An electronic device, system and method for convenient debugging

Abstract

The present invention discloses an electronic device, system, and method for convenient debugging. The present invention cleverly integrates the power interface and signal interface of the electronic device, and only uses the conventional output terminal of the electronic device to interact with the main control device, thereby enabling debugging of electronic devices such as PACKAGE (package chip) / PCBA / COB module semi-finished products and electronic products. This overcomes the technical problem in the prior art of requiring different ports to be provided on the electronic device in order to perform various tests, burning, and calibration on the electronic device, which results in an increase in the size and cost of the electronic device. This achieves the goal of debugging the electronic device using fewer external interfaces, thereby facilitating the miniaturization of electronic devices such as PACKAGE (package chip) / PCBA / COB module semi-finished products and electronic products, as well as the waterproof, dustproof, and aesthetically pleasing design of the device housing mechanism, thereby facilitating the quality assurance of electronic products and having good economic and social benefits. The present invention can be widely applied to the debugging of various electronic products and their systems.

Description

Technical Field

[0001] The present invention relates to the field of electronic devices, and in particular to an electronic device, system and method that require testing, burning or calibration. Background Art

[0002] Commissioning: Testing and / or adjusting machines, instruments, etc.

[0003] When mass-producing electronic products (including finished electronic devices and semi-finished electronic devices at the PACKAGE / PCBA / COB stage), there are diverse and multi-stage testing, recording, setting, and calibration requirements.

[0004] In the prior art, commonly used debugging methods mainly include:

[0005] 1. Use the test / calibration port reserved on the electronic product under test to connect to the test host, which then runs the corresponding test program. This method requires reserving a test / calibration port on the electronic product, which consumes a certain amount of interface resources and product area. In addition to increasing costs, it is also not conducive to the miniaturization of electronic products.

[0006] 2. Reserved test / calibration ports are sometimes shared with other I / O ports. This is also done to fully utilize interface resources and reduce the cost of electronic products. However, due to the diverse range of product applications and the wide variety of electronic components that I / O ports connect to, sharing reserved test / calibration ports with other I / O ports on electronic products can be susceptible to interference from external circuits, affecting the electrical characteristics of the test / calibration ports. Summary of the Invention

[0007] In order to solve the above technical problems, the first object of the present invention is to provide an electronic device that saves interface resources, has strong versatility, and is convenient for debugging.

[0008] A second object of the present invention is to provide a debugging system based on the above electronic device.

[0009] The third object of the present invention is to provide a debugging method applied to the above debugging system.

[0010] The technical solution adopted in the present invention is:

[0011] An electronic device convenient for debugging, comprising:

[0012] Power interface;

[0013] a signal processing circuit, wherein the input end of the signal processing circuit is connected to the output end of the power interface, and is used to receive and process the access signal received by the power interface, and drive the output element to output a corresponding action signal according to the access signal;

[0014] The output element is connected to the output end of the signal processing circuit and is used to output a perceptible action signal.

[0015] Preferably, the signal processing circuit includes a rectifier unit, an input unit, a logic operation unit and an output unit, and the access signal passes through the rectifier unit, the input unit, the logic operation unit and the output unit in sequence and is output to the output element.

[0016] Preferably, the rectifier unit includes a positive half-wave / negative half-wave / full-wave rectifier circuit, a capacitor connected in parallel with the output end of the positive half-wave / negative half-wave / full-wave rectifier circuit, and a voltage divider circuit connected between the input end and the output end of the rectifier unit. The voltage divider circuit includes a pull-up / pull-down resistor and a series resistor / diode connected in series with the pull-up / pull-down resistor and the series resistor / diode, and the output signal is sent to the input unit after voltage division.

[0017] Preferably, the signal processing circuit further includes a memory unit, and the memory unit is connected to the logic operation unit.

[0018] Preferably, the device further comprises a frequency / reference voltage adjustment unit, wherein the frequency / reference voltage adjustment unit is used to adjust the clock oscillation frequency and reference voltage of the electronic device.

[0019] Preferably, a reset unit is further included, and the reset unit is used to control the electronic device to reset and restart.

[0020] Preferably, the output unit is a PWM output unit.

[0021] Preferably, the output element is a light wave, electromagnetic wave, sound wave / ultrasound wave or mechanical vibration wave output element, etc., and correspondingly, the action signal is a light wave, electromagnetic wave, sound wave / ultrasound wave or mechanical vibration wave signal, etc.

[0022] Preferably, the electronic device can be a chip and device with a small number of pins such as LED lamp, LDO, LVD, charging management IC, wireless radio frequency module, voice IC, single-chip microcomputer MCU, memory, sensor, steering gear, servo motor, etc.; the electronic device can also be LED bulb, LED lamp bead, LED lamp string, LED light bar, LED light belt, LED copper wire lamp, LED copper wire lamp, LED net lamp, LED curtain lamp, LED meteor lamp, LED lamp tube, LED scoreboard, LED signboard, LED indicator board, LED advertising board, LED display screen, LED display, etc., which are used for decoration, lighting, emergency, warning, indication, command, and information display of LED lamp products; the electronic device can also be LCD / LED watch, bracelet, gloves, necklace, necklace The electronic device may be a handheld device such as a ring, glasses, helmet, badge, armband, belt, vest, vest, backpack, earphones, shoes, etc.; the electronic device may also be a remote control, a dance machine, a game console, a game controller, a stylus, a handwriting tablet, a mouse, a light gun, a lightsaber, a flash stick, a cheer stick, a baton, a flashlight, a massager, a wireless intercom, a calculator, a scorer, a counter, an electronic cigarette, a mobile power supply, a beauty salon, etc.; the electronic device may also be an electrical device such as a doorbell, an intercom, a building intercom, an access lock, a smart lock, a human far infrared sensor (PIR), a door and window sensor, a temperature and humidity sensor, a smoke alarm, an alarm, a wireless switch, an intelligent gateway, a timer, a telephone exchange, a humidifier, an atomizer, an ultrasonic cleaner, an aromatherapy machine, a massage chair, a foot washing machine, etc.

[0023] The electronic device can also be an electronic measuring device such as an electronic scale, an electronic blood pressure monitor, an ear thermometer, an electronic thermometer, an electronic hygrometer, an electric meter, a rangefinder, etc.; the electronic device can also be an electronic product such as a music alarm clock, a music wall clock, a tour guide, a food ordering machine, a remote-controlled car, a remote-controlled boat, a remote-controlled aircraft, a robot, a voice-controlled lamp, an LED candle lamp, an LED night light, an LED bedside lamp, a wireless switch, a music bed bell, a music box, a music crystal ball, a smart pillow, an electric toothbrush, a voice toothbrush, an electronic musical instrument, an electronic greeting card, an electronic building block, an electronic toy, an electronic educational device, an action movement, a voice doll, an electronic fish, an electronic turtle, an electronic jellyfish, an electronic password lock, etc.

[0024] Obviously, electronic devices are not limited to the above types, but also include PACKAGE (package) / PCBA / COB module semi-finished products and other electronic products, which are not listed here one by one.

[0025] Preferably, the electronic device is an LED lamp bead, which includes a shell and a power interface leading out of the shell, the power interface includes a negative pin and a positive pin, a negative bracket and a positive bracket are provided inside the shell, a signal processing circuit is provided on the negative bracket, and an LED as an output element is provided on the positive bracket.

[0026] An electronic device debugging system includes an electronic device that is easy to debug and a main control device. The main control device includes a main control processing circuit and a testing device. The main control processing circuit is used to output an access signal to the power interface of the electronic device. The testing device includes a sensing element, which is arranged corresponding to the output element of the electronic device. The testing device is used to detect a perceptible action signal output by the output element of the electronic device and convert the action signal into an electrical signal to be transmitted back to the main control processing circuit.

[0027] Preferably, the main control processing circuit includes an input unit, a logic operation unit and an output unit, the input unit is connected to the logic operation unit, the logic operation unit is connected to the output unit, the output unit is used to output an access signal to the power interface of the electronic device, and the input unit is used to receive the electrical signal returned by the test device.

[0028] Preferably, the main control device further includes a driving circuit, and the output unit outputs the access signal to the power interface of the electronic device via the driving circuit.

