Material volatility characteristics test device

Abstract

The embodiments of the present application relate to testing or analyzing materials by measuring the chemical or physical properties of the materials, and specifically to a material volatility characteristics test device. The test device includes a test chamber, a heating element for heating the sample in the test chamber, a heat storage chamber, and a thermal cycle mechanism. The heat storage chamber is not connected to the test chamber. After the test is completed, the thermal cycle mechanism allows the high-temperature gas in the test chamber to enter the heat storage chamber for storage, so that the test chamber can be quickly cooled down; before the next test begins, the high-temperature gas will return to the test chamber through the thermal cycle mechanism to use its heat to heat the sample in the test chamber. The test device provided in the embodiment of the present application sends the high-temperature gas from the test chamber to the heat storage chamber through the thermal cycle mechanism, and can send the high-temperature gas from the heat storage chamber back to the test chamber through the thermal cycle mechanism, which can reduce the time for heating and cooling the sample, and at the same time, it can also reduce energy consumption.

Description

Technical Field

[0001] The embodiments of the present application relate to testing or analyzing materials by measuring the chemical or physical properties of the materials, and more particularly to a material volatility characteristics testing device. Background Art

[0002] The statements herein merely provide background information related to the present application and do not necessarily constitute prior art.

[0003] Some materials need to serve for a long time under high temperature and vacuum conditions, so it is necessary to provide a material volatility test device to verify the volatility of the material under specific service conditions.

[0004] In order to simulate the test conditions of high temperature vacuum, the material volatility characteristic test device usually includes a test chamber and a heating element for heating the sample in the test chamber. After the test is completed, the heated sample needs to be taken out.

[0005] After the test is completed, the test chamber of the material volatility test device is still in a high temperature state. It is necessary to wait until the test chamber is completely cooled before opening the test chamber to take out the sample. Because the temperature in the test chamber is very high and the test chamber usually has an insulation layer, it takes a long time for the test chamber to cool down. Summary of the invention

[0006] A brief overview of the present application is provided below in order to provide a basic understanding of certain aspects of the present application. It should be understood that this overview is not an exhaustive overview of the present application. It is not intended to identify the key or important parts of the present application, nor is it intended to limit the scope of the present application. Its purpose is merely to present certain concepts in a simplified form as a prelude to a more detailed description discussed later.

[0007] The embodiment of the present application provides a material volatility characteristic test device, which includes a test chamber, a heating element for heating a sample in the test chamber, a heat storage chamber, and a thermal cycle mechanism. The heat storage chamber and the test chamber are not connected to each other; the thermal cycle mechanism is used to allow the high-temperature gas in the test chamber to enter the heat storage chamber for storage after the test is completed, so as to quickly cool down the test chamber; and before the next test starts, the high-temperature gas stored in the heat storage chamber enters the test chamber, so as to use the heat of the high-temperature gas to heat the sample in the test chamber.

[0008] The test device provided in the embodiment of the present application is provided with a heat storage chamber and a thermal circulation mechanism. After the test is completed, the thermal circulation mechanism can be used to send high-temperature gas from the test chamber to the heat storage chamber for storage, which can quickly reduce the temperature in the test chamber and thus reduce the cooling time of the sample. Before the next test begins, the high-temperature gas is sent back from the heat storage chamber to the test chamber through the thermal circulation mechanism, and the heat of the high-temperature gas can be used to heat the sample, which can not only reduce the heating time of the sample, but also reduce energy consumption. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Other objects and advantages of the present application will become apparent from the following description of the embodiments of the present application with reference to the accompanying drawings, and will help to provide a comprehensive understanding of the present application.

[0010] Figure 1 It is a cross-sectional schematic diagram of a test device of an embodiment of the present application.

[0011] Figure 2 yes Figure 1 A partial enlarged view of the test device is shown.

[0012] Figure 3 It is a side view schematic diagram of the test device of the embodiment of the present application.

