Method, circuit, device, medium and equipment for judging physical destruction of storage chip

Abstract

The present invention discloses a method, circuit, device, medium and equipment for judging the physical destruction of a memory chip. The method for judging the physical destruction of a memory chip comprises: receiving a physical destruction signal and starting a destruction power supply; detecting the real-time voltage of a voltage divider circuit in real time, and connecting the destruction power supply to both ends of the voltage divider circuit; judging whether the voltage change of the real-time voltage is greater than a threshold value, and if so, stopping the physical destruction of the current memory chip. When performing high-voltage physical destruction, the present invention can intelligently adjust the output time of the destruction voltage to achieve the purpose of complete destruction and energy saving, so as to efficiently and thoroughly destroy the memory chip.

Description

Technical Field

[0001] The present invention relates to the field of data storage security technology, and in particular to a method, circuit, device, medium and equipment for determining physical destruction of a storage chip. Background Art

[0002] For the physical destruction of memory chips, the current practice is to use a split-path timing method, which is to use a fixed time (such as 5 seconds) to sequentially burn each NAND Flash (NAND flash memory) in the memory chip through high voltage. In other words, the current NAND Flash is powered by high voltage for 5 seconds. If the NAND Flash is burned within 5 seconds, it will continue to be powered until the end of 5 seconds, which wastes time and energy. If the NAND Flash is not burned within 5 seconds, it will stop burning the current NAND Flash and execute the burning of the next NAND Flash, so it cannot be completely burned. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide a method, circuit, device, medium and equipment for judging the physical destruction of a memory chip, which can destroy the memory chip efficiently and completely.

[0004] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0005] A method for determining physical destruction of a storage chip comprises the following steps:

[0006] Receive a physical destruction signal and start the destruction power supply;

[0007] Real-time detection of the real-time voltage on the voltage-dividing output end of the voltage-dividing circuit, wherein the destruction power supply is connected to both ends of the voltage-dividing circuit;

[0008] It is determined whether the voltage change of the real-time voltage is greater than a threshold value, and if so, the physical destruction of the current storage chip is stopped.

[0009] In order to solve the above technical problems, another technical solution adopted by the present invention is:

[0010] A storage chip physical destruction circuit, comprising a single chip microcomputer, a destruction power supply and a voltage divider circuit;

[0011] The destruction power supply is connected to both ends of the voltage divider circuit, and the interrupt pin of the single chip microcomputer is connected to the voltage divider output end of the voltage divider circuit;

[0012] A physical destruction program is stored in the single chip microcomputer, the voltage division ratio of the voltage division circuit is greater than 5 / U0 and less than 2 / U0, and U0 is the destruction voltage value of the destruction power supply.

[0013] In order to solve the above technical problems, another technical solution adopted by the present invention is:

[0014] A storage chip physical destruction judgment device, comprising:

[0015] A start module, used to receive a physical destruction signal and start a destruction power supply;

[0016] A detection module, used for detecting the level state on the voltage-dividing output end of the voltage-dividing circuit in real time, wherein the destruction power supply is connected to both ends of the voltage-dividing circuit;

[0017] The judging module determines whether the voltage change of the real-time voltage is greater than a threshold value, and if so, stops physically destroying the current storage chip.

[0018] In order to solve the above technical problems, another technical solution adopted by the present invention is:

[0019] A computer-readable storage medium stores a computer program, wherein the computer program stores the above-mentioned method for determining physical destruction of a storage chip.

[0020] In order to solve the above technical problems, another technical solution adopted by the present invention is:

[0021] An electronic device comprises a memory chip, a processor and a computer program stored on the memory chip and executable on the processor, wherein the processor implements the method for determining physical destruction of the memory chip as described above when executing the computer program.

