Electronic component testing apparatus and testing method

Abstract

This invention provides an electronic component testing apparatus and method. The electronic component testing apparatus includes: a machine base with a machine base surface; a support chassis disposed on the machine base surface, on which a test plate that can be driven to rotate intermittently is disposed; and an infeed unit, an inspection unit, and an outfeed unit are disposed around the periphery of the support chassis. The inspection unit includes a first inspection unit for checking the insulation resistance of capacitors, and a second inspection unit for checking the capacitance, loss, or quality factor of capacitors. The second inspection unit includes a switching circuit, which includes a dry-contact switcher as a switcher. This makes the electronic component testing apparatus more suitable for testing electronic components.

Description

Technical Field

[0001] This invention relates to a testing apparatus and a testing method, and more particularly to an electronic component testing apparatus and a testing method suitable for testing electronic components. Background Technology

[0002] After manufacturing, electronic components typically undergo testing to determine their physical properties and are then classified. Such testing devices include, for example, the device described in Patent Application No. 411735, "Circuit Component Loading and Unloading Apparatus," for testing capacitor-type electronic components. This device features a concentric ring seat with one or more component slots that can rotate relative to a center. The slots rotate at uniform angular intervals in incremental increments, where each increment corresponds to the angular interval between adjacent slots. The ring seat is tilted at a certain angle, and as it rotates, components flow towards the ring seat. Fixed grids adjacent to the outer side of the slot seat restrict any misaligned components from randomly rolling down the arc segment of the ring seat's rotation path due to the force. The empty slots are randomly rolled to return the components to their positions. Electronic contactors connecting the components and the testing machine are located along the path of the rotating ring. Tested components pass beneath a manifold plate that defines numerous ejection orifices. Each time the ring rotates by an increment, the ejection orifices align with a set of slots. The ejection pipe connects to the ejection outlet. Components are ejected from the slots by airflow from selectively activated pneumatic valves. Driven by airflow and gravity, the ejected components fall through pipes and are guided by a piping plate into sorting bins. Component flow paths are selectively directed to a grid plate in response to signals from detectors indicating a missing component. Sensors can detect components in the slots that have not yet been ejected by the manifold.

[0003] While the prior art in patent application No. 411735 provides testing and classification of capacitive electronic components, such prior art typically uses mercury relay switchers as the switching method, mainly because of their high reliability in connection switching. However, since mercury relay switchers use mechanical connection switching, achieving high-speed connection switching is difficult, and the use of mercury is harmful to the environment. In addition, such mercury relay switchers are wet contact switchers, which are bulky and often positioned far from the fixed and movable electrode terminals of the test electrode terminal group in the testing equipment, connected by a coaxial cable. Since the length of this coaxial cable can be more than one meter, it often causes capacitance values ​​to be affected during current transmission. Due to the losses, the industry has filed another patent application, "Inspection and Screening Device for Chip Electronic Components" (Publication No. I680304), which uses electronic MOSFETs instead of mercury relay switchers as the connection switching method. However, although the use of MOSFETs can shorten the coaxial cable, MOSFETs have the problem of high stray capacitance when used in the testing and inspection of capacitive electronic components. Therefore, the MOSFETs in the I680304 application can only be selected with ON resistance of less than 500mΩ and OFF capacitance of less than 20pF. A grounding circuit is also required to dissipate stray capacitance and avoid interference during testing and inspection. This greatly limits the selection of MOSFETs and makes it less than the best choice for electronic component testing equipment! Summary of the Invention

[0004] Therefore, the object of the present invention is to provide an electronic component testing apparatus suitable for testing electronic components.

[0005] Another object of the present invention is to provide an electronic component testing method suitable for testing electronic components.

[0006] Another object of the present invention is to provide an electronic component testing apparatus for performing the electronic component testing method as described above.

[0007] The electronic component testing apparatus according to the present invention includes: a machine base with a machine base table; a support chassis disposed on the machine base table, a test plate that can be driven to rotate intermittently is disposed on the support chassis, and a feeding unit, an inspection unit, and a discharge unit are disposed around the periphery of the support chassis; wherein, the inspection unit includes a first inspection unit for checking the insulation resistance of capacitors, and the inspection unit further includes a second inspection unit for checking the capacitance, loss, or quality factor of capacitors; the second inspection unit includes a switching circuit, and the switching circuit includes a dry contact switcher as a switcher.

[0008] According to another objective of the present invention, an electronic component testing method is provided, which includes a first inspection unit and two second inspection units. When the component under test is located in a slot on a test plate and is transported by an intermittent rotating flow path, it first passes through one of the second inspection units to be tested for capacitance, loss or quality factor, then passes through the first inspection unit to be tested for insulation resistance, and then passes through the other second inspection unit to be tested for capacitance, loss or quality factor.

[0009] An electronic component testing apparatus according to another object of the present invention is used to perform the electronic component testing method as described above.

