Test device with follow-up adjustment structure and test method

Abstract

The embodiment of the application discloses a testing device with a follow-up adjusting structure and a testing method, in the process of pressing of a detection assembly to a detected piece, a first follow-up part, a second follow-up part and a detection head are sequentially abutted on a limiting surface, a top of the detected piece and a contact point, so as to meet the requirements of size detection and electrical performance detection of the detected piece. Thus, on the one hand, in the process of the detection assembly approaching the detected piece, the active part applies an elastic force on the detected piece, avoiding excessive extrusion on the detection part and the detected piece. On the other hand, the elastic force gradually increases in the process, so that the movement speed of the active part is slowed down, thereby avoiding the impact on the detection part and the detected piece when they are in contact. On the other hand, before the detection head presses the detected piece, the second follow-up part first presses the detected piece, so that the detected piece can tightly adhere to the bottom of the profiling groove.

Description

Technical Field

[0001] This invention relates to the field of product testing, and in particular to a testing device and testing method with a follow-up adjustment structure. Background Technology

[0002] Testing procedures before product shipment, packaging, or trial production are crucial for ensuring product pass rates and accelerating product development. This is especially true for 3C products, which have compact overall structures and internal components; therefore, testing is essential to guarantee stable operation. Improving product testing efficiency and optimizing testing processes are key challenges that need to be addressed. Summary of the Invention

[0003] In view of this, embodiments of the present invention provide a testing device and testing method with a follow-up adjustment structure. During the process of the detection component abutting against the test piece, the elastic displacement generated by the first follow-up part, the second follow-up part and multiple detection heads is utilized to make the process smoother and protect the test piece and the detection component.

[0004] According to a first aspect of the present invention, a testing apparatus having a follow-up adjustment structure is provided, comprising:

[0005] The supporting components include contoured grooves and limiting surfaces;

[0006] The detection component is located above the support component and is operable to move linearly relative to the contour groove. The detection component includes an active part, a first follower part, a second follower part, and multiple detection parts. Each detection part has a detection head. The first follower part and the second follower part are elastically connected to the active part, respectively. The active part has a mounting position. The multiple detection parts are fixed to the active part through the mounting position. The detection head, the first follower part, and the second follower part have elastic displacements toward the active part.

[0007] Furthermore, in the linear motion direction, the active part has a first stroke, a second stroke, and a third stroke that sequentially approach the contour groove. From the first stroke to the third stroke, the first follower abuts against the limiting surface and the first follower has an elastic displacement. From the second stroke to the third stroke, the second follower abuts against the top of the tested part and the second follower has an elastic displacement. In the third stroke, the detection head abuts against the contact point of the tested part and the detection head has an elastic displacement.

[0008] Furthermore, the testing device also includes multiple first elastic elements and multiple second elastic elements, the active part and the first follower part are connected by multiple first elastic elements, and the active part and the second follower part are connected by multiple second elastic elements;

[0009] The detection unit also includes multiple third elastic elements, through which the detection head generates elastic displacement.

[0010] The elastic deformation of the first elastic element is greater than that of the second and third elastic elements.

[0011] Furthermore, when the first elastic element is at its maximum elastic deformation, both the second and third elastic elements also have elastic deformation.

[0012] Furthermore, the sum of the elastic forces of the plurality of first elastic elements is greater than the sum of the elastic forces of the plurality of second elastic elements; and / or

[0013] The sum of the elastic forces of the multiple first elastic elements is greater than the sum of the elastic forces of the multiple third elastic elements.

[0014] Furthermore, in the linear motion direction, the active part also has a fourth stroke, which is farther away from the contour groove relative to the first stroke;

[0015] In the fourth stroke, the distance from the first follower to the limiting surface is the first distance, the distance from the second follower to the top of the workpiece is the second distance, and the distance from the detection head to the contact point of the workpiece is the third distance.

[0016] The first distance, the second distance, and the third distance decrease in that order.

[0017] Furthermore, the active part has multiple first guide holes;

[0018] The detection assembly also includes a plurality of first guide posts, each corresponding to a plurality of first guide holes. Each first guide post includes a connecting end and a hooking end, and a first guide surface located between the connecting end and the hooking end. The first guide post is telescopically inserted into the first guide hole through the first guide surface, and the connecting end is fixed to the first follower.

[0019] In the fourth stroke, the first follower is suspended below the driving part via the connecting end.

[0020] Furthermore, the active part also includes two plate-shaped members, and a plurality of first guide holes and a plurality of first elastic members are respectively disposed on the two plate-shaped members, and the plurality of first guide holes and the plurality of first elastic members are symmetrically distributed relative to the mounting position;

[0021] Multiple testing sections include multiple pairs of testing groups, which are arranged at intervals along the arrangement direction of the two plate-shaped components.

[0022] Furthermore, one of the plate-shaped member and the first follower is provided with a second guide hole, and the other is provided with a second guide post corresponding to the second guide hole; and / or

[0023] The supporting component also includes a limiting block, with a limiting surface located at the top of the limiting block. One of the limiting surface and the first follower is provided with a third guide hole, and the other is provided with a third guide post corresponding to the third guide hole.

[0024] Furthermore, the second follower includes a U-shaped body and multiple lugs. The U-shaped body includes a first end face and a second end face that are opposite to each other. The first end face and multiple lugs are located on the side away from the contour groove, and the multiple lugs extend in the bending direction of the U-shaped body.

[0025] The active part includes a mounting head, and the mounting position is located at the mounting head. The mounting head has a guide window that adapts to the U-shaped body.

[0026] The second end face faces the part being tested through the guide window, and the elastic force of the second elastic element acts on the top edge of the guide window through the support ear.

[0027] Furthermore, the installation position corresponds to the opening of the U-shaped body, and at least one clearance notch is provided on the second end face.

[0028] Furthermore, the bottom of the contour groove has a mating window;

[0029] The carrier components also include:

[0030] The base has a receiving groove at the top, which is located at the bottom of the contour groove and communicates with the contour groove through a mating window;

[0031] When the mating test piece is placed in the receiving groove, a portion of the top area of ​​the mating test piece is exposed from the mating window, wherein the mating test piece is paired with the test piece.

[0032] Furthermore, the load-bearing components also include:

[0033] Multiple first positioning parts, each first positioning part including an elastic body, the first positioning part being mounted on the top of the base and at least a portion of the elastic body being located on the top of the receiving groove;

[0034] When the mating test piece is placed in the receiving groove, the elastomer abuts against the side of the mating test piece.

[0035] Furthermore, the plurality of first positioning parts are converted into two first positioning parts, and the two first positioning parts are located on both sides of the receiving groove;

[0036] The elastomer is a strip-shaped structure, and the extension direction of the strip-shaped structure is perpendicular to the arrangement direction of the two first positioning parts. The strip-shaped structure has a second guide surface, which is opposite to the receiving groove.

