An optocoupler high voltage test device with loop test function and a test method thereof

Abstract

The present invention discloses an optocoupler high-voltage test device with a loop test function and a test method thereof, comprising: a base; a test unit, the test unit is installed on the base, the test unit comprises a first test unit and a second test unit; the first test unit comprises a first test piece, a second test piece, a third test piece and a first clamping area; the second test unit comprises a fourth test piece, a fifth test piece, a sixth test piece and a second clamping area; a wiring device for accessing a high-voltage test line, the wiring device being arranged at one end of the second test piece and one end of the sixth test piece. During testing, the first test piece, the second test piece and the third test piece of the optocoupler high-voltage test device with a loop test function jointly clamp an input pin of the fixed optocoupler, and the fourth test piece, the fifth test piece and the sixth test piece jointly clamp another input pin of the fixed optocoupler, thereby achieving the technical effect that the test unit can tightly hold the optocoupler chip.

Description

Technical Field

[0001] The invention relates to the field of optocoupler testing, and in particular to an optocoupler high-voltage testing device with a loop testing function and a testing method thereof. Background Art

[0002] With the continuous development and popularization of contemporary electronic technology, the application of optocouplers in electronic circuits has been quite extensive. At present, there are more and more optocoupler models with different pin positions on the market. Manufacturers have increasingly strict requirements for the high-voltage test of optocouplers. The method of high-voltage test of optocouplers is to connect the pins of the input end of the optocoupler together, and the pins of the output end together, and connect high-voltage AC to the input and output ends for testing. The specific test method is to connect the input and output ends of multiple optocouplers to the test piece respectively. Traditional test pieces are prone to broken pins. If they are not discovered in time, the broken pins will cause some optocouplers in each group to have poor contact, and high-voltage tests will be performed. Therefore, traditional test pieces have a major hidden danger, which is prone to missed tests and optocouplers with poor contact that are not detected, reducing the yield rate of factory products. Summary of the invention

[0003] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention proposes an optocoupler high-voltage test device with a loop test function. The optocoupler high-voltage test device with a loop test function enables each pin of each tested optocoupler to be pressed by two layers of test pieces during the test, and each test piece is independent without short-circuit connection. During the test, if a pin of the optocoupler has poor contact or is broken, the test result will show poor. The present invention achieves a higher safety high-voltage test by redesigning the structure of the high-voltage test piece, thereby improving the technical effect of the major hidden dangers of the optocoupler test.

[0004] The present invention proposes an optocoupler high-voltage test device with the above-mentioned automation function and loop test function. Applicable to an optocoupler test chip, the optocoupler chip includes a chip input end and an output end, the input end includes a first input pin and a second input pin, and the output end includes a first output pin and a second output pin. It includes: a base; a test unit, the test unit is installed on the base, the test unit includes a first test unit for clamping the first input pin or the first output pin of the chip and a second test unit for clamping the second input pin or the second output pin of the chip, the first test unit and the second test unit are arranged adjacent to each other; the first test unit includes a first test piece, a second test piece and a third test piece, the second test piece and the third test piece are arranged adjacent to each other, the first test piece is arranged opposite to the second test piece and the third test piece respectively, and a space for the first input pin or the first output pin of the chip is formed between the first test piece, the second test piece and the third test piece. The first clamping area for placement; the second test unit includes a fourth test piece, a fifth test piece and a sixth test piece, the fifth test piece and the sixth test piece are arranged adjacent to each other, the fourth test piece is arranged opposite to the fifth test piece and the sixth test piece, and a second clamping area for placing the second input pin or the second output pin of the chip is formed between the fourth test piece, the fifth test piece and the sixth test piece; the first test piece, the second test piece, the third test piece, the fourth test piece, the fifth test piece and the sixth test piece are respectively connected to the base; a wiring device is used to connect a high-voltage test line, and the wiring device is arranged at one end of the second test piece and one end of the sixth test piece.

