Test equipment

Abstract

The present invention discloses a test device, including a probe module and a clamping assembly, wherein the probe module includes a probe seat and a plurality of probes, a receiving groove for placing an electronic device is provided in the middle of the upper side of the probe seat, and the clamping assembly includes a bottom frame, an upper cover and two pressing claws, wherein the bottom frame is used to be fixed to a test circuit board, the probe module is located in the bottom frame, and two notches are provided on opposite sides of the bottom frame to accommodate the two pressing claws, respectively, the upper cover is provided on the bottom frame, and an elastic element is provided between the upper cover and the bottom frame, each pressing claw is connected to the upper cover through a pull shaft and to the bottom frame through a support shaft, and the pull shaft is located outside the support shaft, and the upper cover, under the elastic force of the elastic element, makes the pull shaft, the support shaft and the pressing claw be located at a first position for pressing down the electronic device, and by pressing down the upper cover by a predetermined distance, the pull shaft, the support shaft and the pressing claw can be linked to a second position for releasing the electronic device. The present invention increases the downward force so as to be better applicable to electronic devices with a large number of pins.

Description

Technical Field

[0001] The present invention relates to the field of electronic testing devices, and in particular to a testing device for electronic devices. Background Art

[0002] When using a test device to operate electronic devices such as integrated circuit chips, such as chip burning and chip testing, the test device is usually installed on a test rack and aligned with a test circuit board on the test rack, so that the test pins on the chip are placed in the test socket of the test device, and the test pins of the chip are electrically connected to the test circuit board through the test device.

[0003] In the existing test device, it is necessary to press down the chip, so that the pins can stably contact with the probes of the test device to achieve electrical conduction. Since some chips have a large number of pins, the number of probes (or the area of ​​the conductor) required is also large (large), and the probes are conductors with a certain elasticity. Therefore, in order to press down more probes, the test device needs a very large downward force. The downward force of the test rack is limited, thus limiting the maximum number of pins that the test device can test, and it is also easy to reach the downward pressure limit, resulting in poor contact and misjudgment. Summary of the invention

[0004] The main purpose of the present invention is to provide a testing device, aiming to improve the downward force so as to be better suitable for electronic devices with a large number of pins.

[0005] To achieve the above-mentioned purpose, the present invention provides a testing device, which includes a probe module and a clamping assembly. The probe module includes a probe seat and a plurality of probes. A receiving groove for placing electronic devices is provided in the middle of the upper side of the probe seat. The plurality of probes are arranged in the probe seat and pass through the upper and lower sides of the probe seat, and are used to electrically connect a test circuit board located at the lower side of the probe module with the electronic device located in the receiving groove of the probe module. The clamping assembly includes a bottom frame, an upper cover and two pressing claws. The bottom frame is used to be fixed to the test circuit board. The probe module is located at In the bottom frame, two notches are respectively provided on opposite sides of the bottom frame to accommodate the two pressure claws respectively. The upper cover is provided on the bottom frame, and an elastic element is provided between the upper cover and the bottom frame. Each pressure claw is connected to the upper cover through a pull shaft and to the bottom frame through a support shaft, and the pull shaft is located on the outside of the support shaft. Under the elastic force of the elastic element, the upper cover makes the pull shaft, support shaft and pressure claw be located in the first position for pressing down the electronic device. By pressing down the upper cover by a predetermined distance, the pull shaft, support shaft and pressure claw can be linked to the second position for releasing the electronic device.

[0006] Preferably, the upper cover is provided with a transverse guide groove for guiding and limiting the pull shaft, the bottom frame is provided with an oblique groove for guiding and limiting the pull shaft, and the bottom frame is provided with a transverse support groove for guiding and limiting the support shaft, and the transverse support groove is located on the inner side of the oblique groove; when in the first position, the pull shaft is located at the inner end of the transverse guide groove and the top end of the oblique groove, the support shaft is located at the inner end of the transverse support groove, and the pressure claw is in an inwardly extended state for clamping the electronic components in the receiving groove; when in the second position, the pull shaft is located at the outer end of the transverse guide groove and the bottom end of the oblique groove, the support shaft is located at the outer end of the transverse support groove, and the pressure claw is in an outwardly moved state for releasing the electronic components in the receiving groove.

[0007] Preferably, the inclined slot comprises a vertical section at the upper portion and an inclined section at the lower portion, and the inclined section extends outwardly and downwardly from the bottom end of the vertical section.

