A detection device and method

Abstract

The application provides a detection device and method, which can be applied to the field of light display and light measurement, and is especially suitable for the measurement scene of windshield glass. The device comprises a light source and an imaging module. The light source is used for emitting a first light beam to a sample to be measured, and the included angle between the polarization direction of the first light beam and the incident plane is 50 degrees or more than 130 degrees. The imaging module is used for generating a main image of the sample to be measured according to a second light beam, and generating a secondary image of the sample to be measured according to a third light beam. The second light beam is obtained by transmitting the first light beam in the sample to be measured, and the third light beam is obtained by transmitting and reflecting the first light beam in the sample to be measured. The device disclosed in the application sets the polarization direction of the incident light to be less than 50 degrees or more than 130 degrees with the incident plane, which is helpful for detecting the sample to be measured more close to the actual working condition, and improves the safety of user driving.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of light display, and more particularly, to a detection device and method. BACKGROUND

[0002] As one of the main components of vehicles such as automobiles, the windshield glass plays an important role in ensuring the driving safety of the driver, and therefore, strict optical indicators need to be set for the optical performance of the windshield glass. Among them, the secondary image deviation experiment is one of the experiments for testing the optical performance of the windshield glass. In the secondary image deviation experiment, the light beam emitted by the parallel light source generated by the collimating mirror forms a primary image at the imaging system after transmitting through the front surface and the rear surface of the sample to be tested (such as the windshield glass), and forms a secondary image at the imaging system after transmitting through the front surface of the sample to be tested, reflecting twice between the front surface and the rear surface of the sample to be tested, and finally transmitting through the rear surface of the sample to be tested.

[0003] Since in the case of non-perpendicular incidence, the reflectivity of s light (vertical light) with polarization direction perpendicular to the incident plane is higher than that of p light (parallel light) with polarization direction parallel to the incident plane, in order to obtain higher secondary image light power ratio for better detection of the optical performance of the sample to be tested, the industry usually adopts the method of strengthening the S component of the incident light beam for the secondary image deviation experiment.

[0004] However, s light is not natural light and cannot fully represent the actual working condition. In the actual driving process of vehicles and other vehicles, the s component of the reflection of the horizontal plane such as the ground will be strong, but the sky or the vertical plane is not necessarily strong in s component. For example, vehicles and other vehicles may encounter traffic lights above the vehicle at an intersection, or encounter high-power searchlights set above the road on a main traffic road. Therefore, the mainstream method currently adopted by the industry cannot detect the sample to be tested close to the actual working condition, which is not conducive to improving the safety of user driving. SUMMARY

[0005] The present application provides a detection device and method, which helps to detect the sample to be tested more close to the actual working condition and improves the safety of user driving.

[0006] In a first aspect, a detection device is provided. The device includes a light source and an imaging module. The light source is configured to emit a first light beam to a sample to be tested, and the polarization direction of the first light beam forms an angle of 50 degrees or less or 130 degrees or more with respect to the incident plane. The imaging module is configured to generate a primary image of the sample to be tested based on a second light beam and generate a secondary image of the sample to be tested based on a third light beam. The second light beam is obtained by transmitting the first light beam in the sample to be tested, and the third light beam is obtained by transmitting and reflecting the first light beam in the sample to be tested.

[0007] The device disclosed in the application sets the polarization direction of the incident light at an angle of 50 degrees or more than 130 degrees with the incident plane, which helps to detect the sample to be tested more close to the actual working condition, and improves the safety of user driving.

[0008] In combination with the first aspect, in some implementations of the first aspect, the device is configured to detect the optical performance of the sample to be tested under natural light. In this case, the polarization direction of the first light beam forms an angle of 40 degrees to 50 degrees with the incident plane, or the polarization direction of the first light beam forms an angle of 130 degrees to 140 degrees with the incident plane. In this way, by setting the polarization direction of the first light beam at a specific angle with the incident plane, the intensity ratio of s light and p light in the first light beam is between 1.4 and 0.7, which can approximate the case of natural light incident on the sample to be tested, and improve the safety of user driving.