[0029] Preferably, the driving circuit is a voltage follower, which is used to enhance the output driving capability of the output unit of the main control device.

[0030] Preferably, the main control processing circuit also includes a memory unit, a frequency / reference voltage adjustment unit and a reset unit. The memory unit is connected to the logic operation unit. The frequency / reference voltage adjustment unit is used to adjust the clock oscillation frequency of the main control device. The reset unit is used to control the reset and restart of the main control device.

[0031] Preferably, the output element is a light wave, electromagnetic wave, sound wave / ultrasound wave or mechanical vibration wave output element, and correspondingly, the sensing element is a light wave, electromagnetic wave, sound wave / ultrasound wave or mechanical vibration wave sensing element.

[0032] Preferably, the system includes multiple electronic devices, which are connected in series / parallel in sequence. Correspondingly, the main control device includes multiple testing devices for detecting the perceptible action signals output by the output elements of each electronic device, and the output ends of the multiple testing devices are all connected to the input ends of the main control processing circuit.

[0033] Preferably, the multiple electronic devices are connected in series in sequence, the signal processing circuit includes a rectifier unit, and a voltage stabilizing diode is connected in reverse parallel between the positive and negative poles of the power interface of the electronic device or the output end of the rectifier unit.

[0034] A method for debugging an electronic device, which is applied to an electronic device debugging system, comprises the following steps:

[0035] S1, the main control device outputs an access signal for debugging to the power interface of the electronic device;

[0036] S2, the electronic device receives the access signal via the power interface and drives the output element to output a corresponding action signal according to the access signal;

[0037] S3, the main control device uses the test device to detect the perceptible action signal output by the output element of the electronic device, converts the action signal into an electrical signal and transmits it back to the main control processing circuit for processing.

[0038] Preferably, the step S3 specifically includes the following sub-steps:

[0039] S31, the main control device uses the test device to detect the perceptible motion signal output by the output element of the electronic device, converts the motion signal into an electrical signal and transmits it back to the main control processing circuit;

[0040] S32, the logic operation unit of the main control processing circuit calculates the signal parameters of the action signal output by the output element of the electronic device according to the electrical signal in step S31;

[0041] S33, comparing the signal parameter described in step S32 with a preset reference value to obtain a deviation value. If the deviation value is within the preset range, jump to step S8, otherwise go to step S4;

[0042] The method further comprises the steps of:

[0043] S4, the main control device modulates the access signal through its output unit to transmit the deviation value to the electronic device;

[0044] S5, after receiving the deviation value described in step S4, the electronic device writes the value into a memory unit of the electronic device;

[0045] S6, the main control device resets and restarts the electronic device through its output unit;

[0046] S7, after the electronic device is reset, the deviation value in the memory unit is read, and the signal parameters of the action signal output by the output unit are adjusted according to the deviation value, and the execution of steps S1-S3 is returned;

[0047] S8, confirming that the signal parameters of the action signal output by the electronic device meet the preset requirements.

[0048] Preferably, the signal parameter is specifically: the signal parameter is a reference voltage, frequency or period corresponding to the action signal.

[0049] Preferably, the method further comprises the steps of:

[0050] S9, after confirming that the signal parameters of the action signal output by the electronic device meet the requirements, the main control device can write settings to the electronic device.

[0051] Preferably, the method further comprises the steps of:

[0052] S10, separating the electronic device from the main control device, so that the electronic device is powered on and operates independently.

[0053] Preferably, the method further comprises the step of: using a frequency / reference voltage adjustment unit to adjust the clock oscillation frequency of the electronic device to match the clock oscillation frequency of the main control device.

[0054] The beneficial effects of the present invention are:

[0055] The present invention cleverly integrates the power interface and signal interface of the electronic device, and only connects the conventional output end of the electronic device with the main control device, thereby realizing the debugging of electronic devices such as PACKAGE (package chip) / PCBA / COB module semi-finished products and electronic products. This overcomes the technical problem in the prior art that different ports need to be provided on the electronic device in order to perform various tests, burning and calibration on the electronic device, which leads to an increase in the size and cost of the electronic device. The purpose of debugging the electronic device is achieved through fewer external interfaces, thereby facilitating the miniaturization of electronic devices such as PACKAGE (package chip) / PCBA / COB module semi-finished products and electronic products, and achieving a waterproof, dustproof and aesthetically pleasing design of the device housing mechanism, thereby helping to ensure the quality of the electronic products and having good economic and social benefits.

[0056] The present invention can be widely applied to various electronic products and system debugging thereof. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] The specific embodiments of the present invention will be further described below with reference to the accompanying drawings:

[0058] Figure 1 This is a schematic diagram of a convenient debugging system according to embodiment 1A of the present invention;

[0059] Figure 2a This is a schematic diagram of a frequency / reference voltage adjustment unit for convenient debugging of a system using a fixed equivalent resistor to set parameters according to embodiment 1A of the present invention;

[0060] Figure 2bThis is a schematic diagram of a frequency / reference voltage adjustment unit for convenient debugging of a system using an adjustable equivalent resistor to set parameters according to embodiment 1A of the present invention;

[0061] Figure 3 This is a waveform diagram illustrating the working principle of an electronic device for facilitating system debugging according to embodiment 1A of the present invention;

[0062] Figure 4 1A is a signal waveform diagram of the LVD voltage parameter adjustment process of the electronic device according to the present invention;

[0063] Figure 5 This is a schematic diagram of the independent power-on of an electronic device according to embodiment 1A of the present invention;

[0064] Figure 6 is a waveform diagram of adjusting the frequency / period parameters of an electronic device according to embodiment 1B of the present invention;

[0065] Figure 7a and Figure 7b This is a comparison diagram of serial signals corresponding to different Rosc oscillation frequencies in Example 1B of the present invention;

[0066] Figure 8 This is a schematic diagram of a convenient debugging system according to embodiment 1C of the present invention;

[0067] Figure 9 This is a schematic diagram of signal waveforms corresponding to a convenient debugging system according to embodiment 1C of the present invention;

[0068] Figure 10a This is a schematic diagram of a convenient debugging system according to embodiment 1D of the present invention;

[0069] Figure 10b This is a schematic diagram of the independent power-on of the electronic device in Example 1D of the present invention;

[0070] Figure 11a This is a schematic diagram of a convenient debugging system according to embodiment 1E of the present invention;

[0071] Figure 11b This is a schematic diagram of the independent power-on of the electronic device in Example 1E of the present invention;

[0072] Figure 12 This is a schematic diagram of a convenient debugging system according to embodiment 2A of the present invention;

[0073] Figure 13 2A is a signal waveform diagram of the electronic device parameter debugging process of the present invention;

[0074] Figure 14 This is a waveform diagram illustrating the working principle of an electronic device for facilitating system debugging according to embodiment 2A of the present invention;

[0075] Figure 15 This is a schematic diagram of a convenient debugging system according to embodiment 2B of the present invention;

[0076] Figure 16 This is a schematic diagram of signal waveforms corresponding to a convenient debugging system according to embodiment 2B of the present invention;

[0077] Figure 17 This is a schematic diagram of the independent power-on of an electronic device according to embodiment 2B of the present invention;

[0078] Figure 18a This is a schematic diagram of a convenient debugging system according to embodiment 2C of the present invention;

[0079] Figure 18b This is a schematic diagram of the independent power-on of the electronic device in Example 2C of the present invention;

[0080] Figure 19a This is a schematic diagram of a convenient debugging system according to embodiment 2D of the present invention;

[0081] Figure 19b This is a schematic diagram of the independent power-on principle of a 2D electronic device according to an embodiment of the present invention;

[0082] Figure 20 This is a schematic diagram of a convenient debugging system according to embodiment 3A of the present invention;

[0083] Figure 21 This is a signal waveform diagram of the parameter debugging process of the electronic device in Example 3A of the present invention;

[0084] Figure 22 This is a waveform diagram illustrating the working principle of an electronic device for facilitating system debugging according to Example 3A of the present invention;

[0085] Figure 23a This is a schematic diagram of a convenient debugging system according to embodiment 3B of the present invention;

