Virtual instrument-oriented automation test control system and synchronous data acquisition method

Abstract

The application discloses an automation test control system and a synchronous data acquisition method for a virtual instrument, wherein a synchronous control module is provided with n IN pins and n OUT pins, the n IN pins are connected with the synchronous signal output ends of n board cards through a chassis bottom plate respectively, the n OUT pins are connected with the synchronous signal input ends of the n board cards through the chassis bottom plate respectively, and n is greater than or equal to 3. That is, based on the Ethernet communication technology, the board card is designed with a synchronous mechanism, the signal synchronization between any board cards can be configured, the mapping and control of the synchronous signal lines between the board cards are realized, different devices can simultaneously receive signals and operate, so that the board cards in the chassis can be directly accessed through the Ethernet and IP connection, the switch board card realizes the function of the Ethernet switch, can be directly connected with a computer, and has the characteristics of simple structure and low cost.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of intelligent instruments and meters, more specifically, to an automatic test control system for virtual instruments and a synchronous data acquisition method. BACKGROUND

[0002] A virtual instrument is a testing and control tool based on computer technology, which can simulate the functions of actual instruments and has high flexibility and scalability. In an automatic test control system, virtual instruments can be used to test various physical quantities such as voltage, current, pressure, temperature, etc., and also can collect, analyze and process test data.

[0003] The automatic test control system includes multiple virtual instrument modules, each of which can test different physical quantities. These modules are connected to each other through a data bus to achieve the sharing and synchronous acquisition of test data. In addition, the system also includes a control module for controlling the start and end of the test process and data acquisition.

[0004] In terms of synchronous data acquisition, the system adopts a timestamp-based synchronization method. Before the test starts, each virtual instrument module will obtain a timestamp, and then record the timestamp of the test data during the test process. After the test ends, the system will sort and integrate all the test data of the virtual instrument modules according to their corresponding timestamps to ensure the accuracy and synchronization of the data.

[0005] In a computer system, the chassis backplane is an important component that connects various boards and devices together and ensures their normal operation. Currently, the chassis backplane in China uses PCI or PCIE bus communication. PCI or PCIE bus is a high-speed serial bus used to connect various devices in a computer, such as graphics cards, sound cards, network cards, etc. Due to its high-speed transmission characteristics, PCI or PCIE bus is easily affected by interference and distortion during signal transmission, resulting in signal delay. Synchronous signal delay may cause various problems in the computer system. For example, in real-time systems, synchronous signal delay may cause the system response time to be too long, affecting the performance and stability of the system. In the process of data transmission, synchronous signal delay may cause the data transmission speed to decrease, affecting the throughput and response time of the system. SUMMARY

[0006] In order to overcome the prior art, the present application provides a virtual instrument-oriented automatic test control system and a synchronous data acquisition method, based on Ethernet communication technology, with a synchronization mechanism in the card design, which can configure the signal synchronization between any cards, realize the mapping and control of the synchronous signal lines between the cards, and enable different devices to simultaneously receive signals and operate, realizing the functions of one-to-one, one-to-many and many-to-one of the synchronous signals, so that the cards in the case can be directly accessed through Ethernet and IP connection, the Switch card realizes the function of the Ethernet switch, and can be directly connected with the computer, having the characteristics of simple structure and low cost.

[0007] The technical scheme of the present application is as follows: a virtual instrument-oriented automatic test control system, comprising: n cards, a Switch card and a case bottom plate, the Switch card is provided with a synchronous control module, the synchronous control module is provided with n IN pins and n OUT pins, the n IN pins are connected with the synchronous signal output ends of the n cards through the case bottom plate, and the n OUT pins are connected with the synchronous signal input ends of the n cards through the case bottom plate, wherein n is greater than or equal to 3.

[0008] Further, the case bottom plate is provided with n card slots, the first IN pin and the first OUT pin of the synchronous control module are connected with the first card through the first card slot of the case bottom plate, the second IN pin and the second OUT pin of the synchronous control module are connected with the second card through the second card slot of the case bottom plate, and so on, and the nth IN pin and the nth OUT pin of the synchronous control module are connected with the nth card through the nth card slot of the case bottom plate.

[0009] Further, it further comprises n or modules, each or module comprises an OUT endpoint and n IN endpoints, the n IN endpoints correspond to the n IN pins of the synchronous control module one by one, when the nth IN endpoint of the second or module is turned on and the first IN endpoint of the nth or module is turned on, the synchronous signal output end of the first card is connected to the synchronous signal input end of the nth card, and the synchronous signal output end of the nth card is connected to the synchronous signal input end of the second card.

