Automatic testing method and device for power supply system used for LCD screen aging test

Abstract

The embodiment of the present invention discloses an automatic testing method and device for a power supply system for LCD screen aging test. The method comprises: sending a voltage setting command to the power supply system to be tested, setting each power supply device to a preset voltage; sending a voltage reading command to the power supply system to be tested, reading back the initial voltage sampling value of each power supply device; switching the load network to a large resistance network, sending an output start command to the power supply system to be tested, and sampling the first voltage and the first current input to the power supply system to be tested; sending a voltage reading command and a current reading command to the power supply system to be tested, reading back the test voltage sampling value and the test current sampling value of each power supply device; switching the load network to a high-power resistance network, and sampling the second voltage input to the power supply system to be tested; determining whether the function of the power supply system to be tested is normal according to the obtained parameter values. The automatic testing of the power supply system is realized, the production efficiency and reliability are improved, and the cost is reduced.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of system detection technology, and in particular to an automatic testing method and device for a power supply system used for liquid crystal display aging testing. Background Art

[0002] The power supply system used for LCD screen aging test may have different power supply requirements due to the different types of corresponding LCD screens. For example, EDP LCD screen requires two power supplies, VDD and VBL, mipi LCD screen requires four power supplies, VDD, IOVCC, VSP, and VSN, LVDS screen may require eight power supplies, VDD, IOVCC, VSP, VSN, VGH, VGL, VCOM, and AVDD, etc. The backlight of the LCD screen is divided into two types: constant voltage and constant current. When performing aging tests, the power supply system may need to perform aging tests on multiple LCD screens at the same time. At this time, the power supply system needs to monitor and protect the power supply parameters of each LCD screen in real time, including voltage and current. Therefore, the requirements of LCD screen aging test for the power supply system are mainly: multiple power supplies to adapt to the different requirements of different LCD screens; multiple channels to achieve the needs of one-to-many simultaneous aging; a large voltage range, and different voltage values ​​need to be set for output; each channel switch can be controlled separately; voltage and current parameters need to be monitored in real time, and have functions such as OVP, OCP, and UVP.

[0003] The complexity of the power supply system not only increases the difficulty of development itself, but also puts forward relatively high requirements for production testing. If tested manually, it takes at least a few minutes to dozens of minutes to test all the functions and parameters of a power supply system. In this way, mass production of products not only takes a lot of time, but also requires high quality of workers. It costs a huge amount of time and manpower, and is inefficient, and is prone to uncontrollable problems such as missed detection and errors. Summary of the invention

[0004] The embodiment of the present invention provides an automatic testing method and device for a power supply system used for a liquid crystal screen aging test, so as to improve production efficiency and test reliability, and reduce worker quality requirements and costs.

[0005] In a first aspect, an embodiment of the present invention provides an automatic testing method for a power supply system for a liquid crystal screen aging test, the method comprising:

[0006] Sending a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage;

[0007] Sending a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices;

[0008] Switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested;

[0009] Sending a voltage reading command and a current reading command to the power supply system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices;

[0010] Switching the load network to a high-power resistor network, and sampling a second voltage input to the power supply system to be tested;

[0011] Whether the power supply system to be tested functions normally is determined according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value.

[0012] Optionally, sending a voltage setting command to the power system to be tested to set each power supply device in the power system to be tested to a preset voltage includes:

[0013] Sending a first voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the minimum value of its own voltage range;

[0014] Sending a second voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the maximum value of its own voltage range;

[0015] Correspondingly, sending a voltage reading command to the power system to be tested to read back the initial voltage sampling value of each of the power devices includes:

[0016] Sending a first voltage reading command to the power supply system to be tested, so as to read back the first voltage sampling value of each of the power supply devices when the first voltage sampling value is set to the minimum value;

[0017] A second voltage reading command is sent to the power supply system to be tested, so as to read back the second voltage sampling value of each of the power supply devices when the second voltage sampling value is set to the maximum value.

[0018] Optionally, determining whether the power system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value includes:

[0019] Comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal;

[0020] Comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal;

[0021] The second voltage is compared with the preset voltage to determine whether the load capacity of the power system to be tested is normal.

