Sample cutting platform and laser cutting machine including the same

Abstract

The present invention relates to a sample cutting platform, comprising a sample adsorption unit, a residual sample support unit and a lifting device, wherein the residual sample support unit is arranged above the sample adsorption unit. A sample adsorption base is provided on the sample adsorption unit, and an adsorption device is provided on the top of the sample adsorption base. The setting position of the sample adsorption base corresponds to the position of the sample to be adsorbed. The residual sample support unit is used to place the steel plate to be cut. The lifting device is provided on the sample adsorption unit, and / or on the residual sample support unit, and is used to make the sample and the residual sample after cutting produce relative movement up and down, thereby separating the sample and the residual sample. The present invention also provides a laser cutting machine comprising the sample cutting platform.

Description

Technical Field

[0001] The present invention relates to the technical field of mechanical processing, and more particularly to a sample cutting platform and a laser cutting machine comprising the same. Background Art

[0002] When conducting material testing, the laboratory needs to sample and prepare the materials according to the requirements. For example, in a steel plate laboratory, it is necessary to prepare tensile specimens, bending specimens, etc. at the center of the plate or 1 / 4 of the width direction as required, and to prepare specimens for testing coatings, weight, etc. at a certain distance from the edge of the plate. The sample range covers chemical experiments and physical experiments. Figure 1a 、 1b Figures 1a and 1c show several commonly used specimen layouts. Specimen 1 is a roughness specimen, 2 is a porosity specimen, 3 is a tensile and bend specimen, 6 is a disc specimen used for testing coatings, weight, etc., 7 is a hardness specimen, 9 is a ghost band specimen, 10 is a zinc bend specimen, 11 is an interlayer resistance specimen, 12 is a large single-piece magnetic specimen, 13 is a magnetic specimen, and 14 is a specimen for interlayer resistance, thickness measurement, and plate-to-plate difference. Existing specimen preparation methods mostly use shearing machines, punching machines, milling machines, and sawing machines. These require numerous machine tools, resulting in lengthy specimen preparation and high labor intensity. Existing laser cutting machines are not suitable for specimen preparation. During cutting, the cutting platform lacks a device to securely hold the specimen, and the specimen is easily blown away by the compressed air from the laser head, colliding with the laser head and causing machine downtime. Furthermore, the specimens are not easily collected and sorted for subsequent processing. Summary of the Invention

[0003] In view of this, an object of the present invention is to provide a sample cutting platform and a laser cutting machine including the same, aiming to solve the technical problem that the cutting platform of the existing laser cutting machine is not suitable for sample preparation.

[0004] According to a first aspect of the present invention, a sample cutting platform is provided, comprising a sample adsorption unit, a residual sample support unit, and a lifting device, wherein the residual sample support unit is arranged above the sample adsorption unit.

[0005] The sample adsorption unit includes an adsorption reference plate and a plurality of sample adsorption bases provided on the adsorption reference plate. The top of the sample adsorption base is provided with an adsorption device for adsorbing the sample. The arrangement positions of the plurality of sample adsorption bases on the adsorption reference plate correspond to the positions of the samples to be adsorbed.

[0006] The residual sample supporting unit includes a residual sample reference plate, and the residual sample reference plate is used to place the steel plate to be cut;

[0007] The lifting device is provided on the sample adsorption unit and / or the residual sample supporting unit, and is used to make the sample and the residual sample after cutting to move up and down relative to each other, thereby separating the sample and the residual sample.

[0008] Preferably, the sample adsorption unit further comprises a first mounting bracket, the first mounting bracket being arranged below the adsorption reference plate, and the first mounting bracket and the adsorption reference plate being connected via the lifting device;

[0009] The lifting device drives the adsorption reference plate to move up and down to separate the cut sample from the residual sample.

[0010] Preferably, a guide rail is further included, and the sample adsorption unit is movably arranged on the guide rail.

[0011] Preferably, a rotating shaft is provided at one end of the residual sample supporting unit, and the residual sample supporting unit can be turned over around the rotating shaft. The residual sample supporting unit is provided with a driving device for driving the residual sample supporting unit to turn over.

