Method and apparatus for determining particle size, processor and storage medium

Abstract

The embodiment of the present application provides a kind of method and device for determining particle size, processor and storage medium, belongs to mortar field.The method for determining particle size includes: obtaining the first particle size of the particle to be measured obtained by detecting the particle to be measured by laser particle size analyzer;Obtain the cross-sectional image of the particle by image acquisition equipment to the image acquisition of the particle to be measured;According to the first diameter and the second diameter of cross-sectional image, wherein the first diameter is the minimum distance between the two parallel lines that are tangent to cross-sectional image, and the second diameter is the diameter of the circle that is equal to the area of cross-sectional image;According to the first diameter and the second diameter, determine the correction coefficient corresponding to the particle to be measured;According to the first particle size, the second particle size of the particle to be measured is obtained by correcting the correction coefficient.The embodiment of the present application can improve the accuracy of particle size.

Description

Technical Field

[0001] This invention relates to the field of mortar technology, and more specifically to a method and apparatus, processor and storage medium for determining particle size. Background Technology

[0002] In the mortar industry, mortar formulation design and production processes require timely monitoring and control of mortar gradation to ensure product quality and stability. Currently, sieving is a widely used particle size distribution technique in the mortar industry. Specifically, a series of standard sieves with different aperture diameters are selected according to different needs, stacked in ascending order of aperture size, and fixed on a vibrating sieve machine. Vibration causes the sample to fall, achieving sieving and thus determining the particle size of the sample. However, because the principle of sieving is to differentiate samples through sieves of different sizes, limitations in experimental equipment prevent it from achieving high particle size resolution. For example, in certain process designs and product development scenarios, sieving cannot meet the needs of more precise testing. Therefore, existing particle size determination methods suffer from low particle size accuracy. Summary of the Invention

[0003] The purpose of this invention is to provide a method, processor, device, and storage medium for determining particle size, so as to solve the problem of low particle size accuracy in the prior art.

[0004] To achieve the above objectives, a first aspect of the present invention provides a method for determining particle size, the method comprising:

[0005] Obtain the first particle size of the particle to be tested by detecting the particle size using a laser particle size analyzer;

[0006] Acquire a cross-sectional image of the particle to be tested by image acquisition device; determine a first diameter and a second diameter based on the cross-sectional image of the particle, wherein the first diameter is the minimum distance between two parallel lines tangent to the cross-sectional image of the particle, and the second diameter is the diameter of a circle with the same area as the cross-sectional image of the particle;

[0007] Based on the first diameter and the second diameter, determine the correction coefficient corresponding to the particle to be tested;

[0008] The first particle size is corrected according to the correction factor to obtain the second particle size of the particle to be tested.

[0009] In this embodiment of the invention, determining the correction coefficient corresponding to the particle to be tested based on the first diameter and the second diameter includes: determining the ratio of the first diameter to the second diameter to obtain the correction coefficient corresponding to the particle to be tested.

[0010] In this embodiment of the invention, the first particle size is corrected according to the correction coefficient to obtain the second particle size of the particle to be tested, including: determining the product value of the first particle size and the correction coefficient to obtain the second particle size of the particle to be tested.

[0011] In this embodiment of the invention, the method for determining particle size further includes: acquiring a first particle size distribution of the sample to be tested obtained by detecting the sample to be tested using a laser particle size analyzer, wherein the sample to be tested includes multiple particles to be tested, and the first particle size distribution includes multiple first particle sizes and the proportion of first particle sizes corresponding to the multiple first particle sizes; acquiring a cross-sectional image of each particle to be tested obtained by image acquisition using an image acquisition device; determining a first diameter and a second diameter of each particle to be tested based on the cross-sectional image of each particle to be tested; determining a correction coefficient corresponding to each particle to be tested based on the first diameter and the second diameter of each particle to be tested; determining an overall correction coefficient corresponding to the sample to be tested based on the correction coefficient corresponding to each particle to be tested; and correcting the first particle size distribution based on the overall correction coefficient to obtain a second particle size distribution of the sample to be tested, wherein the second particle size distribution includes multiple second particle sizes and the proportion of second particle sizes corresponding to the multiple second particle sizes.

[0012] In this embodiment of the invention, determining the overall correction coefficient of the sample to be tested based on the correction coefficient corresponding to each particle to be tested includes: determining the mean value of the correction coefficient corresponding to each particle to be tested in order to obtain the overall correction coefficient of the sample to be tested.