[0022] Optionally, the large resistor network includes an LED light string for simulating a constant current backlight of a liquid crystal screen; the test voltage sampling value is the voltage on the LED light string monitored by the power system to be tested; after sampling the first voltage and the first current input to the power system to be tested, it also includes:

[0023] Determine a sampled voltage on the LED light string according to the first voltage;

[0024] Correspondingly, determining whether the function of the power system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value includes:

[0025] The sampled voltage is compared with the test voltage sample value to determine whether the voltage sampling function of the power supply system to be tested is normal.

[0026] Optionally, before sending a voltage setting command to the power system to be tested to set each power supply device in the power system to be tested to a preset voltage, the method further includes:

[0027] A communication command is sent to the power system to be tested, and whether a valid response message is received is detected. If received, it is determined that the power system to be tested is normally connected.

[0028] Optionally, the method further includes:

[0029] Detecting the user's start test button input, if input is detected and the current state is not testing, and the power supply system to be tested is connected normally, then starting the test;

[0030] Detect the user's stop test button input. If input is detected and the current state is testing, stop the test.

[0031] Optionally, the method further includes:

[0032] If the function of the power system to be tested is detected to be abnormal, an alarm is given through a buzzer and / or LCD display until the stop test button input is detected, and the test information is printed through the PC.

[0033] In a second aspect, an embodiment of the present invention further provides an automatic testing device for a power supply system for a liquid crystal screen aging test, the device comprising:

[0034] A preset voltage setting module, used to send a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage;

[0035] An initial voltage sampling value reading module is used to send a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices;

[0036] A first sampling module, used for switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested;

[0037] A test parameter reading module, used for sending a voltage reading command and a current reading command to the power supply system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices;

[0038] A second sampling module, used for switching the load network to a high-power resistor network and sampling a second voltage inputted by the power supply system to be tested;

[0039] A function detection module is used to determine whether the function of the power supply system to be tested is normal based on the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value.

[0040] In a third aspect, an embodiment of the present invention further provides a computer device, the computer device comprising:

[0041] one or more processors;

[0042] A memory for storing one or more programs;

[0043] When the one or more programs are executed by the one or more processors, the one or more processors implement the automatic testing method of the power supply system for liquid crystal screen aging test provided by any embodiment of the present invention.

[0044] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements an automatic testing method for a power supply system for LCD screen aging testing provided by any embodiment of the present invention.

[0045] The embodiment of the present invention provides an automatic testing method for a power supply system for a liquid crystal screen aging test, which tests the voltage setting function and the voltage sampling function of the power supply system to be tested by setting a preset voltage for the power supply system to be tested and reading back the initial voltage sampling value of each power supply device, and tests the voltage and current sampling function and the load capacity of the power supply system to be tested by switching the load network to a large resistance network and a high-power resistance network respectively and controlling the output of the power supply system to be tested at the same time, thereby realizing the automatic testing of the power supply system, which not only improves the production efficiency but also improves the reliability of the test, greatly reduces the quality requirements for workers, reduces the production cost, and plays a good auxiliary role in the inspection and analysis of the power supply system by R&D personnel. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 A flow chart of an automatic testing method for a power supply system for a liquid crystal screen aging test provided in the first embodiment of the present invention;

[0047] Figure 2 A schematic diagram of the structure of an automatic testing device for a power supply system for a liquid crystal screen aging test provided in the second embodiment of the present invention;

[0048] Figure 3 This is a schematic diagram of the structure of a computer device provided in Embodiment 3 of the present invention. DETAILED DESCRIPTION

[0049] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0050] It should be mentioned before discussing the exemplary embodiments in more detail that some exemplary embodiments are described as processes or methods depicted as flow charts. Although the flow charts describe the steps as sequential processes, many of the steps therein can be implemented in parallel, concurrently or simultaneously. In addition, the order of the steps can be rearranged. The process can be terminated when its operation is completed, but can also have additional steps not included in the accompanying drawings. The process can correspond to a method, function, procedure, subroutine, subprogram, etc.

