A device testing method and apparatus, device, and storage medium

Abstract

Embodiments of the present application disclose a device testing method and device, equipment and a storage medium, wherein the method comprises: determining a first point on a three-dimensional spherical surface of a reference channel model; a power distribution of the first point is greater than a power distribution of a second point, the second point being a point on the three-dimensional spherical surface except the first point; selecting a face on which a circular ring passing through the first point of the three-dimensional spherical surface of the reference channel model is located as a target horizontal plane; and rotating the reference channel model according to the target horizontal plane to obtain a target channel model; and the target channel model is used for performance evaluation of a device under test in a multi-probe darkroom.

Description

Technical Field

[0001] This invention relates to mobile communication technology, and more particularly to a device testing method, apparatus, device, and storage medium. Background Technology

[0002] Traditional wireless terminals typically utilize over-the-air (OTA) performance testing to evaluate wireless transmission and networking performance. This involves establishing a reflection-free free space within an anechoic chamber to assess the overall performance of the wireless terminal's radio frequency (RF) and antennas. In fourth- and fifth-generation mobile communication systems, multiple-input multiple-output (MIMO) antenna technology has been identified as a core technology to improve network spectral efficiency. Since MIMO performance is highly dependent on the channel environment, traditional anechoic chambers are insufficient to meet its requirements. Therefore, for MIMO, the reconstruction of a three-dimensional realistic channel scenario within an anechoic chamber becomes a crucial reference for its theoretical research and implementation. Summary of the Invention

[0003] This invention provides a device testing method, apparatus, device, and storage medium that can improve the simulation effect of three-dimensional channel models.

[0004] The technical solution of this invention is implemented as follows:

[0005] In a first aspect, embodiments of the present invention provide a device testing method, the method comprising:

[0006] A first point is determined on a three-dimensional sphere of the reference channel model; the power distribution of the first point is greater than the power distribution of a second point, and the second point is any point on the three-dimensional sphere other than the first point.

[0007] On the three-dimensional sphere of the reference channel model, the plane containing the ring passing through the first point is selected as the target horizontal plane;

[0008] The reference channel model is rotated according to the target horizontal plane to obtain the target channel model, which is used to evaluate the performance of the device under test in a multi-probe anechoic chamber.

[0009] Secondly, embodiments of the present invention provide a device testing apparatus, the apparatus comprising:

[0010] The first determining unit is used to determine a first point on a three-dimensional sphere of the reference channel model; the power distribution of the first point is greater than the power distribution of a second point, and the second point is a point on the three-dimensional sphere other than the first point;

[0011] The first selection unit is used to select the surface on the three-dimensional sphere of the reference channel model, where the annulus passing through the first point is located, as the target horizontal plane;

[0012] A rotation unit is used to rotate the reference channel model according to the target horizontal plane to obtain a target channel model; the target channel model is used to evaluate the performance of the device under test in a multi-probe anechoic chamber.

[0013] Thirdly, embodiments of the present invention provide a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps in the above-described device testing method.

[0014] Fourthly, embodiments of the present invention provide a storage medium, namely a computer-readable storage medium, on which a computer program is stored, which, when executed by a processor, implements the above-described device testing method.

[0015] The device testing method provided in this embodiment of the invention includes: determining a first point on a three-dimensional sphere of a reference channel model; the power distribution of the first point is greater than the power distribution of a second point, the second point being any point on the three-dimensional sphere other than the first point; selecting a target horizontal plane on the three-dimensional sphere of the reference channel model, with the ring passing through the first point as the target horizontal plane; the target horizontal plane being the horizontal plane of the target channel model after the reference channel model has been rotated; thereby making the space containing important spatial information in the target channel model compatible with the probe in the anechoic chamber, allowing a higher proportion of spatial information to be constructed by the anechoic chamber, improving the simulation effect of the three-dimensional channel model, and further improving the accuracy of the test results of the tested device in OTA performance testing. Attached Figure Description

[0016] Figure 1 This is an optional architecture diagram of the testing system provided in an embodiment of the present invention;

[0017] Figure 2 This is an optional architecture diagram of the testing system provided in an embodiment of the present invention;

[0018] Figure 3 This is an optional effect diagram of the darkroom provided in an embodiment of the present invention;

[0019] Figure 4 This is an optional flowchart illustrating the device testing method provided in an embodiment of the present invention;

[0020] Figure 5 This is an optional flowchart illustrating the device testing method provided in an embodiment of the present invention;

[0021] Figure 6This is an optional flowchart illustrating the device testing method provided in an embodiment of the present invention;

[0022] Figure 7 This is an optional structural schematic diagram of the equipment testing device provided in an embodiment of the present invention;

[0023] Figure 8 This is an optional structural schematic diagram of the electronic device provided in the embodiments of this application. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings. The described embodiments should not be regarded as limitations on the present invention. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0025] The embodiments of the present invention can provide a device testing method and apparatus, a device, and a storage medium. In practical applications, the device testing method can be implemented by a device testing apparatus, and the functional entities in the device testing apparatus can be collaboratively implemented by the hardware resources of a computer device, such as computing resources like processors and communication resources (such as those used to support various communication methods such as optical fiber and cellular).

