A probe test device for high current testing

Abstract

The present invention discloses a probe testing device for high current testing, and specifically relates to the technical field of chip testing equipment, including a tester, the surface of which is electrically connected to a test probe sleeve through a wire, the side of which is fixedly connected to a symmetrically distributed first lifting rod and a second lifting rod, the first lifting rod and the second lifting rod are respectively fixed with a first lifting hollow threaded slider and a second lifting hollow threaded slider at one end away from the test probe sleeve, and the surface of the first lifting hollow threaded slider is slidably connected to a first lifting control box through a guide rail. The present invention automatically controls the test probe sleeve to move up and down, prolongs the service life of the probe, avoids the silicon wafer waiting to be detected from being stained with sweat and impurities, improves the detection accuracy, fixes the silicon wafer waiting to be detected, avoids it from being touched and sliding on the detection table, and ensures that the silicon wafer waiting to be detected remains relatively still with the probe during the detection process, thereby ensuring the accuracy of the detection result.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing equipment, and more particularly to a probe testing equipment for high current testing. Background Art

[0002] In recent years, semiconductor process technology has advanced by leaps and bounds, surpassing the prediction of Moore's Law by several years, and has now advanced to below 7 nanometers. Products are required to be thin, light and short, and ICs are getting smaller and smaller, with more and more functions and more and more pins. In order to reduce the area occupied by chip packaging and improve IC performance, flip-chip packaging is currently widely used in graphics chips, chipsets, memory and CPUs. The above high-end packaging methods are expensive. If the chip can be tested before packaging and defective products are found in the wafer, they will be marked and discarded before the later packaging process, which can save unnecessary packaging costs.

[0003] However, in actual use, most of the existing probe testing equipment adopts manual control to move the probe up and down, and the test preparation procedure is not automated enough, which may easily cause the probe to collide with the silicon wafer, thereby damaging the probe and shortening the service life of the probe testing equipment. At the same time, traditional probe testing equipment often adopts manual adjustment of the position of the silicon wafer waiting to be tested, and then aligns it with the probe, which may easily cause the surface of the silicon wafer waiting to be tested to be contaminated with sweat and impurities, thereby affecting the accuracy of the test results. In addition, the existing probe testing equipment on the market often places the silicon wafer waiting to be tested directly on the test table, and the silicon wafer is easily touched, thereby affecting the test process and test results. Summary of the invention

[0004] In order to overcome the above-mentioned defects of the prior art, an embodiment of the present invention provides a probe testing device for large current testing. By setting a lifting control mechanism, the up and down movement of the test probe sleeve is automatically controlled to extend the service life of the probe. At the same time, a moving adjustment mechanism is set to prevent the silicon wafer waiting to be tested from being contaminated by sweat and impurities, resulting in internal short circuit, thereby improving the detection accuracy and ensuring the accuracy of the detection results. A fixing mechanism is set to fix the silicon wafer waiting to be tested to prevent it from being touched and sliding on the detection table, ensuring that the silicon wafer waiting to be tested remains relatively still with the probe during the detection process, thereby ensuring the accuracy of the detection results, so as to solve the problems raised in the above-mentioned background technology.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: A probe testing device for high current testing, comprising a tester, the surface of the tester is electrically connected to a test probe sleeve through a wire, the side of the test probe sleeve is fixedly connected to a first lifting rod and a second lifting rod that are symmetrically distributed, the first lifting rod and the second lifting rod are respectively fixed with a first lifting hollow threaded slider and a second lifting hollow threaded slider at one end away from the test probe sleeve, the surface of the first lifting hollow threaded slider is slidably connected to a first lifting control box through a guide rail, the surface of the second lifting hollow threaded slider is slidably connected to a second lifting control box through a guide rail, the bottom of the first lifting control box and the second lifting control box are fixedly connected to a lifting base, the lifting base, the first lifting control box and the second lifting control box are internally provided with a lifting control mechanism, the top of the lifting base is fixedly connected to a horizontal adjustment box, the interior of the horizontal adjustment box is provided with a moving adjustment mechanism, the top of the horizontal adjustment box is fixedly connected to a detection platform, and the surface of the detection platform is provided with a fixing mechanism.

