Query method and device of semiconductor test data, equipment, storage medium and program product

Abstract

The embodiment of the invention provides a semiconductor test data query method and device, equipment, a storage medium and a program product. The method comprises the steps of obtaining a query request input by a user; processing the query statement based on a set combination relation table to obtain a processing result; the set combination relation table comprises a preset splitting rule, a preset query statement and a storage address of a pre-calculation field result; if the processing result is that processing fails, splitting the query statement based on a set combination relation table to obtain a plurality of split fields; performing matching based on the plurality of split fields and a plurality of first pre-calculation fields corresponding to a set combination relation table to obtain a matching result; and determining a target query result for the query mode corresponding to successful processing based on the query mode corresponding to the matching result or the processing result. According to the embodiment of the invention, the query efficiency can be improved by processing and matching the query statements based on the set combination relation table.

Description

Technical Field

[0001] The present application relates to the technical field of semiconductor test data processing, and in particular to a method, device, equipment, storage medium and program product for querying semiconductor test data. Background Art

[0002] In the field of semiconductor manufacturing, collecting and analyzing test data is an important means for enterprises to control the production process, improve product yield, and increase revenue and profits. As the scope of data collected in the semiconductor testing process becomes larger and larger, the calculated indicators become more complex, and the types of collected data increase, the calculation time of indicators in the semiconductor test data processing process becomes longer and the query speed becomes slower, resulting in a lower user experience. Summary of the invention

[0003] The present application provides a method, device, equipment, storage medium and program product for querying semiconductor test data, which improve the query efficiency of semiconductor test data and enhance the user experience.

[0004] In a first aspect, an embodiment of the present disclosure provides a method for querying semiconductor test data, comprising: obtaining a query request input by a user; wherein the query request comprises a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data; processing the query statement based on a set combination relationship table to obtain a processing result; the set combination relationship table comprises a preset splitting rule, a preset query statement and a storage address of a pre-calculated field result; if the processing result is a processing failure, splitting the query statement based on the set combination relationship table to obtain a plurality of split fields; matching the plurality of split fields with a plurality of first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result; determining a target query result based on a query method corresponding to the matching result or a query method corresponding to a processing success when the processing result is a processing failure; wherein the target query result comprises statistical indicators of the semiconductor test data.

[0005] In a second aspect, the embodiment of the present disclosure further provides a semiconductor test data query device, comprising: a query request acquisition module, used to acquire a query request input by a user; wherein the query request includes a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data;

[0006] A query statement processing module, used to process the query statement based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement and a storage address of a pre-calculated field result; a splitting module, used to split the query statement based on the set combination relationship table to obtain multiple split fields if the processing result is a processing failure; a matching module, used to match the multiple split fields with the multiple first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result; a target query result determination module, used to determine a target query result based on a query method corresponding to the matching result or a query method corresponding to a processing success when the processing result is a processing failure; wherein the target query result includes statistical indicators of the semiconductor test data.

[0007] In a third aspect, an embodiment of the present disclosure further provides an electronic device, comprising: one or more processors; a storage device for storing one or more programs, wherein when the one or more programs are executed by the one or more processors, the one or more processors implement the semiconductor test data query method as described in the embodiment of the present disclosure.

[0008] In a fourth aspect, an embodiment of the present disclosure further provides a storage medium comprising computer executable instructions, which, when executed by a computer processor, are used to execute the semiconductor test data query method as described in the embodiment of the present disclosure.

[0009] In a fifth aspect, an embodiment of the present disclosure further provides a computer program product, including a computer program, which, when executed by a processor, implements the semiconductor test data query method as described in the embodiment of the present disclosure.

