An automated commissioning system and method for an opto-electronic turret

Abstract

This invention discloses an automated debugging system and method for an optoelectronic turntable. The system includes: multiple servo units to be tested, a signal integration and processing unit, and a debugging station unit. Each servo unit's turntable includes at least one rotating axis, and each axis corresponds to a motor and a controller. The controller controls the motor to drive the corresponding rotating axis. The signal integration and processing unit consists of multiple signal processing units, each communicatively connected to a servo unit and used to collect data from the corresponding servo unit at various times. The signal integration and processing unit compiles the data collected by each signal processing unit into a dataset and sends the dataset to the debugging station unit. The debugging station unit includes at least a planner and multiple optimizers, each optimizer corresponding to a controller. The planner plans the debugging scheme for each servo unit, and each optimizer adjusts the corresponding controller parameters to obtain the final debugging result. This application can improve the modulation accuracy and efficiency of the turntable controller parameters.

Description

Technical Field

[0001] This invention relates to the field of turntable testing technology, and in particular to an automated debugging system and method for an optoelectronic turntable. Background Technology

[0002] As a core component of optoelectronic systems, the optoelectronic turntable is widely used in target tracking, reconnaissance and early warning, security monitoring, and precision guidance. Its performance directly determines the observation accuracy and tracking stability of the entire optoelectronic system. The turntable controller is the key component that drives the turntable to perform precise movements and achieves accurate position and speed control. Therefore, before the optoelectronic turntable leaves the factory, its controller must undergo comprehensive testing and parameter debugging to ensure that its dynamic response, tracking accuracy, stability, and anti-interference capabilities meet the design requirements.

[0003] Currently, the testing and debugging of turntable controllers still largely rely on traditional manual methods. This involves experienced technicians repeatedly and manually adjusting key parameters such as proportional, integral, and derivative (PID) logic in the controller, observing whether the turntable's motion performance improves after each adjustment, until a relatively satisfactory parameter combination is found. However, this method heavily depends on human experience, resulting in low debugging accuracy and efficiency, and high labor costs. It can no longer meet the urgent needs of the modern optoelectronic turntable industry for high-quality, high-efficiency, and large-scale production.

[0004] Therefore, there is an urgent need for an automated debugging system and method for photoelectric turntables to solve the above problems. Summary of the Invention

[0005] This invention provides an automated debugging system and method for an optoelectronic turntable, which can improve the modulation accuracy and efficiency of the turntable controller parameters. The technical solution is as follows: On the one hand, an automated debugging system for an optoelectronic turntable is provided, including: multiple servo units to be tested, a signal integration and processing unit, and a debugging station unit; Each of the servo units has at least one rotating axis, and each rotating axis corresponds to a motor and a controller. The controller is used to control the motor so that the motor drives the corresponding rotating axis to move. The signal integration processing unit consists of multiple signal processing units, each of which is communicatively connected to a servo unit and is used to collect data from the corresponding servo unit at various times. The data includes axis parameters and controller parameters. The signal integration processing unit is used to compile the data collected by each signal processing unit into a dataset and send the dataset to the debugging console unit. The debugging unit includes at least a planner and multiple optimizers, each of which corresponds to one of the controllers. The planner is used to plan a debugging scheme for each servo unit, and each optimizer debugs the corresponding controller parameters based on the dataset, the debugging scheme, and a preset optimization algorithm to obtain the final debugging result.

[0006] On the other hand, an automated debugging method for an optoelectronic turntable is provided, applied to the aforementioned automated debugging system for the optoelectronic turntable, the method comprising: Determine the threshold values ​​for key parameters and the debugging scheme for the planner, and based on the debugging scheme, determine the optimization order and optimization content for each optimizer; In response to the start of commissioning, the planner sends control signals in the order specified in the commissioning scheme, so that the corresponding controller controls the corresponding motor, so that the motor drives the corresponding shaft to move. The signal integration and processing unit collects the parameters of the corresponding rotating axis at each moment and processes them according to the sampling time to generate a dataset, which is then sent to the optimizer. Based on the aforementioned debugging scheme, each optimizer is called sequentially to optimize the corresponding controller, thereby obtaining the final debugging result.

