An automated integrated circuit board testing system and apparatus
The automated integrated circuit whole machine testing system and operating console device have solved the problems of complex integrated circuit whole machine testing process and errors caused by manual data processing, and have achieved efficient and accurate test result display and data analysis.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- MICRONET UNION TECH (CHENGDU) CO LTD
- Filing Date
- 2023-01-17
- Publication Date
- 2026-04-21
AI Technical Summary
The integrated circuit system testing process is complex and produces a large amount of test data. Relying on manual processing can easily lead to errors and affect the test results.
Design an automated integrated circuit whole machine testing system, including an acquisition unit, a central controller, a transmission module, a comparison module, a drawing module, and a test operation table device. The system acquires, transmits, compares, and displays test data through an automated process, and achieves automation and accuracy in whole machine testing by combining clamping and pushing mechanisms.
This improves the completeness and rigor of the overall testing, effectively avoids oversights in the testing process, and ensures the testing results.
Smart Images

Figure CN116125249B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of electronic product testing technology, specifically an automated integrated circuit whole machine testing system and device. Background Technology
[0002] An integrated circuit is a miniature electronic device or component. Using specific processes, transistors, resistors, capacitors, inductors, and other components required for a circuit, along with interconnecting wiring, are fabricated on one or several small pieces of semiconductor wafers or dielectric substrates, and then packaged in a casing to form a miniature structure with the required circuit function. All components are structurally integrated into a single unit, representing a significant step forward in the miniaturization, low power consumption, intelligence, and high reliability of electronic components.
[0003] Today, integrated circuits play a vital role in all walks of life and are the cornerstone of modern information society. The meaning of integrated circuits has far exceeded its original definition, but its core element remains unchanged: "integration." The various disciplines derived from it mostly revolve around the three questions of "what to integrate," "how to integrate," and "how to handle the advantages and disadvantages of integration."
[0004] In actual production, testing of integrated circuit systems is an essential process. Typically, the testing process is quite complex and produces a large amount of test data. Currently, the data is mostly compiled by staff, which can easily lead to errors and affect the test results. Summary of the Invention
[0005] The purpose of this invention is to provide an automated integrated circuit whole machine testing system and apparatus to solve the problems mentioned in the background art.
[0006] To achieve the above objectives, the present invention provides the following technical solution:
[0007] An automated integrated circuit system testing system includes an acquisition unit for acquiring system test data, and further includes:
[0008] The central controller establishes communication with the acquisition unit and receives the whole machine test data sent by the acquisition unit through its receiving module;
[0009] The transmission module establishes communication with the receiving module to transmit the whole machine test data to the comparison module and to the database for storage. At the same time, the comparison module retrieves the pre-stored data in the memory and compares the whole machine test data with the pre-stored data. The comparison result is analyzed and judged by the analysis and judgment module.
[0010] The plotting module is used to receive the data comparison results sent by the comparison module, and to plot the image based on the data comparison results. The display module displays the real-time output voltage change curve, the real-time output current change curve, and the overall power-on stability curve.
[0011] A test bench device for providing complete system test data to the automated integrated circuit complete system test system includes a base, a horizontal plate fixed on the base, and a test bench disposed on one side of the base, and further includes:
[0012] A feeding chute is located on the side of the horizontal plate facing the test platform, and a gap is reserved between the base and the horizontal plate. The feeding chute is located in the gap and is used to transport the whole machine to be tested to the test platform.
[0013] The housing is fixed to the horizontal plate and is used to hold the whole machine to be tested. One side of the housing is open. A side plate is movably provided on the housing through an elastic mechanism. The side plate is used to block the open side of the housing to form a storage chamber for placing the whole machine to be tested inside the housing.
[0014] An intermittent pushing mechanism, installed on the housing, is used to push the test unit in the storage chamber and allow the test unit to fall onto the discharge chute through the strip opening at the bottom of the housing.
