A focusing coil control system for an accelerator

Abstract

The application relates to the technical field of accelerator control, in particular to a focusing coil control system of an accelerator, which comprises a front-end ion pump acquisition module, a tail-end ion pump acquisition module and a processing module. The front-end ion pump acquisition module is used for acquiring a first ion pump current value of the front-end ion pump; the tail-end ion pump acquisition module is used for acquiring a second ion pump current value of the tail-end ion pump; the processing module is used for generating a group of coil control parameters according to the first ion pump current value and the second ion pump current value; and a plurality of coil control modules are used for respectively adjusting the coil current of each focusing coil according to the coil control parameters, so that the first ion pump current value and the second ion pump current value are minimized. The beneficial effect is that the coil control parameters of the focusing coil are automatically changed according to the running current by the processing device, so that the running current of the ion pump is minimized, the rapid debugging of the focusing coil of the accelerator is realized based on the above process, and the optimal beam distribution is realized.

Description

Technical Field

[0001] This invention relates to the field of accelerator control technology, and more specifically to a focusing coil control system for an accelerator. Background Technology

[0002] In existing technologies, linear accelerators typically include an electron gun and an accelerator section. The electron gun generates a low-energy electron beam, and the accelerator creates an induced electric field that gradually accelerates the electron beam during its journey. Because the electron beam often diverges during acceleration, multiple sets of solenoid coils are also needed to be connected to the outside of the accelerator to create a specifically distributed magnetic field to focus the electron beam.

[0003] However, in actual implementation, the inventors found that due to manufacturing errors and other factors, the actual current value required by each group of coils in actual control differed significantly from the theoretical value. This required repeated adjustments to the coils and changing the combination of current values ​​to adjust the magnetic field distribution, which resulted in a long adjustment process and difficulty in obtaining the optimal value. Summary of the Invention

[0004] In view of the above-mentioned problems in the prior art, a focusing coil control system for an accelerator is provided.

[0005] The specific technical solution is as follows:

[0006] A focusing coil control system for an accelerator includes:

[0007] A first-end ion pump acquisition module is connected to the first-end ion pump of the accelerator, and the first-end ion pump acquisition module acquires the first ion pump current value of the first-end ion pump.

[0008] An end-point ion pump acquisition module is connected to the end-point ion pump of the accelerator and acquires the second ion pump current value of the end-point ion pump.

[0009] The processing module is connected to the first-end ion pump acquisition module and the second-end ion pump acquisition module respectively. The processing module generates a set of coil control parameters based on the first ion pump current value and the second ion pump current value.

[0010] Multiple coil control modules are provided, each of which is connected to the processing module. Each coil control module adjusts the coil current of each focusing coil according to the coil control parameters to minimize the current values ​​of the first ion pump and the second ion pump.

[0011] On the other hand, the processing module includes:

[0012] An accelerator acquisition module is connected to the accelerator and acquires the accelerator parameters of the accelerator.

[0013] A beam simulation module is connected to the accelerator acquisition module. The beam simulation module simulates the beam of the accelerator based on the accelerator parameters and outputs the parameter range of the coil control parameters.

[0014] The search module is connected to the beam simulation module. The search module takes the minimum sum of the first ion pump current value and the second ion pump current value as the search target value, generates the coil control parameters within the parameter range, and outputs them.

[0015] On the other hand, the processing module also includes:

[0016] The feedback module is connected to the search module. After the coil control module adjusts the coil current, the feedback module re-acquires the first ion pump current value and the second ion pump current value, and determines whether the iteration condition is met.

[0017] If the iteration conditions are not met, the feedback module controls the search module to output new coil control parameters.

[0018] On the other hand, the search module includes

[0019] A mesh generation module, upon receiving the parameter range, divides the parameter range according to a pre-configured mesh step size to generate multiple parameter meshes;

[0020] A grid selection module is connected to the grid division module. The grid selection module calculates the sum of current for each parameter grid and selects the parameter grid with the smallest sum of current as the grid to be searched.

[0021] A parameter output module is connected to the grid selection module. The first parameter output module selects the coil control parameters in the grid to be searched and outputs them.