[0026] Here, we will first introduce the multi-probe anechoic chamber detection involved in the embodiments of this application.

[0027] A channel can be considered a transmission path for signals in a real-world application scenario. A signal transmission path corresponding to a dynamically changing application scenario can be called a three-dimensional dynamic channel. When a signal transmitted by a base station is transmitted through a three-dimensional dynamic channel, the channel performs a series of attenuations and phase changes on the transmitted signal. Different three-dimensional dynamic channels exhibit different attenuations and phase changes, resulting in different signals received by terminal devices in real-world dynamic application scenarios. For example, in a high-speed driving scenario, the attenuation and phase of the transmitted signal are constantly changing, causing terminal devices in high-speed motion to sometimes receive the signal and sometimes not.

[0028] Multi-probe testing is performed in a three-dimensional multi-probe channel environment to evaluate the overall performance of the RF and antenna of the device under test (DUT) located in an anechoic chamber configured with multiple probes.

[0029] Multi-probe testing utilizes an anechoic chamber (AC) with multiple probes to eliminate unwanted reflections of radio waves. Signals from the base station or base station emulator are transmitted through a channel emulator (CE) (also known as a fading emulator) and, after passing through a predefined channel model, are radiated through several dual-polarized antennas (i.e., multiple probes) aligned with the center of the device under test (DUT) to the DUT via spatial radiation. This causes the DUT to experience the required channel fading, and its throughput performance is observed and recorded. In this case, the DUT is the terminal device.

[0030] In practical applications, the DUT can be a BS. In this case, terminal equipment and channel simulators are used to test the BS located in an anechoic chamber.

[0031] The three-dimensional multi-probe environment can contain a preset number of probes, each probe contains a virtual antenna pair, and each probe is equipped with a detection component that simulates a three-dimensional channel.

[0032] Taking the DTU as the UE as an example, a test system for implementing multi-probe testing, such as... Figure 1 As shown, the system includes: a base station 101, a radio channel (RC) emulator 102, and a user equipment (UE) 103, wherein the UE 103 is located in an anechoic chamber 104 configured with multiple probes 141. The base station 101 can be an actual base station or a base station emulator, and the UE 103 can be an actual UE or a UE emulator.

[0033] In practical applications, such as Figure 2 As shown, the test system may also include a control device 105. The control device is used to control the base station 101 and the RC emulator 102 to output the base station's wireless signal to the UE 103 through the probe 141.

[0034] In one example, the control device 105 is a computer device independent of the base station 101 and the RC emulator 102. In one example, the control device 105 is integrated with the base station 101. In one example, the control device 105 is integrated with the RC emulator 102.

[0035] The device testing method provided in this application embodiment is applied to the control device 105 of the testing system.

[0036] In this embodiment of the application, the multi-probe anechoic chamber 104 is as follows: Figure 3As shown, in a three-dimensional multi-probe channel environment, each probe 141 is distributed at a preset position on a spherical model with a three-dimensional ring-shaped probe sequence. The device under test 103 is placed in the central detection area of ​​the spherical model. This allows the probes in the spherical model to serve as transmitting antennas, and the positional relationship between the probes can be used to simulate the actual signal angles of the DUT in different directions and attenuations in the channel model to be constructed.

[0037] The embodiments of this application involve the following three coordinate systems: system coordinate system, channel model coordinate system, and device under test coordinate system.

[0038] The system coordinate system, also known as the global coordinate system, serves as a reference for other coordinate systems. It comprises three mutually perpendicular directions: the x-direction, the y-direction, and the z-direction. The xy-plane formed by the x and y directions corresponds to the horizontal plane, and the positive z-direction points above the horizontal plane. The x, y, and z directions are represented by the x-axis, y-axis, and z-axis, respectively.

[0039] The channel model coordinate system, set with reference to the direction of gravity, includes three mutually perpendicular directions: x, y, and z. The x and y directions are the same as the x and y directions in the system coordinate system, while the positive z direction points towards the sky and the negative z direction points towards the Earth's center. The x, y, and z directions are represented by the x-axis, y-axis, and z-axis, respectively.

[0040] The coordinate system of the device under test (DUT) has its origin at the center of the DUT. The mutually perpendicular x, y, and z directions are determined based on the device's usage habits. In one example, the DUT is a mobile phone. The positive x-direction is the direction perpendicular to the screen and pointing outwards from the screen; the positive z-direction is the direction parallel to the screen and pointing towards the top of the phone; and the y-direction follows the right-hand rule. The x, y, and z directions are represented by the x-axis, y-axis, and z-axis, respectively.

[0041] Of course, the embodiments of the present invention are not limited to providing methods and hardware, and can also be implemented in various ways, such as providing a storage medium (storing instructions for executing the device testing method provided in the embodiments of this application).

[0042] The following describes various embodiments of the device testing method, apparatus, device, and storage medium provided in the embodiments of this application.

[0043] This embodiment provides a device testing method, such as... Figure 4 As shown, the method may include the following steps:

[0044] S401. Determine the first point on the three-dimensional sphere of the reference channel model.

[0045] The reference channel model may include a standardized channel model or a channel model acquired from the existing network. The horizontal plane of the reference channel model, i.e., the horizontal plane of the channel model coordinate system of the reference channel model, coincides with the horizontal plane of the system coordinate system.