[0015] A clamping mechanism is installed on the test bench and connected to the intermittent pushing mechanism through a transmission mechanism. The clamping mechanism is used to receive the whole machine to be tested falling from the feeding chute and to perform a clamping and fixing action on the whole machine to be tested. The transmission mechanism is triggered after the clamping mechanism releases the clamping and fixing state of the whole machine and releases the whole machine, so as to cause the intermittent pushing mechanism to move and perform a pushing action on the whole machine to be tested in the storage chamber.
[0016] As a further embodiment of the present invention: the intermittent pushing mechanism includes a push plate slidably disposed in the housing, a rack plate fixed to the push plate, and a gear rotatably mounted on the side plate. The gear meshes with the teeth on the rack plate, and the rotation shaft of the gear is connected to the transmission mechanism.
[0017] As a further embodiment of the present invention: the intermittent pushing mechanism includes a push plate slidably disposed in the housing, a rack plate fixed to the push plate, and a gear rotatably mounted on the side plate. The gear meshes with the teeth on the rack plate, and the rotation shaft of the gear is connected to the transmission mechanism.
[0018] As a further embodiment of the present invention: two opposing upright plates are fixedly installed on the test bench, and the clamping mechanism includes a bidirectional lead screw rotatably installed between the two upright plates and two transverse plates symmetrically arranged on the bidirectional lead screw;
[0019] Among them, the two transverse sliding plates are threadedly connected to the bidirectional lead screw, and each of the two transverse sliding plates is rotatably mounted with a support plate. The support plate is arranged in an "L" shape and is used to support the whole machine and clamp and fix the whole machine.
[0020] An orientation control component is also installed between the two upright plates, and the orientation control component is connected to the rotation shaft of the two support plates.
[0021] As a further embodiment of the present invention: the orientation control component includes two shafts that rotate on the two vertical plates respectively and two connecting columns that are fixedly connected to the two shafts. A connecting shaft is also rotatably installed on each of the two horizontal moving plates. The connecting shaft is connected to the rotating shaft of the support plate through a second transmission belt.
[0022] The connecting column passes through the two connecting shafts and is slidably connected to the connecting shafts, and the connecting shafts coincide with the central axis of the two shaft members, one of the shaft members being connected to a positioning structure.
[0023] As a further embodiment of the present invention: the positioning structure includes a turntable fixed to the shaft and a rocker arm slidably disposed at the eccentric position of the turntable via an elastic element, and the upright plate is provided with a locking hole for inserting the rocker arm;
[0024] The elastic element includes a ring fixed to the rocker arm and a second cylindrical spring sleeved on the outer periphery of the rocker arm. One end of the second cylindrical spring is connected to the ring, and the other end is connected to the turntable.
[0025] As a further embodiment of the present invention: the transmission mechanism includes a long strip plate fixedly installed on one of the transverse plates and a ratchet rotatably installed on the test bench. The bottom of the long strip plate is provided with a plurality of inclined grooves at equal intervals along its length, and each inclined groove is hinged with a pawl that cooperates with the ratchet.
[0026] The ratchet's rotation shaft is connected to a drive shaft rotatably mounted on the base via a first drive belt, and the drive shaft is connected to the gear's rotation shaft via a sliding fitting structure.
[0027] As a further embodiment of the present invention: the sliding fitting structure includes a rotating shaft rotatably mounted on the base and a sleeve rotatably mounted on the side plate and slidably fitted with the rotating shaft. The end of the sleeve away from the base is connected to the rotating shaft of the gear through a first bevel gear set, and the end of the rotating shaft facing the transmission shaft is connected to the transmission shaft through a second bevel gear set.
[0028] The outer wall of the rotating shaft has multiple strip-shaped protrusions equidistantly arranged along the circumference, and the inner wall of the sleeve has multiple strip-shaped grooves equidistantly arranged along the circumference. The strip-shaped grooves and the strip-shaped protrusions are slidably adapted to each other.