[0022] The beneficial effects of the present invention are: a method, circuit, device, medium and equipment for judging the physical destruction of a memory chip. When a destruction power supply is started to physically destroy the memory chip, the real-time voltage of the voltage divider circuit is detected in real time. Since the destruction power supply is connected to both ends of the voltage divider circuit, it is also connected to both ends of the memory chip, that is, the voltage divider circuit and the memory chip are connected in parallel to both ends of the destruction power supply. Therefore, the real-time voltage on the voltage divider circuit is associated with the destruction voltage of the destruction power supply. When the physical destruction of the memory chip is completed, the memory chip is short-circuited to the ground, and the real-time voltage of the destruction power supply is pulled down, causing the real-time voltage on the voltage divider circuit to also decrease rapidly. Therefore, it is judged whether the voltage change of the real-time voltage is greater than a threshold value to judge whether the physical destruction of the memory chip is completed, thereby solving the problem that the memory chip cannot be completely burned. At the same time, when the destruction is completed, the physical destruction of the current memory chip is stopped, reducing unnecessary time waste and electric energy waste, so as to more efficiently complete the burning of the memory chip. That is, when the present invention performs high-voltage physical destruction, it can intelligently adjust the output time of the destruction voltage to achieve the purpose of complete destruction and saving electric energy, so as to destroy the memory chip efficiently and thoroughly. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A schematic diagram of a flow chart of a method for determining physical destruction of a memory chip according to an embodiment of the present invention;

[0024] Figure 2 This is a schematic diagram of module connections of a memory chip physical destruction circuit according to an embodiment of the present invention;

[0025] Figure 3 A circuit diagram of a memory chip physical destruction circuit according to an embodiment of the present invention;

[0026] Figure 4 This is a schematic diagram of module connections of a device for determining physical destruction of a storage chip according to an embodiment of the present invention;

[0027] Figure 5 Schematic diagram of the structure of an electronic device according to an embodiment of the present invention.

[0028] Description of labels:

[0029] 1. Storage chip physical destruction judgment device; 2. Electronic device; 11. Acquisition module; 12. Compression module; 13. Reading module; 21. Processor; 22. Memory;

[0030] C1-C4, filter capacitor; D1, Schottky diode; GND, ground terminal; L1, inductor; R1-R5, resistors, where R1 is the first resistor and R2 is the second resistor; U1, microcontroller; U2, boost chip; Vin, input voltage terminal; Vout, destruction voltage terminal. DETAILED DESCRIPTION

[0031] In order to explain the technical content, achieved objectives and effects of the present invention in detail, the following is an explanation in combination with the implementation modes and the accompanying drawings.

[0032] Please refer to Figures 1 to 3 The embodiment of the present invention provides a method for determining physical destruction of a storage chip, comprising the following steps:

[0033] Receive a physical destruction signal and start the destruction power supply;

[0034] Real-time detection of the real-time voltage of the voltage-dividing circuit, wherein the destruction power supply is connected to both ends of the voltage-dividing circuit;

[0035] It is determined whether the voltage change of the real-time voltage is greater than a threshold value, and if so, the physical destruction of the current storage chip is stopped.

[0036] From the above description, it can be seen that the beneficial effects of the present invention are: when the destruction power supply is started to physically destroy the memory chip, the real-time voltage of the voltage divider circuit is detected in real time. Since the destruction power supply is connected to both ends of the voltage divider circuit, it is also connected to both ends of the memory chip, that is, the voltage divider circuit and the memory chip are connected in parallel to both ends of the destruction power supply, thereby, the real-time voltage on the voltage divider circuit is associated with the destruction voltage of the destruction power supply; and when the physical destruction of the memory chip is completed, the memory chip is short-circuited to the ground, and the real-time voltage of the destruction power supply is pulled down, causing the real-time voltage on the voltage divider circuit to also decrease rapidly, thereby judging whether the voltage change of the real-time voltage is greater than the threshold value, to judge whether the physical destruction of the memory chip is completed, thereby solving the problem that the memory chip cannot be completely burned; at the same time, when the destruction is completed, the physical destruction of the current memory chip is stopped, reducing unnecessary time waste and energy waste, thereby more efficiently completing the burning of the memory chip, that is, when the present invention performs high-voltage physical destruction, it can intelligently adjust the output time of the destruction voltage to achieve the purpose of complete destruction and saving energy, so as to efficiently and thoroughly destroy the memory chip.

