Testing Method, Device, Electronic Device and Storage Medium for Endurance Life of Battery Cell

Abstract

An embodiment of the present application provides a method, device, electronic device, and storage medium for testing the endurance life of a battery cell. Among them, the method includes: obtaining characterization parameters of the battery cell, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference; performing low-temperature pulse heating on the battery cell according to the characterization parameters and pulse heating working condition parameters; obtaining the heating time and updated characterization parameters during the heating process; stopping the low-temperature pulse heating of the battery cell according to the heating time and the updated characterization parameters to obtain the endurance life of the battery cell. Implementing the embodiments of the present application does not require modification or replacement of the battery cell, accelerates the temperature balance of low-temperature pulse heating, obtains more severe low-temperature conditions, reduces the test cycle of pulse heating endurance life testing, and improves the accuracy of the test results of the endurance life of the battery cell at low temperatures.

Description

Technical Field

[0001] The present application relates to the technical field of batteries, and in particular, to a method, apparatus, electronic device, and computer-readable storage medium for testing the durability life of a battery cell. Background Art

[0002] The battery cells of a battery suffer great losses during the low-temperature heating process, resulting in a reduction in the durability life of the battery cells. Therefore, it is necessary to test the durability life of the battery cells under low-temperature pulse heating to improve the durability life of the battery cells under low-temperature pulse heating.

[0003] However, there are many problems in the existing technology during the testing process. For example, it is necessary to modify the battery cells or use specially made three-electrode battery cells, and the temperature at different positions of the battery cells is uneven during the working process, which cannot comprehensively reflect the battery temperature and characteristics. Or limited by the equipment capabilities of the environmental chamber, the equilibrium temperature of the final pulse heating is difficult to control, and it is also difficult to obtain more demanding low-temperature conditions.

[0004] At the same time, during the simulation test, the data is limited by the quality of the grid model and the relevant material property parameters. There are many uncertainties in the simulated temperature points, and there are still differences from the actual temperature distribution. The selected detection points still cannot comprehensively reflect the temperature and characteristics of the battery. Summary of the Invention

[0005] The purpose of the embodiments of the present application is to provide a method, apparatus, electronic device, and computer-readable storage medium for testing the durability life of a battery cell, which does not require modification or replacement of the battery cell, effectively reflects the temperature and characteristics of the battery cell, accelerates the equilibrium of the temperature of the low-temperature pulse heating, obtains more demanding low-temperature conditions, reduces the test cycle of the durability life test of the pulse heating, and improves the accuracy of the test results of the durability life of the battery cell at low temperature.

[0006] In a first aspect, the embodiments of the present application provide a method for testing the durability life of a battery cell, the method comprising:

[0007] Obtaining the characterization parameters of the battery cell, the characterization parameters including temperature, maximum voltage, minimum voltage, and voltage difference;

[0008] Performing low-temperature pulse heating on the battery cell according to the characterization parameters and the pulse heating condition parameters;

[0009] Obtaining the heating time and updating the characterization parameters during the heating process;

[0010] Stopping the low-temperature pulse heating of the battery cell according to the heating time and the updated characterization parameters to obtain the durability life of the battery cell.

[0011] In the above implementation process, a low-temperature pulse heating durability life test is performed on the battery cell according to the characterization parameters, so as to obtain the capacity loss data of the battery cell, and then the test result is obtained according to the capacity loss data. There is no need to modify or replace the battery cell, which effectively reflects the temperature and characteristics of the battery cell, accelerates the temperature balance of the low-temperature pulse heating, obtains more stringent low-temperature conditions, reduces the test cycle of the pulse heating durability life test, and improves the accuracy of the durability life test result of the battery cell at low temperature.

[0012] Further, the step of obtaining the characterization parameters of the battery cell includes:

[0013] Performing multiple equalization operations on the battery cell to obtain multiple initial characterization parameters of the battery cell in each equalization state;

[0014] Fitting the multiple initial characterization parameters to obtain the characterization parameters, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference.

[0015] In the above implementation process, performing multiple equalization operations on the battery cell can obtain the maximum voltage, minimum voltage, and voltage difference of the battery cell at different equalization temperatures, comprehensively reflecting the characteristics of the battery cell at different equalization temperatures. The characterization parameters obtained by fitting are used to characterize the temperature in the dynamic working condition, without the need to modify the battery cell, without arranging internal or external sensors, and at the same time avoiding the temperature difference of the acquisition points caused by uneven temperature during the charge and discharge dynamic process of the battery cell, so as to more reasonably reflect the comprehensive characteristics of the battery cell.

