Klystron output cavity parameter measurement method, device, electronic equipment and storage medium

Abstract

The present invention discloses a method for measuring the output cavity parameters of a klystron tube, which is applied to the field of microwave electrical technology, including: obtaining a phase-frequency curve when the output cavity gap is open-circuited and a phase-frequency curve when it is short-circuited, subtracting at least one different preset degree from all phase data in the phase-frequency curve when it is short-circuited, obtaining at least one different phase-frequency curve, extracting all intersections between the phase-frequency curve when the gap is open-circuited and the at least one different phase-frequency curve, and obtaining the output cavity parameters according to all the intersections. The present application also discloses a klystron output cavity parameter measuring device, electronic device and storage medium. The measurement method is simple and fast, and the results are accurate and reliable, and can be applied to klystrons of any band.

Description

Technical Field

[0001] The present application relates to the field of microwave electrical technology, and in particular to a method, device, electronic device and storage medium for measuring parameters of a klystron output cavity. Background Art

[0002] As a microwave power amplifier, klystron has the advantages of high power, high gain, high efficiency and high stability, and is widely used in radar, communication, accelerator and other fields. Klystron is an electric vacuum device that converts electron beam energy into microwave energy based on the principle of velocity modulation. When the electron beam generated by the electron gun of the klystron passes through the gap of the resonant cavity, velocity modulation is generated under the action of the high-frequency electric field. In the output cavity, the highly clustered electron beam releases most of the energy, converting the kinetic energy of the electron beam into microwave energy, and transmitting the energy to the load through the coupling of the opening of the output cavity wall. The characteristic parameters of the output cavity, especially the resonant frequency and the appearance quality factor, have an important influence on the klystron beam-wave interaction and determine the performance of the device. Therefore, the correct measurement of the resonant frequency and appearance quality factor of the output cavity is of great significance to the design and manufacture of the klystron.

[0003] The group delay method measures the resonant cavity frequency and appearance quality factor. Its principle is: use a single-ended gate to measure the group delay curve. The horizontal coordinate corresponding to the peak of the group delay is the frequency f0 of the output cavity. Substitute the curve peak group delay time τg into the formula Qext = π*f0*τg / 2 to get the appearance quality factor of the output cavity. However, since a section of output waveguide and output window must be loaded when testing the output cavity frequency and appearance quality factor, the appearance quality factor tested by this method is often too high and the test results are inaccurate. Summary of the invention

[0004] The main purpose of the present application is to provide a method, device, electronic device and storage medium for measuring parameters of a klystron output cavity, aiming to solve the problem of inaccurate measurement results of klystron output cavity parameters in the prior art.

[0005] To achieve the above-mentioned purpose, a first aspect of an embodiment of the present application provides a method for measuring parameters of a klystron output cavity, comprising:

[0006] Obtain the phase-frequency curve when the output cavity gap is open-circuited and the phase-frequency curve when the output cavity gap is short-circuited;

[0007] Subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve;

[0008] Extracting all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve;

[0009] The output cavity parameters are obtained according to all the intersection points.

[0010] In one embodiment of the invention, the at least one different preset degree includes 90 degrees, and the step of subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve includes:

[0011] All phase data in the phase-frequency curve during short circuit are subtracted by 90 degrees to obtain a first phase-frequency curve.

[0012] In one embodiment of the invention, the at least one different preset degree includes 180 degrees, and the step of subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve includes:

[0013] All phase data in the phase-frequency curve during short circuit are subtracted by 180 degrees to obtain a second phase-frequency curve.

[0014] In one embodiment of the invention, the at least one different preset degree includes 270 degrees, and the at least one different preset degree is subtracted from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve includes:

[0015] All phase data in the phase-frequency curve during short circuit are subtracted by 270 degrees to obtain a third phase-frequency curve.

[0016] In one embodiment of the invention, extracting all intersection points between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve comprises:

[0017] All intersections between the phase-frequency curve when the gap is open, the first phase-frequency curve, the second phase-frequency curve, and the third phase-frequency curve are extracted.