[0029] As a further embodiment of the present invention: the elastic mechanism includes two mounting brackets fixed on the housing, two crossbars fixedly installed between the two mounting brackets, and two sliding plates slidably disposed on the two crossbars;
[0030] A first cylindrical spring is also fitted on the crossbar. The two ends of the first cylindrical spring are respectively connected to the slide plate and the mounting frame. A connecting rod is connected between the slide plate and the side plate. The two ends of the connecting rod are respectively hinged to the side plate and the slide plate.
[0031] Compared with existing technologies, the advantages of this invention are as follows: This invention features a novel design. It utilizes a test bench device for whole-machine testing. The acquisition unit obtains the whole-machine test data and sends it to the receiving module in the central controller. The receiving module transmits the whole-machine test data to the comparison module via the transmission module, and then stores the data in a database. Simultaneously, the comparison module retrieves pre-stored data from the memory and compares the whole-machine test data with the pre-stored data. The comparison result is analyzed and judged by the analysis and judgment module. Furthermore, the plotting module receives the data comparison results sent by the comparison module and plots images based on the comparison results. The display module shows the real-time output voltage change curve, the real-time output current change curve, and the stable power-on state curve of the whole machine. Therefore, this testing system has a high degree of completeness, greatly improving the rigor of the whole-machine test, effectively avoiding oversights during testing, and ensuring the test results. Attached Figure Description
[0032] Figure 1 This is a flowchart of an automated integrated circuit complete machine testing system.
[0033] Figure 2 This is a schematic diagram of one embodiment of the test console device.
[0034] Figure 3 This is a structural schematic diagram from another angle of one embodiment of the test console device.
[0035] Figure 4 This is a structural schematic diagram of another embodiment of the test console device from another angle.
[0036] Figure 5 for Figure 3 Enlarged view of the structure at point A in the middle.
[0037] Figure 6 for Figure 3 Enlarged view of the structure at point B in the middle.
[0038] Figure 7 for Figure 4 Enlarged view of the structure at point C.
[0039] Figure 8 for Figure 7 Enlarged view of the structure at point D.
[0040] Figure 9 This is a schematic diagram of the clamping mechanism in one embodiment of the test operation table device.
[0041] Figure 10 This is a schematic diagram of the intermittent pushing mechanism in one embodiment of the test console device.
[0042] In the diagram: 1. Base; 2. Horizontal plate; 3. Box body; 4. Side plate; 5. Strip-shaped opening; 6. Push plate; 7. Rack plate; 8. Gear; 9. Mounting bracket; 10. Crossbar; 11. Slide plate; 12. First cylindrical spring; 13. Connecting rod; 14. Strip-shaped through groove; 15. First bevel gear set; 16. Sleeve; 17. Rotating shaft; 18. Second bevel gear set; 19. Drive shaft; 20. First drive belt; 21. Ratchet; 22. Long strip plate; 23. Transverse plate; 24. Support plate; 25. Rubber strip; 26. Two-way lead screw; 27. Test bench; 28. Shaft; 29. Connecting column; 30. Connecting shaft; 31. Turntable; 32. Rocker arm; 33. Ring body; 34. Second cylindrical spring; 35. Vertical plate; 36. Second drive belt; 37. Discharge chute. Detailed Implementation
[0043] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0044] Furthermore, elements in this invention are referred to as being "fixed to" or "set on" another element, which may be directly on the other element or may also include an intervening element. When an element is considered to be "connected" to another element, it may be directly connected to the other element or may also include an intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementations.
[0045] Please see Figure 1 In this embodiment of the invention, an automated integrated circuit system testing system includes an acquisition unit for acquiring system test data, and further includes:
[0046] The central controller establishes communication with the acquisition unit and receives the whole machine test data sent by the acquisition unit through its receiving module;
[0047] The transmission module establishes communication with the receiving module to transmit the whole machine test data to the comparison module and to the database for storage. At the same time, the comparison module retrieves the pre-stored data in the memory and compares the whole machine test data with the pre-stored data. The comparison result is analyzed and judged by the analysis and judgment module.