[0008] Preferably, two pull columns are respectively extended downward on the two opposite sides of the two notches of the upper cover and the bottom frame, and the two pull columns are arranged at an interval, and the transverse guide groove is arranged on the pull column and close to the bottom end of the pull column, and the outer end of the pressure claw is located between the two pull columns, and the bottom frame is respectively provided with the inclined grooves on the side surfaces opposite to the two pull columns, and the two ends of the pull shaft respectively pass through the transverse guide grooves on the two pull columns and are inserted into the inclined grooves.

[0009] Preferably, in the first position, the pulling shaft and the supporting shaft are aligned in the horizontal direction.

[0010] Preferably, two first vertical guide grooves are respectively provided on the side surfaces of the bottom frame opposite to the two pull columns, for limiting and guiding the two pull columns.

[0011] Preferably, the other two opposite sides of the bottom frame are respectively provided with a second vertical guide groove, and the upper cover extends a limiting column toward the bottom frame corresponding to the second vertical guide groove, and the second vertical guide groove is used to guide and limit the limiting column.

[0012] Preferably, a limiting protrusion is formed on the bottom frame in the second vertical guide groove, and a limiting groove is provided on the limiting column corresponding to the limiting protrusion, and the limiting groove is used for guiding and limiting the limiting protrusion.

[0013] Preferably, the elastic element includes four compression springs, and the four compression springs are respectively arranged at four corners of the bottom frame and the upper cover.

[0014] Preferably, the probe seat includes a bottom plate, a middle fixed plate and an upper floating plate, the middle fixed plate and the upper floating plate are sequentially arranged on the bottom plate, multiple probes are fixed by the bottom plate and the middle fixed plate, and a compression spring is provided between the upper floating plate and the middle fixed plate to form a floating connection.

[0015] In the test device of the present invention, by setting a pressure claw, a pull shaft and a support shaft, the lever structure is used to amplify the downward pressure. The increased downward pressure of the pressure claw can make the pins and conductors of the electronic device more stably tested, and can be better suitable for electronic devices with a large number of pins, avoiding the occurrence of misdetection, and can reduce the downward pressure required by the test rack. In addition, by setting an inclined slot, the opening and withdrawal distance of the pressure claw can be increased, which is convenient for taking and placing electronic devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a partially exploded schematic diagram of an embodiment of a testing device of the present invention.

[0017] Figure 2 for Figure 1 An assembled cross-sectional view of the test device shown.

[0018] Figure 3 for Figure 1 Another assembled cross-sectional view of the test device shown.

[0019] Figure 4 for Figure 1 Schematic diagram of the exploded view of the hold-down assembly in the test setup shown.

[0020] Figure 5 for Figure 1 Schematic diagram of the exploded view of the probe module in the test device shown.

[0021] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0022] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0023] like Figures 1 to 5The figure shows an embodiment of a testing device of the present invention, wherein the testing device comprises a probe module 1 and a clamping assembly 2, wherein the probe module 1 comprises a probe seat 11 and a plurality of probes 12, wherein a receiving groove 111 for placing an electronic device (not shown in the figure) is provided in the middle of the upper side of the probe seat 11, wherein the plurality of probes 12 are arranged in the probe seat 11 and pass through the upper and lower sides of the probe seat 11, and are used to electrically connect a test circuit board (not shown in the figure) located at the lower side of the probe 12 module 1 with the electronic device located in the receiving groove 111 of the probe 12 module 1, wherein the clamping assembly 2 comprises a bottom frame 21, an upper cover 22 and two pressing claws 23, wherein the bottom frame 21 is used to be fixed to the test circuit board, and the probe module 1 is located at the bottom In the frame 21, two notches 211 are respectively provided on the opposite sides of the bottom frame 21 to accommodate the two pressing claws 23 respectively. The upper cover 22 is provided on the bottom frame 21, and an elastic element 24 is provided between the upper cover 22 and the bottom frame 21. Each pressing claw 23 is connected to the upper cover 22 through a pull shaft 25 and to the bottom frame 21 through a support shaft 26, and the pull shaft 25 is located on the outside of the support shaft 26. Under the elastic force of the elastic element 24, the upper cover 22 makes the pull shaft 25, the support shaft 26 and the pressing claw 23 located in the first position for pressing down the electronic device. By pressing down the upper cover 22 a predetermined distance, the pull shaft 25, the support shaft 26 and the pressing claw 23 can be linked to the second position for releasing the electronic device.