[0010] The technical solution of the embodiment of the present disclosure is to obtain a query request input by a user; wherein the query request includes a query statement; the query statement is a query statement for calculating the statistical index of the semiconductor test data; the query statement is processed based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement and a storage address of a pre-calculated field result; if the processing result is a processing failure, the query statement is split based on the set combination relationship table to obtain a plurality of split fields; the matching result is obtained based on the plurality of split fields and the plurality of first pre-calculated fields corresponding to the set combination relationship table; the target query result is determined based on the query method corresponding to the matching result or the query method corresponding to the processing success; wherein the target query result includes the statistical index of the semiconductor test data. In the embodiment of the present disclosure, by processing and matching the query statement based on the set combination relationship table, the pre-calculated field result corresponding to the query statement can be directly obtained. Since the pre-calculated field result is a pre-calculated result, it does not need to be calculated again during the actual query. Compared with the prior art, the real-time query method (i.e., real-time statistical index calculation) can reduce the amount of calculation and improve the efficiency of the query. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] The above and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the accompanying drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and the originals and elements are not necessarily drawn to scale.

[0012] Figure 1 A schematic diagram of a semiconductor test data query method provided in an embodiment of the present application;

[0013] Figure 2 A schematic diagram of the structure of a semiconductor test data query device provided by an embodiment of the present disclosure;

[0014] Figure 3 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0015] Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be construed as being limited to the embodiments described herein, which are instead provided for a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are only for exemplary purposes and are not intended to limit the scope of protection of the present disclosure.

[0016] It should be understood that the various steps recorded in the method implementation of the present disclosure can be performed in different orders and / or in parallel. In addition, the method implementation may include additional steps and / or omit the steps shown. The scope of the present disclosure is not limited in this respect. The term "including" and its variations used herein are open inclusions, that is, "including but not limited to". It should be noted that the concepts of "first", "second", etc. mentioned in the present disclosure are only used to distinguish different devices, modules or units, and are not used to limit the order or interdependence of the functions performed by these devices, modules or units. It should be noted that the modifications of "one" and "multiple" mentioned in the present disclosure are illustrative and not restrictive, and those skilled in the art should understand that unless otherwise clearly stated in the context, it should be understood as "one or more". It is understandable that the data involved in the present technical solution (including but not limited to the data itself, the acquisition or use of the data) shall comply with the requirements of the corresponding laws, regulations and relevant provisions.

[0017] Figure 1 The present invention provides a semiconductor test data query method flow chart, the method can be performed by a semiconductor test data query device, the device can be implemented in the form of software and / or hardware, optionally, by an electronic device, the electronic device can be a mobile terminal, PC or server, etc. Figure 1 As shown, the method includes:

[0018] S110: Obtain a query request input by a user.

[0019] The query request includes a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data. In this embodiment, there is no limitation on the specific statistical indicator calculation, for example, the quantile, kurtosis, standard deviation, etc. of each semiconductor product model may be included.

[0020] In this embodiment, the query request input by the user can be obtained in any time period.

[0021] S120: Process the query statement based on the set combination relationship table to obtain a processing result.

[0022] The set combination relationship table includes preset splitting rules, preset query statements and storage addresses of pre-calculated field results.

[0023] In this embodiment, the combination relationship table is set to be stored in the pre-calculation management database, and the pre-calculation field results and the corresponding pre-calculation fields are stored in the pre-calculation result database. The pre-calculation management database and the pre-calculation result database are independent of the original database.

[0024] Among them, the pre-calculated field results can be regarded as reports, caches or sub-tables, etc.

[0025] The preset splitting rule is a preset splitting rule pre-configured based on business needs and / or historical query records. In this embodiment, there is no specific limitation on the preset splitting rule, for example, it can be split according to different product models, production batches, test time periods, etc. Exemplarily, the overall square difference can be split into fields for grouping and statistics, and indicator fields that need to be summarized and calculated through the preset splitting rule.

[0026] In this embodiment, the user can pre-configure the preset splitting rules, which can be set in any time period according to business needs and / or historical query records to flexibly and accurately respond to the user's query needs. When used for the first time, the default query statement can be used to automatically generate the default preset splitting rules. The user can also modify, delete or add preset splitting rules in any time period to meet the needs of different users in different time periods. Compared with the prior art, which can only be configured when creating a database or creating a data table, it achieves the effect of being able to be flexibly adjusted according to actual conditions.