[0048] The plotting module is used to receive the data comparison results sent by the comparison module, and to plot the image based on the data comparison results. The display module displays the real-time output voltage change curve, the real-time output current change curve, and the overall power-on stability curve.
[0049] Please see Figure 2-10 The present invention also proposes a test bench device for providing complete system test data to the automated integrated circuit complete system test system, including a base 1, a horizontal plate 2 fixed on the base 1, and a test bench 27 disposed on one side of the base 1, and further including:
[0050] The feeding chute 37 is located on the side of the horizontal plate 2 facing the test table 27, and a gap is reserved between the base 1 and the horizontal plate 2. The feeding chute 37 is located in the gap and is used to transfer the whole machine to be tested to the test table 27.
[0051] The box 3 is fixed to the horizontal plate 2 and is used to hold the whole machine to be tested. One side of the box 3 is open. The box 3 is provided with a side plate 4 through an elastic mechanism. The side plate 4 is used to block the open side of the box 3 so as to form a storage chamber for placing the whole machine to be tested inside the box 3.
[0052] An intermittent pushing mechanism is installed on the housing 3 to push the test unit in the storage chamber and to make the test unit fall onto the discharge chute 37 through the strip-shaped opening 5 at the bottom of the housing 3.
[0053] A clamping mechanism is installed on the test bench 27 and connected to the intermittent pushing mechanism through a transmission mechanism. The clamping mechanism is used to receive the whole machine to be tested falling from the unloading chute 37 and to perform a clamping and fixing action on the whole machine to be tested. The transmission mechanism is triggered after the clamping mechanism releases the clamping and fixing state of the whole machine and releases the whole machine, so as to cause the intermittent pushing mechanism to move and perform a pushing action on the whole machine to be tested in the storage chamber.
[0054] It should be noted that the inner wall of the housing 3 and the feeding chute 37 are both smoothed and polished to reduce the friction force on the machine under test during movement. This ensures that the clamping mechanism can smoothly receive the machine under test and also protects the machine under test, ensuring its smooth movement.
[0055] Please refer to it again. Figure 4 and Figure 10 The intermittent pushing mechanism includes a push plate 6 slidably disposed in the housing 3, a rack plate 7 fixed to the push plate 6, and a gear 8 rotatably mounted on the side plate 4. The gear 8 meshes with the teeth on the rack plate 7, and the rotating shaft of the gear 8 is connected to the transmission mechanism.
[0056] Furthermore, the top of the housing 3 is also provided with a strip-shaped through groove 14 for the rack plate 7 to move;
[0057] Secondly, multiple limiting blocks (not labeled in the figure) are fixed on the inner wall of the box 3 at the end away from the strip opening 5. The limiting blocks are set to limit the push plate 6. Whenever all the test units in the storage chamber have been tested, the staff needs to open the side plate 4 to add more test units into the box 3. At this time, the push plate 6 is located at the end of the box 3 near the strip opening 5. Therefore, the staff needs to first move the push plate 6 until it is reset. At this time, the multiple limiting blocks play their role in preventing the push plate 6 from being reset inaccurately, which would affect the smoothness of subsequent material discharge.
[0058] After the machine under test falls from the feeding chute 37 onto the clamping mechanism, the tester located on one side of the test bench 27 can operate the clamping mechanism to clamp and fix the machine. After the test is completed, the clamping mechanism releases the machine and continues to move until it separates from the machine, allowing the machine to fall off the clamping mechanism. Subsequently, during the process of the clamping mechanism returning to the state of supporting the machine, the transmission mechanism will be triggered, which will drive the gear 8 to rotate. Then, the rack plate 7 will drive the push plate 6 to move a distance in the direction of the strip-shaped opening 5 within the housing 3, so that the machine near the strip-shaped opening 5 can fall onto the feeding chute 37 through the strip-shaped opening 5, and then be received by the clamping mechanism. In this way, the direct contact between the operator's hands and the machine is avoided during the test, and the test results are prevented from being deviated due to static electricity.