[0051] In addition, the terms "first", "second", etc. may be used in this article to describe various directions, actions, steps or elements, etc., but these directions, actions, steps or elements are not limited by these terms. These terms are only used to distinguish a first direction, action, step or element from another direction, action, step or element. For example, without departing from the scope of the present application, the first voltage may be referred to as the second voltage, and similarly, the second voltage may be referred to as the first voltage. Both the first voltage and the second voltage are voltages, but they are not the same voltage. The terms "first", "second", etc. cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined as "first" and "second" may expressly or implicitly include one or more of the features. In the description of the present invention, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0052] Embodiment 1

[0053] Figure 1 This is a flow chart of an automatic test method for a power system for LCD screen aging test provided in the first embodiment of the present invention. This embodiment is applicable to the case of performing automated testing on a power system for LCD screen aging test. This method can be performed by an automatic test device for a power system for LCD screen aging test provided in the embodiment of the present invention. The device can be implemented in hardware and / or software and can generally be integrated into a computer device. Figure 1 As shown, the specific steps include:

[0054] S11. Sending a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage.

[0055] S12: Send a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices.

[0056] S13, switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested.

[0057] S14, sending a voltage reading command and a current reading command to the power supply system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices.

[0058] S15, switching the load network to a high-power resistor network, and sampling a second voltage input to the power system to be tested.

[0059] S16. Determine whether the power system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value.

[0060] Specifically, the method provided in this embodiment can be implemented by a correspondingly designed power supply automation test system, and the power supply automation test system can be specifically connected to the power supply system to be tested for testing. The power supply automation test system may include an MCU control system, a load network, and a voltage and current sampling module, etc., wherein the MCU control system is connected to the load network and the voltage and current sampling module respectively, the load network may include a high-power resistor load, a high-resistance load, and a switching control circuit therebetween, and the MCU control system may switch the load network to a high-resistance network or a high-power resistor network by controlling the gear switch of the load network, thereby realizing the test of different functions. The voltage and current sampling module may be responsible for sampling the voltage and current outside the power supply automation test system and sending it to the MCU control system, and the MCU control system may perform AD conversion and convert it into the corresponding required voltage and current values ​​after receiving the output of the voltage and current sampling module. When connected to the power supply system to be tested for testing, the MCU control system, the load network, and the voltage and current sampling module may be specifically connected to the corresponding interfaces of the power supply system to be tested, so as to sample the output of the power supply system to be tested using the voltage and current sampling module, provide a load for the power supply system to be tested using the load network, and provide relevant control signals to the power supply system to be tested through the MCU control system to obtain relevant information and control the entire workflow.

[0061] The test process can first test the voltage setting function. Specifically, the MCU control system can send a voltage setting command to the power supply system to be tested, with the goal of setting each power supply device in the power supply system to be tested to a preset voltage, wherein the preset voltages of each power supply device can be the same or different. If each power supply device can complete the voltage setting according to the voltage setting command, it can be determined that the voltage setting function of the power supply system to be tested is normal. After sending the voltage setting command, the MCU control system can send a voltage reading command to the power supply system to be tested to read the current voltage of each power supply device, which can specifically be the initial voltage sampling value of each power supply device obtained by the power supply system to be tested by self-sampling. Therefore, it can be determined whether the voltage setting function of the power supply system to be tested is normal based on the initial voltage sampling value and the corresponding preset voltage. It can also be used to determine whether the voltage sampling function of the power supply system to be tested is normal.

[0062] Then, the voltage sampling function and the current sampling function of the power system to be tested can be tested to see whether they are normal in the case of normal working output. Then, the load network can be switched to a large resistance network first, and then the MCU control system sends an output start command to the power system to be tested to control each power supply device to output, to simulate the state of normal working of the power system to be tested. Then, the first voltage and the first current input to the power automation test system can be sampled by the voltage and current sampling module, and transmitted to the MCU control system. The MCU control system can perform AD conversion on the received first voltage and the first current, respectively, and can be converted into the corresponding required voltage and current values. On the other hand, the MCU control system can send a voltage reading command and a current reading command to the power system to be tested to read the test voltage sampling value and the test current sampling value obtained by self-sampling when the simulated power system to be tested is working normally, so that the voltage sampling function and the current sampling function of the power system to be tested can be judged to be normal according to the first voltage and the first current (specifically, the converted voltage and current values), as well as the test voltage sampling value and the test current sampling value.

[0063] Then, we can test whether the load capacity of each power supply device in the power supply system to be tested is normal. We can first switch the load network to a high-power resistor network. At this time, each power supply device maintains the output state. Then, we can sample the second voltage input to the power supply automation test system through the voltage and current sampling module and transmit it to the MCU control system. The MCU control system can perform AD conversion on the received second voltage for subsequent comparison. We can judge whether the load capacity of each power supply device in the power supply system to be tested is normal based on the second voltage and the preset voltage. The preset voltage can be the preset voltage for completing the voltage setting process in the aforementioned steps, and it can also set a new voltage value in the process of carrying out the load capacity test.