[0027] The pre-calculated field result is obtained from the original database based on the pre-calculated field when the computing resources are in an idle state; the pre-calculated field is obtained according to the preset splitting rule.

[0028] Due to the real-time query method in the prior art, the amount of queried data is large, the consumption of computing resources is large, the user's query request cannot be responded to in time, the query efficiency is low, and the user experience is low. This embodiment performs pre-computation during off-peak hours, uses the computing resources when they are relatively idle to complete the computing tasks, reduces the load during peak hours, balances resource usage, reduces resource consumption, quickly responds to user query requests, improves query efficiency, and improves user experience.

[0029] In this embodiment, the historical query statements (which may be commonly used query statements or complex historical query statements) are disassembled by preset splitting rules to obtain pre-calculated fields, obtain corresponding pre-calculation schemes, and implement the pre-calculation schemes: pre-calculate the pre-calculated fields, and obtain the corresponding pre-calculated field results from the original database. When actually querying, using the pre-calculated field results can reduce the amount of calculation in the query stage, thereby improving query efficiency. The pre-calculation method can also reduce user waiting time. Since most of the fields that require complex calculations have been processed and stored in advance, the user's query request can be responded to quickly, thereby improving the user experience. The pre-calculation process, as an automated process, can reduce human operation errors and improve the accuracy of data processing. By adding the pre-calculation process, it can support the processing of larger-scale semiconductor test data. In the long run, costs can be saved by reducing real-time computing requirements. Among them, the preset splitting rules also include the time, number of implementations, storage structure, etc. of the pre-calculation scheme implementation.

[0030] In this embodiment, a preset query statement can be created at any time, and the preset query statement can be split according to the preset splitting rules to obtain pre-calculated fields, and the pre-calculated field results corresponding to the pre-calculated fields can be obtained from the original database. When the user queries the original database, part of the query can be converted into a query on the pre-calculated pre-calculated field results, thereby improving the versatility of the pre-calculation; at the same time, the pre-calculated field creation method used by the method of this embodiment is more flexible, and is not limited to when creating a database or creating a table, but can be flexibly adjusted according to actual conditions, especially when the amount of data increases, the pre-calculated result database can be expanded in time to speed up database queries and better meet user needs.

[0031] In this embodiment, the pre-calculated fields and pre-calculated field results can be used to quickly generate reports and charts, which can support rapid data analysis in the decision-making process.

[0032] In this embodiment, multiple pre-calculated fields can be obtained based on the storage addresses of multiple pre-calculated field results in the set combination relationship table related to the current project, and the processing result can be determined according to the multiple pre-calculated fields and the multiple query fields of the query statement. If the processing result is successful, the combination result of the multiple pre-calculated field results corresponding to the multiple pre-calculated fields can be directly used as the target query result. If the processing result is a processing failure, the subsequent splitting process is entered.

[0033] In this embodiment, in the pre-calculation result database, the pre-calculation fields and the corresponding pre-calculation field results are stored correspondingly according to different projects. Different projects have different corresponding pre-calculation fields. Separating the pre-calculation fields according to the projects can speed up the retrieval times.

[0034] Optionally, the query statement is processed based on the set combination relationship table to obtain a processing result, including: obtaining multiple query fields corresponding to the query statement; obtaining corresponding multiple second pre-calculated fields based on the storage addresses of the multiple pre-calculated field results; if the corresponding multiple second pre-calculated fields include all query fields, the processing result is successful processing; if the corresponding multiple second pre-calculated fields do not include all query fields, the processing result is failed processing.

[0035] In this embodiment, the query field is not limited. For example, the query field can be the content after the select field and before the from field. The relationship between the split field and the query field can be: the split field contains the query field. For example, the split field can include the content after the select field and before the from field, and can also include the content after the from field.