[0016] Further, the step of stopping the low-temperature pulse heating of the battery cell according to the heating time and the updated characterization parameters to obtain the durability life of the battery cell includes:

[0017] When the heating time is less than the preset time, and at the same time, the temperature in the updated characterization parameters is greater than or equal to the first equalization threshold, or the maximum voltage in the updated characterization parameters is less than or equal to the second threshold, or the minimum voltage in the updated characterization parameters is less than or equal to the third threshold, or the voltage difference in the updated characterization parameters is less than or equal to the fourth threshold, stop heating to obtain the cyclic rest time;

[0018] When the heating time is greater than the preset time, stop heating to obtain the capacity loss data of the battery cell;

[0019] Perform a durability life test according to the capacity loss data to obtain the durability life.

[0020] In the above implementation process, the heating of the battery cell is stopped according to the preset time, heating time, characterization parameters, and preset heating cut-off judgment conditions, ensuring that the real-time changes in the battery cell characteristics can be obtained in a timely manner. At the same time, the heating cut-off temperature of the battery cell can be controlled by controlling the preset temperature, ensuring that a harsh low-temperature environment is obtained for the battery cell durability life test, reducing the test cycle of the pulse heating durability life test, and enabling the obtained capacity loss data to more accurately reflect the pulse heating durability life at low temperatures.

[0021] Further, the step of stopping heating when the heating time is greater than the preset time and obtaining the capacity loss data of the battery cell includes:

[0022] When the heating time is greater than the preset time, stop heating to obtain the normal-temperature capacity and internal resistance data of the battery cell;

[0023] Obtain the capacity loss data of the battery cell according to the normal-temperature capacity and the internal resistance data.

[0024] In the above implementation process, when the heating time is greater than the preset time, stop heating to ensure that the capacity and internal resistance characteristics of the battery cell can be obtained in a timely manner. At the same time, by controlling the preset time, more frequent normal-temperature capacity and internal resistance data can be obtained to reflect the durability life attenuation process of the battery cell.

[0025] Further, after the step of stopping heating when the heating time is less than the preset time, and at the same time, the temperature in the updated characterization parameters is greater than or equal to the first equal threshold, or the maximum voltage in the updated characterization parameters is less than or equal to the second threshold, or the minimum voltage in the updated characterization parameters is less than or equal to the third threshold, or the voltage difference in the updated characterization parameters is less than or equal to the fourth threshold, and obtaining the cyclic rest time, it further includes:

[0026] Re-perform low-temperature pulse heating on the battery cell according to the updated characterization parameters.

[0027] In the above implementation process, re-perform low-temperature pulse heating on the battery cell according to the cyclic rest time and the preset heating start conditions, ensuring that a preset target temperature is obtained at the start of the low-temperature pulse heating. The heating start temperature of the battery cell can be controlled by controlling the preset heating start judgment conditions, effectively reflecting the temperature and characteristics of the battery cell, ensuring the starting low-temperature environmental conditions of the battery cell pulse heating, and enabling the obtained capacity loss data to more accurately reflect the pulse heating durability life at low temperatures.

[0028] Further, the step of obtaining the updated characterization parameters includes: obtaining the updated characterization parameters of the battery cell according to the cyclic rest time.

[0029] Further, the step of performing low-temperature pulse heating on the battery cell according to the characterization parameters and pulse heating condition parameters further includes: cooling the battery cell through a battery cell cooling system.

[0030] In the above implementation process, the battery cell cooling system can quickly cool down the battery cell, balance the temperature of pulse heating, ensure a harsh low-temperature environment for the battery cell durability life test, thereby reducing the test cycle of the pulse heating durability life test, and making the obtained capacity loss data more accurately reflect the pulse heating durability life at low temperatures.

[0031] In a second aspect, an embodiment of the present application further provides a test device for the durability life of a battery cell, and the device includes:

[0032] An acquisition module, configured to acquire characterization parameters of the battery cell, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference;

[0033] A heating module, configured to perform low-temperature pulse heating on the battery cell according to the characterization parameters and pulse heating condition parameters; and further configured to obtain the heating time and update the characterization parameters during the heating process;

[0034] A test module, configured to stop performing low-temperature pulse heating on the battery cell according to the heating time and the updated characterization parameters, and obtain the durability life of the battery cell.