[0006] Furthermore, the lifting control mechanism includes a lifting transmission shaft, both ends of the lifting transmission shaft are rotatably connected to the inner wall of the lifting base through bearing seats, a lifting drive motor is fixedly installed on the side of the lifting base through a mounting seat, the output shaft of the lifting drive motor is fixedly connected to a lifting active shaft passing through the interior of the lifting base through a coupling, an active lifting bevel gear is fixedly sleeved on the surface of the lifting active shaft, a driven lifting bevel gear is fixedly sleeved on the surface of the lifting transmission shaft, and the driven lifting bevel gear is meshingly connected to the active lifting bevel gear.

[0007] Furthermore, the interior of the first lifting control box is rotatably connected with a first lifting screw rod which is inserted into the interior of the lifting base through a bearing seat, the surface of the first lifting screw rod is meshingly connected with the interior of the first lifting hollow threaded slider, the surface of one end of the first lifting screw rod which extends into the interior of the lifting base rod is fixedly sleeved with a first driven transmission lifting bevel gear, the surface of the lifting transmission shaft is fixedly sleeved with a symmetrically distributed first active transmission lifting bevel gear and a second active transmission lifting bevel gear, and the first active transmission lifting bevel gear rod is meshingly connected with the first driven transmission lifting bevel gear.

[0008] Furthermore, the interior of the second lifting control box is rotatably connected to a second lifting screw rod which is inserted into the interior of the lifting base through a bearing seat, the surface of the second lifting screw rod is meshingly connected to the interior of the second lifting hollow threaded slider, and the surface of one end of the second lifting screw rod extending into the interior of the lifting base is fixedly sleeved with a second driven transmission lifting bevel gear, and the second driven transmission lifting bevel gear is meshingly connected to the second active transmission lifting bevel gear.

[0009] Furthermore, the movable adjustment mechanism includes a horizontal adjustment motor, the bottom of which is fixedly connected to the inner wall of the horizontal adjustment box via a mounting seat, and the output shaft of the horizontal adjustment motor is fixedly connected to the horizontal adjustment screw via a coupling.

[0010] Furthermore, a sliding bracket is fixedly connected to the interior of the horizontal adjustment box, and a horizontal adjustment hollow threaded slider and a vertical adjustment box are fixedly connected up and down between the sliding bracket and the inner wall of the horizontal adjustment box via guide rails. The interior of the horizontal adjustment hollow threaded slider is meshed with the surface of the horizontal adjustment screw.

[0011] Furthermore, a vertical adjustment motor is fixedly installed inside the vertical adjustment box via a mounting seat, and the output shaft of the vertical adjustment motor is fixedly connected to a vertical adjustment screw via a coupling. A vertical adjustment hollow threaded slider is slidably connected inside the vertical adjustment box via a guide rail, and the top of the vertical adjustment hollow threaded slider is fixedly connected to the bottom of the detection table, and the inside of the vertical adjustment hollow threaded slider is meshedly connected to the surface of the vertical adjustment screw.

[0012] Furthermore, the fixing mechanism comprises a fixing frame, a side surface of the fixing frame is fixedly connected with a hinge, and an end of the hinge away from the fixing frame is fixedly connected to the detection platform.

[0013] Furthermore, a U-shaped locking block is fixedly connected to one end of the fixing frame away from the hinge, a threaded hole is opened at one end of the testing platform away from the hinge, a locking screw is meshedly connected inside the threaded hole, a locking gasket is fixedly sleeved on the surface of the locking screw, the locking gasket and the locking screw are movably connected to the U-shaped locking block, and a locking handle is fixedly connected to the surface of one end of the locking screw extending out of the threaded hole.

