Probe slider assembly, probe unit, lighting device and control method

Abstract

The present invention relates to the technical field of manufacturing display panels to be tested, and specifically to a probe slider assembly, a probe unit, a lighting device, and a control method. The probe slider assembly includes: a support seat; a probe block, including a plurality of probes facing the pin area of ​​the display panel to be tested; a connecting frame, one end of which is connected to the probe block, and the other end is slidably connected to the support seat through a first sliding assembly, and is used to drive the probe block to slide in the direction corresponding to the plurality of probes and the pin area. The present application designs the probe block in the prior art as a sliding structure. If it is observed through a microscope that a plurality of probes in the current probe block do not correspond to the pin area, at this time, the technician only needs to drive the probe block to slide in the direction corresponding to the pin area until the plurality of probes in the probe block completely correspond to the pin area. In summary, the design of the present application can effectively shorten the adjustment time, improve the adjustment accuracy, and improve the test efficiency.

Description

Technical Field

[0001] The invention relates to the technical field of manufacturing a display panel to be tested, and in particular to a probe slider assembly, a probe unit, a lighting device and a control method. Background Art

[0002] Display panel test (Cell Test, referred to as CT) is a test process in which the display panels that have been matched with each other are powered on and lit up during the display panel manufacturing process to judge the defects on the display panel. The main equipment for testing the display panel is the lighting device. The lighting device usually includes an external signal generator and a probe unit (Probe Unit, referred to as PU). The probe unit usually consists of a plurality of probe blocks, wherein each probe block contains a plurality of probes. During the test, the probe block needs to correspond to the position of the pins or pin patterns on the display panel to be tested. The signal generator emits a signal that simulates the real display screen and is input into the corresponding pin area of ​​the display panel to be tested through the probe to realize the lighting test of the panel.

[0003] In the prior art, before using a lighting device to perform a lighting test on a display panel to be tested, in order to ensure that multiple probes in each probe block can be accurately aligned with the panel to be tested so that each probe is aligned with the corresponding pin area, a technician is required to fine-tune it. At this time, since each probe block in the probe unit in the prior art is fixedly connected, it is impossible to adjust the relative positions of the multiple probes in the probe block and the pin area. At this time, the technician can only observe the position of the alignment mark through a microscope, and control the moving device according to the deviation direction and offset degree of the alignment mark to fine-tune the panel to be tested placed on the workbench in four directions and rotation angles within the plane where it is located.

[0004] However, the alignment adjustment process is time-consuming, and the adjustment work requires high operational capabilities and work proficiency of the technicians. Once the alignment is inaccurate, unstable conditions such as needle position deviation and light failure will occur in the actual test, resulting in test failure. Summary of the invention

[0005] The purpose of the present application is to provide a probe slider assembly, a probe unit, a lighting device and a control method to solve the technical problem in the prior art that the relative positions of multiple probes and pin areas in the probe block cannot be adjusted due to the fixed connection of the probe block in the probe unit.

[0006] (I) Technical solution

[0007] To achieve the above object, the present invention provides a probe slider assembly in a first aspect, comprising:

[0008] Support seat;

[0009] A probe block including a plurality of probes facing a pin area of ​​a display panel to be tested;

[0010] A connecting frame is connected to the probe block at one end and is slidably connected to the support seat through a first sliding assembly at the other end, and is used to drive the probe block to slide in a direction corresponding to the plurality of probes and the pin area.

[0011] As one of the optional solutions of the present technical solution, the first sliding assembly includes: a first connecting member and a second connecting member that match each other, one of the first connecting member and the second connecting member is installed on the connecting frame, and the other is installed on the supporting seat.

[0012] As one of the optional solutions of the present technical solution, one of the first connecting member and the second connecting member is configured as a slide rail parallel to the display panel to be tested, and the other is configured as a slide groove matching the slide rail.

[0013] As one of the optional solutions of the present technical solution, the support seat includes: a vertically connected support block and a support plate, and one end of the support block away from the support plate is slidably connected to the connecting frame through a first sliding component.

[0014] As one of the optional solutions of the present technical solution, the probe block and the connecting frame are connected via a lifting mechanism, so that the probe block and the pin area are in contact with or separated from each other.