[0035] In the above implementation process, low-temperature pulse heating is performed on the battery cell according to the characterization parameters, so as to obtain the capacity loss data of the battery cell, and then the test result is obtained according to the capacity loss data. There is no need to modify or replace the battery cell, which effectively reflects the temperature and characteristics of the battery cell, can accelerate the balance of the temperature of low-temperature pulse heating, obtain more harsh low-temperature conditions, reduce the test cycle of the pulse heating durability life test, and improve the accuracy of the test result of the battery cell durability life at low temperatures.

[0036] In a third aspect, an electronic device provided by an embodiment of the present application includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, the steps of the method according to any one of the first aspects are implemented.

[0037] In a fourth aspect, a computer-readable storage medium provided by an embodiment of the present application has instructions stored thereon, and when the instructions are run on a computer, the computer is made to execute the method according to any one of the first aspects.

[0038] In a fifth aspect, a computer program product provided by an embodiment of the present application, when run on a computer, causes the computer to execute the method according to any one of the first aspects.

[0039] Other features and advantages of the present disclosure will be set forth in the following description, or can be inferred from the description or be undoubtedly determined, or can be learned by implementing the above technologies of the present disclosure.

[0040] And can be implemented according to the content of the description. The following is a detailed description of the preferred embodiments of the present application in conjunction with the accompanying drawings as follows. Description of the Drawings

[0041] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the accompanying drawings required to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0042] Figure 1 It is a schematic flowchart of the test method for the durability life of the battery cell provided by the embodiment of the present application;

[0043] Figure 2 It is a schematic structural composition diagram of the test device for the durability life of the battery cell provided by the embodiment of the present application;

[0044] Figure 3 It is a schematic structural composition diagram of the electronic device provided by the embodiment of the present application. Detailed Description of the Embodiments

[0045] The following will describe the technical solutions in the embodiments of the present application in conjunction with the accompanying drawings in the embodiments of the present application.

[0046] It should be noted that: similar reference numerals and letters denote similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. At the same time, in the description of the present application, the terms "first", "second", etc. are only used for distinguishing descriptions and cannot be understood as indicating or implying relative importance.

[0047] The following will further describe in detail the specific embodiments of the present application in conjunction with the drawings and embodiments. The following embodiments are used to illustrate the present application, but are not used to limit the scope of the present application.

[0048] Embodiment 1

[0049] Figure 1 It is a schematic flowchart of the test method for the durability life of the battery cell provided by the embodiment of the present application. As Figure 1 shown, the method includes:

[0050] S1. Obtain the characterization parameters of the battery cell, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference;

[0051] S2. Perform low-temperature pulse heating on the battery cell according to the characterization parameters and the pulse heating condition parameters;

[0052] S3. Obtain the heating time and update the characterization parameters during the heating process;

[0053] S4. Stop the low-temperature pulse heating of the battery cell according to the heating time and the updated characterization parameters to obtain the durability life of the battery cell.

[0054] In the above implementation process, perform a low-temperature pulse heating durability life test on the battery cell according to the characterization parameters, so as to obtain the capacity loss data of the battery cell, and then obtain the test result according to the capacity loss data. There is no need to modify or replace the battery cell, which can effectively reflect the temperature and characteristics of the battery cell, accelerate the temperature balance of the low-temperature pulse heating, obtain more stringent low-temperature conditions, reduce the test cycle of the pulse heating durability life test, and improve the accuracy of the low-temperature battery cell durability life test result.

[0055] In the embodiment of the present application, a durability life test system for the battery cell is built to test the durability life of the battery cell, and the battery cell and the battery cell cooling system are placed in an environmental chamber.

[0056] Further, S1 includes:

[0057] Perform multiple equal-temperature operations on the battery cell to obtain multiple initial characterization parameters of the battery cell in each equal-temperature state;

[0058] Fit the multiple initial characterization parameters to obtain the characterization parameters, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference.

[0059] In the above implementation process, performing multiple equal-temperature operations on the battery cell can obtain the maximum voltage, minimum voltage, and voltage difference of the battery cell at different equal temperatures, comprehensively reflecting the characteristics of the battery cell at different equal temperatures. The characterization parameters obtained through fitting are used to characterize the temperature in the dynamic working condition, which can avoid modifying the battery cell, arranging internal or external sensors, and also avoid the temperature difference at the acquisition points caused by uneven temperature during the charge and discharge dynamic process of the battery cell, thus more reasonably reflecting the comprehensive characteristics of the battery cell.