[0013] Description of reference numerals:

[0014] 100, test device; 10, outer shell; 101, end plate; 102, cylinder; 103, opening; 104, cover; 11, test chamber; 111, sample support; 12, first shell; 13, second shell;

[0015] 20. Heating element;

[0016] 30. Heat storage cavity;

[0017] 40. thermal cycle mechanism; 41. connecting pipeline; 411. first pipeline; 412. second pipeline; 4121. valve; 413. third pipeline; 4131. valve; 42. air extraction member; 421. air inlet; 422. air outlet; 43. exhaust pipe; 431. exhaust valve;

[0018] 50. Cooling chamber;

[0019] 60. Cooling pipeline; 61. Spiral pipeline; 62. Connecting pipe; 621. Valve;

[0020] 70. Coolant supply part; 71. Liquid storage tank; 711. Coolant storage chamber; 72. Driving part; 73. Coolant circulation pipeline; 74. Heat dissipation part;

[0021] 80. Insulation layer; 90. Ionization gauge.

[0022] It should be noted that the drawings are not necessarily drawn to scale, but are merely shown in a schematic manner that does not affect the reader's understanding. DETAILED DESCRIPTION

[0023] Exemplary embodiments of the present application will be described below in conjunction with the accompanying drawings. For the sake of clarity and conciseness, not all features of the actual implementation are described in the specification. However, it should be understood that many implementation-specific decisions must be made in the process of developing any such actual implementation in order to achieve the developer's specific goals, such as meeting those constraints related to the system and business, and these constraints may vary from implementation to implementation. In addition, it should be understood that although the development work may be very complex and time-consuming, it is only a routine task for those skilled in the art who benefit from the content of this application.

[0024] It is also necessary to explain here that, in order to avoid obscuring the present application due to unnecessary details, only the device structure and / or processing steps closely related to the scheme according to the present application are shown in the accompanying drawings, while other details that are not very relevant to the present application are omitted.

[0025] As mentioned above, since the temperature in the test chamber is very high and the test chamber usually has an insulation layer, it takes a long time for the test chamber to cool down. In addition, when the sample is heated before the test, it takes a long time to heat the test chamber, making the total time spent on each test longer.

[0026] In view of the above problems, the embodiments of the present application provide a material volatility characteristic test device, such as Figure 1 As shown, it shows a cross-sectional schematic diagram of a test device of an embodiment of the present application, and the test device 100 may include a test chamber 11, a heating element 20 for heating a sample (not shown in the figure) in the test chamber 11, a heat storage chamber 30, and a thermal cycle mechanism 40. The heat storage chamber 30 and the test chamber 11 are not connected to each other; the thermal cycle mechanism 40 is used to allow the high-temperature gas in the test chamber 11 to enter the heat storage chamber 30 for storage after the test is completed, so as to quickly cool down the test chamber 11; and before the next test starts, the high-temperature gas stored in the heat storage chamber 30 enters the test chamber 11, so as to use the heat of the high-temperature gas to heat the sample in the test chamber 11.

[0027] The test device 100 provided in the embodiment of the present application is provided with a heat storage chamber 30 and a heat circulation mechanism 40. After the test is completed, the high-temperature gas can be sent from the test chamber 11 to the heat storage chamber 30 for storage through the heat circulation mechanism 40, so that the temperature of the test chamber 11 is reduced, thereby reducing the cooling time of the sample and improving the cooling efficiency of the sample; the test device 100 can also send the high-temperature gas from the heat storage chamber 30 back to the test chamber 11 through the heat circulation mechanism 40 before the next test starts, so as to use the heat of the high-temperature gas to heat the sample, thereby reducing the heating time of the sample and reducing energy consumption.

[0028] In some embodiments, the test device 100 may include a sample support 111, which is disposed in the test chamber 11 and is used to place the sample. The sample support 111 may be made of a high temperature resistant material to withstand the high temperature environment in the test chamber 11. In some embodiments, the high temperature resistant material used to manufacture the sample support 111 may be a molybdenum metal material.