[0015] As one of the optional schemes of the present technical solution, the lifting mechanism includes: a matching toggle part and a limit block, one end of the limit block is connected to the connecting frame, and the other end is movably connected to the probe block through a connecting column, and after the end of the connecting column away from the probe block passes through a through hole opened in the limit block, it is clamped with one end of the toggle part through a limit piece, so as to press the toggle part to drive the probe block to move in the direction of abutting or separating from the pin area.

[0016] As one of the optional solutions of the present technical solution, a second PCB board is also installed on the connecting frame, and the output end of the second PCB board is communicatively connected with the probe block.

[0017] To achieve the above object, the second aspect of the present invention provides a probe unit, which can be detachably mounted on a support frame of a lighting device, comprising:

[0018] At least one probe slider assembly as described in any of the above;

[0019] The first PCB board is used for communication connection with an external signal generator, and one of its output ends is communication connection with an input end of a second PCB board of at least one of the probe slider assemblies, so as to transmit the test screen signal from the first PCB board to the probe block of the probe slider assembly via the second PCB board for output.

[0020] As one of the optional solutions of the present technical solution, the first PCB board is configured as a PCB board with multiple channels.

[0021] As one of the optional solutions of the present technical solution, camera components are respectively arranged at equal intervals on both sides of the probe slider component for capturing marking points arranged at two opposite edges of the display panel to be tested.

[0022] As one of the optional solutions of this technical solution, the camera assembly includes:

[0023] Support arm;

[0024] A camera unit facing a marking point set at an edge of the display panel to be tested;

[0025] A connecting arm, one end of which is rotatably connected to the camera unit, and the other end of which is connected to the supporting arm via a second sliding assembly, so that the marking point coincides with the center of the shooting field of view of the camera unit.

[0026] To achieve the above objectives, the third aspect of the present invention provides a lighting device, comprising: a support frame, a carrier platform and a probe unit as described in any one of the above, wherein the support frame is installed at a position above the carrier platform corresponding to the display panel to be tested, and the probe unit is detachably installed on the support frame.

[0027] To achieve the above object, the fourth aspect of the present invention provides a control method, which is applied to the lighting device as described above, and the method comprises:

[0028] Obtaining the pin area position information of the display panel to be tested;

[0029] An adjustment instruction is generated according to the distance between the pin area position information and the probe slider assembly, and the adjustment instruction is sent to the probe slider assembly, so that the probe slider assembly moves to a position relative to the pin area according to the adjustment instruction.

[0030] As one of the optional solutions of this technical solution, the method also includes:

[0031] If a test picture signal sent by an external signal generator is received, the test picture signal is sent to the first PCB board, and the pin area channel information of the display panel to be tested is obtained;

[0032] Determining the target number of channels required for a second PCB board corresponding to the pin area according to the pin area channel information;

[0033] Transmitting the test screen signal to the pin area via the second PCB board according to the target number of channels;

[0034] The display panel to be tested performs display according to the test picture signal.

[0035] (II) Beneficial effects

[0036] Compared with the prior art, the present invention has the following beneficial effects:

[0037] The present invention provides a probe slider assembly, a probe unit, a lighting device and a control method, wherein the probe slider assembly includes: a support seat; a probe block, including a plurality of probes facing the pin area of ​​a display panel to be tested; a connecting frame, one end of which is connected to the probe block, and the other end is slidably connected to the support seat through a first sliding assembly, and is used to drive the probe block to slide in the direction corresponding to the plurality of probes and the pin area. The present application designs the probe block in the prior art as a sliding structure. If it is observed through a microscope that the plurality of probes in the current probe block do not correspond to the pin area, at this time, the technician only needs to drive the probe block to slide in the direction corresponding to the pin area until the plurality of probes in the probe block completely correspond to the pin area. In summary, the design of the present application can effectively shorten the adjustment time, improve the adjustment accuracy, and improve the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art description are briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative work, among which:

[0040] Figure 1 is a schematic structural diagram of a probe unit according to an embodiment of the present invention;

[0041] Figure 2 is a schematic structural diagram of a probe unit according to an embodiment of the present invention;

[0042] Figure 3 It is a schematic diagram of the structure of the probe slider assembly of the present invention;