[0086] Figure 23b This is a schematic diagram of the independent power-on of an electronic device in Example 3B of the present invention;

[0087] Figure 24 This is a schematic diagram of signal waveforms corresponding to a convenient debugging system according to embodiment 3B of the present invention;

[0088] Figure 25a This is a schematic diagram of a convenient debugging system according to embodiment 3C of the present invention;

[0089] Figure 25b This is a schematic diagram of the independent power-on of a 3C electronic device according to an embodiment of the present invention;

[0090] Figure 26a This is a schematic diagram of a convenient debugging system according to embodiment 3D of the present invention;

[0091] Figure 26b This is a schematic diagram of the independent power-on principle of a 3D electronic device according to an embodiment of the present invention;

[0092] Figure 27 is a top perspective view of an electronic device according to embodiment 4A of the present invention;

[0093] Figure 28 is a side perspective view of an electronic device according to embodiment 4A of the present invention;

[0094] Figure 29 is a schematic diagram of a debugging system corresponding to embodiment 4A of the present invention;

[0095] Figure 30 is a top perspective view of an electronic device according to embodiment 4B of the present invention;

[0096] Figure 31 It is a schematic diagram of the debugging system corresponding to Example 4B of the present invention. DETAILED DESCRIPTION

[0097] It should be noted that, unless there is any conflict, the embodiments and features in the embodiments of this application can be combined with each other.

[0098] Overview:

[0099] The present invention can realize the functions of testing the electronic device, voltage and frequency parameter correction, high-speed data transmission, control and recording by the main control device through the power pin of the electronic device.

[0100] The basic concept of the present invention is:

[0101] 1. Connect the power interface of the electronic device to the output unit of the main control device, and the test device connects the output unit of the electronic device to the input unit of the main control device;

[0102] 2. Using a sensing element on the main control device to detect an output signal from an output unit of the electronic device connected to an output element;

[0103] 3. The test device converts the detected output signal of the electronic device into an electrical signal and then inputs it into the input unit of the main control processing circuit.

[0104] For ease of understanding, in the embodiments listed in the present invention, the output elements connected to the output unit of the electronic device are all converted into electrical signals by the test device and then connected to the input unit of the main control device. Practitioners in this industry can also easily simplify the test device and make simple modifications to the test device. For example, the output unit of the electronic device and the input unit of the main control device can be simply coupled and connected or even electrically directly connected. Such equivalent changes should also be included in the scope of the claims of the present invention.

[0105] The implementation principle and process of the present invention are described in detail below with multiple embodiments.

[0106] In the following embodiments, preliminary installation steps must be implemented first: the main control device and the electronic device are properly set up (the power interface of the electronic device is connected to the output unit of the main control device, and the output element connected to the output unit of the electronic device is within the accessible range of the sensing element, so that the sensing element on the test device can detect the action signal of the output element of the electronic device).

[0107] In the following embodiments, after the system is powered on and starts running, the main control device controls the electronic device, reads the status, and tests the electronic device, including the following steps:

[0108] 1. The master device modulates the power carrier signal through its output unit to access the electronic device;

[0109] 2. Upon receiving a valid access signal, the electronic device drives an output element through its output unit to generate a corresponding action signal (light wave, electromagnetic wave, sound wave / ultrasound wave, mechanical vibration wave), or converts data, status, or calculation results in the electronic device's memory unit into an action signal via an output element connected to the electronic device's output unit;

[0110] 3. After the sensor element on the test device detects the output action signal of the electronic device, it converts it into an electrical signal and transmits it back to the main control device for confirmation;

[0111] 4. Separate the electronic device from the main control device, so that the electronic device can be powered on and run independently, and complete the processes of controlling, reading status, and testing the electronic device.

[0112] It should be noted that the working power of the electronic device can be provided by the power carrier signal output by the main control device; it can also be provided by the built-in battery or capacitor of the electronic device; it can also be provided by the power supply (battery) externally connected to the power interface VP0 / VN0 of the electronic device.

[0113] Example 1A:

[0114] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a positive half-wave rectification circuit, and the output element is an LED.

[0115] like Figure 1 As shown, the main control processing circuit U201 of the main control device, the test device U301, the signal processing circuit U101 of the electronic device, and the output element D460 of the electronic device.

[0116] Description of the main control device composition: The main control device includes a main control processing circuit U201 and a test device U301.

[0117] The main control processing circuit U201 includes an input unit, a logic operation unit, a memory unit, a frequency / reference voltage adjustment unit, a reset unit, and an output unit. The input unit is connected to the logic operation unit, which is connected to the output unit. The output unit is used to output an access signal to the power supply interface VP0 / VN0 of the electronic device. The input unit is used to receive the electrical signal transmitted back from the test device U301. The main control processing circuit U201 can be implemented using an integrated IC chip (RISC / 6502 / 51 single-chip microcomputer, ARM single-chip microcomputer, or FPGA, etc.).

[0118] The main control device also includes a driving circuit, and the output unit outputs the access signal to the power interface VP0 / VN0 of the electronic device through the driving circuit. In this embodiment, the driving circuit is a voltage follower composed of an operational amplifier OPA209, a transistor Q505 and a resistor R506, and the connection relationship is as follows: Figure 1 As shown, it is used to enhance the output driving capability of the output unit of the main control device.

[0119] The test device U301 includes a phototransistor Q902 as a sensing element and a bias resistor R901 connected in series with it. Bias resistor R901 provides an operating bias voltage for phototransistor Q902. If the input unit of the main control device already has built-in pull-up / down resistors, bias resistor R901 can be omitted. Phototransistor Q902 is configured to correspond to an LED (labeled D460 in the figure). Phototransistor Q902 detects the perceptible light wave signal output by the LED (labeled D460 in the figure) and converts the light wave signal into an electrical signal that is transmitted back to input terminal MPI_0 of the input unit of the main control processing circuit U201.

[0120] The memory unit of the main control device can be a readable and writable storage device such as Flash, MTP, EEPROM, OTP (EPROM), SRAM, DRAM, Register, or a combination thereof.

[0121] The power supply unit of the main control device includes a power supply (battery) BAT590, a power supply terminal VCC and a filter capacitor C501.

[0122] The electronic device includes power supply interface VP0 / VN0, signal processing circuit U101, and output element D460. The input end of the input unit of signal processing circuit U101 can also be connected to an external touch button, and the electronic device can receive user control commands through the touch button.

[0123] The signal processing circuit U101 includes a rectifier unit, a logic operation unit, a memory unit, a reset unit, an output unit, an input unit, and a frequency / reference voltage adjustment unit (for digitally adjusting the frequency / level threshold). The signal processing circuit of the electronic device can be implemented using an integrated IC chip (RISC / 6502 / 51 microcontroller, ARM microcontroller or FPGA, etc.).

[0124] The rectifier unit includes a positive half-wave rectifier circuit. This circuit comprises a rectifier diode D400P (which can also be implemented as an equivalent diode within an IC chip), a capacitor C406 (which can also be implemented as an equivalent capacitor within an IC chip) connected in parallel with the output of rectifier diode D400P, and a voltage divider circuit connected between the input and output of rectifier diode D400P. The voltage divider circuit includes a pull-up resistor R407U (which can also be implemented as an equivalent resistor within an IC chip using a PMOS / NMOS method, etc.) and a series resistor R408P (which can also be implemented as an equivalent resistor within an IC chip using a PMOS / NMOS method, etc.). The pull-up resistor R407U and series resistor R408P divide the voltage and output a signal to the input terminal Data_In of the input unit. The rectifier unit receives input signals from power supply interfaces VP0 / VN0 and utilizes the charge-discharge characteristics of capacitor C406 to provide operating power to the signal processing circuit U101. This circuit has a simple structure and is cost-effective.

