Operational amplifier detection method, device and storage medium

Abstract

The present application discloses an operational amplifier detection method, device and storage medium. Multiple operational amplifiers to be tested can be connected simultaneously through an operational amplifier detection circuit, and multiple operational amplifiers to be tested can be switched in a round-robin manner through a switching unit, and then the ADC sampling result to be tested can be obtained through a data acquisition unit. Finally, the quality of the operational amplifier to be tested can be detected based on the threshold parameter of the ADC sampling result to be tested. Compared with the traditional method, the embodiment of the present application can greatly improve the detection efficiency, and because manual detection is no longer used, errors caused by human subjective reasons can also be reduced.

Description

Technical Field

[0001] The present application relates to the field of chip detection, and in particular to an operational amplifier detection method, device and storage medium. Background Art

[0002] Operational amplifiers are widely used in the field of electronic technology. For an enterprise, a large number of operational amplifiers are scrapped and recycled every year for various reasons and reused. However, there is a risk of device damage in the recycled operational amplifier dismantling materials. If the performance cannot be effectively evaluated and the secondary use is carried out, the subsequent maintenance and rework costs will make the recycling work not worth the cost.

[0003] At present, there is no equipment specifically designed for op amp recycling testing on the market. Most engineers use conventional testing instruments and conduct testing based on their own experience. Therefore, it is difficult to conduct large-scale testing, or large-scale testing requires a lot of testing time. Summary of the invention

[0004] The present application aims to provide an operational amplifier detection method, device and storage medium, which can effectively improve the detection efficiency of recycled operational amplifiers.

[0005] The operational amplifier detection method according to the first aspect of the present application is applied to an operational amplifier detection circuit, wherein the operational amplifier detection circuit includes a control unit and a plurality of detection subcircuits, a switching unit, and a data acquisition unit, all of which are electrically connected to the control unit; the plurality of detection subcircuits are used to connect to a plurality of operational amplifiers to be tested or a plurality of initial operational amplifiers, and each of the detection subcircuits is used to change the resistance connection state of the positive input terminal and the negative input terminal of the connected operational amplifier to be tested or the initial operational amplifier; the switching unit is used to switch the connection state between the output terminals of the plurality of operational amplifiers to be tested or the plurality of initial operational amplifiers and the data acquisition unit, and the data acquisition unit is used to perform ADC sampling; the operational amplifiers to be tested and the initial operational amplifiers are of the same model;

[0006] The operational amplifier detection method comprises:

[0007] Acquire a plurality of threshold parameters corresponding to the plurality of operational amplifiers to be tested, wherein the plurality of threshold parameters are obtained by the operational amplifier detection circuit executing a threshold acquisition strategy on the plurality of initial operational amplifiers; the plurality of threshold parameters are used to indicate normal results of the normal operational amplifiers to be tested;

[0008] Control the switching unit to poll and switch the connection status between the plurality of operational amplifiers to be tested and the data acquisition unit, and after each switching of the connection status, change the connection status of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the operational amplifier to be tested in the connection status, and obtain the sampling result of the ADC to be tested through the data acquisition unit;

[0009] Obtaining detection results of the plurality of operational amplifiers to be tested according to the plurality of threshold parameters and the plurality of ADC sampling results to be tested corresponding to the plurality of operational amplifiers to be tested;

[0010] The threshold acquisition strategy includes:

[0011] Control the switching unit to poll and switch the connection states between the multiple initial operational amplifiers and the data acquisition unit, and after each switching of the connection states, change the connection states of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connection state, and obtain the initial ADC sampling result through the data acquisition unit;

[0012] A plurality of threshold parameters are obtained according to the plurality of initial ADC sampling results.

[0013] The operational amplifier detection device according to the second aspect of the present application is applied to an operational amplifier detection circuit, wherein the operational amplifier detection circuit includes a control unit and a plurality of detection subcircuits, a switching unit, and a data acquisition unit, all of which are electrically connected to the control unit; the plurality of detection subcircuits are used to connect to a plurality of operational amplifiers to be tested or a plurality of initial operational amplifiers, and each of the detection subcircuits is used to change the resistance connection state of the positive input terminal and the negative input terminal of the connected operational amplifier to be tested or the initial operational amplifier; the switching unit is used to switch the connection state between the output terminals of the plurality of operational amplifiers to be tested or the plurality of initial operational amplifiers and the data acquisition unit, and the data acquisition unit is used to perform ADC sampling; the operational amplifiers to be tested and the initial operational amplifiers are of the same model;