[0009] In combination with the first aspect, in some implementations of the first aspect, the device is configured to detect the optical performance of the sample to be tested under natural light. In this case, the polarization direction of the first light beam forms an angle of 40 degrees to 50 degrees with the incident plane, or the polarization direction of the first light beam forms an angle of 130 degrees to 140 degrees with the incident plane. In this way, by setting the polarization direction of the first light beam at a specific angle with the incident plane, the intensity ratio of s light and p light in the first light beam is between 1.4 and 0.7, which can approximate the case of natural light incident on the sample to be tested, and improve the safety of user driving.

[0010] In combination with the first aspect, in some implementations of the first aspect, the light source is a laser.

[0011] In combination with the first aspect, in some implementations of the first aspect, the imaging module includes at least one of a charge-coupled device (CCD) or a complementary metal oxide semiconductor (CMOS).

[0012] In combination with the first aspect, in some implementations of the first aspect, the dynamic range of the imaging module is greater than or equal to 8 bits.

[0013] In combination with the first aspect, in some implementations of the first aspect, the imaging module has a nonlinear resolution.

[0014] In combination with the first aspect, in some implementations of the first aspect, the imaging module has a nonlinear resolution.

[0015] In some implementations of the first aspect, the apparatus further includes N plate elements, at least one of the N plate elements is placed on the light path between the light source and the sample to be measured, and / or at least one of the N plate elements is placed on the light path between the sample to be measured and the imaging unit, the N plate elements include a first plate element, the first plate element includes a first surface and a second surface, N is an integer greater than or equal to 1, and the normal of the first surface or the second surface of the first plate element is not equal to 0 with respect to the optical axis of the measurement system. The first plate element is configured to reflect the incident light from a third surface from the first surface or the second surface, so that the incident light from the third surface does not enter the imaging unit, the third surface is a surface that is not parallel to the first surface or the second surface, and the incident light of the third surface belongs to a part of the first light beam. In this way, the first plate element in the measurement apparatus is arranged to be inclined, so that the incident light incident on the first plate element is reflected out of the measurement apparatus, and the reflected light of the first plate element is beyond the observation range of the system, thereby avoiding the observation confusion caused by the secondary image of the non-measured sample, and more close to the actual working condition detection, which can more comprehensively detect the sample to be measured, and improve the safety of user driving.

[0016] In some implementations of the first aspect, the normal of the first surface or the second surface of the first plate element is δ with respect to the optical axis of the measurement apparatus, and the reflected light is 2δ with respect to the optical axis. Based on the above scheme, the measurement apparatus of the present application can expand the deviation angle of the device secondary image generated by the first plate element in the device, thereby avoiding the interference secondary image caused by the plate element in the device.

[0017] In some implementations of the first aspect, the measurement angle of the measurement apparatus is β, and δ and β satisfy: δ≥β / 2. Based on the above scheme, by designing the inclination angle of the first plate element to be more than half of the measurement angle, the device secondary image generated by the first plate element can be theoretically eliminated.

[0018] In some implementations of the first aspect, δ and β satisfy: δ≥β. Based on the above scheme, by designing the inclination angle of the first plate element to be greater than the measurement angle, the assembly error of the device can be further avoided, and it is ensured that the device secondary image generated by the first plate element is not observed, thereby ensuring the stability and accuracy of the measurement apparatus.

[0019] In some implementations of the first aspect, δ≤6 degrees. Based on the above scheme, by limiting the inclination angle of the first plate element to be within 6°, other errors caused by the inclination angle being too large can be avoided.

[0020] In some implementations of the first aspect, the third surface is parallel to the optical axis of the device. By arranging the first flat element at a position where the parallel light beam passes through, the focal plane of the light beam passing through the first flat element can be ensured not to change, further ensuring the accuracy of the measuring device.

[0021] In some implementations of the first aspect, the device further comprises a polarization module between the sample under test and the imaging module, the polarization module being configured to polarize the second light beam and the third light beam so that the second light beam and the third light beam are polarized light. In this way, by arranging the polarization module between the sample under test and the imaging module, the light beams entering the imaging module are polarized light, which helps to flexibly adjust the ratio of the optical power between the secondary image and the primary image according to actual detection requirements, and to comprehensively detect the sample under test.