[0046] Taking the reference channel model as an example, the standardized channel model is obtained by extending the two-dimensional channel model in the horizontal plane towards the pitch direction, and it has a certain typicality in the distribution of the channel environment in the horizontal plane. Specifically, by compressing the standardized channel model in the pitch direction, a two-dimensional channel model can be obtained. In one example, the standardized channel model is the model defined by standards such as TR 36.873 and TR38.901.

[0047] Taking the reference channel model as an example, the current network acquisition channel model is a channel model formed after data extraction and analysis of the real-world wireless channel environment captured or recorded from the current network by channel acquisition equipment. This current network acquisition channel model has not undergone theoretical abstraction and simplification, its energy distribution may not be concentrated, and it lacks obvious horizontal plane distribution characteristics. However, this type of channel model is closer to actual usage scenarios.

[0048] In this embodiment of the application, no limitation is made on the method of determining the reference channel model.

[0049] After determining the reference channel model, the control device obtains the power distribution function on a three-dimensional sphere in the channel model coordinate system of the reference channel model. Based on the power distribution function, it finds the first power peak point, i.e., the first point A1, where the power distribution at the first point is greater than that at the second point, which is any point on the three-dimensional sphere other than the first point.

[0050] In this embodiment, the power distribution function on the three-dimensional sphere in the channel model coordinate system of the reference channel model is: Where θ is the pitch angle, the angle between the pitch angle and the +z axis in the vertical plane, and φ is the horizontal angle, the angle between the horizontal angle and the +x axis in the horizontal plane. The power value of the first point A1 is... ,and ,in, Let Aj be the power value of any second point Aj in the second point set. The second point Aj is a point on the three-dimensional sphere of the reference channel model other than the first point A1. Here, the reference channel model may include multiple second points Aj, and all the second points constitute the second point set.

[0051] S402. On the three-dimensional sphere of the reference channel model, the plane containing the ring passing through the first point is selected as the target horizontal plane.

[0052] After determining the first point A1, the control device determines an annulus centered on the center of the three-dimensional sphere of the reference channel model and passing through the first point A1. This determined annulus can be called a candidate annulus. Multiple candidate annulus may be determined, and the control device selects one from these candidate annulus as the target annulus, taking the surface containing the target annulus as the target horizontal plane.

[0053] The control device selects the target ring from multiple candidate rings using one of the following methods:

[0054] Selection Method 1: Random Selection;

[0055] Method 2: Select the candidate ring that passes through the second power peak point;

[0056] Method 3: Select the candidate ring with the largest power integral.

[0057] Taking the selection method of selecting the target ring as selection method one as an example, the candidate rings include: C1, C2, C3, ..., C n Then, the numbers C1, C2, C3, ..., C will be randomly selected. n Select one candidate annulus as the target annulus.

[0058] Taking the selection method of choosing the target ring as selection method two as an example, the candidate ring that passes through the second power peak point Ajmax is selected as the target ring. Here, the second power peak point Ajmax is the second point with the maximum power value in the second set of points.

[0059] In one example, the candidate annexes include: C1, C2, C3, ..., C n C3 passes through the second power peak point Ajmax. The power value of the second power peak point Ajmax is the second point with the largest power value in the second point set. Therefore, C3 is taken as the target ring.

[0060] Taking the selection method of selecting the target ring as selection method three as an example, the implementation of S401 includes:

[0061] S4011. On the three-dimensional sphere of the reference channel model, at least two rings passing through the first point ring are determined as candidate rings;

[0062] S4012. Determine the power integral of the reference channel model on the candidate circular ring;

[0063] S4013. The surface containing the candidate ring with the largest power integral is determined as the target horizontal surface.

[0064] For a candidate circular ring Ci, the power integral value on Ci is shown in Equation (1):

[0065] Formula (1);

[0066] Search Maximum power integral ,and ,Will The corresponding candidate ring is determined to be the target ring C. M .

[0067] After determining the target ring, the control device uses the surface of the target ring in the reference channel model as the target horizontal plane.

[0068] S403. Rotate the reference channel model according to the target horizontal plane to obtain the target channel model.

[0069] The target channel model is used to evaluate the performance of the device under test in a multi-probe anechoic chamber.

[0070] After determining the target horizontal plane, the control equipment rotates the reference channel model to obtain the target channel model, so that the target horizontal plane serves as the target channel model's horizontal plane, coinciding with the system coordinate system's horizontal plane. This allows for performance evaluation of the DUT (Device Under Test) using the target channel model. The DUT can be a terminal, a terminal emulator, or a base station emulator.

[0071] As the reference channel model rotates, the channel model coordinate system rotates as well. Before the rotation, the original horizontal plane of the channel model coordinate system is the horizontal plane of the reference channel model. After the rotation, the new horizontal plane of the channel model coordinate system is the target horizontal plane, i.e., the horizontal plane of the target channel model.

[0072] In this embodiment, the target horizontal plane is the horizontal plane of the target channel model, that is, the target horizontal plane is the new horizontal plane of the channel model coordinate system, thereby rotating the channel model coordinate system and the reference channel model so that the target horizontal plane coincides with the horizontal plane of the system coordinate system, that is, the horizontal plane of the target channel model coincides with the horizontal plane of the system coordinate system.

