Full-day area polarization ultraviolet spectrum device and on-orbit data processing method

Abstract

The invention provides a full-day area fractional ultraviolet spectrum device and an on-orbit data processing method, and the device comprises a front optical filter which is used for filtering visible light and infrared light; the slit assembly is used for receiving solar radiation; the concave grating is used for receiving the solar radiation passing through the slit assembly, realizing dispersive light splitting and refocusing light beams with different wavelengths; the detector is used for simultaneously receiving and recording light beams with different wavelengths at different positions of the slit; the data processing module is used for acquiring a full-day area spectrum; the front optical filter is located at the foremost end, the slit assembly is located behind the front optical filter, one end of the concave grating is connected with the data processing module through the detector, and the other end of the concave grating is connected with the slit assembly. According to the invention, the sun is used as a fixed star for radiation integral detection, the radial velocity of coronal mass ejection is detected through spectral line blue shift asymmetry, coronal burst events are analyzed through a radiation change rule, and the method has important value for solar physical research and space weather monitoring and forecasting.

Description

Technical Field

[0001] The invention relates to the technical field of solar spectrum detection, and provides a full-day area integral extreme ultraviolet spectrum device and an on-orbit data processing method. Background Art

[0002] Coronal mass ejections (CMEs) are the largest-scale instantaneous explosive phenomena in the solar system. The large amount of plasma ejected propagates in interplanetary space and interacts with planets in the solar system, which can trigger serious space weather events. The origin and propagation of CMEs are important scientific issues in current solar physics. When CMEs reach the Earth or other planets is also an important application issue in the field of space weather monitoring and forecasting.

[0003] At present, the monitoring of CME is mainly based on imaging equipment, which can only obtain the propagation speed in the sky plane, but not the radial speed. That is, the conventional measurement of CME velocity vector has not yet been realized, which limits the prediction accuracy of CME arrival time on Earth. The ejected coronal material is a multi-temperature component, with temperatures ranging from hundreds of thousands to millions of degrees. The above temperatures determine that the extreme ultraviolet band (λ = 10-120nm) is the best observation band. By using multiple spectral lines formed at different temperatures, combined with the Doppler effect, and through the spectral line blue shift asymmetry method, the radial velocity of ejected coronal material at different temperatures can be obtained. Combined with the velocity of the sky plane obtained by the extreme ultraviolet imager, it is expected to obtain the vector velocity of CME. In recent years, the model research of Yang Zihao et al. shows that the spectral resolution of the full-sun area integral extreme ultraviolet spectrometer increases to more than 500, and the radial velocity of CME can be detected through the Doppler effect. Therefore, a multi-band, high spectral resolution, and high temporal resolution full-sun area integral extreme ultraviolet spectrometer is urgently needed to obtain the radial velocity of CME.

[0004] There are currently four main schemes for full-sun integrated extreme ultraviolet spectrum detection. The first is the grazing-incidence single concave grating scheme, such as the MEGS-A on the US SDO / EVE. The entire system consists of four parts: an incident slit, a filter, a grating, and a detector. The sunlight in the full-sun field of view directly enters the slit, and the ultraviolet, visible, and infrared radiation are suppressed by the thin-film filter. Extreme ultraviolet radiation of different wavelengths forms a slit spectrum on the detector after diffraction by the grating. The detector can obtain a wide-band spectrum with a high temporal resolution in one shot. The operating band of MEGS-A is 5-35nm, with a wide band and a spectral resolution of about 200. The second is a normal-incidence double concave grating scheme. In the 40-120nm band, the normal-incidence efficiency of a single-layer concave grating is high, and a normal-incidence system can be used, but there is currently no suitable narrow-band filter to suppress high-order harmonics. The US SDO / EVE's MEGS-B adopts this scheme. The lines of the two concave gratings are perpendicular to each other. After the sunlight passes through the slit and the first grating, the radiation of different wavelengths is dispersed. An aperture is placed at the position of the first-order diffraction spectrum to select the target band, and then it is dispersed twice by the second concave grating to obtain a full-day integral extreme ultraviolet spectrum without the influence of high-order harmonics. MEGS-B has a wide band and a spectral resolution of about 0.1nm. The third type is a slitless grazing-incidence plane grating, such as the EUVS payload on the Aeros A / B satellite jointly developed by Germany and the United States. The full-day sunlight is irradiated onto the plane grating after passing through a rectangular aperture, and the monochromatic (specific diffraction angle) wavelength after grating diffraction is selected by the collimator and received by a point source detector. By rotating the collimator and the detector at the same time, the full-day integral extreme ultraviolet spectrum of different wavelengths is obtained. The time resolution of this scheme is low. The fourth is the transmission scheme, in which the system consists of a collimator, a slit, a filter, a transmission grating and a detector. SOHO / SEM and the like adopt this scheme. After the sunlight in the full disk field of view passes through the transmission grating, radiation of different wavelengths propagates along different diffraction angles and is received by a silicon-based baseline array or multiple point source detectors. This scheme is characterized by high temporal resolution and wide band, but the spectral resolution is only in the tens. In summary, the existing full-disk integral extreme ultraviolet spectrometer cannot simultaneously meet the requirements of spectral resolution of up to 500, high temporal resolution and multi-band.

