LED Test Fixture

Abstract

The present invention provides an LED test fixture, comprising: a housing, two rotating disks, and two control components arranged in one-to-one correspondence with the two rotating disks; the two rotating disks are arranged horizontally and side by side inside the housing; a plurality of ejector pin positions are arranged on the edge of each rotating disk, wherein the number of ejector pin positions included in each ejector pin position is different; each control component is connected to the corresponding rotating disk, and is used to control the corresponding rotating disk, so that the number of ejector pin positions of an ejector pin position of the corresponding rotating disk matches the number of corresponding side pin positions of the LED to be tested. Therefore, by using a rotating disk with a plurality of ejector pin positions arranged on the edge, the LED test with different pin numbers can be realized, the production cost of the test fixture is reduced, and the management and use of the test fixture are convenient.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to an LED testing fixture. Background Art

[0002] LED (Light Emitting Diode) is an optoelectronic product, and its optoelectronic characteristics need to be measured. The measuring equipment mainly includes: integrating sphere, sleeve, angle machine, etc. Due to the small size of LED, it is impossible to measure it directly, and a measuring fixture is needed to light up the LED for testing.

[0003] In the related art, the main test fixture is generally one fixture for one LED, that is, one fixture corresponds to one LED pin, for example, a four-pin LED can only be measured using a four-pin fixture. However, the fixture cost is high, so this technology causes a great waste of cost. Summary of the invention

[0004] In order to solve the above technical problems, the present invention provides an LED test fixture that can realize the testing of LEDs with different numbers of pins, thereby reducing the production cost of the test fixture and facilitating the management and use of the test fixture.

[0005] The technical solution adopted by the present invention is as follows:

[0006] The embodiment of the present invention provides a test fixture for LED, comprising: a housing, two rotating discs, and two control components arranged in one-to-one correspondence with the two rotating discs;

[0007] The two rotating discs are arranged horizontally and side by side inside the housing;

[0008] A plurality of ejector pin positions are arranged on the edge of each rotating disk, wherein each ejector pin position comprises a different number of ejector pin positions;

[0009] Each of the control components is connected to a corresponding rotating disk and is used to control the corresponding rotating disk so that the number of ejector pins at an ejector pin position of the corresponding rotating disk matches the number of corresponding side pins of the LED to be tested.

[0010] In addition, the LED test fixture proposed in the above embodiment of the present invention may also have the following additional technical features:

[0011] According to one embodiment of the present invention, each of the control components includes: a first connecting rod and a turntable; the first connecting rod is vertically arranged at the bottom of the corresponding rotating disk; the turntable is connected to the corresponding rotating disk through the first connecting rod, and the turntable is arranged parallel to the corresponding rotating disk; the turntable is used to drive the corresponding rotating disk to rotate through the first connecting rod, so that the corresponding rotating disk rotates to the target posture.

[0012] According to an embodiment of the present invention, an opening is provided on the shell; the turntable is arranged in the shell and is exposed to the outside of the shell through the opening.

[0013] According to one embodiment of the present invention, each of the control components includes a screw; the screw is arranged on the top of the corresponding rotating disk and is threadedly connected to the corresponding rotating disk; the screw is used to fix the corresponding rotating disk when the corresponding rotating disk rotates to a target posture.

[0014] According to one embodiment of the present invention, each of the control components further includes: a telescopic member and a second connecting rod; the telescopic member and the second connecting rod are horizontally arranged at the bottom of the corresponding rotating disk, and the telescopic member is connected to the bottom of the corresponding rotating disk through the second connecting rod; the telescopic member is used to drive the corresponding rotating disk to move according to the size of the LDE to be measured, so that the position of the rotating disk changes until the rotating disk moves to the target position.

[0015] According to an embodiment of the present invention, the telescopic member is a hydraulic rod or a spring tube.

[0016] According to an embodiment of the present invention, the target posture is determined according to the number of pins of the LED to be tested.

[0017] According to an embodiment of the present invention, the target position is determined according to the size of the LED to be tested.

[0018] The technical solution of the embodiment of the present invention adopts a rotating disk with multiple ejector pin positions set on the edge, which can realize the testing of LEDs with different numbers of pins, reduce the production cost of the test fixture, and facilitate the management and use of the test fixture. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 Schematic diagram of the structure of an LED test fixture according to an embodiment of the present invention.

[0020] Figure 2A It is a schematic diagram of the structure of a control component of an embodiment of the present invention.