[0073] In this embodiment of the invention, a first point is determined on the three-dimensional sphere of the reference channel model; the power distribution of the first point is greater than the power distribution of a second point, the second point being any point on the three-dimensional sphere other than the first point; a target horizontal plane is selected on the three-dimensional sphere of the reference channel model, with the ring passing through the first point as the target horizontal plane; the reference channel model is rotated according to the target horizontal plane to obtain a target channel model, which is used to evaluate the performance of the device under test in a multi-probe anechoic chamber; thereby adapting the space containing important spatial information in the target channel model to the probes in the anechoic chamber, allowing more useful spatial information of the channel model to be constructed by the probes in the anechoic chamber, i.e., a higher proportion of spatial information is constructed by the anechoic chamber, improving the simulation effect of the three-dimensional channel model, and further improving the accuracy of the DUT test results in OTA performance testing.

[0074] In some embodiments, the implementation of S403 includes the following steps:

[0075] Determine the pitch angle difference between the target horizontal plane and the horizontal plane of the reference channel model; based on the pitch angle difference, rotate the reference channel model so that the target horizontal plane coincides with the horizontal plane of the system coordinate system, thereby obtaining the target channel model.

[0076] The pitch angle difference Δθ between the target horizontal plane and the horizontal plane of the reference channel model is shown in formula (2):

[0077] Formula (2);

[0078] in, Let the target horizontal plane be the elevation angle in the reference channel model. This represents the pitch angle of the horizontal plane of the reference channel model. In one example, when the coordinate system of the reference channel model is used as the reference coordinate system, .

[0079] After determining Δθ, the reference channel model is rotated based on Δθ. When the target horizontal plane coincides with the horizontal plane of the system coordinate system, the target channel model is obtained. Rotating the reference channel model based on Δθ means rotating the reference channel model. When the target horizontal plane is rotated to the horizontal plane of the system coordinate system, the reference channel model at this time is the target channel model.

[0080] In some embodiments, the pitch angle difference is also used to adjust the coordinate system of the device under test.

[0081] While rotating the reference channel model, the coordinate system of the device under test (DUT) is also rotated based on the pitch angle difference. This rotation can be done manually or by configuring the pitch angle difference onto the anechoic chamber turntable where the DUT is placed. The rotation of the turntable causes the DUT to rotate, adjusting its coordinate system to maintain consistency between the X, Y, and Z directions of the DUT's coordinate system and those of the target channel model.

[0082] In some embodiments, after S402, such as Figure 5 As shown, it also includes:

[0083] S404. Find the third point in the set of second points formed by the second point;

[0084] After determining the first point, the control device searches for the point with the strongest power among the points other than the first point on the three-dimensional sphere of the reference channel model, which is the third point A2.

[0085] The power distribution at the third point is greater than that at the fourth point, where the fourth point is any point in the second set excluding the third point; the power value of the third point A2 is... ,and ,in, For point A of the fourth point k The power value, and the third point A2 and the fourth point A k This forms the second set of points.

[0086] In some embodiments, before searching for the third point in the second point set, points located on the target horizontal plane are removed from the second point set. In this case, the third and fourth points are points not on the target horizontal plane.

[0087] In the case that the points located on the target horizontal plane are not deleted from the second set of points, the third point A2 is the second power peak point Ajmax.

[0088] S405. Based on the third point, determine the azimuth angle difference between the target channel model and the reference channel model.

[0089] After the control equipment determines the third point A2, it determines the target meridian located on the reference channel model. The azimuth difference between the azimuth of the reference meridian passing through the third point A2 and the azimuth of the target meridian is taken as the azimuth angle difference. After determining the target meridian, the reference channel model is rotated based on the azimuth angle difference so that the third point A2 is located on the target meridian, thus making the reference meridian coincide with the target meridian, and obtaining the target channel model.

[0090] The target meridian can be determined in one of the following ways:

[0091] Method 1: Use the meridian where the current azimuth of the reference channel model is zero as the target meridian;

[0092] Method 2: The meridian corresponding to the probe in the pitch direction is taken as the target meridian; the probe in this case is called the first probe.

[0093] Method 3: The meridian corresponding to the angle bisector of two adjacent elevation probes is taken as the target meridian; these two probes are called the second probe and the third probe.

[0094] Method 4: Take the meridian corresponding to either of the two adjacent elevation probes as the target meridian; these two probes are called the fourth probe and the fifth probe.

[0095] In practical applications, when the target meridian is determined by any one of methods two to four, the second set of points is filtered based on the target horizontal plane before searching for the third point, and points in the second set that are located on the target horizontal plane are deleted.

[0096] The method for determining the target meridian is Method 1. In this case, the implementation of S404 includes:

[0097] Determine the first azimuth angle corresponding to the third point; and determine the magnitude of the first azimuth angle as the azimuth angle difference.

[0098] Here, the azimuth of the target meridian is 0. Therefore, the azimuth of the reference meridian where the third point is located, i.e., the first azimuth, is the azimuth angle difference.