[0012] Preferably, the residual sample reference plate is provided with a blanking hole matching the pre-cut shape of the sample, and the sample adsorption base passes through the blanking hole upwards, thereby achieving adsorption of the sample.

[0013] Preferably, the plurality of sample adsorption bases are divided into a plurality of groups, each group is provided with an independent control switch, and the opening and closing of the adsorption devices on the sample adsorption bases in each group are controlled by the control switch, thereby achieving selective adsorption of the sample.

[0014] Preferably, the residual sample reference plate is fixedly connected to the adsorption reference plate, and the lifting device is provided on the residual sample reference plate. The lifting device is used to lift the residual sample after cutting to achieve separation of the sample and the residual sample.

[0015] Preferably, the adsorption reference plate of the sample adsorption unit includes a fixed adsorption reference plate and movable adsorption reference plates arranged on both sides of the fixed adsorption reference plate, and the residual sample reference plate of the residual sample supporting unit includes a fixed residual sample reference plate and a movable residual sample reference plate, the upper side of the fixed adsorption reference plate is connected to the fixed residual sample reference plate, and the upper side of the movable adsorption reference plate is connected to the movable residual sample reference plate;

[0016] The sample adsorption unit also includes a second mounting bracket, the fixed adsorption reference plate and the movable adsorption reference plate are both arranged on the second mounting bracket, and the movable adsorption reference plate is movably arranged on the second mounting bracket and can move toward or away from the fixed adsorption reference plate.

[0017] Preferably, the residual sample support unit further comprises a plurality of residual sample adsorption bases, the tops of the residual sample adsorption bases are provided with adsorption devices capable of adsorbing residual samples, and the residual sample adsorption bases are arranged on the residual sample reference plate.

[0018] According to a second aspect of the present invention, a laser cutting machine is provided. The laser cutting machine includes the above-mentioned sample cutting platform.

[0019] The beneficial effects of the present invention are as follows: when cutting a sample, the sample cutting platform of the present invention adsorbs the sample through the sample adsorption unit, and the residual sample support unit supports the residual sample. After the sample cutting is completed, the lifting device is used to make the sample and the residual sample move up and down relative to each other, thereby separating the sample and the residual sample, thereby facilitating subsequent processes such as sample collection, sorting and marking. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings.

[0021] Figure 1a 、 Figure 1b and Figure 1c These are the commonly used sample layout diagrams.

[0022] Figure 2 A top view of a sample cutting platform according to a first embodiment of the present invention is shown.

[0023] Figure 3 The diagram shows a front view of the sample adsorption unit and the residual sample support unit in the sample cutting platform according to the first embodiment of the present invention after the sample cutting is completed.

[0024] Figure 4 A top view of a sample adsorption unit in a sample cutting platform according to a first embodiment of the present invention is shown.

[0025] Figure 5 A left side view of a sample adsorption unit in a sample cutting platform according to a first embodiment of the present invention is shown.

[0026] Figure 6 A top view of a residual sample supporting unit in a sample cutting platform according to a first embodiment of the present invention is shown.

[0027] Figure 7 A schematic structural diagram of a vacuum suction cup type sample adsorption base in a sample cutting platform according to a first embodiment of the present invention is shown.

[0028] Figure 8 A schematic structural diagram of another vacuum suction cup type sample adsorption base in a sample cutting platform according to the first embodiment of the present invention is shown.

[0029] Figure 9 A schematic structural diagram of an electromagnet-type sample adsorption base in a sample cutting platform according to a first embodiment of the present invention is shown.

[0030] Figure 10 A top view of a sample cutting platform according to a second embodiment of the present invention is shown.

[0031] Figure 11 A schematic structural diagram of the assembly portion of the fixed adsorption reference plate and the fixed residual sample reference plate in the sample cutting platform according to the second embodiment of the present invention is shown.

[0032] Figure 12 for Figure 11 Center F view.

