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An apparatus and a method for performing a difference measurement of an object image

A target image and differential measurement technology, which is applied in measuring devices, photometry using electric radiation detectors, image communication, etc., can solve problems such as overexposure and achieve high dynamic effects

Inactive Publication Date: 2011-09-21
SIEMENS AG
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This is what is causing the overexp

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  • An apparatus and a method for performing a difference measurement of an object image
  • An apparatus and a method for performing a difference measurement of an object image
  • An apparatus and a method for performing a difference measurement of an object image

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Embodiment Construction

[0053] as from figure 1 It can be seen that the method for performing differential measurement of an object image of an object according to the present invention basically comprises three steps S1 , S2 , S3 .

[0054] In a first step S1, phase shifting of electromagnetic waves originating from a target according to a predetermined mask pattern is performed. The electromagnetic waves may be optically visible waves, ie light waves.

[0055] In a further step S2, an optical superposition of phase-shifted electromagnetic waves is performed. The phase-shifted electromagnetic waves may include a phase difference of π, ie 180 degrees, and the optical superposition results in subtraction of the phase-shifted electromagnetic waves from the non-phase-shifted electromagnetic waves. Thus, with a phase shift of π, the superposition of electromagnetic waves results in the subtraction of light waves from other light waves, ie an optical subtraction is performed. Therefore, only superimpos...

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Abstract

The invention relates to an apparatus and a method for performing a difference measurement of an object image. The invention relates to an apparatus and a method for difference measurement of an object image of an object has an optical phase shift masking unit (2) for performing a phase shift of electromagnetical waves originating from the object according to a predetermined mask pattern, an optical superposition unit (3) for superposition of the phase shifted electromagnetical waves provided by the optical phase shift masking unit and a sensor array (4) for detecting intensities of the superpositioned electromagnetical waves provided by the optical superposition unit. The apparatus can be used in any kind of digital camera used in the visible and non-visible frequency range.

Description

technical field [0001] The present invention relates to an apparatus and method for performing difference measurement of an object image of an object, and in particular to measuring the difference intensities of electromagnetic waves such as visible light waves. Background technique [0002] Conventional digital cameras include a sensor array consisting of a plurality of sensor elements, where each sensor element may have a photodiode. These photodiodes include a limited dynamic range which causes problems for measuring or detecting images of objects due to overexposure. [0003] Most conventional hardware-based wavelet transforms are performed using digital circuits, where calculations are based on electrons generated by photodiodes. However, the dynamic range of photodiodes is limited. When a photodiode reaches its saturation current, no additional photons can be converted into electrons. This is what causes overexposure issues when producing images. Contents of the i...

Claims

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Application Information

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IPC IPC(8): G01J1/04G01J1/42
CPCH04N5/2251H04N5/2355H04N23/741H04N25/48
Inventor A·吉尔格U·韦弗周雅赟
Owner SIEMENS AG