[0037] Furthermore, the receiving of the physical destruction signal and starting the destruction power supply specifically includes the following steps:

[0038] Real-time detection is performed to determine whether a destruction signal is received. If received, it is determined whether the destruction signal is a physical destruction signal. If so, a destruction power supply is started.

[0039] From the above description, it can be known that whether to start the destruction power supply is determined according to whether the physical destruction signal is received.

[0040] Furthermore, after starting to destroy the power supply, the method further includes the following steps:

[0041] Physically destroy the storage chips in a preset order;

[0042] After stopping the physical destruction of the current storage chip, the method further includes the following steps:

[0043] Perform physical destruction of the next memory chip until all memory chips are destroyed.

[0044] It can be seen from the above description that, when the current memory chip is destroyed, the next memory chip is physically destroyed, thereby improving the destruction efficiency.

[0045] Further, the voltage divider circuit includes a first resistor and a second resistor;

[0046] The real-time voltage of the voltage-dividing circuit is detected in real time, and the destruction power supply is connected to both ends of the voltage-dividing circuit, and specifically comprises the following steps:

[0047] The level state between the first resistor R1 and the second resistor R2 is collected in real time, the first end of the first resistor R1 and the first end of the second resistor R2 are connected in series, the destruction voltage end Vout of the destruction power supply is connected to the second end of the first resistor R1 and the ground end GND is electrically connected to the second end of the second resistor R2, the resistance ratio of the first resistor R1 to the second resistor R2 is greater than (0.5U0-1) and less than (0.2U0-1), and U0 is the destruction voltage value of the destruction power supply;

[0048] The step of judging whether the voltage change of the real-time voltage is greater than a threshold value specifically comprises the following steps:

[0049] It is determined whether the level state between the first resistor R1 and the second resistor R2 changes from a high level to a low level.

[0050] From the above description, it can be seen that the voltage divider circuit is further defined as a voltage divider circuit composed of a first resistor R1 and a second resistor R2. When the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (0.5U0-1) and less than (0.2U0-1), that is, when the destruction voltage of the destruction power supply is connected, the voltage between the first resistor R1 and the second resistor R2 is between 2.0V and 5.0V, that is, it is in a high level state; the current storage chip is destroyed, the voltage at both ends of the destruction power supply is pulled down, and the level state between the first resistor R1 and the second resistor R2 becomes a low level, that is, according to the change in the level state between the first resistor R1 and the second resistor R2, it is judged whether the storage chip is completely destroyed, thereby efficiently and thoroughly destroying the storage chip; at the same time, the use of the voltage divider circuit only adds two resistors, the cost of the resistors is low and can be ignored, and the data security of the storage chip is further guaranteed without increasing the cost.

[0051] Please refer to Figures 2 to 3 Another embodiment of the present invention provides a memory chip physical destruction circuit, comprising a single-chip microcomputer U1, a destruction power supply and a voltage divider circuit; the destruction power supply is connected to both ends of the voltage divider circuit, and the interrupt pin INT1 of the single-chip microcomputer U1 is connected to the voltage divider output end of the voltage divider circuit; the single-chip microcomputer U1 stores a physical destruction program, and the voltage divider ratio of the voltage divider circuit is greater than 5 / U0 and less than 2 / U0, and U0 is the destruction voltage value of the destruction power supply, where, for example, if the destruction voltage is 28V, the destruction voltage value is 28.

[0052] Therefore, when the voltage division ratio of the voltage division circuit is greater than 5 / U0 and less than 2 / U0, that is, the interrupt pin INT1 of the microcontroller U1 is between 2.0V and 5.0V when the voltage division circuit is connected to the destruction power supply, it is a high level, and when the destruction is completed, the destruction power supply is short-circuited to the ground, so that the level state collected by the interrupt pin INT1 of the microcontroller U1 is a low level, thereby judging that the memory chip has been completely destroyed.

