A screening system and method for quantum dot optical sheets

Abstract

The present application relates to a kind of screening system and method of quantum dot optical board, the system includes mixing device, extrusion device, hot-pressing shaping device, first backlight module platform, cutting device, second backlight module platform in turn.This application provides a kind of efficient detection quantum dot optical board system and method, save the tedious step of intermediate link in production line production and offline inspection, improve the detection efficiency, avoid the loss of production line batch bad caused by the feedback of offline inspection result not in time.The screening system and method of quantum dot optical board provided by the present application can ensure that the high color gamut backlight module assembled by quantum dot optical board product meets the backlight industry standard.

Description

Technical Field

[0001] This invention relates to the fields of display and lighting, and particularly to a screening system and method for quantum dot optical plates. Background Technology

[0002] Backlight modules are component products with optical plates and optical films as their core basic parts. Based on their downstream applications, they can be divided into input device backlight modules, display device backlight modules, and lighting device backlight modules. The main function of the backlight module structure is to refract and reflect the light emitted by the LED light source, converting a point light source into a surface light source, thereby enabling designated areas of consumer electronics input devices, LCD displays, and lighting equipment to emit light. For high color gamut display backlight modules, quantum dot materials, due to their excellent optical properties and high color purity, can produce purer red and green light after excitation, with a quantum efficiency of up to 90%, resulting in purer color performance, a higher color gamut (>100% NTSC), and higher saturation. The quantum dot functional board (QD board) can replace the functions of the diffuser plate and quantum dot film in the backlight module. While converting the point light source into a surface light source, the blue light emitted by the blue LED chip can excite the green and red quantum dots in the quantum dot yellow board to emit green and red light respectively. These light and red light are mixed with some of the blue light that passes through the board to produce white light, realizing the three primary colors and thus improving the color gamut and light emission effect of the entire LCD backlight.

[0003] In actual production, the yield rate of quantum dot boards has always been a key focus. From controlling the optical properties and stability of quantum dot raw materials, to weighing and metering the material input, to parameter control of the extrusion process, and finally to the inspection of the mechanical and optical properties of the product, quality personnel must monitor, supervise, judge, and handle the board production process and products. They must supervise and inspect the system compliance, process compliance, and product compliance on-site, promptly identify anomalies in the system, process, and products, detect and analyze the causes of anomalies, urge relevant responsible persons to formulate corrective and preventive measures, and follow up on their implementation and effectiveness confirmation until effective improvement is achieved. Only in this way can product quality be guaranteed. However, the current production and manufacturing scale of quantum dot optical boards is still relatively small, and there are no manufacturing and inspection standards for this type of product in the industry. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to address the above-mentioned deficiencies, make up for the lack of detection methods in the production process of quantum dot optical plates, and provide a screening system and method for quantum dot optical plates applied to backlight modules.

[0005] This invention is achieved through the following technical solution:

[0006] A screening system for quantum dot optical plates, the system comprising, in sequence, a mixing device, an extrusion device, a hot pressing and shaping device, a first backlight module platform, a cutting device, and a second backlight module platform; the outlet of the mixing device is connected to the inlet of the extrusion device, and the outlet of the extrusion device is connected to the inlet of the hot pressing and shaping device; the first backlight module platform is located in front of the second backlight module platform, and the cutting device is located between the first backlight module platform and the second backlight module platform.

[0007] Furthermore, in the quantum dot optical plate screening system, a metering device is provided between the extrusion device and the hot pressing shaping device.

[0008] Furthermore, in the quantum dot optical plate screening system, the backlight source emission areas of the first backlight module platform and the second backlight module platform are divided into multi-point measurement areas.

[0009] Furthermore, in the quantum dot optical plate screening system, the multi-point measurement area comprises 13 point regions, including 9 point regions evenly arranged in a 3×3 matrix in the backlight source emission area and 4 point regions located at the four corners of the backlight source emission area.

[0010] Furthermore, in the quantum dot optical plate screening system, the first backlight module platform is equipped with a color analyzer.