[0024] In this embodiment, the upper cover 22 is provided with a transverse guide groove 221 for guiding and limiting the pull shaft 25, the bottom frame 21 is provided with an inclined groove 212 for guiding and limiting the pull shaft 25, and the bottom frame 21 is provided with a transverse support groove 213 for guiding and limiting the support shaft 26, and the transverse support groove 213 is located on the inner side of the inclined groove 212; when in the first position, the pull shaft 25 is located at the inner end of the transverse guide groove 221 (such as Figure 3 ) and the top of the chute 212 (as shown Figure 2 The support shaft 26 is located at the inner end of the transverse support groove 213 (as shown in Figure 3 As shown), the pressing claw 23 is in an inwardly extended state to clamp the electronic device in the receiving groove 111; in the process of pressing down the upper cover 22, the upper cover 22 drives the pulling shaft 25 to move downward and outward along the inclined groove 212, and at the same time, the pulling shaft 25 moves outward along the transverse guide groove 221, and the pressing claw 23 and the support shaft 26 are linked under the pulling action of the pulling shaft 25, so that the pressing claw 23 and the support shaft 26 move outward and the pressing claw 23 rotates to release the electronic device, and when the upper cover 22 is pressed down a predetermined distance to the second position, the pulling shaft 25 is located at the outer end of the transverse guide groove 221 and the bottom end of the inclined groove 212, and the support shaft 26 is located at the outer end of the transverse support groove 213, and the pressing claw 23 is in an outwardly moved state to release the electronic device in the receiving groove 111.

[0025] In this embodiment, the inclined slot 212 includes a vertical section 2121 at the upper portion and an inclined section 2122 at the lower portion. The inclined section 2122 extends outward and downward from the bottom end of the vertical section 2121 .

[0026] In this embodiment, two pull columns 222 are respectively extended downward on the two opposite sides of the two notches 211 of the upper cover 22 and the bottom frame 21, and the two pull columns 222 are arranged at intervals. The transverse guide groove 221 is arranged on the pull column 222 and close to the bottom end of the pull column 222. The outer end of the pressure claw 23 is located between the two pull columns 222. The bottom frame 21 is respectively provided with the inclined grooves 212 on the side opposite to the two pull columns 222, and the two ends of the pull shaft 25 respectively pass through the transverse guide grooves 221 on the two pull columns 222 and are inserted into the inclined grooves 212.

[0027] In this embodiment, in the first position, the pulling shaft 25 and the supporting shaft 26 are aligned in the horizontal direction, so that the elastic element 24 can better lock the pulling shaft 25 , the supporting shaft 26 and the pressing claw 23 .

[0028] Two first vertical guide grooves 214 are respectively formed on the side surfaces of the bottom frame 21 opposite to the two pull posts 222 , for limiting and guiding the two pull posts 222 .

[0029] The other two opposite sides of the bottom frame 21 are respectively provided with second vertical guide grooves 215, and the upper cover 22 extends a limiting column 223 toward the bottom frame 21 corresponding to the second vertical guide grooves 215, and the second vertical guide grooves 215 are used to guide and limit the limiting column 223. In this embodiment, the number of the second vertical guide grooves 215 on each side of the bottom frame 21 is two, and the number of the corresponding limiting columns 223 on the upper cover 22 is also two.

[0030] Furthermore, the bottom frame 21 forms a limiting protrusion 216 in the second vertical guide groove 215 , and the limiting column 223 is provided with a limiting groove 224 corresponding to the limiting protrusion 216 , and the limiting groove 224 is used for guiding and limiting the limiting protrusion 216 .

[0031] In this embodiment, the elastic element 24 includes four compression springs, and the four compression springs are respectively arranged at the four corners of the bottom frame 21 and the upper cover 22. The number and arrangement positions of the compression springs are not limited to this, and in other embodiments, other forms may be adopted, such as arranging compression springs only at two diagonal corners, or arranging compression springs at the middle positions of the four edges of the bottom frame 21.

[0032] In this embodiment, the probe seat 11 includes a bottom plate 112, a middle fixed plate 113 and a floating plate 114, and the middle fixed plate 113 and the floating plate 114 are sequentially arranged on the bottom plate 112, and multiple probes 12 are fixed by the bottom plate 112 and the middle fixed plate 113. A compression spring 115 is provided between the floating plate 114 and the middle fixed plate 113 to form a floating connection.

[0033] In the test device, by providing the pressing claw 23, the pulling shaft 25 and the supporting shaft 26, the lever structure is used to amplify the downward pressure. The increased downward pressure of the pressing claw 23 can make the pins and the conductors of the electronic device more stably tested, and can be better applied to electronic devices with a large number of pins, avoiding the occurrence of misdetection, and can reduce the downward pressure required by the test rack. In addition, by providing the inclined slot 212, the opening and withdrawal distance of the pressing claw 23 can be increased, which is convenient for taking and placing electronic devices.