[0010] The electronic component testing apparatus and method of this invention, since the switching circuit in the second inspection unit, which is used to check the capacitance, loss, or quality factor (CD) of the test capacitor, uses a dry contact switcher for switching; the dry contact switcher can be directly installed in the second upper terminal module or the second lower terminal module respectively. It does not have the bulky size of a mercury relay with wet contacts, nor does it require a long cable. Compared with electronic MOSFET circuits, it can achieve a low on-resistance of only about 30mΩ and a low stray capacitance of about 0.5pf or less during testing. Compared with the stray capacitance value of MOSFETs, which is as high as 10pf or more, it can have a better anti-interference effect. It does not require a grounding circuit to dissipate stray capacitance, and it has a fast response speed when checking and testing capacitor-type electronic components, and can obtain better test accuracy. Attached Figure Description

[0011] Figure 1 This is a three-dimensional schematic diagram of an electronic component testing device, used to illustrate embodiments of the present invention.

[0012] Figure 2 This is a schematic diagram of the configuration of various mechanisms on the table of the electronic component testing device.

[0013] Figure 3 This is a schematic diagram of the support chassis in the electronic component testing device.

[0014] Figure 4 This is a schematic diagram of each block corresponding to each unit in the electronic component testing device.

[0015] Figure 5 This is a schematic diagram of the upper surface of the test board in the electronic component testing device.

[0016] Figure 6 This is a schematic diagram of the lower surface of the test board in the electronic component testing device.

[0017] Figure 7 The diagram shows the positional relationship of the first inspection unit in the intermittent rotation flow path of the test board in the electronic component testing device.

[0018] Figure 8 This is a schematic diagram showing the correspondence of one side of the first inspection unit in the electronic component testing device.

[0019] Figure 9 This is a schematic diagram of the lifting frame in the first inspection unit of the electronic component testing device.

[0020] Figure 10 This is a schematic diagram showing the configuration relationship of multiple first upper terminal assemblies and multiple first lower terminals in the first inspection unit of the electronic component testing device.

[0021] Figure 11 This is a partially enlarged schematic diagram showing the configuration relationship of multiple first upper terminal assemblies and multiple first lower terminals in the first inspection unit of the electronic component testing device.

[0022] Figure 12 This is a partial three-dimensional exploded view of the first inspection block and a row of first electrodes on the support chassis of the electronic component testing device.

[0023] Figure 13 This is a schematic diagram showing the positional relationship of the second inspection unit in the intermittent rotation flow path of the test board in the electronic component testing device.

[0024] Figure 14 This is a schematic diagram showing the configuration relationship of multiple second upper terminal assemblies and multiple second lower terminals in the second inspection unit of the electronic component testing device.

[0025] Figure 15 This is a partially enlarged schematic diagram showing the configuration relationship of the multiple second upper terminal assemblies and multiple second lower terminals in the second inspection unit of the electronic component testing device.

[0026] Figure 16 This is a three-dimensional exploded view of the second inspection block and the second electrode of the supporting chassis in the electronic component testing device.

[0027] Figure 17 This is a bottom schematic diagram of the second inspection block of the supporting chassis in the electronic component testing device.

[0028] Figure 18 This is a schematic diagram of the connection of the switch in the switching circuit of the electronic component testing device.

[0029] [Symbol Explanation]