[0060] During the operation of the battery cell, due to heat dissipation, the temperature of the battery cell is uneven, and the temperature inside the battery cell is usually higher than that on the surface of the battery cell. Temperature has a great impact on the performance of the battery cell. In the embodiment of the present application, the temperature of the battery cell is characterized by recording the maximum voltage, minimum voltage, and voltage difference of a single-pulse characterization working condition at a certain ratio of the charging capacity to the rated capacity (State of Charge, SOC) of the battery. The pulse characterization working condition can be single-pulse charge and discharge, pulse charging, or pulse discharging. Compared with the temperature collected by a single-point sensor, it can more comprehensively reflect the performance of the battery cell. The detailed calibration method is as follows: At room temperature, adjust the battery cell to the specified SOC, and the SOC is calculated by the ampere-hour integration method; set the temperature of the environmental chamber to the specified first calibration temperature T1, and let it stand for at least 6 hours to make the battery cell have a uniform temperature; run a custom pulse characterization working condition, and collect and record the maximum voltage, minimum voltage, and voltage difference; raise the temperature to the specified second calibration temperature T2, and let it stand for at least 3 hours to make the battery cell have a uniform temperature again; repeat multiple times to obtain multiple initial characterization parameters; fit the multiple initial characterization parameters to obtain the characterization parameters.

[0061] In the embodiment of the present application, the SOC of the battery cell is 0%.

[0062] In S2, during the heating process, to obtain the heating time and the heating cut-off temperature, it is first necessary to determine the heating start temperature T0. The heating start temperature T0 is the lowest operating ambient temperature of the battery. T0 uses the characterization parameter as the judgment condition for the start of low-temperature pulse heating to ensure that the temperature and characteristics inside the battery cell are the same as those in the state of uniform temperature when starting low-temperature pulse heating. Since the internal resistance of the battery increases sharply at low temperatures, the capacity loss increases, the working performance is reduced, the use safety is affected, and the service life is reduced, the heating cut-off temperature T1 should be selected as close to T0 as possible to keep the battery cell continuously in a harsh low-temperature environment during low-temperature pulse heating. By adjusting the magnitude of the heating cut-off temperature T1, the calibration pulse heating temperature range, the pulse heating working condition time t1, and the cyclic standing time t2 are adjusted.

[0063] In the embodiment of the present application, the lowest operating ambient temperature of the battery cell is -20°C, so T0 = -20°C. The heating cut-off temperature T1 is selected to characterize the temperature of the large surface of the battery cell, and the set value is -19.6°C. T0 is converted into the maximum voltage difference of the pulse discharge of the battery cell, and the calculated maximum voltage difference of the pulse discharge of the battery cell at -20°C is 0.782V.

[0064] Optionally, in the heating process of the embodiment of the present application, it is also necessary to determine the cyclic ambient temperature Tair during low-temperature pulse heating. As long as the equipment capacity meets the conditions, it is required that Tair is less than T0 as much as possible. At the same time, with the assistance of the cooling system, more stringent low-temperature conditions can be obtained and maintained, and the pulse heating durability life test of the battery cell can be accelerated. In the embodiment of the present application, Tair = -40°C.

[0065] Determine the pulse heating amplitude \(I_p\) and the pulse interval \(t_0\). The pulse heating amplitudes \(I_p\) of the positive and negative pulses are equal and the larger they are, and the smaller the pulse interval \(t_0\) is, the faster the heating rate. In this embodiment, \(I_p = 4C\) and \(t_0 = 10ms\).

[0066] During the low-temperature pulse heating durability life test of the battery cell, it is required that the water pump is connected to a 12V power supply and energized to ensure the continuous normal operation of the cooling system.

[0067] In S3, the heating time and the characterization parameters are obtained during the pulse heating process.

[0068] After every predetermined time of pulse heating, a normal temperature capacity and a normal temperature internal resistance test are performed to evaluate the capacity loss of the battery.

[0069] Further, S4 includes:

[0070] When the heating time is less than the preset time, and at the same time, the updated temperature in the characterization parameters is greater than or equal to the first equal threshold, or the updated maximum voltage in the characterization parameters is less than or equal to the second threshold, or the updated minimum voltage in the characterization parameters is less than or equal to the third threshold, or the updated pressure difference in the characterization parameters is less than or equal to the fourth threshold, stop heating and obtain the cyclic rest time;

[0071] When the heating time is greater than the preset time, stop heating and obtain the capacity loss data of the battery cell;

[0072] Perform a durability life test based on the capacity loss data to obtain the durability life.