[0014] Technical effects and advantages of the present invention:

[0015] 1. Compared with the prior art, a lifting control mechanism is provided to control the operation of the lifting drive motor, thereby driving the lifting active shaft and the active lifting bevel gear to rotate, thereby driving the driven lifting bevel gear and the lifting transmission shaft to rotate, thereby driving the first active transmission lifting bevel gear and the second active transmission lifting bevel gear to rotate, thereby driving the first driven transmission lifting bevel gear and the second driven transmission lifting bevel gear to rotate, thereby driving the first lifting screw and the second lifting screw to rotate, thereby driving the first lifting hollow threaded slider and the second lifting hollow threaded slider to slide up and down, thereby driving the first lifting rod and the second lifting rod to move up and down, thereby automatically controlling the test probe sleeve to move up and down, and extending the service life of the probe.

[0016] 2. Compared with the prior art, by setting a mobile adjustment mechanism and controlling the operation of the horizontal adjustment motor and the vertical adjustment motor, the horizontal adjustment screw and the vertical adjustment screw are driven to rotate, thereby driving the horizontal adjustment hollow thread slider and the vertical adjustment hollow thread slider to slide, and then moving the adjustment detection table at the bottom of the probe to avoid the silicon wafer waiting to be tested being contaminated with sweat and impurities, causing internal short circuit, thereby improving the detection accuracy and ensuring the accuracy of the detection results.

[0017] 3. Compared with the prior art, by setting a fixing mechanism and controlling the rotation of the locking handle, the locking screw and the locking gasket are driven to rotate, so that the fixing frame and the test table are kept fixed, thereby fixing the silicon wafer waiting to be tested, preventing it from being touched and sliding on the test table, ensuring that the silicon wafer waiting to be tested remains relatively still with the probe during the test process, thereby ensuring the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0019] Figure 2 It is a schematic diagram of the structure of the lifting control mechanism of the present invention.

[0020] Figure 3 It is a schematic diagram of the structure of the level adjustment box of the present invention.

[0021] Figure 4 It is a schematic diagram of the structure of the vertical adjustment box of the present invention.

[0022] Figure 5 It is an enlarged view of point A of the present invention.

[0023] The accompanying drawings are marked as follows: 1. tester; 2. test probe sleeve; 3. first lifting rod; 4. second lifting rod; 5. first lifting hollow threaded slider; 6. second lifting hollow threaded slider; 7. first lifting control box; 8. second lifting control box; 9. lifting base; 10. level adjustment box; 11. test table; 12. lifting transmission shaft; 13. lifting drive motor; 14. lifting active shaft; 15. active lifting bevel gear; 16. driven lifting bevel gear; 17. first lifting screw; 18. first driven transmission lifting bevel gear; 19. first main 1. The second active transmission lifting bevel gear; 20. The second active transmission lifting bevel gear; 21. The second lifting screw; 22. The second driven transmission lifting bevel gear; 23. The horizontal adjustment motor; 24. The horizontal adjustment screw; 25. The sliding bracket; 26. The horizontal adjustment hollow threaded slider; 27. The vertical adjustment box; 28. The vertical adjustment motor; 29. ​​The vertical adjustment screw; 30. The vertical adjustment hollow threaded slider; 31. The fixing frame; 32. The hinge; 33. The U-shaped locking block; 34. The threaded hole; 35. The locking screw; 36. The locking gasket; 37. The locking handle. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0025] As attached Figure 1-5 A probe testing device for high current testing is shown, comprising a tester 1, the surface of the tester 1 is electrically connected to a test probe sleeve 2 through a wire, the side of the test probe sleeve 2 is fixedly connected to a symmetrically distributed first lifting rod 3 and a second lifting rod 4, the first lifting rod 3 and the second lifting rod 4 are respectively fixed with a first lifting hollow threaded slider 5 and a second lifting hollow threaded slider 6 at one end away from the test probe sleeve 2, the surface of the first lifting hollow threaded slider 5 is slidably connected to a first lifting control box 7 through a guide rail, the surface of the second lifting hollow threaded slider 6 is slidably connected to a second lifting control box 8 through a guide rail, the bottom of the first lifting control box 7 and the second lifting control box 8 are fixedly connected to a lifting base 9, the lifting base 9, the first lifting control box 7 and the second lifting control box 8 are internally provided with a lifting control mechanism, the top of the lifting base 9 is fixedly connected to a horizontal adjustment box 10, the interior of the horizontal adjustment box 10 is provided with a moving adjustment mechanism, the top of the horizontal adjustment box 10 is fixedly connected to a detection table 11, and the surface of the detection table 11 is provided with a fixing mechanism.

