Test method, device, computer equipment and storage medium

Abstract

The present application relates to a testing method, apparatus, computer equipment and storage medium. The method executes a first test script in response to a test instruction input by a user on a test interface, outputs at least one test signal, and sends at least one test signal to a device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the at least one test signal, obtain a test result, and then obtain the test result on the device under test, and obtain a target test result based on the test result and the expected result. In the above method, since the test device remotely controls the test of the hard disk backplane by the device under test out of band, and the device under test is connected to different types of hard disk backplanes, when the test device is used to test the hard disk backplane, remote and multiple types of tests can be achieved, which greatly improves the test efficiency and saves the test cost.

Description

Technical Field

[0001] The present application relates to the technical field of server testing, and in particular to a testing method, apparatus, computer equipment and storage medium. Background Art

[0002] In the computer field, a server includes a computing unit, a storage unit, and a transmission unit. The storage unit includes a hard disk backplane, a hard disk, and a RIAD card (Redundant Array of Independent Disks). The hard disk backplane connects the RIAD card and the hard disk to provide data transmission and power support. Before the computer is put into use, the hard disk backplane of the server needs to be tested to ensure that the storage unit is working properly.

[0003] At present, the test method for hard disk backplane mainly involves manually connecting a certain type of hard disk backplane to a corresponding type of test fixture, and manually switching the test fixture to test different types of hard disk backplanes, and then manually summarizing and analyzing the test results.

[0004] However, the above test method has the problem of low efficiency. Summary of the invention

[0005] Based on this, it is necessary to provide a testing method, apparatus, computer equipment and storage medium that can improve testing efficiency in response to the above technical problems.

[0006] In a first aspect, the present application provides a testing method, the method comprising:

[0007] In response to a test instruction input by a user on a test interface, a first test script is executed, at least one test signal is output, and at least one test signal is sent to a device under test to instruct the device under test to test a hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result;

[0008] Obtain the test results on the device under test, and obtain the target test results based on the test results and expected results.

[0009] The test method provided by the embodiment of the present application executes the first test script, outputs at least one test signal, and sends at least one test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to at least one test signal, obtain the test result, and then obtain the test result on the device under test, and obtain the target test result according to the test result and the expected result. In the above method, since the test device remotely controls the test of the hard disk backplane of the device under test out of band, and the device under test is connected to different types of hard disk backplanes, when the hard disk backplane is tested by the test device, remote and multiple types of tests can be achieved. Compared with the traditional method that requires manual testing on site according to the hard disk backplane and the corresponding test tooling fixture, the above method greatly improves the test efficiency and saves the test cost. In addition, after the test is completed, it is only necessary to check the test results according to the timestamp information, which also improves the test efficiency.

[0010] In one of the embodiments, the first test script includes a software test function and / or a hardware test function; the software function includes at least one backplane property function, and the hardware test function includes at least one status light function.

[0011] In one embodiment, the method further comprises:

[0012] In response to the user triggering the generation of a state determination instruction on the test interface, obtaining a second test script corresponding to the state determination instruction;

[0013] Executing a first test script and outputting at least one test signal includes:

[0014] The second test script is executed to output at least one test signal.

[0015] In the test method provided in the embodiment of the present application, after receiving the test status selected by the user on the test interface, the test device can remotely control the device under test to automatically test the hard disk backplane under different test states, and can remotely switch different test states through human-computer interaction, thereby improving test efficiency.

[0016] In one embodiment, the method further comprises:

[0017] Displaying test function options; the test function options include function items corresponding to all functions included in the first test script;

[0018] In response to a selection instruction triggered by a user on a test interface, a third test script is generated according to the selection instruction;

[0019] Executing a first test script and outputting at least one test signal includes:

[0020] The third test script is executed to output at least one test signal.

[0021] The test method provided in the embodiment of the present application can remotely control the device under test to automatically test different test function options of the hard disk backplane after receiving the test function option selected by the user on the test interface. Different test function options can be remotely tested through human-computer interaction, thereby improving test efficiency.

[0022] In one embodiment, the test signal is a test signal output by the status light function in the first test script, and the test signal is sent to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the test signal, and obtain a test result, including:

[0023] Sending a test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and to control a status light to perform a corresponding operation according to the control signal;

[0024] Get the test results on the device under test, including:

[0025] The level signal output by the digital-to-analog conversion module connected to the device under test is read, and the level signal is used as the test result; the digital-to-analog conversion module is used to store the status data of the corresponding operation of the status light.

[0026] In the test method provided in the embodiment of the present application, the test device can test whether the hardware test function of the hard disk backplane is normal by obtaining the level signal of the hard disk backplane from the digital-to-analog conversion module and analyzing the level signal, thereby improving the test efficiency.

[0027] In a second aspect, the present application provides a testing method, the method comprising:

[0028] When receiving at least one test signal sent by the test device, testing the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result;

[0029] The test results are returned to the test equipment to instruct the test equipment to obtain the target test results based on the test results and expected results.

[0030] The test method provided by the embodiment of the present application tests the hard disk backplane corresponding to the test signal according to at least one test signal when receiving at least one test signal sent by the test device, obtains the test result, and returns the test result to the test device to instruct the test device to obtain the target test result according to the test result and the expected result. In the above method, since the test device remotely controls the test of the hard disk backplane of the device under test out-of-band, and the device under test is connected to different types of hard disk backplanes, when the hard disk backplane is tested by the test device, remote and various types of tests can be achieved. Compared with the traditional method that requires manual testing on site according to the hard disk backplane and the corresponding test tooling fixture, the above method greatly improves the test efficiency and saves the test cost. In addition, after the test is completed, it is only necessary to check the test results according to the timestamp information, which also improves the test efficiency.

[0031] In one embodiment, testing a hard disk backplane corresponding to the test signal according to at least one test signal to obtain a test result includes:

[0032] Determine the corresponding hard disk backplane and test strategy according to the test signal; the test strategy includes software test strategy and / or hardware test strategy;

[0033] According to the test strategy, the hard disk backplane corresponding to the test signal is tested to obtain a test result corresponding to the test signal.

