Large-scale and high-precision absolute coordinate measurement system and measurement method for spatial assembly position
By combining a measurement system with a stable frequency laser and a two-dimensional rotary table, the problems of large errors and high costs in the existing technology are solved, and low-cost and high-precision spatial assembly position measurement is achieved, and the system structure is simple and easy to domestically produce.
Patent Information
- Application Number
- CN202311018607.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-08-14
- Publication Date
- 2025-08-26
- Estimated Expiration
- 2043-08-14
AI Technical Summary
In the prior art, theodolites and laser trackers have problems of large errors and high costs in measuring the assembly accuracy of parts of large equipment, and it is difficult to achieve the accuracy of spatial absolute position measurement at the micron level.
The left measurement device and the right measurement device, abutment, calibration target, level, positioning target and computer processor are adopted, combined with a stable frequency laser and a two-dimensional rotary table, and the distance and angle between the lasers are solved through a series of steps to achieve high-precision spatial assembly position measurement.
It realizes low-cost and high-precision absolute coordinate measurement of spatial assembly position, avoids aiming errors in traditional methods, the system structure is simple and easy to domestically produce, the cost can be greatly reduced, and the measurement accuracy reaches the micron level.
Smart Images

Figure CN117029684B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of spatial coordinate measurement, and in particular to a large-scale and high-precision spatial assembly position absolute coordinate measurement system and a measurement method. Background Art
[0002] With the continuous advancement of science and technology, the requirements for assembly precision of large-scale equipment components in the aerospace, precision manufacturing, and military fields are constantly increasing. There is an urgent need for measuring instruments and methods that can achieve micron-level absolute spatial position measurement accuracy. Traditional large-scale spatial position measurement methods mainly use theodolites and laser trackers. However, theodolites' calibration and measurement methods based on visual aiming at the target have large errors. Laser trackers are limited by the low accuracy of longitude and latitude angle measurement and the low precision of the target sphere, making it difficult to improve the absolute spatial position measurement accuracy. In addition, both instruments are expensive. Summary of the Invention
[0003] The present invention aims to overcome the above-mentioned deficiencies of the prior art and to provide a large-scale, high-precision spatial assembly position absolute coordinate measurement system and measurement method, so as to achieve low-cost, high-precision absolute coordinate measurement of spatial assembly positions.
[0004] In order to achieve the above object, the present invention adopts the following technical solutions:
[0005] The present invention provides a large-scale, high-precision absolute coordinate measurement system for spatial assembly positions, comprising: a left measuring device, a right measuring device, a base, a calibration target, a level, a plurality of positioning targets, and a computer processor, wherein the left measuring device comprises: a left two-dimensional rotary table and a left frequency-stabilized laser; the right measuring device comprises: a right two-dimensional rotary table and a right frequency-stabilized laser;
[0006] A longitudinal angle measuring device is provided on the longitudinal turntable of the left two-dimensional rotating table, and a latitudinal angle measuring device is provided on the latitudinal turntable;
[0007] A longitudinal angle measuring device is provided on the longitudinal turntable of the right two-dimensional rotating table, and a latitudinal angle measuring device is provided on the latitudinal turntable;
[0008] The left frequency-stabilized laser is arranged at the rotation center of the latitudinal turntable of the left two-dimensional rotating platform, and the right frequency-stabilized laser is arranged at the rotation center of the latitudinal turntable of the right two-dimensional rotating platform;
[0009] The left measuring device and the right measuring device are symmetrically arranged on the base;
[0010] The level is provided on the base, and the level is located in front of the optical path of the left frequency-stabilized laser and the right frequency-stabilized laser;
[0011] The calibration target is vertically mounted on the loading plate of the level; a high-precision long-stroke position detector is provided on the calibration target, and the long-stroke position detector is located in the optical path of the left stabilized laser and the right stabilized laser;
[0012] A target mounting load is provided in front of the base, and the target mounting load is located on a reference platform for measuring the target; a plurality of positioning targets are provided on the reference platform and the target mounting load, respectively; wherein at least three positioning targets are provided on the reference platform according to the reference measurement requirements and are not in a line, and at least one positioning target is provided on the target mounting load according to the load measurement position requirements;
[0013] A four-quadrant position detector is provided on the positioning target; and the four-quadrant position detector is located in the optical path of the left frequency-stabilized laser and the right frequency-stabilized laser;
[0014] The computer processor is respectively connected to the interfaces of the left two-dimensional rotating stage, the right two-dimensional rotating stage, and the calibration target.
