Probe allowing large current to pass through
The telescopic probe design with a flexible contact head addresses the bulkiness and inflexibility of traditional probes by enhancing contact area and conductivity, improving testing efficiency and accuracy.
Patent Information
- Application Number
- CN202421374244.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-17
- Publication Date
- 2025-07-15
- Estimated Expiration
- 2034-06-17
AI Technical Summary
The existing power electronics test probes have a bloated structure and require additional board racks to achieve buffering, resulting in inconvenience in installation and waste of space.
A telescopic composite probe is designed, using a winding ball wrapped in conductive metal wire as a contact head, and elastic telescopic through spring and locking nozzle, combining pins and positioning slots to ensure stability, and is directly installed at the equipment test port.
A compact equipment structure is realized, the contact surface is increased, the current passing capacity and detection accuracy are improved, and the installation process is simplified.
Smart Images
Figure CN223107886U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of test probes, in particular to a probe that can conduct large current. Background Technique
[0002] At present, the probes used in the automatic test equipment for the strong electricity input and output of power electronic products such as frequency converters, servo drivers, photovoltaic energy storage inverters, electric vehicle controllers, and UPS power supplies are mostly single-rod probe designs. The buffer bushing is fixed to the outside of the probe rod through a nut, and the installation between the probe and the equipment is achieved by adding a plate frame outside the buffer bushing. Moreover, a part of the space needs to be vacated at the top end of the probe for the up and down movement of the probe rod to achieve the purpose of touch buffering, resulting in the structure of the test end of the test equipment being extremely bulky after installing the probe.
[0003] Therefore, we designed a telescopic combined universal large-current probe that can be directly installed at the test end of the equipment. Content of the Utility Model
[0004] Aiming at the deficiencies of the prior art pointed out in the above background technique, the utility model provides a probe that can conduct large current.
[0005] A probe that can conduct large current disclosed by the utility model includes a probe rod and a mounting cap. The mounting cap is slidably sleeved on the top end of the probe rod, enabling the entire test probe to achieve telescopic combination. In order to enable the test probe to have an effective impact buffering effect during the telescopic process, a spring and a lock nozzle are respectively sleeved in the middle of the probe rod, and a winding ball is arranged at the bottom end of the probe rod. The winding ball is mainly used to contact the surface of the object to be detected. Compared with the contact heads of traditional fixed cylindrical, plum blossom-shaped, and needle-shaped probes, the winding ball adopts a flexible design made of conductive metal thin wires, which can enable the front end of the probe rod to adaptively change with the surface shape of the object when it contacts the object to be detected, thereby increasing the contact surface of the probe contact head, improving the current that the probe can conduct, improving the adaptability of the test probe to the object surface, and improving the detection accuracy of the product.
[0006] Further, in order to cooperate with the spring, the nozzle and the mounting cap to achieve an elastic telescopic buffering effect, the probe rod includes a needle core and a probe column. The size of the probe column is larger than that of the needle core, and the probe column is integrally formed at the bottom of the needle core. The mounting cap includes a needle sleeve slidably sleeved outside the top end of the needle core. An installation stud is integrally formed at the top end of the mounting cap. Specifically, the spring and the nozzle are sleeved outside the needle core, and the nozzle is located above the spring and abuts against the spring. The other end of the spring abuts against the probe column. In the initial state, the probe rod of the test probe and the mounting cap are in a natural extended state. When the winding ball at the front end of the probe rod contacts the object to be measured, the probe rod is blocked from advancing. Under the action of inertia, the probe rod retracts backward, causing the spring to be compressed and contracted. The winding ball is pressed against the surface of the object to be detected under the elastic force generated by the spring. Due to the flexible design of the winding ball, the shape of the winding ball will adaptively change with the shape of the contact surface of the object to be measured, ensuring that the winding ball can maintain good contact with the object to be measured.
[0007] Further, in order to make the assembly between the winding ball and the probe rod more stable, an embedding groove for embedding the winding ball is integrally formed at the bottom end of the probe column, and a part of the winding ball is embedded in the embedding groove, and the other part is located outside the probe rod.
[0008] Further, in order to prevent the mounting cap and the probe rod of the telescopic combination from being disengaged, a locking hole is horizontally opened at the top of the needle core, and a pin is inserted inside the locking hole. At the same time, symmetrically designed positioning slot holes are opened in the middle of the needle sleeve, and both ends of the pin are respectively slidably inserted inside the two positioning slot holes.