[0053] Furthermore, the voltage divider circuit includes a first resistor R1 and a second resistor R2; the destruction voltage terminal Vout of the destruction power supply is electrically connected to the first end of the first resistor R1, the second end of the first resistor R1 is the voltage divider output terminal and is simultaneously electrically connected to the first end of the second resistor R2 and the interrupt pin INT1 of the single-chip computer U1, and the second end of the second resistor R2 is connected to the ground terminal GND of the destruction power supply; the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (0.5U0-1) and less than (0.2U0-1), so that the level state collected by the interrupt pin INT1 of the single-chip computer U1 when the voltage divider circuit is connected to the destruction power supply is a high level, and can be changed to a low level when the destruction is completed.

[0054] Furthermore, the destruction voltage of the destruction power supply is [20V, 36V], the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (U0 / 3.6-1) and less than (0.2U0-1), 20V to 36V ensures that the storage chip can be completely destroyed while ensuring personal safety, and the resistance ratio range of the first resistor R1 and the second resistor R2 is further reduced, so that the interrupt pin INT1 of the microcontroller U1 is between 2.0V and 3.6V when the voltage divider circuit is connected to the destruction power supply.

[0055] The memory chip physical destruction circuit provided in the above embodiment is used to collect the level changes before and after the memory chip is destroyed. For other technical effects, refer to the relevant description in the memory chip physical destruction judgment method in the above embodiment.

[0056] Please refer to Figure 4 Another embodiment of the present invention provides a storage chip physical destruction judgment device 1, comprising:

[0057] A starting module 11 is used to receive a physical destruction signal and start a destruction power supply;

[0058] The detection module 12 is used to detect the real-time voltage of the voltage-dividing circuit in real time, and the destruction power supply is connected to both ends of the voltage-dividing circuit;

[0059] The judgment module 13 is used to judge whether the voltage change of the real-time voltage is greater than a threshold value, and if so, stop the physical destruction of the current storage chip.

[0060] For the specific processes and corresponding effects implemented by the starting module 11, the detection module 12 and the judgment module 13, reference may be made to the relevant description in the method for judging physical destruction of a storage chip in the above embodiment.

[0061] Another embodiment of the present invention provides a computer-readable storage medium on which a computer program is stored. The computer program stores the method for determining physical destruction of a storage chip according to the above embodiment.

[0062] Among them, regarding the specific implementation process and corresponding effects of the method for determining physical destruction of a storage chip contained in the computer program in this embodiment, reference may be made to the relevant description of the method for determining physical destruction of a storage chip in the above embodiment.

[0063] Please refer to Figure 5 Another embodiment of the present invention provides an electronic device 2, including a memory 22, a processor 21, and a computer program stored in the memory 22 and executable on the processor 21, wherein the processor 21 implements the method for determining physical destruction of a storage chip according to the above embodiment when executing the computer program.

[0064] Among them, regarding the specific implementation process and corresponding effects of the method for determining physical destruction of a storage chip implemented by the processor 21 in this embodiment, reference may be made to the relevant description of the method for determining physical destruction of a storage chip in the above-mentioned embodiment.

[0065] The storage chip physical destruction judgment method and corresponding circuit, device, storage medium and electronic device of the present application are mainly applied to application scenarios where any storage chip needs to be physically destroyed, and are described below in conjunction with specific application scenarios:

[0066] Based on the above, combined with Figures 1 to 3 , Embodiment 1 of the present invention is:

[0067] A method for determining physical destruction of a storage chip comprises the following steps:

[0068] S1, receiving the physical destruction signal and starting the destruction power supply;

[0069] Step S1 specifically includes the following steps: detecting in real time whether a destruction signal is received, and if so, determining whether the destruction signal is a physical destruction signal, and if so, starting a destruction power supply.

[0070] Corresponding to this embodiment, if the device implementing the reception is a single-chip microcomputer U1, a certain pin on the single-chip microcomputer U1 is used to receive the destruction signal, for example Figure 3When the P3.2 pin of the MCU detects the input of the destruction signal, the MCU U1 determines the destruction type of the input signal. If it is a physical destruction signal, the voltage input terminal Vin is powered on, and the voltage is boosted to U0 by the boost chip U2 to form a destruction power supply, and then the storage chip is physically destroyed in a preset order.