[0015] The characteristics of the measurement method of the large-scale and high-precision absolute coordinate measurement system for spatial assembly positions described in the present invention include the following steps:
[0016] Step 1: Adjust the absolute coordinate measurement system:
[0017] Step 1.1, adjusting the table top of the base to be level according to the angle indication of the level instrument, and recording the first angle indication when reaching level;
[0018] Step 1.2: placing the level on the latitudinal turntable of the left two-dimensional rotating stage, and adjusting the left two-dimensional rotating stage according to the second angle indication of the level so that the second angle indication is the same as the first angle indication;
[0019] Step 1.3, placing the level on the latitudinal turntable of the right two-dimensional rotating stage, and adjusting the right two-dimensional rotating stage according to the third angle indication of the level so that the third angle indication is the same as the first angle indication;
[0020] Step 1.4: After re-placing the level on the base, vertically mount the calibration target on the loading plate, and adjust the base of the level according to the fourth angle indication of the level so that the fourth angle indication is the same as the first angle indication, thereby making the calibration target and the horizontal plane of the base perpendicular to each other;
[0021] Step 2: Place two positioning targets on the left frequency-stabilized laser and the right frequency-stabilized laser respectively; then, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating stage, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating stage respectively, so that the laser emitted by the left frequency-stabilized laser hits the position p of one positioning target and the laser emitted by the right frequency-stabilized laser hits the position q of the other positioning target, and record the current measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating stage p , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage p , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating stage q , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage q ;
[0022] Step 3. Calculate the distance d between the rotation centers of the left and right frequency-stabilized lasers:
[0023] Step 3.1: Rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotary table, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotary table, so that the lasers emitted by the left stabilized laser and the right stabilized laser successively hit the same position a on the position detector of the calibration target, and record the current indication x obtained by the position detector on the calibration target. a , and record the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating stage a1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage a1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating stage a2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage a2 ;
[0024] Step 3.2: Slightly rotate the latitudinal turntables of the left and right two-dimensional rotating stages so that the lasers emitted by the left and right stabilized lasers successively hit the same position b in the vertical direction of the position detector of the calibration target, and record the current indication x obtained by the position detector on the calibration target. b , and the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage b1 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage b2 ;
[0025] Step 3.3: Calculate the distance d between the rotation centers of the left and right frequency-stabilized lasers according to equation (1):
[0026] (1)
[0027] Step 4: Calculate the distance from the rotation center of the left frequency-stabilized laser to each positioning target:
[0028] Step 4.1. Place a first positioning target on the reference platform, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform, so that the lasers emitted by the left stabilized laser and the right stabilized laser successively hit the same position A on the four-quadrant detector of the first positioning target, and record the current measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform. A1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage A1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating stage A2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage A2 ;
[0029] Step 4.2: Calculate the distance L from the rotation center of the left frequency-stabilized laser to position A on the first positioning target according to formula (2): A1 :
[0030]
[0031] Step 4.3: Place a second positioning target on the reference platform, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform, so that the lasers emitted by the left stabilized laser and the right stabilized laser successively hit the same position B on the four-quadrant detector of the second positioning target, and record the current measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform. B1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage B1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating stage B2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage B2 ;
[0032] Step 4.4: Calculate the distance L from the rotation center of the left frequency-stabilized laser to the second positioning target position B according to formula (3): B1 :
[0033] (3)
[0034] Step 4.5: Place a third positioning target on the reference platform, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform, so that the lasers emitted by the left stabilized laser and the right stabilized laser successively hit the same position C on the four-quadrant detector of the third positioning target, and record the current measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform. C1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage C1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating stage C2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage C2 ;