[0125] like Figure 2a and Figure 2b As shown, the frequency / reference voltage adjustment unit includes an oscillator unit and a bandgap reference unit, providing a reference voltage level for related circuits / units such as LVD (low voltage detection), LVR (low voltage reset), ADC (analog-to-digital conversion), DAC (digital-to-analog conversion), LDO (low dropout voltage regulator), over-temperature and over-current protection, and threshold adjustment. The frequency / reference voltage adjustment unit digitally adjusts the frequency / reference voltage. The oscillator or bandgap circuit within the integrated IC chip can change the value of the equivalent resistor Radj connected to the frequency / reference voltage adjustment unit input to adjust the circuit's output parameters, such as in an R / C oscillator circuit (changing the R value changes the oscillation frequency). Figure 2a In the figure, resistor R1 is a schematic diagram of an equivalent resistor that is originally fixed and cannot be adjusted; Figure 2b In the example, R1a and R1b0 to R1b3 form an adjustable equivalent resistance network connected in series. By inputting different states (1111b to 0000b) via the input terminals ADJ_b0 to ADJ_b3, the equivalent resistance Radj connected to the input terminal of the frequency / reference voltage adjustment unit becomes an adjustable 16-step equivalent resistance. In this embodiment, the adjustable range of the equivalent resistance Radj is 92R to 107R. Figure 2bThe transistors Q1 to Q4 (N-MOS transistors) are switch equivalent elements, which respectively control the weighted values ​​of the four series resistors R1b0 to R1b3.

[0126] The electronic device memory unit may be a Flash, MTP, EEPROM, OTP (EPROM), Mask-ROM, Laser-Fuse, Metal-Fuse, Poly-Fuse, SRAM, DRAM, Register, or a mixed type of readable and writable memory device.

[0127] In this embodiment, the working principle of the positive half-wave rectifier electronic device is as follows: Figure 3 shown. Figure 3 The figure includes the signal waveforms of the negative input terminal VN0 of the power interface, the positive input terminal VP0, the power supply VDD, and the input terminal Data_In of the input unit.

[0128] The output unit of the main control device inputs a high level to the positive input terminal VP0 of the power interface of the electronic device and a low level to the negative input terminal VN0. VP0 / VN0 charges the capacitor C406 through the diode D400P. When the potential stored on the capacitor C406 is basically balanced with the potential of the power interface VP0 / VN0, and the pull-up resistor R407U and the series resistor R408P of the electronic device input unit jointly raise the Data_In potential to above the VIH (high-level input voltage) level of the electronic device input unit, the logic operation unit of the electronic device recognizes the valid high-level input signal. After the above state remains stable for a short period of time, the PWR (Power On Reset) cycle of the electronic device is completed.

[0129] A low pulse (Low-Pulse) is input to the electronic device VP0 by the output unit of the main control device or the discharge resistor R506. At this time, the electronic device power supply VDD / VSS is supported by the discharge of the electric energy stored in the capacitor C406. However, the low level on the positive input terminal VP0 will generate a voltage divider through the series resistor R408P and the pull-up resistor R407U, pulling down the input level of the input terminal Data_In of the electronic device input unit. When the level input to Data_In is lower than the VIL (low-level input voltage) level of the electronic device input unit, the logic operation unit of the electronic device recognizes a valid low-level input signal. At this time, the level of the positive input terminal VP0 is set high again, and the capacitor C406 is recharged through the diode D400P.

[0130] The following is a detailed description of an implementation example of adjusting LVD (low voltage detection) voltage parameters by an electronic device with positive half-wave rectification according to this embodiment:

[0131] The signal waveform for adjusting the LVD voltage parameters of the electronic device is as follows: Figure 4shown.

[0132] First, properly connect the electronic device to the main control device and the test device.

[0133] The adjustment process includes the following stages:

[0134] PWR: The output unit of the master device powers on and resets the electronic device through the drive circuit.

[0135] TxD1: The output unit of the master device issues an "electronic device output unit action instruction following LVD voltage value" to the electronic device through the drive circuit. The signal level input to the electronic device must be lower than the VIL level of the electronic device.

[0136] The electronic device output unit can be configured to operate when the external input voltage to the electronic device is higher than the electronic device LVD voltage value, or it can be configured to operate when the external input voltage to the electronic device is lower than the electronic device LVD voltage value. This embodiment illustrates the operation of the electronic device output unit when the external input voltage to the electronic device is lower than the electronic device LVD voltage value.

[0137] Adj2: The output unit of the main control device gradually changes the voltage value supplied to the positive input terminal VP0 of the electronic device through the driving circuit, and at the same time monitors the output status of the electronic device through the sensing element on the test device.

[0138] The stepwise change of the voltage supplied to the positive input terminal VP0 of the electronic device may be in various forms such as stepwise increase, stepwise decrease, or binary search method. This embodiment uses the method of stepwise decrease of the voltage supplied to the positive input terminal VP0 of the electronic device for illustration.

[0139] RxD2a: The electronic device detects that the voltage value of the positive input terminal VP0 is related to the LVD voltage value, and the electronic device drives the output element through its output unit to perform an action.

[0140] The main control device receives the output action signal of the electronic device through the test device, records the voltage value supplied to the positive input terminal VP0 of the electronic device at this time, and compares it with the required value to obtain a difference value.

[0141] The main control device restores the voltage value supplied to the positive input terminal VP0 of the electronic device to a voltage value capable of writing into the memory unit of the electronic device via the output unit and the driving circuit.

[0142] TxD3: If the LVD voltage value of the electronic device does not meet the required specifications, the main control device issues an "LVD voltage adjustment command" to the electronic device through the output unit. The difference value is written into the electronic device's memory unit. The signal level input to the electronic device must be lower than the electronic device's VIL level. If the electronic device's LVD voltage value already meets the required specifications, this step can be omitted. If the electronic device's LVD voltage parameter status needs to be reconfirmed, the above adjustment process can be repeated.

[0143] After the LVD voltage parameters of the electronic device are adjusted, the main control device can be removed to allow the electronic device to be powered on and run independently, such as Figure 5 After the electronic device is separated from the test device and the main control device, it is powered on and operated independently, with the positive input terminal VP0 and the negative input terminal VN0 connected to the power supply BAT490.

[0144] In this embodiment, the main control device can also detect the RxD2a cycle time or the frequency reflected by the output unit of the electronic device to obtain the electronic device cycle / frequency value and compare it with the required value to obtain the difference value. Similarly, in the TxD3 stage, the main control device issues an "instruction to adjust the internal oscillation frequency value of the electronic device" to the electronic device through the output unit to complete the frequency adjustment operation of the electronic device. The waveform diagram of adjusting the frequency / cycle parameters of the electronic device is shown in FIG. Figure 6 shown.

[0145] Example 1B:

[0146] An electronic device debugging method is applied to an electronic device debugging system in embodiment 1A.

[0147] In this embodiment, the system is powered on and starts to run the method of writing and calibrating parameters such as reference voltage and oscillation frequency of the electronic device. The specific steps are as follows:

[0148] 1. The master control unit modulates the power carrier signal (access signal) through its output unit to access the electronic device. (At this stage, the access signal can use a modulation signal with a wide tolerance range, such as PWM (PDM) / PPM, commonly known as long-wave and short-wave signals.)

[0149] 2. After receiving a valid access signal, the electronic device drives the output element through its output unit to output a corresponding action signal (light wave, electromagnetic wave, sound wave / ultrasound wave, mechanical vibration wave, etc.), or converts the data, status, or calculation result in the electronic device's memory unit into an action signal output through the output element connected to the electronic device's output unit.

[0150] 3. After the sensor element on the test device detects the output action signal of the electronic device, it converts it into an electrical signal and sends it back to the main control device for confirmation.

[0151] 4. The logic operation unit of the main control device calculates the frequency or period value corresponding to the output action signal of the electronic device, compares it with the required frequency or period value, and obtains the deviation value. If the deviation value meets the required range, jump to step 13; otherwise, go to step 5.

[0152] 5. The main control device modulates the power carrier signal through its output unit and transmits the deviation value to the electronic device.

[0153] 6. After receiving the valid deviation value, the electronic device writes the value into the internal memory unit.

[0154] 7. The main control device powers on and restarts the electronic device through its output unit to reset it.

[0155] 8. After the electronic device is reset, the deviation value in the internal memory unit is read and the relevant parameters of the relevant (reference voltage / frequency) unit are adjusted.

[0156] 9. The master device modulates the power carrier signal (access signal) through its output unit to access the electronic device.

