A testing device and a detection system

Abstract

The present invention discloses a testing device and a detection system, which belongs to the technical field of testing equipment. The testing device includes a stage, a first test module and a second test module. The stage is used to place a circuit board; the first test module includes a first test probe, which is located below the stage and can move upward to abut against the pad of the circuit board, for detecting the pad; the second test module includes a second test probe, which is located below the stage and can move upward to abut against the connector of the circuit board, for detecting the connector. The first test probe and the second test probe are used to automatically run and detect the pad and the connector respectively, which effectively improves work efficiency, unifies detection standards, and improves the reliability of circuit board performance detection. Multi-channel synchronous testing completes all test items in a shorter time, which is conducive to mass production of circuit boards.

Description

Technical Field

[0001] The present invention relates to the technical field of testing equipment, and in particular to a testing device and a detection system. Background Art

[0002] FCT (Functional Certificate of Transport) functional test refers to a test method that provides a simulated operating environment (stimulus and load) to the test target board (UUT: Unit Under Test) to make it work in various design states, thereby obtaining parameters of each state to verify the function of the UUT. Simply put, it is to load the UUT with appropriate stimulus and measure whether the output response meets the requirements.

[0003] A circuit board with a connector includes a pad and a connector, and existing functional tests are mainly based on manual communication tests, resulting in low efficiency in existing integrated circuit board testing, inconsistent testing standards, and unreliable test results.

[0004] Therefore, it is urgent to provide a testing device and a detection system to solve the above problems. Summary of the invention

[0005] The purpose of the present invention is to provide a testing device and a detection system to effectively improve work efficiency, unify detection standards, and improve the reliability of product performance detection.

[0006] In order to achieve the above objectives, the following technical solutions are provided:

[0007] A testing device, comprising:

[0008] A stage for placing circuit boards;

[0009] A first test module, comprising a first test probe, the first test probe is located below the stage and can move upward to abut against a pad of the circuit board, for detecting the pad;

[0010] The second test module includes a second test probe, which is located below the stage and can move upward to abut against the connector of the circuit board for detecting the connector.

[0011] As an optional solution of the testing device, it also includes a pressing module, which is located above the stage and can move downward to press the circuit board.

[0012] As an optional solution for the testing device, a first via hole is formed through the stage, and the first via hole is arranged in a one-to-one correspondence with the detection points of the pad.

[0013] As an optional scheme for the testing device, the first testing module includes a first mounting plate, a first linear driving mechanism and a first testing movable table, the fixed end of the first linear driving mechanism is arranged on the first mounting plate, the movable telescopic end of the first linear driving mechanism is connected to the first testing movable table, and the first testing probe is arranged on the first testing movable table along the vertical direction and is arranged one by one with the first via hole.

[0014] As an optional solution for the testing device, a first guide column is protrudingly provided on the first testing movable platform, a guide hole is through-set on the loading platform, and the first guide column and the guide hole are arranged in a one-to-one correspondence.

[0015] As an optional solution for the testing device, the stage is provided with second via holes, and the second via holes are provided in a one-to-one correspondence with the connectors.

[0016] As an optional scheme for the testing device, the second testing module includes a second mounting plate, a second linear driving mechanism and a second testing mobile platform, the fixed end of the second linear driving mechanism is arranged on the second mounting plate, the movable telescopic end of the second linear driving mechanism is connected to the second testing mobile platform, and the second testing probe is arranged on the second testing mobile platform along the vertical direction and is arranged one-to-one with the connector.

[0017] As an optional solution for the testing device, a limiting groove is provided on the second testing mobile platform, the limiting groove is adapted to the connector, and the second testing probe is inserted into the limiting groove along a vertical direction and extends out.

[0018] As an optional solution for the testing device, the pressing module includes a pressing linear drive mechanism, a mounting plate and a pressure head. The movable telescopic end of the pressing linear drive mechanism is arranged on one end surface of the mounting plate, and the pressure head is arranged on the other end surface of the mounting plate and abuts against the top of the circuit board.

[0019] A detection system includes a space transportation mechanism, a controller module and a technical solution of any test device as described above, wherein the space transportation mechanism is used to transport the circuit board to the loading platform, and the controller module is electrically connected to the first test module, the second test module and the space transportation mechanism.