[0036] In this embodiment, the second pre-calculated field may be the same as the first pre-calculated field, and the result of the first pre-calculated field may be the same as the result of the second pre-calculated field.

[0037] In this embodiment, multiple query fields corresponding to the query statement can be obtained, and the corresponding multiple second pre-calculated fields can be obtained from the pre-calculated result database based on the storage addresses of the multiple pre-calculated field results; if the multiple second pre-calculated fields include all query fields, the processing result is successful, so that the pre-calculated field results can be directly used as the target query result to improve the query efficiency. If the multiple second pre-calculated fields do not include all query fields, the processing result is a processing failure, so as to enter the subsequent splitting process.

[0038] S130: If the processing result is a processing failure, split the query statement based on the set combination relationship table to obtain a plurality of split fields.

[0039] In this embodiment, a preset query statement consistent with the query statement can be found from the set combination relationship table based on the query statement, so that the preset splitting rule associated with the preset query statement can be obtained. The query statement is split according to the preset splitting rule to obtain the splitting field.

[0040] Optionally, the query statement is split based on the set combination relationship table to obtain multiple split fields, including: searching for a target preset query statement that matches the query statement from multiple preset query statements in the set combination relationship table; obtaining a preset split rule associated with the target preset query statement; and splitting the query statement according to the preset split rule to obtain multiple split fields.

[0041] In this embodiment, before the actual query is executed, a target preset query statement matching the query statement is found, and a preset splitting rule associated with the target preset query statement is obtained, and the query statement is split according to the preset splitting rule, so that the split fields can be matched with the pre-calculated fields, so that the pre-calculated field results can be obtained, thereby improving the query efficiency and response speed, reducing the burden of real-time calculation, and making the query process more efficient.

[0042] S140: Matching is performed based on the multiple split fields and the multiple first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result.

[0043] Exemplarily, the split fields may be the content corresponding to the where field, the content corresponding to the select field, the content corresponding to the groupby field, the content corresponding to the from field, the content corresponding to the limit field, the content corresponding to the order by field, etc. Where, select, group by, from, limit, orderby, etc. are all fields in a database query language (such as SQL).

[0044] In this embodiment, the matching result can be obtained by comparing the multiple first pre-calculated fields with the multiple split fields.

[0045] Optionally, matching is performed based on the multiple split fields and the multiple first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result, including: if the corresponding multiple first pre-calculated fields include all split fields, the matching result is a successful match; if the corresponding multiple first pre-calculated fields include some split fields, the matching result is a partial successful match; if the corresponding multiple first pre-calculated fields do not include any split fields, the matching result is a failed match.

[0046] Exemplarily, the first pre-calculated field may be: select wafer, midle, P1, STDDEV, from dwd, where site>1and testtime<30, group by wafer;

[0047] Query statement 1: select wafer, midle from dwd1 where site>1and testtime<30group by wafer; (the split fields can be selectwafer, midle, from dwd1 where site>1andtesttime<30, group by wafer)

[0048] Since the dwd after the first pre-calculated field form is different from dwd1 after the query statement form, the form split field is not matched successfully, and the other remaining split fields are matched successfully. For query statement 1, it can be considered that a partial match is successful.

[0049] Query statement 2: select wafer,P5 from dwd where site>1and testtime<30groupby wafer; (the split fields can be select wafer,P5, from dwd, where site>1andtesttime<30, group by wafer)

[0050] Since the content corresponding to the select field in query statement 2 includes P5, which is not included in the first pre-calculated field, the select does not match successfully, but the remaining split fields match successfully. Query statement 2 can be considered to be partially matched successfully.

[0051] In this embodiment, the explanation for the first pre-calculated field containing the split field is: the split field is exactly the same as the first pre-calculated field (equivalent to the first pre-calculated field directly containing the split field); or, the result of the split field is a subset of the result of the first pre-calculated field, that is, it can be indirectly extracted from the pre-calculated field result of the pre-calculated field (equivalent to the first pre-calculated field indirectly containing the split field).