[0033] In the figure: adsorption reference plate 1, sample adsorption base 2, vacuum suction cup 21, connecting base 22, electromagnet 23, residual sample reference plate 3, mounting base 30, blanking hole 31, first mounting bracket 41, second mounting bracket 42, lifting screw 51, lifting cylinder 52, guide rail 6, rack 71, gear 72, first drive device 8, rotating shaft 9, lifting cylinder 10, fixed adsorption reference plate 11, movable adsorption reference plate 12, fixed residual sample reference plate 13, movable residual sample reference plate 14, servo motor 15, transmission screw 16, first transmission part 161, second transmission part 162, screw nut 17, residual sample lifting cylinder 18, residual sample adsorption base 19, support column 20. DETAILED DESCRIPTION

[0034] Various embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. In each of the accompanying drawings, identical elements are represented by identical or similar reference numerals. For the sake of clarity, the various parts in the accompanying drawings are not drawn to scale.

[0035] Example 1:

[0036] As shown in Figure 1 to Figure 9 As shown, this embodiment provides a sample cutting platform comprising a sample adsorption unit, a residual sample support unit, and a lifting device. The residual sample support unit is positioned above the sample adsorption unit. The term "sample" in this specification refers to a material cut from a specific location on a steel plate that meets material testing requirements and has a specific shape. The remaining portion of the steel plate after the sample is cut is called a residual sample.

[0037] The sample adsorption unit includes an adsorption reference plate 1, on which a plurality of sample adsorption bases 2 are provided. The top of the sample adsorption base 2 is provided with an adsorption device for adsorbing the sample, which is used to adsorb the sample to be cut when the steel plate is cut, and to continue to adsorb the sample after the sample cutting is completed to complete the separation from the residual sample. The arrangement positions of the plurality of sample adsorption bases 2 on the adsorption reference plate 1 correspond to the positions of the samples to be adsorbed, so that the sample adsorption base 2 and the adsorption device provided thereon can avoid the cutting path when the sample is cut, thereby preventing damage to the sample adsorption base 2 and the adsorption device during laser cutting.

[0038] The residual sample support unit includes a residual sample reference plate 3, which is used to place the steel plate to be cut. The residual sample reference plate 3 is provided with a blanking hole 31 that matches the pre-cut shape of the sample. The sample adsorption base 2 passes through the blanking hole 31 upward to achieve adsorption of the sample.

[0039] The lifting device is provided on the sample adsorption unit, and is used to make the sample and the residual sample after cutting produce relative up and down movement, so as to separate the sample and the residual sample. The adsorption device is a vacuum suction cup 21 or an electromagnet 23. Multiple sample adsorption bases 2 are divided into multiple groups, and each group is provided with an independent control switch. The opening and closing of the adsorption device on each group of sample adsorption bases 2 is controlled by the control switch, so as to realize the selective adsorption of the sample. When cutting the sample, the vacuum suction cup 21 or electromagnet 23 on each sample adsorption base 2 can be controlled according to the production task to select which samples need to be adsorbed to facilitate cutting. Samples that do not need to be cut are not adsorbed or are released when the residual sample and the sample are separated. Figure 7 and Figure 8 , which are schematic structural diagrams of sample adsorption bases 2 with two different types of vacuum suction cups 21 in the sample cutting platform. Figure 7 The sample adsorption base 2 shown in the figure has a circular vacuum suction cup 21 on the top and a connecting base 22 on the bottom. The connecting base 22 is used to be connected to the adsorption reference plate 1 by screws. Figure 7 The sample adsorption base 2 shown can be used to adsorb smaller wafer samples, and several sample adsorption bases 2 can also be combined to adsorb larger interlayer resistance samples or large single-piece magnetic samples. Figure 8 The sample adsorption base 2 shown in the figure has three circular vacuum suction cups 21 on the top and the bottom can be connected to the adsorption reference plate 1 by screws. Figure 8 The sample adsorption base 2 shown can be used to adsorb Figure 1bThe long magnetic sample in the middle. It is understandable that the vacuum suction cup 21 can be changed to other shapes to absorb the sample. The sample adsorption base 2 of the vacuum suction cup 21 type has the vacuum suction cup 21 on the top connected to the vacuum generator through a conduit. Depending on the size of the sample to be adsorbed, one or more vacuum suction cups 21 can share a vacuum generator, or vacuum generators of different specifications can be selected. For example Figure 8 In the embodiment, the vacuum suction cup 21 for adsorbing the long magnetic sample can use one vacuum generator for three vacuum suction cups 21, and the vacuum generator is arranged inside the sample adsorption base 2. For a smaller sample adsorption base 2, the vacuum generator can be arranged outside the sample adsorption base 2. Figure 9 As shown, an electromagnet-type sample adsorption base 2 is provided. An electromagnet 23 is provided on the top of the sample adsorption base 2 , and the bottom of the sample adsorption base 2 can be connected to the adsorption reference plate 1 by screws.

