An operating method of a thyristor depth performance testing device

Abstract

The invention discloses an operation method of a thyristor depth performance test device, and relates to the field of semiconductor development technology. For the test device currently used in thyristor performance detection, the thyristor is unstable in installation and fixation, is not easy to be taken and placed, and the triggering mode of hand-held touching pins has too low detection efficiency, and multiple contacts are likely to cause pin structure damage. Now, the following scheme is proposed, the test device comprises a test device body, a cover plate is arranged on the test device body, which is used for dust prevention treatment of the test device body, a strip light is arranged on the test device body, which is used for observation during current operation, a multimeter is arranged on the test device body, which is used for category analysis of electrodes of each pin of the thyristor, a placement bin is arranged on the test device body, which is used for structure placement during thyristor testing, and a slider is arranged on the test device body, which is used for current flow direction control. The various structures cooperate with each other, and the use effect is significantly improved.

Description

Technical Field

[0001] The invention relates to the technical field of semiconductor development, and mainly to an operating method of a thyristor depth performance testing device. Background Art

[0002] Thyristor is the abbreviation of thyristor, also known as silicon-controlled rectifier. It has three poles: anode, cathode and gate. Thyristor has the characteristics of silicon rectifier devices, can work under high voltage and high current conditions, and its working process can be controlled. It is widely used in electronic circuits such as controlled rectification, AC voltage regulation, contactless electronic switches, inverters and frequency converters.

[0003] With regard to the test device currently used for thyristor performance testing, the thyristor is installed and fixed unstably, making it difficult to take and place, and the triggering method of touching the pins by hand has too low detection efficiency. At the same time, multiple contacts can easily cause damage to the pin structure. Summary of the invention

[0004] The present invention proposes an operating method for a thyristor depth performance test device, which solves the problem that the test device currently used in thyristor performance testing is unstable in installation and fixation, difficult to take and place, and has a triggering method of hand-held touching pins, which has too low detection efficiency and is prone to damage to the pin structure due to multiple contacts.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] A method for operating a thyristor depth performance test device, the test device comprising a test device body, a cover plate provided on the test device body, a strip light provided on the test device body, a multimeter provided on the test device body, a placement bin provided on the test device body, a thyristor mounted on the placement bin, a circulating touch mechanism provided on the test device body, and the slider being a circulating touch structure driven by a motor;

[0007] The specific steps of the operation method are as follows:

[0008] Step 1. Open the cover, place the thyristor in the storage compartment, turn on the power, observe the status of the strip light, and check the circuit.

[0009] The current flow state is fed back through a multimeter fixed on the main body of the test device. Under the action of a retractable second wire constrained by a limit block set on one side of the multimeter, the first conductor rod is matched and contacted with the A-pole interface, the G-pole interface and the K-pole interface fixed on one side of the placement bin in pairs. The resistance value displayed on the multimeter is observed to analyze the electrode type at the three pins of the thyristor.

[0010] Step 2, test analysis: connect the black probe of the multimeter to any one of the thyristor electrodes, and the red probe to the other two electrodes in turn. If the resistance is several thousand ohms in one measurement and several hundred ohms in another measurement, it can be determined that the black probe is connected to the gate G. In the measurement of several hundred ohms, the red probe is connected to the cathode K, and in the measurement of several thousand ohms, the red probe is connected to the anode A. If the resistance values ​​measured twice are both very large, it means that the black probe is not connected to the gate G. Use the same method to measure other electrodes until three electrodes are found.

[0011] Step 3, a rotating disc driven by a motor fixedly arranged on one side of the first vertical plate drives a fixed shaft fixedly arranged on the rotating disc to make a circular motion, drives a waist-shaped driving block to move, and makes a slider sliding on a slide rail of the second vertical plate to make a horizontal circular motion, when the slider moves and contacts with an elastic guide plate rotatingly arranged on one side of the placement bin, the rotating elastic guide plate contacts with a second conductor rod arranged through one side of the placement bin, and the G-pole pin of the thyristor is stimulated, and current passes through the thyristor, and the strip light is turned on;

[0012] Step 4. Similarly, when the slider moves and contacts the current conductor, the circuit switch is closed to achieve the state of thyristor short circuit. At this time, the light bar is powered off. By circulating the slider to observe the state of the light bar, the purpose of thyristor performance test is achieved.