[0005] According to the embodiment of the optocoupler high-voltage test device with a loop test function, there is at least the following technical effect: during testing, the first test piece, the second test piece and the third test piece of the optocoupler high-voltage test device with a loop test function jointly clamp and fix the first input pin of the optocoupler, the fourth test piece, the fifth test piece and the sixth test piece jointly clamp and fix the second input pin of the optocoupler, and the first test piece, the second test piece and the third test piece of another optocoupler high-voltage test device with a loop test function jointly clamp and fix the first output pin of the optocoupler, and the fourth test piece, the fifth test piece and the sixth test piece jointly clamp and fix the second output pin of the optocoupler, thereby achieving the technical effect that the test unit can tightly hold the optocoupler chip.

[0006] According to the optocoupler high-voltage testing device with loop testing function of an embodiment of the present invention, when the first input pin or the first output pin of the chip is placed in the first clamping area, the first test piece, the second test piece and the third test piece are connected, and the first test piece, the second test piece and the third test piece tightly clamp an input pin or an output pin of the optocoupler.

[0007] According to the optocoupler high-voltage testing device with loop testing function of an embodiment of the present invention, when the second input pin or the second output pin of the chip is placed in the second clamping area, the fourth test piece, the fifth test piece and the sixth test piece are connected, and the fourth test piece, the fifth test piece and the sixth test piece tightly clamp the other input pin or one output pin of the optocoupler.

[0008] According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, when the second input pin or the second output pin of the chip is placed in the second clamping area, the third test piece and the fifth test piece are connected. Therefore, during the high-voltage test process, the input pins or output pins of all optocouplers clamped in the same optocoupler high-voltage test device with loop test function are connected.

[0009] According to the optocoupler high-voltage test device with loop test function of an embodiment of the present invention, the wiring device includes a first wiring hole for welding the high-voltage test line, the first wiring hole is arranged at one end of the second test piece, and the first wiring hole is used to connect to the high-voltage AC terminal.

[0010] According to the optocoupler high-voltage test device with loop testing function of an embodiment of the present invention, the wiring device includes a second wiring hole for welding the high-voltage test line, the second wiring hole is arranged at one end of the sixth test piece, and the second wiring hole is used to connect to the high-voltage AC terminal.

[0011] According to the optocoupler high-voltage testing device with loop testing function of an embodiment of the present invention, a mounting hole for installing the test unit is also provided on the inner side of the base, and the first test piece, the second test piece, the third test piece, the fourth test piece, the fifth test piece and the sixth test piece of the test unit are respectively fixed to the base through the mounting holes.

[0012] According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, the base includes a first end face, a second end face and an isolation face, the isolation face is arranged between the first end face and the second end face, the second test piece, the third test piece and the fourth test piece are respectively installed on the first end face through the first mounting hole, and the first test piece, the fifth test piece and the sixth test piece are respectively installed on the second end face through the second mounting hole. The isolation face can ensure that different test pieces will not be accidentally touched, and the first end face and the second end face are used to fix each test piece.

[0013] The optocoupler high-voltage test device with loop test function according to an embodiment of the present invention further includes a first fixing hole and a second fixing hole for fixing the base, and the first fixing hole and the second fixing hole are arranged on the base. The first fixing hole and the second fixing hole are used to fix the optocoupler high-voltage test device with loop test function on a workbench, a machine table, and other equipment.

[0014] A method for testing high-voltage optocouplers with a loop test function, characterized in that it includes: inserting the first input pin of the input end of the optocoupler to be tested into the first test unit of the optocoupler high-voltage test device with a loop test function; inserting the second input pin of the input end of the optocoupler to be tested into the second test unit of the optocoupler high-voltage test device with a loop test function; inserting the first output pin of the optocoupler to be tested into the first test unit of another optocoupler high-voltage test device with a loop test function; inserting the second output pin of the optocoupler to be tested into the second test unit of another optocoupler high-voltage test device with a loop test function; connecting the high-voltage test line to a wiring device; if the optocoupler has poor contact with the optocoupler high-voltage test device with a loop test function or the optocoupler is damaged, the test fails. During the test, the input ends of multiple optocouplers are connected to the same high-voltage test device, and the two pins of the output end of the optocoupler are connected to another high-voltage test device, and the number of the test units is at least one. The test unit is clamped with two input pins of an optocoupler, and there are multiple test units on the optocoupler high-voltage test device with loop test function, which can be 8, 10 or others. Therefore, an optocoupler high-voltage test device with loop test function can be connected to two input pins of multiple optocouplers, or an optocoupler high-voltage test device with loop test function can be connected to two output pins of multiple optocouplers.

