Measuring device for magnetic induction intensity distribution in induction pulse plasma thruster

Abstract

The invention provides a device for measuring magnetic induction intensity distribution in an induction pulse plasma thruster, and relates to the technical field of measurement of magnetic induction intensity in the induction pulse plasma thruster, and the device comprises a calculation assembly, a magnetic probe fixing assembly, a plurality of magnetic probes and a plurality of groups of measurement assemblies. Each magnetic probe comprises a plurality of inductance coils arranged according to a preset interval; each inductance coil corresponds to one group of measuring components; each group of measuring assembly comprises a twisted pair, a passive integrating circuit, a signal transmission cable and an oscilloscope; the multiple magnetic probes are arranged in the axial direction of the cavity of the induction pulse plasma thruster in parallel and evenly fixed to the upper half portion in the cavity through the magnetic probe fixing assembly, and the tail ends of the multiple magnetic probes are all located on the center line of the cavity. A plurality of magnetic probes can realize full coverage of measurement of a space magnetic field in a cavity of the induction pulse plasma thruster, and magnetic induction intensity distribution in the induction pulse plasma thruster can be obtained through measurement.

Description

Technical Field

[0001] The present invention relates to the technical field of measuring magnetic induction intensity in an induction pulse plasma thruster, and in particular to a device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster. Background Art

[0002] To meet the mission requirements of deep space exploration, long-life, high-specific-impulse space electric propulsion technologies, represented by Hall and ion thrusters, are booming. Compared to traditional continuous-flow thrusters like Hall and ion thrusters, induction pulsed plasma thrusters (IPPs) are electrodeless electromagnetic thrusters that avoid electrode ablation. They offer advantages such as high specific impulse, high efficiency, high power, and a diverse working fluid. However, IPPs, especially those with field-reversed configurations, operate in a pulsed mode, with rapid plasma generation and dissipation, resulting in high-frequency fluctuations in the magnetic field in space at megahertz levels. During operation, the distribution of the electromagnetic field in space significantly influences the thruster's thrust, efficiency, specific impulse, and total impulse. For example, the thrust of a thruster is related to the magnitude of the angular current, which in turn depends on the frequency of the rotating magnetic field generated by the rotating magnetic field antenna. Therefore, there is an urgent need for an effective and reliable diagnostic measurement device to measure the spatial distribution of the high-frequency magnetic induction intensity within the thruster, enabling performance evaluation and subsequent improvements. Summary of the Invention

[0003] The purpose of the present invention is to provide a device for measuring the magnetic induction intensity distribution inside an induction pulse plasma thruster, so as to provide an effective and reliable device for measuring the spatial distribution of the magnetic induction intensity of the high-frequency magnetic field inside the thruster.

[0004] In a first aspect, the present invention provides a device for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster, comprising: a computing component, a magnetic probe fixing component, multiple magnetic probes, and multiple groups of measuring components; each magnetic probe comprises: multiple induction coils arranged at preset intervals; each induction coil corresponds to a group of measuring components; each group of measuring components comprises: a twisted pair, a passive integrating circuit, a signal transmission cable, and an oscilloscope; the multiple magnetic probes are arranged axially and parallel to each other along the cavity of the induction pulse plasma thruster and are uniformly fixed to the upper half of the cavity by the magnetic probe fixing component, with the ends of the multiple magnetic probes all located on the centerline of the cavity; the two ends of each induction coil are connected to the input end of the passive integrating circuit via a twisted pair, and the output end of the passive integrating circuit is connected to the oscilloscope via a signal transmission cable; the passive integrating circuit, signal transmission cable, oscilloscope, and computing component are all located outside the cavity; the computing component collects the signal voltage of each oscilloscope and determines the magnetic induction intensity at the spatial position of each induction coil based on the signal voltage, the time constant of the passive integrating circuit, and the sensitivity of the induction coil, thereby obtaining the magnetic induction intensity distribution within the induction pulse plasma thruster.