[0029] In some embodiments, the heating element 20 may include a plurality of strip-shaped electric heating elements, which are arranged at intervals along the axial direction of the test chamber 11. The heating element 20 may be made of a high temperature resistant material to withstand the high temperature environment in the test chamber 11. In some embodiments, the high temperature resistant material used to manufacture the heating element 20 may be a molybdenum metal material. The molybdenum metal material is not only resistant to high temperatures, but also has the advantages of uniform resistance, stable heat generation, and long service life.

[0030] See also Figure 1 In some embodiments, the thermal cycle mechanism 40 may include a connecting pipeline 41 and an exhaust member 42. The connecting pipeline 41 may be used to controllably connect the heat storage chamber 30 and the test chamber 11; the exhaust member 42 may be disposed on the connecting pipeline 41 to exhaust the high-temperature gas in the test chamber 11 into the heat storage chamber 30; or to exhaust the high-temperature gas in the heat storage chamber 30 into the test chamber 11. The exhaust member 42 may be a vacuum pump.

[0031] The test device 100 of the embodiment of the present application can be used to perform a material volatility test, which needs to be performed in a high-temperature vacuum environment. The heat storage chamber 30 and / or the test chamber 11 can be evacuated using the vacuum element 42 .

[0032] See also Figure 1 and Figure 2In some embodiments, the connecting pipeline 41 may include two first pipelines 411, two second pipelines 412, and two third pipelines 413. The air extraction member 42 may be disposed between the two first pipelines 411. One end of each second pipeline 412 may be connected to a first pipeline 411 through a valve 4121, and the other end of each second pipeline 412 may be connected to the test chamber 11; one end of each third pipeline 413 may be connected to the first pipeline 411 through a valve 4131, and the other end of each third pipeline 413 may be connected to the heat storage chamber 30.

[0033] In some embodiments, the air extraction member 42 may be provided with an air inlet 421 and an air outlet 422, and gas may enter the air extraction member 42 from the air inlet 421 and flow out of the air extraction member 42 from the air outlet 422. The two first pipelines 411 may be respectively connected to the air inlet 421 and the air outlet 422 of the air extraction member 42. By such a configuration, the air extraction member 42 may be used to deliver the gas in the test chamber 11 into the heat storage chamber 30, or deliver the gas in the heat storage chamber 30 into the test chamber 11.

[0034] In some embodiments, a three-way pipe can be used to replace the second pipeline 412 and the third pipeline 413 connected to the air inlet 421 or the air outlet 422, that is, a three-way pipe can be used to replace the second pipeline 412 and the third pipeline 413 connected to the air inlet 421, and a three-way pipe can be used to replace the second pipeline 412 and the third pipeline 413 connected to the air outlet 422.

[0035] See also Figure 1 and Figure 2 In some embodiments, the thermal cycle mechanism 40 may further include an exhaust pipe 43, which may controllably connect the external environment to the connecting pipeline 41 to discharge the gas extracted by the exhaust member 42 to the external environment.

[0036] In some embodiments, one end of the exhaust pipe 43 may be connected to the first pipeline 411, and the other end of the exhaust pipe 43 may be connected to the external environment; an exhaust valve 431 may also be provided on the exhaust pipe 43 to achieve controlled conduction of the exhaust pipe 43.

[0037] The exhaust pipe 43 may be connected to the first pipeline 411 at one side of the air outlet 422 of the suction member 42 , so that the test chamber 11 or the heat storage chamber 30 may be evacuated by the suction member 42 .

[0038] In some embodiments, the test device 100 may include an outer shell 10 , in which a test chamber 11 and a heat storage chamber 30 are formed.

[0039] In some embodiments, the test device 100 may also include: a first shell 12 and a second shell 13 arranged in the outer shell 10, the first shell 12 is arranged on the radial inner side of the second shell 13, the first shell 12 is arranged to form a test chamber 11, and a heat storage chamber 30 is formed between the first shell 12 and the second shell 13.