[0022] On the other hand, the search module includes:

[0023] A parameter combination module, which randomly combines multiple sets of coil control parameters within the parameter range;

[0024] A parameter selection module is connected to the parameter combination module, and the parameter selection module randomly selects and outputs a set of coil control parameters.

[0025] On the other hand, the beam simulation module includes:

[0026] The simulation module establishes an accelerator model based on the accelerator parameters and the beam size to be formed, and determines the focusing magnetic field parameters based on the accelerator model.

[0027] A coil parameter calculation module is connected to the simulation module, and the coil parameter calculation module generates a parameter range corresponding to the focusing coil according to the focusing magnetic field parameters.

[0028] On the other hand, it also includes a stop module, which is connected to the modulator, the first-end ion pump acquisition module, and the last-end ion pump acquisition module respectively.

[0029] The stop module acquires a voltage divider signal from the modulator, and generates a first fault signal when the voltage divider signal undergoes a transition.

[0030] The stop module collects the first ion pump current value and the second ion pump current value, and generates a second fault signal when the first ion pump current value or the second ion pump current value exceeds the current limit value.

[0031] On the other hand, it also includes a display module, which is connected to the processing module. The display module generates and displays parameter change curves based on the coil control parameters.

[0032] The above technical solution has the following advantages or beneficial effects:

[0033] To address the issue that the focusing coil current value in existing technologies requires repeated adjustments, this solution configures ion pumps at the beginning and end of the accelerator to absorb the stray beam. A corresponding acquisition module collects the operating current of the ion pumps, and the processing device automatically adjusts the focusing coil control parameters based on the operating current to minimize the ion pump operating current. This process enables rapid adjustment of the accelerator focusing coil and achieves optimal beam distribution. Attached Figure Description

[0034] Embodiments of the invention will be described more fully with reference to the accompanying drawings. However, the drawings are for illustration and explanation only and do not constitute a limitation on the scope of the invention.

[0035] Figure 1 This is an overall schematic diagram of an embodiment of the present invention;

[0036] Figure 2 This is a schematic diagram of the processing module in an embodiment of the present invention;

[0037] Figure 3This is a schematic diagram of the processing module in another embodiment of the present invention;

[0038] Figure 4 This is a schematic diagram of the search module in an embodiment of the present invention;

[0039] Figure 5 This is a schematic diagram of the search module in another embodiment of the present invention;

[0040] Figure 6 This is a schematic diagram of the beam simulation module in an embodiment of the present invention;

[0041] Figure 7 This is a schematic diagram of the stop module in an embodiment of the present invention;

[0042] Figure 8 This is a schematic diagram of the display module in an embodiment of the present invention. Detailed Implementation

[0043] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0044] It should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other.

[0045] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, but this is not intended to limit the scope of the invention.

[0046] This invention includes:

[0047] A focusing coil control system for an accelerator, such as Figure 1 As shown, this is applicable to an electron beam accelerator, which includes an electron gun 101 and an accelerator 102 arranged sequentially along the beam propagation direction. Multiple focusing coils 103 are fitted around the accelerator 102 to form a focusing magnetic field within the accelerator to control the electron beam. The accelerator 102 also includes a modulator 1021 and a klystron 1022. The modulator 1021 is connected to a processing module 3 and converts the control signals from the processing module 3 into corresponding modulation signals to control the klystron 1022. The klystron 1022 then oscillates and amplifies the electron beam based on the modulation signals. To ensure smoother electron beam transmission, a head ion pump 104 is further installed at the inlet of the accelerator 102, and a tail ion pump 105 is installed at the outlet of the accelerator 102.

[0048] The focusing coil control system includes:

[0049] First-end ion pump acquisition module 1 is connected to the first-end ion pump 104 of accelerator 102. First-end ion pump acquisition module 1 acquires the first ion pump current value of the first-end ion pump 104.

[0050] End-point ion pump acquisition module 2 is connected to the end-point ion pump 105 of accelerator 102 and acquires the second ion pump current value of end-point ion pump 105.