[0022] In some implementations of the first aspect, the polarization angle of the polarization module satisfies:

[0023] γ∈[0, 2π].

[0024] In some implementations of the first aspect, the device further comprises a phase modulation module between the sample under test and the polarization module, the phase modulation module being configured to make the phase difference between the s component and the p component of the second light beam after passing through the polarization module a first value, and make the phase difference between the s component and the p component of the third light beam after passing through the polarization module a second value. In this way, the phase difference between the S component and the P component of the light beam entering the imaging module can be modulated by the phase modulation module, which can further improve the ratio of the optical power between the secondary image and the primary image.

[0025] In a second aspect, a detection method is provided. The method is performed by the detection device of the first aspect, and comprises: emitting a first light beam to a sample under test, the polarization direction of the first light beam being 50 degrees or more than 130 degrees with respect to the incident plane; generating a primary image of the sample under test according to a second light beam, and generating a secondary image of the sample under test according to a third light beam.

[0026] The second light beam is obtained by transmitting the first light beam in the sample under test, and the third light beam is obtained by transmitting and reflecting the first light beam in the sample under test.

[0027] According to the method provided in the present application, the polarization direction of the incident light is set to be 50 degrees or more than 130 degrees with respect to the incident plane, which helps to detect the sample under test more close to the actual working condition, and improves the safety of the user driving. BRIEF DESCRIPTION OF DRAWINGS

[0028] Figure 1 is an example application scenario to which the present application is applicable.

[0029] Figure 2 is a structural schematic diagram of a first detection device provided by an embodiment of the present application.

[0030] Figure 3 is a polarized light incidence schematic diagram provided by an embodiment of the present application.

[0031] Figure 4 is a polarized light vector decomposition schematic diagram provided by an embodiment of the present application.

[0032] Figure 5 is a structural schematic diagram of a second detection device provided by an embodiment of the present application.

[0033] Figure 6 is a structural schematic diagram of a third detection device provided by an embodiment of the present application.

[0034] Figure 7 is a structural schematic diagram of a fourth detection device provided by an embodiment of the present application.

[0035] Figure 8 is a structural schematic diagram of a fifth detection device provided by an embodiment of the present application.

[0036] Figure 9 is a flow schematic diagram of a detection method provided by an embodiment of the present application. DETAILED DESCRIPTION

[0037] The technical solutions in the present application will be described below with reference to the accompanying drawings.

[0038] The terms used in the following embodiments are only for the purpose of describing specific embodiments and are not intended to be limiting of the present application. As used in the specification and the appended claims of the present application, the singular forms “a,” “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises” and / or “comprising,” when used in this specification, specify the presence of stated features, integers, steps, operations, objects, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, objects, and / or components thereof. As used herein, the term “and / or” includes any and all combinations of one or more of the associated listed items. The term “ / ” generally represents an “or” relationship between the associated objects.

[0039] Reference to "one embodiment" or "an embodiment" or "some embodiments" or "one implementation" or "an implementation" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment. The appearances of the phrase "in one embodiment" or "in some embodiments" or "in other embodiments" or "in still other embodiments" or other similar phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. The terms "including," "comprising," "having," and "containing" are used herein and are meant to be open-ended terms that specifically permit the inclusion of one or more other features, structures, or characteristics.

[0040] As a component capable of protecting the driver from air flow and external impact, the windshield is widely used in the field of automobiles and the like. The driver observes the road conditions through the windshield, and the light emitted by the objects outside the automobile also enters the human eye through the windshield. Since the inner and outer sides of the windshield are not parallel, when the light emitted by the objects outside the automobile enters the human eye through the windshield, the human eye will observe the main image and the secondary image of the object, and the secondary image of the object will interfere with the driver's judgment of the road conditions, thereby affecting the driving safety of the driver. Therefore, it is necessary to detect the secondary image deviation optical performance of the windshield, that is, the secondary image deviation experiment. In the secondary image deviation experiment, the light beam emitted by the parallel light source generated by the collimator, on the one hand, forms a main image at the imaging system after transmitting through the front surface and the rear surface of the to-be-tested sample (such as the windshield), and on the other hand, after transmitting through the front surface of the to-be-tested sample, it is reflected twice by the rear surface and the front surface of the to-be-tested sample, and finally transmits through the rear surface of the to-be-tested sample and forms a secondary image at the imaging system.

