Sample introduction device and test system

Abstract

The present application relates to a sample introduction device and a test system. The sample introduction device includes a substrate. The substrate includes a first surface. The first surface includes adjacent first and second areas. The first area is provided with a first boss. The second area is used to set a separation dielectric resonator. The first boss includes adjacent first boss surfaces and second boss surfaces. The first boss surface is parallel to the first surface. The second boss surface is adjacent to the second area. A first groove is provided at the first edge where the first boss surface and the second boss surface meet. The opening of the first groove at the second boss surface is used to be arranged opposite to the resonant cavity of the separation dielectric resonator. The first groove forms a guide rail structure. The sample is introduced into the resonant cavity of the separation dielectric resonator along the first groove, which shortens the time for the sample to enter the resonant cavity, thereby improving the test efficiency of high-frequency materials for 5G.

Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a sample introduction device and a testing system. Background Art

[0002] 5G communication has attracted much attention due to its high data rate, low latency, high capacity and large-scale device connection, and is the main direction of the development of the new generation of mobile communication technology. As the basic components of 5G electronic products, polymer materials with special high-frequency and high-speed performance have received increasing attention from the industry in recent years. This is mainly because the performance of polymer materials for 5G requires that the materials have low dielectric constant and dielectric loss, sufficient mechanical strength and excellent weather resistance. Its core performance indicators, such as dielectric constant and dielectric loss at high frequencies, are very different from those of traditional polymer materials. Therefore, it is of great significance to carry out testing and evaluation technology and reliability research on key materials for 5G, such as antenna materials liquid crystal polymer (LCP), antenna cover materials polycarbonate (PC), high-frequency substrate materials polytetrafluoroethylene (PTFE), high-efficiency thermal conductive materials, electromagnetic shielding materials, etc.

[0003] At present, 5G high-frequency materials need to undergo a variety of tests, including dielectric constant, dielectric loss factor, dielectric constant thermal stability coefficient, and loss factor thermal stability coefficient. How to improve the testing efficiency of 5G high-frequency materials is an urgent problem to be solved. Summary of the invention

[0004] Based on this, it is necessary to provide a sample introduction device and a testing system to address the issue of how to improve the testing efficiency of high-frequency materials for 5G.

[0005] A sample introduction device includes a substrate. The substrate includes a first surface. The first surface includes adjacent first and second regions. The first region is provided with a first boss. The second region is used to set a separation medium resonator. The first boss includes adjacent first boss surfaces and second boss surfaces. The first boss surface is parallel to the first surface. The second boss surface is adjacent to the second region. A first groove is provided at a first edge where the first boss surface and the second boss surface meet. The opening of the first groove at the second boss surface is used to be arranged relative to the resonant cavity of the separation medium resonator.

[0006] In one embodiment, the first boss further includes a third boss surface opposite to the second boss surface, and the first groove runs through the second boss surface and the third boss surface.

[0007] In one embodiment, the side walls of the first groove are respectively oppositely provided with a second groove and a third groove.

[0008] In one embodiment, the second groove and the third groove penetrate through the second boss surface and the third boss surface respectively.

[0009] In one embodiment, the second groove includes a first groove surface arranged opposite to the first boss surface, the first boss surface has a threaded hole passing through the first groove surface, and the sample introduction device also includes a bolt, one end of the bolt is used to pass through the threaded hole and abut against the surface of the sample.

[0010] In one embodiment, the sample introduction device further comprises a gasket, which is arranged on a surface of the bolt close to the bottom of the first groove.

[0011] In one embodiment, a second boss is provided on the surface of the gasket, a third boss is provided on the surface of the second boss away from the gasket, a fourth groove is formed on the bolt corresponding to the second boss, and a fifth groove is formed on the bolt corresponding to the third boss.

[0012] In one embodiment, along the extension direction of the first groove, the first boss surface opens a plurality of the threaded holes, there are a plurality of the bolts, a plurality of the second bosses are arranged on the gasket surface, and the plurality of the second bosses are arranged in one-to-one correspondence with the plurality of the threaded holes.