[0018] In one embodiment of the invention, obtaining the output cavity parameters according to all the intersection points includes:

[0019] Extracting frequency data of an intersection point between the second phase-frequency curve and the phase-frequency curve when the gap is open;

[0020] The frequency data is determined as a resonant frequency of the output cavity.

[0021] In one embodiment of the invention, obtaining the output cavity parameters according to all the intersection points includes:

[0022] Obtaining frequency data of all the intersection points;

[0023] Obtaining the appearance quality factor of the output cavity according to the frequency data of all the intersection points;

[0024] Q ext =f0 / (f2-f1);

[0025] Among them, Q ext represents the appearance quality factor of the output cavity, f0 represents the frequency data of the intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open, f1 represents the frequency data of the intersection between the first phase-frequency curve and the phase-frequency curve when the gap is open, and f2 represents the frequency data of the intersection between the third phase-frequency curve and the phase-frequency curve when the gap is open.

[0026] A second aspect of an embodiment of the present application provides a klystron output cavity parameter measurement device, comprising:

[0027] An acquisition module, used to acquire a phase-frequency curve when the output cavity gap is open-circuited and a phase-frequency curve when the output cavity gap is short-circuited;

[0028] A calculation module, used for subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve;

[0029] An extraction module, used to extract all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve;

[0030] A determination module is used to obtain the output cavity parameters according to all the intersection points.

[0031] In one embodiment of the invention, the at least one different preset degree includes 90 degrees, and the calculation module is specifically used to subtract 90 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a first phase-frequency curve.

[0032] In one embodiment of the invention, the at least one different preset degree includes 180 degrees, and the calculation module is specifically used to subtract 180 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a second phase-frequency curve.

[0033] In one embodiment of the invention, the at least one different preset degree includes 270 degrees, and the calculation module is specifically used to subtract 270 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a third phase-frequency curve.

[0034] In one embodiment of the invention, the extraction module is specifically used to extract all intersections between the phase-frequency curve when the gap is open, the first phase-frequency curve, the second phase-frequency curve and the third phase-frequency curve.

[0035] In one embodiment of the invention, the determining module includes:

[0036] An extraction submodule, used to extract frequency data of an intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open;

[0037] The resonant frequency determination submodule is used to determine the frequency data as the resonant frequency of the output cavity.

[0038] In one embodiment of the invention, the determining module includes:

[0039] An acquisition submodule, used for acquiring frequency data of all the intersections;

[0040] A quality factor determination submodule, used for obtaining the appearance quality factor of the output cavity according to the frequency data of all the intersection points;

[0041] Q ext =f0 / (f2-f1);

[0042] Among them, Q ext represents the appearance quality factor of the output cavity, f0 represents the frequency data of the intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open, f1 represents the frequency data of the intersection between the first phase-frequency curve and the phase-frequency curve when the gap is open, and f2 represents the frequency data of the intersection between the third phase-frequency curve and the phase-frequency curve when the gap is open.

[0043] A third aspect of the embodiments of the present application provides an electronic device, including:

[0044] A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the method for measuring the output cavity parameters of a klystron provided in the first aspect of the embodiment of the present application is implemented.

[0045] A fourth aspect of the embodiments of the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for measuring the output cavity parameters of a klystron provided in the first aspect of the embodiments of the present application is implemented.

[0046] From the above embodiments of the present application, it can be seen that the method, device, electronic device and storage medium for measuring the output cavity parameters of a klystron provided by the present application obtain the phase-frequency curve when the output cavity gap is open and the phase-frequency curve when it is short-circuited, subtract at least one different preset degree from all phase data in the phase-frequency curve when it is short-circuited, obtain at least one different phase-frequency curve, extract all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve, and obtain the output cavity parameters based on all the intersections. The measurement method is simple and fast, and the results are accurate and reliable, and can be applied to klystrons of any band. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without paying any creative work.