[0041] As described above, the secondary image of the objects outside the automobile formed through the windshield is easy to interfere with the driver's judgment of the road conditions, and in actual application, it is necessary to reduce the deviation angle of the secondary image as much as possible to improve the imaging quality. When testing the optical performance of the windshield, it is necessary to improve the light power ratio (light intensity ratio) of the secondary image and the main image to better obtain the position characteristics of the secondary image, so as to more accurately test the optical performance (or secondary image deviation angle optical performance) of the windshield.

[0042] Since in the case of non-perpendicular incidence, the reflectivity of s light (vertical light) with polarization direction perpendicular to the incident plane is higher than that of p light (parallel light) with polarization direction parallel to the incident plane, in order to obtain a higher secondary image light power ratio to better detect the optical performance of the to-be-tested sample, the industry usually adopts the method of strengthening the S component of the incident light beam to perform the secondary image deviation experiment.

[0043] However, s light is not natural light and cannot fully represent the actual working condition. For example, Figure 1As shown, in the actual driving process of a vehicle or the like, the ground or the like horizontal surface reflection s component is relatively strong when acquiring road information, but the sky or the like vertical surface is not the s component when acquiring traffic light information. In addition, the vehicle or the like may encounter a high-power searchlight arranged above the road on the main road, which may interfere with the driver's line of sight. Therefore, the mainstream method currently used in the industry cannot detect the to-be-detected sample close to the actual working condition, which is not conducive to improving the safety of user driving.

[0044] Based on this, the application provides a detection device and method, which can help to detect the to-be-detected sample close to the actual working condition and improve the safety of user driving.

[0045] Figure 2 The structure diagram of the first detection device provided by the embodiment of the application is shown. As shown in the figure, Figure 2 The device 200 includes a light source 210 and an imaging module 220. The light source 210 is used to emit a first light beam to a to-be-detected sample 230, and the polarization direction of the first light beam and the angle with the incident plane are 50 degrees or less or 130 degrees or more. The imaging module 220 is used to generate a main image of the first light beam according to a second light beam and generate a secondary image of the first light beam according to a third light beam. The second light beam is obtained by transmitting the first light beam in the to-be-detected sample, and the third light beam is obtained by transmitting and reflecting the first light beam in the to-be-detected sample.

[0046] Optionally, the imaging module 220 can be a charge-coupled device (CCD) or a complementary metal oxide semiconductor (CMOS). The dynamic range of the imaging module 220 is greater than or equal to 8 bits. Optionally, the imaging module 220 has a nonlinear resolution or a logarithmic resolution.

[0047] Optionally, the light source 210 can be a laser light source or a light emitting diode (LED) light source or the like.

[0048] As shown in the figure, Figure 3 The incident light beam, i.e. the first light beam, propagates along the Z axis, and the angle between the polarization direction and the Y axis is α. The normal line of the incident plane of the to-be-detected sample is in the YZ plane, and the angle with the Z axis is θ1, and the incident angle is θ1. Therefore, as shown in the figure, Figure 4 The amplitude of the s component when the polarization direction of the first light beam is perpendicular to the incident plane is As, and the amplitude of the p component when the polarization direction of the first light beam is parallel to the incident plane is Ap, wherein:

[0049] A s =A*sinα

[0050] A p = A*cosα

[0051] The optical power Ws of s light and the optical power Wp of p light are respectively:

[0052] W s = A 2 sinα 2

[0053] W p = A 2 cosα 2

[0054] When α = 40 degrees, the optical power Ws of s light is 0.41A 2 , the optical power Wp of p light is 0.59A 2 , and the s light and p light intensity ratio is 0.7; when α = 50 degrees, the optical power Ws of s light is 0.59A 2 , the optical power Wp of p light is 0.41A 2 , and the s light and p light intensity ratio is 1.4. In this way, by setting the angle between the polarization direction of the first light beam and the incident plane to be between 40 degrees and 50 degrees or between 130 degrees and 140 degrees, the s light and p light intensity ratio in the first light beam is between 1.4 and 0.7, which can approximately simulate the case of natural light incident on the sample to be tested, is closer to the actual working condition detection, and improves the safety of user driving.