[0013] In one embodiment, a positioning hole is provided at the bottom of the first groove, and the positioning hole is arranged at an end away from the second boss surface. The positioning hole is used to set a positioning piece to limit the position of the sample.

[0014] In one embodiment, the sample introduction device further comprises a traction body, wherein the traction body is used to be fixed to the sample, and the traction body is used to drive the sample to move in the first groove.

[0015] In one embodiment, there are two traction bodies, and the two traction bodies are respectively used to be fixed to the sample.

[0016] A test system including the sample introduction device described in any one of the above embodiments, further comprising a separation dielectric resonator, an environmental test chamber, two traction bodies and a vector network analyzer. The separation dielectric resonator is fixed to the first surface. The environmental test chamber surrounds and forms a first space. The sample introduction device and the separation dielectric resonator are accommodated in the first space. The environmental test chamber is provided with a first opening and a second opening opposite to each other, and the first opening and the second opening are provided on two opposite surfaces.

[0017] The two traction bodies are used to connect to one end of the sample away from the separation dielectric resonator. The two traction bodies pass through the first opening and the second opening one by one. The vector network analyzer is electrically connected to the separation dielectric resonator. The vector network analyzer is used to detect the resonant frequency and quality factor of the separation dielectric resonator in no-load and loaded states.

[0018] Since the sample is relatively thin, the height of the opening of the resonant cavity of the separation dielectric resonator is consistent with the thickness of the sample. If the sample is placed directly into the resonant cavity by hand, it is not easy to align the sample with the opening of the resonant cavity, and it takes a long time. In the sample introduction device provided in an embodiment of the present application, the opening of the first groove on the second boss surface is used to be arranged relative to the resonant cavity of the separation dielectric resonator. The first groove forms a guide rail structure. The sample is introduced into the resonant cavity of the separation dielectric resonator along the first groove, which shortens the time for the sample to enter the resonant cavity, thereby improving the testing efficiency of high-frequency materials for 5G. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0020] Figure 1 This is a schematic diagram of the structure of the sample introduction device provided in one embodiment of the present application;

[0021] Figure 2 This is a schematic diagram of the structure of the sample introduction device provided in one embodiment of the present application after a sample is placed therein;

[0022] Figure 3 This is a schematic diagram of the structure of the sample introduction device provided in one embodiment of the present application after the sample and the separation dielectric resonator are placed therein;

[0023] Figure 4 It is an AA cross-sectional view of the sample introduction device provided in one embodiment of the present application;

[0024] Figure 5 This is a schematic structural diagram of the sample introduction device provided in another embodiment of the present application;

[0025] Figure 6 This is a schematic structural diagram of the gasket provided in another embodiment of the present application;

[0026] Figure 7This is a schematic diagram of the structure of the bolt provided in another embodiment of the present application;

[0027] Figure 8 This is a schematic diagram of the structure of the test system provided in another embodiment of the present application.

[0028] Figure Number:

[0029] Sample introduction device 10

[0030] Test system 100

[0031] Split dielectric resonator 110

[0032] Resonant cavity 111

[0033] Sample 120

[0034] Environmental test chamber 130

[0035] First Space 131

[0036] Vector Network Analyzer 140

[0037] Base 20

[0038] First Area 101

[0039] Second area 102

[0040] First surface 201

[0041] First boss 30

[0042] First boss surface 301

[0043] Second boss surface 302

[0044] First edge 303

[0045] The third boss surface 304

[0046] Threaded hole 305

[0047] Positioning hole 306

[0048] First groove 40

[0049] Second groove 50

[0050] The third groove 60

[0051] First groove surface 501

[0052] Bolt 70

[0053] Fourth groove 701

[0054] Fifth groove 702

[0055] Gasket 80

[0056] Second boss 801

[0057] The third boss 802

[0058] Traction body 90 DETAILED DESCRIPTION

[0059] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific implementation disclosed below.

[0060] The serial numbers for the components herein, such as "first", "second", etc., are only used to classify the objects described and do not have any order or technical meaning. The "connection" and "coupling" mentioned in this application, unless otherwise specified, include direct and indirect connections (couplings). In the description of this application, it should be understood that the orientation or position relationship indicated by the terms "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", etc. are based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing this application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation to this application.