[0071] Among them, because when the input of the destruction signal is detected, it is also necessary to judge the destruction type according to the continuous pressing time of the button that triggers the destruction signal. Among them, in this embodiment, if the continuous pressing time is within the first preset time, no destruction operation is performed. Logical destruction is performed within the first preset time and the second preset time, that is, the formatted destruction type. Physical destruction is performed after the second preset time, that is, the destruction type of breaking down the chip in this embodiment, wherein the second preset time is greater than the first preset time, for example, the first preset time is 3 seconds, the second preset time is 5S, or 2 seconds and 4 seconds, 4 seconds and 7 seconds in other equivalent embodiments, etc.

[0072] S2, real-time detection of the real-time voltage of the voltage divider circuit, and the destruction power supply is connected to both ends of the voltage divider circuit;

[0073] For step S2, the destruction power supply is connected to the two ends of the voltage divider circuit, that is, the voltage divider circuit and the storage chip are connected in parallel to the two ends of the destruction power supply. Therefore, the real-time voltage on the voltage divider circuit is related to the destruction voltage of the destruction power supply, and the destruction voltage of the destruction power supply is usually higher to ensure that the storage chip can be physically destroyed. Therefore, the initial voltage value on the voltage divider circuit is higher.

[0074] S3, determining whether the voltage change of the real-time voltage is greater than a threshold, and if so, stopping the physical destruction of the current storage chip;

[0075] For step S3, when the physical destruction of the memory chip is completed, the memory chip is short-circuited to the ground, and the real-time voltage of the destruction power supply is pulled down, causing the real-time voltage on the voltage divider circuit to also rapidly decrease. Therefore, it is determined whether the voltage change of the real-time voltage is greater than the threshold value to determine whether the physical destruction of the memory chip is completed. When the physical destruction of this memory chip is completed, the destruction of the next memory chip is immediately executed until all the memory chips are destroyed, thereby enabling the efficient and thorough destruction of the memory chips.

[0076] Among them, in this embodiment, the storage chip that is physically destroyed is NAND Flash, and in other equivalent embodiments, it can be other storage chips.

[0077] Based on the above, combined with Figures 1 to 3 , Embodiment 2 of the present invention is:

[0078] A method for judging the physical destruction of a storage chip. Based on the above-mentioned embodiment 1, this embodiment provides a specific judgment method after adopting a specific voltage divider circuit. In other equivalent embodiments, appropriate variations can be made with reference to this embodiment.

[0079] In the second embodiment, the voltage divider circuit includes a first resistor R1 and a second resistor R2. At this time, step S2 specifically includes the following steps: real-time acquisition of the level state between the first resistor R1 and the second resistor R2, the first end of the first resistor R1 and the first end of the second resistor R2 are connected in series, the destruction voltage end Vout of the destruction power supply is connected to the second end of the first resistor R1 and the ground end GND is electrically connected to the second end of the second resistor R2, the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (0.5U0-1) and less than (0.2U0-1), and U0 is the destruction voltage value of the destruction power supply;

[0080] For step S2 in the second embodiment, the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (0.5U0-1) and less than (0.2U0-1), that is, when the destruction voltage of the destruction power supply is connected, the voltage between the first resistor R1 and the second resistor R2 is between 2.0V and 5.0V, that is, it is in a high level state.

[0081] In the second embodiment, step S3 specifically includes the following steps: determining whether the level state between the first resistor R1 and the second resistor R2 changes from a high level to a low level, and if so, stopping the physical destruction of the current storage chip.

[0082] For step S3 in the second embodiment, the destruction of the current storage chip is completed, the voltages at both ends of the destruction power supply are pulled down, and the level state between the first resistor R1 and the second resistor R2 becomes a low level, that is, whether the storage chip is completely destroyed is judged based on the change in the level state between the first resistor R1 and the second resistor R2, thereby efficiently and thoroughly destroying the storage chip; at the same time, the use of the voltage divider circuit only adds two voltage divider circuits, the cost of the voltage divider circuit is low and can be ignored, thereby further ensuring the data security of the storage chip without increasing the cost.