[0035] Step 4.6: Calculate the distance L from the rotation center of the left frequency-stabilized laser to the third positioning target position C according to formula (4): C1 :
[0036] (4)
[0037] Step 4.7: Place a fourth positioning target on the target mounting load, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating stage, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating stage, so that the lasers emitted by the left stabilized laser and the right stabilized laser successively hit the same position D on the four-quadrant detector of the fourth positioning target, and record the current measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating stage. D1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage D1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating stage D2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage D2 ;
[0038] Step 4.8: Calculate the distance L from the rotation center of the left frequency-stabilized laser to the fourth positioning target position D according to formula (5): D1 :
[0039] (5)
[0040] Step 5: Based on the solution of step 4, the spherical coordinates of the first positioning target, the second positioning target, the third positioning target, and the fourth positioning target at position A, position B, position C, and position D in the left measurement device coordinate system are obtained in the spherical coordinate system of the left two-dimensional rotating stage, and are recorded as: A(L A1 , φ A1 , θA1 )、B(L B1 , φ B1 ,θ B1 )、C(L C1 , φ C1 , θ C1 )、D(L D1 , φ D1 , θ D1 ); mark the coordinate of the ball at any i-th position as i(L i1 ,φ i1 , θ i1 );
[0041] Step 6: According to formula (6), the spherical coordinates i(L i1 , φ i1 , θ i1 ) to perform coordinate transformation and obtain the coordinates of the i-th position in the rectangular coordinate system :
[0042] (6)
[0043] Step 7: Establish the reference platform coordinate system:
[0044] According to the coordinates of positions A, B, and C in the rectangular coordinate system, the plane normal vector formed by positions A, B, and C is used as the Z axis of the reference platform coordinate system, position A is used as the coordinate origin, the direction of the line between positions A and B is used as the X axis, and the direction perpendicular to the AB line is used as the Y axis, thereby establishing the reference platform coordinate system;
[0045] Step 8: Convert the coordinates of position D in the rectangular coordinate system into absolute coordinates in the reference platform coordinate system, thereby completing the position measurement of the target installation load.
[0046] Compared with the existing technology, the beneficial effects of the present invention are embodied in:
[0047] 1. The measuring device of the present invention has simple features, is easy to localize and industrialize, and can significantly reduce costs. Using a stabilized frequency laser as a sighting device can more accurately and intuitively aim at the target installation load.
[0048] 2. The high-precision photoelectric sensor positioning target in the present invention, as a signal receiver of the aiming laser, can obtain the information of the aiming point more accurately, thereby achieving a large-scale and high-precision measurement of the absolute coordinates of the target position.
[0049] 3. The high-precision photoelectric sensor calibration target in the present invention serves as a calibration reference for a large-scale, high-precision, two-dimensional rotary stage, and can accurately provide the calibration length measured by the aiming laser of the laser on the measuring device, thereby avoiding the influence of aiming errors in the traditional theodolite calibration process and realizing the calibration of a high-precision spatial position measurement system. BRIEF DESCRIPTION OF THE DRAWINGS
[0050] Figure 1 This is a schematic diagram of a two-dimensional rotating stage measuring a measurement target according to the present invention;
[0051] Figure 2 Schematic diagram of laser mutual marking on a two-dimensional rotating table in the present invention;
[0052] Figure 3 Schematic diagram of distance calibration between lasers on a two-dimensional rotating platform in the present invention;
[0053] Figure 4 Schematic diagram of the geometric relationship between the laser light emitted by the laser and the calibration target in the spatial position measurement system of the present invention;
[0054] Figure 5 Schematic diagram of the geometric relationship between the laser light emitted by the laser and the positioning target in the spatial position measurement system of the present invention;
[0055] Figure 6 Schematic diagram of the position coordinates between positioning targets in the spherical coordinate system of the spatial position measurement system of the present invention;
[0056] Numbers in the figure: 1 base, 2 left two-dimensional rotation stage, 3 right two-dimensional rotation stage, 4 calibration target, 5 level, 6 computer processor, 61 first positioning target, 62 second positioning target, 63 third positioning target, 64 fourth positioning target, 7 reference stage, 8 target mounting load, 31 left frequency-stabilized laser, 32 right frequency-stabilized laser. DETAILED DESCRIPTION
[0057] The following describes in detail the large-scale and high-precision spatial assembly position absolute coordinate measurement system and measurement method for measuring the absolute coordinates of spatial assembly positions of the present invention in conjunction with the embodiments and the accompanying drawings.