[0030] A: Machine

[0031] A1: Machine table surface

[0032] A2: Machine desktop

[0033] A21: Positioning hole

[0034] B: Chassis

[0035] B1: Feeding Block

[0036] B11: Feed suction groove

[0037] B12: Suction hole

[0038] B13: Short curved edge

[0039] B14: Long curved edge

[0040] B15: Front End

[0041] B16: Backend Edge

[0042] B17: Empty area

[0043] B171: Third suction groove

[0044] B172: Suction hole

[0045] B2: Check Block

[0046] B21: First Inspection Block

[0047] B211: First suction groove

[0048] B212: Suction hole

[0049] B213: Rib

[0050] B214: Collar

[0051] B215: Shaft hole

[0052] B216: Short curved edge

[0053] B217: Long curved edge

[0054] B218: Front-end edge

[0055] B219: Backend Edge

[0056] B22: Second Inspection Block

[0057] B221: Second suction groove

[0058] B222: Suction hole

[0059] B223: Rib

[0060] B224: Collar

[0061] B225: Shaft hole

[0062] B226: Short curved edge

[0063] B227: Long curved edge

[0064] B228: Front End

[0065] B229: Backend Edge

[0066] B23: Second Inspection Block

[0067] B3: Exit Block

[0068] B31: Discharge suction nozzle

[0069] B32: Suction hole

[0070] B33: Short curved edge

[0071] B34: Long curved edge

[0072] B35: Front Edge

[0073] B36: Backend Edge

[0074] C: Test board

[0075] C1: Seat Slot

[0076] C2: Guide trench

[0077] C3: Cleaning tank

[0078] C31: Expanded Convex Region

[0079] D: Feeding unit

[0080] E: Inspection Unit

[0081] E1: First Inspection Unit

[0082] E11: First Frame

[0083] E111: Mounting bracket

[0084] E1111: Fixing part

[0085] E1112: Slide

[0086] E1113: Adjustment component

[0087] E112: Support frame

[0088] E1121: Rail base

[0089] E1122: Sliding part

[0090] E1123: Support section

[0091] E1124: Elastic element

[0092] E1125: Adjustment component

[0093] E1126: Bar section

[0094] E1127: Pivot section

[0095] E113: Lifting frame

[0096] E1131: Yield Range

[0097] E1132: Support section

[0098] E1133: Fasteners

[0099] E1134: Embedded Hole

[0100] E1135: Stopper

[0101] E1136: Gasket

[0102] E12: First upper terminal module

[0103] E121: Case lid

[0104] E1211: Fixed cover base

[0105] E1212: Movable cover

[0106] E122: Upper Case Mount

[0107] E1221: Connector

[0108] E1222: Upper terminal block

[0109] E123: First upper terminal assembly

[0110] E1231: First upper terminal

[0111] E1232: Upper terminal block

[0112] E1233: Elastic element

[0113] E1234: Conductive sheet

[0114] E1235: Adapter Section

[0115] E1236: Connector

[0116] E1237: Connector

[0117] E13: First lower terminal module

[0118] E131: Lower terminal block

[0119] E132: Lower Case Mount

[0120] E133: First lower terminal

[0121] E134: Cable

[0122] E135: First electrode

[0123] E2: Second Inspection Unit

[0124] E21: Second frame

[0125] E211: Base

[0126] E2111: Pin

[0127] E212: Lifting Seat

[0128] E2121: Positioning hole

[0129] E2122: Grip

[0130] E2123: Screw fasteners

[0131] E2124:pedestal

[0132] E2125: First Fine-tuning Mount

[0133] E2126: Second Fine-tuning Mount

[0134] E2127: Mounting bracket

[0135] E2128: Third Fine-tuning Mount

[0136] E2129: Fine-tuning knob

[0137] E22: Second upper terminal module

[0138] E221: Base Plate

[0139] E2211: Limiting component

[0140] E222: Switching circuit

[0141] E2221: Switching Unit

[0142] E2222: Conductive socket

[0143] E2223: Connector

[0144] E2224: End

[0145] E2225: The other end

[0146] E223: Terminal block

[0147] E2231: Connector socket

[0148] E2232: Terminal assembly base

[0149] E224: Second upper terminal assembly

[0150] E2241: Second upper terminal

[0151] E2242: Upper terminal block

[0152] E2243: Stop

[0153] E2244: Elastic element

[0154] E2245: Conductive sheet

[0155] E2246: Adapter Section

[0156] E2247: Terminal pin

[0157] E23: Second lower terminal module

[0158] E231: Base Plate

[0159] E232: Switching Circuit

[0160] E2321: Switching Device

[0161] E2322: Conductive base

[0162] E2323: End

[0163] E2324: The other end

[0164] E233: Lower terminal block

[0165] E234: Second lower terminal

[0166] E2341: Top and bottom end

[0167] E2342: Connector

[0168] E235: Second electrode

[0169] E2351: Electrode section

[0170] E2352: Threaded section

[0171] E2353: Adjustment Section

[0172] E236: Electrode holder

[0173] E2361: Adjustment Hole

[0174] E3: Third Inspection Unit

[0175] F: Discharge unit

[0176] G: Feeding unit

[0177] H: Material guide frame

[0178] K: Collection Agency

[0179] L: Radial axis

[0180] M: Inspector Detailed Implementation

[0181] Please see Figure 1 , 2 As shown, this embodiment of the invention is described using an electronic component testing apparatus for testing capacitor-type components under test, but is not limited to the implementation of capacitor-type electronic components. A disc-shaped metal support base B is provided on a machine table A1 tilted at approximately 60 degrees on a machine table A. A test plate C, capable of carrying eight rows of electronic components, is provided on the support base B and rotates intermittently in a clockwise direction. Around the periphery of the support base B are a feeding unit D for loading the components under test, an inspection unit E for testing the characteristics of the components under test, and a discharge unit F for discharging and collecting the tested components. A feeding mechanism G for providing the components under test and a guide rack H for guiding the discharge unit F to a collection mechanism K are provided on a horizontal machine table A2 of the machine table A. The collection mechanism K, which accommodates multiple material boxes K1, is located at the front of the machine table A.

[0182] Please see Figure 2 As shown, the inspection unit E is provided with a first inspection unit E1 for checking the insulation resistance (commonly known as IR) of the capacitor, and two second inspection units E2 and E3 located before and after the first inspection unit E1 in the direction in which the test board C rotates intermittently, respectively, for checking the capacitance, loss or quality factor (commonly known as CD) of the capacitor; wherein, the second inspection unit E3 located after the first inspection unit E1 in the direction in which the intermittent rotation is performed can be omitted as needed.

[0183] Please see Figure 3 , 4 As shown, the supporting chassis B is composed of multiple independent but interconnectable sector-shaped blocks of different sizes, including a feeding block B1 corresponding to the feeding unit D, an inspection block B2 corresponding to the inspection unit E, and a discharge block B3 corresponding to the discharge unit F. The inspection block B2 is composed of a first inspection block B21 and two second inspection blocks B22 and B23, which are independent but interconnectable. The first inspection block B21 corresponds to the first inspection unit E1, and the two second inspection blocks B22 and B23 correspond to the two second inspection units E2 and E3, respectively.

[0184] The feeding block B1 is provided with multiple rows (8 rows in this embodiment) of concentric annular feeding grooves B11 arranged at radial intervals. Each feeding groove B11 is provided with multiple hollowed-out suction holes B12 arranged at intervals along the bottom of the feeding groove B11. The suction holes B12 can be connected to a negative pressure source to create a vacuum state within the feeding groove B11. The feeding block B1 includes a short arc edge B13 and a long arc edge B14 that are parallel to each other, as well as a front end edge B15 and a rear end edge B16 that form an included angle with each other.