[0005] Therefore, it is necessary to study a full-day area integral extreme ultraviolet spectrometer and an on-orbit data processing method to address the shortcomings of the existing technology and to solve or alleviate one or more of the above problems. Summary of the invention

[0006] In order to overcome the shortcomings of the prior art, the present invention provides a full-day area integral extreme ultraviolet spectrum device and an on-orbit data processing method in view of the characteristics of large data volume and high consumption of data transmission resources of multiple area array detectors, which can realize multi-band and high spectral resolution solar spectrum detection. The present invention adopts a normal-incidence concave multi-layer film grating scheme, which is composed of a filter, a slit, a grating, and multiple detectors. The sunlight is filtered out of visible light and near-infrared radiation through the filter. After dispersion by the concave multi-layer film grating, the extreme ultraviolet spectra of multiple bands are re-converged on multiple detectors, and are processed and corrected on-orbit by the data processing module, thereby reducing the amount of data transmitted by the space payload, and finally obtaining spectral line data and spectral resolution of multiple bands.

[0007] The present invention adopts the following technical solution:

[0008] On the one hand, the present invention provides a full-day area integral extreme ultraviolet spectrum device, which comprises a front filter, a slit assembly, a concave grating, a detector and a data processing module in sequence;

[0009] The front filter is used to filter out visible light and infrared light;

[0010] The slit assembly is used to receive solar radiation;

[0011] The concave grating is used to receive solar radiation passing through the slit assembly, realize dispersion and splitting, and refocus light beams of different wavelengths;

[0012] The detector is used to realize the simultaneous reception and recording of light beams at different positions and wavelengths of the slits, and radiation of different wavelength bands is received by multiple array detectors;

[0013] The data processing module is used to process the spectra received by multiple array detectors, reduce the amount of data transmitted, compress the data, and obtain a one-dimensional full-day area integral spectrum with high spectral resolution and high signal-to-noise ratio;

[0014] The front filter is located at the front end close to solar radiation, the slit assembly is located behind the front filter, one end of the concave grating is connected to the data processing module through a detector, and the other end is connected to the slit assembly.

[0015] As any possible implementation described above, an implementation is further provided, wherein the slit assembly is a single slit opened on the metal sheet, the single slit is vertically arranged in the middle of the metal sheet, the slit width is 0.010-0.060 mm, and the slit length b=2-15 mm.

[0016] Any possible implementation as described above, further provides an implementation, wherein the aperture of the concave grating is 20-40 mm, the half curvature is 400-1000 mm, the grating period is 200-400 nm, the duty cycle is 0.4-0.6, and a multilayer film stack is arranged on the concave grating substrate.

[0017] According to any possible implementation described above, an implementation is further provided, wherein the aperture of the concave grating is larger than the size of the incident solar spot at the position, wherein the solar spot is calculated as follows:

[0018] d = r1 × tan(Φ) + b;

[0019] Among them, d is the size of the solar spot, r1 is the distance from the slit to the grating, Φ is the observation field of view, and b is the slit length.