[0013] In this embodiment of the invention, the first particle size distribution is corrected according to the overall correction coefficient to obtain the second particle size distribution of the sample to be tested, including: obtaining a plurality of first particles in the first particle size distribution; determining the product values ​​of the plurality of first particles with the overall correction coefficient to obtain a plurality of second particles; and determining the second particle size distribution of the sample to be tested according to the plurality of second particles and the proportion of the first particles in the first particle size distribution.

[0014] In this embodiment of the invention, the number of test particles in the test sample is greater than 100.

[0015] A second aspect of the present invention provides a processor configured to execute the method for determining particle size as described above.

[0016] A third aspect of the present invention provides an apparatus for determining particle size, the apparatus comprising:

[0017] The first particle size acquisition module is used to acquire the first particle size of the particle to be tested, which is obtained by detecting the particle to be tested using a laser particle size analyzer.

[0018] The particle cross-section acquisition module is used to acquire particle cross-section images obtained by image acquisition devices of the particles under test.

[0019] The correction coefficient determination module is used to determine a first diameter and a second diameter based on the particle cross-sectional image, wherein the first diameter is the minimum distance between two parallel lines tangent to the particle cross-sectional image, and the second diameter is the diameter of a circle with the same area as the particle cross-sectional image; and to determine the correction coefficient corresponding to the particle to be tested based on the first diameter and the second diameter.

[0020] The second particle size determination module is used to correct the first particle size according to the correction coefficient to obtain the second particle size of the particle to be tested.

[0021] A fourth aspect of the present invention provides a machine-readable storage medium on which a program or instruction is stored, and when the program or instruction is executed by a processor, it implements the method described above for determining granularity.

[0022] The above technical solution obtains the first particle size of the particle to be tested by a laser particle size analyzer and acquires a cross-sectional image of the particle to be tested by an image acquisition device. Based on the cross-sectional image, a first diameter and a second diameter are determined. The first diameter is the minimum distance between two parallel lines tangent to the cross-sectional image, and the second diameter is the diameter of a circle with an area equal to that of the cross-sectional image. A correction coefficient is then determined based on the first and second diameters, and the first particle size is corrected according to the correction coefficient to obtain the second particle size. This technical solution, by acquiring the morphological characteristics of the particle through an image acquisition device and obtaining the correction coefficient, and then correcting the first particle size obtained by the laser particle size analyzer based on the correction coefficient, enables the conversion between particle size measured by the laser particle size analyzer method and particle size measured by sieving method. It obtains a relatively accurate particle size with sieving properties without the need for sieving, thus improving the accuracy of particle size determination.

[0023] Other features and advantages of the embodiments of the present invention will be described in detail in the following detailed description section. Attached Figure Description

[0024] The accompanying drawings are provided to further illustrate embodiments of the present invention and form part of the specification. They are used together with the following detailed description to explain the embodiments of the present invention, but do not constitute a limitation thereof. In the drawings:

[0025] Figure 1 The schematic diagram illustrates a process flow chart of a method for determining particle size in one embodiment of the present invention;

[0026] Figure 2 The illustration shows a schematic diagram of a particle cross-sectional image of a sample acquired by an optical microscope in one embodiment of the present invention;

[0027] Figure 3 A schematic diagram of the first diameter (i.e., the minimum diameter) in one embodiment of the present invention is shown;

[0028] Figure 4 A schematic diagram of the second diameter (i.e., equivalent diameter) in one embodiment of the present invention is shown.

[0029] Figure 5 This illustration schematically shows a comparison of the particle size distribution map of the sample under test before correction and the particle size distribution map after correction in one embodiment of the present invention.

[0030] Figure 6 The diagram illustrates a structural block diagram of a device for determining particle size according to an embodiment of the present invention. Detailed Implementation

[0031] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit the scope of the present invention.

[0032] It should be noted that if the embodiments of the present invention involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0033] Furthermore, if the embodiments of this invention involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. If the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0034] Figure 1 The diagram illustrates a flow chart of a method for determining particle size according to an embodiment of the present invention. Figure 1 As shown in the embodiment of the present invention, a method for determining particle size is provided. Taking the application of this method to a processor as an example, the method may include the following steps:

[0035] Step S101: Obtain the first particle size of the particle to be tested by detecting the particle to be tested using a laser particle size analyzer.