[0013] Preferably, support legs are symmetrically arranged below the test device body, a cover plate is rotatably arranged on the test device body, and a first conductive wire is laid inside the test device body.

[0014] Preferably, a power supply, a first guide block, a second guide block, a placement bin, and a light bar are fixedly disposed inside the main body of the test device, and the first guide block, the second guide block, the placement bin, and the light bar are connected to the power supply via a first wire.

[0015] Preferably, both ends of the placement bin can be used for current transmission, an A-pole interface, a G-pole interface and a K-pole interface are fixedly provided on one side of the placement bin, and an elastic guide plate is rotatably provided on one side of the placement bin.

[0016] Preferably, a restraining spring is symmetrically arranged on one side of the prevention bin, and the elastic guide plate is connected to the placement bin via the restraining spring, and a second conductor rod is penetrated through the main body of the testing device.

[0017] Preferably, a circuit switch is fixedly provided on the main body of the test device, the circuit switch comprises a rotatably arranged current conducting plate, a restoring spring is fixedly provided on the current conducting plate, and the first guide block and the second guide block cooperate with each other through the circuit switch.

[0018] Preferably, a first vertical plate and a second vertical plate are fixedly provided on the main body of the test device, a motor is fixedly provided on one side of the first vertical plate, and a rotating disk is provided on one side of the main body of the test device.

[0019] Preferably, a fixed shaft is fixedly provided on the rotating disc, and the motor passes through the first vertical plate and rotates with the rotating disc. A slide rail is fixedly provided on one side of the second vertical plate, and a slider is slidably provided on the slide rail.

[0020] Preferably, a waist-shaped drive block is fixedly provided on the sliding block, and the fixed shaft is interpenetratingly matched with the waist-shaped drive block, a multimeter is fixedly provided on the main body of the testing device, and limit blocks are evenly provided on the main body of the testing device.

[0021] Preferably, a second wire is evenly arranged on one side of the multimeter, a first conductor rod is fixedly arranged on one end of the second wire, and the first conductor rod is penetrated and matched with the limit block.

[0022] The beneficial effects of the present invention are:

[0023] 1. The device is through the power supply, the first guide block, the second guide block, the strip light and the placement bin which are mutually connected by the first wire on the main body of the test device. Under the action of the elastic guide plate rotatably arranged on one side of the placement bin, in conjunction with the restraint spring fixedly arranged on one side of the placement bin and the second conductor rod arranged through one side of the placement bin, it is beneficial to the current stimulation of the G pole of the thyristor, facilitates the structural protection when the G pole pin is in contact, avoids the bending damage of the pin under frequent contact, and significantly improves the service life.

[0024] 2. The device is configured to test the first and second vertical plates fixedly arranged on the main body of the device, and the rotating disk fixedly arranged on the main body of the device and on the first vertical plate and driven by a motor, in cooperation with the waist-shaped drive block fixedly arranged on the slide rail on the second vertical plate and rotating with the fixed axis, and the current guide plate connected for rotation constrained by a restoring spring, which is beneficial to the short-circuit processing of the thyristor and convenient for observing the use status of the thyristor. The circulating contact structure further enhances the test accuracy, reduces the manpower consumption, and greatly improves the detection efficiency.

[0025] 3. The device uses a multimeter fixedly installed on the main body of the test device and multiple groups of arranged limit blocks. Under the action of a second wire with a first conductor rod penetrating the limit block set at one end of one side of the multimeter, in conjunction with the A-pole interface, G-pole interface and K-pole interface set on one side of the placement bin, it is beneficial to the electrode detection of each pin of the thyristor, convenient for subsequent G-pole stimulation, further enhancing its use stability and making the test effect more accurate.

[0026] To summarize, the invention, through the rotatable openable and closable cover plate arranged on the main body of the test device and the symmetrically arranged supporting legs at the bottom, under the action of the mutually coordinated cyclic touch-driven structure for circuit flow and short-circuit state switching arranged on the main body of the test device, cooperates with the stretchable second conductor rod for electrode end detection, which is beneficial to the cyclic stimulation of the current at the G end of the thyristor, facilitates the structural protection of the G-pole pin when it is in contact, avoids bending and damage of the pin under frequent contact, further enhances its stability in use, and greatly accelerates the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0028] Figure 2 It is a schematic diagram of the multimeter mechanism of the present invention.