[0051] Processing module 3 is connected to the first-end ion pump acquisition module 1 and the end-end ion pump acquisition module 2 respectively. Processing module 3 generates a set of coil control parameters based on the first ion pump current value and the second ion pump current value.

[0052] Multiple coil control modules 4 are connected to the processing module 3. The coil control modules 4 adjust the coil current of each focusing coil 103 according to the coil control parameters so as to minimize the current values ​​of the first ion pump and the second ion pump.

[0053] Specifically, addressing the issue of lengthy focusing coil debugging processes in existing technologies, this embodiment adjusts the accelerator structure accordingly. The first and second ion pump current values ​​are collected by the first-end ion pump acquisition module 1 and the last-end ion pump acquisition module 2, respectively. Using the minimum sum of ion pump current values ​​as the target condition, the processing module 3 automatically searches for and combines feasible coil control parameters, outputting corresponding coil control parameters. This allows the coil control module 4 to control the coil current of the focusing coil 103 according to these parameters, thereby forming a specifically distributed magnetic field in the accelerator 102. This achieves effective focusing of the electron beam and reduces the time required for manual debugging.

[0054] In one embodiment, such as Figure 2 As shown, processing module 3 includes:

[0055] Accelerator acquisition module 31 is connected to accelerator 102, and accelerator acquisition module 32 acquires accelerator parameters of accelerator 102.

[0056] The beam simulation module 32 is connected to the accelerator acquisition module 31. The beam simulation module 32 simulates the beam of the accelerator 102 according to the accelerator parameters and outputs the parameter range of the coil control parameters.

[0057] Search module 33 is connected to beam simulation module 32. Search module 33 takes the minimum sum of the first ion pump current value and the second ion pump current value as the search target value, generates coil control parameters within the parameter range and outputs them.

[0058] Specifically, to achieve better coil control parameter generation, in this embodiment, the accelerator acquisition module 31 pre-acquires and stores the accelerator parameters of the accelerator 102, including the initial electron beam energy, current intensity, emittance, beam spot size, half-divergence angle, microwave feed power, and other accelerator parameters. These accelerator parameters can be used to simulate the electron beam current in the accelerator 102. Simultaneously, the accelerator acquisition module 102 also acquires parameters such as the placement position and coil structure of each focusing coil 103. Subsequently, the beam simulation module 32 performs simulation according to the accelerator parameters to calculate the corresponding beam current. Then, based on the relevant parameters of the focusing coil 103, a magnetic field simulation is performed to constrain the beam current and change its distribution, thereby calculating the feasible parameter range of the coil control parameters. The search module 33 then searches according to this parameter range, using the minimum sum of the first and second ion pump current values ​​as the search target value to determine and output the coil control parameters within the parameter range. This parameter range is a set of parameter range values, each corresponding to a feasible current value range for the coil control parameters of each focusing coil 103.

[0059] In one embodiment, such as Figure 3 As shown, processing module 3 also includes:

[0060] Feedback module 34 is connected to search module 33. After the coil current is adjusted by coil control module 4, feedback module 34 re-acquires the first ion pump current value and the second ion pump current value, and determines whether the iteration condition is met.

[0061] If the iteration conditions are not met, the feedback module 34 controls the search module 33 to output new coil control parameters.

[0062] Specifically, addressing the coil deviation problem caused by the installation and processing of each coil in the prior art, this embodiment also includes a feedback module 34 in the processing module 3. After the coil control module 4 completes the adjustment of the coil current, the feedback module 34 controls the first-end ion pump acquisition module 1 and the last-end ion pump acquisition module 2 to re-acquire the first and second ion pump current values, and determines whether the iteration condition is met based on the first and second ion pump current values. In one embodiment, the iteration condition is that the sum of the first and second ion pump current values ​​is less than 400uA. Based on the above iteration condition, the coil control parameters output to the coil control module 4 are automatically changed, replacing the manual parameter adjustment process and improving work efficiency.