[0034] According to the test method provided in the embodiment of the present application, after the device under test receives the test signal remotely sent by the test device, it can determine the hard disk backplane and the test strategy, and then perform corresponding tests, and the process does not require human intervention.

[0035] In a third aspect, the present application further provides a testing device, the device comprising:

[0036] A sending module, used to respond to a test instruction input by a user on a test interface, execute a first test script, output at least one test signal, and send at least one test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result;

[0037] The first acquisition module is used to acquire the test result on the device to be tested, and obtain the target test result according to the test result and the expected result.

[0038] In a fourth aspect, the present application further provides a computer device, which includes a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the steps of the test method of any one of the first and second aspects are implemented.

[0039] In a fifth aspect, the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the test method of any one of the first and second aspects are implemented.

[0040] In a sixth aspect, the present application further provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the steps of the test method of any one of the first and second aspects are implemented.

[0041] The above-mentioned test method, device, computer equipment and storage medium, the method executes the first test script by responding to the test instruction input by the user on the test interface, outputs at least one test signal, and sends at least one test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the at least one test signal, obtain the test result, and then obtain the test result on the device under test, and obtain the target test result according to the test result and the expected result. In the above-mentioned method, since the test equipment remotely controls the test of the hard disk backplane of the device under test out of band, and the device under test is connected to different types of hard disk backplanes, when the hard disk backplane is tested by the test equipment, remote and multiple types of tests can be realized. Compared with the traditional method that requires manual testing on the hard disk backplane and the corresponding test fixture on site, the above-mentioned method greatly improves the test efficiency and saves the test cost. In addition, after the test is completed, it is only necessary to check the test results according to the timestamp information, which also improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1 A schematic diagram of the structure of a test system according to an embodiment;

[0043] Figure 2 A schematic diagram of a test method in one embodiment;

[0044] Figure 3 A schematic flow chart of a testing method in another embodiment;

[0045] Figure 4 A schematic flow chart of a testing method in another embodiment;

[0046] Figure 5 A schematic flow chart of a testing method in another embodiment;

[0047] Figure 6 A schematic flow chart of a testing method in another embodiment;

[0048] Figure 7 A schematic flow chart of a testing method in another embodiment;

[0049] Figure 8 A schematic flow chart of a testing method in another embodiment;

[0050] Fig. 9 is a structural block diagram of a testing device in one embodiment;

[0051] Fig.10 is a structural block diagram of a testing device in another embodiment;

[0052] Fig.11 is a structural block diagram of a testing device in another embodiment;

[0053] Fig.12 is a structural block diagram of a testing device in another embodiment;

[0054] Fig.13 is a structural block diagram of a testing device in another embodiment;

[0055] Fig.14 is a structural block diagram of a testing device in another embodiment;

[0056] Fig.15 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0057] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0058] In the computer field, a server includes a computing unit, a storage unit and a transmission unit, wherein the storage unit includes a hard disk backplane, a hard disk and a RIAD card (Redundant Array of Independent Disks). The hard disk backplane connects the RIAD card and the hard disk to provide data transmission and power support. Before the computer is put into use, the hard disk backplane of the server needs to be tested to ensure that the storage unit works normally. At present, the test method for the hard disk backplane mainly connects a certain type of hard disk backplane with a corresponding type of test fixture manually, and realizes the test of different types of hard disk backplanes by manually switching the test fixture, and then manually summarizes and analyzes the test results. However, the above test method has the problem of low efficiency.

[0059] The present application provides a testing method, aiming to solve the above-mentioned technical problems. The following examples will specifically illustrate the testing method described in the present application.

[0060] The test method provided in the embodiment of the present application can be applied to Figure 1In the test system shown, the test system includes a test device 01, a device to be tested 02 and a digital-to-analog conversion module 03, wherein the test device 01 and the device to be tested 02 are connected wirelessly, the device to be tested 02 and the digital-to-analog conversion module 03 are connected by wire, the device to be tested 02 and the digital-to-analog conversion module 03 can each be an independent device, and optionally, the device to be tested 02 and the digital-to-analog conversion module 03 can also be integrated into one device. A test tool for testing the hard disk backplane is installed on the test device 01, for example, the ipmitool tool, the device to be tested 02 is connected to different types of hard disk backplanes, specifically used to test the software functions of different types of hard disk backplanes, and the digital-to-analog conversion module 03 is used to convert analog signals into digital signals, specifically used to test the hardware functions of different types of hard disk backplanes. In actual applications, the test device 01 sends a test signal to the device to be tested 02, tests the software functions of the hard disk backplane through the device to be tested 02, and tests the hardware functions of the hard disk backplane through the digital-to-analog conversion module 03, and obtains a test result. The above-mentioned test equipment 01 can be but not limited to various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The device to be tested 02 can be but not limited to various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The digital-to-analog conversion module 03 can be a microcontroller unit (MCU) or an integrated single-chip microcomputer or other device capable of digital-to-analog conversion.

[0061] Those skilled in the art will understand that Figure 1 The structure shown in the figure is only a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the test system to which the scheme of the present application is applied. The specific test system may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0062] In one embodiment, Figure 2 As shown, a test method is provided, which is applied to Figure 1 Take the test device 01 in the example as an example, and include the following steps:

[0063] S101, responding to the test instructions input by the user on the test interface, executing the first test script, outputting at least one test signal, and sending at least one test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result.