[0036] It is understood that the particles to be tested are particles that require particle size detection (such as sand and gravel). Laser particle size analyzers typically measure particle size by measuring the volume of the particles. For example, the diameter of an equivalent sphere with equal volume is taken as the particle size, and the first particle size is the particle size determined by the laser particle size analyzer.

[0037] Specifically, the processor can communicate with the laser particle size analyzer to obtain the first particle size of the particles detected by the laser particle size analyzer.

[0038] Step S102: Obtain a cross-sectional image of the particle to be tested by image acquisition using an image acquisition device.

[0039] As can be understood, an image acquisition device is a device capable of acquiring images of the particles to be tested, such as an optical microscope or other photographic equipment. A particle cross-section image is a cross-sectional image of the particle.

[0040] Specifically, refer to Figure 2 As shown, an image acquisition device (such as an optical microscope) can take a picture of fully dispersed, non-adhesive particles from the front to obtain cross-sectional image data of the particles, i.e., particle cross-sectional images. The processor can communicate with the image acquisition device to obtain the particle cross-sectional images of the particles obtained by the image acquisition device.

[0041] Step S103: Determine the first diameter and the second diameter based on the particle cross-sectional image, wherein the first diameter is the minimum distance between two parallel lines tangent to the particle cross-sectional image, and the second diameter is the diameter of a circle with the same area as the particle cross-sectional image.

[0042] Understandable, refer to Figure 3 As shown, the first diameter is the minimum distance between two parallel lines tangent to the particle cross-sectional image. Understandably, there can be multiple parallel lines tangent to the particle cross-sectional image; the distance between the two parallel lines with the smallest distance is taken as the first diameter. This symbolizes the characteristic of the sieving method that only a minimum diameter smaller than the sieve mesh is required for passage. (Refer to...) Figure 4 As shown, the second diameter is the diameter of a circle with the same area as the cross-sectional image of the particle, that is, the diameter of an equivalent circle with the same cross-sectional area, which is similar to the characteristic of using the diameter of an equivalent sphere with equal volume as the particle size in the laser particle size analyzer method.

[0043] Specifically, the processor can determine the first diameter and the second diameter of the particle based on the particle cross-sectional image. That is, it determines the distance between two parallel lines tangent to the particle cross-sectional image, takes the minimum distance as the first diameter, and determines the diameter of the circle with the same area as the particle cross-sectional image as the second diameter.

[0044] Step S104: Determine the correction coefficient corresponding to the particle to be tested based on the first diameter and the second diameter.

[0045] It can be understood that the correction factor is a parameter that needs to be corrected for the first particle size of the particles to be tested by the laser particle size analyzer.

[0046] Specifically, the processor can obtain the correction coefficient of the particle through the first diameter and the second diameter. For example, the first diameter and the second diameter data can be substituted into the formula for calculating the correction coefficient to obtain the corresponding correction coefficient. The formula for calculating the correction coefficient can be, for example, multiplying the ratio of the first diameter and the second diameter by a preset ratio value (e.g., 0.8 or 0.9), or adding a preset value, or subtracting a preset value, which can be determined according to the actual application scenario.

[0047] Step S105: Correct the first particle size according to the correction coefficient to obtain the second particle size of the particle to be tested.

[0048] It can be understood that the second particle size is the particle size obtained after correcting the first particle size according to the correction coefficient.

[0049] Specifically, the processor can correct the first particle size according to the correction coefficient to obtain the second particle size. For example, the first particle size can be multiplied by or divided by the correction coefficient, and the first particle size can be corrected using the correction coefficient to obtain a second particle size with sieving characteristics and greater accuracy.

[0050] The above technical solution obtains the first particle size of the particle to be tested by a laser particle size analyzer and acquires a cross-sectional image of the particle to be tested by an image acquisition device. Based on the cross-sectional image, a first diameter and a second diameter are determined. The first diameter is the minimum distance between two parallel lines tangent to the cross-sectional image, and the second diameter is the diameter of a circle with an area equal to that of the cross-sectional image. A correction coefficient is then determined based on the first and second diameters, and the first particle size is corrected according to the correction coefficient to obtain the second particle size. This technical solution, by acquiring the morphological characteristics of the particle through an image acquisition device and obtaining the correction coefficient, and then correcting the first particle size obtained by the laser particle size analyzer based on the correction coefficient, enables the conversion between particle size measured by the laser particle size analyzer method and particle size measured by sieving method. It obtains a relatively accurate particle size with sieving properties without the need for sieving, thus improving the accuracy of particle size determination.