[0026] In a preferred embodiment, the lifting control mechanism includes a lifting transmission shaft 12, and both ends of the lifting transmission shaft 12 are rotatably connected to the inner wall of the lifting base 9 through bearing seats. A lifting drive motor 13 is fixedly installed on the side of the lifting base 9 through a mounting seat. The output shaft of the lifting drive motor 13 is fixedly connected to a lifting active shaft 14 that passes through the interior of the lifting base 9 through a coupling. An active lifting bevel gear 15 is fixedly sleeved on the surface of the lifting active shaft 14, and a driven lifting bevel gear 16 is fixedly sleeved on the surface of the lifting transmission shaft 12. The driven lifting bevel gear 16 is meshed and connected with the active lifting bevel gear 15, so that the lifting drive motor 13 can be controlled to work, thereby driving the lifting active shaft 14 and the active lifting bevel gear 15 to rotate, thereby driving the driven lifting bevel gear 16 and the lifting transmission shaft 12 to rotate.

[0027] In a preferred embodiment, the interior of the first lifting control box 7 is rotatably connected to a first lifting screw 17 that passes through the interior of the lifting base 9 through a bearing seat, the surface of the first lifting screw 17 is meshedly connected to the interior of the first lifting hollow threaded slider 5, and the surface of one end of the first lifting screw 17 that extends into the interior of the lifting base 9 is fixedly sleeved with a first driven transmission lifting bevel gear 18, and the surface of the lifting transmission shaft 12 is fixedly sleeved with a symmetrically distributed first active transmission lifting bevel gear 19 and a second active transmission lifting bevel gear 20, the first active transmission lifting bevel gear 19 is meshedly connected with the first driven transmission lifting bevel gear 18, so that when the lifting transmission shaft 12 rotates, it drives the first active transmission lifting bevel gear 19 and the first driven transmission lifting bevel gear 18 to rotate, and then drives the first driven transmission lifting bevel gear 18 and the first lifting screw 17 to rotate, and then drives the first lifting hollow threaded slider 5 and the first lifting rod 3 to move up and down.

[0028] In a preferred embodiment, the interior of the second lifting control box 8 is rotatably connected to a second lifting screw 21 that is inserted into the interior of the lifting base 9 through a bearing seat. The surface of the second lifting screw 21 is meshedly connected to the interior of the second lifting hollow threaded slider 6. The surface of one end of the second lifting screw 21 that extends into the interior of the lifting base 9 is fixedly sleeved with a second driven transmission lifting bevel gear 22. The second driven transmission lifting bevel gear 22 is meshedly connected to the second active transmission lifting bevel gear 20, so that when the second active transmission lifting bevel gear 20 rotates, it drives the second driven transmission lifting bevel gear 22 and the second lifting screw 21 to rotate, and then drives the second lifting hollow threaded slider 6 and the second lifting rod 4 to move up and down, thereby automatically adjusting the height of the test probe sleeve 2, facilitating the testing of the current flow of the PCB board, reducing the labor of manual operation, avoiding damage to the internal probe caused by manual operation of the test probe sleeve 2, and extending the service life of the probe.