[0043] Figure 4It is a schematic structural diagram of the probe slider assembly in the present invention from another angle;

[0044] Figure 5 It is a schematic diagram of the structure of the cooperation between the lifting mechanism and the probe block in the present invention;

[0045] Figure 6 It is a schematic diagram of the structure of the camera assembly in which the camera part is omitted in the present invention;

[0046] Figure 7 is a schematic structural diagram of a display panel to be tested according to an embodiment of the present invention;

[0047] Figure 8 is a schematic structural diagram of a display panel to be tested according to another embodiment of the present invention;

[0048] Fig. 9 FIG. 1 is a schematic structural diagram showing a display panel to be tested in another embodiment of the present invention.

[0049] In the figure: 1. support seat; 2. probe block; 3. connecting frame; 4. first sliding assembly; 5. support block; 6. support plate; 7. lifting mechanism; 8. toggle part; 9. limit block; 10. limit member; 11. second PCB board; 12. first PCB board; 13. camera assembly; 14. support arm; 15. connecting arm; 16. second sliding assembly; 17. support frame; 18. pin area; 19. probe slider assembly. DETAILED DESCRIPTION

[0050] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0051] In the prior art, before using a lighting device to perform a lighting test on a display panel to be tested, in order to ensure that multiple probes in each probe block 2 can be accurately aligned with the panel to be tested so that each probe is aligned with the corresponding pin area 18, a technician is required to fine-tune it. At this time, since each probe block 2 in the probe unit in the prior art is fixedly connected, it is impossible to adjust the relative positions of the multiple probes in the probe block 2 and the pin area 18. At this time, the technician can only observe the position of the alignment mark through a microscope, and control the moving device according to the deviation direction and offset degree of the alignment mark to fine-tune the panel to be tested placed on the workbench in four directions and rotation angles within the plane where it is located.

[0052] However, the alignment adjustment process is time-consuming, and the adjustment work requires high operational capabilities and work proficiency of the technicians. Once the alignment is inaccurate, unstable conditions such as needle position deviation and light failure will occur in the actual test, resulting in test failure.

[0053] To solve the technical problem in the prior art that the relative positions of the plurality of probes in the probe block 2 and the pin area 18 cannot be adjusted due to the fixed connection of the probe block 2 in the probe unit; Figure 1-Figure 9 As shown, the present application provides a lighting device, including: a support frame 17, a carrying platform and a probe unit, the support frame 17 is installed at intervals above the carrying platform at a position corresponding to the display panel to be tested, specifically, the support frame 17 is formed by overlapping four support members, and the formed support frame 17 is adapted to the shape of the display panel to be tested; the probe unit is detachably installed on the support frame 17.

[0054] The probe unit is further described in detail below in conjunction with the accompanying drawings and specific embodiments:

[0055] The present invention provides a probe unit that can be detachably mounted on a support frame 17 of a lighting device, comprising:

[0056] at least one probe slider assembly 19;

[0057] The number and location of the probe slider assembly 19 are matched with the number and location of the pin area 18 of the display panel to be tested. For example, Figure 7-9 The hybrid cut multi-screen shown, that is: two to three display panels of different sizes are combined on one display panel. In the prior art, in order to facilitate the detection of display panels of all sizes in the aforementioned hybrid cut multi-screen, the pin areas 18 of all display panels are often integrated into one or two. By correspondingly setting one or two probe slider assemblies 19 to correspond to the aforementioned pin areas 18, display panels of all sizes can be lit up. At this time, the technician can observe with the naked eye whether all current display panels of all sizes are displaying normally. If it is found that the display panel of one size is lit normally, it means that there is a problem with the display panel and it can be repaired in time. Of course, the probe unit of this embodiment is not limited to display detection of the hybrid cut multi-screen, but can also perform separate detection on display screens of different sizes in the prior art. It is only necessary to correspond the probe slider assembly 19 to the pin area 18 of the display panel to be tested. In summary, the display panel to be tested is not specifically limited in this embodiment.