[0073] In the above implementation process, when the heating time is greater than the preset time, stop heating to ensure that the capacity and internal resistance characteristics of the battery cell can be obtained in a timely manner. At the same time, by controlling the preset time, more frequent normal temperature capacity and internal resistance data can be obtained to reflect the attenuation process of the durability life of the battery cell.

[0074] Further, after the step of when the heating time is less than the preset time, and at the same time, the updated temperature in the characterization parameters is greater than or equal to the first equal threshold, or the updated maximum voltage in the characterization parameters is less than or equal to the second threshold, or the updated minimum voltage in the characterization parameters is less than or equal to the third threshold, or the updated pressure difference in the characterization parameters is less than or equal to the fourth threshold, stop heating and obtain the cyclic rest time, it further includes:

[0075] Re-perform low-temperature pulse heating on the battery cell according to the updated characterization parameters.

[0076] In the above implementation process, the battery cell is reheated by low-temperature pulse heating according to the cyclic standing time and the preset heating start condition, so as to ensure that the preset target temperature is obtained at the start of low-temperature pulse heating. The heating start temperature of the battery cell can be controlled by controlling the preset heating start judgment condition, effectively reflecting the temperature and characteristics of the battery cell, ensuring the starting low-temperature environmental conditions for the pulse heating of the battery cell, and enabling the obtained capacity loss data to more accurately reflect the pulse heating durability life at low temperature.

[0077] Further, the step of obtaining the updated characterization parameter includes: obtaining the updated characterization parameter of the battery cell according to the cyclic standing time.

[0078] When the heating time is less than the preset time and the heating cut-off temperature is less than T1, continue the low-temperature pulse heating; and when the temperature corresponding to the characterization parameter is less than or equal to T0, continue the low-temperature pulse heating.

[0079] When the pulse heating time is less than the preset time and the heating cut-off temperature is greater than or equal to T1, perform cyclic standing to obtain the cyclic standing time; when the temperature corresponding to the characterization parameter is greater than T0, continue to stand.

[0080] When the pulse heating time is greater than or equal to the preset time, stop heating, restore the temperature of the battery cell to normal temperature, perform normal-temperature capacity and internal resistance tests, and evaluate the capacity loss of the battery cell.

[0081] In the embodiment of the present application, a durability test of low-temperature pulse heating of the battery cell is carried out. After the large surface temperature of the battery cell controlled by the -20°C pulse discharge voltage difference is between -25°C and -19.6°C, and the temperature shown by the battery cell characterization parameter is between -20°C and -16°C, the environmental conditions are harsh. After 320 hours of pulse heating conditions, the capacity of the battery cell has basically no attenuation, and the internal resistance increases by about 3% - 4%.

[0082] The step of performing low-temperature pulse heating on the battery cell according to the characterization parameter and the pulse heating condition parameter further includes: cooling the battery cell through the battery cell cooling system.

[0083] In the embodiment of the present application, the battery cell cooling system includes a cooling fan, a water pump, a water kettle, a cooling water plate and corresponding pipelines. The positive and negative electrodes of the battery cell are connected to a high-voltage load, the water pump is connected to a low-voltage power supply, and a number of temperature sensors are respectively arranged on the large surface, side surface and positive and negative electrode tabs of the battery cell to collect and monitor the temperature of each point on the surface of the battery cell. The freezing point of the used coolant should meet the minimum temperature requirements of the test.

[0084] Embodiment 2

[0085] In order to execute the method corresponding to the above Embodiment 1 to achieve the corresponding functions and technical effects, a test device for the durability life of a battery cell is provided below, as Figure 2 shown, and the device includes:

[0086] An acquisition module 1 for acquiring characterization parameters of an electric cell, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference;

[0087] A heating module 2 for performing low-temperature pulse heating on the electric cell according to the characterization parameters and pulse heating condition parameters; and also for obtaining heating time and updating the characterization parameters during the heating process;

[0088] A testing module 3 for stopping the low-temperature pulse heating of the electric cell according to the heating time and the updated characterization parameters to obtain the durability life of the electric cell.