[0037] When the mating test piece is placed in the receiving groove, the strip structure extends into the groove of the mating test piece.

[0038] Furthermore, the first opening is made laterally in the contour groove.

[0039] The carrier components also include:

[0040] The second positioning part has a first contouring surface that can extend and retract laterally along the contouring groove.

[0041] Furthermore, the bottom of the contour groove also has an arc-shaped edge, which surrounds the mating window. The arc-shaped edge has a second contouring surface and a clearance surface, which are located at the top and bottom of the arc-shaped edge, respectively. The clearance surface is adapted to the periphery of the area of ​​the mating window exposed by the mating test piece.

[0042] Furthermore, the contour groove has arc-shaped sidewalls;

[0043] The first contour surface is located above the curved edge and faces the curved sidewall.

[0044] Furthermore, the load-bearing components also include:

[0045] A substrate having a receiving window, the top of a base being located within the receiving window; and

[0046] The cover plate has a contoured groove located on it, and the cover plate is removably pressed onto the receiving window.

[0047] Secondly, embodiments of the present invention also provide a testing method comprising:

[0048] A testing device with a follow-up adjustment structure is provided. The testing device includes a support component and a detection component. The support component includes a contour groove and a limiting surface. The detection component is located above the support component and can be operably moved linearly relative to the contour groove. The detection component includes an active part, a first follower part, a second follower part, and a plurality of detection parts. Each detection part has a detection head. The first follower part and the second follower part are elastically connected to the active part, respectively. The active part has a mounting position. The plurality of detection parts are fixed to the active part through the mounting position. The detection head, the first follower part, and the second follower part have elastic displacements toward the active part.

[0049] The part to be inspected is placed in the contour groove and positioned.

[0050] The detection assembly moves towards the contour groove, pressing the first follower against the limiting surface and the second follower against the top of the workpiece being inspected, and the detection head...

[0051] The contact point is pressed against the part being tested;

[0052] The tested items are inspected by multiple inspection departments.

[0053] Furthermore, the bottom of the contour groove has a mating window;

[0054] The carrier components also include:

[0055] The base has a receiving groove at the top, which is located at the bottom of the contour groove and communicates with the contour groove through a mating window;

[0056] The part to be inspected is placed in the contour groove and positioned, before which the following steps are taken:

[0057] The mating test piece is placed in the receiving groove and positioned, wherein the mating test piece is paired with the test piece;

[0058] Align and expose a portion of the top of the mating test piece from the mating window.

[0059] Further, the part to be tested is placed in the contour groove and positioned, and / or the second follower is pressed against the top of the part to be tested, followed by:

[0060] The concentricity of the tested part and the mating tested part is checked.

[0061] This invention discloses a testing device and method with a follow-up adjustment structure. During the pressing process of the detection component against the tested object, the first follower, the second follower, and the detection head sequentially abut against the limiting surface, the top of the tested object, and the contact point to meet the requirements for dimensional and electrical performance testing of the tested object. Thus, on the one hand, as the detection component approaches the tested object, the active part applies elastic force to the tested object, avoiding excessive compression of the detection component and the tested object. On the other hand, the elastic force on the active part gradually increases during this process, slowing down the movement speed of the active part and preventing impact on the detection component and the tested object upon contact. Furthermore, before the detection head presses against the tested object, the second follower first presses the tested object to ensure that the tested object is tightly attached to the bottom of the contour groove. This allows for more accurate measurement of the positional tolerance between the tested object and the contour groove in this state. Simultaneously, when the detection head presses against the contact point, it also prevents one side of the tested object from tilting up. Attached Figure Description

[0062] The above and other objects, features and advantages of the present invention will become clearer from the following description of embodiments of the invention with reference to the accompanying drawings, in which:

[0063] Figure 1 This is a schematic diagram of the structure of the testing device with a follow-up adjustment structure according to an embodiment of the present invention;

[0064] Figure 2 This is a schematic diagram of the structure of the detection component and the carrier component according to an embodiment of the present invention;

[0065] Figure 3 This is an exploded view of one side of the detection component according to an embodiment of the present invention;

[0066] Figure 4 This is an exploded view of the other side of the detection component in an embodiment of the present invention;

[0067] Figure 5 This is an exploded view of the U-shaped body and the mounting head according to an embodiment of the present invention;

[0068] Figure 6 This is a schematic diagram of the first elastic element, the second elastic element, and the third elastic element in the compressed state according to an embodiment of the present invention;

[0069] Figure 7 This is a structural schematic diagram of one side of the load-bearing component according to an embodiment of the present invention;

[0070] Figure 8 This is a schematic diagram of the structure of the other side of the bearing component in an embodiment of the present invention;

[0071] Figure 9 This is an exploded view of one side of the support component according to an embodiment of the present invention;

[0072] Figure 10 This is an exploded view of the other side of the support component in an embodiment of the present invention;

[0073] Figure 11 This is a schematic diagram showing the positional relationship between the tested component, the mating tested component, and the receiving groove according to an embodiment of the present invention;

[0074] Figure 12 This is a schematic diagram showing the disassembled test piece and the mating test piece according to an embodiment of the present invention;

[0075] Figure 13 This is a schematic diagram of the working process of the testing device with a follow-up adjustment structure according to an embodiment of the present invention;

[0076] Figure 14 This is a flowchart illustrating the testing method according to an embodiment of the present invention.

[0077] Explanation of reference numerals in the attached figures:

[0078] 1-Detection components;

[0079] 11-First follower;

[0080] 12-Second follower;

[0081] 121-U-shaped body; 1211-First end face; 1212-Second end face; 1213-Avoidance notch; 122-Support lug;

[0082] 13-Active part; 131-Installation position; 132-Plate-shaped component; 133-Mounting head; 1331-Guide window; 1332-Support groove;

[0083] 14-Detection section; 141-Detection head; 142-Detection group;

[0084] 2-Bearing components;

[0085] 21-Shaped groove; 211-Matching window; 212-First opening; 213-Arched edge; 2131-Second shaped surface; 2132-Avoidance surface; 214-Arched sidewall;

[0086] 22-Limiting surface;

[0087] 23-Limit Block;

[0088] 24-Base; 241-Receiving slot;

[0089] 25-First positioning part; 251-Elastic body;

[0090] 26-Second positioning part; 261-First contoured surface;

[0091] 27-Substrate; 271-Receiving window;

[0092] 28-Cover plate;

[0093] 31-First elastic element; 32-Second elastic element; 33-Third elastic element; 34-Fourth elastic element;

[0094] 41-First guide hole; 42-First guide post; 421-Connecting end; 422-Hanging end; 423-First guide surface; 43-Second guide hole; 44-Second guide post; 45-Third guide hole; 46-Third guide post; 47-Second guide surface;

[0095] 5-Driver;

[0096] 6-Staff;

[0097] A - Component being tested; A1 - Contact point; A2 - First arc surface; A3 - Outer edge;

[0098] B - Fitting test piece; B1 - Groove; B2 - Second arc surface;

[0099] S1 - First leg of the journey; S2 - Second leg of the journey; S3 - Third leg of the journey; S4 - Fourth leg of the journey. Detailed Implementation

[0100] The present invention is described below based on embodiments, but the invention is not limited to these embodiments. In the detailed description of the invention below, certain specific details are described in detail. Those skilled in the art will fully understand the invention even without these details. To avoid obscuring the essence of the invention, well-known methods, processes, flows, elements, and circuits are not described in detail.