[0058] More specifically, Fig. 9As shown, when there is only one pin area 18 of the display panel to be tested, the number of the probe slider assembly 19 is also correspondingly set to one, and is installed on the support frame 17 and the support member parallel to the pin area 18 by fastening bolts, etc., to ensure that the multiple probes of the probe slider assembly 19 correspond to the pin area 18; similarly, Figure 7 and Figure 8 As shown, when there are two pin areas 18 of the display panel to be tested, the number of the probe slider assemblies 19 is correspondingly set to two, such as Figure 7 As shown, two pin areas 18 are arranged at the right side of the display panel to be tested, and correspondingly, two probe slider assemblies 19 are arranged on the right support member of the support frame 17. Similarly, as shown in FIG. Figure 8 As shown, two pin areas 18 are arranged at the upper side of the display panel to be tested, and correspondingly, two probe slider assemblies 19 are arranged on the upper support member of the support frame 17. If it is observed through a microscope that multiple probes of the current probe slider assembly 19 do not correspond to the pin area 18, at this time, the technician only needs to drive the probe slider assembly 19 to slide in the direction corresponding to the pin area 18 until the multiple probes of the current probe slider assembly 19 completely correspond to the pin area 18.

[0059] The first PCB board 12 is used to communicate with an external signal generator, and one of its output ends is communicated with the input end of the second PCB board 11 of at least one probe slider assembly 19, so as to transmit the test screen signal from the first PCB board 12 to the probe block 2 of the probe slider assembly via the second PCB board 11 for output; specifically, the first PCB board 12 and the support frame 17 of the lighting device are detachably connected by fastening bolts, etc., and the first PCB board 12 and the support frame 17 are connected by a hinge, so that the setting position of the first PCB board 12 can be adjusted.

[0060] In a specific embodiment, when there is only one pin area 18, correspondingly, the probe slider assembly 19 is set to one. At this time, the first PCB board 12 is set to a PCB board with a single channel. At this time, if a test screen signal sent by an external signal generator is received, the test screen signal is sent to the first PCB board 12. Thereafter, the first PCB board 12 transmits the test screen signal to multiple probes of the probe slider assembly 19 via the second PCB board 11, and finally transmits it to the pin area 18 of the display panel to be tested. At this time, the display panel to be tested is displayed according to the test screen signal.

[0061] In another specific embodiment, when there are only multiple pin areas 18 and the number of channels in each pin area 18 is not exactly the same, that is, the larger the display panel, the more channels are required, and the same size of the display panel requires the same number of channels. Preferably, the first PCB board 12 is configured as a PCB board with multiple channels, that is, the first PCB board 12 can distribute the received test screen signal according to the signal amount required by display panels of different sizes to ensure that each size of the display panel can be displayed normally, thereby improving the adaptability of the probe unit; for example, Figure 7 As shown, in the hybrid multi-cut screen, there is a large-size display panel and two small-size display panels. Correspondingly, the pin area 18 of the large-size display panel requires 10 pins to light up, while the small-size display panel requires 5 pins to light up. At this time, it is only necessary to install a second PCB board 11 with 10 signal transmission channels on the probe slider assembly 19 corresponding to the pin area 18 of the large-size display panel, and correspondingly, install a second PCB board 11 with 5 signal transmission channels on the probe slider assembly 19 corresponding to the pin area 18 of the small-size display panel. At this time, if a test picture signal sent by an external signal generator is received, the test picture signal is sent to the first PCB board 12, and then the first PCB board 12 The test screen signal is divided according to the number of channels, that is, the test screen signals of 10 signal channels are transmitted to the second PCB board 11 matched with the large-size display panel, and the test screen signals of 5 signal channels are transmitted to the second PCB board 11 matched with the small-size display panel. Finally, the two second PCB boards 11 only need to transmit the received test screen signals to the multiple probes in the corresponding probe slider assembly 19, and finally transmit them to the pin area 18 of the corresponding display panel to be tested, so that the display panels to be tested of different sizes are displayed according to the test screen signals. The above parameters are only used as examples for ease of understanding. The signal transmission method of the display panel in other embodiments is the same as the above, so it will not be elaborated here.