[0061] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0062] Please also see Figure 1 , Figure 2 , Figure 3 and Figure 4The embodiment of the present application provides a sample introduction device 10 including a substrate 20. The substrate 20 includes a first surface 201. The first surface 201 includes adjacent first areas 101 and second areas 102. The first area 101 is provided with a first boss 30. The second area 102 is used to set a separation medium resonator 110. The first boss 30 includes adjacent first boss surfaces 301 and second boss surfaces 302. The first boss surface 301 is parallel to the first surface 201. The second boss surface 302 is adjacent to the second area 102. A first groove 40 is provided on a first edge 303 where the first boss surface 301 and the second boss surface 302 meet. The opening of the first groove 40 at the second boss surface 302 is used to be arranged opposite to the resonant cavity 111 of the separation medium resonator 110.

[0063] The thickness of the sample is between 0.1 mm and 6 mm. Due to the thin thickness of the sample, the height of the opening of the resonant cavity of the separation dielectric resonator is consistent with the thickness of the sample. If the sample is placed into the resonant cavity directly by hand, it is not easy to align the sample with the opening of the resonant cavity, and it takes a long time. In the sample introduction device 10 provided in an embodiment of the present application, the opening of the first groove 40 on the second boss surface 302 is used to be arranged opposite to the resonant cavity 111 of the separation dielectric resonator 110. The first groove 40 forms a guide rail structure. The sample 120 is introduced into the resonant cavity 111 of the separation dielectric resonator 110 along the first groove 40, which shortens the time for the sample 120 to enter the resonant cavity 111, thereby improving the testing efficiency of high-frequency materials for 5G.

[0064] The material of the substrate 20 includes one or more of Teflon, ceramic, stainless steel or aluminum. The shape of the substrate 20 includes regular shapes such as a cuboid, a cube or a cylinder. The end face shape of the substrate 20 can be an irregular shape such as an arc or a semicircle.

[0065] In one embodiment, the sample introduction device further includes a traction body 90. The traction body 90 is used to be fixed to the sample 120. The traction body 90 is used to drive the sample 120 to move in the first groove 40.

[0066] When a pulling force is applied to the traction body 90 along the extending direction of the first groove 40 , the sample 120 slides in the first groove 40 .

[0067] The traction body 90 is a soft rope structure, or a rigid rod structure. The traction body 90 is a natural fiber rope or a chemical fiber rope, so as to avoid scratching the sample 120 and protect the integrity of the sample 120.

[0068] In one embodiment, there are two traction bodies 90. The two traction bodies 90 are respectively used to be fixed to the sample 120. The two traction bodies 90 are respectively used to drive the sample 120 to move in two opposite directions.

[0069] In one embodiment, the first boss 30 also includes a third boss surface 304 opposite to the second boss surface 302 , and the first groove 40 runs through the second boss surface 302 and the third boss surface 304 , so as to facilitate the sample 120 to enter from the first groove 40 away from the opening of the resonant cavity 111 of the separation dielectric resonator 110 .

[0070] In one embodiment, the first groove 40 does not penetrate the third boss surface 304 , so as to prevent the sample 120 from being separated from the first groove 40 .

[0071] In one embodiment, the sidewalls of the first groove 40 are respectively oppositely provided with a second groove 50 and a third groove 60. The second boss surface 302 is C-shaped.

[0072] Portions of the second groove 50 and the third groove 60 close to the first boss surface 302 block the sample 120 from passing through the opening of the first boss surface 302 .

[0073] In one embodiment, the second groove 50 and the third groove 60 penetrate through the second boss surface 302 and the third boss surface 304 respectively.

[0074] Please also see Figure 5 In one embodiment, the second groove 50 includes a first groove surface 501 arranged opposite to the first boss surface 301. The first boss surface 301 is provided with a threaded hole 305 penetrating the first groove surface 501. The sample introduction device also includes a bolt 70. One end of the bolt 70 is used to pass through the threaded hole 305 and to abut against the surface of the sample 120. The height of the bolt 70 passing through the threaded hole 305 is different, and the distance between the end face of the bolt 70 and the bottom of the first groove 40 is different. The bolt 70 is used to limit the height of the space where the sample 120 is located. By adjusting the length of the bolt 70 passing through the threaded hole 305, different thickness requirements of the first sample 120 can be met.

