A method for evaluating the accuracy of chip resistor screen printing systems

Abstract

The present invention provides a method for evaluating the accuracy of a screen-printed chip resistor system, comprising the following steps: 1. Placing resolution identification patterns at the four corners of a standard screen, and placing resistor patterns of various sizes at the four corners and in the center of the standard screen; 2. Using the standard screen in the printing system to be evaluated, testing the resolution identification pattern and resistor pattern printed on the substrate; 3. Determining the system's printability and the dimensional accuracy of the printable product based on the integrity of the printed resolution identification pattern; 4. Determining the accuracy of the system's resistor printing process based on the area differences of the printed resistor patterns; and 5. Combining the results of steps 3 and 4 to determine the accuracy level of the entire system. This method offers advantages such as enabling proactive maintenance of equipment anomalies or determining the equipment's ability to produce products of varying sizes based on the evaluation results.

Description

Technical Field

[0001] The present invention relates to the field of screen printing, and in particular to a method for evaluating the accuracy of a chip resistor screen printing system. Background Art

[0002] Screen printing is a type of stencil printing, considered one of the four major printing methods along with lithography, letterpress, and gravure. Stencil printing includes stenciling, perforated stenciling, spray-painting, and screen printing. The principle of stencil printing is that during printing, a certain pressure is applied to a printing plate (a paper film or other plate substrate with perforations through which ink can pass) to transfer ink through the perforations to the substrate (paper, ceramic, etc.), forming an image or text. Currently, with mass-produced stencils, there is no effective method for accurately evaluating screen printing equipment; it is impossible to quantitatively and qualitatively verify the accuracy of equipment specified by the manufacturer; and it is impossible to monitor the accuracy of the equipment in the operating environment.

[0003] Therefore, it is necessary to provide a new technical solution. Summary of the Invention

[0004] In order to solve the technical problems existing in the prior art, the present invention discloses a method for evaluating the accuracy of the screen printing system of chip resistors. The specific technical solution is as follows:

[0005] The present invention provides a method for evaluating the accuracy of a chip resistor screen printing system, comprising the following steps:

[0006] S1. Set up a standard screen, set resolution identification patterns at the four corners of the standard screen, and set resistor patterns of various sizes at the four corners and the center of the standard screen, avoiding the dividing line of the substrate corresponding to the largest size product;

[0007] S2. Print the resistor using a screen printing machine with ink of a fixed viscosity, using a substrate corresponding to the largest of the various sizes listed above.

[0008] S3. Remove the printed sample and detect the resolution of the printed pattern and the resistor pattern on the substrate;

[0009] S4. Determine the printability of the system and the size range of the printable product corresponding to the resistor process based on the completeness of the resolution identification pattern printed on the substrate;

[0010] S5. Based on the area difference between the surrounding and central portions of the resistor pattern printed on the substrate, the system determines the range of printable product sizes corresponding to the resistor process.

[0011] S6. Combining the determination results of S4 and S5, the accuracy of the entire screen printing system is determined.

[0012] Furthermore, the resolution identification pattern includes various sizes from small to large.

[0013] Furthermore, the resolution identification pattern includes rectangular patterns of four sizes: A, B, C, and D, which represent four different ranges of 10um, 30um, 50um, and 80um, respectively.

[0014] Furthermore, the printable product size range of the resistor process can be determined by observing the completeness of the image under a microscope:

[0015] When all A graphics are printed, the resistor process of products with a size below 10um can be printed;

[0016] When the B pattern is fully printed and the A pattern is partially printed, the resistor process of the product with a size of 10um to 30um can be printed;

[0017] When the C pattern is fully printed and the B pattern is partially printed, the resistor process of 30um to 50um size products can be printed;

[0018] When the D pattern is fully printed and the C pattern is partially printed, the resistor process of the product with a size of 50um to 80um can be printed;

[0019] When the D graphic part is printed, the printability of the printing system is too low, the ink and screen do not match, and the system is unusable.

[0020] Furthermore, the areas of a certain number of resistor patterns of the same size are detected in the four corners and the five middle resistor patterns printed on the substrate, and the average value is calculated to represent the area value of the resistor pattern. The change difference between the maximum area and the minimum area of ​​all resistor patterns of the same size is then calculated. When the area change difference is less than 10% of the average value of all resistor patterns of the same size at the five locations, it is determined that the system can print resistor processes for resistors of this size and above.

[0021] Furthermore, the determination results of steps S4 and S5 are both necessary conditions. Only when the determination results of S4 and S5 are satisfied at the same time can the range of printable product sizes of the system resistance process be determined.

[0022] Furthermore, based on the range of printable product sizes of the resistor process determined in steps S4 and S5, the accuracy level of the entire system is determined to be the lower accuracy level.

[0023] The present invention has the following beneficial effects: Standard screens with different-sized resolution identification patterns and resistor patterns are designed and manufactured. Printing can be performed on different screen printing equipment using inks of uniform viscosity. The printed resolution identification patterns and resistor patterns can be used to evaluate the printability, resolution, and system accuracy of the printing system. This allows for pre-diagnosis before screen equipment, inks, and screens are deployed, or before process changes are made. The evaluation results can be used to identify equipment anomalies, facilitate maintenance, and enable the production of products with varying quality requirements.

[0024] Additional aspects and advantages of the present invention will be set forth in part in the description which follows and, in part, will be obvious from the description which follows, or may be learned by practice of the present invention. DETAILED DESCRIPTION

[0025] In order to further illustrate the technical means adopted by the present invention and the technical effects achieved, a detailed description is given below in conjunction with embodiments.