[0059] Please refer to it again. Figure 7 and Figure 9 The test bench 27 has two opposing upright plates 35 fixedly installed on it. The clamping mechanism includes a bidirectional lead screw 26 rotatably installed between the two upright plates 35 and two transverse plates 23 symmetrically arranged on the bidirectional lead screw 26.
[0060] The two transverse sliding plates 23 are threadedly connected to the bidirectional lead screw 26, and each of the two transverse sliding plates 23 is rotatably mounted with a support plate 24. The support plate 24 is arranged in an L-shape and is used to support and clamp the entire machine. An orientation control component is also installed between the two vertical plates 35, and the orientation control component is connected to the rotation shaft of the two support plates 24.
[0061] In detail, the inner wall of the support plate 24 is also provided with an installation groove, and a rubber strip 25 is provided in the installation groove. After the machine to be tested falls onto the two support plates 24 through the feeding chute 37, the operator rotates the double-acting screw 26 in the forward direction, so that the two transverse plates 23 simultaneously engage with the double-acting screw 26 and move closer to each other. The machine is clamped between the two support plates 24 by the pressure of the rubber strip 25. The setting of the rubber strip 25 realizes the effective flexible clamping function of the machine and prevents rigid clamping from damaging the machine.
[0062] After the test is completed, the operator rotates the bidirectional lead screw 26 in the reverse direction to move the two support plates 24 away from each other until the entire machine automatically detaches from them. Of course, in actual use, the test bench 27 should also be equipped with a special material receiving circuit for automatically collecting and stacking the tested machine. After the machine falls off the two support plates 24, the operator rotates the bidirectional lead screw 26 in the forward direction again to move the two support plates 24 closer to each other and restore the two support plates 24 to the state of supporting the machine.
[0063] The bidirectional lead screw 26 is used to control the opposite movement of the two support plates 24, adjust the distance between the two support plates 24, and realize the function switching of the two support plates 24 supporting or clamping and fixing the whole machine. The bidirectional lead screw 26 has high driving precision.
[0064] The orientation control assembly includes two shafts 28 that rotate on the two upright plates 35 respectively, and two connecting columns 29 that are fixedly connected to the two shafts 28. Each of the two transverse plates 23 is also rotatably mounted with a connecting shaft 30, which is connected to the rotation shaft of the support plate 24 via a second transmission belt 36. The connecting column 29 passes through the two connecting shafts 30 and is slidably connected to them. The connecting shafts 30 coincide with the central axes of the two shafts 28, and one of the shafts 28 is connected to a positioning structure.
[0065] During actual testing, once the machine under test falls from the feeding chute 37 onto the two support plates 24, and the two support plates 24 clamp and fix the machine, the operator can rotate the shaft 28. The shaft 28 can then drive the connecting shaft 30 to rotate via the two connecting columns 29. In turn, the connecting shaft 30 can drive the support plates 24 to rotate via the second transmission belt 36, causing the machine located between the two support plates 24 to flip over. This allows the testers to observe the condition of the machine in detail and also facilitates other tests.
[0066] During the rotation of the bidirectional lead screw 26, the distance between the two transverse plates 23 changes, and accordingly, the two connecting shafts 30 will slide closer or further apart between the connecting columns 29.
[0067] The positioning structure includes a turntable 31 fixed to the shaft 28 and a rocker arm 32 slidably disposed on the eccentric part of the turntable 31 via an elastic element, and the upright plate 35 is provided with a lock hole for inserting the rocker arm 32.