[0011] Furthermore, in the quantum dot optical plate screening system, the second backlight module platform is equipped with a color analyzer and a luminance meter.

[0012] Furthermore, in the quantum dot optical plate screening system, a traction device is provided between the first backlight module platform and the cutting device.

[0013] A method for screening quantum dot optical plates, the method comprising the following steps:

[0014] (1) The second backlight module platform tests the transmission spectrum of each point in the multi-point measurement area without quantum dot optical plate, and calculates the peak area A1 of blue backlight in the transmission spectrum of each point.

[0015] (2) The extruded and shaped quantum dot optical plate is sent to the first backlight module platform to test the real-time coordinates and brightness of the quantum dot optical plate; if the test results do not meet the inspection standards, the quantum dot optical plate is placed in the adjustment plate area; if the test results meet the inspection standards, the quantum dot optical plate is cut and sent to the second backlight module platform.

[0016] (3) The second backlight module platform tests the black and yellow foreign objects, damage, burrs, scratches, dirt, flatness and roughness of the quantum dot optical plate; tests the position and half-peak width of the quantum dot fluorescence emission peaks in the green and red regions of the light transmission spectrum of each point area; tests the chromaticity value, luminance value and light transmission spectrum of the multi-point measurement area of ​​the quantum dot optical plate, calculates the uniformity of the multi-point coordinates and luminance value, and obtains the peak area A2 of the blue region, the peak area A3 of the green region and the peak area A4 of the red region in the light transmission spectrum of each point area in the multi-point measurement area, and calculates the luminous efficiency (A1-A2) / (A3+A4)×100%.

[0017] (4) Compare with the inspection standard to determine whether the appearance, surface roughness, quantum dot spectrum, chromaticity value, luminance value, coordinate uniformity, luminance uniformity and luminous efficiency of the quantum dot optical plate are within the standard chromaticity range; if they meet the inspection standard, the quantum dot optical plate is placed in the good product area; if they do not meet the inspection standard, the quantum dot optical plate is placed in the defective product area.

[0018] Furthermore, in the quantum dot optical plate screening method, in step (2), the width and cutting length of the cut quantum dot optical plate are 20-50 mm greater than the backlight module of the second backlight module platform.

[0019] Furthermore, in the quantum dot optical plate screening method, the multi-point measurement area comprises 13 point regions, including 9 point regions evenly arranged in a 3×3 matrix in the backlight source emission area and 4 point regions located at the four corners of the backlight source emission area.

[0020] The advantages and effects of this invention are:

[0021] The quantum dot optical panel screening system and method provided by this invention are highly compatible with the production and assembly processes of common backlight modules. It comprehensively examines the indicators of quantum dot light-emitting panels in terms of foreign matter, scratches, roughness, display brightness, color coordinates, uniformity, quantum dot emission peak, full width at half maximum (FWHM), and luminous efficiency. This provides a highly efficient system and method for testing quantum dot optical panels, eliminating the cumbersome steps in production line and offline inspection, improving testing efficiency, and avoiding batch defects caused by untimely feedback of offline inspection results. The quantum dot optical panel screening system and method provided by this invention can ensure that the high color gamut backlight modules assembled with quantum dot optical panel products meet backlight industry standards. Attached Figure Description

[0022] Figure 1 A schematic diagram of the structure of a quantum dot optical plate screening system according to an embodiment of the present invention is shown;

[0023] Figure 2 A schematic diagram of the production process of a quantum dot optical plate screening system according to an embodiment of the present invention is shown.

[0024] Figure 3 A schematic diagram showing the multi-point measurement area of ​​a quantum dot optical plate screening system according to an embodiment of the present invention is provided.

[0025] Figure 4 A schematic diagram of the backlight module components of a quantum dot optical plate screening system according to an embodiment of the present invention is shown.

[0026] Figure 5 A flowchart illustrating a screening method for a quantum dot optical plate according to another embodiment of the present invention is shown.