[0083] Based on the above, combined with Figure 2 and Figure 3 , Embodiment 3 of the present invention is:

[0084] A memory chip physical destruction circuit comprises a single-chip microcomputer U1, a destruction power supply and a voltage divider circuit; the destruction power supply is connected to both ends of the voltage divider circuit, and an interrupt pin INT1 of the single-chip microcomputer U1 is connected to a voltage divider output end of the voltage divider circuit; a physical destruction program is stored in the single-chip microcomputer U1, and a voltage divider ratio of the voltage divider circuit is greater than 5 / U0 and less than 2 / U0, and U0 is a destruction voltage value of the destruction power supply.

[0085] In this embodiment, the voltage divider circuit includes a first resistor R1 and a second resistor R2; the destruction voltage terminal Vout of the destruction power supply is electrically connected to the first end of the first resistor R1, the second end of the first resistor R1 is electrically connected to the first end of the second resistor R2 and the interrupt pin INT1 of the single-chip computer U1 at the same time, and the second end of the second resistor R2 is connected to the ground terminal GND of the destruction power supply; the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (0.5U0-1) and less than (0.2U0-1), so that the level state collected by the interrupt pin INT1 of the single-chip computer U1 when the voltage divider circuit is connected to the destruction power supply is high, and can be changed to low when the destruction is completed.

[0086] For this embodiment, the destruction voltage of the destruction power supply is [20V, 36V], and the resistance ratio of the first resistor R1 and the second resistor R2 is greater than (U0 / 3.6-1) and less than (0.2U0-1). For example, the destruction voltage of the destruction power supply in this embodiment can be 28V, the first resistor R1 is 5.1KΩ, and the second resistor R2 is 680Ω, and the resistance ratio of the two is 7.5. At this time, the interrupt pin INT1 of the single-chip computer U1 is 3.3V, which is a high level. In other equivalent embodiments, it is sufficient to consider a reasonable voltage that can achieve the destruction of the memory chip, and at the same time, the voltage divider output terminal designed for the destruction voltage can be a high level of 2.0V-5.0V when the destruction power supply is at the destruction voltage.

[0087] In order to facilitate understanding of this embodiment, Figure 3 The destruction power supply formed by the boost chip U2 is explained in some detail: Generally speaking, the input voltage in the circuit is less than [20V, 36V], which is not enough to destroy the storage chip. For example, in this embodiment, the input voltage terminal Vin in the circuit is 12V, which needs to be boosted to 28V by the boost chip U2 before output, wherein the input voltage terminal Vin is simultaneously connected to the first ends of the filter capacitors C1 and C2, and the second ends of the filter capacitors C1 and C2 are simultaneously connected to the ground terminal GND, and the output destruction voltage terminal Vout is simultaneously connected to the first ends of the two filter capacitors C3 and C4, and the second ends of the filter capacitors C3 and C4 are simultaneously connected to the ground terminal GND; the resistor R3 It is a pull-down resistor to ensure that the boost chip U2 will not start and output a destruction voltage when the destruction function is not triggered. Resistors R4 and R5 are feedback resistors for the output voltage of the boost chip U2, which are used to adjust the output voltage; inductor L1 is a storage inductor for energy transfer, which boosts the voltage through continuous charging and discharging; Schottky diode D1 prevents the capacitor from discharging to the ground; therefore, when the destruction function is not triggered, the P2.5 pin of the microcontroller U1 outputs a low level, the boost chip U2 is turned off, and there is no voltage output. When the destruction function is triggered, the P2.5 pin of the microcontroller U1 outputs a high level, the boost chip U2 starts, and outputs a destruction voltage to physically destroy the storage chip.

[0088] In addition, this embodiment Figure 3 As shown, the model of the single chip microcomputer U1 is STC8F2K16S2, and the model of the boost chip U2 is SY7304DBC. In other equivalent embodiments, different chips can be selected for processing according to actual needs.