[0005] Optionally, the magnetic probe is a PCB circuit board with a plurality of inductor coils welded on the surface at preset intervals, and the arrangement directions of the plurality of inductor coils are consistent.

[0006] Optionally, it also includes: multiple quartz protective covers; each magnetic probe is covered with a quartz protective cover.

[0007] Optionally, the bottom end of each quartz protective cover is closed and the top end is open, and the opening is a boss structure with a groove. After each quartz protective cover is inserted into the magnetic probe fixing assembly, the groove is complementary connected with the limiting boss on the magnetic probe fixing assembly.

[0008] Optionally, the boss with the groove includes: a first groove and a second groove, and the first groove and the second groove are respectively arranged on both sides of the opening.

[0009] Optionally, the magnetic probe fixing assembly includes: a fixing rod, a fixing plate and a glass cover; the fixing rod is a groove structure, attached to the inner surface of the upper half of the cavity, and is used to connect with multiple quartz protective covers; the glass cover is used to cover the groove structure of the fixing rod; the fixing plate is fixedly connected to the edge of the cavity and the fixing rod respectively; a hole is opened at the connection between the fixing rod and the fixing plate, so that the twisted pair cable can be led out from the inside of the cavity to the passive integration circuit through the hole.

[0010] Optionally, the passive integration circuit includes: a resistor and a capacitor; the first end of the resistor is connected to the first lead-out end of the twisted pair, and the second end of the resistor is connected to the first end of the capacitor and the first access end of the signal transmission cable; the second end of the capacitor is respectively connected to the second lead-out end of the twisted pair and the second access end of the signal transmission cable.

[0011] Optionally, the cutoff frequency of the passive integration circuit is N times the frequency of the magnetic field in the induction pulse plasma thruster, where N is less than 1.

[0012] Optionally, the inductor coil is a coreless coil.

[0013] In a second aspect, the present invention provides a method for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster, which is applicable to the device for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster according to any of the aforementioned embodiments, and comprises: obtaining a time constant of a passive integration circuit and a sensitivity of an inductor coil in the device for measuring the magnetic induction intensity distribution within the induction pulse plasma thruster; collecting a signal voltage from each oscilloscope in the device for measuring the magnetic induction intensity distribution within the induction pulse plasma thruster; and determining the magnetic induction intensity at the spatial position of each inductor coil based on the signal voltage, the time constant of the passive integration circuit, and the sensitivity of the inductor coil, to obtain the magnetic induction intensity distribution within the induction pulse plasma thruster.

[0014] The present invention provides a device for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster. The device comprises a computing component, a magnetic probe fixing component, multiple magnetic probes, and multiple groups of measuring components. Each magnetic probe comprises multiple inductance coils arranged at preset intervals. Each inductance coil corresponds to a group of measuring components. Each group of measuring components comprises a twisted pair of cables, a passive integrating circuit, a signal transmission cable, and an oscilloscope. The multiple magnetic probes are arranged axially and parallel to each other within the induction pulse plasma thruster cavity and are evenly fixed to the upper half of the cavity by the magnetic probe fixing component. The ends of the multiple magnetic probes are all located on the centerline of the cavity. Thus, the multiple magnetic probes can achieve full coverage of the spatial magnetic field measurement within the induction pulse plasma thruster cavity. During the measurement process, the induced electromotive force generated by each inductance coil is integrated by the passive integrating circuit and then connected to the oscilloscope. The computing component collects the signal voltage of each oscilloscope and determines the magnetic induction intensity at the spatial position of each inductance coil based on the signal voltage, the time constant of the passive integrating circuit, and the sensitivity of the inductance coil, thereby obtaining the magnetic induction intensity distribution within the induction pulse plasma thruster. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the specific embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0016] Figure 1An isometric view of a field-reversed plasma thruster cavity provided by an embodiment of the present invention; Figure 2 A plurality of magnetic probes provided in an embodiment of the present invention Figure 1 Isometric view in the cavity shown; Figure 3 A plurality of magnetic probes provided in an embodiment of the present invention Figure 1 A half-section view of the cavity shown; Figure 4 A circuit schematic diagram of an inductor coil and its corresponding measurement component provided by an embodiment of the present invention; Figure 5 An isometric view of a magnetic probe composed of a PCB circuit board and an inductor coil provided in an embodiment of the present invention; Figure 6 An isometric view of a quartz protective sleeve provided by an embodiment of the present invention; Figure 7 An isometric view of a magnetic probe fixing assembly provided in an embodiment of the present invention.