[0157] 10. After receiving a valid access signal, the electronic device drives the output element through its output unit to output a corresponding action signal (light wave, electromagnetic wave, sound wave / ultrasound wave, mechanical vibration wave, etc.), or converts the data, status, or calculation result in the electronic device's memory unit into an action signal output through the output element connected to the electronic device's output unit.

[0158] 11. After the sensor element on the test device detects the output action signal of the electronic device, it converts it into an electrical signal and transmits it back to the main control device for confirmation.

[0159] 12. The main control device calculates the frequency or period of the output action signal of the electronic device and calculates its deviation value. If it still does not meet the required range, return to step 5.

[0160] 13. After confirming that the output action signal of the electronic device meets the requirements, the main control device can write settings to the electronic device.

[0161] At this time, the electronic device can be set to a high-speed receiving signal modulation mode, and the subsequent electronic device can accept access from the main control device using a high-speed modulation signal (asynchronous / start-stop), thereby improving transmission efficiency.

[0162] 14. Separate the electronic device from the main control device and the test device, so that the electronic device can be powered on and run independently, and complete the process of writing to the electronic device and calibrating parameters such as reference voltage and oscillation frequency.

[0163] In addition, since this embodiment uses single-wire serial data transmission, there is no clock signal connection between the main control device and the electronic device. As a result, the transmitting and receiving ends cannot obtain completely synchronized oscillation frequencies / clock signals. Conventionally, the following two methods are used for communication.

[0164] 1.Signal modulation and coding methods such as PWM (PDM), PPM, FSK, etc.

[0165] The advantage of this method is that the Rosc (oscillation resistor) oscillation frequency / clock signal at the transmitting / receiving ends can be allowed to have a larger error range, such as + / -10%.

[0166] This type of modulation coding method uses a variety of different (period, frequency) ratio values ​​to arrange and combine a bit signal to achieve bit signal representation.

[0167] Specific approach: The receiving end samples the bit signal and receives it completely, and compares the ratio value (period, frequency) of the bit signal.

[0168] According to the ratio of duty cycle, frequency or amplitude, it is determined whether the bit signal belongs to "bit 0" or "bit 1".

[0169] Disadvantages: Under the same receiving sampling conditions, the transmission efficiency of this type of signal modulation and coding method is relatively poor.

[0170] 2. Asynchronous (start-stop) single-wire serial communication protocol (Asynchronous Communications).

[0171] This method requires that the Rosc oscillation frequency / clock signal at the sending / receiving ends be as close as possible.

[0172] Conventionally, a crystal oscillator of a specific frequency is used at both the transmitting and receiving ends to minimize the error range of the Rosc oscillation frequency / clock signal at both ends, for example, to less than + / - 0.5%.

[0173] The transmission efficiency of this type of signal modulation and coding method is relatively high, but the cost is also relatively high.

[0174] Assume that the system Rosc oscillation frequency of both the transmitter and receiver has a ±5% error. During mass production, worst-case scenarios must be considered to prevent erroneous data from being received. This requires considering extreme application scenarios, such as where the master control unit and the electronic device are paired with a transmitter with a Rosc oscillation frequency of +5% and a receiver with a Rosc oscillation frequency of -5%, or vice versa.

[0175] Figure 7a This is a comparison diagram of serial signals corresponding to different Rosc oscillation frequencies. In the figure, the reading times LH0 to LH7 at the receiving end are fixed.

[0176] When the transmitter TX_Rosc has a +0% deviation value, LH0 to LH7 can always fall within the valid reading area of ​​the single-wire serial signal.

[0177] When the transmitter TX_Rosc has a +10% deviation, LH0 to LH3 barely fall within the valid reading area of ​​the single-wire serial signal, but there is a chance that an erroneous state will be read starting from LH4.

[0178] When the transmitter TX_Rosc has a -10% deviation value, LH0 to LH2 barely fall within the valid reading area of ​​the single-wire serial signal, but there is a chance that an erroneous state will be read starting from LH3.

[0179] Figure 7a The LSB (Least-Significant-Bit) is sent out first for illustration, but the MSB (Most-Significant-Bit) can also be sent out first. Both are equivalent variations.

[0180] The description of signal modulation coding methods such as PDM (PWM) and PPM is as follows Figure 7b As shown, it can be compared with the asynchronous (start-stop) single-wire serial communication protocol. Under the same receiving end sampling conditions, the transmission efficiency of this type of signal modulation and coding method is relatively poor. Figure 7b The definitions of Bit0 and Bit1 in are interchangeable and are equivalent changes.

[0181] Assuming that the oscillation frequencies of the main control device and the electronic device have a + / -10% error during mass production, the worst-case scenario needs to be taken into account when designing the transmission protocol. This includes extreme situations where the transmitter / receiver ends may be paired with +10% and -10% or -10% and +10%. The receiving timing of conventional electronic devices needs to reserve an error margin of at least + / -20%, otherwise erroneous data may be received.

[0182] This embodiment can adjust the oscillation frequency error of the electronic device to be within a range very close to that of the main control device, for example, adjusting the error range to less than + / - 0.5%, allowing more orders (types) of data transmission within the same transmission cycle time.

[0183] Example 1C:

[0184] An electronic device debugging system comprises a main control device and an electronic device. The rectification unit comprises a positive half-wave rectification circuit, and the output element is a loudspeaker.

[0185] like Figure 8 As shown, the difference between this embodiment and embodiment 1A is that the output element of the electronic device is changed from an LED (marked D460 in the figure) to a speaker SPK480. The system of this embodiment includes a main control processing circuit U201, a test device U302, an electronic device U101, and an electronic device output element SPK480.

[0186] The sensing element on test device U302 is microphone MIC932. Test device U302 includes a microphone preamplifier circuit consisting of capacitor C931, resistor R933, capacitor C934, capacitor C935, resistor R936, resistor R937, resistor R938, resistor R939, resistor R940, transistor Q941, and capacitor C942. This circuit amplifies the signal received by microphone MIC932 and transmits it to the input of the main control device.

[0187] The signal waveform diagram corresponding to this embodiment is shown in FIG. Figure 9 As shown in the figure, the corresponding relationship between the signal waveforms of the negative input terminal VN0, the positive input terminal VP0 of the power interface of the electronic device and the output terminals SPWM0 / SPWM1 of the output unit is described. The working principle is similar to that of embodiment 1A and will not be repeated here.

[0188] Example 1D:

[0189] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a positive half-wave rectification circuit, the output element is an LED, and the electronic device has a built-in rechargeable battery or capacitor.

[0190] The principle diagram of this embodiment is as follows Figure 10a As shown, the difference from embodiment 1A is that the electronic device has a built-in rechargeable battery or capacitor.

[0191] After completing the operation of the electronic device, the main control device can be removed and the electronic device can operate independently using the built-in rechargeable battery BAT490a or capacitor, or the positive input terminal VP0 and the negative input terminal VN0 of the electronic device can be connected to the external power supply BAT490, such as Figure 10b shown.

[0192] In this embodiment, the rechargeable battery BAT490a or the capacitor is connected in parallel to the power supply VDD / VSS of the electronic device. The external power supply BAT490 can charge the rechargeable battery BAT490a or the capacitor built into the electronic device.

[0193] Example 1E:

[0194] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a positive half-wave rectification circuit, the output element is an LED, and the electronic device has a built-in battery.

[0195] The principle diagram of this embodiment is as follows Figure 11a As shown, the difference from embodiment 1A is that the electronic device has a built-in battery.

[0196] After completing the operation of the electronic device, the main control device can be removed and the electronic device can be operated independently using the built-in battery BAT490b, or the positive input terminal VP0 and the negative input terminal VN0 of the electronic device can be connected to the external power supply BAT490. Figure 11b shown.

[0197] In the figure, the internal battery BAT490b is connected in series with a diode D418P and connected to both ends of the power supply VDD / VSS of the electronic device to prevent the external power supply BAT490 and the internal battery BAT490b from affecting each other.

[0198] In this embodiment, the voltage of the external power supply BAT490 is generally slightly higher than the voltage of the internal battery BAT490b. This design allows the electronic device to primarily consume system power when connected to the external power supply BAT490, minimizing the energy consumption of the internal battery BAT490b.

