Universal single event lock-in effect protection circuit with adjustable multi-channel lock-in current threshold

Abstract

The invention discloses a universal single event lock-in effect protection circuit with adjustable multi-channel lock-in current threshold values, and belongs to the field of single event lock-in protection. The circuit comprises a switching circuit, a current monitoring and converting circuit, a voltage comparison circuit, a CPLD (Complex Programmable Logic Device) execution circuit, an MCU (Microprogrammed Control Unit) control circuit and a locking current threshold setting circuit, a locking protection threshold of current can be preset, and any locking threshold current setting can be realized even if the protection circuit is in hardware connection with a load device. Meanwhile, multiple paths of real-time current and voltage can be monitored, and when one path or multiple paths of current reach a locking threshold value, any path or multiple paths of voltage can be cut off, single event locking effect protection is completed, and a load device is protected.

Description

Technical Field

[0001] The invention relates to a universal single-particle lock-up effect protection circuit with adjustable multi-path lock-up current thresholds, belonging to the field of single-particle lock-up protection. Background Art

[0002] When working in a space environment, load devices will randomly encounter particles from space radiation. When high-energy particles hit the inside of the device, they will generate electrons and holes due to ionization, causing circuit errors. This is a common single-particle effect for aerospace devices. The main structural unit of a typical ultra-large-scale digital integrated circuit using CMOS technology is the CMOS transistor, so the main radiation effect of such devices is related to the radiation effect of the CMOS tube.

[0003] There are many parasitic components in the circuit of CMOS process. If these parasitic components are not reinforced, they may form PNPN structure and produce locking effect. When the positive feedback circuit in the satellite or circuit enters the working state, the current will be continuously amplified, and finally a large conduction current will be formed between the power supply and the ground, which will destroy the normal operation of the circuit and even burn the whole chip. This is the basic process and principle of single particle locking effect.

[0004] In satellites, dedicated single-particle lockout protection circuits are usually designed for load devices that are prone to single-particle lockout, and corresponding single-particle test protection systems need to be built according to the device type. The system development cost is high, the cycle is long, the compatibility is low, and the engineering application is relatively limited. Summary of the invention

[0005] The technical problem solved by the present invention is: to overcome the shortcomings of the prior art and propose a universal single-particle lock-in effect protection circuit with adjustable multi-path lock-in current thresholds, which is used for single-particle lock-in effect protection of load devices. When a single-particle lock-in effect occurs, the power input of the load device can be cut off in time, and the changes in data such as the voltage and current of the load device power supply can be monitored in real time.

[0006] The technical solution of the present invention is:

[0007] A universal single-particle lock-up effect protection circuit with adjustable multi-channel lock-up current thresholds, comprising a switch circuit, a current monitoring and conversion circuit, a voltage comparison circuit, a CPLD execution circuit, an MCU control circuit, and a lock-up current threshold setting circuit;

[0008] The MCU control circuit sends a threshold setting instruction to the locking current threshold setting circuit, receives feedback information from the voltage comparison circuit, and sends a manual load channel shutdown instruction to the CPLD execution circuit according to the feedback information;

[0009] The CPLD execution circuit receives a manual load channel shut-off instruction, sends a shut-off instruction to the switch circuit, and sends an automatic restart instruction to the switch circuit after a set interval time;

[0010] The switch circuit closes the corresponding channel of the load device according to the closing instruction, and opens the corresponding channel of the load device according to the automatic restart instruction;

[0011] The current monitoring and conversion circuit collects the current value of each channel of the load device in real time, converts it into a voltage value of the same value, generates a voltage signal and sends it to the voltage comparison circuit;

[0012] The voltage comparison circuit receives the reference voltage of each channel and compares the voltage signal of each channel with the corresponding reference voltage. If it exceeds the threshold, it is determined to be locked and fed back to the MCU control circuit;

[0013] The locking current threshold setting circuit receives the threshold setting instruction, obtains the single-particle locking protection current threshold of each channel of the load device, and converts it into the corresponding reference voltage of each channel and sends it to the voltage comparison circuit.

[0014] Furthermore, the current monitoring and conversion circuit collects the current value of each channel of the load device in real time, converts it into a voltage value through the Hall sensor and amplifies the voltage value, so that the voltage value corresponding to each channel of the load device after amplification is equal to the collected current value.

[0015] Furthermore, according to the coefficient of converting the unit current of the Hall sensor into a voltage value, the resistance value used for voltage amplification is determined so that the voltage value corresponding to each channel of the load device after amplification is equal to the collected current value.

[0016] Furthermore, the switch circuit includes a MOSFET driver and an NMOS, and the CPLD execution circuit sends a signal to the MOSFET driver to control the on-off of the NMOS, thereby controlling the on-off of the power input channel of the load device.

[0017] Furthermore, the locking current threshold setting circuit includes an LDO and a digital potentiometer, receives a threshold setting instruction sent by the MCU control circuit, parses to obtain the current threshold requirements of each channel, changes the resistance value of the digital potentiometer, adjusts the voltage division of the LDO output voltage, obtains a reference voltage corresponding to the current threshold of each channel, and outputs it to the voltage comparison circuit.