[0020] Any possible implementation as described above, further provides an implementation, wherein the multilayer film stack is composed of two or more materials with high atomic number and low atomic number that are periodically alternating, and high efficiency can be obtained in multiple observation bands λ, the thickness of each period is 5nm-50nm, and the number of multilayer film periods is 3-40; the high atomic number materials include Al, Zr, Mg, Mo and Sc; the low atomic number materials include B4C, Si and SiC.

[0021] As any possible implementation described above, there is further provided an implementation, wherein the observation field of view Φ≥40', and the observation band λ is 10-120 nm.

[0022] As any possible implementation described above, an implementation is further provided, wherein the detector is a back-illuminated sCMOS scientific-grade camera or a CCD camera or an image-enhanced ICMOS, with an array size of 2k×2k and a frame rate greater than 1 frame per second.

[0023] Any possible implementation as described above further provides an implementation, wherein the data processing module is an FPGA or a CPU, which is used to reduce the 2k×2k data size to a 2k×1 data size by averaging along the slit direction after dark field reduction, deducting hot pixels, and correcting spectral tilt and curvature.

[0024] According to any possible implementation described above, a method for processing on-orbit data of a full-day area integral extreme ultraviolet spectrometer is further provided. The method for processing on-orbit data is implemented by the full-day area integral extreme ultraviolet spectrometer, and the method for processing on-orbit data includes:

[0025] S1. Determine the structural parameters of the component according to the solar observation field Φ and the observation band λ;

[0026] S2, after the sunlight passes through the pre-filter, visible light and infrared light are filtered out; then it enters the slit, and the concave multi-layer film grating receives the solar extreme ultraviolet beam of the entire solar disk, and refocuses the beams of multiple bands and different wavelengths; the detector receives and records the beams of multiple wavelengths at different positions of the slit at the same time;

[0027] S3, the data processing module corrects the detection data of multiple detectors respectively;

[0028] S4. Count the spectral data of multiple bands respectively and calculate the spectral resolution.

[0029] Any possible implementation as described above, further provides an implementation, wherein the element structure parameters in step S1 include: filter material, filter size, slit width, slit length, concave grating aperture, concave grating curvature radius, grating period, grating duty cycle, multilayer film stack material and period thickness, detector type, detector array size and parameters of the data processing unit.

[0030] Compared with the prior art, the present invention can achieve the following technical effects:

[0031] 1. Compared with SDO / MEGS, it adopts the normal incidence scheme to reduce the influence of aberration, increases the grating line density and the output arm, obtains high spectral resolution in multiple target bands, and obtains high efficiency in multiple bands by coating a multi-layer film structure on the concave grating;

[0032] 2. Compared with the SDO / MEGS one-time downlink array data, the present invention realizes on-orbit processing by adding a data processing module. Without losing the spectral resolution ability, the data volume is reduced by more than 3 orders of magnitude, and the output spectral signal-to-noise ratio is significantly improved. It is particularly suitable for deep space exploration missions where data downlink resources are very tight.

[0033] Of course, any product implementing the present invention does not necessarily need to achieve all of the above-mentioned technical effects at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A schematic structural diagram of a multi-band high-resolution full-day area integral extreme ultraviolet spectroscopy device provided by one embodiment of the present invention;

[0035] Among them, 1-pre-filter, 2-slit, 3-concave grating, 4-detectors of different bands;

[0036] Figure 2 A graph of diffraction efficiency and spectral resolution provided for one embodiment of the present invention;

[0037] Wherein, a) is the diffraction efficiency diagram of the multilayer film grating at 18.3-21.3nm, 49.6-52.9nm, and 100-105nm;

[0038] b) is the spectral resolution diagram of the full-day area-integrated extreme ultraviolet spectrometer at 18.3-21.3nm, 49.6-52.9nm, and 100-105nm;

[0039] Figure 3 A spectrum diagram provided for one embodiment of the present invention;

[0040] Wherein, a) is the original spectrum image taken;

[0041] b) is the spectrum after dark field reduction;