[0051] In one embodiment, determining the correction coefficient corresponding to the particle to be tested based on the first diameter and the second diameter includes: determining the ratio of the first diameter to the second diameter to obtain the correction coefficient corresponding to the particle to be tested.

[0052] Specifically, the processor can use the ratio of the first diameter to the second diameter as the correction coefficient corresponding to the particle to be measured.

[0053] In one embodiment, correcting a first particle size according to a correction coefficient to obtain a second particle size of the particle to be tested includes: determining the product of the first particle size and the correction coefficient to obtain the second particle size of the particle to be tested.

[0054] Specifically, the processor can determine the product of the first particle size and the correction coefficient to obtain the second particle size of the particle to be tested.

[0055] In one embodiment, the method for determining particle size further includes: acquiring a first particle size distribution of the sample to be tested obtained by detecting the sample using a laser particle size analyzer, wherein the sample to be tested includes multiple particles to be tested, and the first particle size distribution includes multiple first particle sizes and the proportion of first particle sizes corresponding to the multiple first particle sizes; acquiring a cross-sectional image of each particle to be tested obtained by image acquisition of each particle to be tested in the sample to be tested using an image acquisition device; determining a first diameter and a second diameter of each particle to be tested based on the cross-sectional image of each particle to be tested; determining a correction coefficient corresponding to each particle to be tested based on the first diameter and the second diameter of each particle to be tested; determining an overall correction coefficient corresponding to the sample to be tested based on the correction coefficient corresponding to each particle to be tested; and correcting the first particle size distribution based on the overall correction coefficient to obtain a second particle size distribution of the sample to be tested, wherein the second particle size distribution includes multiple second particle sizes and the proportion of second particle sizes corresponding to the multiple second particle sizes.

[0056] It can be understood that the sample to be tested is a sample composed of multiple particles that need to be measured in terms of particle size; that is, the sample to be tested includes multiple particles to be tested. Particle size distribution refers to the relationship between the particle size of the particles in the sample and the proportion of each particle size in the sample. A first particle size distribution may include multiple first particle sizes and their corresponding proportions, where the first particle size proportion is the proportion (by weight or volume) of each particle's first particle size in the sample. A second particle size distribution may include multiple second particle sizes and their corresponding proportions, where the second particle size proportion is the proportion (by weight or volume) of each particle's second particle size in the sample. Furthermore, in some embodiments, the particle size distribution may also include the cumulative particle size proportion corresponding to each particle size. The overall correction coefficient is the correction coefficient corresponding to the entire sample.

[0057] Specifically, the processor can acquire the first particle size distribution of the sample to be tested, obtained by detecting the sample with a laser particle size analyzer, and acquire cross-sectional images of each particle to be tested, obtained by image acquisition device. Then, based on the cross-sectional images of each particle to be tested, the processor can determine the first diameter and the second diameter of each particle to be tested. Then, based on the first diameter and the second diameter of each particle to be tested, the processor can determine the correction coefficient corresponding to each particle to be tested. Based on the correction coefficients corresponding to each particle to be tested, the processor can determine the overall correction coefficient corresponding to the sample to be tested. For example, the median of the correction coefficients corresponding to each particle to be tested can be selected as the overall correction coefficient. Then, the processor can correct the first particle size distribution based on the overall correction coefficient, for example, by multiplying the first particle size distribution by the overall correction coefficient to obtain the second particle size distribution of the sample to be tested.

[0058] In one embodiment, determining the overall correction coefficient of the sample to be tested based on the correction coefficients corresponding to each particle to be tested includes: determining the mean value of the correction coefficients corresponding to each particle to be tested in order to obtain the overall correction coefficient of the sample to be tested.

[0059] Specifically, the processor can calculate the mean of the correction coefficients corresponding to each particle to be tested, and then use the mean as the overall correction coefficient for the sample to be tested.

[0060] In one embodiment, correcting a first particle size distribution based on an overall correction coefficient to obtain a second particle size distribution of the sample to be tested includes: acquiring a plurality of first particles in the first particle size distribution; determining the product values ​​of the plurality of first particles with the overall correction coefficient to obtain a plurality of second particles; and determining the second particle size distribution of the sample to be tested based on the plurality of second particles and the proportion of the first particles in the first particle size distribution.