[0099] Taking any one of determination methods two to four as an example to determine the target meridian, the implementation of S405 includes: comparing the power angle broadening and power angle broadening threshold of the third point; determining the target meridian of the reference channel model based on the comparison result, wherein the azimuth angle of the target meridian on the reference channel model and the azimuth angle of the third point on the reference channel model are the azimuth angle difference.

[0100] When the power angle broadening of the third point is less than or equal to the power angle broadening threshold, the target meridian is the meridian corresponding to the first probe, and the first probe is located in the pitch direction of the reference channel model. In this case, the method for determining the target meridian is determination method two.

[0101] When the power angle broadening at the third point is greater than the power angle broadening threshold, the target meridian is the meridian corresponding to the bisector of the angle between the second and third probes; wherein the power angle broadening at the third point is less than or equal to the angle between the second and third probes, and the second and third probes are located in the elevation direction of the reference channel model. In this case, the method for determining the target meridian is determination method four.

[0102] When the power angle broadening at the third point is greater than the power angle broadening threshold, the target meridian is the meridian corresponding to the fourth probe; wherein, the power angle broadening at the third point is less than the angle between the fourth and fifth probes, and the fifth probe is the probe adjacent to the fourth probe. In this case, the method for determining the target meridian is determination method four.

[0103] In some embodiments, such as Figure 5 As shown, after implementing S404 and S405, the implementation of S403 includes:

[0104] S4031. Rotate the reference model according to the target horizontal plane to obtain the undetermined channel model;

[0105] S4032. Based on the azimuth angle difference, rotate the undetermined channel model in the horizontal direction to obtain the target channel model.

[0106] The azimuth angle difference Δφ between the target channel model and the reference channel model is shown in formula (3):

[0107] Formula (3);

[0108] in, Let be the azimuth angle of the target horizontal plane in the reference channel model. This is the azimuth angle of the horizontal plane of the reference channel model. In one example, when the coordinate system of the reference channel model is used as the reference coordinate system, .

[0109] In this embodiment, given a determined azimuth angle difference, the reference channel model is rotated from both latitude and longitude angles. When adjusting the reference channel model from the latitude angle, the rotation is performed based on the target horizontal plane; the rotated channel model is called the undetermined channel model. Further rotation from the longitude angle yields the target channel model. Specifically, after determining Δφ, the undetermined channel model is rotated based on Δφ to obtain the target channel model. This rotation based on Δφ involves rotating the vertical plane of the reference channel model. The target channel model is obtained when the vertical plane of the undetermined channel model rotates to the point where the reference longitude coincides with the target longitude.

[0110] In some embodiments, the azimuth angle difference is also used to adjust the coordinate system of the device under test.

[0111] While rotating the reference channel model, the device under test (DUT) is also rotated based on the azimuth angle difference. This rotation can be done manually or by configuring the azimuth angle difference onto a turntable in the anechoic chamber where the DUT is placed. The rotation of the turntable causes the DUT to rotate, adjusting its coordinate system to maintain consistency between the X, Y, and Z directions of the DUT's coordinate system and those of the target channel model.

[0112] The following description uses the DUT as an example to further illustrate the device testing method provided in the embodiments of this application.

[0113] In existing multi-probe anechoic chambers, a large proportion (more than 50%) of the probes are arranged on a horizontal circular ring. When constructing a three-dimensional multi-probe channel environment, this results in the severe loss of important energy branches existing on the non-horizontal plane, low channel fidelity, and thus significantly reduces the value of three-dimensional testing.

[0114] To compensate for incoming waves distributed on non-horizontal planes, the number of test probes in the upper and lower hemispheres can be increased. However, this approach comes at three costs: first, it significantly increases calibration complexity and workload; second, it greatly increases mutual interference between probes, thereby reducing the accuracy of the channel model and even making the channel environment unusable; and third, the surge in back-end channel simulation channels brought about by more probes affects the stability and cost of the entire test system.

[0115] In this embodiment, a three-dimensional channel model is constructed by adding a small number of non-horizontal probes to the horizontal probe to achieve a more efficient channel reconstruction effect.

[0116] In this embodiment, the three-dimensional channel model and the terminal under test are processed collaboratively to improve the fidelity of the three-dimensional channel model. Here, the power distribution function of the reference three-dimensional channel model on a three-dimensional sphere in the channel model coordinate system is... , where θ is the pitch angle and φ is the horizontal angle.

[0117] like Figure 6 As shown, the processing of the three-dimensional channel model includes:

[0118] S601. Select the strongest power point A1 based on the reference three-dimensional model;

[0119] In the three-dimensional sphere of the reference three-dimensional channel model, select point A1, which has the strongest power distribution. The power value corresponding to point A1 is... ;

[0120] S602. Determine candidate horizontal rings based on the strongest power point A1.

[0121] Using the center of the three-dimensional sphere of the reference channel model as the center, we will define all the annexes passing through the point of strongest power A1: C1, C2, C3, ..., C n This refers to the candidate level ring.

[0122] S603. Determine the power integral value of each candidate horizontal loop.

[0123] Along C1, C2, C3, ..., C n Each ring integrates the reference channel model to obtain the power integral value on each ring.