[0042] c) is the spectrum diagram superimposed along the slit direction after thermal pixel correction and slit tilt and bending correction. DETAILED DESCRIPTION

[0043] In order to better understand the technical solution of the present invention, the embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0044] It should be clear that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0045] The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The singular forms "a", "said" and "the" used in the embodiments of the present invention and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0046] like Figure 1 As shown, an embodiment of the present invention provides a multi-band high-resolution full-day surface integral extreme ultraviolet spectroscopy device and an on-orbit processing algorithm, wherein the spectroscopy device sequentially comprises a front filter, a slit device, a concave grating, a detector and a data processing unit;

[0047] The front filter is located at the front end and is used to filter out visible light and infrared light;

[0048] The slit is a single slit, which serves as an entrance pupil and is used to limit the solar radiation entering the spectral device, and the light collecting area is the slit area;

[0049] The concave grating is used to receive the light beam from the slit, realize dispersion splitting and refocusing of light beams of different wavelengths. Specifically, light beams of different positions and different bands emitted from the slit are refocused along the spectral direction to realize dispersion splitting and multi-band selection. High spectral resolution is obtained in multiple bands by optimizing grating parameters, and high efficiency is obtained in multiple bands by coating multi-layer film structures of different combinations.

[0050] The detector is used to realize the simultaneous reception and recording of light beams at different positions and wavelengths of the slits, and radiation of different wavelength bands is received by multiple area array detectors.

[0051] The data processing unit is used to process the spectra received by multiple array detectors, reduce the amount of data transmitted, compress the data, and obtain a one-dimensional full-day area integral spectrum with high spectral resolution and high signal-to-noise ratio.

[0052] In a specific embodiment, the front filter is circular, made of Al, and has a thickness of 200 nm.

[0053] In a specific embodiment, the slit is a single slit opened on the metal sheet, the slit width is 0.01-0.06 mm, and the slit length b=2-15 mm;

[0054] In a specific embodiment, the concave grating is a rectangular groove with an aperture of 20-40 mm, a radius of curvature of 400-1000 mm, a grating period of 200-400 nm, a duty cycle of 0.4-0.6, and a multilayer film stack is arranged on the concave grating substrate. The grating aperture needs to be larger than the size of the incident sunlight, and the calculation method is d=r1×tan(Φ)+b, where d is the size of the solar image, r1 is the distance from the slit to the grating, Φ is the observation field, and b is the slit length.

[0055] In a specific embodiment, the multilayer film stack is composed of two or more materials with high atomic number and low atomic number that are periodically alternating, the thickness of each period is 5nm-50nm, and the number of multilayer film periods is 3-40; the high atomic number materials include Al, Zr, Mg, Mo, and Sc; the low atomic number materials include B4C, Si and SiC.

[0056] In a specific embodiment, the detector is a back-illuminated sCMOS scientific-grade camera or a CCD camera or an image-enhanced ICMOS, with an array size of 2k×2k and a frame rate greater than 1 frame per second.

[0057] In a specific embodiment, the observation field Φ of the full-day area integral extreme ultraviolet spectrometer is 40', and the observation band λ=10-120nm.

[0058] The observation bands of the full-day area integral extreme ultraviolet spectrometer include three bands: 18.3-21.3nm, 49.6-52.9nm, and 100-105nm; there are different ionized coronal lines between 18.3-21.3nm (Fe VIII 18.521, Fe X 18.454, FeXI 18.823, Fe XII 19.512, Fe XIII 20.204, Fe XIV 21.132), and the 49.6-52.9nm and 100-105nm bands include transition zone lines such as O III 52.6nm and O VI 103.2nm, so that temperature coverage of tens of thousands of degrees, tens of temperatures, and millions of degrees can be achieved; there is also a density-sensitive line pair of Fe XII 19.512 / 18.688, and the Fe XII 19.5nm and other lines can also observe the darkening of the coronal sky.