[0064] The test interface is an application interface of a test tool installed on the test device. The first test script is a script pre-programmed to test the hard disk backplane of the server, and the first test script includes a software test function, or includes a hardware test function, or includes a software test function and a hardware test function. The software test function includes at least one backplane property function. The software test functions include a test function for testing the function of obtaining the manufacturer information of the main control chip (CPLD / MCU) on the hard disk backplane, a test function for testing the function of obtaining the actual number of hard disks on the current hard disk backplane, a test function for testing the function of obtaining the hard disk status and determining the hard disk type, a test function for testing the baseboard management controller (BMC) to control the hard disk backplane positioning (Locate) hard disk operation function, a test function for testing the baseboard management controller (BMC) to indicate the failure (Fail) and rebuild (Rebuild) status of the NVMe disk, a test function for testing the baseboard management controller (BMC) to control the failure warning (Predictive Fail) status light function, a test function for testing the baseboard management controller (BMC) to control the warning (Warning) status light function, a test function for testing the function of obtaining the version information of the board main control chip firmware (Firmware, referred to as FW), a test function for testing the function of obtaining the backplane model configuration information, and a test function for testing whether the hard disk backplane supports online upgrades (Update The hardware test function includes at least one of the following functions: a test function for testing the state of an external electronic fuse (efuse) of a specified hard disk slot on the backplane, a test function for testing the operation function of the external electronic fuse (efuse) of a specified hard disk slot controlled by a baseboard management controller (BMC), a test function for testing the manufacturer information identification function of a hard disk expander (SAS Expander), a test function for testing the hard disk channel (SATA / SAS Host) differentiation function, a test function for testing the hard disk backplane naming function, a test function for testing the signal connection port (PCIe Port) differentiation function of an MCIO interface, and a test function for testing whether the hard disk performance meets the manufacturer's performance requirements. The hardware test function includes at least one of the following functions: a test function for testing whether the pin lighting function of a main control chip (CPLD / MCU) on the hard disk backplane is normal, a test function for testing whether the temperature measurement function of a temperature sensor (Temp sonser) chip is normal, a test function for testing whether the minimum power supply voltage function of a hardware chip (MUX) is normal, and a test function for testing whether the basic register unit function of a main control chip (CPLD / MCU) on the hard disk backplane is normal. The test signal includes at least one of a type identification of the hard disk backplane, a test function option, a test status, and the like.The types of hard disk backplanes include expander backplanes (Expander, EXP for short), integrated circuit backplanes (Anybay backplanes) and universal hard disk backplanes (Universal Backplane Management, UBM for short). The test function options include the functions tested by the software test function and / or the functions tested by the hardware test function. The test status includes the power-on status of the device under test (the status when 3.3V, 5V and 12V points are powered at the same time, i.e., the Mainpower status) and the power-off status of the device under test (the status when the 12V point is not powered, i.e., the Standby status). The test result is a result recorded based on a timestamp, and its form can be in the form of a time-level status. The test result includes the software test result of the hard disk backplane and the hardware test result of the hard disk backplane.

[0065] In the embodiment of the present application, the test equipment pre-installs a test tool for testing the hard disk backplane, and imports a pre-programmed first test script, for example, installing the ipmitool tool. The first test script can define a main function and multiple functional sub-functions. When executing the first test script, the execution logic can be set to be executed sequentially, or it can be set to be executed in the order selected by the user. When executing the first test script, the main function calls the sub-function to output the test result to the corresponding test result storage file. When the test equipment needs to test the hard disk backplane, the test equipment can be wirelessly connected to the device under test, and the device under test can be wired with the digital-to-analog conversion module. After the connection is successful, it can further detect whether the hardware circuit of the hard disk backplane is successfully connected, for example, whether the power supply line, I2c_BMC cable, data line, and I2c_HP cable are successfully connected, whether the pin of the digital-to-analog conversion module is connected to the chip output pin position of the hard disk backplane, whether the hardware of the test equipment and the device under test is complete, whether the software version matches, and whether the network of the test equipment and the device under test is unobstructed, whether it can be pinged, etc. When the hardware circuit of the hard disk backplane is successfully connected, the test tool on the test device can be started, and the test interface can be displayed on the current display screen of the test device. The user can enter the test instruction on the test interface. After receiving the test instruction triggered by the user, the test device can execute the first test script corresponding to the test instruction and output at least one test signal to the device under test. When the device under test receives the test signal sent by the test device, it can determine the type of the hard disk backplane according to the test signal and test the hard disk backplane. After the test is completed, the device under test can save the software test results in the software result storage file, for example, the software test results are stored in Software.log, and the digital-to-analog conversion module can save the hardware test results in the hardware result storage file, for example, the software test results are stored in Hw.log. After that, the device under test can summarize the hardware test results of the digital-to-analog conversion module and the software test results of the device under test itself to obtain the test results. It should be noted that if the device under test and the digital-to-analog conversion module are integrated into one device, the device under test can obtain the test results corresponding to the software test and / or the hardware test after testing the hard disk backplane.

[0066] S102, obtaining the test result on the device to be tested, and obtaining the target test result according to the test result and the expected result.

[0067] The expected result is a standard result. The target test result includes whether the test passes or fails.

[0068] In an embodiment of the present application, after the device under test obtains the test result, the test device can obtain the test result from the device under test. Optionally, the device under test can return the test result to the test device. The embodiment of the present application does not limit the method of obtaining the test result. After the test device obtains the test result on the device under test, it can compare the test result with the expected result to obtain the target test result. If the test result is consistent with the expected result, the target test result indicates that the test passed. If the test result is inconsistent with the expected result, the target test result indicates that the test failed. Optionally, in the case of a test failure, the reason for the test failure can be displayed on the test interface for the user to view.

[0069] The test method provided by the embodiment of the present application executes the first test script, outputs at least one test signal, and sends at least one test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to at least one test signal, obtain the test result, and then obtain the test result on the device under test, and obtain the target test result according to the test result and the expected result. In the above method, since the test device remotely controls the test of the hard disk backplane of the device under test out of band, and the device under test is connected to different types of hard disk backplanes, when the hard disk backplane is tested by the test device, remote and multiple types of tests can be achieved. Compared with the traditional method that requires manual testing on site according to the hard disk backplane and the corresponding test tooling fixture, the above method greatly improves the test efficiency and saves the test cost. In addition, after the test is completed, it is only necessary to check the test results according to the timestamp information, which also improves the test efficiency.

[0070] In one embodiment, a specific implementation method for testing the hard disk backplane in different states is also provided, such as Figure 3 As shown, Figure 2 The method described in the embodiment also includes:

[0071] S103, in response to the user triggering generation of a state determination instruction on the test interface, obtaining a second test script corresponding to the state determination instruction.

