A method, device and electronic equipment for multi-cavity testing

Abstract

The present invention discloses a method, device and electronic equipment for multi-mode cavity testing, which belongs to the field of SFR testing technology, including calculating the full field of view value according to the test distance of the product and the field of view angle of the product; calculating the size value of the rectangular diagram according to the chip output ratio and the full field of view value; drawing the rectangular diagram according to the size value of the rectangular diagram, drawing a black block at the center of the rectangular diagram, and rotating the black block by 8°; drawing the black block corresponding to each field of view test on the diagonal of the rectangular diagram, and rotating the black block by 8° to produce a single-mode spatial frequency response test control diagram; according to the spacing between the multi-mode fixture cavities, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram. The present invention achieves the technical effect of improving the test efficiency and meeting the simultaneous test of multi-mode cavities.

Description

Technical Field

[0001] The present invention belongs to the technical field of SFR testing, and in particular relates to a method, a device and an electronic device for multi-cavity testing. Background Art

[0002] SFR test is a common test method for camera resolution. When performing SFR test, the camera to be tested is photographed on the SFR test card to obtain an SFR test image. The SFR test card has multiple black blocks. The SFR test software calculates the edge resolution of the black blocks in the SFR test image to obtain the resolution of the camera to be tested.

[0003] At present, in the existing SFR test technology, it is usually necessary to align the product optical center with the central black block of the X_chart during the SFR test process. However, due to the physical offset between the cavities on the multi-cavity test machine, one X_chart cannot take into account all the test cavities, forcing the SFR test to use only single-cavity operations or use a more complex chessboard chart, which greatly reduces the test efficiency.

[0004] In summary, the existing SFR testing technology has the technical problems of low testing efficiency and inability to meet the requirements of simultaneous testing of multiple cavities. Summary of the invention

[0005] The technical problem to be solved by the present invention is that the testing efficiency is low and the technical problem of being unable to meet the requirements of simultaneous testing of multiple cavities is solved.

[0006] In order to solve the above technical problems, the present invention provides a method for multi-cavity testing, the method comprising: calculating the full field of view value according to the test distance of the product and the field of view angle of the product; calculating the size value of the rectangular diagram according to the chip output ratio and the full field of view value; drawing a rectangular diagram according to the size value of the rectangular diagram, drawing a black block at the center of the rectangular diagram, and rotating the black block by 8°; drawing a black block corresponding to each field of view test on the diagonal of the rectangular diagram, and rotating the black block by 8° to produce a single-mode spatial frequency response test control chart; according to the spacing between the cavities of a multi-mode fixture, the black blocks in the single-mode spatial frequency response test control chart are all translated and copied, and the translated and copied black blocks are merged on the same drawing to produce a multi-mode spatial frequency response test control chart.

[0007] Furthermore, the full field of view value calculated based on the test distance of the product and the field of view angle of the product includes: the test distance of the product is 400 mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

[0008] Furthermore, the size value of the rectangular image is calculated based on the chip output ratio and the full field of view value, including: the chip output ratio is 4:3, the size value includes a long side value and a short side value, the long side value is equal to the full field of view value * 0.8, and the short side value is equal to the full field of view value * 0.6.

[0009] Furthermore, drawing a black block at the center of the rectangular diagram includes: drawing a central black block at the center of the rectangular diagram with a size of 200 pixels, and the side length of the black block is 35 mm.

[0010] Furthermore, the step of performing translational copying on all black blocks in the single-mode spatial frequency response test control diagram includes: copying the black blocks, and translating the copied black blocks at a distance of 50 mm.

[0011] According to another aspect of the present invention, the present invention also provides a device for multi-mode cavity testing, the device comprising: a full field of view value calculation module, used to calculate the full field of view value according to the test distance of the product and the field of view angle of the product; a rectangular diagram calculation module, used to calculate the size value of the rectangular diagram according to the chip output ratio and the full field of view value; a black block production module, used to draw a rectangular diagram according to the size value of the rectangular diagram, draw a black block at the center of the rectangular diagram, and rotate the black block by 8°; a single-mode spatial frequency response test control diagram production module, used to draw a black block corresponding to each field of view test on the diagonal of the rectangular diagram, and rotate the black block by 8° to produce a single-mode spatial frequency response test control diagram; a multi-mode spatial frequency response test control diagram production module, used to translate and copy the black blocks in the single-mode spatial frequency response test control diagram according to the spacing between the multi-mode fixture cavities, and merge the translated and copied black blocks into the same drawing to produce a multi-mode spatial frequency response test control diagram.