[0055] When α is less than 40 degrees or greater than 140 degrees, the s component ratio gradually decreases, and the p component ratio gradually increases. In this way, by setting the angle between the polarization direction of the first light beam and the incident plane to be less than 40 degrees or greater than 140 degrees, the p light component is dominant in the first light beam, which can approximately simulate the case of p light dominant incident on the sample to be tested, is closer to the actual working condition detection, and can perform more comprehensive detection on the sample to be tested, and improves the safety of user driving.

[0056] The device disclosed in the present application sets the polarization direction of the incident light to an angle of 50 degrees or less or 130 degrees or more with respect to the incident plane, which helps to detect the sample to be tested more closely to the actual working condition, and improves the safety of user driving.

[0057] Figure 5 A structure schematic diagram of a second detection device provided by an embodiment of the present application is shown. As shown in FIG. 4, the second detection device comprises a light source 41, a polarization beam splitter 42, a first light beam 43, a second light beam 44, a first light detector 45, a second light detector 46, a third light detector 47, a fourth light detector 48, a first polarization direction angle adjusting mechanism 49, and a second polarization direction angle adjusting mechanism 410. Figure 5As shown, the device 500 adds a first flat plate 540 between the light source 510 and the sample 530 to be measured, the light source 510 includes a window sheet 511, and the rest of the structure is the same as that of the device 200. The inclination angle of the first flat plate 540 is the angle between the normal of the first surface of the first flat plate 540 and the optical axis, and the inclination angle is δ, and the angle between the reflected light and the optical axis is 2δ. The first flat plate 510 can be a filter, a polarizer, an attenuator, etc.

[0058] In some embodiments, the inclination angle δ of the first flat plate 540 can be set to be greater than or equal to 1 / 2 of the measurement angle β of the device 200, i.e., δ≥β / 2. The measurement angle of the device 200 is the maximum measurement range of the imaging module 220, and when the imaging module in the imaging module 220 is a CCD, the measurement angle of the system is the imaging range of the CCD.

[0059] In some embodiments, the inclination angle δ of the first flat plate 540 can be set to be greater than or equal to the measurement angle β of the device 200, i.e., δ≥β. By setting a larger inclination angle, errors caused by device assembly can be avoided.

[0060] In some embodiments, the inclination angle δ of the first flat plate 540 can be set to be greater than or equal to the measurement angle β of the device 200, i.e., δ≥β. By setting a larger inclination angle, errors caused by device assembly can be avoided.

[0061] In this way, by placing the first flat plate 540 at an inclination, the secondary image light generated between the window sheet 511 inside the light source and the first flat plate 540 is reflected out of the imaging range of the device 500, thereby avoiding the generation of unnecessary device secondary images in the imaging module 520, and further improving the accuracy of measurement.

[0062] Figure 6 A structure diagram of a third device for detection provided by an embodiment of the present application is shown. As shown in Figure 6 The device 600 adds a first flat plate 640 between the sample 630 to be measured and the imaging module 620, and the imaging module 620 includes a camera protection window 621, and the rest of the structure is the same as that of the device 200. The inclination angle of the first flat plate 640 can refer to the inclination angle of the first flat plate 540 in Figure 5 The inclination angle of the first flat plate 640 will not be described here.

[0063] In this way, by placing the first flat plate 640 at an inclination, the secondary image light generated between the first flat plate 640 and the camera protection window 621 is reflected out of the imaging range of the device 600, thereby avoiding the generation of unnecessary device secondary images in the imaging module 620, and further improving the accuracy of measurement.

[0064] Figure 7 A structural schematic diagram of a fourth detecting device provided by an embodiment of the present application is shown. As shown, the device 700 adds a first flat plate 740 and a second flat plate 750 to the device 200. The second flat plate 750 can be a filter, a polarizer, an attenuator, a single lens, etc. Figure 7

[0065] As a possible implementation, the inclination angle of the second flat plate 750 is set to 0 degree, and the inclination angle of the first flat plate 740 is the same as that of the first flat plate 640 and the first flat plate 540, which will not be repeated here.