[0029] In a preferred embodiment, the movable adjustment mechanism includes a horizontal adjustment motor 23, the bottom of the horizontal adjustment motor 23 is fixedly connected to the inner wall of the horizontal adjustment box 10 through a mounting seat, and the output shaft of the horizontal adjustment motor 23 is fixedly connected to the horizontal adjustment screw 24 through a coupling, so that the horizontal adjustment screw 24 can be driven to rotate by controlling the operation of the horizontal adjustment motor 23.

[0030] In a preferred embodiment, a sliding bracket 25 is fixedly connected to the interior of the horizontal adjustment box 10, and a horizontal adjustment hollow threaded slider 26 and a vertical adjustment box 27 are fixedly connected up and down between the sliding bracket 25 and the inner wall of the horizontal adjustment box 10 through guide rails. The interior of the horizontal adjustment hollow threaded slider 26 is meshed with the surface of the horizontal adjustment screw 24, so that when the horizontal adjustment screw 24 rotates, it drives the horizontal adjustment hollow threaded slider 26 and the vertical adjustment box 27 to move horizontally, thereby adjusting the horizontal position of the vertical adjustment box 27.

[0031] In a preferred embodiment, a vertical adjustment motor 28 is fixedly installed inside the vertical adjustment box 27 through a mounting seat, and the output shaft of the vertical adjustment motor 28 is fixedly connected to a vertical adjustment screw 29 through a coupling. A vertical adjustment hollow threaded slider 30 is slidably connected to the inside of the vertical adjustment box 27 through a guide rail. The top of the vertical adjustment hollow threaded slider 30 is fixedly connected to the bottom of the detection platform 11, and the interior of the vertical adjustment hollow threaded slider 30 is meshingly connected to the surface of the vertical adjustment screw 29, so that the vertical adjustment motor 28 can be controlled to work, thereby driving the vertical adjustment screw 29 to rotate, and then driving the vertical adjustment hollow threaded slider 30 and the detection platform 11 to move in the vertical direction, thereby avoiding human touch and adjustment of the PCB board, which may cause the detected object to be contaminated with sweat and impurities, thereby improving the detection accuracy and ensuring the accuracy of the detection results.

[0032] In a preferred embodiment, the fixing mechanism includes a fixing frame 31, and a hinge 32 is fixedly connected to the side of the fixing frame 31, and the end of the hinge 32 away from the fixing frame 31 is fixedly connected to the detection platform 11, so that the fixing frame 31 can be controlled to rotate under the action of the hinge 32, so that the object to be detected on the detection platform 11 can be kept fixed, thereby avoiding shaking of the object to be detected and improving the accuracy of the detection result.

[0033] In a preferred embodiment, a U-shaped locking block 33 is fixedly connected to one end of the fixed frame 31 away from the hinge 32, and a threaded hole 34 is opened at one end of the testing platform 11 away from the hinge 32. A locking screw 35 is meshedly connected inside the threaded hole 34, and a locking gasket 36 is fixedly sleeved on the surface of the locking screw 35. The locking gasket 36 and the locking screw 35 are movably connected with the U-shaped locking block 33. A locking handle 37 is fixedly connected to the surface of one end of the locking screw 35 extending out of the threaded hole 34, so that the locking handle 37 can be controlled to rotate, thereby driving the locking screw 35 and the locking gasket 36 to rotate, and then the locking gasket 36 is locked and fixed to the U-shaped locking block 33, so that the fixed frame 31 and the testing platform 11 remain fixed.

