Scattered ray model derivation apparatus, method, and storage medium, and radiological image processing apparatus, method, and storage medium
CN115040146BActive Publication Date: 2026-08-28FUJIFILM CORP
Patent Information
- Application Number
- CN202210205563.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2021-03-09
- Filing Date
- 2022-03-02
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2042-03-02
AI Technical Summary
Technical Problem
因此,若不考虑放射线的能量特性及介于被摄体与放射线检测器之间的物体的放射线特性,则无法以良好的精度估计被摄体的组成
Benefits of technology
[0063]根据本发明,能够以良好的精度估计被摄体的组成。
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Figure CN115040146B_ABST
Abstract
The present application relates to a scatter model derivation apparatus, a radiation image processing apparatus, a method thereof, and a storage medium. The apparatus includes: a reference image acquisition unit configured to acquire at least one reference image representing a reference object having different thicknesses, the at least one reference image being obtained by radiographing the reference object with a radiation detector in a state in which the reference object is interposed between the reference object and the radiation detector; a reference object thickness and radiation attenuation coefficient relationship derivation unit configured to derive a relationship between a thickness of the reference object and a radiation attenuation coefficient of the reference object corresponding to an energy characteristic of the radiation and reflecting an influence of beam hardening caused by the reference object and an object; a primary ray component derivation unit configured to derive a primary ray component corresponding to the thickness of the reference object included in the reference image based on the relationship between the thickness of the reference object and the radiation attenuation coefficient of the reference object; a scatter ray component derivation unit configured to derive a scatter ray component corresponding to the thickness of the reference object included in the reference image based on a difference between the reference image and the primary ray component; and a scatter model derivation unit configured to derive a scatter model representing a relationship between the thickness of the reference object and a proportion of the scatter ray component with respect to the primary ray component.
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Citation Information
Patent Citations
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