[0017] Icons: 100-magnetic probe fixing assembly; 200-magnetic probe; 300-twisted pair cable; 400-passive integrator circuit; 500-signal transmission cable; 600-oscilloscope; 700-quartz protective cover; 201-inductor coil; 101-fixing rod; 102-fixing plate; 103-glass cover. DETAILED DESCRIPTION

[0018] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in various different configurations.

[0019] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention as claimed, but rather merely represents selected embodiments of the present invention. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort shall fall within the scope of protection of the present invention.

[0020] The following embodiments of the present invention are described in detail with reference to the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments may be combined with each other.

[0021] Example 1 An embodiment of the present invention provides a device for measuring the magnetic induction intensity distribution in an inductive pulsed plasma thruster, comprising: a calculation component, a magnetic probe fixing component 100, a plurality of magnetic probes 200, and a plurality of measurement components.

[0022] Each magnetic probe includes: a plurality of inductive coils 201 arranged at preset intervals; each inductive coil corresponds to a set of measurement components; each set of measurement components includes: a twisted pair 300, a passive integration circuit 400, a signal transmission cable 500 and an oscilloscope 600.

[0023] Multiple magnetic probes are arranged axially along the induction pulse plasma thruster cavity and are parallel to each other. They are evenly fixed to the upper half of the cavity through a magnetic probe fixing assembly, and the ends of the multiple magnetic probes are all located on the center line of the cavity.

[0024] Figure 1 An isometric view of a field-reversed plasma thruster cavity provided by an embodiment of the present invention. Figure 2 A plurality of magnetic probes provided in an embodiment of the present invention Figure 1 An isometric view of the cavity shown, Figure 3 A plurality of magnetic probes provided in an embodiment of the present invention Figure 1 It should be noted that the measuring device provided in the embodiment of the present invention is suitable for measuring the magnetic induction intensity in cavities of various shapes (short for induction pulse plasma thruster cavities). Figure 1 The shape of one cavity is shown only as an example.

[0025] In the measuring device provided by an embodiment of the present invention, all magnetic probes are arranged in parallel and axially evenly in the upper half of the cavity through a magnetic probe fixing assembly. The top ends of all magnetic probes are close to the inner wall of the cavity, and the ends (i.e., the bottom ends) are all located on the center line of the cavity. In other words, the line connecting the ends of all magnetic probes is the center line of the cavity.

[0026] Figure 3In the measuring device shown, there are three magnetic probes, and each magnetic probe is provided with an inductor coil at intervals of 5 mm. The three magnetic probes are provided with 9 inductor coils, 12 inductor coils, and 15 inductor coils, respectively. The embodiment of the present invention does not specifically limit the number of magnetic probes in the measuring device and the number of inductor coils on the magnetic probes. The user needs to adaptively set the number of magnetic probes according to the size of the cavity and the requirements for the resolution of the magnetic induction intensity. Obviously, the larger the size, the more magnetic probes and inductor coils; the higher the resolution requirement, the more magnetic probes and inductor coils. However, if the spacing between the inductor coils is too small, mutual interference will occur. Therefore, by reasonably designing the spacing between the magnetic probes and the spacing between the inductor coils on each magnetic probe, the spatial resolution of the magnetic induction intensity measurement in the cavity can be guaranteed. The embodiment of the present invention forms a magnetic probe array by arranging multiple magnetic probes along the axial direction, thereby achieving full coverage of the spatial magnetic field measurement in the cavity.