[0021] Figure 2BThe figure is a schematic diagram of the structure of an LED test fixture according to an example of the present invention.

[0022] Figure 3A The figure is a schematic diagram of the structure of an LED test fixture according to an embodiment of the present invention.

[0023] Figure 3B A schematic diagram of the structure of a control component of an example of the present invention. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0025] Figure 1 FIG. 4 is a schematic diagram of an LED test fixture according to an embodiment of the present invention.

[0026] like Figure 1 As shown, the LED test fixture 100 includes: a housing 10, two rotating disks 20, and two control components (not shown in the figure) arranged in a one-to-one correspondence with the two rotating disks 20.

[0027] Among them, two rotating disks 20 are horizontally and side by side arranged inside the shell 10; a plurality of ejector pin positions 30 are arranged on the edge of each rotating disk 20, wherein each ejector pin position 30 comprises a different number of ejector pins; each control component is connected to the corresponding rotating disk 20, and is used to control the corresponding rotating disk 20 so that the number of ejector pins of an ejector pin position of the corresponding rotating disk 20 matches the number of corresponding side pins of the LED to be tested.

[0028] In the embodiment of the present invention, the LED that needs to be tested by the test fixture is called the LED to be tested. The number of corresponding side pins of the LED to be tested can be understood as the number of pins on one side of the LED that needs to match the number of pins of a pin position on the edge of a rotating disk, and the number of pins on the other side needs to match the number of pins of a pin position on the edge of another rotating disk.

[0029] Specifically, when it is necessary to use the test fixture 100 to test the photoelectric characteristics of the LED to be tested (the number and structure of pin positions are determined), the corresponding rotating disk 20 can be controlled by the control component first, so that the number of pins of a pin position 30 on the edge of a rotating disk matches the number of pins on one side of the LED to be tested, and the number of pins of a pin position 30 on the edge of the other rotating disk matches the number of pins on the other side of the LED to be tested. In this way, the LED to be tested is connected between the two rotating disk edges, so that the pins of the LED to be tested match the pins of the test fixture 100, which facilitates the subsequent lighting test of the LED to be tested.

[0030] That is to say, any combination of the pin positions on the edges of the two rotating disks 20 can be used to measure LEDs with different pin numbers and pin structures.

[0031] For example, if the LED to be tested has 1 pin on one side and 2 pins on the other side, then a control component can be used to match a pin position (having 1 pin) of the corresponding rotating disk 20 with 1 pin on one side of the LED, and another control component can be used to match a pin position (having 2 pins) of the corresponding rotating disk 20 with 2 pins on the other side of the LED.

[0032] Therefore, by using a rotating disk with multiple ejector pin positions arranged on the edge, LED testing with different numbers of pins can be achieved, which reduces the production cost of the test fixture and facilitates the management and use of the test fixture.

[0033] In one embodiment of the present invention, Figure 2A As shown, each control component may include: a first connecting rod 1 and a rotating disk 2.

[0034] The first connecting rod 1 is vertically arranged at the bottom of the corresponding rotating disk 20; the turntable 2 is connected to the corresponding rotating disk 20 through the first connecting rod 1, and the turntable 2 is arranged parallel to the corresponding rotating disk 20; the turntable 2 is used to drive the corresponding rotating disk 20 to rotate through the first connecting rod 1, so that the corresponding rotating disk 20 rotates to the target posture.

[0035] Among them, the target posture can be determined according to the number of pins of the LED to be tested. For example, if the LED to be tested has 4 pins: 2 pins on one side and 2 pins on the other side, then the target posture of the two rotating disks can be determined as: the posture of the rotating disks when the pin positions of the ejector including 2 pins on one rotating disk 20 match the pin positions of the ejector including 2 pins on the other rotating disk 20. It can also be understood that the target posture refers to the posture of the rotating disks that match the number of pins of the LED to be tested when the two rotating disks 20 are combined, and different numbers of LED pins can correspond to different target postures.

[0036] Furthermore, if Figure 2B As shown, an opening 3 may be opened on the housing 10 ; the turntable 2 is disposed in the housing 10 and is exposed to the outside of the housing 10 through the opening 3 .