[0029] Figure 3 It is a schematic diagram of the circuit switch mechanism of the present invention.

[0030] Figure 4 It is a schematic diagram of the placement bin mechanism of the present invention.

[0031] Numbers in the figure: 1. Test device body; 2. Cover plate; 3. Support leg; 4. Power supply; 5. First conductor; 6. First guide block; 7. Second guide block; 8. Multimeter; 9. Light bar; 10. Circuit switch; 11. Motor; 12. Thyristor; 13. Placement bin; 14. Second conductor; 15. Limit block; 16. First conductor rod; 17. First vertical plate; 18. Second vertical plate; 19. Slide rail; 20. Slider; 21. Rotating disk; 22. Waist-shaped drive block; 23. Fixed shaft; 24. Restoring spring; 25. Current guide plate; 26. A-pole interface; 27. G-pole interface; 28. K-pole interface; 29. ​​Elastic guide plate; 30. Second conductor rod; 31. Constraint spring. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0033] Reference Figure 1-Figure 4As shown, an operation method of a thyristor depth performance test device is provided, support legs 3 are symmetrically arranged below the test device body 1, a cover plate 2 is rotatably arranged on the test device body 1, a first wire 5 is laid inside the test device body 1, a power supply 4, a first guide block 6, a second guide block 7, a placement bin 13, and a strip light 9 are fixedly arranged inside the test device body 1, and the first guide block 6, the second guide block 7, the placement bin 13 and the strip light 9 are connected to the power supply 4 through the first wire 5, and current can be transmitted between the two ends of the placement bin 13, an elastic guide plate 29 is rotatably arranged on one side of the placement bin 13, a constraint spring 31 is symmetrically arranged on one side of the placement bin 13, and the elastic guide plate 29 is connected to the placement bin 13 through a restraining spring 31, a second conductor rod 30 is penetrated on the test device main body 1, and the power supply 4, the first guide block 6, the second guide block 7, the strip light 9 and the placement bin 13 are mutually connected through the first wire 5 on the test device main body 1. Under the action of the elastic guide plate 29 rotatably arranged on one side of the placement bin 13, in conjunction with the restraining spring 31 fixedly arranged on one side of the placement bin 13 and the second conductor rod 30 penetrating one side of the placement bin 13, it is beneficial to the current stimulation of the G pole of the thyristor 12, facilitates the structural protection when the G pole pin is in contact, avoids the bending damage of the pin under frequent contact, and significantly improves the service life.

[0034] Reference Figure 1-Figure 3 As shown, a circuit switch 10 is fixedly arranged on the test device body 1, and the circuit switch 10 includes a rotatably arranged current conducting plate 25, on which a restoring spring 24 is fixedly arranged, and the first guide block 6 and the second guide block 7 cooperate with each other through the circuit switch 10, and a first vertical plate 17 and a second vertical plate 18 are fixedly arranged on the test device body 1, and a motor 11 is fixedly arranged on one side of the first vertical plate 17, and a rotating disk 21 is arranged on one side of the test device body 1, and a fixed shaft 23 is fixedly arranged on the rotating disk 21, and the motor 11 passes through the first vertical plate 17 and rotates with the rotating disk 21, and a slide rail 19 is fixedly arranged on one side of the second vertical plate 18, and a slider 20 is slidably arranged on the slide rail 19, and a waist-shaped The drive block 22 is provided, and the fixed shaft 23 is penetrated and matched with the waist-shaped drive block 22. Through the first vertical plate 17 and the second vertical plate 18 fixedly provided on the test device main body 1, under the action of the rotating disk 21 fixedly provided with the fixed shaft 23 on the first vertical plate 17 driven by the motor 11 on the test device main body 1, the waist-shaped drive block 22 fixedly provided on the slide rail 19 and matched with the fixed shaft 23 for rotation is cooperated with the second vertical plate 18, and the current conducting plate 25 connected for rotation constrained by the restoring spring 24 is beneficial to the short-circuit processing of the thyristor 12, and it is convenient to observe the use status of the thyristor 12. The circular contact structure further enhances its test accuracy, reduces the consumption of manpower, and greatly improves the detection efficiency.