[0034] Working principle of the present invention: when a probe test device for large current testing is used, the lifting drive motor 13 is controlled to work, so as to drive the lifting active shaft 14 and the active lifting bevel gear 15 to rotate, and then drive the driven lifting bevel gear 16 and the lifting transmission shaft 12 to rotate, drive the first active transmission lifting bevel gear 19 and the first driven transmission lifting bevel gear 18 to rotate, and then drive the first driven transmission lifting bevel gear 18 and the first lifting screw 17 to rotate, and then drive the first lifting hollow threaded slider 5 and the first lifting rod 3 to move up and down, drive the second driven transmission lifting bevel gear 22 and the second lifting screw 21 to rotate, and then drive the second lifting hollow threaded slider 6 and the second lifting rod 4 to move up and down, so as to automatically adjust the height of the test probe sleeve 2, facilitate the current flow of the PCB board to be tested, reduce the labor of manual operation, avoid the damage of the internal probe caused by manual operation of the test probe sleeve 2, and extend the service life of the probe. The horizontal adjustment motor 23 is controlled to work, and the horizontal adjustment screw 24 is driven to rotate, and the horizontal adjustment hollow threaded slider 26 and the vertical adjustment box 27 are driven to move horizontally, so as to adjust the horizontal position of the vertical adjustment box 27. At the same time, the vertical adjustment motor 28 is controlled to work, and the vertical adjustment screw 29 is driven to rotate, thereby driving the vertical adjustment hollow threaded slider 30 and the detection platform 11 to move in the vertical direction, so as to avoid human touch and adjustment of the PCB board, which may cause the detected object to be contaminated with sweat and impurities, improve the detection accuracy, and ensure the accuracy of the detection result. At the same time, the locking handle 37 is controlled to rotate, and the locking screw 35 and the locking gasket 36 are driven to rotate, so that the locking gasket 36 is locked and fixed with the U-shaped locking block 33, so that the fixed frame 31 and the detection platform 11 are kept fixed, and the fixed frame 31 is controlled to rotate under the action of the hinge 32, so that the object to be detected on the detection platform 11 is kept fixed, so as to avoid the shaking of the object to be detected and improve the accuracy of the detection result.

[0035] Finally, a few points should be explained: First, in the description of this application, it should be noted that, unless otherwise specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, which may refer to mechanical connection or electrical connection, or internal communication between two components, or direct connection. "upper", "lower", "left", "right", etc. are only used to indicate relative positional relationships. When the absolute position of the object being described changes, the relative positional relationship may change;

[0036] Secondly: In the drawings of the embodiments disclosed in the present invention, only the structures related to the embodiments disclosed in the present invention are involved, and other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of the present invention can be combined with each other;

[0037] Finally: The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe test device for high current testing, comprising a tester (1), characterized in that: The surface of the tester (1) is electrically connected to a test probe sleeve (2) via a wire, and a first lifting rod (3) and a second lifting rod (4) are fixedly connected to the side of the test probe sleeve (2) with symmetrical distribution, and a first lifting hollow threaded slider (5) and a second lifting hollow threaded slider (6) are respectively fixed to the ends of the first lifting rod (3) and the second lifting rod (4) away from the test probe sleeve (2), and the surface of the first lifting hollow threaded slider (5) is slidably connected to a first lifting control box (7) via a guide rail, and the surface of the second lifting hollow threaded slider (6) is slidably connected to a first lifting control box (7) via a guide rail. The rail is slidably connected to a second lifting control box (8); the bottoms of the first lifting control box (7) and the second lifting control box (8) are fixedly connected to a lifting base (9); a lifting control mechanism is arranged inside the lifting base (9), the first lifting control box (7) and the second lifting control box (8); the top of the lifting base (9) is fixedly connected to a level adjustment box (10); a movable adjustment mechanism is arranged inside the level adjustment box (10); the top of the level adjustment box (10) is fixedly connected to a detection platform (11); a fixing mechanism is arranged on the surface of the detection platform (11).

2. The probe test device for high current testing according to claim 1, characterized in that: The lifting control mechanism comprises a lifting transmission shaft (12), both ends of which are rotatably connected to the inner wall of the lifting base (9) through bearing seats, a lifting drive motor (13) is fixedly mounted on the side of the lifting base (9) through a mounting seat, an output shaft of the lifting drive motor (13) is fixedly connected to a lifting active shaft (14) penetrating the interior of the lifting base (9) through a coupling, a driving lifting bevel gear (15) is fixedly sleeved on the surface of the lifting active shaft (14), a driven lifting bevel gear (16) is fixedly sleeved on the surface of the lifting transmission shaft (12), and the driven lifting bevel gear (16) is meshingly connected to the driving lifting bevel gear (15).