[0064] Among them, the sending of a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage includes: sending a first voltage setting command to the power supply system to be tested to set each of the power supply devices to the minimum value of its own voltage range; sending a second voltage setting command to the power supply system to be tested to set each of the power supply devices to the maximum value of its own voltage range; correspondingly, the sending of a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices includes: sending a first voltage reading command to the power supply system to be tested to read back the first voltage sampling value of each of the power supply devices when it is set to the minimum value; sending a second voltage reading command to the power supply system to be tested to read back the second voltage sampling value of each of the power supply devices when it is set to the maximum value.

[0065] Specifically, in the process of testing the voltage setting function of the power supply system to be tested, you can refer to the above instructions to first set each power supply device to the minimum value of its own voltage range, then read back the first voltage sampling value, and judge whether the voltage setting function of the power supply system to be tested is normal, then set each power supply device to the maximum value of its own voltage range and read back the second voltage sampling value. If both results are normal, it can be determined that the voltage setting function of the power supply system to be tested is normal within the full voltage range of each power supply device, and the voltage sampling function can also be temporarily considered normal.

[0066] Optionally, determining whether the function of the power supply system to be tested is normal based on the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes: comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal; comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal; comparing the second voltage with the preset voltage to determine whether the load capacity of the power supply system to be tested is normal.

[0067] Specifically, referring to the above description, the initial voltage sampling value can be compared with the preset voltage. If the error between the two is within the first preset error (such as 0.1V), it is determined that the voltage setting function and the voltage sampling function of the power supply system to be tested are normal. If the error between the two is outside the first preset error, it can be further determined whether the voltage setting function is normal based on the subsequent determination of whether the voltage sampling function is normal. The first current can be compared with the test current sampling value. If the error between the two is within the second preset error (such as 2%), it is determined that the current sampling function of the power supply system to be tested is normal. If the error between the two is outside the second preset error, it is determined that the current sampling function of the power supply system to be tested is abnormal. The second voltage can be compared with the preset voltage. If the error between the two is within the third preset error (such as 0.2V), it is determined that the load capacity of the power supply system to be tested is normal. If the error between the two is outside the third preset error, it is determined that the load capacity of the power supply system to be tested is abnormal.

[0068] Optionally, the large resistor network includes an LED light string for simulating a constant current backlight of a liquid crystal screen; the test voltage sampling value is the voltage on the LED light string obtained by monitoring the power supply system to be tested; after sampling the first voltage and the first current input to the power supply system to be tested, it also includes: determining the sampled voltage on the LED light string based on the first voltage; accordingly, determining whether the power supply system to be tested functions normally based on the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes: comparing the sampled voltage with the test voltage sampling value to determine whether the voltage sampling function of the power supply system to be tested is normal.

[0069] Specifically, a constant current backlight of an LCD screen can be simulated by setting an LED light string in the load network to simulate the state of the power system under test performing normal testing. In the process of testing whether the voltage sampling function of the power system under test is normal, a judgment can be made by comparing the voltage on the LED light string. Specifically, after sampling the first voltage, the sampled voltage on the LED light string can be converted according to the first voltage and the parameters of the load network components. At the same time, the power system under test can use the monitored voltage on the LED light string as the test voltage sampling value, so that the sampled voltage can be compared with the test voltage sampling value. If the error between the two is within a fourth preset error (such as 0.1V), it is determined that the voltage sampling function of the power system under test is normal. If the error between the two is outside the fourth preset error, it is determined that the voltage sampling function of the power system under test is abnormal.

[0070] On the basis of the above technical solution, optionally, before sending a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage, it also includes: sending a communication command to the power supply system to be tested, detecting whether a valid response message is received, and if so, determining that the power supply system to be tested is normally connected.

[0071] Specifically, when the power supply automation test system provided by the present embodiment needs to be used for testing, the system can be powered on and initialized first, and it can be determined whether it has been normally connected to the power supply system to be tested. If it has been normally connected, the subsequent test steps can be started. Specifically, after completing the initialization, communication commands can be continuously sent to the power supply system to be tested to detect whether valid response information can be received. If received, it can be determined that it has been normally connected to the power supply system to be tested. At the same time, a connection flag can be set. After initialization, the connection flag can be set to 0. If it is detected that it is normally connected to the power supply system to be tested, the connection flag can be set to 1, so that the connection flag can be directly used to determine the current connection status later.