[0089] Please refer to Figure 4 Embodiment 4 of the present invention is a storage chip physical destruction judgment device 1 corresponding to the storage chip physical destruction judgment method in the above embodiment 1 or 2, comprising:

[0090] A starting module 11 is used to receive a physical destruction signal and start a destruction power supply;

[0091] The detection module 12 is used to detect the real-time voltage of the voltage-dividing circuit in real time, and the destruction power supply is connected to both ends of the voltage-dividing circuit;

[0092] The judgment module 13 is used to judge whether the voltage change of the real-time voltage is greater than a threshold value, and if so, stop the physical destruction of the current storage chip.

[0093] Embodiment 5 of the present invention is a computer-readable storage medium corresponding to the method for determining physical destruction of a storage chip in the above embodiment 1 or 2, on which a computer program is stored, and the computer program stores the method for determining physical destruction of a storage chip in the above embodiment 1 or 2.

[0094] Please refer to Figure 5 Embodiment 6 of the present invention is an electronic device 2 corresponding to the method for determining physical destruction of a storage chip in the above-mentioned embodiment 1 or 2, comprising a memory 22, a processor 21, and a computer program stored in the memory 22 and executable on the processor 21, wherein the method for determining physical destruction of a storage chip in the above-mentioned embodiment 1 or 2 is implemented when the processor 21 executes the computer program.

[0095] In the six embodiments provided in the present application, it should be understood that the disclosed methods, circuits, devices, storage media, and electronic devices can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0096] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0097] In addition, each functional module in each embodiment of the present invention may be integrated into one processing module, or each module may exist physically separately, or two or more modules may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of software functional modules.

[0098] If the integrated module is implemented in the form of a software function module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program codes.

[0099] It should be noted that, for the convenience of description, the aforementioned method embodiments are all described as a series of action combinations, but those skilled in the art should be aware that the present invention is not limited by the described action sequence, because according to the present invention, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present invention.

[0100] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0101] In summary, the present invention provides a method, circuit, device, medium and equipment for judging the physical destruction of a memory chip. When the destruction power supply is started to physically destroy the memory chip, the real-time voltage of the voltage divider circuit is detected in real time. Since the destruction power supply is connected to both ends of the voltage divider circuit, it is also connected to both ends of the memory chip, that is, the voltage divider circuit and the memory chip are connected in parallel to both ends of the destruction power supply. Therefore, the real-time voltage on the voltage divider circuit is associated with the destruction voltage of the destruction power supply. When the physical destruction of the memory chip is completed, the memory chip is short-circuited to the ground, and the real-time voltage of the destruction power supply is pulled down, causing the real-time voltage on the voltage divider circuit to drop rapidly. Therefore, it is judged whether the voltage change of the real-time voltage is greater than the threshold value to judge whether the physical destruction of the memory chip is completed, thereby solving the problem of not being able to destroy the memory chip. The problem of completely burning the memory chip; at the same time, when the destruction is completed, the physical destruction of the current memory chip is stopped, unnecessary time waste and electric energy waste are reduced, so as to more efficiently complete the burning of the memory chip; at the same time, by setting two voltage divider circuits to perform destruction detection with the single-chip microcomputer, whether the destruction is completed is judged according to the collected level state change, and the data security of the memory chip is further guaranteed without increasing the cost. That is, the present invention provides a memory chip physical destruction solution that further guarantees the data security of the memory chip without increasing the cost, and can intelligently adjust the output time of the destruction voltage during high-voltage physical destruction, so as to achieve the purpose of complete destruction and saving electric energy, so as to efficiently and completely destroy the memory chip.