[0040] See also Figure 1 and Figure 3 The two axial ends of the outer shell 10 respectively form openings 103 communicating with the test chamber 11 for taking and placing the sample, and the outer shell 10 also includes two covers 104 for opening or closing the openings 103. It is easy to understand that after such arrangement, when the cover 104 is opened, the heat storage chamber 30 is still in a sealed state.

[0041] In some embodiments, the outer shell 10 includes a cylinder 102 and end plates 101 disposed at both ends of the cylinder. An opening 103 is formed on the end plate 101 and a cover 104 is disposed thereon.

[0042] See also Figure 1 In some embodiments, the test device 100 may further include a cooling chamber 50 , in which a coolant is contained to reduce the temperature of the outer shell 10 .

[0043] See also Figure 1 In some embodiments, the test device 100 may further include a coolant supply 70 , which may be used to provide a coolant to the cooling cavity 50 .

[0044] In some embodiments, the coolant supply member 70 may include a liquid storage tank 71 and a driving member 72. The liquid storage tank 71 forms a coolant storage chamber 711 for providing coolant; the driving member 72 may be used to drive the coolant to circulate in the coolant storage chamber 711 and the cooling chamber 50. The driving member 72 may be a flow stirrer composed of a motor and an impeller.

[0045] In some embodiments, the coolant supply member 70 may further include a coolant circulation pipeline 73. There may be two coolant circulation pipelines 73, and the coolant may circulate in the coolant storage chamber 711 and the cooling chamber 50 through the two coolant circulation pipelines 73. In some embodiments, the driving member 72 may be connected to one of the coolant circulation pipelines 73.

[0046] In some embodiments, the liquid storage tank 71 may be disposed below the outer shell 10. In some embodiments, the coolant supply member 70 may further include a plurality of heat sinks 74, which may be disposed on the side walls of the liquid storage tank 71 to cool the liquid storage tank 71. In some embodiments, the heat sink 74 may be a heat sink fin.

[0047] In some embodiments, the test device 100 may further include a cooling pipeline 60 disposed in the cooling cavity 50. The cooling pipeline 60 may be in controlled communication with the test chamber 11, so that external air can enter the test chamber 11 through the cooling pipeline 60 to cool the test chamber 11.

[0048] In some embodiments, the cooling cavity 50 may be an annular cavity formed on the radially outer side of the test chamber 11 , and the cooling pipeline 60 may extend spirally in the annular cavity.

[0049] In some embodiments, the cooling cavity 50 is formed between the cylinder 102 and the peripheral wall of the second shell 13 .

[0050] In some embodiments, the test chamber 11 is a cylindrical chamber with an axis extending in the horizontal direction; the heat storage chamber 30 is an annular chamber arranged radially outside the test chamber 11. The cooling chamber 50 is an annular chamber 50 formed radially outside the heat storage chamber 30. Part of the high-temperature gas in the test chamber 11 can enter the cooling pipeline 60 to heat the cooling chamber 50, increase the temperature of the cooling chamber 50, and prevent the temperature of the high-temperature gas stored in the heat storage chamber 30 from dropping rapidly.

[0051] The heat storage chamber 30 coincides with the axis of the test chamber 11 .

[0052] In some embodiments, the cooling pipeline 60 may include a spiral pipeline 61 and a connecting pipe 62. The spiral pipeline 61 may extend spirally in the cooling chamber 50, and one end of the spiral pipeline 61 may penetrate the cooling chamber 50 and extend to the outside of the outer shell 10; the other end of the spiral pipeline 61 may be connected to the connecting pipe 62, and the other end of the connecting pipe 62 may be connected to the first pipeline 411, and a valve 621 may be provided on the connecting pipe 62. Specifically, in order to use the exhaust member 42 to extract the high-temperature gas from the test chamber 11 to the spiral pipeline 61, the connecting pipe 62 may be connected to the first pipeline 411 on the side of the gas outlet 422 of the exhaust member 42.