[0015] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0017] Figure 1 It is a front view of an optocoupler high-voltage test device with loop test function according to an embodiment of the present invention;

[0018] Figure 2 Schematic diagram of an optocoupler high-voltage test device with loop test function according to an embodiment of the present invention;

[0019] Reference numerals:

[0020] Base 101, first end surface 102, second end surface 103, isolation surface 104, first mounting hole 106, second mounting hole 107, first fixing hole 108, second fixing hole 109,

[0021] Test unit 201, first test unit 202, second test unit 203, first test piece 204, second test piece 205, third test piece 206, first clamping area 207, fourth test piece 208, fifth test piece 209, sixth test piece 210, second clamping area 211,

[0022] A first wiring hole 301 and a second wiring hole 302 . DETAILED DESCRIPTION

[0023] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0024] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0025] In the description of the present invention, "several" means one or more, "more" means more than two, "greater than", "less than", "exceed" etc. are understood as not including the number itself, and "above", "below", "within" etc. are understood as including the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0026] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0027] Reference Figure 1 and Figure 2 The present invention proposes an optocoupler high-voltage test device with the above-mentioned automation function and loop test function. Applied to an optocoupler test chip, the optocoupler chip includes a chip input end and an output end, the input end includes a first input pin and a second input pin, and the output end includes a first output pin and a second output pin. It includes: a base 101; a test unit 201, the test unit 201 is installed on the base 101, the test unit 201 includes a first test unit 202 for clamping the first input pin or the first output pin of the chip and a second test unit 203 for clamping the second input pin or the second output pin of the chip, the first test unit 202 and the second test unit 203 are arranged adjacent to each other; the first test unit 202 includes a first test piece 204, a second test piece 205 and a third test piece 206, the second test piece 205 and the third test piece 206 are arranged adjacent to each other, the first test piece 204 is arranged opposite to the second test piece 205 and the third test piece 206, and the first test piece 204, the second test piece 205 and the third test piece 206 form a first input pin or the second output pin of the chip between the three test pieces. The first clamping area 207 for placing the first output pin; the second test unit 203 includes a fourth test piece 208, a fifth test piece 209 and a sixth test piece 210, the fifth test piece 209 and the sixth test piece 210 are arranged adjacent to each other, the fourth test piece 208 is arranged opposite to the fifth test piece 209 and the sixth test piece 210, and a second clamping area 211 for placing the second input pin or the second output pin of the chip is formed between the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210; the first test piece 204, the second test piece 205, the third test piece 206, the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210 are respectively connected to the base 101; a wiring device is used to connect the high-voltage test line, and the wiring device is arranged at one end of the second test piece and one end of the sixth test piece.

[0028] Reference Figure 1 and Figure 2According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, there is at least the following technical effect: during testing, the first test piece 204, the second test piece 205 and the third test piece 206 of the optocoupler high-voltage test device with loop test function jointly clamp and fix the first input pin of the optocoupler, and the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210 jointly clamp and fix the second input pin of the optocoupler; the first test piece 204, the second test piece 205 and the third test piece 206 of another optocoupler high-voltage test device with loop test function jointly clamp and fix the first input pin of the optocoupler, and the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210 jointly clamp and fix the second input pin of the optocoupler, thereby achieving the technical effect that the test unit 201 can tightly hold the optocoupler chip.

[0029] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, the number of test units 201 is at least one. One test unit 201 is clamped with two input pins of one optocoupler, and there are multiple test units 201 on an optocoupler high-voltage test device with loop test function, which can be 8, 10 or other. Therefore, an optocoupler high-voltage test device with loop test function can be connected to two input pins of multiple optocouplers, or an optocoupler high-voltage test device with loop test function can be connected to two output pins of multiple optocouplers.