[0052] Exemplarily, the first pre-calculated field: select mean, midle, P1, P5, STDDEV, FROM dwd;

[0053] Query statement 3: select P5,STDDEV FROM dwd; (the split field can be select P5,STDDEV,FROM dwd)

[0054] Since P5 after the split field select is exactly the same as P5 after the pre-calculated field select, and dwd after the split field FROM is exactly the same as dwd after the first pre-calculated field FROM, it can be considered that the first pre-calculated field directly contains the split field.

[0055] Exemplarily, the first pre-calculated field: selectwafer,midle,P1,STDDEV,from dwd1,wherewafer>=1andwafer<=10and c=xxxx;

[0056] Query statement 4: select wafer, P1 from dwd1 where wafer>=1and wafer<=5and c=xxxx; (the split fields can be select wafer, P1, from dwd1, where wafer>=1and wafer<=5and c=xxxx)

[0057] Since where wafer>=1and wafer<=5 in the first pre-calculated field where is a subset of wafer>=1and wafer<=10 in the split field where, it can be considered that the first pre-calculated field indirectly includes the split field.

[0058] In this embodiment, the first pre-calculated field indirectly includes the split field, which can also be interpreted as: the target query result of the user query statement can be obtained by secondary processing from the first pre-calculated field result corresponding to the first pre-calculated field through a set function similar to sum.

[0059] Exemplarily, an example in which the first pre-calculated field includes a split field may also be:

[0060] The user query statement is the overall square difference of wafer yield of all products from January to June. The first pre-calculated field is the square difference of wafer yield of all products every day from January to June.

[0061] The first pre-calculated field corresponds to: select testday, product, yield, stddev, from table, where testday>=01-01 and testday<=06-30, group by testday;

[0062] Query statement 5 is: select product,stddev from table where testday>=01-01andtestday<=06-30; (the split fields are: selectproduct,stddev,from table,where testday>=01-01and testday<=06-30)

[0063] In this embodiment, the three matching methods of successful matching, partial successful matching and failed matching can hierarchically evaluate the matching degree between the query statement and the pre-calculated fields, provide a more flexible matching method, and improve the availability and flexibility of semiconductor test data query.

[0064] S150: Determine a target query result based on a query method corresponding to the matching result or a query method corresponding to a successful processing result.

[0065] Wherein, the target query result includes statistical indicators of the semiconductor test data.

[0066] In this embodiment, the target query result can be determined according to the query method corresponding to the processing result of successful processing. After the processing result is a processing failure, the target query result can be determined according to the query method corresponding to the matching result of successful matching. The target query result can also be determined according to the query method according to the matching result of partially successful matching. The target query result can also be determined according to the query method according to the matching result of failed matching.

[0067] Optionally, the target query result is determined based on the query method corresponding to the matching result or the query method corresponding to the processing result being successful processing, including: if the processing result is successful processing, the corresponding multiple second pre-calculated field results are combined as the target query result; if the matching result is the matching success, the corresponding multiple first pre-calculated fields are combined according to the corresponding preset splitting rules as the target query result; if the matching result is the partial matching success, the corresponding multiple first pre-calculated fields are combined according to the corresponding preset splitting rules to obtain the first target query result; the remaining split fields are queried through the original database to obtain the second target query result; wherein the remaining split fields are split fields that have not been matched successfully; the first target query result and the second target query result are combined into the target query result; if the matching result is the matching failure, all split fields are queried through the original database to obtain the target query result.

[0068] Exemplarily, when the processing result is successful, the corresponding multiple second pre-calculated field results can be directly combined as the target query result without further query.

[0069] On the basis that the processing result is a processing failure, if the matching result is a matching success, the corresponding multiple first pre-calculated fields are combined according to the corresponding preset splitting rule as the target query result to improve the query efficiency.