[0053] See also Figure 1 In some embodiments, the test device 100 may further include a heat-insulating layer 80, which may be disposed on the peripheral wall of the test chamber 11 (i.e., the first shell 12) to insulate the test chamber 11. In some embodiments, the heat-insulating layer 80 may be disposed on the inner side of the peripheral wall of the test chamber 11, or may be disposed on the outer side of the peripheral wall of the test chamber 11.

[0054] In some embodiments, the heating element 20 is disposed in the test chamber 11. In some embodiments, the heating element 20 can be disposed inside the heat-insulating layer 80. In some embodiments, the heat storage chamber 30 can be disposed radially outside the test chamber 11.

[0055] In some embodiments, the thermal insulation layer 80 may be made of a high temperature resistant material to withstand the high temperature environment in the test chamber 11 . The high temperature resistant material used to manufacture the thermal insulation layer 80 may be a molybdenum metal material.

[0056] In some embodiments, the first pipeline 411 may pass through the heat storage chamber 30 and the cooling chamber 50 , and may extend to the outside of the outer shell 10 ; the exhaust member 42 is connected to the first pipeline 411 outside the outer shell 10 .

[0057] In some embodiments, the second pipeline 412 may penetrate the thermal insulation layer 80 and communicate with the test chamber 11. In some embodiments, the third pipeline 413 may be located in the heat storage chamber 30.

[0058] In some embodiments, the test device 100 may further include an ionization gauge 90 . The ionization gauge 90 may penetrate the cooling cavity 50 and enter the heat storage cavity 30 , so as to detect the vacuum degree of the heat storage cavity 30 .

[0059] Combine the following Figures 1 to 3 , describes in detail the process of conducting a material volatility performance test using the test device 100 of an embodiment of the present application.

[0060] During the first test, before conducting the test, a sample can be placed in the test chamber 11, and then the heat storage chamber 30 and the test chamber 11 can be evacuated. For example, the exhaust valve 431 and the valves 4131 and 4121 located on the air inlet side of the vacuum component 42 can be opened, and the vacuum component 42 can be started to evacuate the heat storage chamber 30 and the test chamber 11.

[0061] When the vacuum degree in the test chamber 11 reaches the preset vacuum degree, close the exhaust valve 431, the valves 4131, 4121 located on the air inlet 421 side of the exhaust component 42, and the exhaust component 42, turn on the heating component 20 to heat the test chamber 11, and carry out the material volatility performance test.

[0062] When the test is completed, the heating element 20 is turned off first, and then the high-temperature gas in the test chamber 11 is sent to the heat storage chamber 30 for storage through the heat circulation mechanism 40. This process may include the following: open the valve 4121 located on the air inlet 421 side of the suction element 42 and the valve 4131 located on the air outlet 422 side of the suction element 42, and start the suction element 42. At this time, the high-temperature gas in the test chamber 11 flows into the heat storage chamber 30 along the pipeline.

[0063] When the heat storage chamber 30 reaches a saturated state (for example, the vacuum degree is 1.0*10 -6pa), close the valve 4121 located on the air inlet 421 side of the exhaust member 42, the valve 4131 located on the air outlet 422 side of the exhaust member 42, and the exhaust member 42, and the high-temperature gas completes the flow process from the test chamber 11 to the heat storage chamber 30.