[0061] Specifically, the processor can acquire multiple first particles in the first particle size distribution and determine the product value of each of the multiple first particles with the overall correction coefficient to obtain multiple second particles. Then, based on the multiple second particles and the proportion of the first particles in the first particle size distribution, the second particle size distribution of the sample to be tested can be determined. That is, the proportion of the second particle size corresponding to each second particle in the second particle size distribution is the proportion of the first particle size in the corresponding first particle size distribution. For example, the proportion of the second particle size of particle number 10 is the same as the proportion of the first particle size of particle number 10 in the first particle size distribution. That is, the particle size proportion remains unchanged, only changing from the first particle size to the second particle size.

[0062] In one embodiment, the number of test particles in the test sample is greater than 100.

[0063] Understandably, if the number of test particles in the sample is greater than 100, the accuracy and representativeness of the overall correction coefficient corresponding to the sample can be improved.

[0064] In existing technologies, sieving methods have the following drawbacks: First, the results of sieving methods are highly dependent on the accuracy of the sieve. Damage to the sieve due to rough manufacturing processes or long-term use can cause the sieve aperture size to deviate from the standard value, directly resulting in measurement errors and unreliable test results. Failure to calibrate the sieve in a timely manner or using two sets of sieves for comparison can easily lead to risks in the accuracy of the experimental results. Second, although sieving methods are simple to operate, they require a considerable amount of time to vibrate the sieve to ensure sieving quality, and after sieving, the weight of the residue on each sieve layer must be weighed, which is relatively labor-intensive and time-consuming. Finally, because sieving methods, in principle, distinguish samples using sieves of different sizes, limitations in experimental equipment prevent them from achieving high particle size resolution. In specific situations such as process design and product development, sieving methods are insufficient to meet more precise detection requirements.

[0065] In traditional sieving methods, particles in a sample are classified as xxμm if they can pass through a sieve with a mesh size of xxμm. Therefore, the particle size defined using this method is generally equal to its minimum diameter. However, in laser particle size analyzers, particle size is measured using the volume of the particles. The particle size of a sample is defined as the diameter of an equivalent sphere with the same volume as the sample particles.

[0066] A specific embodiment of the present invention provides a method for determining particle size, which can be referred to... Figures 2 to 5 As shown, the fully dispersed and non-adhesive sample is photographed from the front using an optical microscope or other photographic equipment. Taking a cross-section of any particle, the minimum distance between two parallel lines simultaneously tangent to the particle's cross-section is defined as its minimum diameter, denoted as d1. The diameter of a circle with the same cross-sectional area is defined as its equivalent diameter, denoted as d2. The ratio of d1 to d2 is used as the correction coefficient k for the particle.

[0067]

[0068] To reduce the overall error of the sample's correction coefficient, the average of the correction coefficients of multiple particles is used as the final value. For example, software with automated measurement capabilities can be used to batch measure the minimum diameter and equivalent diameter of the particle cross-section from a frontal photograph of the sample and calculate the correction coefficient k for each particle. n K is defined as the k of each particle. n Average value:

[0069]

[0070] Based on experience, when the number of particles in a sample is greater than 100, the sample can be considered representative.

[0071] After obtaining the particle size information of the sample measured by a laser particle size analyzer and the correction coefficient K value obtained by microscopy, the specific implementation steps are as follows:

[0072] ① Export the sample particle size information obtained from the laser particle size analyzer.

[0073] ② Multiply the x-axis (i.e. granularity) value in the exported data by the correction factor K.

[0074] ③ Regenerate the granularity distribution map (i.e., particle size distribution map) by combining the newly obtained x-axis data with the original y-axis data.

[0075] like Figure 5 As shown, the x-axis represents particle size classification, and the y-axis represents the cumulative particle size percentage, i.e., the total volume percentage of particles from size 0 to the current size in the sample. The first particle size distribution can be corrected using an overall correction coefficient. The overall correction coefficient K for the particle size distribution curve before correction (i.e., the first particle size distribution) can be 1, and the overall correction coefficient K for the particle size distribution curve after correction (i.e., the second particle size distribution) can be 0.89.

[0076] Understandably, compared to traditional sieving methods, laser particle size analyzers offer numerous advantages in terms of measurement accuracy, including speed, accuracy, high repeatability, and high particle size resolution. Their high degree of automation reduces the workload of laboratory technicians and significantly improves testing efficiency. However, sieving and laser particle size analysis, as two commonly used particle size analysis methods, cannot be directly compared due to their different measurement principles.