[0034] In the testing device, the distance between the fixed point of the pulling shaft 25 of the pressing claw 23 and the fixed point of the support shaft 26 of the pressing claw 23 is large, so that when the elastic force of the elastic element 24 on the upper cover 22 is constant, the greater the ratio of the distance between the pressing point of the pressing claw 23 and the fixed point of the support shaft 26 to the distance between the fixed point of the support shaft 26 and the fixed point of the pulling shaft 26, the greater the force generated by the pressing point of the pressing claw 23.

[0035] The present invention is not limited to the above embodiments. Various changes can be made under the technical contents disclosed in the above embodiments. Any equivalent structural transformation made by using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A testing device, characterized in that: The testing device comprises a probe module and a clamping assembly. The probe module comprises a probe seat and a plurality of probes. A receiving groove for placing electronic devices is provided in the middle of the upper side of the probe seat. The plurality of probes are arranged in the probe seat and penetrate the upper and lower sides of the probe seat to electrically connect the test circuit board located at the lower side of the probe module with the electronic device located in the receiving groove of the probe module. The clamping assembly includes a bottom frame, an upper cover and two pressing claws, the bottom frame is used to be fixed to the test circuit board, the probe module is located in the bottom frame, two notches are respectively provided on opposite sides of the bottom frame to accommodate the two pressing claws respectively, the upper cover is arranged on the bottom frame, and an elastic element is arranged between the upper cover and the bottom frame, each pressing claw is connected to the upper cover through a pull shaft and to the bottom frame through a support shaft, and the pull shaft is located on the outside of the support shaft, and the upper cover is under the elastic force of the elastic element, so that the pull shaft, the support shaft and the pressing claw are located in the first position of pressing down the electronic device, and by pressing down the upper cover by a predetermined distance, the pull shaft, the support shaft and the pressing claw can be linked to the second position of releasing the electronic device; The upper cover is provided with a transverse guide groove for guiding and limiting the pulling shaft, the bottom frame is provided with an oblique groove for guiding and limiting the pulling shaft, the bottom frame is provided with a transverse support groove for guiding and limiting the support shaft, and the transverse support groove is located on the inner side of the oblique groove; when in the first position, the pulling shaft is located at the inner end of the transverse guide groove and the top end of the oblique groove, the support shaft is located at the inner end of the transverse support groove, and the pressing claw is in an inwardly extended state for pressing the electronic components in the receiving groove; when in the second position, the pulling shaft is located at the outer end of the transverse guide groove and the bottom end of the oblique groove, the support shaft is located at the outer end of the transverse support groove, and the pressing claw is in an outwardly moved state for releasing the electronic components in the receiving groove; The probe seat includes a bottom plate, a middle fixed plate and an upper floating plate, wherein the middle fixed plate and the upper floating plate are sequentially arranged on the bottom plate, and a plurality of probes are fixed by the bottom plate and the middle fixed plate, and a compression spring is arranged between the upper floating plate and the middle fixed plate to form a floating connection.

2. The testing device according to claim 1, characterized in that: The inclined slot includes a vertical section at the upper part and an inclined section at the lower part, and the inclined section extends outwardly and downwardly from the bottom end of the vertical section.

3. The testing device according to claim 1, characterized in that: Two pull columns are respectively extended downward on the two opposite sides of the two notches of the upper cover and the bottom frame, and the two pull columns are arranged at an interval. The transverse guide groove is arranged on the pull column and close to the bottom end of the pull column. The outer end of the pressure claw is located between the two pull columns. The bottom frame is respectively provided with the inclined grooves on the side surfaces opposite to the two pull columns, and the two ends of the pull shaft respectively pass through the transverse guide grooves on the two pull columns and are inserted into the inclined grooves.

4. The testing device according to claim 1, characterized in that: In the first position, the pulling shaft and the supporting shaft are aligned in the horizontal direction.

5. The testing device according to claim 3, characterized in that: Two first vertical guide grooves are respectively provided on the side surfaces of the bottom frame opposite to the two pull columns, for limiting and guiding the two pull columns.

6. The testing device according to any one of claims 1 to 5, characterized in that: The other two opposite sides of the bottom frame are respectively provided with a second vertical guide groove, and the upper cover extends a limiting column toward the bottom frame corresponding to the second vertical guide groove, and the second vertical guide groove is used to guide and limit the limiting column.

7. The testing device according to claim 6, characterized in that: The bottom frame forms a limiting protrusion in the second vertical guide groove, and the limiting column is provided with a limiting groove corresponding to the limiting protrusion, and the limiting groove is used for guiding and limiting the limiting protrusion.

8. The testing device according to claim 1, characterized in that: The elastic element comprises four compression springs, and the four compression springs are respectively arranged at the four corners of the bottom frame and the upper cover.

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