[0075] In one embodiment, the sample introduction device 10 further includes a gasket 80. The gasket 80 is disposed on a surface of the bolt 70 close to the bottom of the first groove 40. The gasket 80 prevents the bolt 70 from scratching the sample 120.

[0076] Please also see Figure 6 and Figure 7In one embodiment, a second boss 801 is provided on the surface of the gasket 80, a third boss 802 is provided on the surface of the second boss 801 away from the gasket 80, a fourth groove 701 is formed on the bolt 70 corresponding to the second boss 801, and a fifth groove 702 is formed on the bolt 70 corresponding to the third boss 802.

[0077] During installation, the bolt 70 is first screwed into the threaded hole 305 , so that the fourth groove 701 and the fifth groove 702 face the third groove 60 . Then, the gasket 80 is placed in the first groove 40 , so that the second boss 801 is clamped in the fourth groove 701 , and the third boss 802 is clamped in the fifth groove 702 .

[0078] In one embodiment, along the extension direction of the first groove 40, the first boss surface 301 opens a plurality of the threaded holes 305, the bolts 70 are multiple, and a plurality of the second bosses 801 are arranged on the surface of the gasket 80, and the plurality of the second bosses 801 are arranged one-to-one correspondingly to the plurality of the threaded holes 305.

[0079] In one embodiment, the third groove 60 includes a groove surface arranged opposite to the first boss surface 301. The first boss surface 301 is provided with a threaded hole penetrating the groove surface. There are multiple threaded holes. Multiple bolts 70 are used to pass through the threaded holes of the groove surface.

[0080] The structure of the structural member of the sample introduction device 10 disposed in the third groove 60 is the same as the structure of the structural member disposed in the third groove 60 .

[0081] In one embodiment, a positioning hole 306 is formed at the bottom of the first groove 40 . The positioning hole 306 is disposed at one end away from the second boss surface 302 , and is used to set a positioning member to limit the position of the sample 120 to prevent the sample 120 from leaving the first groove 40 .

[0082] In one embodiment, the first surface 201 is provided with a groove corresponding to the separation dielectric resonator 110. The shape of the groove is adapted to the bottom of the separation dielectric resonator 110, so that the separation dielectric resonator 110 is stable and immovable during the test process.

[0083] In one embodiment, for the separated dielectric resonator 110 at 10 GHz, the length of the resonant cavity 111 is 90 mm, the thickness of the sample 120 is 0.9 mm, the width of the sample 120 is 83 mm, the length of the first groove 40 is 150 mm, the airfoil length is 5 mm on both sides, and the height of the second groove 50 and the third groove 60 perpendicular to the first surface 201 is 3 mm.

[0084] Please also see Figure 8 , an embodiment of the present application provides a test system 100 including the sample introduction device described in any one of the above embodiments, and also includes a separation dielectric resonator 110, an environmental test box 130, two traction bodies 90 and a vector network analyzer 140. The separation dielectric resonator 110 is fixed to the first surface 201. The environmental test box 130 surrounds and forms a first space 131. The sample introduction device 10 and the separation dielectric resonator 110 are accommodated in the first space 131. The environmental test box 130 is provided with a first opening 132 and a second opening 133 opposite to each other, and the first opening 132 and the second opening 133 are provided on two opposite surfaces.

[0085] The two traction bodies 90 are used to be connected to one end of the sample 120 away from the separated dielectric resonator 110. The two traction bodies 90 pass through the first opening 132 and the second opening 133 in a one-to-one correspondence. The vector network analyzer 140 is electrically connected to the separated dielectric resonator 110. The vector network analyzer 140 is used to detect the resonant frequency and quality factor of the separated dielectric resonator 110 in no-load and loaded states.