[0077] This technical solution starts from the measurement principles of the two methods, analyzes the root causes of their errors, and proposes a correction scheme through image analysis and mathematical processing. This scheme effectively solves the correction problem when comparing and matching particle size analysis data from laser and sieving methods. Extensive experiments have verified that this scheme achieves good correction results, demonstrating its innovation and practicality.

[0078] like Figure 6 As shown, this embodiment of the invention provides a device 600 for determining particle size, which may include:

[0079] The first particle size acquisition module 610 is used to acquire the first particle size of the particle to be tested, which is obtained by detecting the particle to be tested using a laser particle size analyzer.

[0080] The particle cross-section acquisition module 620 is used to acquire particle cross-section images obtained by image acquisition of the particles under test through an image acquisition device.

[0081] The correction coefficient determination module 630 is used to determine a first diameter and a second diameter based on the particle cross-sectional image, wherein the first diameter is the minimum distance between two parallel lines tangent to the particle cross-sectional image, and the second diameter is the diameter of a circle with the same area as the particle cross-sectional image; and to determine the correction coefficient corresponding to the particle to be tested based on the first diameter and the second diameter.

[0082] The second particle size determination module 640 is used to correct the first particle size according to the correction coefficient to obtain the second particle size of the particle to be tested.

[0083] The aforementioned apparatus 600 for determining particle size acquires a first particle size of the particle to be tested, obtained by a laser particle size analyzer, and acquires a cross-sectional image of the particle to be tested, obtained by an image acquisition device. Based on the cross-sectional image, a first diameter and a second diameter are determined. The first diameter is the minimum distance between two parallel lines tangent to the cross-sectional image, and the second diameter is the diameter of a circle with an area equal to that of the cross-sectional image. A correction coefficient is then determined based on the first and second diameters, and the first particle size is corrected according to the correction coefficient to obtain a second particle size. This technical solution, by acquiring the morphological characteristics of the particle through an image acquisition device and obtaining a correction coefficient, and then correcting the first particle size obtained by the laser particle size analyzer based on the correction coefficient, enables the conversion between particle size measured by the laser particle size analyzer method and particle size measured by sieving method. It obtains a relatively accurate particle size with sieving properties without the need for sieving, thus improving the accuracy of particle size determination.

[0084] In one embodiment, the correction coefficient determination module 630 is further configured to: determine the ratio of the first diameter to the second diameter to obtain the correction coefficient corresponding to the particle to be tested.

[0085] In one embodiment, the second particle size determination module 640 is further configured to: determine the product of the first particle size and the correction coefficient to obtain the second particle size of the particle to be tested.

[0086] In one embodiment, the apparatus 600 for determining particle size further includes a particle size distribution determination module, configured to acquire a first particle size distribution of the sample to be tested obtained by detecting the sample to be tested using a laser particle size analyzer, wherein the sample to be tested includes multiple particles to be tested, and the first particle size distribution includes multiple first particle sizes and the proportion of first particle sizes corresponding to the multiple first particle sizes; acquire particle cross-sectional images of each particle to be tested obtained by image acquisition using an image acquisition device; determine a first diameter and a second diameter of each particle to be tested based on the particle cross-sectional images of each particle to be tested; determine a correction coefficient corresponding to each particle to be tested based on the first diameter and the second diameter of each particle to be tested; determine an overall correction coefficient corresponding to the sample to be tested based on the correction coefficient corresponding to each particle to be tested; and correct the first particle size distribution based on the overall correction coefficient to obtain a second particle size distribution of the sample to be tested, wherein the second particle size distribution includes multiple second particle sizes and the proportion of second particle sizes corresponding to the multiple second particle sizes.

[0087] In one embodiment, the particle size distribution determination module is further configured to: determine the mean value of the correction coefficients corresponding to each particle to be tested, so as to obtain the overall correction coefficients corresponding to the sample to be tested.

[0088] In one embodiment, the particle size distribution determination module is further configured to: obtain a plurality of first particles in a first particle size distribution; determine the product values ​​of the plurality of first particles with the overall correction coefficient to obtain a plurality of second particles; and determine the second particle size distribution of the sample to be tested based on the plurality of second particles and the proportion of the first particles in the first particle size distribution.