[0012] According to another aspect of the present invention, the present invention also provides an electronic device for multi-mode cavity testing, including a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the following steps when executing the program: calculating a full field of view value based on a test distance of a product and a field of view angle of the product; calculating a size value of a rectangular diagram based on a chip output ratio and the full field of view value; drawing a rectangular diagram based on the size value of the rectangular diagram, drawing a black block at the center of the rectangular diagram, and rotating the black block by 8°; drawing a black block corresponding to each field of view test on the diagonal of the rectangular diagram, and rotating the black block by 8° to produce a single-mode spatial frequency response test control diagram; performing a translational copy of the black blocks in the single-mode spatial frequency response test control diagram based on the spacing between the cavities of a multi-mode fixture, and merging the translated and copied black blocks on the same drawing to produce a multi-mode spatial frequency response test control diagram.

[0013] Furthermore, when the processor executes the program, the following steps are also implemented: the full field of view value is calculated based on the test distance of the product and the field of view angle of the product, including: the test distance of the product is 400 mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

[0014] According to another aspect of the present invention, the present invention also provides a computer-readable storage medium for multi-cavity testing, on which a computer program is stored, and when the program is executed by a processor, the following steps are implemented: calculating the full field of view value based on the test distance of the product and the field of view angle of the product; calculating the size value of the rectangular diagram based on the chip output ratio and the full field of view value; drawing a rectangular diagram based on the size value of the rectangular diagram, drawing a black block in the center of the rectangular diagram, and rotating the black block by 8°; drawing black blocks corresponding to the test of each field of view on the diagonal of the rectangular diagram, and rotating the black blocks by 8° to produce a single-mode spatial frequency response test control chart; according to the spacing between the cavities of a multi-mode fixture, the black blocks in the single-mode spatial frequency response test control chart are all translated and copied, and the translated and copied black blocks are merged on the same drawing to produce a multi-mode spatial frequency response test control chart.

[0015] Furthermore, when the program is executed by the processor, the following steps are also implemented: the full field of view value is calculated based on the test distance of the product and the field of view angle of the product, including: the test distance of the product is 400mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

[0016] Beneficial effects:

[0017] The present invention provides a method for multi-mode cavity testing, which calculates the full field of view value according to the test distance of the product and the field of view angle of the product; calculates the size value of the rectangular diagram according to the chip output ratio and the full field of view value; draws the rectangular diagram according to the size value of the rectangular diagram, draws a black block at the center of the rectangular diagram, and rotates the black block by 8°; draws the black block corresponding to each field of view test on the diagonal of the rectangular diagram, and rotates the black block by 8° to produce a single-mode spatial frequency response test control diagram; according to the spacing between the multi-mode fixture cavity, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram. In this way, when using a dual-mode fixture, the left module center is aligned with the center of the black block on the left side of the center, and the corresponding SFR field of view captures the field of view corresponding to the black block, and the right module center is aligned with the center of the red block on the right side of the center, and the corresponding SFR field of view captures the field of view corresponding to the red block, so that dual-mode simultaneous testing can be achieved. Then the test efficiency is improved, and the simultaneous testing of multiple cavities can be satisfied. Thus, the technical effect of improving the test efficiency and satisfying the simultaneous testing of multiple cavities is achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 A flow chart of a method for multi-cavity testing provided by an embodiment of the present invention;

[0020] Figure 2 A structural block diagram of a device for multi-cavity testing provided by an embodiment of the present invention;

[0021] Figure 3 A structural diagram of an electronic device for multi-cavity testing provided by an embodiment of the present invention;

[0022] Figure 4 A computer-readable storage medium for multi-cavity testing provided by an embodiment of the present invention;

[0023] Figure 5 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 1 ;

[0024] Figure 6 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 2;

[0025] Figure 7 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 3 ;

[0026] Figure 8 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 4 ;

[0027] Fig. 9 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 5 . DETAILED DESCRIPTION

