This invention proposes a method and apparatus for improving the accuracy of
fundamental frequency metrology. The apparatus includes: a UART module for sending the number of
clock cycles (
baud_cnt) required to transmit one symbol to a calculation module and a control module; a calculation module for calculating the
frequency offset of the
fundamental frequency (RCH) and, based on the RCH
frequency offset, calculating the bandpass filter coefficient (b) in the
fundamental frequency metrology device using a pipelined approach, and adjusting the bandpass filter based on the bandpass filter coefficient (b); a control module for
process control of the pipelined approach; and a register for receiving and storing relevant data during the operation of the UART module, calculation module, and control module. The method employs the aforementioned apparatus for improving the accuracy of fundamental frequency
metrology to calculate the bandpass filter coefficient (b) and adjust the bandpass filter accordingly.