[0072] The state determination instruction is used to indicate the test state selected by the user. The test state includes the power-on state of the device under test (the state when 3.3V, 5V and 12V points are powered at the same time, i.e., the Mainpower state) and the power-off state of the device under test (the state when the 12V point is not powered, i.e., the Standby state). The second test script may be the same as the first test script or different from the first test script.

[0073] In the embodiment of the present application, after the test device starts the test tool, the test interface is displayed on the current display screen of the test device. The test interface includes a test state selection area for multiple test states. The user can select a test state in the test state selection area and start the test. The test device can receive the state determination instruction triggered by the user on the test interface, parse the state determination instruction to obtain the test state, and then call the second test script corresponding to the test state. Optionally, after the test device displays the test interface, the user can select multiple test states on the test interface and start the test. The test device can call the script corresponding to each test state and generate a second test script.

[0074] Correspondingly, when the test device executes "execute the first test script and output at least one test signal" in step S101, the specific execution steps are: execute the second test script and output at least one test signal.

[0075] In an embodiment of the present application, after obtaining the second test script, the test device can execute the second test script and output at least one test signal to the device under test. When the device under test receives the test signal sent by the test device, it can determine the type of the hard disk backplane according to the test signal and test the hard disk backplane. After the test is completed, the device under test can save the software test results in a software result storage file, for example, the software test results are stored in Software.log, and the digital-to-analog conversion module can save the hardware test results in a hardware result storage file, for example, the software test results are stored in Hw.log. After that, the device under test can summarize the hardware test results of the digital-to-analog conversion module and the software test results of the device under test itself to obtain the test results. It should be noted that if the device under test and the digital-to-analog conversion module are integrated into one device, the device under test can obtain the test results corresponding to the software test and / or hardware test after testing the hard disk backplane.

[0076] In the test method provided in the embodiment of the present application, after receiving the test status selected by the user on the test interface, the test device can remotely control the device under test to automatically test the hard disk backplane under different test states, and can remotely switch different test states through human-computer interaction, thereby improving test efficiency.

[0077] In one embodiment, a specific implementation method for testing the test function option of the hard disk backplane according to the user's selection is also provided, such as Figure 4 As shown, Figure 2 The method described in the embodiment also includes:

[0078] S104, displaying test function options;

[0079] Among them, the test function options include function items corresponding to all functions included in the first test script, including functions tested by software test functions and functions tested by hardware test functions, that is, the test function options include software test functions and hardware test functions. The software testing functions include obtaining the manufacturer information of the main control chip (CPLD / MCU) on the hard disk backplane, obtaining the actual number of hard disks on the current hard disk backplane, obtaining the hard disk status and judging the hard disk type, the baseboard management controller (BMC) controls the hard disk backplane positioning (Locate) hard disk operation function, the baseboard management controller (BMC) indicates the failure (Fail) and rebuild (Rebuild) status of the NVMe disk, the baseboard management controller (BMC) controls the failure warning (Predictive Fail) status light function, the baseboard management controller (BMC) controls the warning (Warning) status light function, obtaining the board card main control chip firmware (Firmware, referred to as FW) version information function, obtaining the backplane model configuration information function, whether the hard disk backplane supports online upgrade (Update Flag) function, obtaining the external electronic fuse (efuse) status of the specified hard disk slot on the backplane, the baseboard management controller (BMC) controls the number of external electronic fuse (efuse) operations of the specified hard disk slot, obtaining the hard disk expander (SAS Expander) manufacturer information identification function, hard disk channel (SATA / SAS The hardware test function includes at least one of the following: distinguishing the host (host), obtaining the name of the hard disk backplane, distinguishing the signal connection port (PCIe Port) of the MCIO interface, and whether the hard disk performance meets the manufacturer's performance requirements. The hardware test function includes at least one of the following: whether the main control chip (CPLD / MCU) pin lighting function on the hard disk backplane is normal, whether the temperature sensor (Temp sonser) chip temperature measurement function is normal, whether the hardware chip (MUX) minimum power supply voltage function is normal, and whether the basic register unit function of the main control chip (CPLD / MCU) on the hard disk backplane is working normally.

[0080] In an embodiment of the present application, when the hardware circuit of the hard disk backplane is successfully connected, the test tool on the test device can be started, the test interface can be displayed on the current display screen of the test device, and all test function options can be displayed on the current test interface. The user can select a test function option on the test interface, can select multiple test function options, or can select all test function options.

[0081] S105, responding to a selection instruction generated by the user on the test interface, generating a third test script according to the selection instruction.

[0082] The selection instruction is used to indicate the selection of a certain test function option. The third test script is determined by the test function option indicated by the selection instruction. The third test script, the first test script, and the second test script may be the same, two of them may be the same, or they may be different.

[0083] In the embodiment of the present application, after the test device starts the test tool, the test interface is displayed on the current display screen of the test device. The test interface includes a test function option selection area for multiple test function options. The user can select the test function option to be tested in the test function option selection area and start the test. The test device can receive the selection instruction triggered by the user on the test interface, parse the selection instruction to obtain the test function option, and then call the third test script corresponding to the test function option. Optionally, after the test device displays the test interface, the user can select all the test function options on the test interface and start the test. The test device can call the script corresponding to each test function option and generate a third test script.

[0084] Correspondingly, when the test device executes "execute the first test script and output at least one test signal" in step S101, the specific execution step is: execute the third test script and output at least one test signal.

[0085] In an embodiment of the present application, after obtaining the third test script, the test device can execute the third test script and output at least one test signal to the device under test. When the device under test receives the test signal sent by the test device, it can determine the type of the hard disk backplane according to the test signal and test the hard disk backplane. After the test is completed, the device under test can save the software test results in a software result storage file, for example, the software test results are stored in Software.log, and the digital-to-analog conversion module can save the hardware test results in a hardware result storage file, for example, the software test results are stored in Hw.log. After that, the device under test can summarize the hardware test results of the digital-to-analog conversion module and the software test results of the device under test itself to obtain the test results. It should be noted that if the device under test and the digital-to-analog conversion module are integrated into one device, the device under test can obtain the test results corresponding to the software test and / or hardware test after testing the hard disk backplane.