[0089] In one embodiment, the number of test particles in the test sample is greater than 100.

[0090] This invention also provides a machine-readable storage medium storing a program or instructions that, when executed by a processor, implement the method for determining granularity according to the above embodiments.

[0091] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0092] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0093] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0094] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0095] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0096] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0097] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0098] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0099] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A method for determining particle size, characterized in that, The method includes: Obtain the first particle size of the particle to be tested by detecting the particle using a laser particle size analyzer; Obtain a cross-sectional image of the particle obtained by image acquisition of the particle under test using an image acquisition device; A first diameter and a second diameter are determined based on the particle cross-sectional image, wherein the first diameter is the minimum distance between two parallel lines tangent to the particle cross-sectional image, and the second diameter is the diameter of a circle with an area equal to that of the particle cross-sectional image. Based on the first diameter and the second diameter, a correction coefficient corresponding to the particle to be tested is determined, wherein the correction coefficient is determined based on the ratio of the first diameter to the second diameter; The first particle size is corrected according to the correction coefficient to obtain the second particle size of the particle to be tested.

2. The method according to claim 1, characterized in that, The step of correcting the first particle size according to the correction coefficient to obtain the second particle size of the particle to be tested includes: The product of the first particle size and the correction coefficient is determined to obtain the second particle size of the particle to be tested.

3. The method according to claim 1, characterized in that, The method further includes: A first particle size distribution of the sample to be tested is obtained by detecting the sample to be tested using a laser particle size analyzer. The sample to be tested includes multiple particles to be tested, and the first particle size distribution includes multiple first particle sizes and multiple first particle size percentages corresponding to the first particle sizes. The cross-sectional images of each particle in the sample to be tested are obtained by acquiring images of each particle in the sample to be tested using an image acquisition device. Based on the cross-sectional images of each particle to be tested, the first diameter and the second diameter of each particle to be tested are determined. Based on the first diameter and the second diameter of each particle to be tested, the correction coefficient corresponding to each particle to be tested is determined. Based on the correction coefficients corresponding to each particle to be tested, the overall correction coefficient corresponding to the sample to be tested is determined. The first particle size distribution is corrected according to the overall correction coefficient to obtain the second particle size distribution of the sample to be tested, wherein the second particle size distribution includes a plurality of second particle sizes and a proportion of the second particle size corresponding to the plurality of second particle sizes.

4. The method according to claim 3, characterized in that, The step of determining the overall correction coefficient for the sample to be tested based on the correction coefficients corresponding to each particle to be tested includes: The mean value of the correction coefficients corresponding to each particle to be tested is determined to obtain the overall correction coefficients corresponding to the sample to be tested.

5. The method according to claim 3, characterized in that, The step of correcting the first particle size distribution according to the overall correction coefficient to obtain the second particle size distribution of the sample to be tested includes: Obtain multiple first granularities from the first granularity distribution; Determine the product values ​​of multiple first granularities with the overall correction coefficient to obtain multiple second granularities; The second particle size distribution of the sample to be tested is determined based on the proportion of the first particle size in the plurality of second particle sizes and the first particle size distribution.

6. The method according to claim 3, characterized in that, The number of test particles in the sample is greater than 100.

7. A processor, characterized in that, It is configured to perform the method for determining particle size as described in any one of claims 1 to 6.

8. An apparatus for determining particle size, characterized in that, The device includes: The first particle size acquisition module is used to acquire the first particle size of the particle to be tested, which is obtained by detecting the particle to be tested using a laser particle size analyzer. The particle cross-section acquisition module is used to acquire a particle cross-section image obtained by image acquisition of the particle under test through an image acquisition device. The correction coefficient determination module is used to determine a first diameter and a second diameter based on the particle cross-sectional image, wherein the first diameter is the minimum distance between two parallel lines tangent to the particle cross-sectional image, and the second diameter is the diameter of a circle with an area equal to that of the particle cross-sectional image; and to determine a correction coefficient corresponding to the particle to be tested based on the first diameter and the second diameter, wherein the correction coefficient is determined based on the ratio of the first diameter to the second diameter. The second particle size determination module is used to correct the first particle size according to the correction coefficient to obtain the second particle size of the particle to be tested.

9. A machine-readable storage medium on which a program or instructions are stored, characterized in that, When the program or the instructions are executed by the processor, they implement the method for determining particle size according to any one of claims 1 to 6.

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