[0066] As another possible implementation, the inclination angle of the first flat plate 740 is set to 0 degree, and the inclination angle of the second flat plate 750 is the same as that of the first flat plate 640 and the first flat plate 540, which will not be repeated here.

[0067] In this way, the light of the secondary image of the device 700 can be prevented from entering the imaging module 720, thereby avoiding the generation of unnecessary device secondary images in the imaging module 720, and further improving the accuracy of measurement.

[0068] It should be understood that the above Figures 5 to 7 are only some embodiments of the detecting device provided by the present application. In the detecting device provided by the present application, other numbers of flat plate elements can also be included, for example, N, which can be equal to 3, 4 or even more. At least one of the plurality of N flat plate elements is placed on the light path between the light source (such as the light source 210, the light source 510, the light source 610, the light source 710, etc.) and the sample to be measured (such as the sample to be measured 230, the sample to be measured 530, the sample to be measured 630, the sample to be measured 730, etc.), and / or at least one of the N flat plate elements is placed on the light path between the sample to be measured (such as the sample to be measured 230, the sample to be measured 530, the sample to be measured 630, the sample to be measured 730, etc.) and the imaging module (the imaging module 220, the imaging module 520, the imaging module 620, the imaging module 720).

[0069] ​It should be noted that when the detection device provided in this application includes multiple plate elements, at most only one plate element can have a tilt angle of zero; the other plate elements need to be placed at an angle. Furthermore, it should be noted that the multiple tilted plate elements should be placed at positions through which the parallel light beam passes, including in the optical path between the light source (e.g., light source 210, light source 510, light source 610, light source 710, etc.) and the sample to be tested (e.g., sample 230, sample 530, sample 630, sample 730), and / or in the optical path between the sample to be tested (e.g., sample 230, sample 530, sample 630, sample 730) and the imaging modules (imaging modules 220, 520, 620, 720).

[0070] It should be understood that components such as lenses in the detection device are not tilted because they have the effect of diverging or converging light.

[0071] Figure 8 A schematic diagram of the structure of the fifth detection device provided in an embodiment of this application is shown. For example... Figure 8 As shown, device 800 adds a polarization module 840 to device 200, while the rest of the structure is the same as device 200. The polarization module 840 is located between the sample 830 and the imaging module 820. The polarization module 840 is used to set the phase difference between the s-component and p-component in the second beam to a first value, and to set the phase difference between the s-component and p-component in the third beam after passing through the polarization module to a second value.

[0072] Optionally, the polarization angle of polarization module 840 satisfies:

[0073] γ∈[0,2π].

[0074] Optionally, although not shown in the figure, the apparatus 800 may further include a phase modulation module located between the sample under test and the polarization module. The phase modulation module is configured to ensure that the phase difference between the s-component and p-component in the second beam after passing through the polarization module is a first value, and that the phase difference between the s-component and p-component in the third beam after passing through the polarization module is a second value. In this way, the phase difference between the s-component and p-component in the beam entering the imaging module can be modulated by the phase modulation module, which can further improve the optical power ratio between the secondary image and the primary image.

[0075] This allows the phase difference between the s-component and p-component in the beam entering the imaging module to be modulated by the phase modulation module, which can further improve the optical power ratio between the secondary image and the primary image.

[0076] It should be understood that the various detection devices provided in the embodiments of this application can be combined arbitrarily, and this application does not limit them.

[0077] Figure 9 A flowchart illustrating the detection method provided in an embodiment of this application is shown. Method 900 is executed by any one of the aforementioned devices 200, 500 to 800.

[0078] S910 emits a first beam to the sample under test, and the polarization direction of the first beam makes an angle of less than 50 degrees or more than 130 degrees with the incident surface.

[0079] S920 generates a primary image of the sample under test based on the second beam and a secondary image of the sample under test based on the third beam.

[0080] The second beam is obtained by transmitting the first beam through the sample to be tested, and the third beam is obtained by transmitting and reflecting the first beam through the sample to be tested.

[0081] According to the method provided in this application, setting the polarization direction of the incident light to have an angle of less than 50 degrees or more than 130 degrees with the incident plane helps to conduct tests on the sample that are closer to actual working conditions, thereby improving the safety of the user's driving.