[0040] The sample adsorption unit also includes a first mounting bracket 41, which is arranged below the adsorption reference plate 1. The first mounting bracket 41 and the adsorption reference plate 1 are connected through a lifting device; wherein the lifting device drives the adsorption reference plate 1 to rise and fall to separate the cut sample from the residual sample. Figure 4 and Figure 5 The sample adsorption unit is a schematic diagram of the structure of the sample adsorption unit. The sample adsorption base 2 on the sample adsorption unit is arranged on the adsorption reference plate 1. Figure 1b The sample arrangement diagram is shown. In this embodiment, the lifting device includes two lifting screws 51 and four lifting cylinders 52 arranged between the first mounting bracket 41 and the adsorption reference plate 1. The two lifting screws 51 are arranged at both ends of the adsorption reference plate 1 along the length direction, and are located in the middle position of the adsorption reference plate 1 along the width direction. A lifting cylinder 52 is symmetrically arranged on both sides of each lifting screw 51. The outer tube of the lifting screw 51 is connected to the first mounting bracket 41, and the screw rod of the lifting screw 51 is connected to the nut installed on the adsorption reference plate 1; the cylinder barrel of the lifting cylinder 52 is connected to the first mounting bracket 41, and the top end of the cylinder rod of the lifting cylinder 52 is connected to the adsorption reference plate 1. The two lifting screws 51 cooperate with the four lifting cylinders 52 to operate simultaneously, which can smoothly complete the lifting and lowering of the adsorption reference plate 1. Figure 6 The top view of the residual sample support unit includes a residual sample reference plate 3. The residual sample support unit has a blanking hole 31 on the residual sample reference plate 3. The blanking hole 31 matches the pre-cut shape of the sample. The blanking hole 31 on the residual sample reference plate 3 in the figure corresponds to Figure 1bIn the sample arrangement diagram shown, the shape and dimensions of the drop hole 31 are slightly larger than those of the sample. This facilitates the upward movement of the sample adsorption base 2 through the drop hole 31 to adsorb the sample. Furthermore, the sample can pass smoothly through the drop hole 31 when separating from the residual sample. In this embodiment, the residual sample support unit includes a support frame, to which the periphery of the residual sample reference plate 3 is connected.

[0041] Furthermore, the sample cutting platform also includes a guide rail 6, such as Figure 2 The figure shows a top view of the sample cutting platform, in which the arrangement of the sample adsorption base 2 on the adsorption reference plate 1 corresponds to Figure 1a The sample arrangement diagram shown in FIG. Two parallel guide rails 6 are provided below the sample adsorption unit. Rollers are provided below the first mounting bracket 41 of the sample adsorption unit, allowing the sample adsorption unit to move along the guide rails 6. After sample cutting is completed, the sample adsorption base 2 adsorbs the sample and, driven by the lifting device, moves downward to separate it from the residual sample. After separation, the sample adsorption unit, holding the sample, can be moved along the guide rails 6 toward the side away from the residual sample support unit. The sample can then be removed manually or by machine. In this embodiment, the movement of the sample adsorption unit on the guide rails 6 is driven by a rack and pinion transmission. Specifically, a rack 71 parallel to the guide rails 6 is provided between the two guide rails 6. A first drive device 8 is provided at one end of the first mounting bracket 41 of the sample adsorption unit. A gear 72 meshing with the rack 71 is provided on the output shaft of the first drive device 8. The first drive device 8 comprises a motor and a reduction gearbox. The output shaft of the motor is connected to the input shaft of the reduction gearbox, which is connected to the gear 72. The forward and reverse rotation of the motor enables the sample adsorption unit to move in both directions on the guide rails 6. In other embodiments, the movement of the sample adsorption unit on the guide rail 6 may also be driven by a synchronous belt, a screw rod, or the like.