[0048] Figure 1 A schematic diagram of a flow chart of a method for outputting cavity parameters of a klystron provided in an embodiment of the present application;

[0049] Figure 2 A connection diagram for measuring a klystron output cavity provided in one embodiment of the present application;

[0050] Figure 3 A schematic diagram of a phase-frequency curve provided in an embodiment of the present application;

[0051] Figure 4 A schematic diagram of the structure of a klystron output cavity parameter device provided in one embodiment of the present application;

[0052] Figure 5 A schematic diagram of the hardware structure of an electronic device is shown. DETAILED DESCRIPTION

[0053] In order to make the purpose, features, and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0054] See also Figure 1 , Figure 1The present invention provides a flowchart of a method for outputting cavity parameters of a klystron provided in an embodiment of the present invention. The method can be applied to electronic devices, including mobile phones, tablet computers, laptops, smart watches, smart glasses and other electronic devices that can process data on the move, as well as desktop computers, all-in-one machines, smart TVs and other electronic devices that cannot process data on the move. The method mainly includes the following steps:

[0055] S101, obtaining a phase-frequency curve when the output cavity gap is open-circuited and a phase-frequency curve when the output cavity gap is short-circuited.

[0056] In the present invention, the processed output cavity, output waveguide and output window are assembled, and the corresponding vector network analyzer calibration parts are selected to perform single-port calibration. Figure 2 As shown, the vector network analyzer is connected to the output cavity, the output cavity gap is open, and the phase-frequency curve when the output cavity gap is open is measured using the single-port method. The output cavity gap is short-circuited, and the phase-frequency curve when the output cavity gap is short-circuited is measured using the single-port method.

[0057] S102 , subtract at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve.

[0058] In an embodiment of the present invention, the at least one different preset degree includes 90 degrees, and S102 includes: subtracting 90 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a first phase-frequency curve.

[0059] In an embodiment of the present invention, the at least one different preset degree includes 180 degrees, and S102 includes: subtracting 180 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a second phase-frequency curve.

[0060] In an embodiment of the present invention, the at least one different preset degree includes 270 degrees, and S102 includes: subtracting 270 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a third phase-frequency curve.

[0061] S103: extract all intersection points between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve.

[0062] In one embodiment of the present invention, when the at least one different phase-frequency curve includes the first phase-frequency curve, the second phase-frequency curve, and the third phase-frequency curve, all intersections between the phase-frequency curve when the gap is open, the first phase-frequency curve, the second phase-frequency curve, and the third phase-frequency curve are extracted. Since the first phase-frequency curve, the second phase-frequency curve, and the third phase-frequency curve are parallel to each other, all intersections between the phase-frequency curve when the gap is open, the first phase-frequency curve, the second phase-frequency curve, and the third phase-frequency curve include 3 intersections.

[0063] like Figure 3 As shown, the phase-frequency curve 5 when the output cavity gap is open, the phase-frequency curve 1 when the gap is short-circuited, the first phase-frequency curve 2, the second phase-frequency curve 3, and the third phase-frequency curve 4 are respectively shown. The intersection A represents the intersection 5 between the second phase-frequency curve 3 and the phase-frequency curve when the gap is open, the intersection B represents the intersection between the first phase-frequency curve 2 and the phase-frequency curve 5 when the gap is open, and the intersection C represents the intersection between the third phase-frequency curve 4 and the phase-frequency curve 5 when the gap is open.

[0064] S104: Obtain the output cavity parameters according to all the intersection points.

[0065] In one embodiment of the present invention, S104 includes: extracting frequency data of an intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open, and determining the frequency data as the resonant frequency of the output cavity.

[0066] In one embodiment of the present invention, S104 includes: acquiring frequency data of all the intersections, and obtaining an appearance quality factor of the output cavity according to the frequency data of all the intersections.