[0101] Furthermore, those skilled in the art should understand that the accompanying drawings provided herein are for illustrative purposes only and are not necessarily drawn to scale.

[0102] In the description of this invention, it should be understood that the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Furthermore, in the description of this invention, unless otherwise stated, "a plurality of" means two or more.

[0103] Figure 1 This is a schematic diagram of a testing device with a follow-up adjustment structure. Figure 2 This is a structural diagram of the detection component 1 and the support component 2. Figure 1 The detection component 1 and the support component 2 are equipped with protective covers on their outer sides. The right side houses the electrical distribution box, which controls the driver 5 of the testing device with a follow-up adjustment structure. The driver 5 includes a cylinder or a linear motor. The driver 5 is mounted on the bracket 6, and its output shaft is fixedly connected to the active part 13 to drive the active part 13 to move up and down.

[0104] Figure 3-4 This is a schematic diagram of the explosion of the detection component 2 in different directions. Figure 5 This is an exploded view of the U-shaped body 121 and the mounting head 133. The dotted lines in the three figures represent the outline of the inspected part A.

[0105] Figure 6 This diagram illustrates the compression states of the first elastic element 31, the second elastic element 32, and the third elastic element 33. The thick solid lines in the diagram represent the ultimate compression states of the first elastic element 31, the second elastic element 32, and the third elastic element 33, which is when the three springs are at their maximum deformation height.

[0106] As is easily understood, S1, S2, S3, and S4 in the diagram represent the correspondence between the stroke of the active part 13 during movement and the deformation of the first elastic element 31, the second elastic element 32, and the third elastic element 33, respectively. Therefore, the actual partial stroke of the active part 13 may differ from the deformation of each spring.

[0107] Figure 7-8 This is a schematic diagram of the structure of the load-bearing component 2 in different directions. Among them, Figure 8 The enlarged view on the right is a partial schematic of the contour groove 21 when viewed from the bottom.

[0108] Figure 9-10 This is a schematic diagram of the explosion of the supporting component 2 in different directions. Among them, Figure 9 The direction of the explosion of the tested component A is independent of its installation direction.

[0109] Figure 11-12 It is a test piece A and a mating test piece B that can be tested using the aforementioned test device with a follow-up adjustment structure. Among them, Figure 11 The two parts are in a close fit and placed in the receiving groove, with the thick solid line representing three sets of contacts A1. Figure 12 The two are in a separate state.

[0110] Optionally, the tested component A and the cooperating tested component B are arranged in pairs. During testing, they can transfer electrical energy or exchange information. Taking information exchange as an example, the tested component A and the cooperating tested component B can transmit Bluetooth signals or infrared signals. Taking the transfer of electrical energy as an example, the tested component A can be a wireless power transmitting module, and the cooperating tested component B can be a device including but not limited to watches or bracelets, which have a wireless power receiving module built into it.

[0111] It should be understood that the aforementioned information and electrical energy will experience significant spatial attenuation during transmission. Therefore, in the interaction test between the tested component A and the cooperating tested component B, the two need to be placed together. The following will use a wireless power transmitting module and a watch with a wireless power receiving module as examples to illustrate this.

[0112] Figure 12 This is a schematic diagram showing the disassembled test piece A and the mating test piece B according to an embodiment of the present invention. Figure 13 This is a schematic diagram of the working process of a testing device with a follow-up adjustment structure. State I, State II, State III, and State IV in the diagram sequentially illustrate some testing procedures. Specifically, State I is located in the fourth stroke S4, State II is located in the first stroke S1, State III is located in the second stroke S2, and State IV is located in the third stroke S3.

[0113] In some implementations, such as Figure 1-13 As shown, the testing device with a follower adjustment structure includes a support component 2 and a detection component 1. The support component 2 includes a contour groove 21 and a limiting surface 22. Correspondingly, the detection component 1 is configured to be located above the support component 2 and is operably linearly movable relative to the contour groove 21. The detection component 1 includes an active part 13, a first follower part 11, a second follower part 12, and a plurality of detection parts 14. Each detection part 14 has a detection head 141. The first follower part 11 and the second follower part 12 are elastically connected to the active part 13, respectively. The active part 13 has a mounting position 131. The plurality of detection parts 14 are fixed to the active part 13 through the mounting position 131. The detection head 141, the first follower part 11, and the second follower part 12 have elastic displacements toward the active part 13.

[0114] Under this premise, in the linear motion direction of the detection component 1, the active part 13 has a first stroke S1, a second stroke S2 ​​and a third stroke S3 that sequentially approach the contour groove 21. From the first stroke S1 to the third stroke S3, the first follower part 11 presses against the limiting surface 22 and the first follower part 11 has an elastic displacement. From the second stroke S2 ​​to the third stroke S3, the second follower part 12 presses against the top of the detected part A and the second follower part 12 has an elastic displacement. In the third stroke, the detection head 141 presses against the contact point A1 of the detected part A and the detection head 141 has an elastic displacement.

[0115] Before the first follower 11 presses against the limiting surface 22, the first follower 11, the second follower 12, and the detection head 141 all move synchronously with the movement of the driving unit 13. After the first follower 11, the second follower 12, and the detection head 141 are pressed, the driving unit 13 will continue to move during the first stroke S1 to the third stroke S3, but the movement of the first follower 11, the second follower 12, and the detection head 141 will be restricted.