[0062] like Figure 3 and Figure 4 As shown, the probe slider assembly 19 in the above embodiment includes:

[0063] The support base 1 is detachably connected to the support frame 17 of the lighting device by fastening bolts or the like;

[0064] A probe block 2, comprising a plurality of probes facing a pin area 18 of a display panel to be tested;

[0065] The connecting frame 3 is connected to the probe block 2 at one end and is slidably connected to the support base 1 through the first sliding component 4 at the other end, and is used to drive the probe block 2 to slide in the direction corresponding to the multiple probes and the pin area 18; a second PCB board 11 is also installed on the connecting frame 3, and the output end of the second PCB board 11 is communicatively connected to the probe block 2. Preferably, the second PCB board 11 is connected to the connecting frame 3 by a hinge to facilitate adjustment of the relative position of the second PCB board 11.

[0066] In a specific embodiment, the support seat 1 includes: a vertically connected support block 5 and a support plate 6, and the end of the support block 5 away from the support plate 6 is slidably connected to the connecting frame 3 through a first sliding component 4. In summary, the design of this embodiment can improve the assembly performance between the support seat 1 and different support parts.

[0067] The present application designs the probe block 2 in the prior art as a sliding structure. If it is observed through a microscope that multiple probes in the current probe block 2 do not correspond to the pin area 18, at this time, the technician only needs to drive the probe block 2 to slide in the direction corresponding to the pin area 18 until the multiple probes in the probe block 2 completely correspond to the pin area 18. In summary, the design of the present application can effectively shorten the adjustment time, improve the adjustment accuracy, and improve the test efficiency.

[0068] Specifically, Figure 3 and Figure 4 As shown, the first sliding component 4 includes: a first connecting member and a second connecting member that match each other, one of the first connecting member and the second connecting member is installed on the connecting frame 3, and the other is installed on the support seat 1. In order to improve the sliding stability of the probe block 2 relative to the support seat 1, preferably, the first sliding component 4 is set in two, and the two first sliding components 4 are provided with an upper wall surface of the support block 5 and a wall surface that matches with the connecting frame 3. In order to ensure the stability of the connection frame 3 and the support block 5, preferably, one end of the connecting frame 3 that matches with the support block 5 is set to an L-shaped structure bent toward the support block 5. The second PCB board 11 is installed on the bending section of the L-shaped connecting frame 3, and is slidably connected to the support block 5 through the first sliding component 4. The probe Block 2 is installed on the vertical section of the connecting frame 3, and is slidably connected to the support block 5 through the first sliding component 4; in a preferred embodiment, one of the first connecting member and the second connecting member is set as a slide rail parallel to the display panel to be tested, and the other is set as a slide groove cooperating with the slide rail. By adopting the cooperation of this embodiment, the probe slider assembly 19 can be sliding in a direction parallel to the display panel to be tested. Of course, in this embodiment, the first connecting member and the second connecting member are not limited to the cooperation between the above-mentioned slide rail and the slide groove, and can also be set as the cooperation between the pulley and the slide groove. As long as the structure can realize the movement of the probe slider assembly 19 relative to the display panel to be tested, it is applicable to this embodiment and belongs to the protection scope of this embodiment.

[0069] According to one embodiment of the present invention, the probe block 2 is connected to the connecting frame 3 via a lifting mechanism 7 so that the probe block 2 can abut against or separate from the pin area 18. Specifically, the lifting mechanism 7 includes: a matching toggle portion 8 and a limit block 9. One end of the limit block 9 is connected to the connecting frame 3, and the other end is movably connected to the probe block 2 via a connecting column. After the end of the connecting column away from the probe block 2 passes through a through hole opened in the limit block 9, it is engaged with one end of the toggle portion 8 through a limit member 10, so that the toggle portion 8 is pressed to drive the probe block 2 to move in a direction of abutting against or separating from the pin area 18. Specifically, a through hole for the connecting column to pass through is opened on the limit block 9, and the limit member 10 is set to a nut with a size larger than the through hole. Preferably, the length of the connecting column is greater than the depth of the through hole, so that A clamping portion for clamping the toggle portion 8 is formed between the limit piece 10 and the limit block 9; when the probe slider assembly 19 and the support frame 17 are assembled, under the action of gravity, the connecting column will push the probe block 2 to move in the direction close to the pin area 18 until the probes of the probe block 2 abut against the pin area 18. If it is observed through a microscope that multiple probes in the current probe block 2 do not correspond to the pin area 18, at this time, the technician first presses the toggle portion 8 downward so that the toggle portion 8 pulls the connecting column upward through the limit piece 10 until the probe block 2 is separated from the pin area 18. After that, the probe block 2 is driven to slide in the direction corresponding to the pin area 18 until it is observed that multiple probes in the probe block 2 are completely corresponding to the pin area 18, and then the toggle portion 8 is released.