[0014] The operational amplifier detection device comprises:

[0015] A threshold acquisition unit, used to acquire a plurality of threshold parameters corresponding to the plurality of operational amplifiers to be tested, wherein the plurality of threshold parameters are obtained by the operational amplifier detection circuit executing a threshold acquisition strategy on the plurality of initial operational amplifiers; the plurality of threshold parameters are used to indicate normal results of the normal operational amplifiers to be tested;

[0016] A data acquisition unit, used to control the switching unit to poll and switch the connection state between the plurality of operational amplifiers to be tested and the data acquisition unit, and after each switching of the connection state, change the connection state of the resistor connected in series with the positive input end and the resistor connected in series with the negative input end of the operational amplifier to be tested in the connection state, and obtain the sampling result of the ADC to be tested through the data acquisition unit;

[0017] A result output unit, configured to obtain detection results of the plurality of operational amplifiers to be tested according to the plurality of threshold parameters and the plurality of ADC sampling results to be tested corresponding to the plurality of operational amplifiers to be tested;

[0018] The threshold acquisition strategy includes:

[0019] Control the switching unit to poll and switch the connection states between the multiple initial operational amplifiers and the data acquisition unit, and after each switching of the connection states, change the connection states of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connection state, and obtain the initial ADC sampling result through the data acquisition unit;

[0020] A plurality of threshold parameters are obtained according to the plurality of initial ADC sampling results.

[0021] According to the computer-readable storage medium of the third aspect embodiment of the present application, computer-executable instructions are stored, and the computer-executable instructions are used to execute the operational amplifier detection method as described in the first aspect embodiment above.

[0022] The operational amplifier detection method, device and storage medium of the embodiment of the present application can simultaneously connect multiple operational amplifiers to be tested through the operational amplifier detection circuit, and can realize the patrol switching of multiple operational amplifiers to be tested through the switching unit, and then obtain the ADC sampling result to be tested through the data acquisition unit, and finally, the quality of the operational amplifier to be tested can be detected based on the threshold parameter of the ADC sampling result to be tested. Compared with the traditional method, the embodiment of the present application can greatly improve the detection efficiency, and because it is no longer a manual detection, it can also reduce the occurrence of errors caused by human subjective reasons.

[0023] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent from the description, or may be understood by practicing the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0025] Figure 1A circuit diagram of an operational amplifier detection circuit of a single-channel operational amplifier according to an embodiment of the present application;

[0026] Figure 2 A circuit diagram of an operational amplifier detection circuit of a dual operational amplifier according to an embodiment of the present application;

[0027] Figure 3 Flow chart of an operational amplifier detection method according to an embodiment of the present application.

[0028] Reference numerals:

[0029] Detection subcircuit 110 , switching unit 120 , and data acquisition unit 130 . DETAILED DESCRIPTION

[0030] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0031] In the description of this application, if there is a description of first, second, etc., it is only for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0032] In the description of the present application, it should be understood that the descriptions involving orientation, such as the orientation or positional relationship indicated as up, down, etc., are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0033] In the description of this application, it should be noted that, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meaning of the above terms in this application based on the specific content of the technical solution.

[0034] The technical solution of the present application will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described below are only part of the embodiments of the present application, not all of the embodiments.

[0035] See also Figure 3 As shown, Figure 3 This is a flow chart of an operational amplifier detection method provided by an embodiment of the present application. The operational amplifier detection method includes but is not limited to the following steps:

[0036] Acquire a plurality of threshold parameters corresponding to the plurality of operational amplifiers to be tested, wherein the plurality of threshold parameters are obtained by the operational amplifier detection circuit executing a threshold acquisition strategy on the plurality of initial operational amplifiers; the plurality of threshold parameters are used to indicate normal results of the normal operational amplifiers to be tested;

[0037] Control the switching unit 120 to poll and switch the connection state between the plurality of operational amplifiers to be tested and the data acquisition unit 130, and after each switching of the connection state, change the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the operational amplifier to be tested in the connection state, and obtain the sampling result of the ADC to be tested through the data acquisition unit 130;

[0038] Obtaining detection results of the plurality of operational amplifiers to be tested according to the plurality of threshold parameters and the plurality of ADC sampling results to be tested corresponding to the plurality of operational amplifiers to be tested;

[0039] The threshold acquisition strategy includes:

[0040] The control switching unit 120 polls and switches the connection state between the multiple initial operational amplifiers and the data acquisition unit 130. After each connection state is switched, the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connection state is changed, and the initial ADC sampling result is obtained through the data acquisition unit 130.