[0116] The testing device with a follow-up adjustment structure in this embodiment, during the pressing of the detection component 1 against the test piece A, causes the first follower 11, the second follower 12, and the detection head 141 to sequentially abut against the limiting surface 22, the top of the test piece A, and the contact point A1, to meet the requirements for dimensional and electrical performance testing of the test piece A. Thus, on the one hand, as the detection component 1 approaches the test piece A, the active part 13 applies elastic force to the test piece A, avoiding excessive compression of the detection part 14 and the test piece A. On the other hand, the elastic force on the active part 13 gradually increases during this process, slowing down the movement speed of the active part 13 and preventing impact on the detection part 14 and the test piece A upon contact. Furthermore, before the detection head 141 presses against the test piece A, the second follower 12 first presses the test piece A, ensuring that the test piece A fits tightly against the bottom of the contour groove 21. This makes the measurement of the positional tolerance between the test piece A and the contour groove 21 more accurate in this state. At the same time, when the detection head 141 presses against the contact A1, it can also prevent the tested part A from tilting up.

[0117] Specifically, the detection part 14 is a spring needle. When the head of the spring needle is compressed, it can move along the sleeve of the spring needle to the tail of the spring needle. In contrast, the mounting position 131 has multiple mounting holes corresponding to the spring needle, and the spring needle can be fixed to the mounting holes through the sleeve.

[0118] Furthermore, the testing device with the follow-up adjustment structure also includes multiple first elastic elements 31 and multiple second elastic elements 32. The active part 13 and the first follower part 11 are connected through the multiple first elastic elements 31, and the active part 13 and the second follower part 12 are connected through the multiple second elastic elements 32. The detection part 14 also includes multiple third elastic elements 33, and the detection head 141 generates an elastic displacement through the third elastic elements 33. The elastic deformation of the first elastic element 31 is greater than the elastic deformation of the second elastic elements 32 and the third elastic elements 33.

[0119] Figure 6 The diagram illustrates a compression configuration of the first elastic element 31, the second elastic element 32, and the third elastic element 33. The dashed line represents the elastic deformation of the first elastic element 31, while the thick solid line represents the maximum compression state of the spring. The diagram shows that the elastic deformation of the first elastic element 31 is greater than that of the second and third elastic elements 32 and 33. This ensures that the first follower part 11 and the active part 13 maintain elasticity during the movement of the active part 13. It avoids a rigid connection between them, which could affect the operation of the testing device with the follower adjustment structure.

[0120] In some implementations, such as Figure 6 As shown, when the first elastic element 31 is at its maximum elastic deformation, the second elastic element 32 and the third elastic element 33 also have elastic deformation. Figure 6 The dimension La shown represents the height of the first elastic element 31 in its maximum compressed state. In this state, the second elastic element 32 and the third elastic element 33 remain within their elastic deformation range. Therefore, in this embodiment, by controlling the amount of elastic deformation of the first elastic element 31, the tested component A can be protected from excessive compression. When the driver 5 drives the active part 13 to move excessively, or fails to stop the movement in time, the resulting compressive force will be transmitted sequentially through the output shaft of the driver 5, the active part 13, the first elastic element 31, the first follower part 11, and the limiting surface 22 to the bearing assembly 2, thereby protecting the tested component A.

[0121] In some implementations, such as Figure 1-13 As shown, the sum of the elastic forces of the multiple first elastic elements 31 is greater than the sum of the elastic forces of the multiple second elastic elements 32. Simultaneously, the sum of the elastic forces of the multiple first elastic elements 31 is greater than the sum of the elastic forces of the multiple third elastic elements 33. In this embodiment, the elastic forces of the first elastic elements 31 are configured such that during the second stroke S2 ​​and the third stroke S3, as the first elastic elements 31 are compressed, the second elastic elements 32 and the third elastic elements 33 are also compressed synchronously. This further prevents the driving force of the driver 5 from being directly transmitted to the detected component A.

[0122] Specifically, the first elastic element 31, the second elastic element 32, and the third elastic element 33 are springs, and there are multiple springs. In this embodiment, when configuring the elastic force, not only the elastic force of the elastic elements placed at different positions is considered, but also the number of elastic elements at each position. This avoids the following situation: for example, although the elastic force of each first elastic element 31 is greater than that of the second elastic element 32, if the volume of the detected component A is large, the volume of the second follower 12 also increases accordingly, and therefore the number of second elastic elements 32 also increases accordingly. This would make the total elastic force of the multiple second elastic elements 32 greater than that of the multiple first elastic elements 31. When the active part 13 is in the second stroke S2, although the first elastic element 31 is compressed, the multiple second elastic elements 32 are still not compressed, or are not fully compressed, resulting in excessive transmission of the driving force of the driver 5 to the detected component A.

[0123] In some implementations, such as Figure 1-13 As shown, in the linear motion direction of the active part 13, the active part 13 also has a fourth stroke S4, which is farther away from the contour groove 21 relative to the first stroke S1. In this state, during the fourth stroke S4, the distance from the first follower 11 to the limiting surface 22 is the first distance, the distance from the second follower 12 to the top of the detected part A is the second distance, and the distance from the detection head 141 to the contact point A1 of the detected part A is the third distance. The first distance, the second distance, and the third distance are configured to decrease sequentially. Figure 12 As shown in state I, the active part 13 is in the fourth stroke S4, where L1, L2, and L3 are the first distance, the second distance, and the third distance, respectively. Thus, during the movement of the detection component 1 towards the carrier component 2, the active part 13, the first follower part 11, and the second follower part 12 come into contact with each other in sequence.

[0124] In some implementations, such as Figure 1-13 As shown, the active part 13 has a plurality of first guide holes 41. Correspondingly, the detection assembly 1 also includes a plurality of first guide posts 42, each corresponding to one of the first guide holes 41. Each first guide post 42 includes a connecting end 421 and a hooking end 422, and a first guide surface 423 located between the connecting end 421 and the hooking end 422. The first guide post 42 is telescopically inserted into the first guide hole 41 through the first guide surface 423, and the connecting end 421 is fixed to the first follower part 11. Simultaneously, during the fourth stroke S4, the first follower part 11 is suspended below the active part 13 through the hooking end 422.

[0125] The first follower 11 can be suspended below the driving part 13 via the first guide post 42 (e.g., Figure 3 and Figure 13As shown in state I), when the distance between the first follower 11 and the driving part 13 decreases, the hook end 422 of the first guide post 42 can also move upward toward the driving part 13 (as shown in state I). Figure 4 neutralization Figure 13 (As shown in region IIa), to compensate for the distance change between the active unit 13 and the first follower unit 11.

[0126] Preferably, to ensure that the first elastic element 31 can be stably disposed between the first follower part 11 and the driving part 13, the first elastic element 31 will also be partially compressed during the fourth stroke S4 (e.g., Figure 6 As shown in S4), this ensures that the first follower 11 will not sway relative to the active part 13 during the movement of the detection component 1.