[0070] According to an embodiment of the present invention, in order to achieve more accurate positioning, Figure 1 and Figure 2 As shown, camera assemblies 13 are arranged at equal intervals on both sides of the probe slider assembly 19, which are used to capture the marking points arranged at the two opposite edges of the display panel to be tested; when the current display panel has completed the test and the next display panel moves to the support frame 17, at this time, since the position of the aforementioned probe slider assembly 19 has been adjusted, at this time, it is only necessary to capture the marking points at the edge of the display panel through the camera assemblies 13 arranged at both ends. If the current marking point is not coincident with the center of the shooting field of view of the camera unit, it means that the position of the display panel is offset at this time. At this time, it is necessary to control the moving device to fine-tune the panel to be tested placed on the workbench in four directions and the rotation angle within the plane where it is located according to the deviation direction and the degree of offset of the marking point, until it is observed that the current marking point coincides with the center of the shooting field of view of the camera unit. At this time, the probe block 2 of the probe slider assembly 19 corresponds exactly to the pin area 18. The aforementioned fine-tuning process of the marking point is all prior art and therefore will not be elaborated on here.

[0071] In a specific embodiment, in order to facilitate the adjustment of the relative position between the camera assembly 13 and the display panel to be tested, as shown in FIG. Figure 6 As shown, the camera assembly 13 includes:

[0072] The support arm 14 is detachably connected to the support frame 17 of the lighting device by fastening bolts or the like;

[0073] A camera unit facing a marking point set at an edge of the display panel to be tested;

[0074] The connecting arm 15 has one end rotatably connected to the camera part, and the other end is connected to the supporting arm 14 through the second sliding component 16, so that the marking point coincides with the center of the shooting field of the camera part. In this embodiment, the second sliding component 16 has the same structure as the first sliding component 4, so it will not be described in detail here. In summary, the design of this embodiment can realize the sliding of the camera part in a direction parallel to the display panel, so as to adjust the marking point to a position that coincides with the center of the shooting field of the camera part, thereby improving the test efficiency.

[0075] The present application also provides a control method, which is applied to the lighting device as described above, and the method includes:

[0076] Obtaining the position information of the pin area 18 of the display panel to be tested;

[0077] An adjustment instruction is generated according to the position information of the pin area 18 and the distance between the probe slider assembly 19 , and the adjustment instruction is sent to the probe slider assembly 19 , so that the probe slider assembly 19 moves to a position relative to the pin area 18 according to the adjustment instruction.

[0078] According to one embodiment of the present invention, the method further includes:

[0079] If a test picture signal is received from an external signal generator, the test picture signal is sent to the first PCB board 12, and the channel information of the pin area 18 of the display panel to be tested is obtained;

[0080] According to the channel information of the pin area 18, the target number of channels required by the second PCB board 11 corresponding to the pin area 18 is determined;

[0081] The test screen signal is transmitted to the pin area 18 via the second PCB board 11 according to the target channel number;

[0082] The display panel to be tested displays according to the test picture signal.

[0083] Each embodiment in this specification is described in a progressive manner, and some embodiments focus on the differences from other embodiments. The same or similar parts between the embodiments can be referenced to each other.

[0084] It should be noted that, in the specification and claims of the present application and the above-mentioned drawings, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or specific order or precedence between these entities or operations. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein, for example.

[0085] Moreover, the terms "comprises," "comprising," and "having," and any variations thereof or any other variants thereof, are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements, but also other elements not expressly listed, or also includes elements inherent to such process, method, article, or apparatus. For example, a process, method, system, product, or apparatus comprising a series of steps or units need not be limited to those steps or units expressly listed, but may include other steps or units not expressly listed or inherent to such process, method, product, or apparatus. In the absence of further limitations, an element defined by the statement "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus comprising the element.