[0027] Before calculating the magnetic induction intensity, the sensitivity of the inductor coil must be determined in advance. To simplify the calibration process for the inductor coil's sensitivity, the inductor coil in the embodiment of the present invention is a coreless coil. The sensitivity of the inductor coil can also be obtained by consulting the manufacturer. To reduce the size of the magnetic probe to reduce interference with the plasma and improve the measurement accuracy of the magnetic field intensity, the smaller the inductor coil, the better. It is known that the inductance value of the inductor coil affects its sensitivity. If the inductance value is too small, the output voltage will be too low and the signal-to-noise ratio will decrease; if the inductance value is too large, its volume will increase accordingly. Therefore, users should select an inductor coil of appropriate size and inductance value based on actual testing requirements.

[0028] The two ends of each inductor coil are connected to the input end of the passive integration circuit through a twisted pair cable, and the output end of the passive integration circuit is connected to the oscilloscope through a signal transmission cable; the passive integration circuit, signal transmission cable, oscilloscope and computing components are all located outside the cavity.

[0029] The computing component collects the signal voltage of each oscilloscope, and determines the magnetic induction intensity at the spatial position of each inductor based on the signal voltage, the time constant of the passive integration circuit and the sensitivity of the inductor, thereby obtaining the magnetic induction intensity distribution within the induction pulse plasma thruster.

[0030] Figure 4 A circuit schematic diagram of an inductor coil and its corresponding measuring component provided by an embodiment of the present invention, through Figure 4 As can be seen, the output signal of the inductor is input into the passive integration circuit via a twisted pair, and the output signal of the passive integration circuit is transmitted to the oscilloscope via a signal transmission cable. Optionally, in order to shield electromagnetic interference, the twisted pair is made of copper enameled wire.

[0031] Oscilloscopes are known to have acquisition frequencies as high as GHz, enabling them to capture transient changes in the magnetic field at the same point in space during pulsed plasma thruster operation, enabling performance evaluation and subsequent optimization and improvement efforts. A computing component, connected to the oscilloscope, acquires the signal voltage received by each oscilloscope and, based on the signal voltage, the time constant of the passive integration circuit, and the sensitivity of the inductor, calculates the magnetic induction intensity at the spatial location of each inductor. The present invention does not impose specific limitations on the choice of computing component; as long as it can perform the aforementioned computational functions, the computing component can be a single-chip microcomputer, a computer, or the like.

[0032] The following is a detailed description of the principle of calculating magnetic induction intensity by the calculation component: According to Faraday's law of electromagnetic induction, the inductor coil will generate an induced electromotive force under the action of a high-frequency magnetic field. ,in, represents the induced electromotive force, represents the magnetic flux. Since the effective area of ​​the inductor is small enough that the magnetic field in the cavity is approximately uniform, the induced electromotive force can be written as ,in, Indicates the sensitivity of the inductor coil. The sensitivity is equal to the product of the number of turns of the inductor coil and its cross-sectional area. The unit is m 2 , Indicates the magnetic induction intensity. After the signal is re-integrated through the passive integration circuit, the signal voltage connected to the oscilloscope is obtained. ,in, Indicates the signal voltage of the oscilloscope, represents the time constant of the passive integration circuit. In other words, the oscilloscope signal voltage and magnetic induction intensity are linearly related. Therefore, given the oscilloscope signal voltage, the time constant of the passive integration circuit, and the sensitivity of the inductor, the magnetic induction intensity at a given moment at the corresponding spatial measurement point within the cavity (i.e., the location of the inductor) can be calculated using the above formula. The magnetic induction intensity at all spatial measurement points within the cavity constitutes the magnetic induction intensity distribution within the induction pulse plasma thruster.