[0007] This invention provides an automated debugging system and method for photoelectric turntables. By introducing an integrated signal processing unit, information from multiple multi-axis photoelectric turntable servo units can be collected and debugged simultaneously. An optimizer is constructed using an optimization algorithm, and a planner guides the optimizer to automatically optimize the controller parameters of the photoelectric turntable servo units. This application can realize the automated debugging of batch photoelectric turntable servo systems, identify abnormal individuals in the same batch of photoelectric turntables, improve the debugging efficiency and accuracy of photoelectric turntable servo systems, reduce manual input, standardize the debugging process of photoelectric turntable servo systems, and has high reliability. Attached Figure Description

[0008] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0009] Figure 1 This is a schematic diagram of an automated debugging system for an optoelectronic turntable according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of a servo unit provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the structure of a signal integration processing unit provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of the structure of a debugging console unit provided in an embodiment of the present invention; Figure 5 This is a flowchart of an automated debugging method for an optoelectronic turntable according to an embodiment of the present invention; Figure 6 This is a schematic diagram of the optimized space provided in an embodiment of the present invention; Figure 7 This is a schematic diagram of an optimization algorithm provided in an embodiment of the present invention; Figure 8 This is a schematic diagram of planning speed and feedback speed provided in an embodiment of the present invention; Figure 9 This is a schematic diagram of the planned location and feedback location provided in an embodiment of the present invention.

[0010] Figure label: 20-Servo Unit; 201-Turntable base; 202-A-axis actuator; 203-B-axis actuator; 204-A-axis motor; 205-B-axis motor; 206-A-axis sensor; 207-B-axis sensor; 208-First communication interface; 209-Controller; 30 - Signal integrated processing unit; 301 - Servo start / stop button; 302 - Communication start / stop button; 303 - Second communication interface; 304 - Emergency stop button; 305 - System main power switch; 40 - Debugging station unit; 401 - Human-Machine Interface; 402 - Planner and Optimizer Carrier; 403 - Debugging Console Control; 404 - Third Communication Interface. Detailed Implementation

[0011] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0012] The specific implementation of the method in this application is described in detail below.

[0013] Please refer to Figure 1 The present invention provides an automated debugging system for an optoelectronic turntable, comprising multiple servo units to be tested, a signal integration and processing unit, and a debugging station unit; Each servo unit's turntable includes at least one rotating axis, and each rotating axis corresponds to a motor and a controller. The controller is used to control the motor so that the motor drives the corresponding rotating axis to move. The signal integration processing unit consists of multiple signal processing units. Each signal processing unit is connected to a servo unit and is used to collect data from the corresponding servo unit at various times. The data includes axis parameters and controller parameters. The signal integration processing unit is used to compile the data collected by each signal processing unit into a dataset and send the dataset to the test bench unit. The debugging unit includes at least a planner and multiple optimizers, with each optimizer corresponding to a controller. The planner is used to plan the debugging scheme for each servo unit, and each optimizer debugs the corresponding controller parameters based on the dataset, the debugging scheme, and the preset optimization algorithm to obtain the final debugging result.

[0014] This embodiment, by introducing an integrated signal processing unit, can simultaneously collect and debug information from multiple multi-axis photoelectric turntable servo units. An optimizer, constructed using an optimization algorithm, is guided by a planner to automatically optimize the controller parameters of the photoelectric turntable servo units. This application enables automatic debugging of batch photoelectric turntable servo systems, identifies abnormal individuals within the same batch, improves the debugging efficiency and accuracy of photoelectric turntable servo systems, reduces manual labor, standardizes the debugging process, and ensures high reliability.

[0015] The specific results of each unit will be described in detail below.

[0016] 1. Servo Unit Each servo unit also includes a first communication interface, a turntable base, an actuator and a sensor corresponding to each rotating axis; wherein, each sensor and actuator is mounted on a corresponding motor, and the sensor is used to collect the speed and position of the rotating axis; the first communication interface is used to communicate with the signal integration and processing unit.

[0017] like Figure 2The diagram shows a servo unit 20 with two axes of rotation. The figure includes a turntable base 201, an A-axis actuator 202, a B-axis actuator 203, an A-axis motor 204, a B-axis motor 205, an A-axis sensor 206, a B-axis sensor 207, a first communication interface 208, and a controller 209. The A-axis motor 204 is mounted on the turntable base 201, the A-axis sensor 206 is mounted on the A-axis motor 204, and the A-axis actuator 202 is mounted on the A-axis motor 204. The combination of the A-axis motor 204, A-axis actuator 202, and A-axis sensor 206 is called the A-axis. The combination of the B-axis motor 205, B-axis actuator 203, and B-axis sensor 207 is called the B-axis. The A-axis and B-axis together form the servo turntable motion system. The first communication interface 208 serves as the communication interface between the servo unit 20 and the signal integration and processing unit 30. The controller 209 controls the motion of the connected servo turntable motion system.