[0010] Further, it further comprises n or modules, each or module comprises an OUT endpoint and n IN endpoints, the n IN endpoints correspond to the n IN pins of the synchronous control module one by one, when the first IN endpoint of the second or module is turned on and the first IN endpoint of the nth or module is turned on, the synchronous signal output end of the first card is connected to the synchronous signal input end of the second card and the synchronous signal input end of the nth card.

[0011] Further, the n or modules each include one OUT endpoint and n IN endpoints, the n IN endpoints correspond to the n IN pins of the synchronization control module one by one, and when the first IN endpoint and the second IN endpoint of the nth or module are turned on, the synchronization signal output end of the first board card and the synchronization signal output end of the second board card are connected to the synchronization signal input end of the nth board card.

[0012] Further, the Switch board card is a PCIE Switch board card.

[0013] Further, the chassis bottom plate communicates through Ethernet.

[0014] The application further provides a synchronization data acquisition method of the automatic test control system.

[0015] S1, a master device generates a clock signal, and the master device transmits and controls the signal through a switch board card to transmit the clock signal to a slave device through a synchronization signal line;

[0016] S2, the slave device transmits data or executes an instruction through the rising edge or the falling edge of the received clock signal.

[0017] Further, the master device includes a clock unit for generating the clock signal and a power supply circuit.

[0018] Further, the switch board card includes a signal input port, a signal output port and a synchronization control module.

[0019] The application according to the above scheme has the following beneficial effects:

[0020] (1) The application provides an automatic test control system for a virtual instrument, which includes n board cards, a Switch board card and a chassis bottom plate, the Switch board card is internally provided with a synchronization control module, the synchronization control module is provided with n IN pins and n OUT pins, the n IN pins are connected to the synchronization signal output ends of the n board cards through the chassis bottom plate, the n OUT pins are connected to the synchronization signal input ends of the n board cards through the chassis bottom plate, and n is greater than or equal to 3. That is, the automatic test control system for the virtual instrument provided by the application is based on Ethernet communication technology, has a synchronization mechanism in the design of the board card, can configure the signal synchronization between any board cards, realizes the mapping and control of the synchronization signal lines between the board cards, and enables different devices to simultaneously receive signals and operate, so as to realize the functions of one-to-one, one-to-many and many-to-one of the synchronization signal, so that the board cards in the chassis can be directly accessed through Ethernet and IP connection, the Switch board card realizes the function of an Ethernet switch and can be directly connected with a computer, and has the characteristics of simple structure and low cost.

[0021] (2) The application provides a virtual instrument-oriented automatic test control system, a switch board card is designed with a synchronization mechanism, the switch board card realizes the function of an Ethernet switch, and communicates through an Ethernet, so that the virtual instrument-oriented automatic test control system is simple in structure and low in cost, can be directly connected with a computer, secondly, a bus scheme is improved by using mature Ethernet technology, so that the automatic test control system is stable and reliable, and can be used for internal communication of a low-cost test and control case.

[0022] (3) The application provides a virtual instrument-oriented automatic test control system, because of using Ethernet communication technology, a single card can be connected with a computer alone or inserted into a case to be connected with the computer.

[0023] (4) The application provides a virtual instrument-oriented automatic test control system, because of using Ethernet communication technology, a single card can be connected with a computer alone or inserted into a case to be connected with the computer, secondly, a communication mode is simple, and a board card in the case can be directly accessed through Ethernet and IP. BRIEF DESCRIPTION OF DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the application, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative effort on the basis of these drawings.

[0025] Figure 1 It is a synchronization signal connection path diagram in the embodiment 1 of the application;

[0026] Figure 2 It is a one-to-one signal connection path diagram in the embodiment 1 of the application;

[0027] Figure 3 It is a one-to-one module connection diagram in the embodiment 1 of the application;

[0028] Figure 4 It is a one-to-one synchronization signal waveform diagram in the embodiment 1 of the application;

[0029] Figure 5 It is a one-to-many signal connection path diagram in the embodiment 2 of the application;

[0030] Figure 6 It is a one-to-many module connection diagram in the embodiment 2 of the application;

[0031] Figure 7 It is a one-to-many synchronization signal waveform diagram in the embodiment 2 of the application;