[0059] On the other hand, the present invention implements a method for obtaining a multi-band high spectral resolution full-day area integral extreme ultraviolet spectrum, the method using the above-mentioned full-day area integral extreme ultraviolet spectrum device, the method comprising:

[0060] S1. Determine the parameters of the spectral device according to the solar observation field Φ and the observation band λ;

[0061] S2. The spectral device starts from the slit and is a non-focus slit spectral device without an imaging system. After the sunlight passes through the pre-filter, visible light and infrared light are filtered out; then it enters the slit, and the concave multi-layer film grating receives the extreme ultraviolet radiation of the entire solar disk, refocusing the beams of multiple bands and different wavelengths; the detector receives and records the beams of different wavelengths in the slit direction at the same time;

[0062] S3, respectively counting the light spots of different wavelengths and calculating the spectral resolution;

[0063] S4. The spectrum data processing unit processes the spectrum received by the multiple detectors.

[0064] In a specific embodiment, in step S1, the parameters of the spectral device include: filter type, slit width, slit length, slit size, concave grating aperture, concave grating curvature radius, grating period, grating duty cycle, multilayer film stack material and period thickness, detector type, data processing unit configuration (including the type of data processing unit and the algorithm built therein, the type includes FPGA or CPU and its affiliated circuits, and the algorithm includes a row-by-row sub-pixel translation algorithm).

[0065] Embodiment 1:

[0066] This embodiment designs a multi-band high spectral resolution full-day surface integral extreme ultraviolet spectrum device structure for the 18.3-21.3nm, 49.6-52.9nm, and 100-105nm bands. The specific design method includes the following steps:

[0067] 1) Set the solar observation field of view Φ to 40', and the observation band λ to 18.3-21.3nm, 49.6-52.9nm, 100-105nm.

[0068] 2) The detector pixel size is 11 μm. According to the sampling theorem and the relationship between the slit width and the spectral resolution, the slit width is at least 22 μm and is set to 33 μm. The slit length is selected to be 10 mm.

[0069] 3) The concave grating is a rectangular groove with a curvature radius of 598.2 mm, a grating period of 285.2 nm, a duty cycle of 0.5, and a solar image size on the grating of d = r1 × tan (Φ) + b, where r1 is 600 mm, Φ is 40', and b is 10 mm. The calculated solar image on the grating is 16.9 mm, and the grating aperture is set to 25 mm;

[0070] 4) For the 18.3-21.3nm, 49.6-52.9nm, 100-105nm bands and application working angles, for 18.3-21.3nm, Al / Mo / B4C is selected as the multilayer film material combination, for 49.6-52.9nm, Al / B4C is selected as the multilayer film material combination, and for 100-105nm, B4C material is selected to determine the planar multilayer film parameters corresponding to the incident wavelength and angle. The optimal multilayer film structure for the three bands is B4C / Al_[12.5nm / 21nm] 2 +B4C / Mo / Al_[1.5nm / 3nm / 6.1nm] 4 +B4C / Mo / Al_[1.5nm / 3nm / 5nm] 5 , the period number is 11, after considering the grating efficiency and the reflectivity of the multilayer film, the absolute efficiency of the grating in the three target bands is shown in Figure 2 a);

[0071] 5) By performing ray tracing with ZEMAX software, we can obtain the distribution of the light spot position and geometric line dispersion of different wavelengths on the detector, and obtain the spectral resolution of different bands, such as Figure 2 As shown in (b), the spectral resolution of all bands is better than 0.018 nm, the spectral resolution at 18.3-21.3 nm is better than 1000, the spectral resolution at 49.6-52.9 nm is better than 2700, and the spectral resolution at 100-105 nm is better than 5000.

[0072] 6) The basic algorithm flow in the data processing unit is: first, take multiple frames of images with the same exposure time as the observed spectrum, which can be achieved by non-solar pointing of the satellite, and calculate the dark field based on multiple frames of images; second, take the full solar area spectrum, such as Figure 3 As shown in a); Third, take the spectrum minus the dark field to obtain the spectrum after dark field correction, as shown in Figure 3 As shown in (b), after dark field correction, the spectral profile is basically clear; Fourth, identify and correct the hot and bad pixels in the dark field reduction image, identify the pixel position through threshold judgment, and then replace the hot and bad pixel values ​​through nearby pixel interpolation; Fifth, calculate the spectral tilt and curvature based on the spectrum after dark field reduction, and correct it through the line-by-line sub-pixel translation algorithm; Finally, superimpose all spectra along the slit direction to obtain the full-day area integrated spectral line, as shown in Figure 3 As shown in (c).