[0018] certainly, Figure 2 This is merely an exemplary representation of a servo unit. In practical applications, users can expand upon the A-axis and B-axis to include C-axis, D-axis, and even N-axis. This application does not impose a specific limit on the number of axes.

[0019] 2. Signal Integration and Processing Unit like Figure 3 As shown, the signal integration processing unit 30 also includes a servo start / stop button 301, a communication start / stop button 302, a second communication interface 303, an emergency stop button 304, and a system main power switch 305, all mounted on the housing. The servo start / stop button 301 controls the power supply to the servo unit 20. The communication start / stop button 302 controls the communication between all units. The second communication interface 303 exchanges information with the first communication interface 208 via a communication cable. The emergency stop button 304 stops the movement of the servo unit 20. The system main power switch 305 controls the power supply to all units.

[0020] In some embodiments, the on / off states of the servo start / stop button 301, communication start / stop button 302, emergency stop button 304, and main power switch 305 are detected, uploaded to the signal integration and processing unit, and forwarded.

[0021] 3. Debugging bench unit like Figure 4 As shown, the test bench unit 40 also includes a human-machine interface 401, a planner and optimizer carrier 402, a test bench controller 403, and a third communication interface 404. The human-machine interface 401 is installed in the middle of the planner and optimizer carrier 402, and the debugging console manipulator 403 is used to operate and modify the information content in the human-machine interface 401. The third communication interface 404 and the second communication interface 303 exchange information via a communication cable.

[0022] Furthermore, the console controller 403 is preferably operated by a mouse and keyboard, a joystick, or a touch screen.

[0023] like Figure 5 As shown, this embodiment of the invention also provides an automated debugging method for a photoelectric turntable, applicable to the automated debugging system of the photoelectric turntable in any of the above embodiments. The method includes: Step 500: Determine the key parameter thresholds and the planner's debugging scheme, so as to determine the optimization order and optimization content of each optimizer based on the debugging scheme; Step 502: In response to the start of commissioning, the planner sends control signals in the order specified in the commissioning plan so that the corresponding controller controls the corresponding motor so that the motor drives the corresponding shaft to move. Step 504: The signal integration processing unit collects the parameters of the corresponding rotating shaft at each moment and processes them according to the sampling time to generate a dataset and send it to the optimizer. Step 506: Based on the debugging scheme, each optimizer is called in sequence to optimize the corresponding controller, and the final debugging result is obtained.

[0024] The following description Figure 5 The execution method for each step is shown.

[0025] First, regarding step 500, the debugging plan includes the sequence and content of actions for each turntable, each axis of each turntable, and each control loop of each axis. Key parameter thresholds include the controller's KP, KI, and KD thresholds, the velocity thresholds of KP, KI, and KD in the P, I, and D directions, and the parameter thresholds corresponding to the optimization algorithm. For example, when using the particle swarm optimization algorithm, it is necessary to set the population optimal solution threshold, which the user can determine as needed.

[0026] For steps 502 and 504, after debugging begins, the planner needs to send waveforms in sequence, and the servo system, controlled by the controller, follows suit, with the rotating shaft moving accordingly. At this time, the signal integration processing unit creates a dataset based on the data collected by the sensors. It then simplifies the total data according to the sampling time and sends it to the optimizer for calculation.

[0027] For step 506, based on the debugging scheme, each optimizer is called sequentially to optimize the corresponding controller, obtaining the final debugging results, including: Based on the optimization order of each turntable, optimize each turntable in turn. For the current turntable, execute: Based on the current optimization order of each axis in the turntable, optimize each axis in turn. For the current axis, perform the following: Based on the optimization order of each control loop of the current axis, optimize each control loop in turn; For each control loop, use the corresponding optimizer to optimize the parameters in the control loop according to the preset optimization algorithm. This process continues until every axis of each turntable is optimized, resulting in the debugging results for all controllers.