[0072] Based on the above technical solution, optionally, the method further includes: detecting the user's start test button input, if input is detected and the system is currently in a non-test state, and the power supply system to be tested is connected normally, then starting the test; detecting the user's stop test button input, if input is detected and the system is currently in a test state, then stopping the test.

[0073] Specifically, the power supply automation test system provided in this embodiment can start to detect the user's key input after power-on, and the key input can include a start test key input and a stop test key input. When a start test key input is detected, if the system is in a non-test state and the power supply system to be tested is normally connected (such as a connection flag is 1), the test can be started, wherein if the system is in a test state, this key input can be ignored, and if the power supply system to be tested is not normally connected, the user can be prompted by an alarm or the like. When the system is in a test state and a stop test key input is detected, the test can be stopped, wherein if the system is in a non-test state, this key input can be ignored. That is, the test system is simple to operate, and after being connected to the power supply system to be tested, only one key operation is required to press the start test key to perform automatic testing. At the same time, a test flag can be set, and the test flag can be set to 0 after initialization to represent that it is currently in a non-test state, and when the test is started, the test flag can be set to 1 to represent that it is currently in a test state, so that the test flag can be directly used to determine the current test state later.

[0074] On the basis of the above technical solution, optionally, the method further includes: if it is detected that the function of the power system to be tested is abnormal, an alarm is issued through a buzzer and / or LCD display until the stop test button input is detected, and the test information is printed through a PC.

[0075] Specifically, the power supply automation test system provided in this embodiment may also include a human-computer interaction module and be connected to the MCU control system, and the human-computer interaction module may specifically include a PC, an LCD display unit, a buzzer, and one or more of the above-mentioned start test button and stop test button. The MCU control system may communicate with the PC to receive instructions and output test status, results, etc., and may also detect key input, control the LCD display unit and the buzzer to prompt different test results in different ways, etc. Specifically, after the user presses the start test button to start the automatic test, if a functional abnormality is detected, a multiple long beep alarm may be issued through the buzzer, and the alarm may be stopped when the user presses the stop test button. If no functional abnormality is detected, the test process may be automatically terminated after one or more test processes are completed, and two short beeps may be used to remind the test to pass. At the same time, if the user presses the start test button and detects that the power supply system to be tested is not connected normally, a long beep alarm may also be issued through the buzzer to distinguish different alarm events. The above-mentioned alarm method through the buzzer can also be respectively alarmed through different display modes of the LCD display unit. After the user presses the stop test button or the test is automatically terminated, the test information may also be printed through the PC. Therefore, the test method provided in this embodiment can present the test results in various intuitive and simple ways. The tester only needs to distinguish different sounds and / or different LCD display methods to judge the quality of the power supply system to be tested. This greatly reduces the quality requirements of the tester. By connecting to a PC, various test information can also be printed, so that maintenance personnel can quickly locate the problem through the test information.

[0076] The technical solution provided in the embodiment of the present invention tests the voltage setting function and voltage sampling function of the power supply system to be tested by setting a preset voltage for the power supply system to be tested and reading back the initial voltage sampling value of each power supply device, and tests the voltage and current sampling function and load capacity of the power supply system to be tested by switching the load network to a large resistance network and a high-power resistance network respectively, and controlling the output of the power supply system to be tested at the same time, thereby realizing automated testing of the power supply system, which not only improves production efficiency, but also improves test reliability, greatly reduces requirements on worker quality, and reduces production costs, and plays a good auxiliary role in R&D personnel checking and analyzing the power supply system.

[0077] Embodiment 2

[0078] Figure 2 This is a schematic diagram of the structure of the automatic testing device for the power system of the LCD screen aging test provided by the second embodiment of the present invention. The device can be implemented by hardware and / or software, and can generally be integrated into a computer device to execute the automatic testing method for the power system of the LCD screen aging test provided by any embodiment of the present invention. Figure 2 As shown, the device comprises:

[0079] A preset voltage setting module 21, used to send a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage;

[0080] An initial voltage sampling value reading module 22 is used to send a voltage reading command to the power system to be tested to read back the initial voltage sampling value of each of the power supply devices;

[0081] A first sampling module 23, used for switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested;

[0082] A test parameter reading module 24 is used to send a voltage reading command and a current reading command to the power system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices;

[0083] A second sampling module 25, used for switching the load network to a high-power resistor network and sampling a second voltage input to the power system to be tested;

[0084] The function detection module 26 is used to determine whether the function of the power supply system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value.