[0064] Afterwards, the remaining high-temperature gas in the test chamber 11 can be pumped into the spiral pipeline 61 by using the exhaust member 42. Open the valve 4121 and the valve 621 located on the side of the air inlet 421 of the exhaust member 42, start the exhaust member 42, and at this time, the high-temperature gas in the test chamber 11 flows into the spiral pipeline 61 along the pipeline. Afterwards, close the valve 4121 and the valve 621 located on the side of the air inlet 421 of the exhaust member 42, and close the exhaust member 42. It is easy to understand that most of the high-temperature gas in the test chamber 11 is sent to the heat storage chamber 30 for storage, and a part of the high-temperature gas in the test chamber 11 flows into the spiral pipeline 61 to heat the cooling chamber 50 and increase the temperature of the cooling chamber 50. Since the cooling chamber 50 is located outside the heat storage chamber 30, increasing the temperature of the cooling chamber 50 is conducive to avoiding a rapid decrease in the temperature in the heat storage chamber 30, thereby having a heat preservation effect on the heat storage chamber 30.

[0065] Afterwards, when the temperature of the cooling chamber 50 is increased, since the test chamber 11 is in a negative pressure state at this time, the gas from the external environment can be sent into the test chamber 11 to quickly cool down the test chamber 11. The process of the gas from the external environment entering the test chamber 11 is as follows: open the valve 4121 located on the side of the air inlet 421 of the exhaust member 42 and the valve 621 on the connecting pipe 62. Since the inside of the test chamber 11 is in a negative pressure state, the gas from the external environment enters the spiral pipeline 61, the connecting pipe 62, the first pipeline 411 located on the side of the air inlet 421 of the exhaust member 42, and the second pipeline 412 located on the side of the air inlet 421 of the exhaust member 42 in turn under the action of air pressure, and flows to the test chamber 11. When the high-temperature gas is sent to the heat storage chamber 30, the temperature of the test chamber 11 decreases; when the gas from the external environment enters the test chamber 11, the gas is cooled in the spiral pipe 61 and then enters the test chamber 11, which is conducive to quickly reducing the temperature in the test chamber 11. After a short period of time, the external gas no longer enters the test chamber 11, and the air pressure in the test chamber 11 is the same as the air pressure of the external environment. At this time, the cover 104 is opened, and the sample on the sample support 111 is taken out from the opening 103.

[0066] After the next test begins, the sample is first placed in the test chamber 11. Then, the cover 104 is closed, and the test chamber 11 is evacuated to a preset vacuum degree. Afterwards, the high-temperature gas stored in the heat storage chamber 30 is sent back to the test chamber 11. The specific operation may include the following: closing the valve 4121 located on the side of the air inlet 421 of the exhaust member 42, the exhaust valve 431 on the exhaust pipe 43, and the exhaust member 42, opening the valve 4131 located on the side of the air inlet 421 of the exhaust member 42 and the valve 4121 located on the side of the air outlet 422 of the exhaust member 42, and starting the exhaust member 42 to allow the high-temperature gas in the heat storage chamber 30 to flow through the third pipeline 413 located on the side of the air inlet 421 of the exhaust member 42, the first pipeline 411, the first pipeline 411 located on the side of the air outlet 422 of the exhaust member 42, and the second pipeline 412, and enter the test chamber 11.

[0067] After sending the high-temperature gas in the heat storage chamber 30 back to the test chamber 11, close the valve 4131 located on the air inlet 421 side of the vacuum component 42 and the valve 4121 located on the air outlet 422 side of the vacuum component 42, and use the vacuum component 42 to evacuate the test chamber 11. When the vacuum degree reaches the preset vacuum degree, stop evacuating the test chamber 11, heat the test chamber 11, and conduct a material volatility performance test. Among them, after closing the corresponding valves and vacuum components 42, the heating component 20 can be directly turned on to heat the test chamber, or it can be kept warm for a period of time before turning on the heating component 20 for heating. In the actual test process, you can choose whether to keep warm for a period of time according to the temperature conditions of the current test. After the test is completed, you can repeat the above-mentioned related operations to repeat the test again.