[0127] In some implementations, such as Figure 1-13 As shown, the active part 13 also includes two plate-shaped members 132, with multiple first guide holes 41 and multiple first elastic members 31 respectively disposed on the two plate-shaped members 132, and the multiple first guide holes 41 and multiple first elastic members 31 are symmetrically distributed with respect to the mounting position 131. The multiple detection parts 14 include multiple pairs of detection groups 142, which are spaced apart along the arrangement direction of the two plate-shaped members 132.

[0128] Figure 11 The diagram illustrates a specific form of an electric power transmitting module. The thick solid lines in the diagram represent three pairs of detection groups 142, each pair consisting of two detection units 14 arranged at intervals. The left pair is connected to the positive terminal of the electric power transmitting coil, and the right pair is connected to the negative terminal. The middle pair is the ground of the electric power transmitting module. Through the interaction between each pair of contacts, various tests can be performed on the electric power transmitting coil. For example, in the 326.5kHz frequency band, with the excitation signal set to constant current mode and the watch coil terminals set to open circuit, the coupling coefficient between the electric power transmitting module and the watch can be measured. As another example, in the 1.78MHz frequency band, with the excitation signal set to constant current mode and the watch coil terminals set to open circuit, the energy consumption of the electric power transmitting module can be measured. On the other hand… Figure 11 The distance between the pairs of contacts A1 is relatively close, which makes it easy for short circuits to occur during testing.

[0129] Under this premise, it is necessary to simultaneously abut the three pairs of detection groups 142 against the contact A1 of the tested component A, while ensuring that each detection head 141 does not slip relative to the corresponding contact A1 during a prolonged test. To this end, this embodiment symmetrically arranges multiple first guide holes 41 and multiple first elastic members 31 along the arrangement direction of the multiple pairs of detection groups 142. Two plate-shaped members 132 have a wing-like structure, extending to both sides of the detection head 141. This greatly improves the horizontal positional accuracy of the multiple pairs of detection groups 142 located in the middle region. That is, the extension direction of the detection head 141 is perpendicular or almost perpendicular to the plane of the contact A1. This allows them to simultaneously press against the contact A1, preventing relative slippage between them.

[0130] Preferably, one of the plate-shaped member 132 and the first follower part 11 is provided with a second guide hole 43, and the other is provided with a second guide post 44 corresponding to the second guide hole 43. Meanwhile, the supporting assembly 2 also includes a limiting block 23, with a limiting surface 22 located at the top of the limiting block 23. One of the limiting surface 22 and the first follower part 11 is provided with a third guide hole 45, and the other is provided with a third guide post 46 corresponding to the third guide hole 45.

[0131] Specifically, Figure 3 The second guide post 44 is fixed to the active part 13, and the third guide post 46 is fixed to the first follower part 11. As the first follower part 11 approaches the limiting surface 22, the second guide post 44, in conjunction with the second guide hole 43, guides the relative position of the detection part 14 and the supporting assembly 2. Then, as the first elastic member 31 is compressed, the third guide post 46, in conjunction with the third guide hole 45, further guides the movement of the active part 13, ensuring that the second follower part 12 and the detection head 141 can accurately contact the corresponding position of the detected part A.

[0132] In some implementations, such as Figure 1-13 As shown, the second follower 12 includes a U-shaped body 121 and a plurality of lugs 122. The U-shaped body 121 includes a first end face 1211 and a second end face 1212 that are opposite to each other. The first end face 1211 and the plurality of lugs 122 are located on the side away from the contour groove 21, and the plurality of lugs 122 extend in the bending direction of the U-shaped body 121. The active part 13 includes a mounting head 133, and the mounting position 131 is located at the mounting head 133. The mounting head 133 has a guide window 1331 that is adapted to the U-shaped body 121. At the same time, the second end face 1212 faces the workpiece A through the guide window 1331, and the elastic force of the second elastic member 32 acts on the top edge of the guide window 1331 through the lugs 122.

[0133] Specifically, Figure 4The image shows one form of the U-shaped body 121. The top of the tested component A is roughly circular, and the bottom of the U-shaped body 121 can press against most of the top area of ​​the tested component A. Simultaneously, two of the three lugs 122 are located at the two ends of the second end face 1212 of the U-shaped body 121, and one is located in the middle of the first end face 1211 of the U-shaped body 121. Correspondingly, the mounting head 133 has lug grooves 1332 on its top, corresponding one-to-one with the lugs 122. In the third stroke S3 position, the lugs 122, under the action of the second elastic member 32, abut against the bottom of the lug groove 1332. In the second stroke S2, the second follower 12 is lifted by the upward force of the tested component A, and there is a certain gap between the lugs 122 and the bottom of the lug groove 1332 (e.g., ...). Figure 13 (As shown in the middle region IVa). That is, the second follower 12 in the second stroke S2 ​​slides in the lug groove 1332.

[0134] Furthermore, the mounting position 131 corresponds to the opening of the U-shaped body 121, and the second end face 1212 has at least one clearance notch 1213. This clearance notch 1213 can be used to avoid electrical components on the top of the tested component A, such as... Figure 12 As shown in region Ⅲa, the cable on the tested component A is connected to the side of the tested component A from one end and to the top of the tested component A from the other end. The clearance notch 1213 can prevent the second end face 1212 from interfering with the cable.

[0135] In some implementations, such as Figure 1-13 As shown, the bottom of the contour groove 21 has a mating window 211. The support assembly 2 also includes a base 24. The top of the base 24 has a receiving groove 241, which is located at the bottom of the contour groove 21 and communicates with the contour groove 21 through the mating window 211. When the mating detection piece B is placed in the receiving groove 241, a portion of the top area of ​​the mating detection piece B is exposed through the mating window 211, wherein the mating detection piece B is paired with the detected piece A.

[0136] Specifically, the testing component B is a watch equipped with a power receiving module. After placing the watch into the receiving slot 241, the side of the watch that receives wireless power faces the component A under test. A portion of the top of the testing component B is exposed through the mating window 211. Figure 10 and Figure 12 As can be seen, the tested component A has a first arc surface A2, and the cooperating tested component B has a second arc surface B2. The first arc surface A2 and the second arc surface B2 are partially spherical structures. Figure 10 The dotted line C in the figure represents the position of the top of the second arc surface B2 when the detection part B is set at the bottom of the contour groove 21.

[0137] When testing the test piece A using the testing device with the follow-up adjustment structure of this embodiment, the mating test piece B is first placed into the receiving groove 241, and the position of the receiving groove 241 is precisely set so that the top of the second arc surface B2 of the mating test piece B is exposed in the mating window 211. At this time, when the test piece A is placed into the contour groove 21, it can be ensured that the first arc surface A2 of the test piece A and the second arc surface B2 of the mating test piece B can fit together.