[0124] The power integral value on the annulus Ci is shown in formula (1):

[0125] Formula (1);

[0126] S604. Find the largest power integral value among the power integral values.

[0127] Here, search Maximum power integral ,and .

[0128] S605. The candidate horizontal ring with the largest power integral value is determined as the target ring.

[0129] Will The corresponding candidate ring is determined to be the target ring C. M and C M The plane in question serves as the new horizontal plane of the channel model coordinate system. Here, in determining C... M Then, the reference channel model can be rotated so that C M The plane in question is the horizontal plane of the target channel model, which coincides with the horizontal plane of the system coordinate system. The rotated reference channel model is the target channel model, and the horizontal plane of the target channel model coincides with the horizontal plane of the system coordinate system.

[0130] S606. Select the secondary power point A2 based on the reference three-dimensional model;

[0131] In the region outside the target ring on the three-dimensional sphere of the reference channel model, select point A2, which has the strongest power distribution within the searched region. The power value corresponding to point A2 is... .

[0132] S607. Point A2 is taken as the upper hemisphere region of the system coordinate system, and point A2 is placed on the meridian with φ = 0 in the system coordinate system. Here, after rotating the target channel model according to the target horizontal plane, the target channel model is further rotated in the horizontal direction so that the meridian where A2 is located coincides with the meridian with φ = 0 in the system coordinate system. That is, the meridian where A2 is located is taken as the meridian with φ = 0 of the target channel model.

[0133] Here, the horizontal plane and meridian of the target channel model are determined by S601 to S607, thereby realizing the rotation from the reference channel model to the target channel model.

[0134] In some embodiments, S607 may also be implemented as the following process:

[0135] When the power value information at point A2 is small, i.e., the power angle spread (PAS) at point A2 is small, point A2 is placed on the meridian corresponding to the probe in a certain pitch direction.

[0136] At this point, A2 is an important information point with strong energy. Meanwhile, in the reference channel model, the energy of point A2 is only distributed within a very small angular range centered on A2. If there is an anechoic chamber probe on the meridian where A2 is located, the constructed target channel model will clearly express the orientation of point A2.

[0137] When the power value information at the protruding point A2, i.e., the power angle spread (PAS) at point A2 is large, the following two cases are handled based on the PAS of point A2:

[0138] Case 1: When the PAS of point A2 is less than or equal to the angle between two adjacent test probes in the upper hemisphere (excluding the horizontal plane), then point A2 is placed on the meridian corresponding to the bisector of the angle between the two adjacent pitch directions.

[0139] Case 2: When the PAS of point A2 is greater than the angle between two adjacent test probes in the upper hemisphere (excluding the horizontal plane), then point A2 should be placed on the meridian corresponding to one of the two adjacent pitch probes.

[0140] At this time, when the energy distribution at point A2 is within a wide azimuth angle range, that is, the power angle is broadened considerably, the spatial information of point A2 is constructed by multiple probes on a non-horizontal plane, so that the focus of the target channel model is the PAS information, that is, the terminal under test does not see the incoming wave in the single direction of A2, but can receive energy in a wide angular range nearby.

[0141] The processing of the terminal under test includes:

[0142] Based on the rotation from the reference channel model to the target channel model, the terminal under test is rotated accordingly so that the x-axis, y-axis, and z-axis of the terminal under test correspond to the x-axis, y-axis, and z-axis of the target channel model's coordinate system. This ensures that the relative position of the terminal under test and the channel environment matches even when the channel model is rotated.

[0143] In this embodiment of the application, the testing system may have the capability of a three-dimensional turntable, thereby automatically performing three-dimensional positioning of the attitude of the terminal under test.

[0144] In the embodiments of this application, the method of constructing a channel environment with higher fidelity in a 3D all-wave OTA anechoic chamber by virtually rotating the reference channel model in space can accurately express and reconstruct the main energy information in the channel model.

[0145] In this embodiment, the method for constructing a 3D spatial channel model in a 3D all-wave OTA anechoic chamber achieves a more efficient channel reconstruction effect under the commonly used distribution layout of horizontal probes plus a small number of non-horizontal probes. The 3D channel model construction provided in this embodiment not only allows existing multi-probe anechoic chambers to construct a spatial channel environment with higher fidelity without or with only minor hardware modifications, but also does not increase the system's calibration workload or add uncertainties. Furthermore, because the main energy distribution in the channel environment of Virtual Drive Test (VDT) is commonly found to be non-horizontal, the 3D channel construction method proposed in this embodiment demonstrates a more significant improvement in channel reconstruction accuracy when applied to virtual drive test scenarios.

[0146] Figure 7 This is a schematic diagram illustrating the implementation structure of a device testing apparatus according to an embodiment of this application, as shown below. Figure 7 As shown, the device 700 includes:

[0147] The first determining unit 701 is used to determine a first point on the three-dimensional sphere of the reference channel model; the power distribution of the first point is greater than the power distribution of a second point, and the second point is a point on the three-dimensional sphere other than the first point;

[0148] The first selection unit 702 is used to select the surface on the three-dimensional sphere of the reference channel model, where the ring passing through the first point is located, as the target horizontal plane;

[0149] The rotation unit 703 is used to rotate the reference channel model according to the target horizontal plane to obtain the target channel model, which is used to evaluate the performance of the device under test in the multi-probe anechoic chamber.