[0185] The first inspection block B21 is provided with multiple rows (8 rows in this embodiment) of concentrically arranged concave annular first suction grooves B211 arranged at radial intervals. Each first suction groove B211 is provided with multiple hollow suction holes B212 arranged at intervals along the bottom of the first suction groove B211. On the partition ribs B213 at corresponding positions between every two first suction grooves B211 arranged in a radial straight line, there are multiple rows (16 rows in this embodiment) of spaced intervals located on the fan-shaped radial axis, each of which is provided with a collar B214 made of insulating material. Each collar B214 is provided with a shaft hole B215. The suction holes B212 can be connected to a negative pressure source to draw a vacuum, so that a negative pressure vacuum state is formed in the first suction groove B211. The first inspection block B21 includes a short arc edge B216 and a long arc edge B217 that are parallel to each other, and a front end edge B218 and a rear end edge B219 that are at an included angle to each other.

[0186] The second inspection block B22 is provided with multiple rows (eight rows in this embodiment) of concentrically arranged concave annular second suction grooves B221 at radially spaced intervals. Each second suction groove B221 has multiple hollow suction holes B222 arranged at intervals along the bottom of the second suction groove B221. Each row of the partition ribs B223 between each two second suction grooves B221 arranged in a radial straight line is provided with a collar B224 made of insulating material. Each collar B224 is provided with a shaft hole B225. The collars B224 in each row are located on the radial axis L at the center of the fan shape. The suction holes B222 can be connected to a negative pressure source to evacuate the vacuum, so that a negative pressure vacuum state is formed in the second suction groove B221. The second inspection block B22 includes a short arc edge B226 and a long arc edge B227 that are parallel to each other, and a front end edge B228 and a rear end edge B229 that are at an included angle to each other.

[0187] The second inspection block B23 has the same structure as the second inspection block B22, and the same logic applies, so it will not be repeated here; however, when the second inspection unit E3 is omitted as not needed as mentioned above, the second inspection block B23 can be constructed as follows. Figure 3 The collar B224 and shaft hole B225 in the second inspection block B22 are omitted as shown.

[0188] The discharge block B3 is provided with multiple rows (eight rows in this embodiment) of concentric recessed annular discharge grooves B31 arranged at radial intervals. Each discharge groove B31 is provided with multiple hollowed-out suction holes B32 arranged at intervals along the bottom of the discharge groove B31. The suction holes B32 can be connected to a negative pressure source to create a vacuum state within the discharge groove B31. The discharge block B3 includes a short arc edge B33 and a long arc edge B34 that are parallel to each other, as well as a front end edge B35 and a rear end edge B36 that form an included angle with each other.

[0189] The first suction groove B211 on the first inspection block B21 is connected to the second suction groove B221 on the second inspection blocks B22 and B23 when they are combined, but is not connected to the feeding suction groove B11 on the feeding block B1 or the discharging suction groove B31 on the discharging block B3 when they are combined. The feeding suction groove B11 on the feeding block B1 has a gap B17 at the rear end. The gap B17 is provided with a small section of the third suction groove B171 that is connected to the second suction groove B221 on the second inspection block B22 when they are combined, and the third suction groove B171 is provided with a hollow suction hole B172.

[0190] Please see Figure 3 , 5 As shown, the upper surface of the test plate C has multiple rows (eight rows in this embodiment) of concentrically arranged rectangular slots C1 spaced radially apart. Each row of slots C1 has multiple slots spaced at intervals, and the slots C1 corresponding to each row are arranged in a straight line at multiple rows. Each slot C1 can accommodate a test element, such as a capacitor, with electrodes at its upper and lower ends. The test element is positioned such that its electrodes are located at its upper and lower ends. Figure 5 The material is placed in the seat groove C1 at the feed unit D.

[0191] Please see Figure 3 , 6Each groove C1 on the lower surface of the test plate C has a recessed guide groove C2 extending radially outward from its bottom. Each guide groove C2 is connected to the feed suction groove B11, the first suction groove B211, the second suction groove B221, and the discharge suction groove B31 of the supporting chassis B during intermittent rotation of the test plate C. When negative pressure is introduced through the suction holes B12, B1213, B1223, and B32 in the supporting chassis B for vacuuming, the negative pressure can be transmitted through the feed suction groove B11, the first suction groove B211, the second suction groove B221, the third suction groove B221, the fourth suction groove B221, the fifth suction groove B32, and the sixth suction groove B31. Suction groove B221 and discharge suction groove B31 adsorb the test object (in this embodiment, a capacitor-type electronic component) placed in each of the seat grooves C1; a long strip of recessed cleaning groove C3 is formed between the two rows of seat grooves C1 on the lower surface of the test plate C; a raised area C31 is formed near each seat groove C1 of the cleaning groove C3, which is used to accommodate the dust generated by the friction between the lower surface of the test plate C and the supporting chassis B during long-term operation, so as to avoid clogging the bottom aperture of the seat groove C1.