[0138] In some implementations, such as Figure 1-13 As shown, the supporting assembly 2 also includes multiple first positioning parts 25, each first positioning part 25 including an elastic body 251. The first positioning parts 25 are mounted on the top of the base 24, and at least a portion of the elastic body 251 is located on the top of the receiving groove 241. When the mating test piece B is placed in the receiving groove 241, the elastic body 251 abuts against the side of the mating test piece B. The contact between the elastic body 251 and the side of the mating test piece B ensures the stability of the position of the mating test piece B within the receiving groove 241. This ensures that the position of the mating test piece B remains stable during continuous replacement of the test piece A during testing.

[0139] Furthermore, the plurality of first positioning parts 25 are divided into two first positioning parts 25, which are located on both sides of the receiving groove 241. The elastic body 251 is a strip-shaped structure, the extension direction of which is perpendicular to the arrangement direction of the two first positioning parts 25, and the strip-shaped structure has a second guide surface 47, which is opposite to the receiving groove 241. When the mating detection piece B is placed in the receiving groove 241, the strip-shaped structure extends into the groove B1 of the mating detection piece B.

[0140] As is easily understood, in this embodiment, the groove B1 of the mating detection component B is used to connect with the watch strap. This embodiment utilizes the mating of the groove B1 with the strip structure to position the mating detection component B. Simultaneously, using the second guide surface 47, the mating detection component B can be directly pressed into the receiving groove 241 from above, thus completing the installation of the mating detection component B. This improves the installation efficiency of the mating detection component B.

[0141] In some implementations, such as Figure 1-13 As shown, the contour groove 21 has a first opening 212 on its side. Simultaneously, the supporting assembly 2 also includes a second positioning part 26, which has a first contour surface 261. The first contour surface 261 is telescopically movable along the side of the contour groove 21. The first contour surface 261 can abut against the side of the tested piece A. Figure 8 (As shown by the middle arrow A), thereby controlling the position of the tested part A in the horizontal direction.

[0142] Optionally, such as Figure 7As shown, a fourth elastic element 34 is also provided on the rear side of the second positioning part 26. The fourth elastic element 34 can make the first contoured surface 261 abut against the side of the tested part A, while ensuring a certain positive pressure.

[0143] Furthermore, the bottom of the contour groove 21 also has an arc-shaped edge 213, which surrounds the mating window 211. The arc-shaped edge 213 has a second contouring surface 2131 and a clearance surface 2132, which are located at the top and bottom of the arc-shaped edge 213, respectively. The clearance surface 2132 is adapted to the periphery of the area of ​​the mating detection piece B1 exposed in the mating window 211. Figure 12 The test piece A shown also has an outer edge A3, which surrounds the first arc surface A2. In this embodiment, the test piece A is suspended on the contour groove 21 through the cooperation of the outer edge A3 and the arc-shaped edge 213. The first arc surface A2 is fitted with the second arc surface B2 through the mating window 211. The clearance surface 2132 ensures that when the first arc surface A2 is located above the mating window 211, there is a gap between the arc-shaped edge 213 and the second arc surface B2, avoiding interference between them.

[0144] In some implementations, such as Figure 1-13 As shown, the contour groove 21 has an arc-shaped sidewall 214. The first contour surface 261 is located above the arc-shaped edge 213 and faces the arc-shaped sidewall 214. The side surface of the outer edge A3 contacts the arc-shaped sidewall 214, and the bottom surface of the outer edge A3 contacts the top surface of the arc-shaped edge 213, thereby achieving the positioning of the workpiece A being inspected.

[0145] In some implementations, such as Figure 1-13 As shown, the support assembly 2 also includes a substrate 27 and a cover plate 28. The substrate 27 has a receiving window 271, and the top of the base 24 is located within the receiving window 271. A contoured groove 21 is located in the cover plate 28, and the cover plate 28 is detachably pressed against the receiving window 271.

[0146] First, the base 24 can be installed below the substrate 27, and then the mating test piece B can be installed in the receiving groove 241. After ensuring the relative position of the mating test piece B and the receiving groove 241, the cover plate 28 is pressed onto the receiving window 271 so that the second arc surface B2 is exposed on the mating window 211. Thus, the preparation process of the test device with the follow-up adjustment structure can be simplified before testing the test piece A.

[0147] Figure 14 This is a flowchart illustrating the testing method of this embodiment. For example... Figure 1-14 As shown, the test device with a follow-up adjustment structure in the above embodiment can test the test piece A by the following method.

[0148] Step S100: Provide a testing device.

[0149] The testing device includes a support component 2 and a detection component 1. The support component 2 includes a contour groove 21 and a limiting surface 22. The detection component 1 is located above the support component 2 and can move linearly relative to the contour groove 21. The detection component 1 includes an active part 13, a first follower part 11, a second follower part 12 and a plurality of detection parts 14. The detection part 14 has a detection head 141. The first follower part 11 and the second follower part 12 are elastically connected to the active part 13 respectively. The active part 13 has a mounting position 131. The plurality of detection parts 14 are fixed to the active part 13 through the mounting position 131. The detection head 141, the first follower part 11 and the second follower part 12 have elastic displacement toward the active part 13.

[0150] Step S200: Place the part to be inspected A in the contour groove 21 and position it.

[0151] Specifically, the second positioning part 26 in the above embodiment is used to position the tested part A.

[0152] Step S300: Move the detection component 1 toward the contour groove 21, press the first follower 11 against the limiting surface 22, press the second follower 12 against the top of the tested part A, and press the detection head 141 against the contact point A1 of the tested part A.

[0153] Specifically, the first follower 11, the second follower 12, and the detection head 141 are sequentially pressed against the limiting surface 22, the top of the tested part A, and the contact point A1 of the tested part A. Thus, during a single descent of the detection assembly 1, the positional accuracy of the tested part A and the electrical performance are controlled sequentially. Positional accuracy measurement can be performed using devices such as vision sensors. This process is faster than electrical performance testing, therefore it is placed as a step prior to electrical performance testing. When the dimensional accuracy of the product is unqualified, the product can no longer fit well with the mating test part B, so further testing is unnecessary. This improves the testing efficiency of the tested part A.

[0154] Step S400: The part A to be tested is inspected by multiple inspection units 14. After ensuring that the dimensional accuracy of the part A to be tested meets the requirements, its electrical performance is tested.