[0028] In this step, if multi-axis motion is set, each axis will move sequentially (axis 1 moves and stops, axis 2 moves and stops, ... until axis N), or combined motions between multiple axes can be debugged. Switching axis modes requires building multiple optimizers that work in parallel based on the number of axes. Furthermore, controller control loops can be combined, nested, serially connected, or connected in parallel. The optimizer debugs each control loop sequentially according to the planner's planning order, and retains or resets its own parameters when switching loops.

[0029] Furthermore, in some implementations, for each control loop, a corresponding optimizer is used to optimize the parameters in that control loop according to a preset optimization algorithm, including: Initialize the threshold ranges for each key parameter, population parameters, and maximum number of iterations, as follows: Initialize the optimal solution's KP, KI, KD direction thresholds and total threshold: [ ], i=1,2...N; [ ], i=1,2...N; [ ], i=1,2...N; [ ], i=1,2...N; [ ], i=1,2...N; [ ], i=1,2...N; In the formula, , , ; respectively The threshold; , They are respectively KP The maximum and minimum values; , They are respectively KI The maximum and minimum values; , They are respectively KD The maximum and minimum values; , These are the maximum and minimum values ​​of the velocity in the P direction, respectively; , These are the maximum and minimum values ​​of the velocity in the I direction, respectively; , These are the maximum and minimum values ​​of the velocity in the D direction, respectively. , , These are the threshold values ​​for velocity in the P, I, and D directions, respectively.

[0030] In addition, it is necessary to initialize the population (Kp1,Ki1,Kd1)...(Kpn,Kin,Kdn) starting point, initialize the initial and final inertial weights in the KP, KI, and KD directions, initialize the velocity limits in the KP, KI, and KD directions, and initialize the learning factor.

[0031] The parameters in the control loop are iteratively calculated using the particle swarm optimization algorithm. For each iteration, the following steps are performed: Update particle velocity and position; based on particle velocity and position, update particle fitness, individual optimal solution, and population optimal solution; based on individual optimal solution and population optimal solution, determine whether the number of individuals falling into the population optimal solution threshold is not lower than the total threshold requirement; If so, it is determined that the optimal solution has been found and the debugging was successful, and the corresponding controller parameters and dataset are saved; If not, determine whether the maximum number of iterations has been reached; if yes, determine that the debugging has failed; if no, remove individuals that fall outside the threshold of the optimal solution, update the optimizer parameter configuration, update the servo unit control rate configuration, re-collect the dataset of the corresponding axis, and re-perform iterative calculation based on the new dataset and particle fitness until the maximum number of iterations is reached.

[0032] In the above calculation process, such as Figure 6 The diagram shown is a schematic representation of the optimization space in one embodiment of this application. The optimization objects are the control rate parameters KP, KI, and KD. The optimization objects are distributed in the optimization space, set as points, namely (Kpn, Kin, Kdn).

[0033] like Figure 7The diagram shows the particle swarm optimization algorithm used in this embodiment. The debugging process requires multiple iterations. Each iteration updates the particle velocity threshold and position, calculates the linearly decreasing inertia weights in the KP, KI, and KD directions, and calculates the velocity and position of the population (Kp1, Ki1, Kd1)...(Kpn, Kin, Kdn). Velocity limits are applied to the population (Kp1, Ki1, Kd1)...(Kpn, Kin, Kdn), and boundary constraints are imposed on the population position. The velocity and position update formulas are as follows.

[0034] In the formula, For particles In the In the nth iteration A velocity vector of dimension; For particles In the In the nth iteration A dimensional position vector; For the group in the first In the nth iteration A dimensional position vector; For particles In the In the nth iteration A velocity vector of dimension; For particles In the In the nth iteration A dimensional position vector; For particles In the In the nth iteration The historical optimal position of dimension, that is, the position at the dimensional level. After the nth iteration, the th The optimal solution obtained by searching for individual particles; For the group in the first In the nth iteration The historical optimal position of dimension; that is, the position in the dimensional... The optimal solution in the entire particle swarm after the iteration; Inertial weights are used to balance global and local search capabilities; , These are acceleration constants, which control the step size of individual and group cognition, respectively; , These are random numbers that are uniformly distributed in the range [0,1], used to introduce randomness.

[0035] In some implementations, particle fitness is calculated using the following formula: In the formula, , , , , These represent the weights of each indicator in the fitness function; IAE is the integral of absolute error; ITAE is the integral of absolute error over time; Overshoot is the overshoot penalty; settingtime is the settling time; and risetime is the rise time.