[0192] Please see Figures 7-9 As shown, the first inspection unit E1 includes a first frame E11, a plurality of box-shaped first upper terminal modules E12 arranged in an arc-shaped parallel manner at intervals on the first frame E11, and a plurality of box-shaped first lower terminal modules E13 respectively arranged in an arc-shaped parallel manner below each of the first upper terminal modules E12; wherein,

[0193] The first frame E11 includes a fixed base E111, a support frame E112 that can move up and down relative to the fixed base E111, and a lifting frame E113 that can be lifted up and down or lowered. The fixed base E111 includes a fixing part E1111 that is horizontally arranged with the machine platform A1 and a sliding base E1112 that is perpendicular to the machine platform A1. Two adjusting parts E1113, which are bolted together, are provided on one side of the fixing part E1111. The two adjusting parts E1113 are arranged on the left and right with a spacing between them and are secured by bolts. Figure 1The fine-tuning fixing part A11 on the machine table surface A1 can finely adjust the left and right tilt positioning of the first seat E11. The support base E112 is provided with a rail seat E1121 arranged parallel to the slide E1112. The rail seat E1121 is provided with a sliding part E1122, which allows the rail seat E1121 to slide up and down relative to the slide E1112. On the other side of the support base E112 above the rail seat E1121 opposite to the fixing part E1111, a support part E1123 is extended parallel to the machine table surface A1. The lower end of the sliding part E1122 is supported by an elastic element E1124 made of spring, so that the support part E1123 is maintained at a predetermined height. The support base E112 and the rail seat E1121 are relative to the fixing part. On the same side of part E1111, there is a knob-like adjustment component E1125. The adjustment component E1125 is screwed onto the fixed base E111 with a threaded rod portion E1126. By rotating the adjustment component E1125, the support base E112 can be moved up and down. The lifting frame E113 is pivotally connected to a pivot portion E1127 on the support base E112 and can be lifted or placed on the support part E1124. The support part E1124 has a relief section E1131 that is arc-shaped and recessed from one side toward the fixed base E11. A left and right support portion E1132 is formed on each side of the relief section E1131. Each support portion E1132 is provided with a screw fastener E1133, which can screw the lifting frame E113 onto the support part E1124 for positioning.

[0194] Please see Figure 7 , 10As shown in Figure 11, each of the first upper terminal modules E12 is respectively disposed on the lifting frame E113 of the first base E11 and located above the test plate C; each of the first upper terminal modules E12 is provided with a cover E121 located above the lifting frame E113 and an upper housing E122 located below the lifting frame E113; the upper housing E122 is embedded in a recess E1134 of the lifting frame E113 at its upper end, and a pad E1136 is provided on the lifting frame E113 with a plurality of blocking holes E1135 respectively corresponding to the recess E1134. The diameter is smaller than the diameter of the recessed hole E1134, so that the upper end of the upper case seat E122 can be stopped and positioned; the case cover E121 includes a fixed cover seat E1211 located on one side and fixed to the pad E1136, and a movable cover seat E1212 located on the other side and detachably provided on the side of the fixed cover seat E1211; the upper case seat E122 includes a connecting seat E1221 located above and an upper terminal seat E1222 located below, and the connecting seat E1221 is embedded in the recessed hole E1134; the upper case seat E122 is provided with a plurality of linearly arranged (actual) spaced apart (in this case) (Example: 8) First upper terminal assemblies E123, each first upper terminal assembly E123 having, from bottom to top, a first upper terminal E1231 formed by a rolling wheel above the test plate C, an upper terminal seat E1232 for mounting the first upper terminal E1231 in a recessed cavity E1222 on the upper housing E122, an elastic element E1233 formed by a spring above the upper terminal seat E1232 in the cavity E1222 to provide up-and-down elastic driving force for the first upper terminal E1231, and one end connected to the first upper terminal E1231 and electrically A long, thin, conductive sheet E1234; a transition portion E1235 that fixes the other end of the conductive sheet E1234; a connector E1236 located in the connector E1221, with one end connected to the transition portion E1235, the other end of the conductive sheet E1234 being electrically connected and the other end protruding from the cover E121; a conductor E1237 that is welded and connected to the connector E1236 in the cover E121 and extends through a cable hole E1213 on the cover E121 to the outside of the first upper terminal module E12; the conductor E1237 can be a coaxial cable.

[0195] Each of the first lower terminal modules E13 is respectively located below the supporting chassis B. Each first lower terminal module E13 includes a lower terminal base E131 located above and a lower housing E132 located below the lower terminal base E131. The lower terminal base E131 has multiple (eight in this embodiment) linearly arranged first lower terminals E133 that are elastically movable (including springs, not shown in the figure) and can move slightly up and down. Each first lower terminal E133 may have, for example, an elastic probe. One end of each first lower terminal E133 is welded to the lower housing E132 and conducts a cable E134 extending through a cable hole E1321 on the lower housing E132 to the outside of the lower housing E132. Please refer to [link to relevant documentation]. Figures 11-12 Each first lower terminal E133 has one end abutting against the bottom end of a first electrode E135. The first electrode E135 is rod-shaped and is welded to the shaft hole B215 corresponding to the first inspection block B21 of the supporting chassis B, making it immovable. The upper end face of the first electrode E135 abuts against... Figure 6 Below the slot C1 on the test board C.