[0058] In this embodiment, Figure 1 As shown, a large-scale, high-precision absolute coordinate measurement system for spatial assembly positions includes: a left measuring device, a right measuring device, a base 1, a calibration target 4, a level 5, several positioning targets, and a computer processor 6. The left measuring device includes: a left two-dimensional rotary table 2 and a left stabilized laser 31, and the right measuring device includes: a right two-dimensional rotary table 3 and a right stabilized laser 32.
[0059] There is a longitudinal angle measuring device on the longitudinal turntable of the left two-dimensional rotating platform 2, and a latitudinal angle measuring device on the latitudinal turntable;
[0060] There is a longitudinal angle measuring device on the longitudinal turntable of the right two-dimensional rotating platform 3, and a latitudinal angle measuring device on the latitudinal turntable;
[0061] A left frequency-stabilized laser 31 is arranged at the rotation center of the latitudinal turntable of the left two-dimensional rotating platform 2, and a right frequency-stabilized laser 32 is arranged at the rotation center of the latitudinal turntable of the right two-dimensional rotating platform 3;
[0062] A left measuring device and a right measuring device are symmetrically arranged on the base 1;
[0063] A target mounting load 8 is placed in front of the base 1 and is placed on a reference platform 7 for measuring the target. Three positioning targets (positioning target 61, positioning target 62, and positioning target 63) are placed on the reference platform 7 according to the reference measurement requirements and are not in a line. A positioning target 64 is placed on the target mounting load 8 according to the load measurement position requirements. When placing the positioning targets, the four-quadrant position detector on the positioning targets is in the optical path of the left stabilized laser 31 and the right stabilized laser 32. A level 5 is placed on the base 1 and is in front of the optical path of the left stabilized laser 31 and the right stabilized laser 32. A calibration target 4 is vertically mounted on the loading plate of the level 5. A high-precision long-stroke position detector is provided on the calibration target 4 and is in the optical path of the left stabilized laser 31 and the right stabilized laser 32. A computer processor 6 is connected to the interfaces of the left two-dimensional rotary stage 2, the right two-dimensional rotary stage 3, and the calibration target 4, respectively.
[0064] In this embodiment, a method for measuring the absolute coordinates of a spatial assembly position with high precision over a large range is performed in the following steps:
[0065] Step 1: Adjust the absolute coordinate measurement system:
[0066] Step 1.1: Place the level 5 without a calibration target on the base 1, adjust the base 1 to a level according to the angle indicated by the level 5, and record the first angle indicated when the level is reached.
[0067] Step 1.2: Place the level 5 on the latitudinal turntable of the left two-dimensional rotating stage 2, and adjust the left two-dimensional rotating stage 2 according to the second angle indication of the level 5 so that the second angle indication is the same as the first angle indication;
[0068] Step 1.3: Place the level 5 on the latitudinal turntable of the right two-dimensional rotating stage 3, and adjust the right two-dimensional rotating stage 3 according to the third angle indication of the level 5 so that the third angle indication is the same as the first angle indication;
[0069] Step 1.4: After re-placing the level 5 on the base 1, vertically mount the calibration target 4 on the loading plate. Based on the fourth angle indication of the level 5, adjust the base of the level 5 so that the fourth angle indication is the same as the first angle indication, so that the calibration target 4 and the horizontal plane of the base 1 are perpendicular to each other.