[0037] Specifically, when it is necessary to use the test tool 100 to test the photoelectric characteristics of the LED to be tested, the number of pins of the LED can be determined, and then the target posture of the two rotating disks 20 can be determined based on the number of pins. After that, the turntable 2 can be rotated manually or by machine, so that the turntable 2 drives the corresponding rotating disk 20 to rotate through the first connecting rod 1, driving the ejector pin position 30 to rotate until each rotating disk 20 rotates to the target posture. At this time, the number of ejector pins of an ejector pin position 30 of each rotating disk 20 matches the number of corresponding side pins of the LED to be tested.

[0038] pass Figure 2A and Figure 2B The test fixture structure shown, that is, using two rotating disks 20 carrying multiple ejector pin positions 30, using a first connecting rod 1 to connect the rotating disk 20 and the turntable 2, which are placed in the housing 10. During use, only the turntable 2 needs to be rotated to change the pin position, thereby adapting to the measurement of LEDs with different pin positions.

[0039] Therefore, through two rotating disks carrying multiple ejector pin positions, the first connecting rod and the disk, it can be suitable for LED testing with different numbers of pins, which can reduce the cost of fixture production caused by a large number of pin types, and at the same time reduce the number of fixtures, thereby facilitating the management and use of the fixtures.

[0040] In another embodiment of the present invention, Figure 3A and Figure 3B As shown, each control member may include a screw 4 .

[0041] The screw 4 is disposed on the top of the corresponding rotating disk 20 , and the screw 4 is threadedly connected to the corresponding rotating disk 20 ; the screw 4 is used to fix the corresponding rotating disk 20 when the corresponding rotating disk 20 rotates to a target posture.

[0042] Among them, the target posture can be determined according to the number of pins of the LED to be tested. For example, if the LED to be tested has 4 pins: 2 pins on one side and 2 pins on the other side, then the target posture of the two rotating disks can be determined as: the posture of the rotating disks when the pin positions of the ejector including 2 pins on one rotating disk 20 match the pin positions of the ejector including 2 pins on the other rotating disk 20. It can also be understood that the target posture refers to the posture of the rotating disks that match the number of pins of the LED to be tested when the two rotating disks 20 are combined, and different numbers of LED pins can correspond to different target postures.

[0043] Specifically, when it is necessary to use the test tool 100 to test the photoelectric characteristics of the LED to be tested, the number of pins of the LED can be determined, and then the target posture of the two rotating disks 20 can be determined based on the number of pins. After that, the rotating disk 20 can be rotated manually or by machine, thereby driving the ejector pin position 30 to rotate, until each rotating disk 20 rotates to the target posture, and then the rotating disk 20 is fixed by the screw 4 to fix the rotating disk 20 at the current position and maintain it in the target posture. At this time, the number of ejector pins of an ejector pin position 30 of each rotating disk 20 matches the number of corresponding side pins of the LED to be tested.

[0044] Therefore, through two rotating disks and screws carrying multiple ejector pin positions, it can be suitable for LED testing with different numbers of pins, which can reduce the cost of fixture production caused by a large number of pin types and reduce the number of fixtures, thereby facilitating the management and use of the fixtures.

[0045] It should be noted that in the related art, different sizes of LEDs are measured using different test fixtures, that is, one LED size corresponds to one test fixture. For example, a 0603 packaged LED can only be measured using a 0603 packaged fixture. However, there are many LEDs of different sizes, and the fixture cost is high, which results in a great waste of cost. To this end, an example of the present invention proposes the following fixture structure to adapt to the testing of LEDs of various sizes.

[0046] That is, in one example, referring to Figure 3A and Figure 3B Each control component may also include: a telescopic member 5 and a second connecting rod 6.

[0047] The telescopic member 5 and the second connecting rod 6 are horizontally arranged at the bottom of the corresponding rotating disk 20, and the telescopic member 5 is connected to the bottom of the corresponding rotating disk 20 through the second connecting rod 6; the telescopic member 5 is used to drive the corresponding rotating disk 20 to move according to the size of the LDE to be measured, so that the position of the rotating disk 20 changes until the rotating disk moves to the target position.

[0048] The target position can be determined according to the size of the LED to be tested. For example, for an LED with a package size of 2 mm (millimeter), the target position can be: the position of the rotating disk when the ejector pin position on one rotating disk 20 is 2 mm away from the ejector pin position on another rotating disk 20. It can also be understood that the target position refers to the position of the rotating disk when the two rotating disks 20 are combined to match the size of the LED to be tested, and LEDs of different sizes can correspond to different target positions.