[0085] The technical solution provided in the embodiment of the present invention tests the voltage setting function and voltage sampling function of the power supply system to be tested by setting a preset voltage for the power supply system to be tested and reading back the initial voltage sampling value of each power supply device, and tests the voltage and current sampling function and load capacity of the power supply system to be tested by switching the load network to a large resistance network and a high-power resistance network respectively, and controlling the output of the power supply system to be tested at the same time, thereby realizing automated testing of the power supply system, which not only improves production efficiency, but also improves test reliability, greatly reduces requirements on worker quality, and reduces production costs, and plays a good auxiliary role in R&D personnel checking and analyzing the power supply system.

[0086] On the basis of the above technical solution, optionally, the preset voltage setting module 21 includes:

[0087] A first voltage setting unit, configured to send a first voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to a minimum value within its own voltage range;

[0088] A second voltage setting unit, used for sending a second voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the maximum value of its own voltage range;

[0089] Correspondingly, the initial voltage sampling value reading module 22 includes:

[0090] A first voltage sampling value reading unit, used for sending a first voltage reading command to the power supply system to be tested, so as to read back the first voltage sampling value of each of the power supply devices when the first voltage sampling value is set to the minimum value;

[0091] The second voltage sampling value reading unit is used to send a second voltage reading command to the power supply system to be tested, so as to read back the second voltage sampling value of each of the power supply devices when the second voltage sampling value is set to the maximum value.

[0092] On the basis of the above technical solution, optionally, the function detection module 26 includes:

[0093] A voltage setting function detection unit, used for comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal;

[0094] a current sampling function detection unit, used for comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal;

[0095] The power supply load capacity detection unit is used to compare the second voltage with the preset voltage to determine whether the load capacity of the power supply system to be tested is normal.

[0096] On the basis of the above technical solution, optionally, the large resistance network includes an LED light string for simulating a constant current backlight of a liquid crystal screen; the test voltage sampling value is the voltage on the LED light string obtained by monitoring the power system to be tested; the automatic test device for the power system for a liquid crystal screen aging test further includes:

[0097] A sampling voltage determination module, configured to determine a sampling voltage on the LED light string according to the first voltage after sampling the first voltage and the first current input to the power supply system to be tested;

[0098] Accordingly, the function detection module 26 includes:

[0099] The voltage sampling function detection unit is used to compare the sampled voltage with the test voltage sampling value to determine whether the voltage sampling function of the power supply system to be tested is normal.

[0100] On the basis of the above technical solution, optionally, the automatic test device for the power supply system for LCD screen aging test further includes:

[0101] The system connection detection module is used to send a communication command to the power system to be tested before sending a voltage setting command to the power system to be tested to set each power supply device in the power system to be tested to a preset voltage, and detect whether a valid response message is received. If received, it is determined that the power system to be tested is normally connected.

[0102] On the basis of the above technical solution, optionally, the automatic test device for the power supply system for LCD screen aging test further includes:

[0103] A start test detection module is used to detect the user's start test button input. If input is detected and the current state is not testing, and the power supply system to be tested is connected normally, the test starts;

[0104] The stop test detection module is used to detect the user's stop test button input. If input is detected and the current state is testing, the test is stopped.

[0105] On the basis of the above technical solution, optionally, the automatic test device for the power supply system for LCD screen aging test further includes:

[0106] The alarm prompt module is used to sound an alarm through a buzzer and / or LCD display if an abnormality is detected in the function of the power system to be tested, until the stop test button input is detected, and the test information is printed through the PC.

[0107] The automatic testing device for a power supply system for LCD screen aging test provided in an embodiment of the present invention can execute the automatic testing method for a power supply system for LCD screen aging test provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0108] It is worth noting that in the above-mentioned embodiment of the automatic testing device of the power supply system for LCD screen aging test, the various units and modules included are only divided according to functional logic, but are not limited to the above-mentioned division, as long as the corresponding functions can be achieved; in addition, the specific names of the functional units are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of the present invention.

