Manufacturing method of trench type metal oxide semiconductor field effect transistor
A technology of oxide semiconductor and field effect transistor, which is used in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Publication Date
- 2016-05-18
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to the field of electronic devices, in particular to an ultra-deep trench metal oxide semiconductor field effect transistor. Background technique
[0002] In recent years, vertical double-diffused metal oxide semiconductor field effect transistor technology has developed rapidly, and has become one of the most important high-power mainstream devices in the field of power electronics. Low on-resistance and low power consumption are important directions for product pursuit. Therefore, metal The product structure of oxide semiconductor field effect transistors has also shifted from planar devices to trench devices. However, for traditional trench devices, the depth of the trench is all within the epitaxial layer, and in order to improve the withstand voltage of the product, most of the effort has been focused on how to better deal with the bottom of the trench, which has been able to obtain higher voltage.
[0003] In the prior art,...
Examples
Embodiment Construction
[0029] In the following description, many technical details are proposed in order to enable readers to better understand the application. However, those skilled in the art can understand that without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in each claim of the present application can be realized.
[0030] In order to make the purpose, technical solution and advantages of the present invention clearer, the following will further describe the implementation of the present invention in detail in conjunction with the accompanying drawings.
[0031] The first embodiment of the present invention relates to a trench metal oxide semiconductor field effect transistor. figure 2 It is a structural schematic diagram of the trench metal oxide semiconductor field effect transistor.
[0032] Specifically, as figure 2 As shown, the trench metal oxide semiconductor field effect transistor incl...