[0036] Of course, users can also choose other optimization algorithms as needed, such as hummingbird algorithm, ant colony algorithm, etc., and this application does not make specific restrictions.

[0037] To demonstrate the effectiveness of the method described in this application, the inventors verified it on a turntable servo system. The experimental results are as follows: Figure 8 and Figure 9 As shown in the figure, the dashed line represents the planned speed, which is the desired speed and position of the turntable after the user issues a command, and the solid line represents the actual speed and position of the turntable after debugging. It can be seen from the figure that the planned speed and feedback speed, as well as the planned position and feedback position, are very close, indicating that the turntable has high accuracy after debugging using the method of this application.

[0038] Finally, it should be noted that in this document, relational terms such as first, second, third, and fourth are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0039] The above description is only a preferred embodiment of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of this application, and these improvements and modifications should also be considered within the scope of protection of this application.

Claims

1. An automated debugging system for an optoelectronic turntable, characterized in that, The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable.

2. The system of claim 1, wherein, The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable.

3. The system of claim 2, wherein, The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable.

4. The system of claim 3, wherein, The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable.

5. The system of claim 4, wherein, The application relates to an automatic debugging system for an optoelectronic turntable.

6. A method of automated commissioning of an opto-electronic turret, characterized in that, The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable.

7. The method of claim 6, wherein, The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application relates to an automatic debugging system for an optoelectronic turntable. The application related to an automatic debugging system for an optoelectronic turntable. The application relates to an Based on the aforementioned debugging scheme, each optimizer is sequentially invoked to optimize the corresponding controller, yielding the final debugging result, including: Based on the optimization order of each turntable, optimize each turntable in turn. For the current turntable, execute: Based on the optimization order of each axis in the current turntable, each axis is optimized sequentially. For the current axis, the following steps are performed: based on the optimization order of each control loop of the current axis, each control loop is optimized sequentially; for each control loop, the parameters in the control loop are optimized using the corresponding optimizer according to the preset optimization algorithm. This process continues until every axis of each turntable is optimized, resulting in the debugging results for all controllers.

8. The method of claim 7, wherein, The preset optimization algorithm is a particle swarm optimization algorithm; the key parameter thresholds include the controller's KP, KI, and KD thresholds, the velocity thresholds of KP, KI, and KD in the P, I, and D directions, and the population optimal solution threshold. For each control loop, the parameters in that control loop are optimized using a corresponding optimizer according to the preset optimization algorithm, including: Initialize the threshold ranges of key parameters, population parameters, and maximum number of iterations; The particle swarm optimization algorithm is used to iteratively calculate the parameters in the control loop, and the following steps are performed for each iteration: Update particle velocity and position; based on particle velocity and position, update particle fitness, individual optimal solution, and population optimal solution; based on individual optimal solution and population optimal solution, determine whether the number of individuals falling into the population optimal solution threshold is not lower than the total threshold requirement; If so, it is determined that the optimal solution has been found and the debugging was successful, and the corresponding controller parameters and dataset are saved; If not, determine whether the maximum number of iterations has been reached; if yes, determine that the debugging has failed; if no, remove individuals that fall outside the threshold of the optimal solution, update the optimizer parameter configuration, update the servo unit control rate configuration, re-collect the dataset of the corresponding axis, and re-perform iterative calculation based on the new dataset and particle fitness until the maximum number of iterations is reached.

9. The method of claim 8, wherein, The formulas for updating particle velocity and position are as follows: In the formula, For particles In the In the nth iteration A velocity vector of dimension; For particles In the In the nth iteration A dimensional position vector; For the group in the first In the nth iteration A dimensional position vector; For particles In the In the nth iteration A velocity vector of dimension; For particles In the In the nth iteration A dimensional position vector; For particles In the In the nth iteration Dimension's historical best position; For the group in the first In the nth iteration Dimension's historical best position; Inertial weights are used to balance global and local search capabilities; , These are acceleration constants, which control the step size of individual and group cognition, respectively; , These are random numbers that are uniformly distributed in the range [0,1], used to introduce randomness.

10. The method of claim 8, wherein, Particle fitness The formula for calculating the particle fitness is given by: wherein, , , , , are the respective index weights of the fitness function; IAE is the integral of absolute error; ITAE is the integral of time absolute error; Overshoot is the overshoot penalty; setting time is the setting time; rise time is the rise time.

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