[0086] In the test system 100 provided in the embodiment of the present application, the sample introduction device 10 and the separation dielectric resonator 110 are stored in the environmental test box 130. The environmental test box 130 is used to place the first space 131 in different temperature environments. After detecting the resonant frequency and quality factor of the separation dielectric resonator 110 under load, it is only necessary to pull the traction body 90 to make the sample 120 enter the resonant cavity 111 of the separation dielectric resonator 110. In the process of detecting the resonant frequency and quality factor of the separation dielectric resonator 110 under no-load and loaded states, the test system 100 does not need to open the door of the environmental test box 130, which reduces the time for switching the detection state and thereby improves the detection efficiency.

[0087] The two test parameters of the thermal stability coefficient of the dielectric constant and the thermal stability coefficient of the loss factor of the high-frequency materials for 5G are tested under variable temperature conditions. The separated dielectric resonator 110 needs to be placed in the environmental test chamber 130. The environmental test chamber 130 is used to expose the separated dielectric resonator 110 to different temperatures. In order to complete the test of the thermal stability coefficient of the dielectric constant and the thermal stability coefficient of the loss factor. It is also necessary to measure the resonant frequency and quality factor of the separated dielectric resonator 110 in an unloaded state at different temperatures and in a state where the sample 120 is placed in the resonant cavity 111 of the separated dielectric resonator 110 (i.e., loaded state).

[0088] Since there is no suitable import tool in the prior art, the usual test process is "cooling → testing cavity parameters after stabilization for two hours → heating to room temperature → placing the sample in the separation medium resonator 110 → cooling → stabilization for two hours and testing the loaded parameters". Taking the parameters of the sample at -40°C as an example, it is necessary to cool down to -40°C, let the SPDR resonator stand for two hours in the current environment, then test the resonant frequency and Q value of the cavity, then heat up to room temperature, unpack and put the sample in, cool down, let it stand for two hours after reaching -40°C, and then test the resonant frequency and Q value (quality factor) of the load.

[0089] In the process of switching between the no-load and loaded states, the cavity door of the separation dielectric resonator 110 needs to be opened repeatedly. The temperature in the cavity changes due to the opening and closing of the cavity door, and the temperature needs to be adjusted and left to stand. Too frequent opening and closing of the cavity door results in low detection efficiency.

[0090] In one embodiment, the installation process of the test system 100 includes:

[0091] The two traction bodies 90 are fixed to the sample 120 .

[0092] The separation dielectric resonator 110 is fixed to the first surface 201. The resonant cavity 111 of the separation dielectric resonator 110 is arranged relative to the side opening of the first groove 40. The sample 120 is placed in the first groove 40, and the fixed end of the traction body 90 is away from the resonator 110. The sample introduction device 10, the sample 120 and the separation dielectric resonator 110 are placed in the environmental test box 130.

[0093] The two traction bodies 90 are passed through the first opening 132 and the second opening 133 in a one-to-one correspondence.

[0094] The vector network analyzer 140 is electrically connected to the separated dielectric resonator 110. The connection line between the vector network analyzer 140 and the separated dielectric resonator 110 passes through the first opening 132 and the second opening 133 respectively.

[0095] In one embodiment, the testing process of the testing system 100 includes:

[0096] The temperature in the environmental test box 130 is adjusted to a first preset temperature and stabilized for a first preset time.

[0097] The separated dielectric resonator 110 is controlled to operate in a no-load state, and the vector network analyzer 140 measures the resonant frequency and the quality factor of the separated dielectric resonator 110 in a no-load state at the first preset temperature.

[0098] The separation dielectric resonator 110 is controlled to stop working. The traction body 90 is pulled through the first opening 132 to make the sample 120 slide into the resonance cavity 111 along the first groove 40 .

[0099] The separated dielectric resonator 110 is controlled to operate in a no-load state, and the vector network analyzer 140 measures the resonant frequency and the quality factor of the separated dielectric resonator 110 in a loaded state at the first preset temperature.

[0100] It can be seen from the test process of the test system 100 that during the switching process between the no-load state and the loaded state of the separated dielectric resonator 110, there is no need to open the chamber door of the environmental test box 130 and adjust the temperature again, which saves time and improves efficiency.