[0196] Please see Figures 13-15 As shown, the second inspection unit E2 has the same mechanism as E3. Similarly, the following description will focus on the second inspection unit E2. The second inspection unit E2 includes a second mounting frame E21, a box-shaped second upper terminal module E22 mounted on the second mounting frame E21, and a corresponding box-shaped second lower terminal module E23 located below the second upper terminal module E22.

[0197] The second frame E21 is mounted on the machine table A1 with a base E211. The first frame E11 and the second frame E21 are spaced apart and do not move from each other. The base E211 has a pin E2111 located on one side that can be pulled out along the X-axis, and a lifting seat E212 located on the upper surface and pivotally mounted to the base E211 on the other side opposite to the second upper terminal module E22. The lifting seat E212 has a positioning hole E2121 located on one side for the pin E2111 to be inserted when it is lifted, a handle E2122 located on the upper surface of the lifting seat E212 along the Z-axis for gripping the lifting seat E212 to lift it to one side, and a screw E2123 located on the upper surface of the lifting seat E212 for locking the lifting seat E212 to the base E211. A standing platform E2124 is located on the upper surface of the lifting base E212. Between the bottom of the platform E2124 and the lifting base E212, there is a first fine-tuning seat E2125 for fine-tuning the X-axis displacement of the platform E2124 and a second fine-tuning seat E2126 for fine-tuning the Y-axis displacement of the platform E2124. A fixing frame E2127 for fixing the second upper terminal module E22 is provided on one side of the platform E2124. Between one side of the platform E2124 and the fixing frame E2127, there is a third fine-tuning seat E2128 for fine-tuning the Y-axis displacement of the fixing frame E2127. The third fine-tuning seat E2125 is provided with a fine-tuning knob E2129 with scale for fine-tuning the distance height between the second upper terminal module E22 and the upper surface of the test plate C.

[0198] The second upper terminal module E22 has a base plate E221 for fixing to the fixing bracket E2127. The base plate E221 has a switching circuit E222 located above and a terminal block E223 located below. The terminal block E223 includes a connector block E2231 with a larger width located above and a terminal assembly block E2232 located below with a narrower width. The terminal assembly block E2232 is positioned between two spaced-apart limiting members E2211 on the base plate E221, while the connector block E2231 is positioned across the two limiting members E2211. The switching circuit E222 has a dry contact switcher E2221. Figure 18The switch E2221 uses a reed relay or a reel relay as the switch, wherein the reed relay uses a surface-mount reed relay. Relays can achieve the best effect in this embodiment; the terminal block E223 is provided with a plurality of (eight in this embodiment) second upper terminal assemblies E224 arranged in a straight line with a spacing between them. Each second upper terminal assembly E224 is provided with, from bottom to top, a second upper terminal E2241 consisting of a rolling wheel body located above the test plate C, an upper terminal block E2242 located in a recess E2231 on the terminal block E223 for mounting the second upper terminal E2241, a stop member E2243 with one end fixed to the upper terminal block E2242 and the other end maintaining a distance from the inner upper edge of the recess E2231 to limit the upper dead point of the second upper terminal E2241, and a spring consisting of a spring located above the upper terminal block E2242 in the recess E2231 to provide the upper and lower elastic driving force of the second upper terminal E2241. The circuit comprises: a component E2244; a long, thin, conductive sheet E2245 connected and electrically connected at one end to the second upper terminal E2241; a connector E2246 fixed at the other end of the conductive sheet E2245; and a terminal pin E2247 fixed to the connector E2246. The switching circuit E222 is mounted on two stacked circuit boards, with multiple conductive seats E2222 corresponding to the number of second upper terminals E2241 sandwiched between the two circuit boards. Each conductive seat E2222 is connected to a connector E2223. The connector E2223 is pluggably and detachably connected to the terminal pin E2247 in the second upper terminal assembly E224 in a male-female manner. Alternatively, the connector E2223 and the terminal pin E2247 can be fixed to the connector E2246 by a coaxial cable or a metal connector.

[0199] The second lower terminal module E23 is located below the supporting chassis B. The second lower terminal module E23 has a base plate E231. The base plate E231 has a switching circuit E232 located below and a lower terminal block E233 located above. The switching circuit E232 has a dry contact switcher E2321. Figure 18The switch E2321, for example, uses a reed relay or a reel relay as the switcher. In this embodiment, surface-mount reed relays are used for optimal performance. The lower terminal block E233 has multiple (eight in this embodiment) linearly arranged, spaced-apart second lower terminals E234 that are elastically fitted (with springs, not shown) and capable of slight up-and-down movement. These second lower terminals E234 may be, for example, elastic probes. Please refer to... Figures 15-17 The switching circuit E232 is mounted on two stacked circuit boards, with multiple conductive bases E2322 corresponding to the number of second lower terminals E234 sandwiched between the two circuit boards. Each second lower terminal E234 has a top end E2341 abutting against the bottom end of a second electrode E235, and its lower end connecting to a conductive base E2322 and thus to the switching circuit E232. The second electrode E235 is rod-shaped and, from top to bottom, has an electrode section E2351, a threaded section E2352 with an external thread, and a hexagonal cross-section (or an internal hexagonal recess) for fine-tuning by turning with a tool. The adjustment part E2353; an electrode seat E236 is provided below the shaft hole B215 corresponding to the second inspection block B22 of the support chassis B. The electrode seat E236 has a fine adjustment hole E2361 with an internal thread corresponding to the shaft hole B225 on the second inspection block B22 of the support chassis B. The second electrode E235 is screwed into the fine adjustment hole E2361 of the electrode seat E236 with the threaded part E2352, and the electrode part E2351 extends through the shaft hole B225 corresponding to the second inspection block B22 of the support chassis B, and the upper end face of the electrode part E2351 abuts against the shaft hole B225 on the second inspection block B22 of the support chassis B. Figure 6 Below the slot C1 on the test board C.