[0155] In this embodiment, during the pressing of the detection component 1 against the test piece A, the first follower 11, the second follower 12, and the detection head 141 sequentially abut against the limiting surface 22, the top of the test piece A, and the contact point A1 to meet the requirements for dimensional and electrical performance testing of the test piece A. Thus, on the one hand, as the detection component 1 approaches the test piece A, the active part 13 applies elastic force to the test piece A, avoiding excessive compression of the detection part 14 and the test piece A. On the other hand, the elastic force on the active part 13 gradually increases during this process, slowing down its movement speed and preventing impact on the detection part 14 and the test piece A upon contact. Furthermore, before the detection head 141 presses against the test piece A, the second follower 12 first presses the test piece A, ensuring that the test piece A fits tightly against the bottom of the contour groove 21. This makes the measurement of the positional tolerance between the test piece A and the contour groove 21 more accurate in this state. At the same time, when the detection head 141 presses against the contact A1, it can also prevent the tested part A from tilting up.

[0156] In some implementations, such as Figure 1-14 As shown, before placing the test piece A in the contour groove 21 and positioning it, the process includes placing and positioning the mating test piece B in the receiving groove 241, wherein the mating test piece B is paired with the test piece A. A portion of the top area of ​​the mating test piece B is aligned and exposed from the mating window 211.

[0157] Specifically, the center of the second arc surface A2 is aligned with the center of the mating window 211 of the contour groove 21. This ensures that the relative positional accuracy of the test piece A and the mating test piece B can be precisely controlled each time a new test piece A is replaced.

[0158] In some implementations, such as Figure 1-14 As shown, the part to be tested A is placed in the contour groove 21 and positioned, and / or the second follower 12 is pressed against the top of the part to be tested A (e.g., Figure 13 As shown in region IIIb, at this point, the detection head 141 is not in contact with contact point A1. The process then includes detecting the concentricity of the tested component A and the mating detection component B. In this embodiment, the concentricity refers to the concentricity between the first arc surface A2 and the second arc surface B2 after the tested component A and the mating detection component B are in contact. This concentricity detection is performed after the tested component A is positioned. Therefore, it can be ensured that the energy transmitted from the power transmitting module to the power receiving module of the watch will not result in inaccurate detection information due to misalignment of the relative positions of the tested component A and the mating detection component B.

[0159] It's easy to understand that in the concentricity test of the tested part A and the mating tested part B, the main consideration is their relative position. Therefore, during the process of pressing the mating tested part B into the receiving groove 241, there is no need to excessively restrict the relative positional relationship between the mating tested part B and the receiving groove 241. It is sufficient to ensure that the relative position of the mating tested part B and the receiving groove 241 remains fixed. For example, Figure 11 L4 and L5 represent the distances from the tested part A and the mating tested part B to one side wall of the receiving groove 241, respectively. The concentricity can be calculated by determining the difference between L4 and L5. Alternatively, the distances from the tested part A and the mating tested part B to different side walls of the receiving groove 241 can be considered simultaneously for a more accurate calculation of concentricity.

[0160] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. For those skilled in the art, the present invention can be modified and varied in various ways. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principle of the present invention should be included within the scope of protection of the present invention.

Claims

1. A testing device with a follow-up adjustment structure, characterized in that, The testing apparatus includes: The supporting component (2) includes a contoured groove (21) and a limiting surface (22); A detection component (1) is located above the support component (2) and is operable to move linearly relative to the contour groove (21). The detection component (1) includes an active part (13), a first follower part (11), a second follower part (12), and a plurality of detection parts (14). The detection part (14) has a detection head (141). The first follower part (11) and the second follower part (12) are elastically connected to the active part (13) respectively. The active part (13) has a mounting position (131). The plurality of detection parts (14) are fixed to the active part (13) through the mounting position (131). The detection head (141), the first follower part (11), and the second follower part (12) have elastic displacements toward the active part (13). In the linear motion direction, the active part (13) has a first stroke (S1), a second stroke (S2) and a third stroke (S3) that are sequentially close to the contour groove (21). From the first stroke (S1) to the third stroke (S3), the first follower part (11) presses against the limiting surface (22) and the first follower part (11) has an elastic displacement. From the second stroke (S2) to the third stroke (S3), the second follower part (12) presses against the top of the tested item (A) and the second follower part (12) has an elastic displacement. In the third stroke, the detection head (141) presses against the contact point (A1) of the tested item (A) and the detection head (141) has an elastic displacement.

2. The testing device with a follow-up adjustment structure according to claim 1, characterized in that, The testing device further includes a plurality of first elastic elements (31) and a plurality of second elastic elements (32). The active part (13) and the first follower part (11) are connected through the plurality of first elastic elements (31), and the active part (13) and the second follower part (12) are connected through the plurality of second elastic elements (32). The detection unit (14) further includes a plurality of third elastic elements (33), and the detection head (141) generates an elastic displacement through the third elastic elements (33); The elastic deformation of the first elastic element (31) is greater than that of the second elastic element (32) and the third elastic element (33).

3. The testing device with a follow-up adjustment structure according to claim 2, characterized in that, When the first elastic element (31) is at its maximum elastic deformation, the second elastic element (32) and the third elastic element (33) both have elastic deformation.

4. The testing device with a follow-up adjustment structure according to claim 2, characterized in that, The sum of the elastic forces of the plurality of first elastic elements (31) is greater than the sum of the elastic forces of the plurality of second elastic elements (32); and / or The sum of the elastic forces of the plurality of first elastic elements (31) is greater than the sum of the elastic forces of the plurality of third elastic elements (33).

5. The testing device with a follow-up adjustment structure according to claim 2, characterized in that, In the linear motion direction, the active part (13) also has a fourth stroke (S4), which is away from the contour groove (21) relative to the first stroke (S1); In the fourth stroke (S4), the distance from the first follower (11) to the limiting surface (22) is the first distance, the distance from the second follower (12) to the top of the tested item (A) is the second distance, and the distance from the detection head (141) to the contact point (A1) of the tested item (A) is the third distance. The first distance, the second distance, and the third distance decrease sequentially.

6. The testing device with a follow-up adjustment structure according to claim 5, characterized in that, The active part (13) has a plurality of first guide holes (41); The detection component (1) further includes a plurality of first guide posts (42), each of which corresponds to a plurality of first guide holes (41). Each first guide post (42) includes a connecting end (421) and a hook end (422) opposite to each other, and a first guide surface (423) located between the connecting end (421) and the hook end (422). The first guide post (42) is telescopically inserted into the first guide hole (41) through the first guide surface (423). The connecting end (421) is fixed to the first follower (11). In the fourth stroke (S4), the first follower (11) is suspended below the active part (13) via the hook end (422).

7. The testing device with a follow-up adjustment structure according to claim 6, characterized in that, The active part (13) further includes two plate-shaped members (132), and a plurality of first guide holes (41) and a plurality of first elastic members (31) are respectively disposed on the two plate-shaped members (132), and the plurality of first guide holes (41) and the plurality of first elastic members (31) are symmetrically distributed relative to the mounting position (131); The plurality of detection units (14) include a plurality of pairs of detection groups (142), which are arranged at intervals along the arrangement direction of the two plate-shaped members (132).