[0032] Figure 8 A multi-to-one signal connection path diagram in the embodiment 3 of the present application;

[0033] Figure 9 A multi-to-one module connection diagram in the embodiment 3 of the present application;

[0034] Figure 10 A multi-to-one synchronization signal waveform diagram in the embodiment 3 of the present application. DETAILED DESCRIPTION

[0035] The embodiments of the present application will be further described in detail below with reference to the accompanying drawings and embodiments. The detailed description of the following embodiments and the accompanying drawings are used to exemplarily illustrate the principles of the present application, but cannot be used to limit the scope of the present application, that is, the present application is not limited to the described embodiments.

[0036] In the description of the present application, it should be noted that, unless otherwise specified, the meaning of "a plurality of" is two or more; in addition, the terms "first", "second", etc. are only used for description purposes, and cannot be understood as indicating or implying relative importance.

[0037] In order to better understand the present application, the present application will be further described below in conjunction with the accompanying drawings and embodiments:

[0038] Embodiment 1

[0039] The synchronization signal line technology is a method for solving the data synchronization between multiple devices. It transmits clock signals and control information by using a dedicated synchronization signal line to ensure that all devices operate according to the same clock and remain synchronized.

[0040] Referring to Figure 1 The embodiment 1 of the present application provides an automation test control system for a virtual instrument, which comprises n board cards, a switch card and a chassis bottom plate, the switch card is provided with a synchronization control module, the synchronization control module is provided with n IN pins and n OUT pins, the n IN pins are connected with the synchronization signal output ends of the n board cards through the chassis bottom plate, and the n OUT pins are connected with the synchronization signal input ends of the n board cards through the chassis bottom plate, wherein n is greater than or equal to 3.

[0041] The present application provides a synchronization data acquisition method of an automation test control system, comprising the following steps:

[0042] S1, the master device generates a clock signal, and the master device realizes transmission control of the signal through the switch card to transmit the clock signal to the slave device through the synchronization signal line;

[0043] S2, the slave device transmits data or executes instructions by receiving a rising edge or a falling edge of the clock signal.

[0044] Preferably, the master device comprises a clock unit for generating the clock signal and a power supply circuit.

[0045] Preferably, the switch board card comprises a signal input port, a signal output port and a synchronization control module.

[0046] The chassis bottom plate is provided with n card slots, a first IN pin and a first OUT pin of the synchronization control module are connected with a first board card through a first card slot of the chassis bottom plate, a second IN pin and a second OUT pin of the synchronization control module are connected with a second board card through a second card slot of the chassis bottom plate, and so on, and an nth IN pin and an nth OUT pin of the synchronization control module are connected with an nth board card through an nth card slot of the chassis bottom plate.

[0047] Referring to Figures 2 to 4 In the embodiment 1, the automation test control system for virtual instrument provided by the embodiment 1 can realize one-to-one setting of the synchronization signal, so as to drive another board card to act by the synchronization signal output by one board card. Specifically, the following steps are taken.

[0048] The automation test control system for virtual instrument provided by the embodiment 1 further comprises n or modules, each or module comprises an OUT endpoint and n IN endpoints, the n IN endpoints correspond to the n IN pins of the synchronization control module one by one, when an nth IN endpoint of a second or module is turned on and a first IN endpoint of an nth or module is turned on, a synchronization signal output end of the first board card is connected to a synchronization signal input end of the nth board card, and a synchronization signal output end of the nth board card is connected to a synchronization signal input end of the second board card. When the first board card acts, the first board card outputs a synchronization signal, the input synchronization signal of the nth board card detects the signal output of the first board card, and the nth board card performs corresponding action and outputs a synchronization signal, and the input synchronization signal of the second board card also detects the signal output of the first board card and performs corresponding action.

[0049] In the embodiment 1, the switch board card is a PCIE switch board card.

[0050] In the embodiment 1, the chassis bottom plate communicates through Ethernet.

[0051] Embodiment 2

[0052] Referring to Figures 5 to 7As shown in the embodiment 2, the automation test control system for virtual instrument provided by the embodiment 2 can realize one-to-many setting of the synchronization signal, so as to drive multiple board cards to act through the synchronization signal output by one board card. Specifically, as follows:

[0053] In the embodiment 2, the automation test control system for virtual instrument further includes n or modules, each or module includes an OUT endpoint and n IN endpoints, the n IN endpoints correspond to the n IN pins of the synchronization control module one by one, when the first IN endpoint of the second or module is connected and the first IN endpoint of the n or module is connected, the synchronization signal output end of the first board card is connected to the synchronization signal input end of the second board card and the synchronization signal input end of the n board card respectively. When the first board card acts, the first board card outputs a synchronization signal, the input synchronization signal of the second board card and the n board card detects the signal output of the first board card, and then performs corresponding action.