[0086] The test method provided in the embodiment of the present application can remotely control the device under test to automatically test different test function options of the hard disk backplane after receiving the test function option selected by the user on the test interface. Different test function options can be remotely tested through human-computer interaction, thereby improving test efficiency.

[0087] In one embodiment, when the test signal is a test signal output by the status light function in the first test script, a specific implementation method for obtaining the test result of the hard disk backplane hardware test is also provided, such as Figure 5 As shown, the step S101 of "sending the test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the test signal to obtain the test result" includes:

[0088] S201, sending a test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and to control a status light to perform a corresponding operation according to the control signal.

[0089] Among them, the status light function is a hardware test function, including a test function for testing whether the pin lighting function of the main control chip (CPLD / MCU) on the hard disk backplane is normal, a test function for testing whether the temperature measurement function of the temperature sensor (Temp sonser) chip is normal, a test function for testing whether the minimum power supply voltage function of the hardware chip (MUX) is normal, and a test function for testing whether the basic register unit function of the main control chip (CPLD / MCU) on the hard disk backplane is working normally. At least one of the above.

[0090] In an embodiment of the present application, after receiving a test instruction triggered by a user, the test device can execute a first test script corresponding to the test instruction and output at least one test signal to the device under test. After receiving the test signal sent by the test device, the device under test can determine the control signal according to the test signal, and then control the status light to turn on or off according to the control signal, for example, control the status light to turn on or off.

[0091] Correspondingly, when executing "obtaining the test result on the device under test" in step S101, the test device specifically executes step S202: reading the level signal output by the digital-to-analog conversion module connected to the device under test, and taking the level signal as the test result.

[0092] The analog conversion module is used to store the status data of the corresponding operation of the status light, that is, to store the high level or low level data corresponding to turning the status light on or off.

[0093] In the embodiment of the present application, the digital-to-analog conversion module is connected to the pins of the chip on the hard disk backplane. After the device under test controls the status light to turn on or off, the digital-to-analog conversion module can obtain the result of turning on the status light or the result of turning off the status light through the pins, and use the corresponding level change signal as the test result. For example, if the state of the hard disk backplane status light changes from the on state to the off state, then the test result of the digital-to-analog conversion module is a high level to a low level, and if the state of the hard disk backplane status light changes from the off state to the on state, then the test result of the digital-to-analog conversion module is a low level to a high level.

[0094] In the test method provided in the embodiment of the present application, the test device can test whether the hardware test function of the hard disk backplane is normal by obtaining the level signal of the hard disk backplane from the digital-to-analog conversion module and analyzing the level signal, thereby improving the test efficiency.

[0095] In one embodiment, Figure 6 As shown, a test method is provided, which is applied to Figure 1 Taking the device under test 02 in the example as an example, the following steps are included:

[0096] S301, when at least one test signal sent by a test device is received, a hard disk backplane corresponding to the test signal is tested according to the at least one test signal to obtain a test result.

[0097] The test signal includes at least one of the type identification of the hard disk backplane, the test function options, the test status, etc. The types of hard disk backplanes include expander backplane (Expander, referred to as EXP), integrated circuit backplane (Anybay backplane) and universal hard disk backplane (Universal Backplane Management, referred to as UBM). The test function options include the functions tested by the software test function and / or the functions tested by the hardware test function. The test status includes the power-on status of the device under test (the status when 3.3V, 5V and 12V points are powered at the same time, that is, the Mainpower status) and the power-off status of the device under test (the status when the 12V point is not powered, that is, the Standby status). The test result is a result based on the timestamp record, and its form can be in the form of time-level status. The test result includes the software test result of the hard disk backplane and the hardware test result of the hard disk backplane.

[0098] In an embodiment of the present application, when the hardware circuit of the hard disk backplane is successfully connected, the test tool on the test device can be started, and the test interface can be displayed on the current display screen of the test device. The user can enter test instructions on the test interface. After receiving the test instructions triggered by the user, the test device can execute the test script corresponding to the test instructions and output at least one test signal to the device under test.

[0099] When the device under test receives the test signal sent by the test device, it can determine the type of the hard disk backplane according to the test signal and test the hard disk backplane. After the test is completed, the device under test can save the software test results in the software result storage file, for example, the software test results are stored in Software.log, and the digital-to-analog conversion module can save the hardware test results in the hardware result storage file, for example, the software test results are stored in Hw.log. The device under test can summarize the hardware test results of the digital-to-analog conversion module and the software test results of the device under test itself to obtain the test results. It should be noted that if the device under test and the digital-to-analog conversion module are integrated into one device, the device under test can obtain the test results corresponding to the software test and / or hardware test after testing the hard disk backplane.

[0100] S302, returning the test result to the test device to instruct the test device to obtain a target test result based on the test result and the expected result.

[0101] The expected result is a standard result. The target test result includes whether the test passes or fails.

[0102] In an embodiment of the present application, after the device under test obtains the test result, the test device can obtain the test result from the device under test. Optionally, the device under test can return the test result to the test device. The embodiment of the present application does not limit the method of obtaining the test result. After the test device obtains the test result on the device under test, it can compare the test result with the expected result to obtain the target test result. If the test result is consistent with the expected result, the target test result indicates that the test passed. If the test result is inconsistent with the expected result, the target test result indicates that the test failed. Optionally, in the case of a test failure, the reason for the test failure can be displayed on the test interface for the user to view.

[0103] The test method provided by the embodiment of the present application tests the hard disk backplane corresponding to the test signal according to at least one test signal when receiving at least one test signal sent by the test device, obtains the test result, and returns the test result to the test device to instruct the test device to obtain the target test result according to the test result and the expected result. In the above method, since the test device remotely controls the test of the hard disk backplane of the device under test out-of-band, and the device under test is connected to different types of hard disk backplanes, when the hard disk backplane is tested by the test device, remote and various types of tests can be achieved. Compared with the traditional method that requires manual testing on site according to the hard disk backplane and the corresponding test tooling fixture, the above method greatly improves the test efficiency and saves the test cost. In addition, after the test is completed, it is only necessary to check the test results according to the timestamp information, which also improves the test efficiency.