3. The probe test equipment for high current testing according to claim 2, characterized in that: The first lifting control box (7) is rotatably connected to a first lifting screw (17) that is inserted into the lifting base (9) through a bearing seat. The surface of the first lifting screw (17) is meshingly connected to the inside of the first lifting hollow threaded slider (5). The surface of one end of the first lifting screw (17) that extends into the lifting base (9) is fixedly sleeved with a first driven lifting bevel gear (18). The surface of the lifting transmission shaft (12) is fixedly sleeved with a symmetrically distributed first active lifting bevel gear (19) and a second active lifting bevel gear (20). The first active lifting bevel gear (19) is meshingly connected to the first driven lifting bevel gear (18).

4. The probe test equipment for high current testing according to claim 3, characterized in that: The interior of the second lifting control box (8) is rotatably connected to a second lifting screw (21) that is inserted into the interior of the lifting base (9) via a bearing seat; the surface of the second lifting screw (21) is meshingly connected to the interior of the second lifting hollow threaded slider (6); a second driven lifting bevel gear (22) is fixedly sleeved on the surface of one end of the second lifting screw (21) that extends into the interior of the lifting base (9); the second driven lifting bevel gear (22) is meshingly connected to the second active lifting bevel gear (20).

5. The probe testing device for high current testing according to claim 4, characterized in that: The movable adjustment mechanism comprises a horizontal adjustment motor (23), the bottom of which is fixedly connected to the inner wall of the horizontal adjustment box (10) via a mounting seat, and the output shaft of the horizontal adjustment motor (23) is fixedly connected to a horizontal adjustment screw (24) via a coupling.

6. The probe testing device for high current testing according to claim 5, characterized in that: A sliding bracket (25) is fixedly connected inside the horizontal adjustment box (10), and a horizontal adjustment hollow threaded slider (26) and a vertical adjustment box (27) fixedly connected up and down are slidably connected between the sliding bracket (25) and the inner wall of the horizontal adjustment box (10) via guide rails, respectively, and the interior of the horizontal adjustment hollow threaded slider (26) is meshedly connected with the surface of the horizontal adjustment screw rod (24).

7. The probe testing device for high current testing according to claim 6, characterized in that: A vertical adjustment motor (28) is fixedly installed inside the vertical adjustment box (27) via a mounting seat, and an output shaft of the vertical adjustment motor (28) is fixedly connected to a vertical adjustment screw (29) via a coupling. A vertical adjustment hollow threaded slider (30) is slidably connected inside the vertical adjustment box (27) via a guide rail, and the top of the vertical adjustment hollow threaded slider (30) is fixedly connected to the bottom of the detection platform (11), and the inside of the vertical adjustment hollow threaded slider (30) is meshedly connected to the surface of the vertical adjustment screw (29).

8. The probe testing device for high current testing according to claim 7, characterized in that: The fixing mechanism comprises a fixing frame (31), a hinge (32) is fixedly connected to a side surface of the fixing frame (31), and an end of the hinge (32) away from the fixing frame (31) is fixedly connected to the detection platform (11).

9. The probe testing device for high current testing according to claim 8, characterized in that: A U-shaped locking block (33) is fixedly connected to one end of the fixing frame (31) away from the hinge (32); a threaded hole (34) is provided at one end of the testing platform (11) away from the hinge (32); a locking screw (35) is meshedly connected inside the threaded hole (34); a locking washer (36) is fixedly sleeved on the surface of the locking screw (35); the locking washer (36) and the locking screw (35) are movably connected to the U-shaped locking block (33); and a locking handle (37) is fixedly connected to the surface of one end of the locking screw (35) extending out of the threaded hole (34).

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