[0028] The present invention discloses a method for multi-cavity testing, which calculates the full field of view value according to the test distance of the product and the field of view angle of the product; calculates the rectangular shape according to the chip output ratio and the full field of view value; Figure 1 The size value of the rectangle Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center of the rectangle and rotate the black block 8°; Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block 8° to produce a single-mode spatial frequency response test control chart; according to the spacing between the mold cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control chart are translated and copied, and the translated and copied black blocks are merged on the same drawing to produce a multi-mode spatial frequency response test control chart. In this way, when using a dual-mode fixture, the center of the left module is aligned with the center of the black block on the left, and the corresponding SFR field of view captures the field of view corresponding to the black block, and the center of the right module is aligned with the center of the red block on the right, and the corresponding SFR field of view captures the field of view corresponding to the red block, so that dual-mode simultaneous testing can be achieved. Then, the efficiency of the test is improved, and the simultaneous testing of multiple mode cavities can be met. Thereby achieving the technical effect of improving the efficiency of the test and meeting the simultaneous testing of multiple mode cavities.

[0029] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention belong to the scope of protection of the present invention; the "and / or" keyword involved in this implementation represents both and, or. In other words, A and / or B mentioned in the embodiments of the present invention represent both A and B, and A or B, and describe the three states of A and B. For example, A and / or B means: only A is included but not B; only B is included but not A; both A and B are included.

[0030] It should be understood that although the terms "first", "second", etc. can be used here to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Therefore, without departing from the teachings of the exemplary embodiments, the first element, component, region, layer or section discussed below can be referred to as the second element, component, region, layer or section. Spatially related terms such as "below", "above", etc. can be used here to facilitate the description of the relationship between one element or feature and another element or feature. It is understood that in addition to the orientation shown in the figure, spatially relative terms also include different orientations of the device in use or operation. For example, if the device in the figure is turned over, the element or feature described as "below" will be oriented as "above" other elements or features. Therefore, the exemplary term "below" can include both above and below orientations. The device can be oriented (rotated 90 degrees or in other orientations), and the spatially related descriptors used here are interpreted accordingly.

[0031] At the same time, in the embodiments of the present invention, when a component is referred to as being "fixed to" another component, it may be directly on the other component or there may also be a centered component. When a component is considered to be "connected to" another component, it may be directly connected to the other component or there may also be a centered component. When a component is considered to be "set on" another component, it may be directly set on the other component or there may also be a centered component. The terms "vertical", "horizontal", "left", "right" and similar expressions used in the embodiments of the present invention are for illustrative purposes only and are not intended to limit the present invention.

[0032] Embodiment 1

[0033] See also Figure 1 , Figure 5 , Figure 6 , Figure 7 , Figure 8 and Fig. 9 , Figure 1 It is a flow chart of a method for multi-cavity testing provided by an embodiment of the present invention. Figure 5 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 1 ; Figure 6 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 2 ; Figure 7 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 3 ; Figure 8 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 4 ; Fig. 9 Schematic diagram of a rectangular diagram in a method for multi-cavity testing provided by an embodiment of the present invention Figure 5 The embodiment of the present invention provides a method for multi-cavity testing, comprising the following steps:

[0034] Step S100, calculating the full field of view value based on the test distance of the product and the field of view angle of the product; the full field of view value calculated based on the test distance of the product and the field of view angle of the product includes: the test distance of the product is 400 mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

[0035] Specifically, the spatial frequency response test control chart may refer to an SFR X_chart. For the SFRX_chart corresponding to the dual-mode fixture, the 13MA product model may be taken as an example. The module SFR test distance is 400mm, the product FOV is 78.2°, the chip output ratio is 4:3, the pixel size is 1.75um, the test field of view is 0F, 0.5F, 0.8F, and the distance between the centers of the two cavities of the dual-mode fixture is 50mm. The multi-mode spatial frequency response test control chart may include a dual-mode SFR X_chart. In the process of making a dual-mode SFR X_chart, a single-mode SFR X_chart must be made first. Based on the product test distance and product FOV, the size of the product's full field of view at the SFR test distance can be calculated (i.e., the maximum range that the module can capture at a distance of 400mm). The formula for calculating the full field of view value is: tan(FOV / 2)*400*2.