[0030] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage testing device with loop testing function of an embodiment of the present invention, when the first clamping area 207 is placed on the first input pin or the first output pin of the chip, the first test piece 204, the second test piece 205 and the third test piece 206 are connected, and the first test piece 204, the second test piece 205 and the third test piece 206 tightly clamp an input pin or an output pin of the optocoupler.

[0031] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage testing device with loop testing function of an embodiment of the present invention, when the second input pin or the second output pin of the chip is placed in the second clamping area 211, the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210 are connected, and the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210 tightly clamp the other input pin or one output pin of the optocoupler.

[0032] Reference Figure 1 and Figure 2According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, when the second input pin or the second output pin of the chip is placed in the second clamping area 211, the third test piece 206 is connected to the fifth test piece 209. Therefore, during the high-voltage test process, the input pins or output pins of all optocouplers clamped in the same optocoupler high-voltage test device with loop test function are connected.

[0033] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, the wiring device includes a first wiring hole 301 for welding the high-voltage test line, and the first wiring hole 301 is arranged at one end of the second test piece 205. The first wiring hole 301 is used to connect the high-voltage AC wiring terminal.

[0034] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, the wiring device includes a second wiring hole 302 for welding the high-voltage test line, and the second wiring hole 302 is arranged at one end of the sixth test piece 210. The second wiring hole 302 is used to connect the high-voltage AC wiring terminal.

[0035] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage test device with loop test function according to the embodiment of the present invention, the inner side of the base 101 is also provided with a mounting hole for mounting the test unit 201, and the first test piece 204, the second test piece 205, the third test piece 206, the fourth test piece 208, the fifth test piece 209 and the sixth test piece 210 of the test unit 201 are respectively fixed to the base 101 through the mounting holes.

[0036] Reference Figure 1 and Figure 2 According to the optocoupler high-voltage test device with loop test function of the embodiment of the present invention, the base 101 includes a first end face 102, a second end face 103 and an isolation surface 104, the isolation surface 104 is arranged between the first end face 102 and the second end face 103, the second test piece 205, the third test piece 206 and the fourth test piece 208 are respectively installed on the first end face 102 through the first mounting hole 106, and the first test piece 204, the fifth test piece 209 and the sixth test piece 210 are respectively installed on the second end face 103 through the second mounting hole 107. The isolation surface 104 can ensure that different test pieces will not be accidentally touched, and the first end face 102 and the second end face 103 are used to fix each test piece.

[0037] Reference Figure 1 and Figure 2According to the embodiment of the present invention, the optocoupler high-voltage test device with loop test function further includes a first fixing hole 108 and a second fixing hole 109 for fixing the base 101, and the first fixing hole 108 and the second fixing hole 109 are arranged on the base 101. The first fixing hole 108 and the second fixing hole 109 are used to fix the optocoupler high-voltage test device with loop test function on a workbench, a machine table and other equipment.

[0038] A method for testing high-voltage optocouplers with a loop test function, characterized in that it includes: inserting the first input pin of the input end of the optocoupler to be tested into the first test unit of the optocoupler high-voltage test device with a loop test function; inserting the second input pin of the input end of the optocoupler to be tested into the second test unit of the optocoupler high-voltage test device with a loop test function; inserting the first output pin of the optocoupler to be tested into the first test unit of another optocoupler high-voltage test device with a loop test function; inserting the second output pin of the optocoupler to be tested into the second test unit of another optocoupler high-voltage test device with a loop test function; connecting the high-voltage test line to a wiring device; if the optocoupler has poor contact with the optocoupler high-voltage test device with a loop test function or the optocoupler is damaged, the test fails. During the test, the input ends of multiple optocouplers are connected to the same high-voltage test device, and the two pins of the output end of the optocoupler are connected to another high-voltage test device, and the number of the test units is at least one. The test unit is clamped with two input pins of an optocoupler, and there are multiple test units on the optocoupler high-voltage test device with loop test function, which can be 8, 10 or others. Therefore, an optocoupler high-voltage test device with loop test function can be connected to two input pins of multiple optocouplers, or an optocoupler high-voltage test device with loop test function can be connected to two output pins of multiple optocouplers.