[0102] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent transformations made using the contents of the present invention's specification and drawings, or directly or indirectly applied in related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A method for determining physical destruction of a storage chip, characterized in that: The following steps are involved: Receive a physical destruction signal and start the destruction power supply; Real-time detection of the real-time voltage on the voltage-dividing output end of the voltage-dividing circuit, wherein the destruction power supply is connected to both ends of the voltage-dividing circuit; Determine whether the voltage change of the real-time voltage is greater than a threshold value, and if so, stop physically destroying the current storage chip; The voltage divider circuit includes a first resistor and a second resistor; The real-time voltage of the voltage-dividing circuit is detected in real time, and the destruction power supply is connected to both ends of the voltage-dividing circuit, and specifically comprises the following steps: The level state between the first resistor and the second resistor is collected in real time, the first end of the first resistor and the first end of the second resistor are connected in series, the destruction voltage end of the destruction power supply is connected to the second end of the first resistor and the ground end is electrically connected to the second end of the second resistor, the resistance ratio of the first resistor to the second resistor is greater than (0.5U0-1) and less than (0.2U0-1), and U0 is the destruction voltage value of the destruction power supply; The step of judging whether the voltage change of the real-time voltage is greater than a threshold value specifically comprises the following steps: It is determined whether the level state between the first resistor and the second resistor changes from a high level to a low level.

2. The method for determining physical destruction of a memory chip according to claim 1, characterized in that: The receiving of the physical destruction signal and starting the destruction power supply specifically comprises the following steps: Real-time detection is performed to determine whether a destruction signal is received. If received, it is determined whether the destruction signal is a physical destruction signal. If so, a destruction power supply is started.

3. The method for determining physical destruction of a memory chip according to claim 1, characterized in that: After the power supply is started, the following steps are also included: Physically destroy the storage chips in a preset order; After stopping the physical destruction of the current storage chip, the method further includes the following steps: Perform physical destruction of the next memory chip until all memory chips are destroyed.

4. A storage chip physical destruction circuit, characterized in that: Including single chip microcomputer, destruction power supply and voltage divider circuit; The destruction power supply is connected to both ends of the voltage divider circuit, and the interrupt pin of the single chip microcomputer is connected to the voltage divider output end of the voltage divider circuit; The single chip microcomputer stores a physical destruction program, the voltage division ratio of the voltage division circuit is greater than 5 / U0 and less than 2 / U0, and U0 is the destruction voltage value of the destruction power supply; The voltage divider circuit includes a first resistor and a second resistor; The destruction voltage end of the destruction power supply is electrically connected to the first end of the first resistor, the second end of the first resistor is the voltage-dividing output end and is electrically connected to the first end of the second resistor and the interrupt pin of the single-chip computer at the same time, and the second end of the second resistor is connected to the ground end of the destruction power supply; A resistance ratio of the first resistor to the second resistor is greater than (0.5U0-1) and less than (0.2U0-1).

5. The memory chip physical destruction circuit according to claim 4, characterized in that: The destruction voltage of the destruction power supply is [20V, 36V], and the resistance ratio of the first resistor to the second resistor is greater than (U0 / 3.6-1) and less than (0.2U0-1).

6. A device for determining physical destruction of a storage chip, characterized in that: include: A start module, used to receive a physical destruction signal and start a destruction power supply; A detection module, used for detecting the real-time voltage on the voltage-dividing output end of the voltage-dividing circuit in real time, wherein the destruction power supply is connected to both ends of the voltage-dividing circuit; A judging module, used for judging whether the voltage change of the real-time voltage is greater than a threshold value, and if so, stopping the physical destruction of the current storage chip; The voltage divider circuit includes a first resistor and a second resistor; The real-time voltage of the voltage-dividing circuit is detected in real time, and the destruction power supply is connected to both ends of the voltage-dividing circuit, and specifically comprises the following steps: The level state between the first resistor and the second resistor is collected in real time, the first end of the first resistor and the first end of the second resistor are connected in series, the destruction voltage end of the destruction power supply is connected to the second end of the first resistor and the ground end is electrically connected to the second end of the second resistor, the resistance ratio of the first resistor to the second resistor is greater than (0.5U0-1) and less than (0.2U0-1), and U0 is the destruction voltage value of the destruction power supply; The step of judging whether the voltage change of the real-time voltage is greater than a threshold value specifically comprises the following steps: It is determined whether the level state between the first resistor and the second resistor changes from a high level to a low level.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: The computer program stores the method for determining physical destruction of a storage chip as described in any one of claims 1 to 3.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method for determining physical destruction of a storage chip as described in any one of claims 1 to 3 is implemented.

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