[0068] The elastic element includes a ring 33 fixed to the rocker arm 32 and a second cylindrical spring 34 sleeved on the outer periphery of the rocker arm 32. One end of the second cylindrical spring 34 is connected to the ring 33, and the other end is connected to the turntable 31.
[0069] When the operator needs to flip the machine, the rocker arm 32 is pulled out of the lock hole on the upright plate 35. During this process, the second columnar spring 34 is stretched. Then, the operator can rotate the shaft 28 through the rocker arm 32 and the turntable 31, causing the machine to flip for inspection. After the inspection of the machine is completed, the operator rotates the rocker arm 32 to the position opposite to the lock hole and then releases the rocker arm 32. The second columnar spring 34 then rebounds, causing the rocker arm 32 to be inserted back into the lock hole. This ensures that after each observation, both support plates 24 remain in a horizontal state, ensuring that the next machine can be smoothly placed on the two support plates 24 for clamping, fixing, and testing.
[0070] Please refer to it again. Figure 5 , Figure 6 as well as Figure 10 The transmission mechanism includes a long strip plate 22 fixedly mounted on one of the transverse plates 23 and a ratchet 21 rotatably mounted on the test platform 27. The bottom of the long strip plate 22 has multiple equidistant inclined slots along its length, and each inclined slot has a pawl hinged to it to engage with the ratchet 21. The rotation shaft of the ratchet 21 is connected to a transmission shaft 19 rotatably mounted on the base 1 via a first transmission belt 20. The transmission shaft 19 is connected to the rotation shaft of the gear 8 via a sliding fitting structure.
[0071] The sliding fitting structure includes a rotating shaft 17 rotatably mounted on the base 1 and a sleeve 16 rotatably mounted on the side plate 4 and slidably fitted with the rotating shaft 17. The end of the sleeve 16 away from the base 1 is connected to the rotating shaft of the gear 8 through a first bevel gear set 15, and the end of the rotating shaft 17 facing the drive shaft 19 is connected to the drive shaft 19 through a second bevel gear set 18.
[0072] To elaborate, the first bevel gear set 15 includes a first bevel gear fixedly installed on the sleeve 16 at the end away from the base 1 and a second bevel gear fixedly installed coaxially with the gear 8, and the second bevel gear meshes with the first bevel gear;
[0073] Secondly, the second bevel gear set 18 includes a third bevel gear fixedly mounted on the drive shaft 19 and a fourth bevel gear fixedly mounted on the rotating shaft 17 at one end facing the drive shaft 19, and the fourth bevel gear meshes with the third bevel gear.
[0074] The outer wall of the rotating shaft 17 is provided with multiple strip-shaped protrusions at equal intervals along the circumference, and the inner wall of the sleeve 16 is provided with multiple strip-shaped grooves at equal intervals along the circumference. The strip-shaped grooves are slidably adapted to the strip-shaped protrusions.
[0075] After the two support plates 24 move away from each other to release the tested whole machine, they move closer to each other until they return to the state of supporting the whole machine. When the long plate 22 moves together with the transverse plate 23, and the pawl at the bottom of the long plate 22 passes the ratchet 21, the inclined groove at the bottom of the long plate 22 will limit the pawl. The pawl cannot be turned over in the inclined groove. As a result, the ratchet 21 will rotate. Correspondingly, the rotating shaft of the ratchet 21 drives the transmission shaft 19 to rotate through the first transmission belt 20. The transmission shaft 19 drives the rotating shaft 17 to rotate through the second bevel gear set 18. The rotating shaft 17 drives the sleeve 16 to rotate through the strip protrusion and the strip groove. The sleeve 16 drives the gear 8 to rotate through the first bevel gear set 15, so that the push plate 6 pushes the whole machine to be tested in the storage chamber.