[0067] Q ext =f0 / (f2-f1);

[0068] Among them, Q ext represents the appearance quality factor of the output cavity, f0 represents the frequency data of the intersection A between the second phase-frequency curve 3 and the phase-frequency curve 5 when the gap is open, f1 represents the frequency data of the intersection B between the first phase-frequency curve 2 and the phase-frequency curve 5 when the gap is open, and f2 represents the frequency data of the intersection C between the third phase-frequency curve 4 and the phase-frequency curve 5 when the gap is open.

[0069] In one example, by Figure 3It can be seen that the horizontal coordinate f0 of point A where the phase-frequency curve 5 when the output cavity is open intersects the second phase-frequency curve 3 is 2.8 GHz, which is the resonant frequency of the output cavity. The horizontal coordinates f1 and f2 of points B and C where the phase-frequency curve 5 when the output cavity is open intersects the first phase-frequency curve 2 and the third phase-frequency curve 4 are 2.68 GHz and 2.89 GHz respectively. Substituting into the formula Q ext =f0 / (f2-f1), and the output cavity appearance quality factor Qext=13.3 is obtained.

[0070] See also Figure 4 , Figure 4 1 is a schematic diagram of a structure of a klystron output cavity parameter measurement device provided in an embodiment of the present application. The device can be built into an electronic device. The device mainly includes:

[0071] An acquisition module 410 is used to acquire a phase-frequency curve when the output cavity gap is open-circuited and a phase-frequency curve when the output cavity gap is short-circuited;

[0072] A calculation module 420, configured to subtract at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve;

[0073] An extraction module 430, configured to extract all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve;

[0074] The determination module 440 is used to obtain the output cavity parameters according to all the intersection points.

[0075] In one embodiment of the invention, the at least one different preset degree includes 90 degrees, and the calculation module 420 is specifically configured to subtract 90 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a first phase-frequency curve.

[0076] In one embodiment of the invention, the at least one different preset degree includes 180 degrees, and the calculation module 420 is specifically configured to subtract 180 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a second phase-frequency curve.

[0077] In one embodiment of the invention, the at least one different preset degree includes 270 degrees, and the calculation module 420 is specifically configured to subtract 270 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a third phase-frequency curve.

[0078] In one embodiment of the invention, the extraction module 430 is specifically used to extract all intersections between the phase-frequency curve when the gap is open, the first phase-frequency curve, the second phase-frequency curve and the third phase-frequency curve.

[0079] In one embodiment of the invention, the determination module 440 includes:

[0080] An extraction submodule, used to extract frequency data of an intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open;

[0081] The resonant frequency determination submodule is used to determine the frequency data as the resonant frequency of the output cavity.

[0082] In one embodiment of the invention, the determination module 440 includes:

[0083] An acquisition submodule is used to acquire the frequency data of all the intersections;

[0084] A quality factor determination submodule, used for obtaining the appearance quality factor of the output cavity according to the frequency data of all the intersection points;

[0085] Q ext =f0 / (f2-f1);

[0086] Among them, Q ext represents the appearance quality factor of the output cavity, f0 represents the frequency data of the intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open, f1 represents the frequency data of the intersection between the first phase-frequency curve and the phase-frequency curve when the gap is open, and f2 represents the frequency data of the intersection between the third phase-frequency curve and the phase-frequency curve when the gap is open.

[0087] See also Figure 5 , Figure 5 A hardware structure diagram of an electronic device is shown.

[0088] The electronic device described in this embodiment includes:

[0089] The memory 41, the processor 42 and the computer program stored in the memory 41 and executable on the processor, when the processor executes the program, the aforementioned Figure 1 The method for measuring the output cavity parameters of a klystron described in the illustrated embodiment.

[0090] Furthermore, the electronic device also includes:

[0091] At least one input device 43 ; at least one output device 44 .

[0092] The memory 41 , processor 42 , input device 43 and output device 44 are connected via a bus 45 .

[0093] The input device 43 may be a camera, a touch panel, a physical button or a mouse, etc. The output device 44 may be a display screen.