[0073] The present invention provides a full-sun surface integral extreme ultraviolet spectrum device and an on-orbit data processing method, wherein the spectrum device comprises a front filter, a slit, a concave grating and a detector; the front filter is located at the front end and is used to filter out visible light and infrared light; the slit is located at the entrance pupil and is used to receive full-sun surface solar radiation, and the light collecting area is the slit area; the concave grating is used to refocus light beams of different bands emitted from different positions of the slit along the spectral direction to achieve dispersion spectrometry and multi-band selection, and high spectral resolution is obtained in multiple bands by optimizing grating parameters, and high efficiency is obtained in multiple bands by plating multi-layer film structures of different combinations; the detector is used to receive high-resolution spectra of different bands, and radiation of different bands is received by multiple area array detectors.

[0074] In order to reduce the amount of space payload detection data transmitted, the present invention also proposes an on-orbit data processing method. First, dark field calibration is performed on-orbit and dark field is calculated. After each set of test data is corrected for dark field reduction, spectral line bending and tilt, it is superimposed along the slit direction. Without losing spectral resolution, the integrated spectral signal-to-noise ratio can be significantly improved, and the amount of transmitted data can be reduced by three orders of magnitude. The present invention uses the sun as a star for radiation integral detection, detects the radial velocity of coronal mass ejections through spectral line blueshift asymmetry, and analyzes coronal eruption events through radiation variation laws, which is of great value to solar physics research and space weather monitoring and forecasting.

[0075] The present invention uses a normal incidence multilayer film grating to achieve full-day area integral spectroscopy measurement with multi-band, high spectral resolution, and high temporal resolution. Compared with the previous grazing incidence full-day area integral spectroscopy device, the spectral resolution is higher, and it is expected to obtain the radial velocity of coronal ejection materials of tens of thousands to millions of degrees; through the on-orbit processing unit, the two-dimensional images of multiple detectors are processed into a one-dimensional spectrum with a higher signal-to-noise ratio without losing the spectral resolution. The present invention can obtain a full-day area integral spectrum with high spectral resolution, and calculate the CME radial velocity through the asymmetry of spectral lines, which is of great value to solar physics research and space weather monitoring and forecasting.

[0076] The above is a detailed introduction to a full-day area integral extreme ultraviolet spectroscopy device and an on-orbit processing method provided in the embodiments of the present application. The description of the above embodiments is only used to help understand the method and core idea of ​​the present application; at the same time, for those skilled in the art, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

[0077] For example, certain words are used in the specification and claims to refer to specific components. Those skilled in the art should understand that hardware manufacturers may use different nouns to refer to the same component. This specification and claims do not use differences in names as a way to distinguish components, but use differences in the functions of components as the criteria for distinction. As mentioned throughout the specification and claims, "including" and "comprising" are open-ended terms, so they should be interpreted as "including / including but not limited to". "Approximately" means that within an acceptable error range, those skilled in the art can solve the technical problem within a certain error range and basically achieve the technical effect. The subsequent description of the specification is a preferred embodiment of the present application, but the description is for the purpose of illustrating the general principles of the present application, and is not used to limit the scope of the present application. The scope of protection of the present application shall be determined by the definition of the attached claims.

[0078] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a product or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such a product or system. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the product or system including the elements.

[0079] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0080] The above description shows and describes several preferred embodiments of the present application, but as mentioned above, it should be understood that the present application is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the application concept described herein through the above teachings or the technology or knowledge of the relevant field. The changes and modifications made by those skilled in the art do not deviate from the spirit and scope of the present application, and should be within the scope of protection of the claims attached to the present application.

