2results about How to "Improve alignment quality" patented technology

The present disclosure provides a method for evaluating the capability of a large language model, aligning a large language model, related devices and computer program products, relating to the technical field of artificial intelligence such as large language model alignment, model capability evaluation and deep learning. A specific embodiment of the method for evaluating the capability of a large language model comprises: processing a sample question by using a large language model to be evaluated to obtain at least two answers to be evaluated; determining a correct answer set from the at least two answers to be evaluated by using a sample answer corresponding to the sample question; in response to the correct answer set including at least two correct answers, generating a first capability evaluation value based on a similarity comparison result between the correct answers, and generating a second capability evaluation value based on a quantity relationship between the correct answers in the correct answer set and the answers to be evaluated; and generating a target capability evaluation value for evaluating the model capability of the large language model to be evaluated based on the first capability evaluation value and the second capability evaluation value. Thus, the model capability of the large language model can be evaluated more comprehensively, with higher quality and efficiency.

An alignment mechanism for aligning a substrate in a vacuum chamber is provided. The alignment mechanism comprises an actuator configured to be coupled to a chamber wall of the vacuum chamber and a lever pivotably arranged on a first pivot axis. The lever is actuatable by the actuator to be pivoted about the first pivot axis for aligning the substrate. The alignment mechanism further comprises a substrate contact portion. The substrate contact portion is configured for contacting the substrate. The substrate contact portion is pivotably coupled to the lever and is pivotable about a second pivot axis. Furthermore, a vacuum chamber for processing large area substrates is provided, the vacuum chamber comprising an alignment mechanism.