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A method and apparatus for improving the accuracy of fundamental wave measurement

This invention proposes a method and apparatus for improving the accuracy of fundamental frequency metrology. The apparatus includes: a UART module for sending the number of clock cycles (baud_cnt) required to transmit one symbol to a calculation module and a control module; a calculation module for calculating the frequency offset of the fundamental frequency (RCH) and, based on the RCH frequency offset, calculating the bandpass filter coefficient (b) in the fundamental frequency metrology device using a pipelined approach, and adjusting the bandpass filter based on the bandpass filter coefficient (b); a control module for process control of the pipelined approach; and a register for receiving and storing relevant data during the operation of the UART module, calculation module, and control module. The method employs the aforementioned apparatus for improving the accuracy of fundamental frequency metrology to calculate the bandpass filter coefficient (b) and adjust the bandpass filter accordingly.
Owner:HANGZHOU VANGO TECH