[0042] Furthermore, a rotating shaft 9 is provided at one end of the residual sample support unit, and the residual sample support unit can be turned around the rotating shaft 9. A second driving device for driving the residual sample support unit to turn is provided on the residual sample support unit. Figure 3 The figure shows a front view of the sample adsorption unit and the residual sample support unit after the sample cutting is completed. In this embodiment, the rotating shaft 9 is arranged on the mounting seat 30 on one side of the residual sample support unit. The second driving device for driving the residual sample support unit to flip is a lifting cylinder 10 arranged below the residual sample support unit. The cylinder rod of the lifting cylinder 10 is hinged to the lower part of the residual sample support unit, and the cylinder barrel of the lifting cylinder 10 is hinged to the lower part of the mounting seat 30. In this embodiment, the mounting seat 30 is arranged on the ground at one end of the guide rail 6. After the sample cutting is completed, the sample adsorption unit moves to the side of the residual sample support unit. The residual sample support unit flips a certain angle to slide the residual sample into the residual sample box. The residual sample can also be removed from the residual sample support unit manually or by a robot.

[0043] Furthermore, a plurality of residual sample adsorption bases can be provided on the residual sample reference plate 3 of the residual sample support unit for adsorbing the residual sample. The top of the residual sample adsorption base is provided with an adsorption device capable of adsorbing the residual sample. The structural type of the residual sample adsorption base can refer to the sample adsorption base 2.

[0044] Embodiment 2:

[0045] like Figures 10 to 12 As shown, the sample cutting platform in this embodiment is different from that in the first embodiment in that:

[0046] The residual sample reference plate 3 is fixedly connected to the adsorption reference plate 1, and there is a certain distance between the residual sample reference plate 3 and the adsorption reference plate 1. A lifting device is provided on the residual sample reference plate 3, and the lifting device is used to lift the residual sample after cutting is completed to achieve separation of the sample and the residual sample. The adsorption reference plate 1 of the sample adsorption unit in this embodiment includes a fixed adsorption reference plate 11, and a movable adsorption reference plate 12 arranged on both sides of the fixed adsorption reference plate 11. The residual sample reference plate 3 includes a fixed residual sample reference plate 13 and a movable residual sample reference plate 14. The upper side of the fixed adsorption reference plate 11 is connected to the fixed residual sample reference plate 13, and the upper side of the movable adsorption reference plate 12 is connected to the movable residual sample reference plate 14. The sample adsorption unit also includes a second mounting bracket 42. The fixed adsorption reference plate 11 and the movable adsorption reference plate 12 are both arranged on the second mounting bracket 42. The movable adsorption reference plate 12 can be movably arranged on the second mounting bracket 42 and can move toward or away from the fixed adsorption reference plate 11. Reference Figure 10-12 , Figure 10 To correspond Figure 1cThe sample cutting platform shown in the sample arrangement diagram includes a second mounting bracket 42. A fixed adsorption reference plate 11 is mounted in the middle of the second mounting bracket 42. A fixed residual sample reference plate 13 is positioned above the fixed adsorption reference plate 11. The fixed residual sample reference plate 13 is spaced a certain distance from the fixed adsorption reference plate 11 and connected to the fixed adsorption reference plate 11 via support columns 20. Movable adsorption reference plates 12 are positioned on either side of the fixed adsorption reference plate 11 on the second mounting bracket 42. A movable residual sample reference plate 14 is positioned above the movable adsorption reference plate 12. The movable residual sample reference plate 14 is spaced a certain distance from the movable adsorption reference plate 12 and connected to the movable adsorption reference plate 12 via support columns 20. The movable adsorption reference plate 12 can move on the second mounting bracket 42 toward or away from the fixed adsorption reference plate 11. Movement of the movable adsorption reference plate 12 on the second mounting bracket 42 is driven by a screw transmission mechanism. In this embodiment, two movable adsorption reference plates 12 are provided on either side of the fixed adsorption reference plate 11. A screw nut 17 is provided at the same end of each of the two movable adsorption reference plates 12 on each side. A transmission screw 16 is provided on the second mounting bracket 42, which is coupled to the screw nut 17. The transmission screw 16 is divided into a first transmission portion 161 and a second transmission portion 162. The first transmission portion 161 is located on the side closest to the fixed adsorption reference plate 11, and the lead of the second transmission portion 162 is twice that of the first transmission portion 161. The movable adsorption reference plate 12 closer to the fixed adsorption reference plate 11 is coupled to the first transmission portion 161 of the transmission screw 16 via the screw nut 17, while the movable adsorption reference plate 12 farther from the fixed adsorption reference plate 11 is coupled to the second transmission portion 162 of the transmission screw 16 via the screw nut 17. A sliding sleeve is provided at the other end of each of the two movable adsorption reference plates 12 on each side, and a sliding rod is provided on the second mounting bracket 42, which is coupled to the sliding sleeve. The transmission screw 16 is driven to rotate by a servo motor 15. The rotation of the transmission screw 16 is converted into linear movement of the two movable adsorption reference plates 12. Because the first transmission portion 161 and the second transmission portion 162 of the transmission screw 16 have two leads, the two movable adsorption reference plates 12 on the same side move proportionally when approaching or moving away from the fixed adsorption reference plate 11. In this embodiment, the movement speed of the movable adsorption reference plate 12 connected to the second transmission portion 162 of the transmission screw 16 is twice that of the movable adsorption reference plate 12 connected to the first transmission portion 161 of the transmission screw 16. The servo motor 15 is located at both ends of the second mounting bracket 42 and is arranged parallel to the transmission screw 16. A belt drives the output shaft of the servo motor 15 and the input shaft of the transmission screw 16. Controlling the number of revolutions of the servo motor 15 controls the movement distance of the movable adsorption reference plate 12 on one side. The movement of the movable adsorption reference plate 12 on the second mounting bracket 42 can also be driven by a synchronous belt, ball screw, or other means.