[0063] In one embodiment, such as Figure 4 As shown, the search module 33 includes

[0064] Mesh generation module A331, upon receiving a parameter range, divides the parameter range according to a pre-configured mesh step size to generate multiple parameter meshes;

[0065] Mesh selection module A332 is connected to mesh generation module A331. Mesh selection module A332 calculates the total current for each parameter mesh and selects the parameter mesh with the smallest total current as the mesh to be searched.

[0066] The parameter output module A333 is connected to the grid selection module A332. The parameter output module A333 selects and outputs the coil control parameters in the grid to be searched.

[0067] Specifically, to achieve better parameter output, this embodiment employs a grid search method in the search module 33 to search for coil control parameters. The grid division module A331, upon receiving the parameter range, divides the range into multiple parameter grids according to a corresponding step size. For each parameter grid, the grid selection module A332 calculates the beam current distribution that the coil control parameters in each grid might correspond to in actual conditions, thereby predicting the change in the sum of the first and second ion pump current values. It then outputs the minimum value and compares it with the minimum values ​​of other parameter grids to obtain the smallest grid to be searched. Once the grid to be searched is established, all subsequent coil control parameters are selected by the parameter output module A333 only within this parameter grid, thus reducing the search range.

[0068] In one embodiment, such as Figure 5 As shown, the search module 33 includes:

[0069] The parameter combination module B331 randomly combines multiple sets of coil control parameters within the parameter range.

[0070] The parameter selection module B332 is connected to the parameter combination module B331. The parameter selection module B332 randomly selects and outputs a set of coil control parameters.

[0071] Specifically, to achieve more comprehensive parameter coverage, in this embodiment, the parameter combination module B331 arbitrarily combines the coil control parameters of each focusing coil 103 within the parameter range to obtain multiple sets of feasible coil control parameters. Subsequently, during the iteration process of the feedback module 34, the parameter selection module B332 randomly selects and outputs a set of coil control parameters until the iteration conditions are met and then stops.

[0072] In one embodiment, such as Figure 6As shown, the beam simulation module 32 includes:

[0073] Simulation module 321 establishes an accelerator model based on accelerator parameters and the size of the beam spot to be formed, and determines the focusing magnetic field parameters based on the accelerator model;

[0074] The coil parameter calculation module 322 is connected to the simulation module 321. The coil parameter calculation module 322 generates a parameter range corresponding to the focusing coil according to the focusing magnetic field parameters.

[0075] Specifically, to achieve a better simulation effect of the beam, in this embodiment, a simulation module 321 is constructed within the beam simulation module 32. This simulation module 321 can establish an accelerator model based on the accelerator parameters and the size of the beam spot to be formed. The accelerator model includes the possible beam distribution under the current acceleration parameters. Subsequently, a focusing magnetic field is applied according to the accelerator model, and the changes in the simulated beam are observed to determine feasible focusing magnetic field parameters. After determining multiple sets of focusing magnetic field parameters, the parameter range is determined using the coil parameter calculation module 322.

[0076] In one embodiment, such as Figure 7 As shown, it also includes a stop module 5, which is connected to the modulator 1021, the first-end ion pump acquisition module 1, and the last-end ion pump acquisition module 2 respectively.

[0077] The stop module 5 acquires the voltage divider signal from the modulator 1021, and generates the first fault signal when the voltage divider signal undergoes a transition.

[0078] The stop module 5 collects the current values ​​of the first ion pump and the second ion pump. When the current value of the first ion pump or the current value of the second ion pump exceeds the current limit, the stop module generates a second fault signal.

[0079] Specifically, to achieve better safety, this embodiment includes a stop module 5 for monitoring faults in the accelerator 102. The modulator 1021 should output a modulated high-voltage signal to the klystron 1022. The stop module 5 can divide this high-voltage signal to obtain a proportionally lower voltage divider signal and compare it with a fixed voltage threshold. When the voltage divider signal exhibits a negative transition, it indicates a possible arcing fault in the accelerator 102. The stop module 5 outputs a first fault signal, prompting the processing module 3 to perform corresponding actions. Similarly, the stop module 5 collects the first and second ion pump current values ​​and compares them with a current limiting value to determine if an overcurrent fault exists in the ion pump. If an overcurrent fault exists, a second fault signal is generated, prompting the processing module 3 to perform corresponding actions.