[0070] On the basis that the processing result is a processing failure, if the matching result is a partial matching success, the corresponding multiple first pre-calculated fields are combined according to the corresponding preset splitting rules to obtain the first target query result; the remaining split fields are queried through the original database to obtain the second target query result; the first target query result and the second target query result are combined into the target query result, which can reduce the number of queries and improve the query efficiency. The split field that is not matched successfully, that is, the first pre-calculated field does not contain the corresponding split field.

[0071] Based on the processing result being a processing failure and after the matching result being a matching failure, a real-time query is performed through the original database, which can effectively reduce the pressure caused by directly accessing the original database each time, while improving query efficiency.

[0072] The technical solution of the embodiment of the present disclosure is to obtain a query request input by a user; wherein the query request includes a query statement; the query statement is a query statement for calculating the statistical index of the semiconductor test data; the query statement is processed based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement and a storage address of a pre-calculated field result; if the processing result is a processing failure, the query statement is split based on the set combination relationship table to obtain a plurality of split fields; the matching result is obtained based on the plurality of split fields and the plurality of first pre-calculated fields corresponding to the set combination relationship table; the target query result is determined based on the query method corresponding to the matching result or the query method corresponding to the processing success; wherein the target query result includes the statistical index of the semiconductor test data. In the embodiment of the present disclosure, by processing and matching the query statement based on the set combination relationship table, the pre-calculated field result corresponding to the query statement can be directly obtained. Since the pre-calculated field result is a pre-calculated result, it does not need to be calculated again during the actual query. Compared with the prior art, the real-time query method (i.e., real-time statistical index calculation) can reduce the amount of calculation and improve the efficiency of the query.

[0073] Figure 2 A schematic diagram of a semiconductor test data query device provided by an embodiment of the present disclosure is shown in FIG. Figure 2 As shown, the device includes: a query request acquisition module 210, a query statement processing module 220, a splitting module 230, a matching module 240 and a target query result determination module 250;

[0074] The query request acquisition module 210 is used to acquire a query request input by a user; wherein the query request includes a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data;

[0075] A query statement processing module 220 is used to process the query statement based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement, and a storage address of a pre-calculated field result;

[0076] A splitting module 230 is used to split the query statement based on the set combination relationship table to obtain multiple split fields if the processing result is a processing failure;

[0077] A matching module 240, configured to perform matching based on the multiple split fields and the multiple first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result;

[0078] The target query result determination module 250 is used to determine the target query result based on the query method corresponding to the matching result or the query method corresponding to the processing result being successful; wherein the target query result includes statistical indicators of the semiconductor test data.

[0079] The technical solution of the embodiment of the present disclosure is to obtain a query request input by a user through a query request acquisition module; wherein, the query request includes a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data; the query statement is processed by a query statement processing module based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement and a storage address of a pre-calculated field result; if the processing result is a processing failure, the query statement is split based on the set combination relationship table to obtain multiple split fields through the splitting module; the matching result is obtained by matching based on the multiple split fields and the multiple first pre-calculated fields corresponding to the set combination relationship table through the matching module; the target query result is determined by a target query result determination module based on the query method corresponding to the matching result or the query method corresponding to the processing result being a successful processing; wherein, the target query result includes the statistical indicators of the semiconductor test data. In the disclosed embodiments, by processing and matching query statements based on a set combination relationship table, the pre-calculated field results corresponding to the query statements can be directly obtained. Since the pre-calculated field results are pre-calculated results, there is no need to calculate them again during actual queries. Compared with the prior art, real-time query (i.e., real-time statistical indicator calculation) can be used to reduce the amount of calculation and improve the efficiency of the query.

[0080] Optionally, the query statement processing module is specifically used to: obtain multiple query fields corresponding to the query statement; obtain corresponding multiple second pre-calculated fields based on the storage addresses of the multiple pre-calculated field results; if the multiple second pre-calculated fields include all query fields, the processing result is successful processing; if the multiple second pre-calculated fields do not include all query fields, the processing result is failed processing.