[0047] In this embodiment, both the sample adsorption base 2 and the residual sample adsorption base 19 employ electromagnet-type adsorption devices. The sample adsorption base 2 is mounted on the adsorption reference plate, and the top of the electromagnet on the adsorption reference plate is flush with the upper surface of the residual sample reference plate. The residual sample adsorption base 19 is connected to the residual sample reference plate and mounted on the residual sample reference plate, with the top of the electromagnet on the residual sample adsorption base 19 flush with the upper surface of the residual sample reference plate. A lifting device is mounted on the residual sample reference plate. In this embodiment, the lifting device is a residual sample lifting cylinder 18. The cylinder barrel of the residual sample lifting cylinder 18 is fixed to the lower surface of the residual sample reference plate. When the cylinder rod of the residual sample lifting cylinder 18 is retracted, the top of the cylinder rod is flush with the upper surface of the residual sample reference plate. During sample cutting, the steel plate is placed on the residual sample reference plate. The rod of the residual sample lifting cylinder 18 is retracted, and the electromagnets on the sample adsorption base 2 and the residual sample adsorption base 19 draw the steel plate together for sample cutting. After sample cutting is complete, the electromagnet on the residual sample adsorption base 19 is de-energized, no longer adsorbing the steel plate, while the electromagnet on the sample adsorption base 2 maintains its grip on the sample. The rod of the residual sample lifting cylinder 18 extends, lifting the residual sample, thereby separating it from the sample. After separation from the sample, the residual sample can be removed manually or robotically, and then the sample can be collected. To do this, the electromagnet on the sample adsorption base 2 is de-energized.

[0048] The sample cutting platform in this embodiment can be adjusted according to the width of the steel plate, so that the sample cutting position on the steel plate meets the requirements. For example, if the tensile and bend specimens are required to be cut at 1 / 4 of the width of the steel plate, the movable adsorption reference plate 12 can be adjusted according to the width of the steel plate so that the sample adsorption base 2 for adsorbing the tensile and bend specimens is aligned at 1 / 4 of the width of the steel plate.

[0049] In the above embodiments, the sample layout diagram is not limited to Figure 1a 、 Figure 1b and Figure 1c The layout diagram shown can be adjusted according to the requirements of sample preparation, such as adding or reducing samples, changing the shape and layout of samples, etc.