[0041] A plurality of threshold parameters are obtained according to a plurality of initial ADC sampling results.

[0042] In order to better describe the operational amplifier detection method of the embodiment of the present application, a brief description of the operational amplifier detection circuit to be applied is given here. Figure 1 As shown, the operational amplifier detection circuit includes a control unit and multiple detection sub-circuits 110, a switching unit 120, and a data acquisition unit 130 that are all electrically connected to the control unit; the multiple detection sub-circuits 110 are used to connect to multiple operational amplifiers to be tested or multiple initial operational amplifiers, and each detection sub-circuit 110 is used to change the resistance connection state of the positive input terminal and the negative input terminal of the connected operational amplifier to be tested or the initial operational amplifier; the switching unit 120 is used to switch the connection state between the output terminals of the multiple operational amplifiers to be tested or the multiple initial operational amplifiers and the data acquisition unit 130, and the data acquisition unit 130 is used to perform ADC sampling; the operational amplifiers to be tested and the initial operational amplifiers are of the same model.

[0043] The operational amplifier detection method of the embodiment of the present application is described below based on the above-mentioned operational amplifier detection circuit.

[0044] Before testing the operational amplifier to be tested, the controller first needs to obtain multiple threshold parameters required for threshold comparison. The threshold parameters can be obtained based on the above operational amplifier detection circuit, and the specific process is as follows.

[0045] First, multiple initial operational amplifiers are connected to the operational amplifier detection circuit. The multiple initial operational amplifiers need to be of the same model.

[0046] After the connection between multiple initial operational amplifiers and the operational amplifier detection circuit is completed, the control switching unit 120 is connected to a connection channel so that an initial operational amplifier is connected to the data acquisition unit 130. After that, the initial operational amplifier is powered and the detection voltage is input so that the data acquisition unit 130 can collect the initial ADC sampling results related to the initial operational amplifier. After the collection of the initial operational amplifier is completed, the control switching unit 120 completes the channel switching, connects the next initial operational amplifier, completes the initial ADC sampling results of the next initial operational amplifier, and then continues to switch channels and continue to detect until the acquisition of the initial ADC sampling results of each initial operational amplifier is completed.

[0047] After obtaining the initial ADC sampling results of each initial operational amplifier, the threshold parameters can be determined according to the multiple initial ADC sampling results. It should be noted that, because multiple initial ADC sampling results are used, when there are individual or a small number of sampling results that are abnormal, they can be discovered in time, so that the situation where there are problems with some threshold parameters calculated and determined due to the failure of the initial operational amplifier can be avoided. When an abnormal initial operational amplifier is found, the initial operational amplifier can be directly removed from the operational amplifier detection circuit, and then a new initial operational amplifier can be replaced. After replacement, a round of detection is performed again, and the initial ADC sampling results of multiple initial operational amplifiers are obtained again. If there are still abnormal initial ADC sampling results, continue to replace, and continue to re-polling detection until the initial ADC sampling results of multiple initial operational amplifiers obtained are not abnormal.

[0048] In addition, the threshold parameters of various models of operational amplifiers can be pre-acquired and then stored in a local storage unit. When a certain model of operational amplifier needs to be tested, only the corresponding model information needs to be input into the controller, and the controller can obtain the corresponding multiple threshold parameters.

[0049] When it is necessary to test the operational amplifier to be tested, firstly, multiple operational amplifiers to be tested are connected to the operational amplifier detection circuit, and then the model information of the operational amplifier to be tested is used to obtain multiple corresponding threshold parameters, and then the detection process can be started.

[0050] During the detection process, the controller controls the switching unit 120 to connect a connection channel, so that an operational amplifier to be tested is connected to the data acquisition unit 130, and power is supplied to the operational amplifier to be tested. Then, a detection voltage is input to the operational amplifier to be tested through the detection subcircuit 110, so that the data acquisition unit 130 can collect the ADC sampling results to be tested related to the operational amplifier to be tested; after the acquisition of the operational amplifier to be tested is completed, the switching unit 120 is controlled to complete the channel switching, connect the next operational amplifier to be tested, complete the acquisition of the ADC sampling results to be tested of the next operational amplifier to be tested, and then continue to switch channels and continue testing until the acquisition of the ADC sampling results to be tested of each operational amplifier to be tested is completed.