[0070] Step 2: Figure 2 As shown, two positioning targets are placed at the upper rotation centers of the left stabilized laser 31 and the right stabilized laser 32 respectively; the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform 2 and the right two-dimensional rotating platform 3 are rotated respectively so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 hit the positions p and q of the two positioning targets respectively. Then, the measurement result of the longitudinal angle measurement device on the left two-dimensional rotating platform 2 at this time is recorded as φ p =0°, the measurement result of the latitudinal angle measuring device on the left two-dimensional rotating stage 2 is θ p =0°, the measurement result of the longitudinal angle measuring device on the right two-dimensional rotating platform 3 is φ q =180°, the measurement result of the latitudinal angle measuring device on the right two-dimensional rotating platform 3 is θ q =0°, remove the two positioning targets after completing the laser mutual marking process of the measuring device;
[0071] Step 3: Calculate the distance d between the rotation centers of the left frequency-stabilized laser 31 and the right frequency-stabilized laser 32:
[0072] Step 3.1, such as Figure 3 As shown, the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform 2, as well as the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform 3, are rotated so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 successively hit the same position a on the position detector of the calibration target 4, and the indication x obtained by the position detector on the calibration target 4 at this time is recorded. a =1.253245mm, and record the measurement result of the longitudinal angle measuring device on the left two-dimensional rotating table 2 at this time φ a1 =60°, the measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage 2 a1 =3°23'35'', the measurement result of the longitudinal angle measuring device on the right two-dimensional rotating table 3 is φ a2 =120°, the measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating stage 3 a2 =5°23'35'';
[0073] Step 3.2: Slightly rotate the latitudinal turntables of the left two-dimensional rotating stage 2 and the right two-dimensional rotating stage 3 so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 successively hit the same position b in the vertical direction of the position detector of the calibration target 4, and record the indication x obtained by the position detector on the calibration target 4 at this time. b =11.485425mm, and the measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage 2 b1 =3°48'45'', the measurement result of the latitudinal angle measuring device on the right two-dimensional rotating table 3 is θ b2 =3°48'45'';
[0074] Step 3.3, such as Figure 4 As shown, based on the principle of spatial geometry, the distance d between the rotation centers of the left frequency-stabilized laser 31 and the right frequency-stabilized laser 32 is calculated according to formula (1):
[0075] (1)
[0076] Step 4: Calculate the distance from the rotation center of the left frequency-stabilized laser 31 to each positioning target:
[0077] Step 4.1, such as Figure 5 As shown, a first positioning target 61 is placed on the reference platform 7, and the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform 2, as well as the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform 3, are rotated so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 successively hit the same position A on the four-quadrant detector of the first positioning target 61 placed on the reference platform 7, and the measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform 2 at this time is recorded. A1 =76°37'38'', the measurement result of the latitudinal angle measuring device on the left two-dimensional rotating table 2 is θ A1 =11°28'45'', the measurement result of the longitudinal angle measuring device on the right two-dimensional rotating table 3 is φ A2 =110°28'43'', the measurement result of the latitudinal angle measuring device on the right two-dimensional rotating table 3 is θ A2 =11°28'45'';
[0078] Step 4.2: Based on the principle of spatial geometry, the distance L from the rotation center of the left frequency-stabilized laser 31 to the position A on the first positioning target 61 can be calculated according to formula (2): A1 :
[0079] (2)
[0080] Step 4.3: Place the second positioning target 62 on the reference platform 7, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform 2, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform 3, so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 successively hit the same position B on the four-quadrant detector of the second positioning target 62 placed on the reference platform 7, and record the measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform 2 at this time. B1 =75°46'42'', the measurement result of the latitudinal angle measuring device on the left two-dimensional rotating table 2 is θ B11 =11°27'43'', the measurement result of the longitudinal angle measuring device on the right two-dimensional rotating table 3 is φ B =110°34'33''2, the measurement result of the latitudinal angle measuring device on the right two-dimensional rotating table 3 is θ B22 =11°27'43'';
[0081] Step 4.4: Based on the principle of spatial geometry, calculate the distance L from the rotation center of the left frequency-stabilized laser 31 to the position B of the second positioning target 62 according to formula (3): B1 :
[0082] (3)