[0020] Compared with the prior art, the present invention has the following beneficial effects:

[0021] The test device provided by the present invention places the circuit board to be tested on a stage, arranges the first test module and the second test module under the stage, and uses the first test probe and the second test probe to detect the pad and the connector respectively. The first test probe and the second test probe operate automatically, which effectively improves work efficiency, unifies detection standards, and improves the reliability of circuit board performance detection. Multi-channel synchronous testing completes all test items in a shorter time, which is conducive to mass production of circuit boards.

[0022] In the detection system provided by the present invention, the first test probe and the second test probe automatically detect the pad and the connector respectively, which effectively improves work efficiency, unifies the detection standard, improves the reliability of circuit board performance detection, and is conducive to the mass production of circuit boards. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the contents of the embodiments of the present invention and these drawings without paying any creative work.

[0024] Figure 1 This is a schematic diagram of the structure of a test device clamping a circuit board in an embodiment of the present invention;

[0025] Figure 2 It is a structural schematic diagram of a circuit board of a test device in an embodiment of the present invention;

[0026] Figure 3 It is a schematic diagram of the structure in which a circuit board is placed on a stage in an embodiment of the present invention;

[0027] Figure 4 It is a schematic diagram of the structure in which the circuit board is not placed on the stage in the embodiment of the present invention;

[0028] Figure 5 Schematic diagram of the structure of the first test probe, the second test probe and the circuit board in the embodiment of the present invention

[0029] Figure 6 is a schematic diagram of the structure of the first test module in an embodiment of the present invention;

[0030] Figure 7 Schematic diagram of the structure of the second test module in an embodiment of the present invention (the second mounting plate is not shown).

[0031] Reference numerals:

[0032] 1. First test module; 2. Second test module; 3. Stage; 4. Circuit board; 5. Pressing module;

[0033] 11. first test probe; 12. first mounting plate; 13. first linear drive mechanism; 14. first test moving platform; 15. first guide column;

[0034] 21. second test probe; 22. second mounting plate; 23. second linear drive mechanism; 24. second test moving platform; 25. limiting groove;

[0035] 31. first through hole; 32. second through hole; 33. guide hole; 34. limiting protrusion;

[0036] 41. soldering pad; 42. connector;

[0037] 51. Pressing linear drive mechanism; 52. Mounting plate; 53. Pressing head; 54. Second guide column. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0039] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0040] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0041] In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or are the positions or positional relationships in which the inventive product is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0042] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "disposed" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0043] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0044] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0045] Effectively improve work efficiency, unify testing standards, and improve the reliability of product performance testing. This embodiment provides a testing device and a testing system. Figures 1 to 7 The specific contents of this embodiment are described in detail.

[0046] like Figure 1 and Figure 7 As shown, the test device includes a first test module 1, a second test module 2 and a stage 3, the stage 3 is used to place a circuit board 4, the first test module 1 includes a first test probe 11, the first test probe 11 is located below the stage 3 and can automatically move upward to abut against a pad 41 of the circuit board 4, and is used to detect the pad 41. The second test module 2 includes a second test probe 21, the second test probe 21 is located below the stage 3 and can automatically move upward to abut against a connector 42 of the circuit board 4, and is used to detect the connector 42. That is, the first test module 1 is used for communication testing of the pad 41; the second test module 2 is used for communication testing of the connector 42. The first test probe 11 and the second test probe 21 are used for switching and transmitting communication signals.

[0047] In short, the circuit board 4 to be tested is placed on the stage 3, the first test module 1 and the second test module 2 are both set under the stage 3, and the first test probe 11 and the second test probe 21 are used to detect the pad 41 and the connector 42 respectively. The first test probe 11 and the second test probe 21 are automatically operated, which reduces the test time, effectively improves the work efficiency, unifies the detection standards, and improves the reliability of the performance detection of the circuit board 4. The multi-channel synchronous test completes all test items in a shorter time, reduces the test time, and is conducive to the mass production of the circuit board 4. Multiple test methods are tested simultaneously at the same workstation, and the test fixture cooperates with precise positioning to realize the communication detection of the circuit board 4 with the connector 42.