[0049] In this example, the telescopic member 5 may be a hydraulic rod (micro hydraulic rod) or a spring tube.

[0050] Specifically, when it is necessary to use the test tool 100 to test the photoelectric characteristics of the LED to be tested, the package size of the LED can be determined, and then the target position of the two rotating disks 20 can be determined based on the size. After that, the telescopic part 5 can be compressed manually or by machine to make the corresponding rotating disk 20 move horizontally, thereby driving the ejector pin position 30 to move, so that the position of the rotating disk 20 changes until it moves to the target position. At this time, the distance between an ejector pin position 30 of one rotating disk 20 and an ejector pin position 30 of another rotating disk 20 matches the size of the LED to be tested, that is, the spacing distance is equal to the size of the LED to be tested, thereby achieving testing of LEDs of different sizes.

[0051] pass Figure 3A and Figure 3B The test fixture structure shown, that is, two rotating disks 20 and a telescopic member 5 carrying a plurality of ejector pin positions 30 are used, the telescopic member 5 and the rotating disk 20 are connected by a second connecting rod 6, and a screw 4 is added to the top of the rotating disk 20 for fixing. During use, it is only necessary to rotate the rotating disk 20 to change the pin position, and it is only necessary to compress the telescopic member to change the position of the rotating disk 20, thereby adapting to the measurement of LEDs with different pin positions and different sizes.

[0052] It should be noted that when the position of the rotating disk is changed, the position of one of the rotating disks 20 may be changed, or the positions of both rotating disks 20 may be changed, which may be determined specifically according to the world situation.

[0053] Therefore, through two rotating disks carrying multiple ejector pin positions, screws, telescopic parts and a second connecting rod, it can be suitable for LED testing with different numbers of pins and different package sizes, which can reduce the cost of fixture production caused by a large number of types or different sizes of pins, and at the same time reduce the number of fixtures, thereby facilitating the management and use of the fixtures.

[0054] In summary, the embodiment of the present invention adopts a rotatable multi-pin design test fixture, which can be used for testing LEDs with different numbers of pins and packaging models, and is therefore suitable for measuring the photoelectric characteristics of multiple LEDs.

[0055] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. "Multiple" means two or more, unless otherwise clearly and specifically defined.

[0056] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0057] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0058] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0059] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. An LED test fixture, characterized in that: include: A housing, two rotating discs, and two control components arranged in one-to-one correspondence with the two rotating discs; The two rotating discs are arranged horizontally and side by side inside the housing; A plurality of ejector pin positions are arranged on the edge of each rotating disk, wherein each ejector pin position comprises a different number of ejector pin positions; Each of the control components is connected to a corresponding rotating disk and is used to control the corresponding rotating disk so that the number of ejector pins at an ejector pin position of the corresponding rotating disk matches the number of corresponding side pins of the LED to be tested. Each of the control components comprises: a first connecting rod and a rotating disk; The first connecting rod is vertically arranged at the bottom of the corresponding rotating disc; The rotating disk is connected to the corresponding rotating disk through the first connecting rod, and the rotating disk is arranged in parallel with the corresponding rotating disk; The rotating disk is used to drive the corresponding rotating disk to rotate through the first connecting rod, so that the corresponding rotating disk rotates to a target posture, Each of said control components comprises a screw; The screw is arranged on the top of the corresponding rotating disc and is threadedly connected with the corresponding rotating disc; The screw is used to fix the corresponding rotating disk when the corresponding rotating disk rotates to a target posture.

2. The LED test fixture according to claim 1, characterized in that: The shell is provided with an opening; The turntable is arranged in the shell and is exposed outside the shell through the opening.

3. The LED test fixture according to claim 1, characterized in that: Each of the control components further comprises: a telescopic member and a second connecting rod; The telescopic member and the second connecting rod are horizontally arranged at the bottom of the corresponding rotating disc, and the telescopic member is connected to the bottom of the corresponding rotating disc through the second connecting rod; The telescopic member is used to drive the corresponding rotating disk to move according to the size of the LED to be tested, so that the position of the rotating disk changes until the rotating disk moves to the target position.

4. The LED test fixture according to claim 3, characterized in that: The telescopic member is a hydraulic rod or a spring tube.

5. The LED test fixture according to claim 1, characterized in that: The target posture is determined according to the number of pins of the LED to be tested.

6. The LED test fixture according to claim 3, characterized in that: The target position is determined according to the size of the LED to be tested.

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