[0083] Step 4.5: Place the third positioning target 63 on the reference platform 7, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform 2, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform 3, so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 successively hit the same position C on the four-quadrant detector of the third positioning target 63 placed on the reference platform 7, and record the measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform 2 at this time. C1 =76°55'35'', the measurement result of the latitudinal angle measuring device on the left two-dimensional rotating table 2 is θ C1 =11°25'33'', the measurement result of the longitudinal angle measuring device on the right two-dimensional rotating table 3 is φ C2 =110°52'22'', the measurement result of the latitudinal angle measuring device on the right two-dimensional rotating table 3 is θ C2 =11°25'33'';
[0084] Step 4.6: Based on the principle of spatial geometry, calculate the distance L from the rotation center of the left frequency-stabilized laser 31 to the position C of the third positioning target 63 according to formula (4): C1 :
[0085] (4)
[0086] Step 4.7: Place the fourth positioning target 64 on the reference platform 7, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform 2, and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform 3, so that the lasers emitted by the left stabilized laser 31 and the right stabilized laser 32 successively hit the same position D on the four-quadrant detector of the fourth positioning target 64 placed on the target mounting load 8, and record the measurement result φ of the longitudinal angle measurement device on the left two-dimensional rotating platform 2 at this time. D1 =76°15'45'', the measurement result of the latitudinal angle measuring device on the left two-dimensional rotating table 2 is θ D1 =13°12'23'', the measurement result of the longitudinal angle measuring device on the right two-dimensional rotating table 3 is φ D2 =110°11'32'', the measurement result of the latitudinal angle measuring device on the right two-dimensional rotating table 3 is θ D2 =14°12'23'';
[0087] Step 4.8: Based on the principle of spatial geometry, calculate the distance L from the rotation center of the left stabilized laser 31 to the position D of the fourth positioning target 64 according to formula (5): D1 :
[0088] (5)
[0089] Step 5: Figure 6 As shown, according to the solution result of step 4, in the spherical coordinate system of the left two-dimensional rotary stage 2, the spherical coordinates of positions A, B, C, and D on the first positioning target 61, the second positioning target 62, the third positioning target 63, and the fourth positioning target 64 in the left measuring device coordinate system are obtained respectively, which are recorded as: A(10758.400367, 76°37'38'', 11°28'45''), B(12016.579701, 75°46'42'', 11°27'43''), C(9779.781186, 76°55'35'', 11°25'33''), and D(11938.762150, 76°15'45'', 13°12'23''). The coordinates of the ball at any i-th position are marked as i(L i1 , φ i1 , θ i1 );
[0090] Step 6: According to formula (6), the spherical coordinates i(L i1 , φ i1 , θ i1 ) to perform coordinate transformation and obtain the coordinates of the i-th position in the rectangular coordinate system :
[0091] (6)
[0092] Thus, the coordinates of position A, position B, position C, and position D on the first positioning target 61, the second positioning target 62, the third positioning target 63, and the fourth positioning target 64 in the rectangular coordinate system of the measuring device are obtained, which are: A(495.1957, 2082.999757, 10543.200260), B(586.6437, 2314.706732, 11776.933794), C(438.2362, 1887.146394, 9585.966178), and D(550.9933, 2253.853271, 11711.131181).
[0093] Step 7: Establish the reference platform 7 coordinate system:
[0094] According to the coordinates of positions A, B, and C in the rectangular coordinate system, the plane normal vector formed by positions A, B, and C is used as the Z axis of the reference platform 7 coordinate system, position A is used as the coordinate origin, the direction of the line between positions A and B is used as the X axis, and the direction perpendicular to the AB line is used as the Y axis, thereby establishing the reference platform 7 coordinate system;
[0095] Step 8: Convert the coordinates of the position D in the rectangular coordinate system into absolute coordinates in the coordinate system of the reference platform 7 , thereby completing the position measurement of the target installation load 8 .
[0096] The measuring device involved in the large-scale, high-precision spatial assembly position absolute coordinate measurement system and measurement method of the present invention has simple characteristics, is easy to be domestically produced and industrialized, and the cost can be greatly reduced. In addition, the use of a frequency-stabilized laser as an aiming device can more accurately and intuitively aim at the target installation load. The high-precision photoelectric sensor positioning target designed and used in the present invention as a signal receiver for the aiming laser can more accurately obtain the information of the aiming point, thereby achieving high-precision measurement of the absolute coordinates of the target position. The high-precision photoelectric sensor calibration target designed and used in the present invention as a calibration reference for the large-scale, high-precision two-dimensional rotating stage can accurately provide the calibration length measured by the aiming laser of the laser on the measuring device, avoiding the influence of the aiming error in the calibration process of the traditional theodolite, and can realize the calibration of the high-precision spatial position measurement system. Therefore, the present invention not only has a simple and flexible system structure, is easy to implement, and has low cost, but can also more accurately obtain the information of the aiming point, thereby achieving high-precision measurement of the absolute coordinates of the target spatial assembly position.