[0027] Explanation of reference numerals in the attached drawings: 1-mixing device, 2-extrusion device, 3-metering device, 4-hot pressing and shaping device, 5-first backlight module platform (No. 1 backlight module platform), 6-traction device, 7-cutting device, 8-second backlight module platform (No. 2 backlight module platform), 9-luminance meter, 14-defective product area, 15-good product area; 101-blue LED light strip, 102-reflective sheet, 103-quantum dot optical plate, 104-multi-point measurement area. Detailed Implementation

[0028] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of the embodiments of this invention will be described in more detail below with reference to the accompanying drawings. The described embodiments are only some, not all, of the embodiments of this invention. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the invention, and should not be construed as limiting the invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention. The embodiments of this invention will be described in detail below with reference to the accompanying drawings:

[0029] In the description of this invention, it should be understood that, unless otherwise stated, "a plurality of" means two or more; the terms "center," "longitudinal," "lateral," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this invention. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance. In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "installed," "connected," and "joined" should be interpreted broadly, for example, as a fixed connection, a detachable connection, or an integral connection; it can be a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0030] Figure 1 This diagram illustrates the structure of a quantum dot optical plate screening system according to an embodiment of the present invention. The screening system sequentially includes a mixing device 1, an extrusion device 2, a hot-pressing and shaping device 4, a first backlight module platform 5, a cutting device 7, and a second backlight module platform 8. The outlet of the mixing device 1 is connected to the inlet of the extrusion device 2, and the outlet of the extrusion device 2 is connected to the inlet of the hot-pressing and shaping device 4. In the process flow, the first backlight module platform 5 is located in front of the second backlight module platform 8, and the cutting device 7 is located between the first backlight module platform 5 and the second backlight module platform 8. Specifically, a metering device 3 is provided between the extrusion device 2 and the hot-pressing and shaping device 4 to control the extrusion amount of the extrusion device 2, so as to hot-press and shape the quantum dot optical plate according to a certain width. A traction device 6 is provided between the first backlight module platform 5 and the cutting device 7 to pull the quantum dot optical plate from the outlet of the hot-pressing and shaping device 4 to the first backlight module platform 5. A color analyzer (not shown in the figure) is provided on the first backlight module platform 5. The second backlight module platform 8 is equipped with a color analyzer (not shown in the figure) and a luminance meter 9.

[0031] Figure 2This diagram illustrates the production process of the quantum dot optical plate screening system provided by the present invention. The mixing device 1 mixes the raw materials, and the extrusion device 2, controlled by the metering device 3, extrudes the material. After hot-pressing and shaping the quantum dot optical plate according to a certain width, the traction device 6 pulls the quantum dot optical plate to the first backlight module platform 5 for testing. If the test result is unqualified, the quantum dot optical plate is placed in the adjustment material area; if the test result is qualified, the quantum dot optical plate is cut and sent to the second backlight module platform for further testing. If the test result is qualified, the quantum dot optical plate is placed in the good product area 15 and the finished product is stored in the warehouse; if the test result is unqualified, the quantum dot optical plate is placed in the defective product area 14.

[0032] Specifically, the quantum dot optical plate has a multi-layered structure, including a diffusion layer, a quantum dot light-emitting layer, and a light-emitting layer. It is formed by extruding a mixture of plastic particles and quantum dots using multiple extruders and then bonding them together in a mold. The quantum dots used in the quantum dot light-emitting layer of the quantum dot optical plate are cadmium selenide, perovskite, or indium phosphide.

[0033] The backlight source emission areas of the first backlight module platform 5 and the second backlight module platform 8 are divided into multi-point measurement areas 104. For example... Figure 3 As shown, the blue LED strip 101 and the reflector 102 are stacked to form a multi-point measurement area 104. The multi-point measurement area consists of 13 points, including 9 points evenly arranged in a 3×3 matrix within the backlight source's light-emitting area (i.e.,...). Figure 3 The areas located at the top left (01), top center (02), top right (03), left center (04), center center (05), right center (06), bottom left (07), bottom center (08), and bottom right (09) and the four points located at the four corners of the backlight source's light-emitting area (i.e., Figure 3 (Top left corner 10, top right corner 11, bottom left corner 12, bottom right corner 13).