[0026] The present invention discloses a method for evaluating the accuracy of a chip resistor screen printing system, comprising the following steps:

[0027] S1. Set up a standard screen, set resolution identification patterns at the four corners of the standard screen, and set resistor patterns of various sizes at the four corners and the center of the standard screen, avoiding the dividing line of the substrate corresponding to the largest size product;

[0028] S2. Print the resistor using a screen printing machine with ink of a fixed viscosity, using a substrate corresponding to the largest of the various sizes listed above.

[0029] S3. Remove the printed sample and detect the resolution of the printed pattern and the resistor pattern on the substrate;

[0030] S4. Determine the printability of the system and the size range of the printable product corresponding to the resistor process based on the completeness of the resolution identification pattern printed on the substrate;

[0031] S5. Based on the area difference between the surrounding and central portions of the resistor pattern printed on the substrate, the system determines the range of printable product sizes corresponding to the resistor process.

[0032] S6. Combining the determination results of S4 and S5, the accuracy of the entire screen printing system is determined.

[0033] The resolution identification pattern includes various sizes from small to large.

[0034] In one embodiment, the resolution identification pattern includes rectangular patterns of four sizes: A, B, C, and D, which represent four different ranges of 10um, 30um, 50um, and 80um, respectively.

[0035] The printable product size range of the resistor process can be determined by observing the completeness of the image by resolution under a microscope:

[0036] When all A graphics are printed, the resistor process of products with a size below 10um can be printed;

[0037] When the B pattern is fully printed and the A pattern is partially printed, the resistor process of the product with a size of 10um to 30um can be printed;

[0038] When the C pattern is fully printed and the B pattern is partially printed, the resistor process of 30um to 50um size products can be printed;

[0039] When the D pattern is fully printed and the C pattern is partially printed, the resistor process of the product with a size of 50um to 80um can be printed;

[0040] When the D graphic part is printed, the printability of the printing system is too low, the ink and screen do not match, and the system is unusable.

[0041] The areas of a certain number of resistor patterns of the same size are measured at the four corners and the five middle resistor patterns printed on the substrate. The average value is calculated to represent the area value of the resistor pattern. The difference in the maximum and minimum areas of all resistor patterns of the same size is then calculated. When the area change difference is less than 10% of the average value of all resistor patterns of the same size at the five locations, it is determined that the system can print resistors of that size and above.

[0042] The determination results of steps S4 and S5 are both necessary conditions. Only when the determination results of S4 and S5 are met at the same time can the range of printable product sizes of the system resistance process be determined.

[0043] According to the range of printable product sizes of the resistor process determined in steps S4 and S5, the accuracy level of the entire system is determined by the lower accuracy level.

[0044] In the description of this specification, reference to the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in any suitable manner in any one or more embodiments or examples. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification.

[0045] Although embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and are not to be construed as limitations on the present invention, and that those skilled in the art may make changes, modifications and variations to the above embodiments within the scope of the present invention.

Claims

1. A method for evaluating the accuracy of a chip resistor screen printing system, characterized in that: The steps include: S1. Set up a standard screen, set resolution identification patterns at the four corners of the standard screen, and set resistor patterns of various sizes at the four corners and the center of the standard screen, avoiding the dividing line of the substrate corresponding to the largest size product; S2. Print the resistor using a screen printing machine with ink of a fixed viscosity, using a substrate corresponding to the largest of the various sizes listed above. S3. Remove the printed sample and detect the resolution of the printed pattern and the resistor pattern on the substrate; S4. Determine the printability of the system and the size range of the printable product corresponding to the resistor process based on the completeness of the resolution identification pattern printed on the substrate; S5. Based on the area difference between the surrounding and central portions of the resistor pattern printed on the substrate, the system determines the range of printable product sizes corresponding to the resistor process. S6. Combine the results of S4 and S5 to determine the accuracy of the entire screen printing system. In step S5, the areas of a certain number of resistor patterns of the same size are measured at the four corners and the middle of the five resistor patterns printed on the substrate. The average value is calculated to represent the area value of the resistor pattern. The difference between the maximum and minimum areas of all resistor patterns of the same size is then calculated. When the area change difference is less than 10% of the average value of all resistor patterns of the same size at the five locations, the system is determined to be suitable for printing resistors of that size and above.

2. The method for evaluating the accuracy of a chip resistor screen printing system according to claim 1, wherein: The resolution identification pattern includes various sizes from small to large.

3. The method for evaluating the accuracy of a chip resistor screen printing system according to claim 2, wherein: The resolution identification patterns A, B, C, and D are rectangular patterns of four sizes, which represent four different ranges of 10um, 30um, 50um, and 80um respectively.

4. The method for evaluating the accuracy of a chip resistor screen printing system according to claim 3, wherein: The printable product size range of the resistor process can be determined by observing the completeness of the image by resolution under a microscope: When all A graphics are printed, the resistor process of products with a size of less than 10um can be printed; When the B pattern is fully printed and the A pattern is partially printed, the resistor process of the product with a size of 10um ~ 30um can be printed; When the C pattern is fully printed and the B pattern is partially printed, the resistor process of the product with a size of 30um ~ 50um can be printed; When the D pattern is fully printed and the C pattern is partially printed, the resistor process of products with a size of 50um ~ 80um can be printed; D When the graphic part is printed, the printability of the printing system is too low, the ink screen does not match, and the system is unusable.

5. The method for evaluating the accuracy of a chip resistor screen printing system according to claim 1, wherein: The determination results of steps S4 and S5 are both necessary conditions. Only when the determination results of steps S4 and S5 are met at the same time can the range of printable product sizes of the system resistor process be determined.

6. The method for evaluating the accuracy of a chip resistor screen printing system according to claim 5, wherein: According to the range of printable product sizes of the resistor process determined in steps S4 and S5, the accuracy level of the entire system is determined to be the lower accuracy level.