[0036] Step S110, calculating the size value of the rectangular image according to the chip image output ratio and the full field of view value; the size value of the rectangular image calculated according to the chip image output ratio and the full field of view value includes: the chip image output ratio is 4:3, the size value includes a long side value and a short side value, the long side value is equal to the full field of view value*0.8, and the short side value is equal to the full field of view value*0.6.

[0037] Specifically, after the full field of view value is calculated in step S100, Figure 5 As shown, taking the 13MA product as an example, the chart size is tan(78.2 / 2)*400*2=650mm, and the X_chart frame (i.e., rectangle) is drawn in the field of view at a ratio of 4:3. Figure 1 ), the long side of the rectangle is 650*0.8=520mm, and the short side of the rectangle is 650*0.6=390mm.

[0038] Step S120, draw a rectangular diagram according to the size value of the rectangular diagram, draw a black block in the center of the rectangular diagram, and rotate the black block by 8°; Figure 1 Draw a black block in the center of the rectangle: Figure 1 A central black block is drawn in the center with a size of 200 pixels, and the side length of the black block is 35 mm.

[0039] Specifically, in the above step S110, the rectangle Figure 1 After the size value is obtained, the center black block can be drawn according to the general requirements of the SFR test. For example, the center black block size is drawn in the center with a size of 200 pixels, the side length is 200*0.00175=35mm, and the black block is rotated 8°.

[0040] Step S130, drawing a black block corresponding to each field of view on the diagonal line of the rectangular diagram, and rotating the black block by 8° to produce a single-mode spatial frequency response test control diagram;

[0041] Specifically, in the above steps S100, S110 and S120, in the rectangular Figure 1 After drawing a black block in the center, you can draw a black block corresponding to each field of view on the diagonal of the rectangle according to the field of view to be tested, and rotate the black block corresponding to each field of view accordingly, such as rotating the black block on the right side of the chart clockwise and the black block on the left side counterclockwise. Four black blocks need to be drawn in each field of view except the center. If there are special requirements for the number of black blocks, draw them according to the requirements. After the black blocks are drawn, you can delete the extra lines, such as Figure 6 and Figure 7, the single-mode SFR X_chart is now drawn. The size of the black block in the field of view is the same as the center, which can be 35mm*35mm, and the rotation angle of the black block is 8°.

[0042] Step S140, according to the spacing between the multi-mode fixture cavities, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram. The translation and copying of the black blocks in the single-mode spatial frequency response test control diagram includes: copying the black blocks, and translating the copied black blocks according to a distance of 50 mm.

[0043] Specifically, after completing the production of the single-mode spatial frequency response test control chart through the above steps S100, S110, S120 and S130, all the black blocks in the field of view can be translated and copied according to the spacing between the mold cavities of the dual-mode fixture, and the black blocks are merged into the same drawing. At this time, the production of the dual-mode SFR X_chart can be completed. Taking the model 13MA as an example, all the black blocks in the field of view are translated and copied by 50mm. Figure 8 As shown, after copying and translating, the field of view blocks shown are obtained and the drawings are merged to obtain a dual-mode SFRX_chart, which can be named 13MA-dual-mode SFRX_chart. If there are 3-mode or more fixtures, the corresponding translation and copying can be performed according to the spacing of the centers of the fixture mold cavities. In this way, when using a dual-mode fixture, the center of the left module is aligned with the center of the black block on the left of the center, and the corresponding SFR field of view captures the corresponding field of view of the black block. The center of the right module is aligned with the center of another black block on the right of the center, and the corresponding SFR field of view captures the corresponding field of view of the black block, so that dual-mode simultaneous testing can be achieved. A method for multi-mode cavity testing provided by an embodiment of the present invention has strong versatility, and the field of view to be tested can be set according to the requirements of different cameras. It can be applicable to multi-mode fixtures such as dual-mode cavities, 3-mode cavities, and 4-mode cavities. It is only necessary to draw the center black block spacing on the X_chart diagram according to the design deviation of the fixture mold cavity. Compared with the chessboard chart, X_chart has a fixed field of view, so it can capture the field of view more accurately. At the same time, because the black blocks are fixed, the calculation method of the knife edge will be simpler.