[0199] Example 2A:

[0200] An electronic device debugging system comprises a main control device and an electronic device. The rectification unit comprises a negative half-wave rectification circuit, and the output element is an LED.

[0201] The principle diagram of this embodiment is as follows Figure 12 As shown, the main control device includes a main control processing circuit U203 and a test device U303, and the electronic device includes a signal processing circuit U103. The difference between this embodiment and embodiment 1A is that the rectifier unit includes a negative half-wave rectifier circuit. The parameter debugging waveform corresponding to this embodiment is shown in FIG. Figure 13 shown. Figure 13 The working process of PWR, TxD1, RxD2 and TxD3 in this embodiment is similar to that of embodiment 1A and will not be described in detail here.

[0202] The working principle of the negative half-wave rectifier electronic device is as follows Figure 14 The output unit of the master control device inputs a high level to the positive input terminal VP0 of the electronic device power interface and a low level to the negative input terminal VN0 of the electronic device power interface. The power interface VP0 / VN0 charges the capacitor C406 via the diode D400N. When the potential stored on the capacitor C406 is substantially balanced with the potential of VP0 / VN0, the pull-down resistor R407D and the series resistor R408N of the input unit of the electronic device jointly pull the potential of the input terminal Data_In of the electronic device input unit below the VIH level of the electronic device input unit, allowing the logic operation unit of the electronic device to recognize a valid low-level input signal. After the above state remains stable for a short period of time, the electronic device PWR (Power On Reset) cycle is completed.

[0203] A high pulse (High-Pulse) is input to the electronic device VN0 by the output unit of the main control device or the discharge resistor R505. At this time, the electronic device power supply VDD / VSS is supported by the discharge of the electric energy stored in the capacitor C406. However, the high potential on the negative input terminal VN0 will generate a voltage divider through the series resistor R408N and the pull-down resistor R407D, thereby pulling up the input potential of the input terminal Data_In of the electronic device input unit. When the potential of the input terminal Data_In of the electronic device input unit is higher than the VIH level of the electronic device input unit, the logic operation unit of the electronic device recognizes a valid high-level input signal. At this time, the potential of the negative input terminal VN0 is lowered again, and the capacitor C406 is recharged through the diode D400N.

[0204] Example 2B:

[0205] An electronic device debugging system comprises a main control device and an electronic device. The rectification unit comprises a negative half-wave rectification circuit, and the output element is a loudspeaker.

[0206] like Figure 15As shown, the main control device includes a main control processing circuit U203 and a test device U304, and the electronic device includes a signal processing circuit U103. This embodiment differs from Example 2A in that the output element of the electronic device is changed from an LED (labeled D460 in the figure) to a speaker SPK480, and the sensing element on the test device is a microphone MIC932.

[0207] The waveform diagram corresponding to this embodiment is as follows: Figure 16 shown.

[0208] After the operation is completed, the main control device can be removed and the electronic device can be powered on and run independently, such as Figure 17 shown.

[0209] After the electronic device is separated from the test device and the main control device, it is powered on and operated independently, and the positive input terminal VP0 and the negative input terminal VN0 of the power interface are connected to the power supply BAT490.

[0210] Example 2C:

[0211] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a negative half-wave rectification circuit, the output element is an LED, and the electronic device has a built-in rechargeable battery or capacitor.

[0212] The principle diagram of this embodiment is as follows Figure 18a As shown, the difference from embodiment 2A is that the electronic device has a built-in rechargeable battery or capacitor.

[0213] The electronic device has a built-in rechargeable battery or capacitor BAT490a. After completing the operation of the electronic device, the main control device can be removed and the electronic device can operate independently using the built-in rechargeable battery or capacitor BAT490a, or the positive input terminal VP0 and the negative input terminal VN0 of the electronic device can be connected to an external power supply BAT490. Figure 18b shown.

[0214] Example 2D:

[0215] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a negative half-wave rectification circuit, the output element is an LED, and the electronic device has a built-in battery.

[0216] The principle diagram of this embodiment is as follows Figure 19a As shown, the difference from embodiment 2A is that the electronic device has a built-in battery.

[0217] The output unit MPOUT3 of the main control device directly drives the negative input terminal VN0 of the electronic device using a GPIO (general purpose input) method.

[0218] The electronic device has a built-in battery BAT490b. After completing the operation of the electronic device, the main control device can be removed and the electronic device can operate independently using the built-in battery BAT490b, or the positive input terminal VP0 and the negative input terminal VN0 of the electronic device can be connected to the external power supply BAT490. Figure 19b shown.

[0219] Example 3A:

[0220] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a full-wave rectification circuit, and the output element is an LED.

[0221] The principle diagram of this embodiment is as follows Figure 20 As shown, the main control device includes a main control processing circuit U205 and a test device U305, and the electronic device includes a signal processing circuit U105. The difference between this embodiment and embodiment 1A is that the rectifier unit includes a full-wave rectifier circuit. The parameter debugging waveform corresponding to this embodiment is shown in FIG. Figure 21 shown. Figure 21 The signal waveforms of the electronic device power input terminal VNP0 / VPN0 and the output terminal SPWM2 of the electronic device output unit are shown in FIG. The working process PWR, TxD1, RxD2, and TxD3 are similar to the adjustment working process of embodiment 1A and will not be described in detail here.

[0222] The working principle of full-wave rectifier electronic device is as follows Figure 22 As shown in the figure, the output unit of the master control device inputs a high level and a low level, respectively, to the power interface VPN0 / VNP0 of the electronic device. The potential across the power interface VPN0 / VNP0 is then passed through a full-wave bridge rectifier circuit composed of diodes D402, D403, D404, and D405, charging capacitor C406. When the potential stored on capacitor C406 is substantially balanced with the potential of the power interface VPN0 / VNP0, and the pull-up resistor R407U of the electronic device input unit pulls the potential of the input terminal Data_In of the electronic device input unit above the VIH level or is pulled down to below the VIL level by the series diode D408, the logic operation unit of the electronic device recognizes a valid high / low level input signal. After the above state remains stable for a short period of time, the electronic device completes the PWR (Power On Reset) cycle.

[0223] The output unit of the main control device switches the potential of the power interface VPN0 / VNP0 of the electronic device. During the brief interval of the switch, the power supply VDD / VSS of the electronic device is discharged by the energy stored in capacitor C406. After the switch is completed, the potential at both ends of the power interface VPN0 / VNP0 is recharged through the full-wave bridge rectifier circuit to charge capacitor C406.

[0224] If the power input terminal VNP0 turns to a low level, the series diode D408 is used to pull down the input terminal Data_In of the electronic device input unit, thereby pulling down the input potential. When the potential of the input terminal Data_In of the electronic device input unit is lower than the VIL level of the electronic device input unit, the logic operation unit of the electronic device will recognize a valid low-level input signal.

[0225] If the power input terminal VNP0 transitions to a high level, the pull-up resistor R407U pulls up the input terminal Data_In of the electronic device input unit, thereby raising the input potential. When the potential of the input terminal Data_In of the electronic device input unit is higher than the VIH level of the electronic device input unit, the logic operation unit of the electronic device will recognize a valid high-level input signal.

[0226] Combined with a suitable access signal (e.g. Manchester coded signal), full-wave rectifier electronic devices also have the advantage of being polarity-insensitive for the power pins.

[0227] Example 3B:

[0228] An electronic device debugging system comprises a main control device and an electronic device. The rectification unit comprises a full-wave rectification circuit, and the output element is a speaker.

[0229] like Figure 23a As shown, the difference between this embodiment and embodiment 3A is that the output element of the electronic device is changed from an LED (marked D460 in the figure) to a speaker SPK480, and the sensing element on the test device is a microphone MIC932.

[0230] The waveform diagram corresponding to this embodiment is as follows: Figure 24 shown.

[0231] After the operation is completed, the main control device can be removed and the electronic device can be powered on and run independently, such as Figure 23b shown.

[0232] The electronic device is separated from the test device and the main control device and powered on independently for operation, with VPN0 and VNP0 connected to the power supply BAT490.