[0150] In some embodiments, the first selection unit is further configured to:

[0151] On the three-dimensional sphere of the reference channel model, at least two rings passing through the first point are identified as candidate rings;

[0152] Determine the power integral of the reference channel model on the candidate ring;

[0153] The plane containing the candidate ring with the largest power integral is determined as the target horizontal plane.

[0154] In some embodiments, the rotating unit 703 is further configured to:

[0155] Determine the pitch angle difference between the target horizontal plane and the horizontal plane of the reference channel model;

[0156] Based on the pitch angle difference, the reference channel model is rotated so that the target horizontal plane coincides with the horizontal plane of the system coordinate system, thus obtaining the target channel model.

[0157] In some embodiments, the pitch angle difference is used to adjust the coordinate system of the device under test.

[0158] In some embodiments, the device 700 further includes:

[0159] The second determining unit is used to find a third point among the second points; the power distribution of the third point is greater than the power distribution of the fourth point, and the fourth point is a point among the second points other than the third point;

[0160] The second selection unit is used to determine the azimuth angle difference between the target channel model and the reference channel model based on the third point.

[0161] In some embodiments, the second selection unit is further used for

[0162] Determine the first azimuth angle corresponding to the third point;

[0163] The magnitude of the first azimuth angle is determined as the pitch angle difference.

[0164] In some embodiments, the second selection unit is further configured to:

[0165] The comparison results between the power angle broadening and the power angle broadening threshold of the third point;

[0166] Based on the comparison results, the target meridian of the reference channel model is determined, and the azimuth angle of the target meridian on the reference channel model and the azimuth angle of the third point on the reference channel model are the azimuth angle difference.

[0167] In some embodiments, the second selection unit is further configured to:

[0168] When the power angle broadening of the third point is less than or equal to the power angle broadening threshold, the target meridian is the meridian corresponding to the first probe, and the first probe is located in the pitch direction of the reference channel model.

[0169] In some embodiments, the second selection unit is further configured to:

[0170] When the power angle broadening at the third point is greater than the power angle broadening threshold, the target meridian is the meridian corresponding to the bisector of the angle between the second probe and the third probe; wherein the power angle broadening at the third point is less than or equal to the angle between the second probe and the third probe, and the second probe and the third probe are located in the pitch direction of the reference channel model.

[0171] In some embodiments, the second selection unit is further configured to:

[0172] When the power angle broadening at the third point is greater than the power angle broadening threshold, the target meridian is the meridian corresponding to the fourth probe; wherein, the power angle broadening at the third point is less than the angle between the fourth probe and the fifth probe, and the fifth probe is the probe adjacent to the fourth probe.

[0173] In some embodiments, the rotating unit 703 is further configured to:

[0174] Based on the target horizontal plane, the reference model is rotated to obtain the undetermined channel model.

[0175] Based on the azimuth angle difference, the undetermined channel model is rotated in the horizontal direction to obtain the target channel model.

[0176] In some embodiments, the azimuth angle difference is used to adjust the coordinate system of the device under test.

[0177] It should be noted that the device testing apparatus provided in this application embodiment includes all the units included, which can be implemented by a processor in an electronic device; of course, it can also be implemented by specific logic circuits; in the implementation process, the processor can be a central processing unit (CPU), a microprocessor (MPU), a digital signal processor (DSP), or a field-programmable gate array (FPGA), etc.

[0178] The descriptions of the above device embodiments are similar to those of the above method embodiments, and have similar beneficial effects. For technical details not disclosed in the device embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0179] It should be noted that, in the embodiments of this application, if the above-described device testing method is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiments of this application, or the part that contributes to the related technology, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), magnetic disks, or optical disks. Thus, the embodiments of this application are not limited to any specific hardware and software combination.

[0180] Correspondingly, embodiments of this application provide an electronic device, including a memory and a processor. The memory stores a computer program that can run on the processor. When the processor executes the program, it implements the steps in the device testing method provided in the above embodiments.

[0181] Correspondingly, embodiments of this application provide a storage medium, namely a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it implements the steps in the device testing method provided in the above embodiments.

[0182] It should be noted that the descriptions of the storage medium and device embodiments above are similar to those of the method embodiments above, and have similar beneficial effects. For technical details not disclosed in the storage medium and device embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0183] It should be noted that, Figure 8 This is a schematic diagram of a hardware entity of an electronic device according to an embodiment of this application, such as... Figure 8 As shown, the electronic device 800 includes: a processor 801, at least one communication bus 802, at least one external communication interface 804, and a memory 805. The communication bus 802 is configured to enable communication between these components. In one example, the electronic device 800 further includes: a user interface 803, wherein the user interface 803 may include a display screen, and the external communication interface 804 may include standard wired and wireless interfaces.

[0184] The memory 805 is configured to store instructions and applications executable by the processor 801, and can also cache data to be processed or already processed by the processor 801 and various modules in the electronic device (e.g., image data, audio data, voice communication data and video communication data), which can be implemented by flash memory or random access memory (RAM).