[0104] In one embodiment, a specific implementation method for obtaining the test results is also provided, such as Figure 7 As shown, the above step S301 of "testing the hard disk backplane corresponding to the test signal according to at least one test signal to obtain a test result" includes:

[0105] S401, determining a corresponding hard disk backplane and a test strategy according to a test signal.

[0106] The test strategy is a strategy determined according to the test script, and the test strategy includes a software test strategy and / or a hardware test strategy.

[0107] In an embodiment of the present application, when the device under test receives the test signal sent by the test device, it can determine the type and test strategy of the hard disk backplane according to the test signal. For example, the test signal needs to test the function corresponding to the test of the software test function of the EXP hard disk backplane, then the type of the hard disk backplane is the EXP hard disk backplane, and the test strategy is to test whether the pin lighting function of the main control chip (CPLD / MCU) on the hard disk backplane is normal.

[0108] S402, testing the hard disk backplane corresponding to the test signal according to the test strategy to obtain a test result corresponding to the test signal.

[0109] In the embodiment of the present application, after determining the test strategy, the device under test can test the hard disk backplane corresponding to the test signal according to the test strategy to obtain the test result corresponding to the test signal. For example, after determining that the type of the hard disk backplane is an EXP hard disk backplane, and the test strategy is to test whether the main control chip (CPLD / MCU) pin lighting function on the hard disk backplane is normal, the device under test can test the main control chip (CPLD / MCU) pin lighting function on the EXP hard disk backplane to determine whether the lighting function is normal. After the test is completed, the device under test can save the software test results in the software result storage file, for example, the software test results are stored in Software.log, and the digital-to-analog conversion module can save the hardware test results in the hardware result storage file, for example, the software test results are stored in Hw.log. The device under test can summarize the hardware test results of the digital-to-analog conversion module and the software test results of the device under test itself to obtain the test results. It should be noted that if the device under test and the digital-to-analog conversion module are integrated into one device, the device under test can obtain the test results corresponding to the software test and / or hardware test after testing the hard disk backplane.

[0110] According to the test method provided in the embodiment of the present application, after the device under test receives the test signal remotely sent by the test device, it can determine the hard disk backplane and the test strategy, and then perform corresponding tests, and the process does not require human intervention.

[0111] Based on all the above embodiments, a testing method is also provided. Figure 8 As shown, the method includes:

[0112] S501, the testing device responds to a testing instruction input by a user on a testing interface, executes a first testing script, and outputs at least one testing signal.

[0113] S502, the test device responds to the state determination instruction generated by the user on the test interface, responds to the test instruction input by the user on the test interface, and obtains a second test script corresponding to the state determination instruction.

[0114] S503: The testing device executes a second test script and outputs at least one test signal.

[0115] S504: The test device displays test function options, including function items corresponding to all functions included in the first test script.

[0116] S505, the testing device responds to a selection instruction generated by the user on the testing interface, responds to a test instruction input by the user on the testing interface, and generates a third test script according to the selection instruction.

[0117] S506: The testing device executes a third test script and outputs at least one test signal.

[0118] S507, the test device sends a test signal to the device under test. The first test script includes a software test function and / or a hardware test function, the software function includes at least one backplane property function, and the hardware test function includes at least one status light function.

[0119] S508, when the device under test receives at least one test signal sent by the test device, it determines the corresponding hard disk backplane and test strategy according to the test signal. The test strategy includes software test strategy and / or hardware test strategy.

[0120] S509, the device under test tests the hard disk backplane corresponding to the test signal according to the test strategy, and obtains a test result corresponding to the test signal.

[0121] S510, the device under test returns the test result to the testing device.

[0122] S511, the test device reads the level signal output by the digital-to-analog conversion module connected to the device under test, and uses the level signal as the test result. The digital-to-analog conversion module is used to store the status data of the status light corresponding to the operation.

[0123] S512, the testing device obtains a target test result according to the test result and the expected result.

[0124] The methods described in the above steps are all described in the above embodiments. Please refer to the above description for details and will not be repeated here.

[0125] The test method provided in the embodiment of the present application can test the software and hardware of the hard disk backplane by using software test scripts and digital-to-analog conversion modules. The test content not only includes traditional software functions, such as register setting values, software execution logic, etc., but also can test the basic input and output functions of the pins of the hard disk backplane hardware in combination with the digital-to-analog conversion module. Not only can the hard disk backplane function be detected, but also the performance of the hard disk with a disk array and the performance of the hard disk without a disk array can be detected, and the compatibility test is more comprehensive. The basic information of the hard disk backplane software and hardware can be obtained, and compared with the expected results in the hardware manual, and the defects of the hardware itself and the problems that are different from the theoretical design values ​​can be checked. The hard disk backplane can be tested in multiple states, and by connecting multiple hard disk backplanes to the device to be tested, multiple types of hard disk backplanes can be tested in multiple states in an out-of-band manner, so as to avoid the hard disk backplane under test affecting the output of the test tool during the in-band test and interfering with the results. The software design cost of the above method is low. The running software script and the digital-to-analog conversion module are packaged, which can be adapted on multiple machines and can be copied in batches. It has the advantages of portability and simplicity, and has strong portability. A set of tools can be developed for batch equal transplantation and adapt to various types of backplanes. The output results are stored in log form and compared and verified in timestamp form, which is simple and convenient. When a problem occurs, the fault location can be accurately located, which can provide testing and repair efficiency.

[0126] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0127] Based on the same inventive concept, the embodiment of the present application also provides a test device for implementing the test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more test device embodiments provided below can refer to the limitations on the test method above, and will not be repeated here.

[0128] In one embodiment, Fig. 9 As shown, a testing device is provided, comprising:

[0129] The sending module 10 is used to respond to the test instruction input by the user on the test interface, execute the first test script, output at least one test signal, and send at least one test signal to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain the test result. The first test script includes software test functions and / or hardware test functions; the software function includes at least one backplane property function, and the hardware test function includes at least one status light function.