[0068] After the test is completed, the embodiment of the present application uses the thermal cycle mechanism 40 to extract the high-temperature gas in the test chamber 11, and uses the cooling pipeline 60 to allow external gas to enter the test chamber 11, which can quickly reduce the temperature inside the test chamber 11, thereby reducing the cooling time of the sample and improving the cooling efficiency. Before the test starts, the embodiment of the present application uses the thermal cycle mechanism 40 to return the high-temperature gas in the heat storage chamber 30 to the test chamber 11, which can fully utilize the heat in the high-temperature gas to heat the sample, which can not only reduce the heating time of the sample, but also save electricity.

[0069] Regarding the embodiments of the present application, it should also be noted that, in the absence of conflict, the embodiments of the present application and the features therein can be combined with each other to obtain new embodiments.

[0070] The above are only specific implementation methods of the present application, but the protection scope of the present application is not limited thereto. The protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A material volatility characteristics testing device, comprising: A test chamber and a heating element for heating a sample in the test chamber, wherein the device further comprises: a heat storage chamber not connected to the test chamber; and A thermal cycle mechanism, for allowing the high-temperature gas in the test chamber to enter the heat storage chamber for storage after the test is completed, so as to quickly cool the test chamber; and for allowing the high-temperature gas stored in the heat storage chamber to enter the test chamber before the next test begins, so as to use the heat of the high-temperature gas to heat the sample in the test chamber; The test device comprises an outer shell, wherein the test chamber and the heat storage chamber are formed in the outer shell. The device further comprises: a cooling cavity and a cooling pipeline arranged in the cooling cavity, The cooling cavity contains a coolant for reducing the temperature of the outer shell; The cooling pipeline is in controlled communication with the test chamber, so that external air can enter the test chamber through the cooling pipeline to cool the test chamber; and high-temperature gas in the test chamber can enter the cooling pipeline to heat the cooling chamber; The heat storage chamber is arranged radially outside the test chamber; The cooling cavity is an annular cavity formed radially outside the heat storage cavity.

2. The device according to claim 1, characterized in that The thermal cycle mechanism comprises: A connecting pipeline, used for controllingly connecting the heat storage chamber and the test chamber; The exhaust component is arranged in the connecting pipeline, and is used to extract the high-temperature gas in the test chamber into the heat storage chamber; or to extract the high-temperature gas in the heat storage chamber into the test chamber.

3. The device according to claim 2, characterized in that The connecting pipeline comprises: Two first pipelines, the air extraction member is arranged between the two first pipelines; Two second pipelines, one end of each of the second pipelines is connected to one of the first pipelines through a valve, and the other end of each of the second pipelines is communicated with the test chamber; Two third pipelines, one end of each of the third pipelines is connected to the first pipeline through a valve, and the other end of each of the third pipelines is communicated with the heat storage chamber.

4. The device according to claim 2, characterized in that The vacuum element also evacuates the heat storage chamber and / or the test chamber; The thermal cycle mechanism further includes an exhaust pipe, which controllably connects the external environment with the connecting pipeline to discharge the gas extracted by the exhaust member to the external environment.

5. The device according to claim 1, characterized in that The cooling pipeline extends spirally in the annular cavity.

6. The device according to claim 1, characterized in that Also includes: A coolant supplying member is used for supplying coolant to the cooling cavity.

7. The device according to claim 6, characterized in that The coolant supply comprises: A coolant storage chamber, used for providing coolant; The driving member is used for driving the coolant to circulate in the coolant storage chamber and the cooling chamber.

8. The device according to claim 1, characterized in that Also includes: A heat-insulating layer, which is disposed on the peripheral wall of the test chamber and is used to keep the test chamber warm; The heating element is arranged on the inner side of the thermal insulation layer.

9. The device according to claim 1, characterized in that Also includes: A first shell and a second shell are disposed in the outer shell, the first shell is disposed radially inward of the second shell, the first shell is configured to form the test chamber, and the heat storage chamber is configured between the first shell and the second shell; The two axial ends of the outer shell respectively form openings communicating with the test chamber for taking in and placing samples, and the outer shell also includes two covers for opening or closing the openings.

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