[0039] The embodiments of the present invention are described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Various changes can be made within the knowledge scope of ordinary technicians in the technical field without departing from the purpose of the present invention.

[0040] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0041] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. An optocoupler high-voltage test device with loop test function, applied to an optocoupler test chip, wherein the optocoupler chip comprises a chip input end and an output end, wherein the input end comprises a first input pin and a second input pin, and the output end comprises a first output pin and a second output pin, wherein: include: Base; A test unit, the test unit is mounted on the base, the test unit comprises a first test unit for clamping the first input pin or the first output pin of the chip and a second test unit for clamping the second input pin or the second output pin of the chip, the first test unit and the second test unit are arranged adjacent to each other; The first test unit comprises a first test piece, a second test piece and a third test piece, the second test piece and the third test piece are arranged adjacent to each other, the first test piece is arranged opposite to the second test piece and the third test piece respectively, and a first clamping area for placing the first input pin or the first output pin of the chip is formed between the first test piece, the second test piece and the third test piece; The second test unit comprises a fourth test piece, a fifth test piece and a sixth test piece, wherein the fifth test piece and the sixth test piece are arranged adjacent to each other, the fourth test piece is arranged opposite to the fifth test piece and the sixth test piece, and a second clamping area for placing the second input pin or the second output pin of the chip is formed between the fourth test piece, the fifth test piece and the sixth test piece; The first test piece, the second test piece, the third test piece, the fourth test piece, the fifth test piece and the sixth test piece are respectively connected to the base; A wiring device is used for connecting a high-voltage test line, and the wiring device is arranged at one end of the second test piece and one end of the sixth test piece.

2. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: When the first input pin or the first output pin of the chip is placed in the first clamping area, the first test piece, the second test piece and the third test piece are connected.

3. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: When the second input pin or the second output pin of the chip is placed in the second clamping area, the fourth test piece, the fifth test piece and the sixth test piece are connected.

4. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: When the second input pin or the second output pin of the chip is placed in the second clamping area, the third test piece is connected to the fifth test piece.

5. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: The wiring device comprises a first wiring hole for welding a high-voltage test line, and the first wiring hole is arranged at one end of the second test piece.

6. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: The wiring device comprises a second wiring hole for welding a high-voltage test line, and the second wiring hole is arranged at one end of the sixth test piece.

7. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: The inner side of the base is also provided with a mounting hole for mounting the test unit, and the first test piece, the second test piece, the third test piece, the fourth test piece, the fifth test piece and the sixth test piece of the test unit are respectively fixed to the base through the mounting holes.

8. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: The base includes a first end face, a second end face and an isolation face, the isolation face is arranged between the first end face and the second end face, the second test piece, the third test piece and the fourth test piece are respectively installed on the first end face through the first mounting hole, and the first test piece, the fifth test piece and the sixth test piece are respectively installed on the second end face through the second mounting hole.

9. The optocoupler high voltage test device with loop test function according to claim 1, characterized in that: It also includes a first fixing hole and a second fixing hole for fixing the base, and the first fixing hole and the second fixing hole are arranged on the base.

10. An optocoupler high voltage test method with loop test function, characterized in that: The method is applied to an optocoupler high-voltage test device with a loop test function according to any one of claims 1 to 9, and the method comprises: Inserting a first input pin of an input end of the optical coupler to be tested into a first test unit of the optical coupler high voltage test device with loop test function; Inserting the second input pin of the input end of the optical coupler to be tested into the second test unit of the optical coupler high voltage test device with loop test function; Inserting the first output pin of the optical coupler to be tested into the first test unit of another optical coupler high voltage test device with loop test function; Inserting the second output pin of the optical coupler to be tested into the second test unit of another optical coupler high voltage test device with loop test function; Connect the high voltage test line to the wiring device; If the optocoupler has poor contact with the optocoupler high-voltage test device with loop test function or the optocoupler is damaged, the test fails.

Images