[0009] Further, a plurality of locking pieces are integrally formed around the circumference at the bottom end of the needle sleeve. The outer side of the bottom of the locking piece is designed as an inclined surface, and the inner side of the nozzle is also designed with an inclined surface. In this design, when the probe rod contracts and compresses the spring, the nozzle makes the locking piece contract inward by means of the inclined surface cooperation with the locking piece, increasing the clamping friction force on the probe rod, which can play a good protective effect on the assembly between the probe rod and the mounting cap.
[0010] Compared with the prior art, the beneficial effects of the present utility model are as follows:
[0011] The test probe of the present utility model is composed of an upper and lower sleeve telescopic combination. By using the cooperation of the pin and the positioning slot hole, the telescopic displacement amplitude of the probe rod is limited. Moreover, by directly designing the installation stud at the end of the mounting cap, the test probe can be directly installed on the test port of the test equipment without adding a plate rack, which is more convenient to install, and the test end structure of the installed equipment is more compact.
[0012] Secondly, the probe head of the test probe in the present utility model adopts a flexible design composed of metal filaments wound around, combined with the telescopic buffer design of the whole probe, which enables the front end of the probe rod to adaptively change along with the surface shape of the object when it contacts the object to be detected, thereby increasing the contact area of the probe contact head and improving the current passing capacity of the probe. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] The drawings described herein are used to provide a further understanding of the present application and form a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation of the present application. In the drawings:
[0014] Figure 1 is a schematic structural diagram of the present utility model after decomposition;
[0015] Figure 2 is a schematic semi-sectional structural diagram of the present utility model.
[0016] In the figure: 1, probe rod; 101, needle core; 102, probe column; 103, lock hole; 104, embedding groove; 2, mounting cap; 201, needle sleeve; 202, lock piece; 203, positioning slot hole; 204, mounting stud; 3, lock nozzle; 4, pin; 5, spring; 6, winding ball. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0017] The following will disclose multiple embodiments of the present utility model in the form of drawings. For the sake of clarity, many physical details will be described together in the following narrative. However, it should be understood that these physical details are not used to limit the present utility model. That is to say, in some embodiments of the present utility model, these physical details are unnecessary. In addition, for the sake of simplifying the drawings, some conventional structures and components will be shown in a simple schematic manner in the drawings.
[0018] Embodiment:
[0019] Regarding the test probe for the strong current input and output test of conventional power electronic products at present, due to its single-rod integrated design of the structure, the buffer bushing can only be sleeved outside the probe, resulting in the need to install a plate frame for the subsequent installation of the entire test probe to ensure sufficient telescopic buffer space at the end of the probe. Therefore, after such a test probe is installed at the test end of the test equipment, it appears extremely bulky. For this reason, we have designed a telescopic combined universal high-current probe that can be directly installed at the test end of the equipment. The specific solution is as follows:
[0020] As Figure 1-2As shown, the present embodiment discloses a probe capable of passing a large current, comprising a probe rod 1 and a mounting cap 2, wherein the mounting cap 2 is slidably mounted on the top end of the probe rod 1, so that the entire test probe can be telescopically assembled. In order to enable the test probe to play an effective impact buffering effect during the telescopic process, a spring 5 and a locking mouth 3 are respectively mounted in the middle of the probe rod 1, and a winding ball 6 is arranged at the bottom end of the probe rod 1, wherein the winding ball 6 is mainly used for contacting the surface of the object to be detected. Compared with the traditional fixed cylindrical, plum blossom-shaped, and needle-shaped probe contact heads, the winding ball 6 adopts a flexible design wound with conductive metal fine wires, so that when the front end of the probe rod 1 contacts the object to be detected, it can adapt to the surface morphology of the object, thereby increasing the contact surface of the probe contact head and increasing the amount of current that can pass through the probe, thereby improving the adaptability of the test probe to the surface of the object and improving the accuracy of product detection.