[0035] like Figure 2-Figure 4As shown, an A-pole interface 26, a G-pole interface 27 and a K-pole interface 28 are fixedly provided on one side of the placement bin 13, an elastic guide plate 29 is rotatably provided on one side of the placement bin 13, a multimeter 8 is fixedly provided on the test device body 1, and limit blocks 15 are evenly provided on the test device body 1, and a second wire 14 is evenly provided on one side of the multimeter 8, and a first conductor rod 16 is fixedly provided at one end of the second wire 14, and the first conductor rod 16 is penetrated and matched with the limit block 15. Through the multimeter 8 fixedly provided on the test device body 1 and the plurality of groups of limit blocks 15 arranged, under the action of the second wire 14 having a first conductor rod 16 penetrating the limit block 15 at one end provided on one side of the multimeter 8, in cooperation with the A-pole interface 26, the G-pole interface 27 and the K-pole interface 28 provided on one side of the placement bin 13, it is beneficial to the electrode detection of each pin of the thyristor 12, and is convenient for the subsequent G-pole extreme stimulation, which further enhances its use stability and makes the test effect more accurate.

[0036] A method for operating a thyristor depth performance test device. When in use, a cover plate 2 for dust shielding is opened, a thyristor 12 is placed in a placement bin 13, a power supply 4 is turned on, the state of a strip light 9 is observed, and the state of current flow in the circuit is fed back. Through a multimeter 8 fixedly arranged on a main body 1 of the test device, under the action of a retractable second wire 14 constrained by a limit block 15 arranged on one side of the multimeter 8, a first conductor rod 16 is matched and contacted with an A-pole interface 26, a G-pole interface 27, and a K-pole interface 28 fixedly arranged on one side of the placement bin 13 in pairs, the resistance value displayed on the multimeter 8 is observed, and the electrode type at the three pins of the thyristor 12 is analyzed. Then, through a rotating disk 21 fixedly arranged on one side of a first vertical plate 17 and driven by a motor 11, The fixed shaft 23 fixed on the rotating disk 21 is driven to make a circular motion, and the waist-shaped drive block 22 is driven to move, so that the slider 20 sliding on the slide rail 19 on the second vertical plate 18 makes a horizontal circular motion. When the slider 20 moves and contacts with the elastic guide plate 29 rotatingly arranged on one side of the placement bin 13, the rotating elastic guide plate 29 is connected to the second conductor rod 30 penetrating through one side of the placement bin 13, and the G pole pin of the thyristor 12 is stimulated, and the thyristor 12 passes the current, and the strip light 9 lights up. When the slider 20 moves and contacts with the current guide plate 25, the circuit switch 10 is closed to achieve the state of short circuit of the thyristor 12. At this time, the strip light 9 is powered off, and the state of the strip light 9 is observed through the cyclic operation of the slider 20, so as to achieve the purpose of testing the performance of the thyristor 12.