[0018] Furthermore, the reference voltage of each channel output by the locking current threshold setting circuit is:

[0019] V REFn =4.56R wl / (1000+R wl )

[0020] Rwl =70+D n ×10000 / 1023

[0021] Where V REFn is the reference voltage of the ith channel, D n is the current threshold of the ith channel, R wl is the resistance value of the digital potentiometer.

[0022] Furthermore, it also includes a voltage monitoring circuit for collecting the voltage value of each channel of the load device in real time.

[0023] Furthermore, the universal single-particle latching effect protection circuit is externally powered by a programmable voltage, and the required power supply voltage is provided to the load device through the input and output of the circuit.

[0024] Furthermore, the universal single-particle latching effect protection circuit simultaneously monitors and switches multiple load devices through the data bus and the power distribution unit to complete the control of multiple load devices.

[0025] The advantages of the present invention compared with the prior art are:

[0026] (1) The present invention can monitor the real-time current and voltage of multiple loads. When one or more currents reach the locking threshold, any one or more voltages can be cut off to complete single-particle locking effect protection and protect the load devices.

[0027] (2) The present invention can preset a current locking protection threshold, and even if the protection circuit has completed hardware connection with the load device, any locking threshold current setting can be achieved.

[0028] (3) The locking protection circuit and the load device in the present invention are connected in a modular manner and can be connected to any load device, thus having strong versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present invention. Moreover, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0030] Figure 1 A block diagram of a general single-particle latch-up effect protection circuit system according to an embodiment of the present invention;

[0031] Figure 2 This is a connection diagram of the detection device and the load device according to an embodiment of the present invention;

[0032] Figure 3This is a multi-channel topological structure diagram of a universal single-particle latch-up effect protection circuit according to an embodiment of the present invention. DETAILED DESCRIPTION

[0033] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0034] The present invention proposes a universal single-particle lock-up effect protection circuit with adjustable multi-path lock-up current threshold, such as Figure 1 As shown, it includes a switch circuit, a current monitoring circuit, a voltage monitoring circuit, a voltage amplification circuit, a voltage comparison circuit, a CPLD execution circuit, and an MCU control circuit.

[0035] The switch circuit turns on and off the power input channel of the load device according to the switch control instruction issued by the CPLD execution circuit. The switch circuit is composed of a MOSFET driver and an NMOS. The CPLD execution circuit sends a signal to the MOSFET driver to control the on and off of the NMOS, thereby controlling the on and off of the input power. When an overcurrent occurs during the operation of the single-particle lock protection circuit, the CPLD sends a switch-off signal to the switch circuit, so that the load power supply path is cut off within 120ns. Then the CPLD sends an automatic restart signal after a period of time to open the switch.

[0036] The current monitoring circuit is responsible for collecting the current value of each channel of the load device in real time, converting it into a voltage value through the Hall sensor and feeding it back to the voltage comparison circuit through the voltage amplifier circuit.

[0037] The voltage monitoring circuit is responsible for collecting the voltage values ​​of each channel of the load device in real time.

[0038] The voltage amplifier circuit is responsible for amplifying the voltage signal. The amplified voltage V out_n for:

[0039] V out_n =I n ×Sens[1+(R 83 +R 84 ) / R 85 ]

[0040] In the formula, I n is the current value of each channel of the load device collected, Sens is the coefficient of the voltage value converted from the unit current of the Hall sensor, which is 264mv / A in this embodiment, so the peripheral resistance of the voltage amplifier circuit is set to R 83 +R 84=7.36K, R 85 =2.64K, achieving an input current of 1A corresponding to an adjustable reference voltage of 1V.

[0041] The lock current threshold setting circuit consists of an LDO and a digital potentiometer, which is responsible for setting the single-particle lock threshold. The threshold adjustment signal D is sent from the MCU n The digital potentiometer is used to adjust the voltage division of the LDO output voltage as the set current threshold. The digital potentiometer resistor divider circuit changes the resistance value R of the digital potentiometer. wl , realize the step-down output of LDO, and form the final setting reference voltage V REFn MCU inputs the binary number of the digital potentiometer into a decimal number D n , then V REFn With D n The relationship between them is:

[0042] V REFn =4.56R wl / (1000+R wl )

[0043] R wl =70+D n ×10000 / 1023

[0044] The voltage comparison circuit is responsible for comparing the single-particle lock current threshold. If it exceeds the threshold, it will be fed back to the MCU, and the MCU will issue an instruction to shut down the load path. The voltage comparison circuit compares the collected current of each channel with the set current threshold to determine whether the circuit has an overcurrent phenomenon. If the operating current of the load device exceeds the set threshold current, it is judged as locked. If locked, the CPLD will send a power-off signal to the switch module to protect the load device.

[0045] The CPLD execution circuit is responsible for receiving the result of the voltage comparison circuit, and automatically executing the switch control instruction to the switch circuit to execute the on and off of the specified channel circuit.

[0046] The MCU control circuit is responsible for sending threshold setting instructions to set the lock protection threshold current of each channel; at the same time, it sends manual shutdown instructions to the CPLD execution circuit.