[0044] The present invention provides a method for multi-cavity testing, which calculates the full field of view value according to the test distance of the product and the field of view angle of the product; and calculates the rectangular shape according to the chip output ratio and the full field of view value. Figure 1 The size value of the rectangle Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center of the rectangle and rotate the black block 8°; Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block 8° to produce a single-mode spatial frequency response test control chart; according to the spacing between the mold cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control chart are translated and copied, and the translated and copied black blocks are merged on the same drawing to produce a multi-mode spatial frequency response test control chart. In this way, when using a dual-mode fixture, the center of the left module is aligned with the center of the black block on the left, and the corresponding SFR field of view captures the field of view corresponding to the black block, and the center of the right module is aligned with the center of the red block on the right, and the corresponding SFR field of view captures the field of view corresponding to the red block, so that dual-mode simultaneous testing can be achieved. Then, the efficiency of the test is improved, and the simultaneous testing of multiple mode cavities can be met. Thereby achieving the technical effect of improving the efficiency of the test and meeting the simultaneous testing of multiple mode cavities.

[0045] In order to explain in detail a device for multi-cavity testing provided by the present invention, the above-mentioned embodiment one explains in detail a method for multi-cavity testing. Based on the same inventive concept, the present application also provides a device for multi-cavity testing, see embodiment two for details.

[0046] Embodiment 2

[0047] See also Figure 2 , Figure 2 : is a structural block diagram of a device for multi-cavity testing provided by an embodiment of the present invention. Embodiment 2 of the present invention provides a device for multi-cavity testing, including:

[0048] A full field of view value calculation module 200 is used to calculate the full field of view value according to the test distance of the product and the field of view angle of the product;

[0049] The rectangular diagram calculation module 210 is used to calculate the rectangular diagram according to the chip output ratio and the full field value. Figure 1 The size value of

[0050] The black block making module 220 is used to make a black block according to the rectangular Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center and rotate the black block by 8°;

[0051] The single-mode spatial frequency response test control diagram production module 230 is used to Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block by 8° to produce a single-mode spatial frequency response test control chart;

[0052] The multi-mode spatial frequency response test control diagram production module 240 is used to translate and copy the black blocks in the single-mode spatial frequency response test control diagram according to the spacing between the mold cavities of the multi-mode fixture, and merge the translated and copied black blocks into the same drawing to produce a multi-mode spatial frequency response test control diagram.

[0053] The present invention provides a device for multi-cavity testing, wherein the full field of view value calculation module 200 is used to calculate the full field of view value according to the test distance of the product and the field of view angle of the product; Figure 1 The calculation module 210 is used to calculate the rectangular shape according to the chip image ratio and the full field value. Figure 1 The black block making module 220 is used to make a black block according to the rectangular Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center of the rectangle and rotate the black block by 8°; the single-mode spatial frequency response test control diagram production module 230 is used to draw a black block at the center of the rectangle Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block by 8° to produce a single-mode spatial frequency response test control chart; the multi-mode spatial frequency response test control chart production module 240 is used to translate and copy the black blocks in the single-mode spatial frequency response test control chart according to the spacing between the mold cavities of the multi-mode fixture, and merge the translated and copied black blocks into the same drawing to produce a multi-mode spatial frequency response test control chart. In this way, when using a dual-mode fixture, the center of the left module is aligned with the center of the black block on the left, and the corresponding SFR field of view captures the field of view corresponding to the black block, and the center of the right module is aligned with the center of the red block on the right, and the corresponding SFR field of view captures the field of view corresponding to the red block, so that dual-mode simultaneous testing can be achieved. Then, the efficiency of the test is improved, and the simultaneous testing of multiple mode cavities can be met. Thereby achieving the technical effect of improving the efficiency of the test and meeting the simultaneous testing of multiple mode cavities.

[0054] In order to explain in detail an electronic device for multi-cavity testing provided by the present invention, the above-mentioned embodiment one explains in detail a method for multi-cavity testing. Based on the same inventive concept, the present application also provides an electronic device for multi-cavity testing, see embodiment three for details.

[0055] Embodiment 3

[0056] See also Figure 3 , Figure 3 The second embodiment of the present invention provides an electronic device for multi-mode cavity testing, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, the following steps are implemented:

[0057] Calculate the full field of view value based on the product's test distance and product's field of view angle;

[0058] The rectangle is calculated based on the chip image ratio and the full field value. Figure 1 The size value of

[0059] According to the rectangle Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center and rotate the black block by 8°;

[0060] In the rectangle Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block by 8° to produce a single-mode spatial frequency response test control chart;

[0061] According to the spacing between the cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram.