[0037] The above are only preferred specific implementation modes of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical solutions and inventive concepts of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An operating method of a thyristor depth performance test device, characterized in that: The test device comprises a test device body (1), a cover plate (2) is arranged on the test device body (1), a strip light (9) is arranged on the test device body (1), a multimeter (8) is arranged on the test device body (1), a placement bin (13) is arranged on the test device body (1), a thyristor (12) is mounted on the placement bin (13), and a slider (20) is arranged on the test device body (1), and the slider (20) is a cyclic point contact structure driven by a motor (11); The specific steps of the operation method are as follows: Step 1, open the cover plate (2), place the thyristor (12) in the placement chamber (13), turn on the power supply (4), observe the state of the strip light (9), and provide feedback on the state of the circuit flow. Through the multimeter (8) fixedly arranged on the test device body (1), under the action of the retractable second wire (14) constrained by the limit block (15) arranged on one side of the multimeter (8), the first conductor rod (16) is matched and contacted with the A-pole interface (26), the G-pole interface (27) and the K-pole interface (28) fixedly arranged on one side of the placement chamber (13), the resistance value displayed on the multimeter (8) is observed, and the electrode type at the three pins of the thyristor (12) is analyzed; Step 2, test analysis: connect the black probe of the multimeter to any one of the thyristor electrodes, and the red probe to the other two electrodes in turn. If the resistance is several thousand ohms in one measurement and several hundred ohms in another measurement, it can be determined that the black probe is connected to the gate G. In the measurement of several hundred ohms, the red probe is connected to the cathode K, and in the measurement of several thousand ohms, the red probe is connected to the anode A. If the resistance values ​​measured twice are both large, it means that the black probe is not connected to the gate G. Use the same method to measure other electrodes until three electrodes are found. Step 3, a rotating disk (21) fixedly arranged on one side of the first vertical plate (17) and driven by a motor (11) drives a fixed shaft (23) fixedly arranged on the rotating disk (21) to make a circular motion, drives a waist-shaped drive block (22) to move, and makes a slider (20) slidably arranged on a slide rail (19) on the second vertical plate (18) to make a horizontal circular motion, when the slider (20) moves and contacts an elastic guide plate (29) rotatably arranged on one side of the placement bin (13), the rotating elastic guide plate (29) and a second conductor rod (30) arranged to penetrate one side of the placement bin (13), the G-pole pin of the thyristor (12) is stimulated, current passes through the thyristor (12), and the strip light (9) lights up; Step 4. Similarly, when the slider (20) moves and contacts the current conducting plate (25), the circuit switch (10) is closed to achieve a short-circuit state of the thyristor (12). At this time, the light bar (9) is powered off. By circulating the slider (20), the state of the light bar (9) is observed to achieve the purpose of testing the performance of the thyristor (12).

2. The operating method of a thyristor depth performance test device according to claim 1, characterized in that: Support legs (3) are symmetrically arranged below the test device body (1), a cover plate (2) is rotatably arranged on the test device body (1), and a first conductive wire (5) is laid inside the test device body (1).

3. The operating method of a thyristor depth performance test device according to claim 2, characterized in that: A power source (4), a first guide block (6), a second guide block (7), a placement bin (13), and a light bar (9) are fixedly arranged inside the test device body (1), and the first guide block (6), the second guide block (7), the placement bin (13), and the light bar (9) are connected to the power source (4) via a first wire (5).

4. The operating method of a thyristor depth performance test device according to claim 3, characterized in that: The two ends of the placement bin (13) can be used for current transmission, an A-pole interface (26), a G-pole interface (27) and a K-pole interface (28) are fixedly provided on one side of the placement bin (13), and an elastic guide plate (29) is rotatably provided on one side of the placement bin (13).

5. The operating method of a thyristor depth performance test device according to claim 4, characterized in that: A restraining spring (31) is symmetrically arranged on one side of the placement bin (13), and the elastic guide plate (29) is connected to the placement bin (13) via the restraining spring (31). A second conductor rod (30) is provided through the testing device body (1).

6. The operating method of a thyristor depth performance test device according to claim 3, characterized in that: A circuit switch (10) is fixedly arranged on the test device body (1), the circuit switch (10) comprises a rotatably arranged current conducting plate (25), a restoring spring (24) is fixedly arranged on the current conducting plate (25), and the first guide block (6) and the second guide block (7) are matched with each other through the circuit switch (10).

7. The operating method of a thyristor depth performance test device according to claim 1, characterized in that: A first vertical plate (17) and a second vertical plate (18) are fixedly arranged on the test device body (1), a motor (11) is fixedly arranged on one side of the first vertical plate (17), and a rotating disc (21) is arranged on one side of the test device body (1).

8. The operating method of a thyristor depth performance test device according to claim 7, characterized in that: A fixed shaft (23) is fixedly arranged on the rotating disc (21), and the motor (11) passes through the first vertical plate (17) and rotates with the rotating disc (21). A slide rail (19) is fixedly arranged on one side of the second vertical plate (18), and a slider (20) is slidably arranged on the slide rail (19).

9. The operating method of a thyristor depth performance test device according to claim 8, characterized in that: A waist-shaped drive block (22) is fixedly arranged on the slider (20), and the fixed shaft (23) is interlocked with the waist-shaped drive block (22); a multimeter (8) is fixedly arranged on the test device body (1); limit blocks (15) are evenly arranged on the test device body (1); a second wire (14) is evenly arranged on one side of the multimeter (8); a first conductor rod (16) is fixedly arranged at one end of the second wire (14); and the first conductor rod (16) is interlocked with the limit block (15).

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