[0054] Embodiment 3

[0055] Referring to Figures 8 to 10 As shown in the embodiment 3, the automation test control system for virtual instrument provided by the embodiment 3 can realize many-to-one setting of the synchronization signal, so as to drive one board card to act through the synchronization signal output by multiple board cards. Specifically, as follows:

[0056] In the embodiment 3, the automation test control system for virtual instrument further includes n or modules, each or module includes an OUT endpoint and n IN endpoints, the n IN endpoints correspond to the n IN pins of the synchronization control module one by one, when the first IN endpoint and the second IN endpoint of the n or module are connected, the synchronization signal output end of the first board card and the synchronization signal output end of the second board card are connected to the synchronization signal input end of the n board card. When the first board card and the second board card act, the first board card or the second board card outputs a synchronization signal, the input synchronization signal of the n board card detects the signal output of the first board card or the second board card, and then performs corresponding action.

[0057] It should be understood that, for those skilled in the art, the above description can be improved or changed according to the above description, and all these improvements and changes shall belong to the protection scope of the appended claims of the present application.

[0058] The above description of the present application is exemplary in combination with the drawings, and obviously the implementation of the present application is not limited by the above manner. Any improvement or change of the method concept and technical solution of the present application, or direct application of the concept and technical solution of the present application to other occasions without improvement, shall be within the protection scope of the present application.

Claims

1. An automated test and control system for virtual instruments, characterized in that, include: There are n boards, a Switch board, and a chassis base plate. The Switch board has a synchronization control module with n IN pins and n OUT pins. The n IN pins are connected to the synchronization signal output terminals of the n boards through the chassis base plate, and the n OUT pins are connected to the synchronization signal input terminals of the n boards through the chassis base plate. Where n is greater than or equal to 3. The chassis base plate has n slots. The first IN pin and the first OUT pin of the synchronous control module are connected to the first board through the first slot of the chassis base plate. The second IN pin and the second OUT pin of the synchronous control module are connected to the second board through the second slot of the chassis base plate, and so on. The nth IN pin and the nth OUT pin of the synchronous control module are connected to the nth board through the nth slot of the chassis base plate. The system also includes n OR modules, each of which includes an OUT endpoint and n IN endpoints, and the n IN endpoints correspond one-to-one with the n IN pins of the synchronization control module. When the nth IN endpoint of the second OR module is turned on, and the first IN endpoint of the nth OR module is turned on, the synchronization signal output of the first board is connected to the synchronization signal input of the nth board, and the synchronization signal output of the nth board is connected to the synchronization signal input of the second board. When the first IN endpoint of the second OR module is turned on, and the first IN endpoint of the nth OR module is turned on, the synchronization signal output terminal of the first board is connected to the synchronization signal input terminal of the second board and the synchronization signal input terminal of the nth board, respectively. When the first IN endpoint and the second IN endpoint of the nth OR module are turned on, the synchronization signal output terminal of the first board and the synchronization signal output terminal of the second board are both connected to the synchronization signal input terminal of the nth board.

2. The automated test and control system for virtual instruments as described in claim 1, characterized in that: The switch card is a PCIe switch card.

3. The automated test and control system for virtual instruments as described in claim 1, characterized in that: The chassis baseplate communicates via Ethernet.

4. A synchronous data acquisition method for an automated test and control system, applicable to the automated test and control system for virtual instruments as described in any one of claims 1-3, characterized in that, Includes the following steps: S1. The master device generates a clock signal and controls the transmission of the signal through a switch board to transmit the clock signal to the slave device via a synchronization signal line. S2. The device transmits data or executes instructions by receiving the rising or falling edge of the clock signal.

5. The synchronous data acquisition method for an automated test and control system as described in claim 4, characterized in that: The main equipment includes a clock unit for generating clock signals and a power supply circuit.

6. The synchronous data acquisition method for an automated test and control system as described in claim 4, characterized in that: The switch board includes signal input ports, signal output ports, and a synchronization control module.

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