[0034] Figure 4 This diagram illustrates a backlight module component of the quantum dot optical plate screening system provided by the present invention. The quantum dot optical plate is placed on a first backlight module platform 5 or a second backlight module platform 8 to form a backlight module component, which, from bottom to top, includes a blue LED light strip 101, a reflective sheet 102, and a quantum dot optical plate 103.

[0035] Figure 5 A flowchart illustrating a screening method for a quantum dot optical plate according to another embodiment of the present invention is shown. The screening method includes the following steps:

[0036] (1) Arrange backlight module 1 in the traction section of the quantum dot optical plate extrusion production line of the above screening system, and assemble backlight module 2 after the cutting section, dividing the light emission area of ​​backlight source 2 into multi-point measurement areas. Figure 3As shown, the multi-point measurement area consists of 13 point regions, including 9 point regions arranged in a 3×3 matrix evenly in the light-emitting area of ​​the backlight source (i.e., Figure 3 The areas located at the top left (01), top center (02), top right (03), left center (04), center center (05), right center (06), bottom left (07), bottom center (08), and bottom right (09) and the four points located at the four corners of the backlight source's light-emitting area (i.e., Figure 3 (Top left corner 10, top right corner 11, bottom left corner 12, bottom right corner 13).

[0037] The chromatogram analyzer of the second backlight module platform tests the transmission spectrum of each point in the multi-point measurement area without the quantum dot optical plate, and calculates the peak area A1 of the blue backlight in the transmission spectrum of each point.

[0038] (2) The quantum dot optical plate, after being extruded and shaped to a certain width, is sent to the first backlight module platform. The real-time coordinates and brightness of the quantum dot optical plate are tested using a chromatograph. If the test results do not meet the inspection standards, robotic arm 1 picks up the quantum dot optical plate and places it in the adjustment plate area. If the test results meet the inspection standards, the quantum dot optical plate is cut and then picked up by robotic arm 2 and sent to the second backlight module platform. The width and cutting length of the cut quantum dot optical plate are 20-50 mm greater than the backlight module (backlight module 2) of the second backlight module platform.

[0039] (3) The second backlight module platform was used to test the black and yellow foreign objects, damage, burrs, scratches, dirt, surface flatness, and roughness of the quantum dot optical plate. A luminance meter was used to measure the position and half-peak width of the quantum dot fluorescence emission peaks in the green and red regions of the transmittance spectrum at each point. A color analyzer was used to measure the chromaticity, luminance, and transmittance spectrum of the multi-point measurement area of ​​the quantum dot optical plate. The uniformity of the multi-point coordinates and luminance values ​​was calculated, and the peak area A2 of the blue region, A3 of the green region, and A4 of the red region in the transmittance spectrum of each point in the multi-point measurement area were obtained. The luminous efficiency (A1-A2) / (A3+A4)×100% was then calculated.

[0040] (4) Compare the quantum dot optical board to the inspection standards to determine whether its appearance, surface roughness, quantum dot spectrum, chromaticity value, luminance value, coordinate uniformity, luminance uniformity, and luminous efficiency are within the standard chromaticity range. Only if all test results meet the inspection standard requirements can it be judged as a good product; if any result exceeds the standard, it is judged as a defective product. If it meets the inspection standards, the quantum dot optical board is placed in the good product area; if it does not meet the inspection standards, the quantum dot optical board is placed in the defective product area. Statistical analysis is then performed, and the next quantum dot optical board product is screened, and so on.

[0041] In this embodiment, the acceptable range of the inspection standard is given in the form of standard value ± tolerance. In actual production, due to differences in backlight module size, number and distribution of light sources, and architecture, the main peak wavelength, concentration, and ratio parameters of quantum dots will be adjusted during the manufacturing process, and the corresponding inspection standards will also be fine-tuned to adapt to the needs of actual production.