[0109] Embodiment 3

[0110] Figure 3 The schematic diagram of the structure of the computer device provided for the third embodiment of the present invention shows a block diagram of an exemplary computer device suitable for implementing the implementation mode of the present invention. Figure 3The computer device shown is only an example and should not limit the functions and scope of use of the embodiments of the present invention. Figure 3 As shown, the computer device includes a processor 31, a memory 32, an input device 33 and an output device 34; the number of processors 31 in the computer device can be one or more. Figure 3 Taking a processor 31 as an example, the processor 31, memory 32, input device 33 and output device 34 in the computer device can be connected through a bus or other means. Figure 3 The example of connecting through bus is taken in the following.

[0111] The memory 32, as a computer-readable storage medium, can be used to store software programs, computer executable programs and modules, such as the program instructions / modules corresponding to the automatic test method of the power system for LCD screen aging test in the embodiment of the present invention (for example, the preset voltage setting module 21, the initial voltage sampling value reading module 22, the first sampling module 23, the test parameter reading module 24, the second sampling module 25 and the function detection module 26 in the automatic test device of the power system for LCD screen aging test). The processor 31 executes various functional applications and data processing of the computer device by running the software programs, instructions and modules stored in the memory 32, that is, realizes the above-mentioned automatic test method of the power system for LCD screen aging test.

[0112] The memory 32 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system and at least one application required for a function; the data storage area may store data created according to the use of the computer device, etc. In addition, the memory 32 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some instances, the memory 32 may further include a memory remotely arranged relative to the processor 31, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0113] The input device 33 can be used to receive test status result information, and generate key signal input related to user settings and function control of the computer device, etc. The output device 34 can be used to send commands to the power system to be tested, etc.

[0114] Embodiment 4

[0115] Embodiment 4 of the present invention further provides a storage medium containing computer executable instructions, which, when executed by a computer processor, is used to execute an automatic testing method for a power supply system for a liquid crystal display aging test, the method comprising:

[0116] Sending a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage;

[0117] Sending a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices;

[0118] Switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested;

[0119] Sending a voltage reading command and a current reading command to the power supply system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices;

[0120] Switching the load network to a high-power resistor network, and sampling a second voltage input to the power supply system to be tested;

[0121] Whether the power supply system to be tested functions normally is determined according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value.

[0122] The storage medium may be any of various types of memory devices or storage devices. The term "storage medium" is intended to include: installation media, such as CD-ROM, floppy disk or tape device; computer system memory or random access memory, such as DRAM, DDR RAM, SRAM, EDO RAM, Rambus RAM, etc.; non-volatile memory, such as flash memory, magnetic media (such as hard disk or optical storage); registers or other similar types of memory elements, etc. The storage medium may also include other types of memory or combinations thereof. In addition, the storage medium may be located in the computer system in which the program is executed, or may be located in a different second computer system, which is connected to the computer system via a network (such as the Internet). The second computer system may provide program instructions to the computer for execution. The term "storage medium" may include two or more storage media that may reside in different locations (e.g., in different computer systems connected via a network). The storage medium may store program instructions (e.g., embodied as a computer program) that may be executed by one or more processors.

[0123] Of course, the storage medium containing computer executable instructions provided in an embodiment of the present invention is not limited to the method operations described above, and can also execute related operations in the automatic testing method of the power supply system for LCD screen aging test provided in any embodiment of the present invention.

[0124] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, which carry computer-readable program code. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. Computer-readable signal media may also be any computer-readable medium other than a computer-readable storage medium, which may send, propagate, or transmit a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0125] The program code embodied on the computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

[0126] Through the above description of the implementation methods, the technicians in the relevant field can clearly understand that the present invention can be implemented by means of software and necessary general hardware, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as a computer floppy disk, read-only memory (ROM), random access memory (RAM), flash memory (FLASH), hard disk or optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, server, or network device, etc.) to execute the methods described in each embodiment of the present invention.