[0081] Optionally, the splitting module is specifically used to: search for a target preset query statement that matches the query statement from multiple preset query statements in the set combination relationship table; obtain a preset splitting rule associated with the target preset query statement; split the query statement according to the preset splitting rule to obtain multiple split fields.

[0082] Optionally, the matching module is specifically used for: if the corresponding multiple first pre-calculated fields include all split fields, the matching result is a successful match; if the corresponding multiple first pre-calculated fields include some split fields, the matching result is a partial successful match; if the corresponding multiple first pre-calculated fields do not include any split fields, the matching result is a failed match.

[0083] Optionally, the target query result determination module is specifically used to: if the processing result is successful processing, then combine the corresponding multiple second pre-calculated field results as the target query result; if the matching result is the matching success, then combine the corresponding multiple first pre-calculated fields according to the corresponding preset splitting rules as the target query result; if the matching result is the partial matching success, then combine the corresponding multiple first pre-calculated fields according to the corresponding preset splitting rules to obtain the first target query result; query the remaining split fields through the original database to obtain the second target query result; wherein the remaining split fields are split fields that have not been matched successfully; combine the first target query result and the second target query result into the target query result; if the matching result is the matching failure, query all split fields through the original database to obtain the target query result.

[0084] Among them, the preset splitting rule is a preset splitting rule pre-configured based on business needs and / or historical query records; the pre-calculated field result is determined in advance based on the pre-calculated field when the computing resources are in an idle state; the pre-calculated field is obtained according to the preset splitting rule.

[0085] The semiconductor test data query device provided in the embodiments of the present disclosure can execute the semiconductor test data query method provided in any embodiment of the present disclosure, and has the corresponding functional modules and beneficial effects of the execution method.

[0086] Figure 3 A schematic diagram of an electronic device 10 that can be used to implement an embodiment of the present application is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workbenches, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present application described and / or required herein.

[0087] like Figure 3 As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0088] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0089] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as the method for querying semiconductor test data.

[0090] In some embodiments, the method of querying semiconductor test data can be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the method of querying semiconductor test data described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the method of querying semiconductor test data in any other appropriate manner (for example, by means of firmware).

[0091] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0092] The computer programs for implementing the methods of the present application may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer programs are executed by the processor, the functions / operations specified in the flow charts and / or block diagrams are implemented. The computer programs may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0093] In the context of the present application, a computer readable storage medium may be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, device or equipment. A computer readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer readable storage medium may be a machine readable signal medium. A more specific example of a machine readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0094] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0095] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0096] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0097] An embodiment of the present application also provides a computer program product, including a computer program, which, when executed by a processor, implements a method for querying semiconductor test data as provided in any embodiment of the present application.

[0098] In the process of implementation, the computer program product can be written in one or more programming languages ​​or a combination thereof to perform the computer program code of the present application, and the programming language includes an object-oriented programming language, such as Java, Smalltalk, C++, and also includes a conventional procedural programming language, such as "C" language or similar programming language. The program code can be executed entirely on the user's computer, partially on the user's computer, as an independent software package, partially on the user's computer and partially on the remote computer, or completely on the remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (for example, using an Internet service provider to connect through the Internet).

[0099] Note that the above are only preferred embodiments of the present application and the technical principles used. Those skilled in the art will understand that the present application is not limited to the specific embodiments herein, and that various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the scope of protection of the present application. Therefore, although the present application is described in more detail through the above embodiments, the present application is not limited to the above embodiments, and may include more other equivalent embodiments without departing from the concept of the present application, and the scope of the present application is determined by the scope of the appended claims.