[0101] In one embodiment, after the step in which the vector network analyzer 140 measures the resonant frequency and quality factor of the separated dielectric resonator 110 in the loaded state at the first preset temperature, the test process of the test system 100 further includes:

[0102] The pulling body 90 passing through the second opening 133 is pulled to make the sample 120 leave the resonance cavity 111 along the first groove 40 .

[0103] The temperature in the environmental test box 130 is adjusted to a second preset temperature and stabilized for a second preset time.

[0104] The separated dielectric resonator 110 is controlled to operate in a no-load state, and the vector network analyzer 140 measures the resonant frequency and the quality factor of the separated dielectric resonator 110 in a no-load state at the second preset temperature.

[0105] The separation dielectric resonator 110 is controlled to stop working. The traction body 90 is pulled through the first opening 132 to make the sample 120 slide into the resonance cavity 111 along the first groove 40 .

[0106] The separated dielectric resonator 110 is controlled to operate in a no-load state, and the vector network analyzer 140 measures the resonant frequency and the quality factor of the separated dielectric resonator 110 in a loaded state at the second preset temperature.

[0107] By referring to the above steps, the resonance frequency and quality factor of the split dielectric resonator 110 in no-load and loaded states at multiple different temperatures can be achieved.

[0108] In one embodiment, the first preset time and the second preset time may be different or the same.

[0109] In one embodiment, taking a sample testing six temperature points (-40°C, -25°C, 0°C, 25°C, 50°C, 85°C) as an example, the traditional test process is "test 25°C cavity parameters → put in sample to test load parameters → take out sample → cool down to -40°C → test cavity parameters after stabilizing for two hours → heat up to room temperature → put sample in SPDR resonator → cool down to -40°C → stabilize for two hours and test load parameters → heat up to room temperature → take out sample → cool down to -25°C → stabilize for two hours and test cavity parameters → heat up to room temperature → put sample in SPDR resonator → cool down to -25°C → stabilize for two hours and test Load parameters → heat up to room temperature → take out samples → cool down to 0℃ → test cavity parameters after stabilizing for two hours → heat up to room temperature → put samples into SPDR resonator (separated dielectric resonator 110) → cool down to 0℃ → stabilize for two hours and test load parameters → heat up to room temperature → take out samples → heat up to 50℃ → stabilize for two hours and test cavity parameters → put samples into SPDR resonator → stabilize for two hours and test load parameters → take out samples → heat up to 85℃ → stabilize for two hours and test cavity parameters → put samples into SPDR resonator → stabilize for two hours and test load parameters". The whole test process takes about 40 hours.

[0110] After adopting the testing system 100, the testing process is "testing 25°C cavity parameters → putting in the sample to test the load parameters → pulling the sample out of the SPDR resonator → cooling to -40°C → testing the cavity parameters after stabilizing for two hours → pulling the sample into the SPDR resonator → testing -40°C load parameters → pulling the sample out of the SPDR resonator → heating up to -25°C → testing the cavity parameters after stabilizing for two hours → pulling the sample into the SPDR resonator → testing -25°C load parameters → pulling the sample out of the SPDR resonator → heating up to 0°C → testing the cavity parameters after stabilizing for two hours → pulling the sample into the SPDR resonator → testing 0°C load parameters → pulling the sample out of the SPDR resonator → heating up to 50°C → testing the cavity parameters after stabilizing for two hours → pulling the sample into the SPDR resonator → testing 50°C load parameters → pulling the sample out of the SPDR resonator → heating up to 85°C → testing the cavity parameters after stabilizing for two hours → pulling the sample into the SPDR resonator → testing 85°C load parameters", and the entire testing process takes 13 hours.

[0111] It saves two-thirds of the time cost. After measuring a temperature point, the connected network analyzer can be released, and when the temperature is reached, it can be reconnected for testing. It can provide great convenience and timeliness for factories and corporate research and development. The test system 100 of the present application saves detection time and improves detection efficiency. In addition, the test system 100 avoids condensation caused by the opening of the chamber door of the environmental test chamber 130 during the test, thereby improving detection accuracy.

[0112] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0113] The above-described embodiments only express several implementation methods of the present application, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present application, which all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the attached claims.