[0130] The first acquisition module 11 is used to acquire the test result on the device under test, and obtain the target test result according to the test result and the expected result.

[0131] In one embodiment, Fig.10 As shown, the above-mentioned testing device also includes:

[0132] The second acquisition module 12 is used to respond to the state determination instruction triggered by the user on the test interface and acquire a second test script corresponding to the state determination instruction.

[0133] Correspondingly, the sending module 10 is specifically used to execute the second test script and output at least one test signal.

[0134] In one embodiment, Fig.11 As shown, the above-mentioned test device comprises:

[0135] The display module 13 is used to display the test function options; the test function options include function items corresponding to all functions included in the first test script.

[0136] The generating module 14 is used to respond to the selection instruction triggered by the user on the test interface and generate a third test script according to the selection instruction.

[0137] Correspondingly, the sending module 10 is specifically used to execute the third test script and output at least one test signal.

[0138] In one embodiment, Fig.12 As shown, the sending module 10 includes:

[0139] The sending unit 100 is used to send a test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and control the status light to perform a corresponding operation according to the control signal.

[0140] The acquisition unit 101 is used to read the level signal output by the digital-to-analog conversion module connected to the device under test, and use the level signal as the test result; the digital-to-analog conversion module is used to store the status data of the corresponding operation of the status light.

[0141] In one embodiment, Fig.13 As shown, a testing device is also provided, comprising:

[0142] The receiving module 15 is used to test the hard disk backplane corresponding to the test signal according to the at least one test signal when receiving at least one test signal sent by the test device to obtain a test result.

[0143] The return module 16 is used to return the test result to the test device to instruct the test device to obtain the target test result according to the test result and the expected result.

[0144] In one embodiment, Fig.14 As shown, the receiving module 15 includes:

[0145] The determination unit 150 is used to determine the corresponding hard disk backplane and test strategy according to the test signal; the test strategy includes a software test strategy and / or a hardware test strategy.

[0146] The testing unit 151 is used to test the hard disk backplane corresponding to the test signal according to the test strategy to obtain the test result corresponding to the test signal.

[0147] Each module in the above-mentioned test device can be implemented in whole or in part by software, hardware and a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each module above.

[0148] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Fig.15As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a test method is implemented. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0149] Those skilled in the art will understand that Fig.15 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0150] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0151] In response to a test instruction input by a user on a test interface, a first test script is executed, at least one test signal is output, and at least one test signal is sent to a device under test to instruct the device under test to test a hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result; the first test script includes a software test function and / or a hardware test function; the software function includes at least one backplane property function, and the hardware test function includes at least one status light function;

[0152] Obtain the test results on the device under test, and obtain the target test results based on the test results and expected results.

[0153] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0154] In response to the user triggering the generation of a state determination instruction on the test interface, obtaining a second test script corresponding to the state determination instruction;

[0155] The second test script is executed to output at least one test signal.

[0156] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0157] Displaying test function options; the test function options include function items corresponding to all functions included in the first test script;

[0158] In response to a selection instruction triggered by a user on a test interface, a third test script is generated according to the selection instruction;

[0159] The third test script is executed to output at least one test signal.

[0160] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0161] Sending a test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and to control a status light to perform a corresponding operation according to the control signal;

[0162] The level signal output by the digital-to-analog conversion module connected to the device under test is read, and the level signal is used as the test result; the digital-to-analog conversion module is used to store the status data of the corresponding operation of the status light.

[0163] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0164] When receiving at least one test signal sent by the test device, testing the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result;

[0165] The test results are returned to the test equipment to instruct the test equipment to obtain the target test results based on the test results and expected results.

[0166] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0167] Determine the corresponding hard disk backplane and test strategy according to the test signal; the test strategy includes software test strategy and / or hardware test strategy;

[0168] According to the test strategy, the hard disk backplane corresponding to the test signal is tested to obtain a test result corresponding to the test signal.

[0169] The above embodiment provides a computer device, whose implementation principle and technical effect are similar to those of the above method embodiment, and will not be repeated here.

[0170] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0171] In response to a test instruction input by a user on a test interface, a first test script is executed, at least one test signal is output, and at least one test signal is sent to a device under test to instruct the device under test to test a hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result; the first test script includes a software test function and / or a hardware test function; the software function includes at least one backplane property function, and the hardware test function includes at least one status light function;

[0172] Obtain the test results on the device under test, and obtain the target test results based on the test results and expected results.

[0173] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0174] In response to the user triggering the generation of a state determination instruction on the test interface, obtaining a second test script corresponding to the state determination instruction;

[0175] The second test script is executed to output at least one test signal.

[0176] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0177] Displaying test function options; the test function options include function items corresponding to all functions included in the first test script;

[0178] In response to a selection instruction triggered by a user on a test interface, a third test script is generated according to the selection instruction;

[0179] The third test script is executed to output at least one test signal.

[0180] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0181] Sending a test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and to control a status light to perform a corresponding operation according to the control signal;

[0182] The level signal output by the digital-to-analog conversion module connected to the device under test is read, and the level signal is used as the test result; the digital-to-analog conversion module is used to store the status data of the corresponding operation of the status light.

[0183] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0184] When receiving at least one test signal sent by the test device, testing the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result;

[0185] The test results are returned to the test equipment to instruct the test equipment to obtain the target test results based on the test results and expected results.

[0186] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0187] Determine the corresponding hard disk backplane and test strategy according to the test signal; the test strategy includes software test strategy and / or hardware test strategy;

[0188] According to the test strategy, the hard disk backplane corresponding to the test signal is tested to obtain a test result corresponding to the test signal.

[0189] The above embodiment provides a computer-readable storage medium, whose implementation principle and technical effect are similar to those of the above method embodiment, and will not be repeated here.

[0190] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0191] In response to a test instruction input by a user on a test interface, a first test script is executed, at least one test signal is output, and at least one test signal is sent to a device under test to instruct the device under test to test a hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result; the first test script includes a software test function and / or a hardware test function; the software function includes at least one backplane property function, and the hardware test function includes at least one status light function;

[0192] Obtain the test results on the device under test, and obtain the target test results based on the test results and expected results.