[0097] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. A large-scale, high-precision absolute coordinate measurement system for spatial assembly positions, characterized in that: include: A left measuring device, a right measuring device, a base (1), a calibration target (4), a level (5), a plurality of positioning targets, and a computer processor (6), wherein the left measuring device comprises: a left two-dimensional rotating platform (2), a left frequency-stabilized laser (31); and the right measuring device comprises: a right two-dimensional rotating platform (3), a right frequency-stabilized laser (32). A longitudinal angle measuring device is provided on the longitudinal turntable of the left two-dimensional rotating platform (2), and a latitudinal angle measuring device is provided on the latitudinal turntable; A longitudinal angle measuring device is provided on the longitudinal turntable of the right two-dimensional rotating platform (3), and a latitudinal angle measuring device is provided on the latitudinal turntable; The left frequency-stabilized laser (31) is arranged at the rotation center of the latitudinal turntable of the left two-dimensional rotating platform (2), and the right frequency-stabilized laser (32) is arranged at the rotation center of the latitudinal turntable of the right two-dimensional rotating platform (3); The left measuring device and the right measuring device are symmetrically arranged on the base (1); The level (5) is provided on the base (1), and the level (5) is located in front of the optical path of the left frequency-stabilized laser (31) and the right frequency-stabilized laser (32); The calibration target (4) is vertically mounted on the loading plate of the level (5); a high-precision long-stroke position detector is provided on the calibration target (4), and the long-stroke position detector is located in the optical path of the left frequency-stabilized laser (31) and the right frequency-stabilized laser (32); A target mounting load (8) is provided in front of the base (1), and the target mounting load (8) is located on a reference platform (7) of the measurement target; a plurality of positioning targets are respectively provided on the reference platform (7) and the target mounting load (8); wherein, at least three positioning targets are provided on the reference platform (7) according to reference measurement requirements and are not arranged on a line, and at least one positioning target is provided on the target mounting load (8) according to load measurement position requirements; A four-quadrant position detector is provided on the positioning target; and the four-quadrant position detector is located on the optical path of the left frequency-stabilized laser (31) and the right frequency-stabilized laser (32); The computer processor (6) is respectively connected to interfaces of the left two-dimensional rotating platform (2), the right two-dimensional rotating platform (3), and the calibration target (4).
2. The measurement method of the large-scale and high-precision absolute coordinate measurement system for spatial assembly positions according to claim 1, characterized in that: The steps include: Step 1: Adjust the absolute coordinate measurement system: Step 1.1, adjusting the table top of the base (1) to be level according to the angle indicated by the level (5), and recording the first angle indicated when the table top is level; Step 1.2, placing the level (5) on the latitudinal turntable of the left two-dimensional rotating platform (2), and adjusting the left two-dimensional rotating platform (2) according to the second angle indication of the level (5) so that the second angle indication is the same as the first angle indication; Step 1.3, placing the level (5) on the latitudinal turntable of the right two-dimensional rotating platform (3), and adjusting the right two-dimensional rotating platform (3) according to the third angle indication of the level (5), so that the third angle indication is the same as the first angle indication; Step 1.4, after the level (5) is re-placed on the base (1), the calibration target (4) is vertically mounted on the loading plate, and according to the fourth angle indication of the level (5), the base of the level (5) is adjusted so that the fourth angle indication is the same as the first angle indication, thereby making the calibration target (4) and the horizontal plane of the base (1) perpendicular to each other; Step 2: Place two positioning targets on the left frequency-stabilized laser (31) and the right frequency-stabilized laser (32), respectively; then, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform (2), and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform (3), respectively, so that the laser emitted by the left frequency-stabilized laser (31) hits the position p of one positioning target, and the laser emitted by the right frequency-stabilized laser (32) hits the position q of the other positioning target, and records the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating platform (2). p , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating platform (2) p , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating platform (3) q , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) q ; Step 3: Calculate the distance d between the rotation centers of the left frequency-stabilized laser (31) and the right frequency-stabilized laser (32): Step 3.1, rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform (2), and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform (3), so that the lasers emitted by the left stabilized laser (31) and the right stabilized laser (32) successively hit the same position a on the position detector of the calibration target (4), and record the current indication x obtained by the position detector on the calibration target (4). a , and record the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating platform (2) a1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating platform (2) a1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating platform (3) a2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) a2 ; Step 3.2: slightly rotate the latitudinal turntables of the left two-dimensional rotating platform (2) and the right two-dimensional rotating platform (3) so that the lasers emitted by the left stabilized laser (31) and the right stabilized laser (32) successively hit the same position b in the vertical direction of the position detector of the calibration target (4), and record the current indication x obtained by the position detector on the calibration target (4). b , and the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating stage (2) b1 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) b2 ; Step 3.3: Calculate the distance d between the rotation centers of the left frequency-stabilized laser (31) and the right frequency-stabilized laser (32) according to formula (1): (1) Step 4: Calculate the distance from the rotation center of the left frequency-stabilized laser (31) to each positioning target: Step 4.1: Place a first positioning target (61) on the reference platform (7), rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform (2), and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform (3), so that the lasers emitted by the left stabilized laser (31) and the right stabilized laser (32) successively hit the same position A on the four-quadrant detector of the first positioning target (61), and record the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating platform (2). A1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating platform (2) A1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating platform (3) A2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) A2 ; Step 4.2: Calculate the distance L from the rotation center of the left frequency-stabilized laser (31) to the position A on the first positioning target (61) according to formula (2). A1 : (2) Step 4.3, place a second positioning target (62) on the reference platform (7), rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform (2), and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform (3), so that the lasers emitted by the left stabilized laser (31) and the right stabilized laser (32) successively hit the same position B on the four-quadrant detector of the second positioning target (62), and record the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating platform (2) B1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating platform (2) B1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating platform (3) B2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) B2 ; Step 4.4: Calculate the distance L from the rotation center of the left frequency-stabilized laser (31) to the position B of the second positioning target (62) according to formula (3). B1 : (3) Step 4.5: Place a third positioning target (63) on the reference platform (7), rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform (2), and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform (3), so that the lasers emitted by the left stabilized laser (31) and the right stabilized laser (32) successively hit the same position C on the four-quadrant detector of the third positioning target (63), and record the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating platform (2). C1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating platform (2) C1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating platform (3) C2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) C2 ; Step 4.6: Calculate the distance L from the rotation center of the left frequency-stabilized laser (31) to the position C of the third positioning target (63) according to formula (4): C1 : (4) Step 4.7, place a fourth positioning target (64) on the target mounting load (8), rotate the longitudinal turntable and the latitudinal turntable of the left two-dimensional rotating platform (2), and the longitudinal turntable and the latitudinal turntable of the right two-dimensional rotating platform (3), so that the lasers emitted by the left stabilized laser (31) and the right stabilized laser (32) successively hit the same position D on the four-quadrant detector of the fourth positioning target (64), and record the current measurement result φ of the longitudinal angle measuring device on the left two-dimensional rotating platform (2) D1 , the current measurement result θ of the latitudinal angle measuring device on the left two-dimensional rotating platform (2) D1 , the current measurement result φ of the longitudinal angle measuring device on the right two-dimensional rotating platform (3) D2 , the current measurement result θ of the latitudinal angle measuring device on the right two-dimensional rotating platform (3) D2 ; Step 4.8: Calculate the distance L from the rotation center of the left frequency-stabilized laser (31) to the position D of the fourth positioning target (64) according to formula (5): D1 : (5) Step 5. According to the solution of step 4, the spherical coordinates of the first positioning target (61), the second positioning target (62), the third positioning target (63), and the fourth positioning target (64) at position A, position B, position C, and position D in the left measuring device coordinate system are obtained in the spherical coordinate system of the left two-dimensional rotating stage (2), and are recorded as: A(L A1 , φ A1 ,θ A1 )、B(L B1 , φ B1 , θ B1 )、C(L C1 , φ C1 , θ C1 )、D(L D1 , φ D1 , θ D1 ); mark the coordinate of the ball at any i-th position as i(L i1 , φ i1 , θ i1 ); Step 6: According to formula (6), the spherical coordinates i(L i1 , φ i1 , θ i1 ) to perform coordinate transformation and obtain the coordinates of the i-th position in the rectangular coordinate system : (6) Step 7: Establish the coordinate system of the base station (7): According to the coordinates of positions A, B and C in the rectangular coordinate system, the plane normal vector formed by positions A, B and C is used as the Z axis of the reference platform (7) coordinate system, position A is used as the coordinate origin, the direction of the line between positions A and B is used as the X axis, and the direction perpendicular to the AB line is used as the Y axis, thereby establishing the reference platform (7) coordinate system; Step 8: Convert the coordinates at position D in the rectangular coordinate system into absolute coordinates in the reference platform (7) coordinate system, thereby completing the position measurement of the target installation load (8).
Citation Information
Patent Citations
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CN104677280A
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CN115164839A