[0076] As the two transverse plates 23 move away from each other, the pawl at the bottom of the long plate 22 flips in the inclined groove at the bottom of the long plate 22 when it passes the ratchet 21. As a result, the ratchet 21 does not rotate, thus realizing the one-way transmission function of the gear 8. This ensures that the whole machine slides onto the support plate 24 through the discharge chute 37 only after the two support plates 24 have returned to their supporting positions.
[0077] The elastic mechanism includes two mounting brackets 9 fixed to the housing 3, two crossbars 10 fixedly installed between the two mounting brackets 9, and two sliding plates 11 slidably mounted on the two crossbars 10. A first cylindrical spring 12 is also sleeved on the crossbar 10, with both ends of the first cylindrical spring 12 connected to the sliding plate 11 and the mounting bracket 9, respectively. A connecting rod 13 connects the sliding plate 11 and the side plate 4, with both ends of the connecting rod 13 hinged to the side plate 4 and the sliding plate 11, respectively.
[0078] After all the components in the storage chamber have been tested, the operator can push the side plate 4 upwards. Correspondingly, the side plate 4 pushes the slide plate 11 on the crossbar 10 toward the mounting bracket 9 via the connecting rod 13, which compresses the first columnar spring 12. As the side plate 4 opens upwards, the gear 8 lifts up and disengages from the rack plate 7, and the sleeve 16 slides upwards on the rotating shaft 17. Subsequently, when the operator pushes the push plate 6, it can prevent the rack plate 7 from being unable to move (because the pawl at the bottom of the long plate 22 limits the ratchet 21).
[0079] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.
[0080] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.
Claims
1. A test bench device for providing complete system test data to an automated integrated circuit complete system test system, the automated integrated circuit complete system test system including an acquisition unit for acquiring complete system test data, and further comprising: The central controller establishes communication with the acquisition unit and receives the whole machine test data sent by the acquisition unit through its receiving module; The transmission module establishes communication with the receiving module to transmit the whole machine test data to the comparison module and to the database for storage. At the same time, the comparison module retrieves the pre-stored data in the memory and compares the whole machine test data with the pre-stored data. The comparison result is analyzed and judged by the analysis and judgment module. The plotting module is used to receive the data comparison results sent by the comparison module, and to plot the image based on the data comparison results. The display module displays the real-time change curve of the output voltage, the real-time change curve of the output current, and the stable curve of the whole machine under power-on status. The test platform device includes a base (1), a horizontal plate (2) fixed on the base (1), and a test platform (27) disposed on one side of the base (1), characterized in that it further includes: The feeding chute (37) is located on the side of the horizontal plate (2) facing the test bench (27), and a gap is reserved between the base (1) and the horizontal plate (2). The feeding chute (37) is located in the gap and is used to transfer the whole machine to be tested to the test bench (27). The box (3) is fixed to the horizontal plate (2) and is used to hold the whole machine to be tested. One side of the box (3) is open. The box (3) is provided with a side plate (4) through an elastic mechanism. The side plate (4) is used to block the open side of the box (3) so as to form a storage chamber for placing the whole machine to be tested inside the box (3). An intermittent pushing mechanism is installed on the housing (3) to push the test unit in the storage chamber and make the test unit fall onto the discharge chute (37) through the strip-shaped opening (5) at the bottom of the housing (3); the intermittent pushing mechanism includes a push plate (6) slidably disposed in the housing (3), a rack plate (7) fixed to the push plate (6), and a gear (8) rotatably mounted on the side plate (4). The gear (8) meshes with the teeth on the rack plate (7), and the rotation shaft of the gear (8) is connected to the transmission mechanism; A clamping mechanism is installed on the test bench (27) and connected to the intermittent pushing mechanism through a transmission mechanism. The clamping mechanism is used to receive the whole machine to be tested falling from the unloading chute (37) and perform a clamping and fixing action on the whole machine to be tested. The