[0185] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of this application. Therefore, "in one embodiment" or "in some embodiments" appearing throughout the specification do not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of this application, the sequence numbers of the above-described processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application. The sequence numbers of the above-described embodiments are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0186] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0187] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0188] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0189] In addition, each functional unit in the various embodiments of this application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0190] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0191] Alternatively, if the integrated units described above are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this application, or the parts that contribute to related technologies, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0192] The above description is merely an embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A device testing method, characterized by, The method includes: A first point is determined on a three-dimensional sphere of the reference channel model; the power distribution of the first point is greater than the power distribution of a second point, and the second point is any point on the three-dimensional sphere other than the first point. On the three-dimensional sphere of the reference channel model, the plane containing the ring passing through the first point is selected as the target horizontal plane; Based on the target horizontal plane, the reference channel model is rotated to obtain the target channel model, such that the target horizontal plane serves as the horizontal plane of the target channel model and coincides with the horizontal plane of the system coordinate system; the target channel model is used to evaluate the performance of the device under test in a multi-probe anechoic chamber.

2. The method of claim 1, wherein, The step of selecting the target horizontal plane on the three-dimensional sphere of the reference channel model, where the annulus passing through the first point is located, includes: On the three-dimensional sphere of the reference channel model, at least two rings passing through the first point are identified as candidate rings; Determine the power integral of the reference channel model on the candidate ring; The plane containing the candidate ring with the largest power integral is determined as the target horizontal plane.

3. The method of claim 1, wherein, The step of rotating the reference channel model according to the target horizontal plane to obtain the target channel model includes: Determine the pitch angle difference between the target horizontal plane and the horizontal plane of the reference channel model; Based on the pitch angle difference, the reference channel model is rotated so that the target horizontal plane coincides with the horizontal plane of the system coordinate system, thus obtaining the target channel model.

4. The method of claim 3, wherein, The pitch angle difference is used to adjust the coordinate system of the device under test.

5. The method of claim 1, wherein, The method further includes: Find the third point in the second set of points formed by the second point; the power distribution of the third point is greater than the power distribution of the fourth point, and the fourth point is any point in the second set of points other than the third point. Based on the third point, the azimuth angle difference between the target channel model and the reference channel model is determined.

6. The method of claim 5, wherein, Determining the azimuth angle difference between the target channel model and the reference channel model based on the third point includes: Determine the first azimuth angle corresponding to the third point; The magnitude of the first azimuth angle is defined as the azimuth angle difference.

7. The method of claim 5, wherein, Determining the azimuth angle difference between the target channel model and the reference channel model based on the third point includes: The comparison results between the power angle broadening and the power angle broadening threshold of the third point; Based on the comparison results, the target meridian of the reference channel model is determined, and the azimuth angle of the target meridian on the reference channel model and the azimuth angle of the third point on the reference channel model are the azimuth angle difference.

8. The method of claim 7, wherein, Determining the target meridian of the target channel model based on the comparison result includes: When the power angle broadening of the third point is less than or equal to the power angle broadening threshold, the target meridian is the meridian corresponding to the first probe, and the first probe is located in the pitch direction of the reference channel model.

9. The method of claim 7, wherein, Determining the target meridian of the target channel model based on the comparison result includes: When the power angle broadening at the third point is greater than the power angle broadening threshold, the target meridian is the meridian corresponding to the bisector of the angle between the second probe and the third probe; wherein the power angle broadening at the third point is less than or equal to the angle between the second probe and the third probe, and the second probe and the third probe are located in the pitch direction of the reference channel model.

10. The method of claim 7, wherein, Determining the target meridian of the target channel model based on the comparison result includes: When the power angle broadening at the third point is greater than the power angle broadening threshold, the target meridian is the meridian corresponding to the fourth probe; wherein, the power angle broadening at the third point is less than the angle between the fourth probe and the fifth probe, and the fifth probe is the probe adjacent to the fourth probe.

11. The method of claim 5, wherein, The step of rotating the reference channel model according to the target horizontal plane to obtain the target channel model includes: Based on the target horizontal plane, the reference channel model is rotated to obtain the undetermined channel model; Based on the azimuth angle difference, the undetermined channel model is rotated in the horizontal direction to obtain the target channel model.

12. The method of claim 5, wherein, The azimuth angle difference is used to adjust the coordinate system of the device under test.

13. An apparatus testing device, characterized by The device includes: The first determining unit is used to determine a first point on a three-dimensional sphere of the reference channel model; the power distribution of the first point is greater than the power distribution of a second point, and the second point is a point on the three-dimensional sphere other than the first point; The first selection unit is used to select the surface on the three-dimensional sphere of the reference channel model, where the annulus passing through the first point is located, as the target horizontal plane; A rotation unit is used to rotate the reference channel model according to the target horizontal plane to obtain the target channel model, such that the target horizontal plane serves as the horizontal plane of the target channel model and coincides with the horizontal plane of the system coordinate system; the target channel model is used to evaluate the performance of the device under test in a multi-probe anechoic chamber.

14. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps in the device testing method according to any one of claims 1 to 12.

15. A storage medium storing an executable program, characterized by When the executable program is executed by the processor, it implements the device testing method according to any one of claims 1 to 12.

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