Claims

1. A method for querying semiconductor test data, characterized in that: include: Obtaining a query request input by a user; wherein the query request includes a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data; Processing the query statement based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement, and a storage address of a pre-calculated field result; If the processing result is a processing failure, splitting the query statement based on the set combination relationship table to obtain a plurality of split fields; Matching is performed based on the multiple split fields and the multiple first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result; A target query result is determined based on a query method corresponding to the matching result or a query method corresponding to a successful processing result; wherein the target query result includes statistical indicators of the semiconductor test data.

2. The method according to claim 1, characterized in that The query statement is processed based on the set combination relationship table to obtain a processing result, including: Obtain multiple query fields corresponding to the query statement; Respectively acquiring corresponding second pre-calculated fields based on storage addresses of the pre-calculated field results; If the plurality of second pre-calculated fields include all query fields, the processing result is successful processing; If the plurality of second pre-calculated fields do not include all query fields, the processing result is processing failure.

3. The method according to claim 1, characterized in that The query statement is split based on the set combination relationship table to obtain multiple split fields, including: Searching for a target preset query statement matching the query statement from a plurality of preset query statements in the set combination relationship table; Obtaining a preset splitting rule associated with the target preset query statement; The query statement is split according to the preset splitting rule to obtain multiple split fields.

4. The method according to claim 1, characterized in that: The matching result is obtained by matching the plurality of split fields with the plurality of first pre-calculated fields corresponding to the set combination relationship table, including: If the corresponding multiple first pre-calculated fields include all split fields, the matching result is a successful match; If the corresponding multiple first pre-calculated fields include some split fields, the matching result is a partial match success; If the corresponding multiple first pre-calculated fields do not include any split field, the matching result is a matching failure.

5. The method according to claim 4, characterized in that Determining a target query result based on a query method corresponding to the matching result or a query method corresponding to a successful processing result includes: If the processing result is successful, the corresponding multiple second pre-calculated field results are combined as the target query result; If the matching result is the matching success, combining the corresponding multiple first pre-calculated fields according to the corresponding preset splitting rule as the target query result; If the matching result is the partial match success, the corresponding multiple first pre-calculated fields are combined according to the corresponding preset splitting rule to obtain the first target query result; the remaining split fields are queried through the original database to obtain the second target query result; wherein the remaining split fields are the split fields that have not been successfully matched; the first target query result and the second target query result are combined into the target query result; If the matching result is the matching failure, all split fields are queried through the original database to obtain the target query result.

6. The method according to claim 1, characterized in that in, The preset splitting rule is a preset splitting rule pre-configured based on business needs and / or historical query records; the pre-calculated field result is determined in advance based on the pre-calculated field when the computing resources are idle; the pre-calculated field is obtained according to the preset splitting rule.

7. A semiconductor test data query device, characterized in that: include: A query request acquisition module, used to acquire a query request input by a user; wherein the query request includes a query statement; the query statement is a query statement for calculating statistical indicators of the semiconductor test data; A query statement processing module, used to process the query statement based on a set combination relationship table to obtain a processing result; the set combination relationship table includes a preset splitting rule, a preset query statement, and a storage address of a pre-calculated field result; A splitting module, configured to split the query statement based on the set combination relationship table to obtain a plurality of split fields if the processing result is a processing failure; A matching module, used for matching the plurality of split fields with the plurality of first pre-calculated fields corresponding to the set combination relationship table to obtain a matching result; The target query result determination module is used to determine the target query result based on the query method corresponding to the matching result or the query method corresponding to the processing result being successful; wherein the target query result includes statistical indicators of the semiconductor test data.

8. An electronic device, characterized in that: The electronic device comprises: one or more processors; a storage device for storing one or more programs, When the one or more programs are executed by the one or more processors, the one or more processors implement the semiconductor test data query method as described in any one of claims 1 to 6.

9. A storage medium comprising computer executable instructions, wherein the computer executable instructions are used to execute the semiconductor test data query method according to any one of claims 1 to 6 when executed by a computer processor.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the computer program implements the semiconductor test data query method according to any one of claims 1 to 6.

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