[0047] The invention proposes a universal single-particle lock-up effect protection circuit with adjustable multi-path lock-up current threshold, which is applied to engineering tests and connected as follows: Figure 2 and Figure 3 As shown, Figure 2The external program-controlled power supply provides the universal single-particle lock effect protection circuit with a 5V power supply voltage for the entire board and a 3.3V power supply voltage for the MCU and CPLD. At the same time, the input and output modules of the universal single-particle lock effect protection circuit provide the required power supply voltage to the load device. If the load device is locked during the test, the power supply of the load device is manually or automatically cut off through the universal single-particle lock effect protection circuit. Figure 3 This is a multi-channel topology diagram of a universal single-particle locking effect protection circuit in an embodiment of the present invention. The present invention can simultaneously monitor and switch multiple load devices 1#~N# through a data bus and a power distribution unit, and complete the control of multiple load devices during the test.

[0048] The above-described embodiments are only preferred specific implementations of the present invention. Common changes and substitutions made by those skilled in the art within the scope of the technical solution of the present invention should be included in the protection scope of the present invention.

Claims

1. A universal single-particle lock-up effect protection circuit with adjustable multi-way lock-up current threshold, characterized in that: It includes a switch circuit, a current monitoring and conversion circuit, a voltage comparison circuit, a CPLD execution circuit, an MCU control circuit, and a locking current threshold setting circuit; The MCU control circuit sends a threshold setting instruction to the locking current threshold setting circuit, receives feedback information from the voltage comparison circuit, and sends a manual load channel shutdown instruction to the CPLD execution circuit according to the feedback information; The CPLD execution circuit receives a manual load channel shut-off instruction, sends a shut-off instruction to the switch circuit, and sends an automatic restart instruction to the switch circuit after a set interval time; The switch circuit closes the corresponding channel of the load device according to the closing instruction, and opens the corresponding channel of the load device according to the automatic restart instruction; The current monitoring and conversion circuit collects the current value of each channel of the load device in real time, converts it into a voltage value of the same value, generates a voltage signal and sends it to the voltage comparison circuit; The voltage comparison circuit receives the reference voltage of each channel and compares the voltage signal of each channel with the corresponding reference voltage. If it exceeds the threshold, it is determined to be locked and fed back to the MCU control circuit; The locking current threshold setting circuit receives the threshold setting instruction, obtains the single-particle locking protection current threshold of each channel of the load device, and converts it into the corresponding reference voltage of each channel and sends it to the voltage comparison circuit.

2. The universal single-particle lock-up effect protection circuit with adjustable multi-way lock-up current threshold according to claim 1, characterized in that: The current monitoring and conversion circuit collects the current value of each channel of the load device in real time, converts it into a voltage value through the Hall sensor and amplifies the voltage value so that the voltage value corresponding to each channel of the load device after amplification is equal to the collected current value.

3. The universal single-particle lock-up effect protection circuit with adjustable multi-way lock-up current threshold according to claim 2, characterized in that: According to the coefficient of converting the unit current of the Hall sensor into a voltage value, the resistance value used for voltage amplification is determined so that the voltage value corresponding to each channel of the load device after amplification is equal to the collected current value.

4. The universal single-particle latch-up effect protection circuit with adjustable multi-path latching current threshold according to claim 1, characterized in that: The switch circuit includes a MOSFET driver and an NMOS. The CPLD execution circuit sends a signal to the MOSFET driver to control the on / off of the NMOS, thereby controlling the on / off of the power input channel of the load device.

5. The universal single-particle lock-up effect protection circuit with adjustable multi-way lock-up current threshold according to claim 1, characterized in that: The locking current threshold setting circuit includes an LDO and a digital potentiometer. It receives the threshold setting instruction sent by the MCU control circuit, parses and obtains the current threshold requirements of each channel, changes the resistance value of the digital potentiometer, adjusts the voltage division of the LDO output voltage, obtains the reference voltage corresponding to the current threshold of each channel, and outputs it to the voltage comparison circuit.

6. The universal single-particle latch-up effect protection circuit with adjustable multi-path latching current threshold according to claim 5, characterized in that: The reference voltage of each channel output by the locking current threshold setting circuit is: V REFn =4.56R wl / (1000+R wl ) R wl =70+D n ×10000 / 1023 Where V REFn is the reference voltage of the ith channel, D n is the current threshold of the ith channel, R wl is the resistance value of the digital potentiometer.

7. The universal single-particle latch-up effect protection circuit with adjustable multi-path latching current threshold according to claim 1, characterized in that: It also includes a voltage monitoring circuit for collecting the voltage value of each channel of the load device in real time.

8. The universal single-particle latch-up effect protection circuit with adjustable multi-path latching current threshold according to claim 1, characterized in that: The universal single-particle latching effect protection circuit is externally connected to a program-controlled voltage power supply, and the required power supply voltage is provided to the load device through the input and output of the circuit.

9. The universal single-particle latch-up effect protection circuit with adjustable multi-path latching current threshold according to claim 1, characterized in that: The universal single-event latch effect protection circuit monitors and switches multiple load devices simultaneously through a data bus and a power distribution unit to complete the control of multiple load devices.

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