[0062] Among them, when the processor executes the program, it also implements the following steps: the full field of view value calculated based on the test distance of the product and the field of view angle of the product includes: the test distance of the product is 400mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

[0063] The present invention provides an electronic device for multi-cavity testing, which calculates the full field of view value according to the test distance of the product and the field of view angle of the product; calculates the rectangular shape according to the chip output ratio and the full field of view value; Figure 1 The size value of the rectangle Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center of the rectangle and rotate the black block 8°; Figure 1Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block 8° to produce a single-mode spatial frequency response test control chart; according to the spacing between the mold cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control chart are translated and copied, and the translated and copied black blocks are merged on the same drawing to produce a multi-mode spatial frequency response test control chart. In this way, when using a dual-mode fixture, the center of the left module is aligned with the center of the black block on the left, and the corresponding SFR field of view captures the field of view corresponding to the black block, and the center of the right module is aligned with the center of the red block on the right, and the corresponding SFR field of view captures the field of view corresponding to the red block, so that dual-mode simultaneous testing can be achieved. Then, the efficiency of the test is improved, and the simultaneous testing of multiple mode cavities can be met. Thereby achieving the technical effect of improving the efficiency of the test and meeting the simultaneous testing of multiple mode cavities.

[0064] In order to explain in detail a computer-readable storage medium for multi-cavity testing provided by the present invention, the above-mentioned embodiment one explains in detail a method for multi-cavity testing. Based on the same inventive concept, the present application also provides a computer-readable storage medium for multi-cavity testing, see embodiment four for details.

[0065] Embodiment 4

[0066] See also Figure 4 , Figure 4 A computer-readable storage medium for multi-cavity testing is provided in an embodiment of the present invention. Embodiment 4 of the present invention provides a computer-readable storage medium for multi-cavity testing, on which a computer program is stored, and when the program is executed by a processor, the following steps are implemented:

[0067] Calculate the full field of view value based on the product's test distance and product's field of view angle;

[0068] The rectangle is calculated based on the chip image ratio and the full field value. Figure 1 The size value of

[0069] According to the rectangle Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center and rotate the black block by 8°;

[0070] In the rectangle Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block by 8° to produce a single-mode spatial frequency response test control chart;

[0071] According to the spacing between the cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram.

[0072] Among them, when the program is executed by the processor, the following steps are also implemented: the full field of view value is calculated based on the test distance of the product and the field of view angle of the product, including: the test distance of the product is 400mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

[0073] The present invention provides a computer-readable storage medium for multi-cavity testing, which calculates the full field of view value according to the test distance of the product and the field of view angle of the product; and calculates the rectangular shape according to the chip output ratio and the full field of view value. Figure 1 The size value of the rectangle Figure 1 Draw the rectangle using the size value Figure 1 , in the rectangle Figure 1 Draw a black block at the center of the rectangle and rotate the black block 8°; Figure 1 Draw a black block corresponding to each field of view on the diagonal line, and rotate the black block 8° to produce a single-mode spatial frequency response test control chart; according to the spacing between the mold cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control chart are translated and copied, and the translated and copied black blocks are merged on the same drawing to produce a multi-mode spatial frequency response test control chart. In this way, when using a dual-mode fixture, the center of the left module is aligned with the center of the black block on the left, and the corresponding SFR field of view captures the field of view corresponding to the black block, and the center of the right module is aligned with the center of the red block on the right, and the corresponding SFR field of view captures the field of view corresponding to the red block, so that dual-mode simultaneous testing can be achieved. Then, the efficiency of the test is improved, and the simultaneous testing of multiple mode cavities can be met. Thereby achieving the technical effect of improving the efficiency of the test and meeting the simultaneous testing of multiple mode cavities.

[0074] Finally, it should be noted that the above specific implementation methods are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to examples, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present invention, which should be included in the scope of the claims of the present invention.