[0050] The sample cutting platform of the present invention adsorbs the sample through the sample adsorption unit and supports the residual sample through the residual sample support unit during sample cutting. After the sample cutting is completed, the lifting device is used to make the sample and the residual sample move up and down relative to each other, thereby separating the sample and the residual sample, thereby facilitating subsequent processes such as sample collection, sorting and marking.

[0051] An embodiment of the present invention further provides a laser cutting machine, which includes the sample cutting platform described in the above embodiments.

[0052] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus comprising the element.

[0053] Finally, it should be noted that the above embodiments are merely examples for the purpose of illustrating the present invention and are not intended to limit the embodiments. Those skilled in the art will readily appreciate that other variations or modifications based on the above description are possible. It is not necessary and impossible to provide an exhaustive list of all embodiments. However, obvious variations or modifications arising therefrom remain within the scope of protection of the present invention.

Claims

1. A sample cutting platform, characterized in that: It includes a sample adsorption unit, a residual sample support unit and a lifting device, wherein the residual sample support unit is arranged above the sample adsorption unit. The sample adsorption unit includes an adsorption reference plate and a plurality of sample adsorption bases provided on the adsorption reference plate. The top of the sample adsorption base is provided with an adsorption device for adsorbing the sample. The arrangement positions of the plurality of sample adsorption bases on the adsorption reference plate correspond to the positions of the samples to be adsorbed. The residual sample supporting unit includes a residual sample reference plate, and the residual sample reference plate is used to place the steel plate to be cut; The lifting device is provided on the sample adsorption unit and / or the residual sample support unit, and is used to make the cut sample and the residual sample move up and down relative to each other, thereby separating the sample and the residual sample; The sample adsorption unit further includes a first mounting bracket, the first mounting bracket being disposed below the adsorption reference plate, the first mounting bracket being connected to the adsorption reference plate via the lifting device; wherein the lifting device drives the adsorption reference plate to rise and fall to separate the cut sample from the residual sample; It also includes a guide rail, and the sample adsorption unit is movably arranged on the guide rail; The adsorption reference plate of the sample adsorption unit includes a fixed adsorption reference plate and movable adsorption reference plates arranged on both sides of the fixed adsorption reference plate. The residual sample reference plates of the residual sample support unit include a fixed residual sample reference plate and a movable residual sample reference plate. The upper side of the fixed adsorption reference plate is connected to the fixed residual sample reference plate, and the upper side of the movable adsorption reference plate is connected to the movable residual sample reference plate. The sample adsorption unit also includes a second mounting bracket, the fixed adsorption reference plate and the movable adsorption reference plate are both arranged on the second mounting bracket, and the movable adsorption reference plate is movably arranged on the second mounting bracket and can move toward or away from the fixed adsorption reference plate.

2. The sample cutting platform according to claim 1, characterized in that: A rotating shaft is provided at one end of the residual sample supporting unit, and the residual sample supporting unit can be turned over around the rotating shaft. A driving device for driving the residual sample supporting unit to turn over is provided on the residual sample supporting unit.

3. The sample cutting platform according to claim 1, characterized in that: The residual sample reference plate is provided with a blanking hole that matches the pre-cut shape of the sample, and the sample adsorption base passes through the blanking hole upwards, thereby achieving adsorption of the sample.

4. The sample cutting platform according to claim 1, characterized in that: The plurality of sample adsorption bases are divided into a plurality of groups, each group is provided with an independent control switch, and the opening and closing of the adsorption devices on the sample adsorption bases in each group are controlled by the control switch, thereby realizing selective adsorption of the sample.

5. The sample cutting platform according to claim 1, characterized in that: The residual sample reference plate is fixedly connected to the adsorption reference plate. The residual sample reference plate is provided with the lifting device, which is used to lift the residual sample after cutting to achieve separation of the sample and the residual sample.

6. The sample cutting platform according to claim 1, characterized in that: The residual sample support unit further comprises a plurality of residual sample adsorption bases, the tops of the residual sample adsorption bases are provided with adsorption devices capable of adsorbing residual samples, and the residual sample adsorption bases are arranged on the residual sample reference plate.

7. A laser cutting machine, characterized in that: The invention comprises the sample cutting platform according to any one of claims 1 to 6.

Images