[0094] The memory 41 may be a high-speed random access memory (RAM) memory or a non-volatile memory, such as a disk memory. The memory 41 is used to store a set of executable program codes, and the processor 42 is coupled to the memory 41 .

[0095] Furthermore, the present disclosure also provides a computer-readable storage medium, which may be disposed in the electronic device in the above embodiments. Figure 5 The electronic device in the embodiment shown. The computer readable storage medium stores a computer program, which, when executed by the processor, implements the aforementioned Figure 1 The klystron output cavity parameter measurement method described in the illustrated embodiment. Further, the computer storage medium may also be a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes.

[0096] It should be noted that the functional modules in the various embodiments of the present disclosure may be integrated into one processing module, or each module may exist physically separately, or two or more modules may be integrated into one module. The above-mentioned integrated modules may be implemented in the form of hardware or in the form of software functional modules.

[0097] If the integrated module is implemented in the form of a software function module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product.

[0098] It should be noted that, for the convenience of description, the aforementioned method embodiments are all described as a series of action combinations, but those skilled in the art should be aware that the present invention is not limited by the described action sequence, because according to the present invention, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present invention.

[0099] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0100] The above is a description of a method, device, electronic device and readable storage medium for measuring parameters of a klystron output cavity provided by the present invention. For those skilled in the art, according to the ideas of the embodiments of the present invention, there may be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A method for measuring parameters of a klystron output cavity, characterized in that: include: Obtain the phase-frequency curve when the output cavity gap is open-circuited and the phase-frequency curve when the output cavity gap is short-circuited; Subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve; Extracting all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve; According to all the intersection points, the output cavity parameters are obtained; The at least one different preset degree includes 90 degrees, and the step of subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve includes: subtracting 90 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a first phase-frequency curve; The at least one different preset degree includes 180 degrees, and the step of subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve includes: subtracting 180 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a second phase-frequency curve; The at least one different preset degree includes 270 degrees, and the step of subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve includes: subtracting 270 degrees from all phase data in the phase-frequency curve during the short circuit to obtain a third phase-frequency curve; The extracting all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve comprises: extracting all intersections between the phase-frequency curve when the gap is open, the first phase-frequency curve, the second phase-frequency curve and the third phase-frequency curve; The obtaining of the output cavity parameters according to all the intersections comprises: extracting frequency data of the intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open; and determining the frequency data as the resonant frequency of the output cavity; The obtaining of the output cavity parameters according to all the intersection points comprises: Obtaining frequency data of all the intersection points; Obtaining the appearance quality factor of the output cavity according to the frequency data of all the intersection points; <h2 style=";text-align:left;direction:ltr">Q<h2 style=";text-align:left;direction:ltr"> ext <h2 style=";text-align:left;direction:ltr"> =f0 / (f2-f1) Among them, Q ext represents the appearance quality factor of the output cavity, f0 represents the frequency data of the intersection between the second phase-frequency curve and the phase-frequency curve when the gap is open, f1 represents the frequency data of the intersection between the first phase-frequency curve and the phase-frequency curve when the gap is open, and f2 represents the frequency data of the intersection between the third phase-frequency curve and the phase-frequency curve when the gap is open.

2. A klystron output cavity parameter measurement device, used to implement the klystron output cavity parameter measurement method according to claim 1, characterized in that: include: An acquisition module, used to acquire a phase-frequency curve when the output cavity gap is open-circuited and a phase-frequency curve when the output cavity gap is short-circuited; A calculation module, used for subtracting at least one different preset degree from all phase data in the phase-frequency curve during the short circuit to obtain at least one different phase-frequency curve; An extraction module, used to extract all intersections between the phase-frequency curve when the gap is open and the at least one different phase-frequency curve; A determination module is used to obtain the output cavity parameters according to all the intersection points.

3. An electronic device, comprising: A memory, a processor and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, each step of the method for measuring the output cavity parameters of a klystron as claimed in claim 1 is implemented.

4. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, each step of the method for measuring parameters of a klystron output cavity as claimed in claim 1 is implemented.

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