[0200] Please see Figure 15 , 18 This invention embodiment allows for testing of eight rows of electronic components, using two inspectors (commonly known as instruments) M to assist in the testing and inspection; the second inspection unit E2 is located in the switch circuit E222 of the upper second terminal module E22, where the dry contact switch switch E2221 is located, one end E2224 of which is connected to the inspector M, and the other end E2225 of the switch switch E2221 is connected to the second upper terminal assembly E224 exposed outside the second upper terminal module E222 via the conductive base E2222 and the connector E2223 and the terminal pin E2247.

[0201] The second inspection unit E2 is located in the switch circuit E232 of the lower second terminal module E23, where the dry contact switch switch E2321 is located. One end of the switch switch E2323 is connected to the inspector M, and the other end E2324 of the switch switch E2321 is connected to the upper top end E2341, which is exposed outside the second lower terminal E234 of the second lower terminal module E23 (by means of the conductive base E2322).

[0202] Taking a capacitor as an example, when the capacitor under test is placed in the slot C1 on the test plate C and transported by the intermittent clockwise rotating flow path, it first passes between the second upper terminal E2241 and the second electrode E235 of the second inspection unit E2 to test the capacitance, loss, or quality factor (commonly known as CD) of the capacitor under test. Then it passes between the first upper terminal E1231 and the first electrode E135 of the first inspection unit E1 to test the insulation resistance (commonly known as IR) of the capacitor under test. Then, if necessary, it can pass through the second inspection unit E3 to perform another capacitance, loss, or quality factor test. The first inspection unit E1 has multiple corresponding first upper terminal modules E12 and first lower terminal modules E13. Therefore, when performing the insulation resistance test of the capacitor, it can perform multi-stage testing in the manner of charging, charging, testing, and discharging for every four groups.

[0203] The first inspection unit E1 is used to check the insulation resistance of the test capacitor, and the test charge is relatively low. The first electrode E135 has less wear and tear, so it is welded to the shaft hole B215 corresponding to the support chassis B and cannot be moved. However, the second inspection unit E3 is used to test the capacitance, loss or quality factor of the capacitor, and the test charge is relatively high. Therefore, the design allows the second electrode E235 to be finely adjusted up and down to make relative displacement with respect to the shaft hole B225 on the second inspection block B22 of the support chassis B, so as to accommodate the higher wear and tear of the second electrode E235! When performing capacitance, loss, or quality factor (CD) tests on capacitors, the electronic components of the capacitor are first tested by the second inspection unit E2 to obtain a first measurement value. When the insulation resistance (IR) of the capacitor is tested by the first inspection unit E1, there will be a reduction. Therefore, the capacitor is then tested a second time by the second inspection unit E3 to obtain a second measurement value. The difference between the first measurement value and the second measurement value is used as the judgment value to evaluate whether the tested capacitor is a component that is expected to be acceptable.

[0204] The electronic component testing apparatus and method of this invention, in the second inspection units E2 and E3 for checking the capacitance, loss, or quality factor (CD) of the test capacitor, use the dry contact switch E2221 or the switch E2321 for switching. The dry contact switch E2221 and E2321 can be directly installed in the second upper terminal module E22 or the second lower terminal module E23, respectively. It does not have the bulky size of the mercury relay with wet contacts, nor does it require a long cable. Compared with electronic MOSFET circuits, it can achieve a low on-resistance of only about 30mΩ and a low stray capacitance of about 0.5pf or less during testing. Compared with the stray capacitance value of MOSFETs of up to 10pf or more, it can have a better anti-interference effect. It does not require a grounding circuit to dissipate stray capacitance, and it has a fast response speed when checking and testing capacitor-type electronic components, thus achieving better test accuracy.

[0205] The above description is merely an embodiment of the present invention and should not be construed as limiting the scope of the present invention. Any simple equivalent changes and modifications made in accordance with the scope of the patent application and the contents of the patent specification of the present invention shall still fall within the scope of the patent of the present invention.

Claims

1. An electronic component testing device, comprising: A machine platform, on which a machine platform is provided; A support chassis is mounted on the machine platform. A test plate that can be driven to rotate intermittently is mounted on the support chassis. A feeding unit, an inspection unit, and a discharge unit are arranged around the perimeter of the support chassis. The inspection unit is equipped with a first inspection unit capable of performing insulation resistance testing of capacitors. The first inspection unit is equipped with a first upper terminal module and a first lower terminal module correspondingly disposed below each of the first upper terminal modules. The first upper terminal module is equipped with a plurality of first upper terminals; the first lower terminal module is equipped with a plurality of first lower terminals. The inspection unit further includes a second inspection unit capable of inspecting the capacitance, loss, or quality factor of a capacitor. The second inspection unit includes a second upper terminal module and a second lower terminal module correspondingly disposed below the second upper terminal module. The second upper terminal module has a plurality of second upper terminals arranged in a straight line with a spacing between them. The second lower terminal module has a plurality of second lower terminals. The second inspection unit is equipped with a switching circuit, which is equipped with a dry contact switch as a switcher; the second upper terminal module and the second lower terminal module of the second inspection unit are each equipped with the switching circuit. The first upper terminal module of the first inspection unit is mounted on a first frame, and the second upper terminal module of the second inspection unit is mounted on a second frame. The first frame and the second frame are spaced apart and do not move from each other.