Claims

1. A full-day area integral extreme ultraviolet spectroscopy device, characterized in that: The full-day area integral extreme ultraviolet spectrum device comprises a front filter, a slit assembly, a concave grating, a detector and a data processing module in sequence; The front filter is used to filter out visible light and infrared light; The slit assembly is used to receive solar radiation; The concave grating is used to receive solar radiation passing through the slit assembly, realize dispersion and splitting, and refocus light beams of different wavelengths; The detector is used to realize the simultaneous reception and recording of light beams at different positions and wavelengths of the slits, and radiation of different wavelength bands is received by multiple array detectors; The data processing module is used to process the spectra received by multiple array detectors, reduce the amount of data transmitted, and compress the data to obtain a one-dimensional full-day area integral spectrum with high spectral resolution and high signal-to-noise ratio; The front filter is located at the front end close to solar radiation, the slit assembly is located behind the front filter, one end of the concave grating is connected to the data processing module through a detector, and the other end is connected to the slit assembly.

2. The full-day area integral extreme ultraviolet spectrometer according to claim 1, characterized in that: The slit assembly is a single slit opened on the metal sheet. The single slit is vertically arranged in the middle of the metal sheet. The slit width is 0.010-0.060 mm, and the slit length b=2-15 mm.

3. The full-day area integral extreme ultraviolet spectrometer according to claim 1, characterized in that: The aperture of the concave grating is 20-40 mm, the radius of curvature is 400-1000 mm, the grating period is 200-400 nm, the duty cycle is 0.4-0.6, and a multilayer film stack is arranged on the concave grating substrate.

4. The full-day area integral extreme ultraviolet spectrometer according to claim 3, characterized in that: The aperture of the concave grating is larger than the size of the incident solar spot at the position, wherein the solar spot is calculated as follows: d = r1 × tan(Φ) + b; Among them, d is the size of the solar spot, r1 is the distance from the slit to the grating, Φ is the observation field of view, and b is the slit length.

5. The full-day area integral extreme ultraviolet spectrometer according to claim 3, characterized in that: The multilayer film stack is composed of two or more materials with high atomic number and low atomic number that are periodically alternating, and high efficiency can be achieved in multiple observation bands λ. The thickness of each period is 5nm-50nm, and the number of multilayer film periods is 3-40; the high atomic number materials include Al, Zr, Mg, Mo and Sc; the low atomic number materials include B4C, Si and SiC.

6. The full-day area integral extreme ultraviolet spectrometer according to claim 4, characterized in that: The observation field of view Φ≥40', and the observation band λ is 10-120nm.

7. The full-day area integral extreme ultraviolet spectrometer according to claim 1, characterized in that: The detector is a back-illuminated sCMOS scientific-grade camera or a CCD camera or an image-enhanced ICMOS, with an array size of 2k×2k and a frame rate greater than 1 frame per second.

8. The full-day area integral extreme ultraviolet spectrometer according to claim 1, characterized in that: The data processing module is an FPGA or CPU and its auxiliary circuits, which are used to reduce the 2k×2k data size to 2k×1 data size after averaging along the slit direction by dark field reduction, deducting hot pixels, and correcting spectral tilt and curvature.

9. An on-orbit data processing method for a full-day area integral extreme ultraviolet spectrometer, characterized in that: The on-orbit data processing method is implemented by the full-day area integral extreme ultraviolet spectrometer according to any one of claims 1 to 8, and the on-orbit data processing method comprises: S1. Determine the structural parameters of the component according to the solar observation field Φ and the observation band λ; S2, after the sunlight passes through the pre-filter, visible light and infrared light are filtered out; then it enters the slit, and the concave multi-layer film grating receives the solar extreme ultraviolet beam of the entire solar disk, and refocuses the beams of multiple bands and different wavelengths; the detector receives and records the beams of multiple wavelengths at different positions of the slit at the same time; S3, the data processing module corrects the detection data of multiple detectors respectively; S4. Count the spectral data of multiple bands respectively and calculate the spectral resolution.

10. The on-orbit data processing method according to claim 9, characterized in that: The element structural parameters in step S1 include: filter material, filter size, slit width, slit length, concave grating aperture, concave grating curvature radius, grating period, grating duty cycle, multilayer film stack material and period thickness, detector type, detector array size and parameters of the data processing unit.

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