transmission mechanism is triggered after the clamping mechanism releases the clamping and fixing state of the whole machine and releases the whole machine, so as to cause the intermittent pushing mechanism to move and perform a pushing action on the whole machine to be tested in the storage chamber. Two opposing upright plates (35) are fixedly installed on the test bench (27). The clamping mechanism includes a bidirectional lead screw (26) rotatably installed between the two upright plates (35) and two transverse plates (23) symmetrically arranged on the bidirectional lead screw (26). Among them, the two transverse plates (23) are threadedly connected to the bidirectional lead screw (26), and each of the two transverse plates (23) is rotatably mounted with a support plate (24). The support plate (24) is arranged in an "L" shape and is used to support the whole machine and clamp and fix the whole machine. An orientation control assembly is also installed between the two upright plates (35), and the orientation control assembly is connected to the rotation shaft of the two support plates (24); The transmission mechanism includes a long strip plate (22) fixedly installed on one of the transverse plates (23) and a ratchet (21) rotatably installed on the test bench (27). The bottom of the long strip plate (22) is provided with multiple inclined slots at equal intervals along its length, and each inclined slot is hinged with a pawl that cooperates with the ratchet (21). The ratchet (21) is connected to a drive shaft (19) mounted on the base (1) via a first drive belt (20). The drive shaft (19) is connected to the rotation shaft of the gear (8) via a sliding fitting structure.
2. The test operation table device according to claim 1, characterized in that, The orientation control assembly includes two shafts (28) that rotate on the two vertical plates (35) respectively, and two connecting columns (29) that are fixedly connected to the two shafts (28). A connecting shaft (30) is also rotatably installed on each of the two horizontal plates (23). The connecting shaft (30) is connected to the rotating shaft of the support plate (24) through a second transmission belt (36). The connecting column (29) passes through the two connecting shafts (30) and is slidably connected to the connecting shafts (30). The connecting shafts (30) coincide with the central axis of the two shafts (28), and one of the shafts (28) is connected to a positioning structure.
3. The test operation platform device according to claim 2, characterized in that, The positioning structure includes a turntable (31) fixed to the shaft (28) and a rocker arm (32) slidably disposed on the eccentric part of the turntable (31) via an elastic element, and the upright plate (35) is provided with a locking hole for inserting the rocker arm (32); The elastic element includes a ring (33) fixed on the rocker arm (32) and a second cylindrical spring (34) sleeved on the outer periphery of the rocker arm (32). One end of the second cylindrical spring (34) is connected to the ring (33), and the other end is connected to the turntable (31).
4. The test operation platform device according to claim 1, characterized in that, The sliding fitting structure includes a rotating shaft (17) rotatably mounted on the base (1) and a sleeve (16) rotatably mounted on the side plate (4) and slidably fitted with the rotating shaft (17). The end of the sleeve (16) away from the base (1) is connected to the rotating shaft of the gear (8) through a first bevel gear set (15), and the end of the rotating shaft (17) facing the drive shaft (19) is connected to the drive shaft (19) through a second bevel gear set (18). The outer wall of the rotating shaft (17) is provided with multiple strip-shaped protrusions at equal intervals along the circumference, and the inner wall of the sleeve (16) is provided with multiple strip-shaped grooves at equal intervals along the circumference. The strip-shaped grooves and the strip-shaped protrusions are slidably adapted to each other.
5. The test operation platform device according to claim 1, characterized in that, The elastic mechanism includes two mounting brackets (9) fixed on the housing (3), two crossbars (10) fixedly installed between the two mounting brackets (9), and two sliding plates (11) slidably disposed on the two crossbars (10). A first cylindrical spring (12) is also fitted on the crossbar (10). The two ends of the first cylindrical spring (12) are respectively connected to the slide plate (11) and the mounting bracket (9). A connecting rod (13) is connected between the slide plate (11) and the side plate (4). The two ends of the connecting rod (13) are respectively hinged to the side plate (4) and the slide plate (11).
Citation Information
Patent Citations
Chip testing system and testing method thereof
CN115128429A