Claims

1. A sample introduction device, characterized in that: include: A substrate (20) comprises a first surface (201), wherein the first surface (201) comprises a first region (101) and a second region (102) adjacent to each other, wherein the first region (101) is provided with a first boss (30), and the second region (102) is used to provide a separation dielectric resonator (110), wherein the first boss (30) comprises a first boss surface (301) and a second boss surface (302) adjacent to each other, wherein the first boss surface (301) is parallel to the first surface (201), and the second boss surface (302) is adjacent to the second region (102), and a first groove (40) is provided at a first edge (303) where the first boss surface (301) and the second boss surface (302) meet, and wherein an opening of the first groove (40) at the second boss surface (302) is used to be arranged opposite to a resonant cavity (111) of the separation dielectric resonator (110).

2. The sample introduction device according to claim 1, characterized in that: The first boss (30) further includes a third boss surface (304) opposite to the second boss surface (302), and the first groove (40) runs through the second boss surface (302) and the third boss surface (304).

3. The sample introduction device according to claim 2, characterized in that: The side walls of the first groove (40) are respectively provided with a second groove (50) and a third groove (60) opposite to each other.

4. The sample introduction device according to claim 3, characterized in that: The second groove (50) and the third groove (60) respectively penetrate the second boss surface (302) and the third boss surface (304).

5. The sample introduction device according to claim 4, characterized in that: The second groove (50) includes a first groove surface (501) arranged opposite to the first boss surface (301), and the first boss surface (301) is provided with a threaded hole (305) passing through the first groove surface (501). The sample introduction device also includes a bolt (70), and one end of the bolt (70) is used to pass through the threaded hole (305) and to abut against the surface of the sample (120).

6. The sample introduction device according to claim 5, characterized in that: Also includes: A gasket (80) is arranged on a surface of the bolt (70) close to the bottom of the first groove (40).

7. The sample introduction device according to claim 6, characterized in that: A second boss (801) is provided on the surface of the gasket (80), and a third boss (802) is provided on the surface of the second boss (801) away from the gasket (80). The bolt (70) has a fourth groove (701) corresponding to the second boss (801), and the bolt (70) has a fifth groove (702) corresponding to the third boss (802).

8. The sample introduction device according to claim 7, characterized in that: Along the direction in which the first groove (40) extends, the first boss surface (301) is provided with a plurality of threaded holes (305), there are a plurality of bolts (70), and a plurality of second bosses (801) are arranged on the surface of the gasket (80), and the plurality of second bosses (801) are arranged in a one-to-one correspondence with the plurality of threaded holes (305).

9. The sample introduction device according to claim 1, characterized in that: A positioning hole (306) is provided at the bottom of the first groove (40), and the positioning hole (306) is arranged at an end away from the second boss surface (302). The positioning hole (306) is used to set a positioning piece to limit the position of the sample (120).

10. The sample introduction device according to claim 1, wherein: The sample introduction device also includes: The traction body (90) is used to be fixed to the sample (120), and the traction body (90) is used to drive the sample (120) to move in the first groove (40).

11. The sample introduction device according to claim 10, characterized in that: There are two traction bodies (90), and the two traction bodies (90) are used to be fixed to the sample (120) respectively.

12. A test system comprising the sample introduction device according to any one of claims 1 to 9, characterized in that: Also includes: A separated dielectric resonator (110) fixed to the first surface (201); An environmental test box (130) is surrounded to form a first space (131), wherein the sample introduction device and the separation dielectric resonator (110) are accommodated in the first space (131), and the environmental test box (130) is provided with a first opening (132) and a second opening (133) opposite to each other, and the first opening and the second opening are provided on two opposite surfaces; Two traction bodies (90) are used to connect to one end of the sample (120) away from the separation dielectric resonator (110), and the two traction bodies (90) pass through the first opening (132) and the second opening (133) in a one-to-one correspondence; A vector network analyzer (140) is electrically connected to the separated dielectric resonator (110), and the vector network analyzer (140) is used to detect the resonance frequency and quality factor of the separated dielectric resonator (110) in an unloaded state and a loaded state.

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