[0033] An embodiment of the present invention provides a device for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster. The device comprises: a computing component, a magnetic probe fixing component, multiple magnetic probes, and multiple groups of measuring components. Each magnetic probe comprises: multiple inductance coils arranged at preset intervals; each inductance coil corresponds to a group of measuring components; each group of measuring components comprises: a twisted pair, a passive integrating circuit, a signal transmission cable, and an oscilloscope. The multiple magnetic probes are arranged axially and parallel to each other along the cavity of the induction pulse plasma thruster and are evenly fixed to the upper half of the cavity by the magnetic probe fixing component. The ends of the multiple magnetic probes are all located on the centerline of the cavity. Therefore, the multiple magnetic probes can achieve full coverage of the spatial magnetic field measurement within the induction pulse plasma thruster cavity. During the measurement process, the induced electromotive force generated by each inductance coil is integrated by the passive integrating circuit and then connected to the oscilloscope. The computing component collects the signal voltage of each oscilloscope and determines the magnetic induction intensity at the spatial position of each inductance coil based on the signal voltage, the time constant of the passive integrating circuit, and the sensitivity of the inductance coil, thereby obtaining the magnetic induction intensity distribution within the induction pulse plasma thruster.

[0034] In an optional embodiment, the magnetic probe is a PCB circuit board with a plurality of inductor coils welded on the surface at preset intervals, and the plurality of inductor coils are arranged in the same direction.

[0035] Figure 5 This is an isometric view of a magnetic probe comprising a PCB and an inductor coil, provided in an embodiment of the present invention. Optionally, a pair of solder pads is provided every 3-5 mm on the PCB, one of each soldering pad being soldered to the other end of the inductor coil. In other words, the inductor coil is soldered to the solder pads on the PCB to form the magnetic probe. Optionally, the PCB is made of FR-4 grade material.

[0036] In an optional embodiment, the device further includes: a plurality of quartz protective sleeves 700; and a quartz protective sleeve is respectively provided outside each magnetic probe.

[0037] Specifically, in order to prevent plasma from corroding the magnetic probe and ensure the stability and reliability of the magnetic probe, the embodiment of the present invention embeds the magnetic probe into a quartz protective cover. Optionally, the quartz protective cover adopts a quartz glass tube. Under the premise of ensuring that it does not interfere with the operation of the magnetic probe, the size of the quartz protective cover is minimized. Figure 3 As shown, all magnetic probes are Figure 3 The probes are inserted into the quartz glass tubes in the directions shown, forming an interventional magnetic probe array along the axial direction of the field-reversed plasma thruster cavity, achieving full coverage of the magnetic field measurement points.

[0038] Figure 6This is an isometric view of a quartz protective cover proposed in an embodiment of the present invention. The bottom end of each quartz protective cover is closed and the top end is open, and the opening is a boss structure with a groove. After each quartz protective cover is inserted into the magnetic probe fixing assembly, the groove is complementary to the limiting boss on the magnetic probe fixing assembly.

[0039] In other words, all quartz protective covers can be snapped onto the magnetic probe fixing assembly, so that the quartz protective cover can only perform single-degree-of-freedom movement in the vertical direction (inserting into the magnetic probe fixing assembly, or removing from the magnetic probe fixing assembly). Therefore, when measuring the magnetic induction intensity in the cavity, the quartz protective cover will not move in other directions following the disturbance of the plasma, thereby effectively avoiding test errors.

[0040] In order to ensure the stability of the connection between the quartz protective cover and the magnetic probe fixing assembly, Figure 6 As shown, the boss with grooves includes: a first groove and a second groove, and the first groove and the second groove are respectively arranged on both sides of the opening.

[0041] In an optional embodiment, the magnetic probe fixing assembly includes: a fixing rod 101 , a fixing plate 102 and a glass cover plate 103 .

[0042] The fixing rod is a groove structure, attached to the inner surface of the upper half of the cavity, and is used to connect with multiple quartz protective sleeves.

[0043] The glass cover is used to cover the groove structure of the fixing rod.

[0044] The fixing plate is fixedly connected to the edge of the cavity and the fixing rod respectively.

[0045] A hole is provided at the connection between the fixing rod and the fixing plate so that the twisted pair wires can be led out from the inside of the cavity to the passive integration circuit through the hole.