[0233] Example 3C:

[0234] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a full-wave rectification circuit, the output element is an LED, and the electronic device has a built-in rechargeable battery or capacitor.

[0235] The principle diagram of this embodiment is as follows Figure 25a As shown, the difference from embodiment 3A is that the electronic device has a built-in rechargeable battery or capacitor.

[0236] In this embodiment, the electronic device has a built-in rechargeable battery or capacitor BAT490a. After completing the operation of the electronic device, the main control device can be removed and the electronic device can operate independently using the built-in rechargeable battery or capacitor BAT490a, or the power input terminal VPN0 / VNP0 of the electronic device can be connected to an external power supply BAT490. Figure 25b shown.

[0237] Example 3D:

[0238] An electronic device debugging system includes a main control device and an electronic device. The rectification unit includes a full-wave rectification circuit, the output element is an LED, and the electronic device has a built-in battery.

[0239] The principle diagram of this embodiment is as follows Figure 26a As shown, the difference from embodiment 3A is that the electronic device has a built-in battery. The output terminals MPOUT1 / MPOUT2 of the main control device output unit use PWM / Push-Pull (push-pull output) to directly drive the electronic device power interface VPN0 / VNP0.

[0240] The electronic device has a built-in battery BAT490b. After completing the operation of the electronic device, the main control device can be removed and the electronic device can operate independently using the built-in battery BAT490b, or the power input terminal VPN0 / VNP0 of the electronic device can be connected to an external power supply BAT490. Figure 26b shown.

[0241] Example 4A:

[0242] In this embodiment, the electronic device is a DIP plug-in LED lamp bead, and its structure is as follows: Figure 27 and Figure 28 shown. Figure 28The DIP LED lamp includes a housing 100, a cathode support 110, a cathode support 120, a single-electrode LED 121, a dual-electrode LED 122, a dual-electrode LED 123, a signal processing circuit integrated IC chip 111, a cathode pin 210, and a cathode pin 220. The cathode support 110 and the cathode pin 210 are integrally formed and electrically connected; the anode support 120 and the cathode pin 220 are integrally formed and electrically connected. The positive terminal VP of the signal processing circuit integrated IC chip 111 is electrically connected to the anode support 120, and the negative terminal VSS of the signal processing circuit integrated IC chip 111 is electrically connected to the cathode support 110. The negative terminal of the single-electrode LED 121 is electrically connected to the output terminal SPWM0 of the signal processing circuit integrated IC chip 111, and the positive terminal of the single-electrode LED 121 is electrically connected to the positive electrode bracket 120 by sticking conductive glue on the bottom layer; the negative terminal N of the double-electrode LED 122 is electrically connected to the output terminal SPWM1 of the signal processing circuit integrated IC chip 111, and the positive terminal P of the double-electrode LED 122 is electrically connected to the positive electrode bracket 120; the negative terminal N of the double-electrode LED 123 is electrically connected to the output terminal SPWM2 of the signal processing circuit integrated IC chip 111, and the positive terminal P of the double-electrode LED 123 is electrically connected to the positive electrode bracket 120.

[0243] The schematic diagram of the debugging system corresponding to this embodiment is as follows Figure 29 As shown in the figure, it includes a main control processing circuit U201, a test device U301 and a positive half-wave rectifier electronic device U101. The working principle of this embodiment is similar to that of embodiment 1A, and will not be repeated here.

[0244] In this embodiment, the LED lamp includes a housing and a power interface extending from the housing. The power interface includes a negative pin and a positive pin. A negative and positive holder are located within the housing. The negative holder is equipped with a signal processing circuit, while the positive holder is equipped with an LED as an output element. The signal processing circuit is implemented using an integrated IC chip.

[0245] In principle, there are two ways to drive LEDs: Drive / Sink. This embodiment applies both methods. However, considering the packaging convenience of DIP plug-in LED lamp beads, the LEDs are concentrated on the positive bracket 120 to achieve better light mixing effect, and the signal processing circuit IC chip is placed on the negative bracket 110. The placement positions are reasonably distributed, such as Figure 27 and Figure 28 Considering that some LED lamp bead holders only have one large bracket for the chip, it is also possible to place both the LED and the signal processing circuit IC chip on the large bracket.

[0246] Example 4B:

[0247] In this embodiment, the electronic device can also be an SMD chip packaged LED lamp bead, and its structure is as follows: Figure 30 As shown in the figure, the SMD packaged LED lamp includes a housing 300, SMD power pins 310 / 320, a reference ground 330, a single-electrode LED 321, a dual-electrode LED 322, a dual-electrode LED 323, and a signal processing circuit integrated IC chip 311. The power interface terminals VPN / VNP of the signal processing circuit integrated IC chip 311 are electrically connected to the SMD power pins 310 / 320, respectively. The positive terminal of the single-electrode LED 321 is electrically connected to the output terminal SPWM0 of the signal processing circuit integrated IC chip 311, and the negative terminal of the single-electrode LED 321 is electrically connected to the reference ground 330 through the conductive glue attached to the bottom layer; the positive terminal P of the dual-electrode LED 322 is electrically connected to the output terminal SPWM1 of the signal processing circuit integrated IC chip 311, and the negative terminal N of the dual-electrode LED 322 is electrically connected to the reference ground 330; the positive terminal P of the dual-electrode LED 323 is electrically connected to the output terminal SPWM2 of the signal processing circuit integrated IC chip 311, and the negative terminal N of the dual-electrode LED 323 is electrically connected to the reference ground 330.

[0248] The schematic diagram of the debugging system corresponding to this embodiment is as follows Figure 31 As shown in the figure, it includes a main control processing circuit U205, a test device U305 and a full-wave rectifier electronic device U105. Its working principle is similar to that of embodiment 3A and will not be described in detail here.

[0249] Example 5A:

[0250] An electronic device debugging system comprises a main control device and a plurality of electronic devices, wherein the electronic devices are LED lamp beads.

[0251] In this embodiment, the system includes multiple electronic devices, which are connected in series / parallel in sequence. Correspondingly, the main control device includes multiple testing devices for detecting the perceptible action signals output by the output elements of each electronic device, and the output ends of the multiple testing devices are all connected to the input ends of the main control processing circuit.

[0252] In this embodiment, multiple LED lamp beads are connected in series or in parallel to form a light string. Since each LED lamp bead can be independently controlled and operated, it is convenient to realize LED light strings with individual control or point control functions, as well as all the functions of other types of LED light strings, such as synchronous flashing, jumping flashing, and back and forth flashing.

[0253] When connecting multiple electronic devices in series, a Zener diode must be connected in reverse order between the positive and negative terminals of each device's power connector or rectifier output. During the signal debugging phase, the master control unit can output an AC signal to drive the connected devices. During standalone operation, the connected devices can operate with an external AC signal.

[0254] The technical effects achieved by the present invention include but are not limited to:

[0255] 1. The electronic device has very few external interfaces:

[0256] (1) Fewer PACKAGE / PCBA / COB connections / soldering points reduce production costs and are also conducive to miniaturization of PACKAGE / PCBA / COB;

[0257] (2) It is beneficial to the waterproof, dustproof and beautiful design of the housing of electronic products (electronic devices). In addition to the original power interface, there is no need to lead out additional testing, burning and calibration interfaces;

[0258] (3) It is helpful to facilitate the updating, testing and debugging of program data after the product (electronic device) is assembled, and it is convenient for users to complete the updating of customized / real-time data content by themselves, which is conducive to the sales of customized and differentiated products.

[0259] 2. It can realize the testing, voltage and frequency parameter calibration, high-speed transmission, control and burning requirements of PACKAGE (package) / PCBA / COB module semi-finished products, electronic products and other electronic devices during mass production.

[0260] 3. Products (electronic devices) can adjust the internal oscillation frequency of signal processing circuits (for example, they can correct for offsets in the internal oscillation frequency of IC semiconductors caused by the effects of packaging materials). When used in mass production with passive components with a wide tolerance range, this can ensure greater consistency across mass-produced products (electronic devices), improving product (electronic device) quality and increasing the efficiency of data programming and updating within the product (electronic device).