Claims

1. A method for multi-cavity testing, characterized in that: The method comprises: Calculate the full field of view value based on the product's test distance and product's field of view angle; Calculate the size value of the rectangular image according to the chip image output ratio and the full field value; Draw a rectangular diagram according to the size value of the rectangular diagram, draw a black block at the center of the rectangular diagram, and rotate the black block by 8°; Draw a black block corresponding to each field of view on the diagonal line of the rectangular diagram, and rotate the black block by 8° to produce a single-mode spatial frequency response test control diagram; According to the spacing between the cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram.

2. The method for multi-cavity testing according to claim 1, characterized in that: The full field of view value calculated based on the test distance of the product and the field of view of the product includes: The test distance of the product is 400 mm, the field of view of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

3. The method for multi-cavity testing according to claim 2, characterized in that: The method of calculating the size value of the rectangular image according to the chip image output ratio and the full field value includes: The chip output ratio is 4:3, and the size value includes a long side value and a short side value. The long side value is equal to the full field of view value*0.8, and the short side value is equal to the full field of view value*0.

6.

4. The method for multi-cavity testing according to claim 1, characterized in that: Drawing a black block at the center of the rectangular diagram comprises: A central black block is drawn in the center of the rectangular image with a size of 200 pixels, and the side length of the black block is 35 mm.

5. The method for multi-cavity testing according to claim 1, characterized in that: The performing translational copying on the black blocks in the single-mode spatial frequency response test control diagram comprises: The black block is copied, and the copied black block is translated at a distance of 50 mm.

6. A device for multi-cavity testing, characterized in that: The device comprises: A full field of view value calculation module is used to calculate the full field of view value based on the product's test distance and the product's field of view angle; A rectangular diagram calculation module, used to calculate the size value of the rectangular diagram according to the chip output ratio and the full field of view value; A black block making module, used for drawing a rectangular image according to the size value of the rectangular image, drawing a black block at the center of the rectangular image, and rotating the black block by 8°; A single-mode spatial frequency response test control diagram production module is used to draw a black block corresponding to the test of each field of view on the diagonal line of the rectangular diagram, and rotate the black block by 8° to produce a single-mode spatial frequency response test control diagram; The multi-mode spatial frequency response test control diagram production module is used to translate and copy the black blocks in the single-mode spatial frequency response test control diagram according to the spacing between the mold cavities of the multi-mode fixture, and merge the translated and copied black blocks into the same drawing to produce a multi-mode spatial frequency response test control diagram.

7. An electronic device for multi-cavity testing, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the following steps are implemented: Calculate the full field of view value based on the product's test distance and product's field of view angle; Calculate the size value of the rectangular image according to the chip image output ratio and the full field value; Draw a rectangular diagram according to the size value of the rectangular diagram, draw a black block at the center of the rectangular diagram, and rotate the black block by 8°; Draw a black block corresponding to each field of view on the diagonal line of the rectangular diagram, and rotate the black block by 8° to produce a single-mode spatial frequency response test control diagram; According to the spacing between the cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram.

8. The electronic device for multi-cavity testing according to claim 7, characterized in that: When the processor executes the program, the following steps are also implemented: The full field of view value calculated based on the test distance of the product and the field of view angle of the product includes: the test distance of the product is 400 mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

9. A computer-readable storage medium for multi-cavity testing, having a computer program stored thereon, characterized in that: When the program is executed by the processor, the following steps are implemented: Calculate the full field of view value based on the product's test distance and product's field of view angle; Calculate the size value of the rectangular image according to the chip image output ratio and the full field value; Draw a rectangular diagram according to the size value of the rectangular diagram, draw a black block at the center of the rectangular diagram, and rotate the black block by 8°; Draw a black block corresponding to each field of view on the diagonal line of the rectangular diagram, and rotate the black block by 8° to produce a single-mode spatial frequency response test control diagram; According to the spacing between the cavities of the multi-mode fixture, the black blocks in the single-mode spatial frequency response test control diagram are all translated and copied, and the translated and copied black blocks are merged into the same drawing to produce a multi-mode spatial frequency response test control diagram.

10. The computer-readable storage medium for multi-cavity testing according to claim 9, wherein: When the program is executed by the processor, the following steps are also implemented: The full field of view value calculated based on the test distance of the product and the field of view angle of the product includes: the test distance of the product is 400 mm, the field of view angle of the product is 78.2°, and the full field of view value is equal to tan(78.2 / 2)*400*2.

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