2. The electronic component testing apparatus as described in claim 1, wherein, The switch for this dry contact is either a reed relay or a reel relay.

3. The electronic component testing apparatus as described in claim 1, wherein, The second inspection unit consists of two units, located in front of and behind the first inspection unit, respectively, in the direction in which the test plate rotates intermittently.

4. The electronic component testing apparatus as described in claim 1, wherein, The supporting chassis is composed of multiple independent but interconnectable sector-shaped blocks of different sizes, including an inspection block corresponding to the inspection unit. The inspection block is composed of a first inspection block and a second inspection block, which are independent but interconnectable. The first inspection block is corresponding to the first inspection unit, and the second inspection block is corresponding to the second inspection unit.

5. The electronic component testing apparatus as described in claim 1, wherein, An electrode holder is provided below a shaft hole of the support chassis. The electrode holder has a fine adjustment hole corresponding to the shaft hole of the support chassis and having an internal thread. A second electrode is screwed into the fine adjustment hole of the electrode holder with a threaded portion, and an electrode portion extends through the shaft hole corresponding to the support chassis, with the upper end face of the electrode portion abutting against a groove on the test plate.

6. The electronic component testing apparatus as described in claim 1, wherein, The second bracket is mounted on the machine table with a base. The base has a pin on one side that can be pulled and displaced in the X-axis, and a hinge on the upper surface that is pivotally mounted to the base on the other side opposite to the second upper terminal module. The hinge has a positioning hole on one side for the pin to be inserted when it is lifted, a handle on the upper surface of the hinge for gripping the hinge in the Z-axis to lift it to one side, a screw on the upper surface of the hinge for locking the hinge to the base, and an upright platform on the upper surface of the hinge. The bottom of the platform and the hinge are provided with a first fine-tuning seat for fine-tuning the X-axis displacement of the platform and a second fine-tuning seat for fine-tuning the Y-axis displacement of the platform. A fixing frame for fixing the second upper terminal module is provided on one side of the platform. A third fine-tuning seat for fine-tuning the Y-axis displacement of the fixing frame is provided between one side of the platform and the fixing frame. The third fine-tuning seat is provided with a fine-tuning knob with a scale for fine-tuning the distance between the second upper terminal module and the upper surface of the test plate.

7. The electronic component testing apparatus as described in claim 1, wherein, The second upper terminal module has a base plate, on which the switching circuit is located above and a terminal block is located below. The terminal block has a plurality of second upper terminal assemblies arranged in a straight line with spacing between them. The second upper terminal assembly has, from bottom to top, the following components: the second upper terminal above the test plate; an upper terminal block in a recessed cavity in the terminal block for mounting the second upper terminal; an elastic member above the upper terminal block in the cavity for providing up-and-down elastic driving force for the second upper terminal; a stop member with one end fixed to the upper terminal block and the other end maintaining a distance from the upper edge of the cavity to limit the dead point of the second upper terminal; a conductive sheet with one end connected to the second upper terminal and electrically conductive; a connecting part for fixing the other end of the conductive sheet; and a terminal pin fixed to the connecting part.

8. The electronic component testing apparatus as described in claim 1, wherein, The switching circuit is located on a circuit board, which has multiple conductive seats corresponding to the number of the second upper terminals. Each conductive seat is connected to a connector, and the connector is pluggably connected to a terminal pin in the second upper terminal assembly.

9. The electronic component testing apparatus as described in claim 1, wherein, The second lower terminal module is provided with a base plate, on which the switching circuit is located below and a lower terminal block is located above, and the second lower terminal is provided on the lower terminal block.

10. The electronic component testing apparatus as claimed in claim 1, wherein, The upper end of the second lower terminal abuts against the bottom end of a second electrode. The second electrode is rod-shaped and has an electrode section, a threaded section with an external thread, and an adjustment section that can be turned by a tool for fine-tuning up and down from top to bottom.

11. A method for testing electronic components, using the electronic component testing apparatus as described in any one of claims 1, 2, 4 to 10, wherein the second inspection unit is provided in two parts, and when the component under test is transported in a slot on a test plate by an intermittent rotating flow path, it first passes through one of the second inspection units to be tested for capacitance, loss or quality factor, then passes through the first inspection unit to be tested for insulation resistance, and then passes through the other second inspection unit to be tested for capacitance, loss or quality factor.

12. The electronic component testing method as described in claim 11, wherein, The electronic component is tested by the first of the second inspection units to obtain a first measurement value, and then by the second inspection unit to perform a second test on the capacitance, loss or quality factor of the capacitor to obtain a second measurement value. The difference between the first measurement value and the second measurement value is used as a judgment value to evaluate whether the tested capacitor is a component that is expected to be acceptable.

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