[0086] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0087] The above is only a specific implementation method of the present application, so that those skilled in the art can understand or implement the present application. It will be obvious to those skilled in the art that various modifications and changes to these embodiments, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the protection scope of the present application. Therefore, the present application will not be limited to the embodiments shown in this article, but will comply with the widest range consistent with the principles and novel features applied for herein.

Claims

1. A probe slider assembly, characterized in that: include: Support seat; A probe block including a plurality of probes facing a pin area of ​​a display panel to be tested; and a connecting frame, one end of which is connected to the probe block, and the other end of which is slidably connected to the support seat through a first sliding assembly, for driving the probe block to slide in a direction corresponding to the plurality of probes and the pin area; A second PCB board is also installed on the connecting frame. The input end of the second PCB board is connected to the first PCB board for receiving the signal of the first PCB board dividing the test screen signal according to the number of channels in the display panel pin area. The output end of the second PCB board is communicatively connected to the probe block.

2. The probe slider assembly according to claim 1, characterized in that: The first sliding assembly includes: a first connecting member and a second connecting member that match each other, one of the first connecting member and the second connecting member is installed on the connecting frame, and the other is installed on the supporting seat.

3. The probe slider assembly according to claim 2, characterized in that: One of the first connecting member and the second connecting member is configured as a slide rail parallel to the display panel to be tested, and the other is configured as a slide groove matched with the slide rail.

4. The probe slider assembly according to claim 1, wherein: The support seat comprises: a support block and a support plate which are vertically connected, and one end of the support block away from the support plate is slidably connected to the connecting frame via a first sliding assembly.

5. The probe slider assembly according to claim 1, wherein: The probe block and the connection frame are connected via a lifting mechanism so that the probe block and the pin area are in contact with or separated from each other.

6. The probe slider assembly according to claim 5, characterized in that: The lifting mechanism includes: a matching toggle part and a limit block, one end of the limit block is connected to the connecting frame, and the other end is movably connected to the probe block through a connecting column, and the end of the connecting column away from the probe block passes through a through hole opened in the limit block, and is engaged with one end of the toggle part through a limit piece, so as to press the toggle part to drive the probe block to move in the direction of contacting or separating with the pin area.

7. A probe unit, characterized in that: It can be detachably mounted on the support frame of the lighting device, including: At least one probe slider assembly according to any one of claims 1-6; The first PCB board is used for communicating with an external signal generator, and one of its output ends is communicated with the input end of the second PCB board of at least one of the probe slider assemblies, so as to transmit the test screen signal from the first PCB board to the probe block of the probe slider assembly via the second PCB board for output; the first PCB board is configured as a PCB board with multiple channels, and is used for dividing the test screen signal according to the number of channels in the display panel pin area.

8. The probe unit according to claim 7, characterized in that: Camera assemblies are arranged at equal intervals on both sides of the probe slider assembly, respectively, for capturing marking points arranged at two opposite edges of the display panel to be tested.

9. The probe unit according to claim 8, characterized in that: The camera assembly comprises: Support arm; A camera unit facing a marking point set at an edge of the display panel to be tested; A connecting arm, one end of which is rotatably connected to the camera unit, and the other end of which is connected to the supporting arm via a second sliding assembly, so that the marking point coincides with the center of the shooting field of view of the camera unit.

10. A lighting device, characterized in that: include: A support frame, a carrying platform, and a probe unit as described in any one of claims 7 to 9, wherein the support frame is installed at a distance above the carrying platform at a position corresponding to the display panel to be tested, and the probe unit is detachably installed on the support frame.

11. A control method, characterized in that: Applied to the lighting device as claimed in claim 10, the method comprises: Obtaining the pin area position information of the display panel to be tested; generating an adjustment instruction according to the distance between the pin area position information and the probe slider assembly, and sending the adjustment instruction to the probe slider assembly, so that the probe slider assembly moves to a position relative to the pin area according to the adjustment instruction; The method further comprises: If a test picture signal sent by an external signal generator is received, the test picture signal is sent to the first PCB board, and the pin area channel information of the display panel to be tested is obtained; Determining the target number of channels required for a second PCB board corresponding to the pin area according to the pin area channel information; Transmitting the test screen signal to the pin area via the second PCB board according to the target channel number; The display panel to be tested performs display according to the test picture signal.

Images