[0127] Note that the above are only preferred embodiments of the present invention and the technical principles used. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments, and may include more other equivalent embodiments without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. An automatic testing method for a power supply system for a liquid crystal display aging test, characterized in that: include: Sending a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage; Sending a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices; Switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested; Sending a voltage reading command and a current reading command to the power supply system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices; The test voltage sampling value and the test current sampling value are obtained by self-sampling when simulating the normal operation of the power supply system to be tested; Switching the load network to a high-power resistor network, and sampling a second voltage input to the power supply system to be tested; Determine whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value; The step of sending a voltage setting command to the power system to be tested to set each power supply device in the power system to be tested to a preset voltage includes: Sending a minimum voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the minimum value of its own voltage range; Sending a maximum voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the maximum value of its own voltage range; The determining whether the function of the power supply system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value comprises: Comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal; Comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal; The second voltage is compared with the preset voltage to determine whether the load capacity of the power system to be tested is normal.

2. The automatic testing method for a power supply system for a liquid crystal screen aging test according to claim 1, characterized in that: The step of sending a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices includes: Sending a minimum voltage reading command to the power supply system to be tested, so as to read back the minimum voltage sampling value of each of the power supply devices when the minimum value is set; A maximum voltage reading command is sent to the power supply system to be tested, so as to read back the maximum voltage sampling value of each of the power supply devices when the maximum value is set.

3. The automatic testing method for a power supply system for a liquid crystal screen aging test according to claim 1, characterized in that: The large resistor network includes an LED light string, which is used to simulate the constant current backlight of the liquid crystal screen; the test voltage sampling value is the voltage on the LED light string monitored by the power supply system to be tested; After sampling the first voltage and the first current input to the power supply system to be tested, the method further includes: Determine a sampled voltage on the LED light string according to the first voltage; Correspondingly, determining whether the function of the power system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value includes: The sampled voltage is compared with the test voltage sample value to determine whether the voltage sampling function of the power supply system to be tested is normal.

4. The automatic testing method for a power supply system for a liquid crystal screen aging test according to claim 1, characterized in that: Before sending a voltage setting command to the power system to be tested to set each power supply device in the power system to be tested to a preset voltage, the method further includes: A communication command is sent to the power system to be tested, and whether a valid response message is received is detected. If received, it is determined that the power system to be tested is normally connected.

5. The automatic testing method for a power supply system for a liquid crystal screen aging test according to claim 4 is characterized in that: The method further comprises: Detecting the user's start test button input, if input is detected and the current state is not testing, and the power supply system to be tested is connected normally, then starting the test; Detect the user's stop test button input. If input is detected and the current state is testing, stop the test.

6. The automatic testing method for a power supply system for a liquid crystal screen aging test according to claim 5, characterized in that: The method further comprises: If the function of the power system to be tested is detected to be abnormal, an alarm is given through a buzzer and / or LCD display until the stop test button input is detected, and the test information is printed through the PC.

7. An automatic test device for a power supply system for a liquid crystal display aging test, characterized in that: include: A preset voltage setting module, used to send a voltage setting command to the power system to be tested, so as to set each power supply device in the power system to be tested to a preset voltage; An initial voltage sampling value reading module is used to send a voltage reading command to the power supply system to be tested to read back the initial voltage sampling value of each of the power supply devices; A first sampling module, used for switching the load network to a large resistance network, sending an output start command to the power system to be tested to control each of the power devices to output, and sampling a first voltage and a first current input to the power system to be tested; A test parameter reading module, used for sending a voltage reading command and a current reading command to the power supply system to be tested, so as to read back the test voltage sampling value and the test current sampling value of each of the power supply devices; The test voltage sampling value and the test current sampling value are obtained by self-sampling when simulating the normal operation of the power supply system to be tested; A second sampling module, used for switching the load network to a high-power resistor network and sampling a second voltage inputted by the power supply system to be tested; a function detection module, used for determining whether the function of the power supply system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value; Preset voltage setting module, including: A minimum voltage setting unit, used for sending a minimum voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the minimum value of its own voltage range; A maximum voltage setting unit, used for sending a maximum voltage setting command to the power supply system to be tested, so as to set each of the power supply devices to the maximum value of its own voltage range; Function detection module, including: A voltage setting function detection unit, used for comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal; a current sampling function detection unit, used for comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal; The power supply load capacity detection unit is used to compare the second voltage with the preset voltage to determine whether the load capacity of the power supply system to be tested is normal.

8. A computer device, characterized in that: include: one or more processors; A memory for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the automatic testing method of the power supply system for LCD screen aging test as described in any one of claims 1-6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the automatic testing method of the power supply system for LCD aging test as described in any one of claims 1 to 6 is implemented.

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