[0089] In the above implementation process, low-temperature pulse heating is performed on the electric cell according to the characterization parameters, thereby obtaining capacity loss data of the electric cell, and then obtaining a test result according to the capacity loss data. There is no need to modify or replace the electric cell, which effectively reflects the temperature and characteristics of the electric cell, can accelerate the temperature balance of low-temperature pulse heating, obtain more severe low-temperature conditions, reduce the test cycle of the pulse heating durability life test, and improve the accuracy of the low-temperature electric cell durability life test result.

[0090] Furthermore, the acquisition module 1 is further configured to:

[0091] Perform multiple equal-temperature operations on the electric cell to obtain multiple initial characterization parameters of the electric cell in each equal-temperature state;

[0092] Fit the multiple initial characterization parameters to obtain the characterization parameters, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference.

[0093] In the above implementation process, performing multiple equal-temperature operations on the electric cell can obtain the maximum voltage, minimum voltage, and voltage difference of the electric cell at different equal temperatures, comprehensively reflecting the characteristics of the electric cell at different equal temperatures. The characterization parameters obtained through fitting are used to characterize the temperature in the dynamic working condition, without the need to modify the electric cell, without arranging internal or external sensors, and also avoiding the temperature difference of the acquisition points caused by uneven temperature during the charge and discharge dynamic process of the electric cell, thereby more reasonably reflecting the comprehensive characteristics of the electric cell.

[0094] Furthermore, the testing module 3 is further configured to:

[0095] When the heating time is less than the preset time, and at the same time, the temperature in the updated characterization parameters is greater than or equal to the first equal threshold, or the maximum voltage in the updated characterization parameters is less than or equal to the second threshold, or the minimum voltage in the updated characterization parameters is less than or equal to the third threshold, or the voltage difference in the updated characterization parameters is less than or equal to the fourth threshold, stop heating to obtain the cyclic static time;

[0096] When the heating time is greater than the preset time, stop heating to obtain the capacity loss data of the electric cell;

[0097] Perform a durability life test based on the capacity loss data to obtain the durability life.

[0098] In the above implementation process, stop heating the battery cell according to the preset time, heating time, characterization parameter, and preset heating cut-off judgment condition, ensure that the real-time changes in the battery cell characteristics can be obtained in a timely manner, and at the same time, control the heating cut-off temperature of the battery cell by controlling the preset temperature, ensure that the durability life test of the battery cell obtains a harsh low-temperature environment, reduce the test cycle of the pulse heating durability life test, and make the obtained capacity loss data more accurately reflect the pulse heating durability life at low temperatures.

[0099] Furthermore, the test module 3 is also used for:

[0100] When the heating time is greater than the preset time, stop heating to obtain the normal temperature capacity and internal resistance data of the battery cell;

[0101] Obtain the capacity loss data of the battery cell according to the normal temperature capacity and internal resistance data.

[0102] In the above implementation process, when the heating time is greater than the preset time, stop heating to ensure that the capacity and internal resistance characteristics of the battery cell can be obtained in a timely manner. At the same time, by controlling the preset time, more frequent normal temperature capacity and internal resistance data can be obtained to reflect the durability life attenuation process of the battery cell.

[0103] Furthermore, the test module 3 is also used for:

[0104] Re-perform low-temperature pulse heating on the battery cell according to the updated characterization parameter.

[0105] In the above implementation process, re-perform low-temperature pulse heating on the battery cell according to the cyclic rest time and preset heating start condition, ensure that the preset target temperature is obtained at the start of low-temperature pulse heating, and control the heating start temperature of the battery cell by controlling the preset heating start judgment condition, effectively reflect the temperature and characteristics of the battery cell, ensure the starting low-temperature environment condition of the battery cell pulse heating, and make the obtained capacity loss data more accurately reflect the pulse heating durability life at low temperatures.

[0106] Furthermore, the acquisition module 1 is also used for: obtaining the updated characterization parameter of the battery cell according to the cyclic rest time.

[0107] Furthermore, the device also includes a cooling module for: cooling the battery cell through the battery cell cooling system.

[0108] The above test device for the durability life of the battery cell can implement the method of the first embodiment above. The optional items in the first embodiment above are also applicable to this embodiment and will not be elaborated here.

[0109] The remaining content of the embodiments of this application can refer to the content of the first embodiment above and will not be repeated in this embodiment.

[0110] Embodiment III

[0111] An embodiment of the present application provides an electronic device, including a memory and a processor. The memory is used to store a computer program, and the processor runs the computer program to enable the electronic device to execute the test method for the endurance life of the battery cell in Embodiment I.

[0112] Optionally, the above electronic device may be a server.