[0048] Furthermore, if Figure 1 and Figure 2 As shown, the testing device further comprises a pressing module 5 , which is located above the stage 3 and can move downward to press the circuit board 4 .

[0049] Furthermore, if Figure 4 As shown, a first via hole 31 is provided through the stage 3, and the first via holes 31 are arranged one-to-one correspondingly with the detection points of the pad 41. Specifically, multiple detection points on the pad 41 correspond to multiple first via holes 31, which facilitates simultaneous detection of multiple detection points at one time.

[0050] Furthermore, if Figure 6 As shown, the first test module 1 includes a first mounting plate 12, a first linear drive mechanism 13 and a first test movable platform 14. The fixed end of the first linear drive mechanism 13 is arranged on the first mounting plate 12, and the movable telescopic end of the first linear drive mechanism 13 is connected to the first test movable platform 14. The first test probe 11 is arranged on the first test movable platform 14 along the vertical direction and is arranged one-to-one with the first via hole 31. Specifically, the first linear drive mechanism 13 is an upper cylinder, which is used to push the first test probe 11 to move upward. In other embodiments, the first linear drive mechanism 13 can also be driven by other power, and no excessive restrictions are made here.

[0051] Furthermore, if Figure 6 As shown, a first guide post 15 is convexly provided on the first test movable platform 14, and a guide hole 33 is provided through the stage 3, and the first guide post 15 and the guide hole 33 are provided one by one. Specifically, a plurality of first guide posts 15 are convexly provided on the first test movable platform 14, and a plurality of guide holes 33 are provided on the stage 3, and the positioning accuracy is improved by the cooperation between the first guide posts 15 and the guide holes 33. Furthermore, a plurality of limiting protrusions 34 are convexly provided on the stage 3, and the plurality of limiting protrusions 34 are arranged around the circuit board 4, further ensuring that the circuit board 4 is firmly fixed on the stage 3.

[0052] Furthermore, if Figure 4 As shown, the stage 3 is provided with second vias 32, and the second vias 32 are provided one-to-one with the connectors 42. When the circuit board 4 is placed on the stage 3, the second vias 32 are provided to conveniently expose the part of the connector 42 to be tested, so that the second test probe 21 located above can be brought into contact with the connector 42 for communication testing.

[0053] Furthermore, if Figure 2 and Figure 7 As shown, the second test module 2 includes a second mounting plate 22, a second linear drive mechanism 23 and a second test mobile platform 24. The fixed end of the second linear drive mechanism 23 is arranged on the second mounting plate 22, and the movable telescopic end of the second linear drive mechanism 23 is connected to the second test mobile platform 24. The second test probe 21 is arranged on the second test mobile platform 24 along the vertical direction and is arranged one-to-one with the connector 42. Specifically, the second linear drive mechanism 23 is an upper cylinder, which is used to push the second test probe 21 to move upward. In other embodiments, the second linear drive mechanism 23 can also be driven by other power, and no excessive restrictions are made here.

[0054] Furthermore, if Figure 7 As shown, a limiting groove 25 is provided on the second test movable platform 24, and the limiting groove 25 is adapted to the connector 42, and the second test probe 21 is inserted into the limiting groove 25 in the vertical direction and extends out. The internal shape of the limiting groove 25 is adapted to the external shape of the connector 42, and is used to limit the position of the connector 42, so as to facilitate accurate positioning and enable the second test probe 21 to be accurately implanted.

[0055] Furthermore, if Figure 2 As shown, the pressing module 5 includes a pressing linear drive mechanism 51, a mounting plate 52 and a pressing head 53. The movable telescopic end of the pressing linear drive mechanism 51 is arranged on one end surface of the mounting plate 52. The pressing head 53 is arranged on the other end surface of the mounting plate 52 and abuts against the upper surface of the circuit board 4 to achieve stable fixation of the circuit board 4. The pressing linear drive mechanism 51 is a pressing cylinder, which is used to apply downward pressure to the pressing head 53. The pressing head 53 is used to fix the position of the circuit board 4 so that it does not shake.