[0042] The above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the scope of the present invention. Any equivalent changes and modifications made within the protection scope of the present invention should be considered to fall within the protection scope of the present invention.

Claims

1. A method for screening quantum dot optical plates, employing a screening system for quantum dot optical plates, the screening system comprising, in sequence, a mixing device, an extrusion device, a hot-pressing and shaping device, a first backlight module platform, a cutting device, and a second backlight module platform; the outlet of the mixing device is connected to the inlet of the extrusion device, and the outlet of the extrusion device is connected to the inlet of the hot-pressing and shaping device; the first backlight module platform is located in front of the second backlight module platform, and the cutting device is located between the first backlight module platform and the second backlight module platform; characterized in that, The method includes the following steps: (1) The second backlight module platform tests the transmission spectrum of each point in the multi-point measurement area without quantum dot optical plate, and calculates the peak area A1 of blue backlight in the transmission spectrum of each point. (2) The extruded and shaped quantum dot optical plate is sent to the first backlight module platform to test the real-time coordinates and brightness of the quantum dot optical plate; If the test results do not meet the inspection standards, the quantum dot optical board is placed in the adjustment board area; if the test results meet the inspection standards, the quantum dot optical board is cut and sent to the second backlight module platform. (3) The second backlight module platform tests the black and yellow foreign objects, damage, burrs, scratches, dirt, flatness and roughness of the quantum dot optical plate; tests the position and half-peak width of the quantum dot fluorescence emission peaks in the green and red regions of the light transmission spectrum of each point area; tests the chromaticity value, luminance value and light transmission spectrum of the multi-point measurement area of ​​the quantum dot optical plate, calculates the uniformity of the multi-point coordinates and luminance value, and obtains the peak area A2 of the blue region, the peak area A3 of the green region and the peak area A4 of the red region in the light transmission spectrum of each point area in the multi-point measurement area, and calculates the luminous efficiency (A1-A2) / (A3+A4)×100%. (4) Compare with the inspection standard to determine whether the appearance, surface roughness, quantum dot spectrum, chromaticity value, luminance value, coordinate uniformity, luminance uniformity and luminous efficiency of the quantum dot optical plate are within the standard chromaticity range; if they meet the inspection standard, the quantum dot optical plate is placed in the good product area; if they do not meet the inspection standard, the quantum dot optical plate is placed in the defective product area.

2. The screening method for quantum dot optical plates according to claim 1, characterized in that, In step (2), the width and cutting length of the cut quantum dot optical plate are 20-50 mm greater than the backlight module of the second backlight module platform.

3. The screening method for quantum dot optical plates according to claim 1, characterized in that, The multi-point measurement area consists of 13 point areas, including 9 point areas evenly arranged in a 3×3 matrix in the backlight source emission area and 4 point areas located at the four corners of the backlight source emission area.

4. A screening system for quantum dot optical plates, characterized in that, Used to implement the screening method as described in any one of claims 1 to 3.

5. The screening system for a quantum dot optical plate according to claim 4, characterized in that, A metering device is provided between the extrusion device and the hot pressing and shaping device.

6. A screening system for a quantum dot optical plate according to claim 4 or 5, characterized in that, The backlight source emission areas of the first backlight module platform and the second backlight module platform are divided into multi-point measurement areas.

7. The screening system for a quantum dot optical plate according to claim 6, characterized in that, The multi-point measurement area consists of 13 point areas, including 9 point areas evenly arranged in a 3×3 matrix in the backlight source emission area and 4 point areas located at the four corners of the backlight source emission area.

8. A screening system for a quantum dot optical plate according to claim 4 or 5, characterized in that, The first backlight module platform is equipped with a color analyzer.

9. A screening system for a quantum dot optical plate according to claim 4 or 5, characterized in that, The second backlight module platform is equipped with a color analyzer and a luminance meter.

10. A screening system for a quantum dot optical plate according to claim 4 or 5, characterized in that, A traction device is provided between the first backlight module platform and the cutting device.

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