[0082] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A detection device for performing a secondary image deviation experiment on a sample to be tested, characterized in that, include: A light source is used to emit a first light beam to the sample to be tested, wherein the polarization direction of the first light beam makes an angle of less than 50 degrees or more than 130 degrees with the incident surface; An imaging module is used to generate a primary image of the sample under test based on a second beam and a secondary image of the sample under test based on a third beam, wherein the second beam is obtained by transmitting the first beam through the sample under test and the third beam is obtained by transmitting and reflecting the first beam through the sample under test.

2. The apparatus according to claim 1, characterized in that, The device is used to detect the optical properties of the sample under natural light. The polarization direction of the first beam makes an angle of 40 degrees to 50 degrees with the incident surface, or... The polarization direction of the first beam makes an angle of 130 to 140 degrees with the incident surface.

3. The apparatus according to claim 1, characterized in that, The device is used to detect the optical performance of the sample under test when parallel light is dominant. The polarization direction of the first beam makes an angle of less than or equal to 40 degrees with the incident surface, or... The polarization direction of the first beam makes an angle greater than or equal to 140 degrees with the incident surface.

4. The apparatus according to claim 1, characterized in that, The light source is a laser.

5. The apparatus according to claim 1, characterized in that, The imaging module includes at least one of charge-coupled device (CCD) or complementary metal-oxide-semiconductor (CMOS).

6. The apparatus according to claim 1, characterized in that, The dynamic range of the imaging module is greater than or equal to 8 bits.

7. The apparatus according to claim 1, characterized in that, The imaging module has a non-linear resolution.

8. The apparatus according to claim 1, characterized in that, The imaging module has logarithmic resolution.

9. The apparatus according to claim 1, characterized in that, The device further includes N plate elements, at least one of which is placed in the optical path between the light source and the sample under test, and / or at least one of the N plate elements is placed in the optical path between the sample under test and the imaging module. The N plate elements include a first plate element, which has a first surface and a second surface. N is a positive integer, and the angle between the normal to the first surface or the second surface of the first plate element and the optical axis of the device is not equal to 0. The first plate element is used to reflect outgoing light from the third surface from the first surface or the second surface so that the outgoing light from the third surface does not enter the imaging module. The third surface is a surface that is not parallel to the first surface or the second surface, and the incident light from the third surface is a part of the first light beam.

10. The apparatus according to claim 9, characterized in that, The angle between the normal of the first surface or the second surface of the first flat plate element and the optical axis of the device is δ, and the angle between the reflected light and the optical axis is 2δ.

11. The apparatus according to claim 10, characterized in that, The measuring angle of the device is β, and δ and β satisfy: δ≥β / 2.

12. The apparatus according to claim 11, characterized in that... δ and β satisfy: δ≥β.

13. The apparatus according to any one of claims 10 to 12, characterized in that, δ≤6 degrees.

14. The apparatus according to any one of claims 9 to 12, characterized in that, The emitted light from the third surface is parallel to the optical axis of the device.

15. The apparatus according to any one of claims 1 to 12, characterized in that, The device further includes a polarization module located between the sample to be tested and the imaging module. The polarization module is used to polarize the second beam and the third beam so that the second beam and the third beam are polarized light.

16. The apparatus according to claim 15, characterized in that, The polarization angle of the polarization module satisfies: 。 17. The apparatus according to claim 16, characterized in that, The device further includes a phase modulation module located between the sample to be tested and the polarization module, which is configured to make the phase difference between the s component and the p component in the second beam after passing through the polarization module a first value, and to make the phase difference between the s component and the p component in the third beam after passing through the polarization module a second value.

18. A method for detecting secondary image deviation in a sample to be tested, characterized in that, include: A first beam is emitted to the sample to be tested, wherein the polarization direction of the first beam makes an angle of less than 50 degrees or more than 130 degrees with the incident surface; The primary image of the sample under test is generated by the second beam, and the secondary image of the sample under test is generated by the third beam. The second beam is obtained by the transmission of the first beam through the sample under test, and the third beam is obtained by the transmission and reflection of the first beam through the sample under test.

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