[0056] Specifically, four pressing heads 53 are provided, and the four pressing heads 53 are located around the circuit board 4 to further ensure the accurate positioning of the circuit board 4. The pressing module 5 also includes a second guide column 54, which is vertically arranged on the mounting plate 52 to play a guiding role.

[0057] This embodiment also provides a detection system, which includes a space transportation mechanism, a controller module and a test device, wherein the space transportation mechanism is used to transport the circuit board 4 to the stage 3, and the controller module is electrically connected to the first test module 1, the second test module 2 and the space transportation mechanism. Specifically, the space transportation mechanism is a robot arm.

[0058] The controller module controls the first test module 1 and the second test module 2 to move simultaneously, so that the first test probe 11 and the second test probe 21 automatically detect the pad 41 and the connector 42 respectively at the same time, effectively improving the work efficiency, unifying the detection standard, and improving the reliability of the performance detection of the circuit board 4, which is conducive to the mass production of the circuit board 4. It solves the disadvantages of great visual fatigue, large accidental errors, and different judgment standards of different people in manual observation, as well as low efficiency and high cost, which lead to difficulty in mass production.

[0059] Note that the above are only preferred embodiments of the present invention and the technical principles used. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments, and may include more other equivalent embodiments without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A testing device, characterized in that: include: A loading platform (3) for placing a circuit board (4); A first test module (1) comprising a first test probe (11), wherein the first test probe (11) is located below the stage (3) and is capable of moving upward to abut against a pad (41) of the circuit board (4) for detecting the pad (41); A second test module (2), comprising a second test probe (21), wherein the second test probe (21) is located below the stage (3) and is capable of moving upward to abut against a connector (42) of the circuit board (4) for detecting the connector (42); A pressing module (5) is located above the stage (3) and is capable of moving downward to press the circuit board (4). A first through hole (31) is provided on the stage (3), and the first through hole (31) is arranged in a one-to-one correspondence with the detection point of the pad (41). A second through hole (32) is provided on the stage (3), and the second through hole (32) is arranged in a one-to-one correspondence with the connector (42).

2. The testing device according to claim 1, characterized in that: The first test module (1) comprises a first mounting plate (12), a first linear drive mechanism (13) and a first test movable platform (14); the fixed end of the first linear drive mechanism (13) is arranged on the first mounting plate (12); the movable telescopic end of the first linear drive mechanism (13) is connected to the first test movable platform (14); and the first test probe (11) is arranged on the first test movable platform (14) along a vertical direction and is arranged one-to-one corresponding to the first via hole (31).

3. The testing device according to claim 2, characterized in that: A first guide column (15) is protrudingly provided on the first test movable platform (14), a guide hole (33) is penetratingly provided on the object carrier (3), and the first guide column (15) and the guide hole (33) are arranged in a one-to-one correspondence.

4. The testing device according to claim 3, characterized in that: The second test module (2) comprises a second mounting plate (22), a second linear drive mechanism (23) and a second test movable platform (24); the fixed end of the second linear drive mechanism (23) is arranged on the second mounting plate (22); the movable telescopic end of the second linear drive mechanism (23) is connected to the second test movable platform (24); and the second test probe (21) is arranged on the second test movable platform (24) along a vertical direction and is arranged one-to-one with the connector (42).

5. The testing device according to claim 4, characterized in that: The second test mobile platform (24) is provided with a limiting groove (25), the limiting groove (25) is adapted to the connector (42), and the second test probe (21) is inserted into the limiting groove (25) in a vertical direction and extends out.

6. The testing device according to claim 1, characterized in that: The pressing module (5) comprises a pressing linear drive mechanism (51), a mounting plate (52) and a pressing head (53); the movable telescopic end of the pressing linear drive mechanism (51) is arranged on one end surface of the mounting plate (52); the pressing head (53) is arranged on the other end surface of the mounting plate (52) and abuts against the top of the circuit board (4).

7. A detection system, characterized in that: It comprises a space transportation mechanism, a controller module and a test device as described in any one of claims 1 to 6, wherein the space transportation mechanism is used to transport the circuit board (4) to the loading platform (3), and the controller module is electrically connected to the first test module (1), the second test module (2) and the space transportation mechanism.

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