[0113] Please refer to Figure 3 , Figure 3 which is a schematic diagram of the structural composition of the electronic device provided by the embodiment of the present application. The electronic device may include a processor 31, a communication interface 32, a memory 33, and at least one communication bus 34. Among them, the communication bus 34 is used to realize the direct connection and communication of these components. Among them, the communication interface 32 of the device in the embodiment of the present application is used to perform signaling or data communication with other node devices. The processor 31 may be an integrated circuit chip with signal processing capabilities.

[0114] The above-mentioned processor 31 may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. It can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of the present application. The general-purpose processor may be a microprocessor or the processor 31 may also be any conventional processor, etc.

[0115] The memory 33 may be, but is not limited to, a random access memory (RAM), a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), etc. The memory 33 stores computer-readable instructions. When the computer-readable instructions are executed by the processor 31, the device can execute the above Figure 1 steps involved in the method embodiment.

[0116] Optionally, the electronic device may further include a storage controller and an input / output unit. Each component of the memory 33, the storage controller, the processor 31, the peripheral interface, and the input / output unit is electrically connected directly or indirectly to each other to achieve data transmission or interaction. For example, these components may be electrically connected to each other through one or more communication buses 34. The processor 31 is configured to execute an executable module stored in the memory 33, such as a software functional module or a computer program included in the device.

[0117] The input / output unit is used to provide the user with the ability to create tasks and create a start option period or a preset execution time for the task to achieve interaction between the user and the server. The input / output unit may be, but is not limited to, a mouse, a keyboard, etc.

[0118] It can be understood that Figure 3 The structure shown is only illustrative, and the electronic device may further include more or fewer components than those shown in Figure 3 or have a different configuration from that shown in Figure 3 The components shown in. Figure 3 Each of the components shown in may be implemented using hardware, software, or a combination thereof.

[0119] In addition, an embodiment of the present application further provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, it implements the method for testing the durability life of the battery cell in Embodiment 1.

[0120] An embodiment of the present application further provides a computer program product, which when running on a computer causes the computer to execute the method described in the method embodiment.

[0121] In several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may also be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the flowcharts and block diagrams in the drawings show the possible architectures, functions, and operations of the apparatus, method, and computer program product according to multiple embodiments of the present application. In this regard, each block in the flowchart or block diagram may represent a module, a program segment, or a part of code, and the module, program segment, or part of code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, and the combination of blocks in the block diagram and / or flowchart, may be implemented by a dedicated hardware-based device for performing the specified functions or actions, or may be implemented by a combination of dedicated hardware and computer instructions.

[0122] In addition, each functional module in various embodiments of the present application may be integrated together to form an independent part, or each module may exist alone, or two or more modules may be integrated to form an independent part.

[0123] If the above-mentioned function is implemented in the form of a software functional module and sold or used as an independent product, it may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or a part of this technical solution, may be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to enable a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present application. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical discs that can store program codes.

[0124] The above are only the embodiments of the present application and are not used to limit the protection scope of the present application. For those skilled in the art, the present application may have various changes and modifications. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application. It should be noted that similar reference numerals and letters indicate similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings.

[0125] The above is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of changes or replacements within the technical scope disclosed by the present application, and all should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

[0126] It should be noted that in this text, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "including a..." does not exclude the existence of another identical element in the process, method, article or device including the said element.

Claims

1. A test method for the durable life of an electric cell, characterized in that, The method includes: Obtaining characterization parameters of the battery cell, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference; Adjusting the battery cell to a specified SOC at room temperature, where the SOC is calculated by the ampere-hour integration method; setting the temperature of the environmental chamber to a specified first calibration temperature T1, and standing still for at least 6 hours to equalize the temperature of the battery cell; running a custom pulse characterization condition once, collecting and recording the maximum voltage, minimum voltage, and voltage difference; raising the temperature to a specified second calibration temperature T2, standing still for at least 3 hours, and equalizing the temperature of the battery cell again; repeating multiple times to obtain multiple initial characterization parameters; fitting the multiple initial characterization parameters to obtain the characterization parameters; Performing low-temperature pulse heating on the battery cell according to the characterization parameters and pulse heating condition parameters; Obtaining the heating time and updated characterization parameters during the heating process; Stopping the low-temperature pulse heating of the battery cell according to the heating time and the updated characterization parameters to obtain the durability life of the battery cell; The step of stopping the low-temperature pulse heating of the battery cell according to the heating time and the updated characterization parameters to obtain the durability life of the battery cell includes: When the heating time is less than a preset time, and at the same time, the temperature in the updated characterization parameters is greater than or equal to a first equal threshold, or the maximum voltage in the updated characterization parameters is less than or equal to a second threshold, or the minimum voltage in the updated characterization parameters is less than or equal to a third threshold, or the voltage difference in the updated characterization parameters is less than or equal to a fourth threshold, stop heating to obtain the cyclic standing still time; When the heating time is greater than the preset time, stop heating to obtain the capacity loss data of the battery cell; Performing a durability life test according to the capacity loss data to obtain the durability life.