[0261] The above is a specific description of the preferred embodiments of the present invention, but the invention is not limited to the embodiments. Those skilled in the art can make various equivalent modifications or substitutions without violating the spirit of the present invention. These equivalent modifications or substitutions are all included in the scope defined by the claims of this application.

Claims

1. An electronic device that is easy to debug, characterized in that: include: Power interface; The power interface of the electronic device is connected to the output unit of the main control device; a signal processing circuit, wherein the input end of the signal processing circuit is connected to the output end of the power interface, and is used to receive and process the access signal received by the power interface, and drive the output element to output a corresponding action signal according to the access signal; an output element, connected to the output terminal of the signal processing circuit, for outputting a perceptible action signal; The output element of the electronic device is configured to correspond to the sensing element of the testing device of the main control device, and the testing device is configured to detect the perceptible action signal output by the output element of the electronic device; The output element is a light wave, electromagnetic wave, sound wave or mechanical vibration wave output element, and correspondingly, the action signal is a light wave, electromagnetic wave, sound wave or mechanical vibration wave signal; The signal processing circuit includes a rectification unit, an input unit, a logic operation unit and an output unit. The access signal passes through the rectification unit, the input unit, the logic operation unit and the output unit in sequence and is output to the output element. The electronic device also includes a reset unit, which is used to control the electronic device to reset and restart.

2. The electronic device for convenient debugging according to claim 1, characterized in that: The rectifier unit includes a positive half-wave / negative half-wave / full-wave rectifier circuit, a capacitor connected in parallel with the output end of the positive half-wave / negative half-wave / full-wave rectifier circuit, and a voltage divider circuit connected between the input end and the output end of the rectifier unit. The voltage divider circuit includes an up / down resistor and a series resistor / diode connected in series with the up / down resistor and the series resistor / diode. After voltage division, the up / down resistor and the series resistor / diode output a signal to the input unit.

3. The electronic device for convenient debugging according to claim 2, characterized in that: The signal processing circuit further includes a memory unit connected to the logic operation unit.

4. The electronic device for convenient debugging according to claim 2, characterized in that: The device further comprises a frequency / reference voltage adjustment unit, which is used to adjust the clock oscillation frequency and reference voltage of the electronic device.

5. The electronic device for convenient debugging according to claim 1, characterized in that: The output unit is a PWM output unit.

6. The electronic device for convenient debugging according to claim 1, characterized in that: The electronic device is an LED lamp, an LDO, an LVD, a charging management IC, a wireless radio frequency module, a voice IC, a single-chip microcomputer MCU, a memory, a sensor, a steering gear, a servo motor, an electronic wearable device, an electronic handheld smart device, an electronic measuring device or an electronic toy.

7. The electronic device for convenient debugging according to claim 5, characterized in that: The electronic device is an LED lamp bead, which includes a shell and a power interface leading out of the shell, the power interface includes a negative pin and a positive pin, a negative bracket and a positive bracket are provided inside the shell, a signal processing circuit is provided on the negative bracket, and an LED as an output element is provided on the positive bracket.

8. An electronic device debugging system, characterized in that: It comprises an electronic device and a main control device that are easy to debug as described in any one of claims 1 to 7, wherein the main control device comprises a main control processing circuit and a testing device, wherein the main control processing circuit is used to output an access signal to the power interface of the electronic device, and the testing device comprises a sensing element, wherein the sensing element is arranged corresponding to the output element of the electronic device, and the testing device is used to detect a perceptible action signal output by the output element of the electronic device, and convert the action signal into an electrical signal and transmit it back to the main control processing circuit.

9. The electronic device debugging system according to claim 8, characterized in that: The main control processing circuit includes an input unit, a logic operation unit and an output unit. The input unit is connected to the logic operation unit, and the logic operation unit is connected to the output unit. The output unit is used to output an access signal to the power interface of the electronic device, and the input unit is used to receive the electrical signal returned by the test device.

10. The electronic device debugging system according to claim 9, characterized in that: The main control device further includes a driving circuit, and the output unit outputs the access signal to the power interface of the electronic device through the driving circuit.

11. The electronic device debugging system according to claim 10, characterized in that: The driving circuit is a voltage follower, which is used to enhance the output driving capability of the output unit of the main control device.

12. An electronic device debugging system according to any one of claims 8 to 11, characterized in that: The main control processing circuit also includes a memory unit, a frequency / reference voltage adjustment unit and a reset unit. The memory unit is connected to the logic operation unit. The frequency / reference voltage adjustment unit is used to adjust the clock oscillation frequency of the main control device. The reset unit is used to control the main control device to reset and restart.

13. The electronic device debugging system according to claim 12, characterized in that: The output element is a light wave, electromagnetic wave, sound wave or mechanical vibration wave output element, and correspondingly, the sensing element is a light wave, electromagnetic wave, sound wave or mechanical vibration wave sensing element.

14. An electronic device debugging system according to claim 8, 9, 10, 11 or 13, characterized in that: The system includes multiple electronic devices, which are connected in series / parallel in sequence. Correspondingly, the main control device includes multiple testing devices for detecting the perceptible action signals output by the output elements of each electronic device, and the output ends of the multiple testing devices are all connected to the input ends of the main control processing circuit.

15. The electronic device debugging system according to claim 14, characterized in that: The multiple electronic devices are connected in series in sequence, the signal processing circuit includes a rectifier unit, and a voltage stabilizing diode is connected in reverse parallel between the positive and negative poles of the power interface of the electronic device or the output end of the rectifier unit.

16. A method for debugging an electronic device, characterized in that: The method is applied to an electronic device debugging system according to any one of claims 8 to 15, and the method comprises the steps of: S1, the main control device outputs an access signal for debugging to the power interface of the electronic device; S2, the electronic device receives the access signal via the power interface and drives the output element to output a corresponding action signal according to the access signal; S3, the main control device uses the test device to detect the perceptible action signal output by the output element of the electronic device, converts the action signal into an electrical signal and transmits it back to the main control processing circuit for processing.

17. The electronic device debugging method according to claim 16, characterized in that: The step S3 specifically includes the following sub-steps: S31, the main control device uses the test device to detect the perceptible motion signal output by the output element of the electronic device, converts the motion signal into an electrical signal and transmits it back to the main control processing circuit; S32, the logic operation unit of the main control processing circuit calculates the signal parameters of the action signal output by the output element of the electronic device according to the electrical signal in step S31; S33, comparing the signal parameter described in step S32 with a preset reference value to obtain a deviation value. If the deviation value is within the preset range, jump to step S8, otherwise go to step S4; The method further comprises the steps of: S4, the main control device modulates the access signal through its output unit to transmit the deviation value to the electronic device; S5, after receiving the deviation value described in step S4, the electronic device writes the deviation value into a memory unit of the electronic device; S6, the main control device resets and restarts the electronic device through its output unit; S7, after the electronic device is reset, the deviation value in the memory unit is read, and the signal parameters of the action signal output by the output unit are adjusted according to the deviation value, and the execution of steps S1-S3 is returned; S8, confirming that the signal parameters of the action signal output by the electronic device meet the preset requirements.

18. The electronic device debugging method according to claim 17, characterized in that: The signal parameter is specifically: the signal parameter is a reference voltage, frequency or period corresponding to the action signal.

19. The electronic device debugging method according to claim 18, characterized in that: The method further comprises the steps of: S9, after confirming that the signal parameters of the action signal output by the electronic device meet the requirements, the main control device writes settings to the electronic device.

20. The electronic device debugging method according to any one of claims 16 to 19, characterized in that: The method further comprises the steps of: S10, separating the electronic device from the main control device, so that the electronic device is powered on and operates independently.

21. An electronic device debugging method according to any one of claims 16 to 19, characterized in that: The method further comprises the step of: using a frequency / reference voltage adjustment unit to adjust the clock oscillation frequency of the electronic device to match the clock oscillation frequency of the main control device.

22. The electronic device debugging method according to claim 20, characterized in that: The method further comprises the step of: using a frequency / reference voltage adjustment unit to adjust the clock oscillation frequency of the electronic device to match the clock oscillation frequency of the main control device.

Images