8. The testing device with a follow-up adjustment structure according to claim 7, characterized in that, One of the plate-shaped member (132) and the first follower (11) is provided with a second guide hole (43), and the other is provided with a second guide post (44) corresponding to the second guide hole (43); and / or The bearing component (2) further includes a limiting block (23), the limiting surface (22) is located on the top of the limiting block (23), one of the limiting surface (22) and the first follower (11) is provided with a third guide hole (45), and the other is provided with a third guide post (46) corresponding to the third guide hole (45).

9. The testing device with a follow-up adjustment structure according to any one of claims 2-4, characterized in that, The second follower (12) includes a U-shaped body (121) and a plurality of lugs (122). The U-shaped body (121) includes a first end face (1211) and a second end face (1212) that are opposite to each other. The first end face (1211) and the plurality of lugs (122) are located on the side away from the contour groove (21). The plurality of lugs (122) extend toward the bending direction of the U-shaped body (121). The active part (13) includes a mounting head (133), the mounting position (131) is located at the mounting head (133), and the mounting head (133) has a guide window (1331) adapted to the U-shaped body (121); The second end face (1212) faces the test piece (A) through the guide window (1331), and the elastic force of the second elastic member (32) acts on the top edge of the guide window (1331) through the lug (122).

10. The testing device with a follow-up adjustment structure according to claim 9, characterized in that, The installation position (131) corresponds to the opening of the U-shaped body (121), and the second end face (1212) is provided with at least one clearance notch (1213).

11. The testing device with a follow-up adjustment structure according to any one of claims 1-8, characterized in that, The bottom of the contour groove (21) has a mating window (211); The carrier component (2) further includes: The base (24) has a receiving groove (241) on the top. The receiving groove (241) is located at the bottom of the contour groove (21) and communicates with the contour groove (21) through the mating window (211). When the mating test piece (B) is placed in the receiving groove (241), a portion of the top area of ​​the mating test piece (B) is exposed from the mating window (211), wherein the mating test piece (B) is paired with the test piece (A).

12. The testing device with a follow-up adjustment structure according to claim 11, characterized in that, The carrier component (2) further includes: A plurality of first positioning portions (25), each first positioning portion (25) including an elastomer (251), the first positioning portion (25) being mounted on the top of the base (24) and at least a portion of the elastomer (251) being located on the top of the receiving groove (241); When the mating test piece (B) is placed in the receiving groove (241), the elastomer (251) abuts against the side of the mating test piece (B).

13. The testing device with a follow-up adjustment structure according to claim 12, characterized in that, The plurality of first positioning parts (25) are two first positioning parts (25), and the two first positioning parts (25) are located on both sides of the receiving groove (241); The elastic body (251) is a strip structure, the extension direction of the strip structure is perpendicular to the arrangement direction of the two first positioning parts (25), the strip structure has a second guide surface (47), the second guide surface (47) is opposite to the receiving groove (241); When the mating test piece (B) is placed in the receiving groove (241), the strip structure extends into the groove (B1) of the mating test piece (B).

14. The testing device with a follow-up adjustment structure according to any one of claims 1-8, characterized in that, The contoured groove (21) has a first opening (212) on its side. The carrier component (2) further includes: The second positioning part (26) has a first contour surface (261) which is telescopically movable along the side of the contour groove (21).

15. The testing device with a follow-up adjustment structure according to claim 14, characterized in that, The bottom of the contour groove (21) also has a mating window (211) and an arc-shaped edge (213), the arc-shaped edge (213) surrounds the mating window (211), the arc-shaped edge (213) has a second contouring surface (2131) and a clearance surface (2132), the second contouring surface (2131) and the clearance surface (2132) are located at the top and bottom of the arc-shaped edge (213) respectively, wherein the clearance surface (2132) is adapted to the periphery of the area of ​​the mating detection element (B) exposed by the mating window (211).

16. The testing device with a follow-up adjustment structure according to claim 15, characterized in that, The contour groove (21) has an arc-shaped sidewall (214); The first contoured surface (261) is located above the arcuate edge (213) and toward the arcuate sidewall (214).

17. The testing device with a follow-up adjustment structure according to claim 11, characterized in that, The carrier component (2) further includes: A substrate (27) having a receiving window (271), the top of which is located within the receiving window (271); and Cover plate (28), the contoured groove (21) is located on the cover plate (28), the cover plate (28) is detachably pressed against the receiving window (271).

18. A testing method, characterized in that, The testing method includes: A testing device with a follow-up adjustment structure is provided, wherein the testing device includes a support component (2) and a detection component (1). The support component (2) includes a contour groove (21) and a limiting surface (22). The detection component (1) is located above the support component (2) and is operable to move linearly relative to the contour groove (21). The detection component (1) includes an active part (13), a first follow-up part (11), a second follow-up part (12), and a plurality of detection parts (14). The detection part (14) has a detection head (141). The first follow-up part (11) and the second follow-up part (12) are elastically connected to the active part (13) respectively. The active part (13) has a mounting position (131). The plurality of detection parts (14) are fixed to the active part (13) through the mounting position (131). The detection head (141), the first follow-up part (11), and the second follow-up part (12) have elastic displacements toward the active part (13). The part to be tested (A) is placed in the contour groove (21) and positioned; From the first stroke (S1) to the third stroke (S3), the first follower (11) is pressed against the limiting surface (22) and the first follower (11) has an elastic displacement. From the second stroke (S2) to the third stroke (S3), the second follower (12) is pressed against the top of the tested object (A) and the second follower (12) has an elastic displacement. In the third stroke, the detection head (141) is pressed against the contact point (A1) of the tested object (A) and the detection head (141) has an elastic displacement. The active part (13) has the first stroke (S1), the second stroke (S2) and the third stroke (S3) sequentially approaching the contour groove (21). The test piece (A) is tested by multiple testing units (14).

19. The test method according to claim 18, characterized in that, The bottom of the contour groove (21) has a mating window (211); The carrier component (2) further includes: The base (24) has a receiving groove (241) on the top. The receiving groove (241) is located at the bottom of the contour groove (21) and communicates with the contour groove (21) through the mating window (211). The process of placing the test piece (A) in the contour groove (21) and positioning it includes the following steps: The mating test piece (B) is placed in the receiving groove (241) and positioned, wherein the mating test piece (B) is paired with the test piece (A); Align and expose a portion of the top of the mating test piece (B) from the mating window (211).

20. The test method according to claim 19, characterized in that, The process of placing the test piece (A) in the contour groove (21) and positioning it, and / or pressing the second follower (12) against the top of the test piece (A), includes: The concentricity of the tested part (A) and the mating tested part (B) is checked.

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