2. The test method for the durability life of the battery cell according to claim 1, wherein The step of obtaining the characterization parameters of the battery cell includes: Performing multiple equalizing operations on the battery cell to obtain multiple initial characterization parameters of the battery cell in each equalized state; Fitting the multiple initial characterization parameters to obtain the characterization parameters, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference.

3. The test method for the durability life of the battery cell according to claim 1, wherein The step of when the heating time is greater than the preset time, stopping heating to obtain the capacity loss data of the battery cell includes: When the heating time is greater than the preset time, stop heating to obtain the normal temperature capacity and internal resistance data of the battery cell; Obtaining the capacity loss data of the battery cell according to the normal temperature capacity and the internal resistance data.

4. The test method for the durability life of the battery cell according to claim 1, wherein, After the step of when the heating time is less than a preset time, and at the same time, the temperature in the updated characterization parameters is greater than or equal to a first equal threshold, or the maximum voltage in the updated characterization parameters is less than or equal to a second threshold, or the minimum voltage in the updated characterization parameters is less than or equal to a third threshold, or the voltage difference in the updated characterization parameters is less than or equal to a fourth threshold, stopping heating to obtain the cyclic standing still time, it further includes: Performing low-temperature pulse heating on the battery cell again according to the updated characterization parameters.

5. The test method for the durability life of the battery cell according to claim 1, wherein The step of obtaining the updated characterization parameters includes: obtaining the updated characterization parameters of the battery cell according to the cyclic standing still time.

6. The test method for the durability life of the battery cell according to claim 1, wherein, The step of performing low-temperature pulse heating on the battery cell according to the characterization parameters and pulse heating condition parameters further includes: cooling the battery cell through a battery cell cooling system.

7. A test device for the endurance life of an electric core, characterized in that, The device includes: An acquisition module, configured to acquire characterization parameters of the battery cell, where the characterization parameters include temperature, maximum voltage, minimum voltage, and voltage difference; The acquisition module is further configured to: Adjust the battery cell to a specified state of charge (SOC) at room temperature, where the SOC is calculated by the ampere-hour integration method; set the temperature of the environmental chamber to a specified first calibrated temperature T1, and let it stand for at least 6 hours to equalize the temperature of the battery cell; run a custom pulse characterization condition once, collect and record the maximum voltage, minimum voltage, and voltage difference; raise the temperature to a specified second calibrated temperature T2, and let it stand for at least 3 hours to equalize the temperature of the battery cell again; repeat multiple times to obtain multiple initial characterization parameters; fit the multiple initial characterization parameters to obtain the characterization parameters; A heating module, configured to perform low-temperature pulse heating on the battery cell according to the characterization parameters and pulse heating condition parameters; and is further configured to obtain the heating time and update the characterization parameters during the heating process; A testing module, configured to stop performing low-temperature pulse heating on the battery cell according to the heating time and the updated characterization parameters to obtain the durability life of the battery cell; The testing module is further configured to: When the heating time is less than a preset time, and at the same time, the temperature in the updated characterization parameters is greater than or equal to a first equalization threshold, or the maximum voltage in the updated characterization parameters is less than or equal to a second threshold, or the minimum voltage in the updated characterization parameters is less than or equal to a third threshold, or the voltage difference in the updated characterization parameters is less than or equal to a fourth threshold, stop heating to obtain the cyclic standing time; When the heating time is greater than the preset time, stop heating to obtain the capacity loss data of the battery cell; Perform a durability life test according to the capacity loss data to obtain the durability life.

8. An electronic device, characterized in that, It includes a memory and a processor, where the memory is used to store a computer program, and the processor runs the computer program to enable the electronic device to execute the method for testing the durability life of the battery cell according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, It stores a computer program, and when the computer program is executed by the processor, it implements the method for testing the durability life of the battery cell according to any one of claims 1 to 6.

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