[0193] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0194] In response to the user triggering the generation of a state determination instruction on the test interface, obtaining a second test script corresponding to the state determination instruction;

[0195] The second test script is executed to output at least one test signal.

[0196] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0197] Displaying test function options; the test function options include function items corresponding to all functions included in the first test script;

[0198] In response to a selection instruction triggered by a user on a test interface, a third test script is generated according to the selection instruction;

[0199] The third test script is executed to output at least one test signal.

[0200] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0201] Sending a test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and to control a status light to perform a corresponding operation according to the control signal;

[0202] The level signal output by the digital-to-analog conversion module connected to the device under test is read, and the level signal is used as the test result; the digital-to-analog conversion module is used to store the status data of the corresponding operation of the status light.

[0203] In one embodiment, a computer program product is also provided, including a computer program, which, when executed by a processor, implements the following steps:

[0204] When receiving at least one test signal sent by the test device, testing the hard disk backplane corresponding to the test signal according to the at least one test signal to obtain a test result;

[0205] The test results are returned to the test equipment to instruct the test equipment to obtain the target test results based on the test results and expected results.

[0206] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0207] Determine the corresponding hard disk backplane and test strategy according to the test signal; the test strategy includes software test strategy and / or hardware test strategy;

[0208] According to the test strategy, the hard disk backplane corresponding to the test signal is tested to obtain a test result corresponding to the test signal.

[0209] The above embodiment provides a computer program product, whose implementation principle and technical effect are similar to those of the above method embodiment, and will not be repeated here.

[0210] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0211] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0212] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A testing method, characterized in that: Applied to testing equipment, the method comprises: In response to a test instruction input by a user on a test interface, a first test script is executed, a plurality of test signals are output, and the plurality of test signals are sent to a device under test, so as to instruct the device under test to test the software function of the hard disk backplane corresponding to the test signal according to the plurality of test signals, and to test the hardware function of the hard disk backplane corresponding to the test signal through a digital-to-analog conversion module, so as to obtain a test result; the device under test is connected to different types of hard disk backplanes; the first test script includes a software test function and a hardware test function; the software test function includes at least one backplane property function, and the hardware test function includes at least one status light function; the test signal includes a test signal output by the status light function in the first test script; the test result includes a software test result and a hardware test result; The test result on the device under test is obtained, and the target test result is obtained according to the test result and the expected result.

2. The method according to claim 1, characterized in that The method further comprises: In response to the user triggering generation of a state determination instruction on the test interface, obtaining a second test script corresponding to the state determination instruction; The executing the first test script and outputting a plurality of test signals comprises: The second test script is executed to output a plurality of test signals.

3. The method according to claim 2, characterized in that The state determination instruction is used to indicate the test state selected by the user, and the test state includes a power-on state of the device under test and a power-off state of the device under test.

4. The method according to claim 1, characterized in that: The method further comprises: Displaying test function options; the test function options include function items corresponding to all functions included in the first test script; In response to a selection instruction triggered by the user on the test interface, generating a third test script according to the selection instruction; The executing the first test script and outputting a plurality of test signals comprises: The third test script is executed to output a plurality of test signals.

5. The method according to claim 1, characterized in that The test signal is a test signal output by the status light function in the first test script. The test signal is sent to the device under test to instruct the device under test to test the hard disk backplane corresponding to the test signal according to the test signal to obtain a test result, including: Sending the test signal to the device under test to instruct the device under test to determine a control signal according to the test signal, and controlling a status light to perform a corresponding operation according to the control signal; The obtaining of the test result on the device under test includes: The level signal output by the digital-to-analog conversion module connected to the device under test is read, and the level signal is used as the test result; the digital-to-analog conversion module is used to store the status data of the corresponding operation of the status light.

6. A testing method, characterized in that: Applied to the device under test, the method comprises: When receiving multiple test signals sent by the test device, the software functions of the hard disk backplane corresponding to the test signals are tested according to the multiple test signals, and the hardware functions of the hard disk backplane corresponding to the test signals are tested through the digital-to-analog conversion module to obtain test results; the device to be tested is connected to different types of hard disk backplanes; the multiple test signals are output by the test device executing a first test script; the first test script includes a software test function and a hardware test function; the software test function includes at least one backplane property function, and the hardware test function includes at least one status light function; the test signal includes the test signal output by the status light function in the first test script; the test result includes a software test result and a hardware test result; The test result is returned to the test device to instruct the test device to obtain a target test result according to the test result and the expected result.

7. The method according to claim 6, characterized in that The step of testing the software functions of the hard disk backplane corresponding to the test signals according to the multiple test signals, and testing the hardware functions of the hard disk backplane corresponding to the test signals through a digital-to-analog conversion module to obtain test results includes: Determine the corresponding hard disk backplane and test strategy according to the multiple test signals; the test strategy includes a software test strategy and a hardware test strategy; According to the test strategy, the software function of the hard disk backplane corresponding to the test signal is tested, and the hardware function of the hard disk backplane corresponding to the test signal is tested through the digital-to-analog conversion module to obtain the test result corresponding to the test signal.

8. A testing device, characterized in that: The device comprises: A sending module, used to respond to a test instruction input by a user on a test interface, execute a first test script, output a plurality of test signals, and send the plurality of test signals to a device under test, so as to instruct the device under test to test the software function of the hard disk backplane corresponding to the test signal according to the plurality of test signals, and to test the hardware function of the hard disk backplane corresponding to the test signal through a digital-to-analog conversion module to obtain a test result; the device under test is connected to different types of hard disk backplanes; the first test script includes a software test function and a hardware test function; the software test function includes at least one backplane property function, and the hardware test function includes at least one status light function; the test signal includes a test signal output by the status light function in the first test script; the test result includes a software test result and a hardware test result; The first acquisition module is used to acquire the test result on the device under test, and obtain the target test result according to the test result and the expected result.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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