[0046] Figure 7 This is an isometric view of a magnetic probe mounting assembly provided in an embodiment of the present invention. To enhance the stability of the measuring device, the magnetic probe mounting assembly is constructed from a material that exhibits high stability in a plasma environment. Optionally, the magnetic probe mounting assembly comprises a high-silicon oxide mounting rod, a MC nylon mounting plate, and a glass cover. The glass cover covers the groove in the mounting rod to prevent plasma interference with the magnetic probe. Furthermore, the mounting rod and mounting plate, as well as the mounting plate and chamber, are connected via nylon bolts and nuts.

[0047] In an optional implementation, the passive integration circuit includes: a resistor and a capacitor.

[0048] The first end of the resistor is connected to the first lead-out end of the twisted pair, and the second end of the resistor is connected to the first end of the capacitor and the first access end of the signal transmission cable.

[0049] The second end of the capacitor is connected to the second lead-out end of the twisted pair and the second input end of the signal transmission cable respectively.

[0050] The cutoff frequency of the passive integration circuit is N times the frequency of the magnetic field in the induction pulse plasma thruster, and N is less than 1.

[0051] It is known that the larger the time constant of the passive integration circuit, the smaller the output voltage; if the time constant is too small, the worse the integration effect. When the cutoff frequency of the passive integration circuit is much smaller than the magnetic field frequency in the induction pulse plasma thruster, the output voltage amplitude of the passive integration circuit can be regarded as much smaller than the input voltage amplitude. Can be roughly regarded as ( is the output voltage, is the input voltage), at this time the integrator has a good integration effect and the output voltage amplitude is not too small.

[0052] Taking the measured high-frequency magnetic field of MHz as an example, the cutoff frequency of the passive integration circuit can be selected as 0.1 times the frequency of the magnetic field in the induction pulse plasma thruster, that is, ,in, represents the time constant of the passive integrator circuit, Represents the resistance value of the resistor in the passive integration circuit, represents the capacitance of the capacitor in the passive integration circuit. Optionally, the passive integration circuit is composed of a 1kΩ metal film resistor and a 10nF ceramic capacitor.

[0053] From the above description, it can be seen that by properly designing the inductance of the inductor coil and the time constant of the passive integration circuit in the measurement device, high-precision transient measurement of high-frequency magnetic fields of various magnitudes can be achieved by the magnetic probe array.

[0054] Example 2 An embodiment of the present invention further provides a method for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster. This method is mainly applied to the device for measuring the magnetic induction intensity distribution within an induction pulse plasma thruster provided in the first embodiment above. The method provided by the embodiment of the present invention is described in detail below.

[0055] The method for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster provided in an embodiment of the present invention specifically includes the following steps: Firstly, the time constant of the passive integration circuit and the sensitivity of the inductance coil in the measurement device for the magnetic induction intensity distribution in the induction pulse plasma thruster are obtained.

[0056] Then, the signal voltage of each oscilloscope in the measuring device for sensing the magnetic induction intensity distribution in the pulsed plasma thruster is collected.

[0057] Finally, based on the signal voltage, the time constant of the passive integration circuit and the sensitivity of the inductor coil, the magnetic induction intensity at the spatial position of each inductor coil is determined, and the magnetic induction intensity distribution inside the induction pulse plasma thruster is obtained.

[0058] The measurement principle of the magnetic induction intensity distribution has been introduced in detail above and will not be repeated here. For details, please refer to the description in Example 1.

[0059] In the description of the present invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer" and the like indicate positions or locations based on the positions shown in the accompanying drawings, or the positions or locations in which the inventive product is typically placed when in use. These terms are intended solely to facilitate the description of the present invention and to simplify the description, and are not intended to indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. Furthermore, the terms "first," "second," and "third," etc., are used solely to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0060] Furthermore, terms such as "horizontal," "vertical," and "overhanging" do not necessarily imply that a component must be absolutely horizontal or overhanging, but rather that it can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but rather that it can be slightly tilted.