[0021] In order to cooperate with the spring 5, the lock mouth 3 and the mounting cap 2 to achieve the elastic expansion and contraction buffering effect, as shown in FIG. Figure 1-2 As shown, the probe rod 1 includes a needle core 101 and a probe column 102, and the probe column 102 is larger than the needle core 101, and the probe column 102 is integrally formed at the bottom of the needle core 101, and the mounting cap 2 includes a needle sleeve 201 that is slidably sleeved on the outside of the top of the needle core 101, and the top of the mounting cap 2 is integrally formed with a mounting stud 204. Specifically, the spring 5 and the lock mouth 3 are sleeved on the outside of the needle core 101, and the lock mouth 3 is located above the spring 5 and conflicts with the spring 5, and the other end of the spring 5 conflicts with the probe column 102. In the initial state, the probe rod 1 and the mounting cap 2 of the test probe are in a naturally extended state. When the winding ball 6 at the front end of the probe rod 1 contacts the object to be tested, the forward movement of the probe rod 1 is blocked. Under the action of inertia, the probe rod 1 retracts, causing the spring 5 to be compressed and contracted, and the winding ball 6 is pressed against the surface of the object to be tested under the elastic force generated by the spring 5. Due to the flexible design of the winding ball 6, the shape of the winding ball 6 will adaptably change with the shape of the contact surface of the object to be tested, ensuring that the winding ball 6 can maintain good contact with the object to be tested.
[0022] like Figure 1-2 As shown, in order to make the assembly between the winding ball 6 and the probe rod 1 more stable, the bottom end of the probe column 102 is integrally formed with an embedding groove 104 for embedding the winding ball 6, and a part of the winding ball 6 is embedded in the embedding groove 104, and the other part is located outside the probe rod 1.
[0023] like Figure 1-2 As shown, in order to prevent the mounting cap 2 of the telescopic assembly from detaching from the probe rod 1, a locking hole 103 is horizontally opened at the top of the needle core 101, and a pin 4 is inserted into the inner side of the locking hole 103. At the same time, a symmetrical positioning slot 203 is opened in the middle of the needle sleeve 201, and the two ends of the pin 4 are slidably inserted into the inner sides of the two positioning slots 203 respectively.
[0024] likeFigure 1-2 As shown, a number of locking pieces 202 are integrally formed around the circumference at the bottom end of the needle sleeve 201. The outer side of the bottom of the locking piece 202 is designed as an inclined surface, and the inner side of the locking nozzle 3 is also designed with an inclined surface. In this design, when the probe rod 1 contracts to compress the spring 5, the locking nozzle 3 makes use of the inclined surface cooperation with the locking piece 202 to cause the locking piece 202 to contract inward, increasing the clamping friction force on the probe rod 1, which can play a good protective effect on the assembly between the probe rod 1 and the mounting cap 2.
[0025] The above are only the embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the scope of the claims of the present invention.
Claims
1. A probe that can conduct a large current, comprising a probe rod (1), characterized in that: The top of the probe rod (1) is slidably mounted with a mounting cap (2), the middle of the probe rod (1) is respectively mounted with a spring (5) and a locking mouth (3), and the bottom of the probe rod (1) is provided with a winding ball (6).
2. The probe capable of passing a large current according to claim 1, characterized in that: The probe rod (1) comprises a needle core (101) and a probe column (102); the probe column (102) is larger than the needle core (101), and the probe column (102) is integrally formed at the bottom of the needle core (101).
3. The probe capable of passing a large current according to claim 2, wherein: An embedding groove (104) for embedding a winding ball (6) is integrally formed at the bottom end of the probe column (102), and the winding ball (6) is formed by winding conductive metal thin wires.
4. A probe capable of passing a large current according to claim 1, characterized in that: The spring (5) and the locking mouth (3) are sleeved on the outside of the needle core (101), and the locking mouth (3) is located above the spring (5) and contacts the spring (5), and the other end of the spring (5) contacts the probe column (102).
5. The probe capable of passing a large current according to claim 2, characterized in that: A locking hole (103) is transversely formed at the top of the needle core (101), and a pin (4) is inserted into the inner side of the locking hole (103).
6. The probe capable of passing a large current according to claim 1, characterized in that: The mounting cap (2) comprises a needle sleeve (201) which is slidably sleeved on the outside of the top end of the needle core (101), a symmetrically designed positioning slot (203) is provided in the middle of the needle sleeve (201), and two ends of the pin (4) are respectively slidably inserted into the inner sides of the two positioning slots (203).
7. A probe capable of passing a large current according to claim 6, characterized in that: The bottom end of the needle sleeve (201) is integrally formed with a plurality of locking plates (202) around a circumference, the outer side of the bottom of the locking plates (202) is designed as an inclined surface, and the inner side of the locking mouth (3) is also designed as an inclined surface.
8. The probe capable of passing a large current according to claim 6, characterized in that: A mounting stud (204) is integrally formed at the top end of the mounting cap (2).