[0080] In one embodiment, such as Figure 8As shown, it also includes a display module 6, which is connected to the processing module 3. The display module 6 generates and displays parameter change curves based on the coil control parameters.

[0081] Specifically, to better illustrate the iterative process, in this embodiment, a display module 6 is connected to the processing module 3. This display module 6 collects and stores the coil control parameters during each iteration. The resulting parameter change curve is then fitted and displayed, providing a more intuitive representation of the parameter changes.

[0082] The above are merely preferred embodiments of the present invention and are not intended to limit the implementation methods and protection scope of the present invention. Those skilled in the art should recognize that any equivalent substitutions and obvious changes made based on the description and illustrations of the present invention should be included within the protection scope of the present invention.

Claims

1. A focusing coil control system for an accelerator, characterized in that, include: A first-end ion pump acquisition module is connected to the first-end ion pump of the accelerator, and the first-end ion pump acquisition module acquires the first ion pump current value of the first-end ion pump. An end-point ion pump acquisition module is connected to the end-point ion pump of the accelerator and acquires the second ion pump current value of the end-point ion pump. The processing module is connected to the first-end ion pump acquisition module and the second-end ion pump acquisition module respectively. The processing module generates a set of coil control parameters based on the first ion pump current value and the second ion pump current value. Multiple coil control modules are provided, each of which is connected to the processing module. The coil control modules adjust the coil current of each focusing coil according to the coil control parameters to minimize the current values ​​of the first ion pump and the second ion pump. The processing module includes: An accelerator acquisition module is connected to the accelerator and acquires the accelerator parameters of the accelerator. A beam simulation module is connected to the accelerator acquisition module. The beam simulation module simulates the beam of the accelerator based on the accelerator parameters and outputs the parameter range of the coil control parameters. The search module is connected to the beam simulation module. The search module takes the minimum sum of the first ion pump current value and the second ion pump current value as the search target value, generates the coil control parameters within the parameter range, and outputs them.

2. The focusing coil control system according to claim 1, characterized in that, The processing module further includes: The feedback module is connected to the search module. After the coil control module adjusts the coil current, the feedback module re-acquires the first ion pump current value and the second ion pump current value, and determines whether the iteration condition is met. If the iteration conditions are not met, the feedback module controls the search module to output new coil control parameters.

3. The focusing coil control system according to claim 1, characterized in that, The search module includes A mesh generation module, upon receiving the parameter range, divides the parameter range according to a pre-configured mesh step size to generate multiple parameter meshes; A grid selection module is connected to the grid division module. The grid selection module calculates the sum of current for each parameter grid and selects the parameter grid with the smallest sum of current as the grid to be searched. A parameter output module is connected to the grid selection module. The parameter output module selects the coil control parameters in the grid to be searched and outputs them.

4. The focusing coil control system according to claim 1, characterized in that, The search module includes: A parameter combination module, which randomly combines multiple sets of coil control parameters within the parameter range; A parameter selection module is connected to the parameter combination module, and the parameter selection module randomly selects and outputs a set of coil control parameters.

5. The focusing coil control system according to claim 1, characterized in that, The beam simulation module includes: The simulation module establishes an accelerator model based on the accelerator parameters and the beam size to be formed, and determines the focusing magnetic field parameters based on the accelerator model. A coil parameter calculation module is connected to the simulation module, and the coil parameter calculation module generates a parameter range corresponding to the focusing coil according to the focusing magnetic field parameters.

6. The focusing coil control system according to claim 1, characterized in that, It also includes a stop module, which is connected to the modulator, the first-end ion pump acquisition module, and the last-end ion pump acquisition module respectively; The stop module acquires a voltage divider signal from the modulator, and generates a first fault signal when the voltage divider signal undergoes a transition. The stop module collects the first ion pump current value and the second ion pump current value, and generates a second fault signal when the first ion pump current value or the second ion pump current value exceeds the current limit value.

7. The focusing coil control system according to claim 1, characterized in that, It also includes a display module, which is connected to the processing module. The display module generates and displays parameter change curves based on the coil control parameters.

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