[0061] In the description of the present invention, it should also be noted that, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integral connections; they may refer to mechanical connections or electrical connections; they may refer to direct connections or indirect connections through an intermediate medium; and they may refer to internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on the specific circumstances.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster, characterized in that: include: a calculation component, a magnetic probe fixing component, a plurality of magnetic probes, and a plurality of measurement components; Each of the magnetic probes comprises: a plurality of inductive coils arranged at preset intervals; each of the inductive coils corresponds to a set of measuring components; each set of measuring components comprises: a twisted pair, a passive integrating circuit, a signal transmission cable and an oscilloscope; The plurality of magnetic probes are arranged axially along the induction pulse plasma thruster cavity and are parallel to each other, and are evenly fixed to the upper half of the cavity by the magnetic probe fixing assembly, and the ends of the plurality of magnetic probes are all located on the center line of the cavity; The two ends of each inductor coil are connected to the input end of the passive integration circuit via the twisted pair, and the output end of the passive integration circuit is connected to the oscilloscope via the signal transmission cable; the passive integration circuit, the signal transmission cable, the oscilloscope and the computing component are all located outside the cavity; The computing component collects the signal voltage of each oscilloscope, and determines the magnetic induction intensity at the spatial position of each induction coil based on the signal voltage, the time constant of the passive integration circuit, and the sensitivity of the induction coil, thereby obtaining the magnetic induction intensity distribution within the induction pulse plasma thruster.

2. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 1, characterized in that: The magnetic probe is a PCB circuit board with a plurality of inductor coils welded on the surface at preset intervals, and the arrangement directions of the plurality of inductor coils are consistent.

3. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 1, characterized in that: Also includes: multiple quartz protective sleeves; Each magnetic probe is respectively covered with a quartz protective cover.

4. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 3, characterized in that: The bottom end of each quartz protective cover is closed and the top end is open, and the opening is a boss structure with a groove. After each quartz protective cover is inserted into the magnetic probe fixing assembly, the groove is complementary connected with the limiting boss on the magnetic probe fixing assembly.

5. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 4, characterized in that: The boss with grooves includes a first groove and a second groove, and the first groove and the second groove are respectively arranged on both sides of the opening.

6. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 4, characterized in that: The magnetic probe fixing assembly includes: a fixing rod, a fixing plate and a glass cover plate; The fixing rod is a groove structure, attached to the inner surface of the upper half of the cavity, and used to connect with the multiple quartz protective sleeves; The glass cover is used to cover the groove structure of the fixing rod; The fixing plate is fixedly connected to the edge of the cavity and the fixing rod respectively; A hole is provided at the connection between the fixing rod and the fixing plate, so that the twisted pair wires are led out from the inside of the cavity to the passive integration circuit through the hole.

7. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 1, characterized in that: The passive integration circuit includes: a resistor and a capacitor; The first end of the resistor is connected to the first lead-out end of the twisted pair, and the second end of the resistor is connected to the first end of the capacitor and the first access end of the signal transmission cable; The second end of the capacitor is connected to the second lead-out end of the twisted pair and the second input end of the signal transmission cable respectively.

8. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 7, characterized in that: The cutoff frequency of the passive integration circuit is N times the frequency of the magnetic field in the induction pulse plasma thruster, where N is less than 1.

9. The device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to claim 1, characterized in that: The inductor coil is a coreless coil.

10. A method for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster, characterized in that: A device for measuring the magnetic induction intensity distribution in an induction pulse plasma thruster according to any one of claims 1 to 9, comprising: Obtaining the time constant of the passive integration circuit and the sensitivity of the inductance coil in the device for measuring the magnetic induction intensity distribution in the induction pulse plasma thruster; collecting the signal voltage of each oscilloscope in the measuring device for measuring the magnetic induction intensity distribution in the induction pulse plasma thruster; Based on the signal voltage, the time constant of the passive integration circuit and the sensitivity of the inductor coil, the magnetic induction intensity at the spatial position of each inductor coil is determined to obtain the magnetic induction intensity distribution in the induction pulse plasma thruster.

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