[0051] After obtaining the ADC sampling results of all operational amplifiers to be tested, multiple parameters to be tested corresponding to each operational amplifier to be tested can be determined according to the ADC sampling results to be tested of each operational amplifier to be tested, and then multiple parameters to be tested can be compared with multiple threshold parameters to determine whether each operational amplifier to be tested has an abnormality. Information indication can be given to the operational amplifier with the abnormality.

[0052] In addition, in the process of comparing the multiple parameters to be measured with the multiple threshold parameters, a preset proportional coefficient can be added, and each threshold parameter is first multiplied by the preset proportional coefficient, and then the multiple parameters to be measured are compared with the multiple threshold parameters after the multiplication.

[0053] In addition, for each model of operational amplifier, one threshold parameter can be selected from a plurality of pre-acquired threshold parameters and written into the controller, and subsequently, only this threshold parameter needs to be compared to complete the detection of the operational amplifier to be tested.

[0054] The operational amplifier detection method of the embodiment of the present application can simultaneously connect multiple operational amplifiers to be tested through the operational amplifier detection circuit, and can realize the patrol switching of multiple operational amplifiers to be tested through the switching unit 120, and then obtain the ADC sampling result to be tested through the data acquisition unit 130, and finally, the quality of the operational amplifier to be tested can be detected based on the threshold parameter of the ADC sampling result to be tested. Compared with the traditional method, the embodiment of the present application can greatly improve the detection efficiency, and because it is no longer a manual detection, it can also reduce the occurrence of errors caused by human subjective reasons.

[0055] In some embodiments, changing the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the operational amplifier to be tested in a connected state, and acquiring the sampling result of the ADC to be tested through the data acquisition unit 130 includes:

[0056] Control the first switch to be closed and the second switch to be closed, and obtain the first voltage sampling result at both ends of the fifth resistor, the second voltage sampling result at both ends of the sixth resistor, and the third voltage sampling result at the output end of the operational amplifier to be tested through the data acquisition unit 130;

[0057] Control the first switch to be closed and the second switch to be opened, and obtain a fourth voltage sampling result of the output terminal of the operational amplifier to be tested through the data acquisition unit 130;

[0058] The first switch is controlled to be opened and the second switch is controlled to be closed, and the fifth voltage sampling result of the output terminal of the operational amplifier to be tested is obtained through the data acquisition unit 130; the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result are recorded as the ADC sampling results to be tested.

[0059] refer to Figure 1 In order to better describe the method in the embodiment, the detection subcircuit 110 involved is briefly described here. The detection subcircuit 110 includes a first resistor R1, a second resistor R3, a third resistor R4, a fourth resistor R2, a fifth resistor R5, a sixth resistor R6, a first switch S1, and a second switch S2; one end of the first resistor R1 is used as a test input end, and a second resistor R3 is connected in series between the other end of the first resistor R1 and the negative input end of the operational amplifier U1 to be tested, the third resistor R3 is connected in series between the test input end and the positive input end of the operational amplifier U1 to be tested, the fourth resistor R2 is connected in series between one end of the first resistor R1 and the output end of the operational amplifier U1 to be tested, the fifth resistor R5 is used to connect the positive power supply voltage to the positive power supply voltage end of the operational amplifier U1 to be tested, and the sixth resistor R6 is used to connect the negative power supply voltage to the negative power supply voltage end of the operational amplifier U1 to be tested; the first switch S1 is used to bypass the second resistor R3, and the second switch S2 is used to bypass the third resistor R4.

[0060] Based on the above sub-circuit, this embodiment is further described below.

[0061] First, the first switch S1 is controlled to be closed and the second switch S2 is controlled to be closed. At this time, the current of the positive power supply voltage terminal V+ generates a voltage drop through the fifth resistor R5, and the voltage drop is amplified by the data acquisition unit 130 to obtain the first voltage sampling result V_IQ+, and the amplification gain is G0; then the first static current parameter to be measured can be inferred, wherein the first static current parameter to be measured IQ+=V_IQ+ / (G0*R5).

[0062] The current at the negative power supply voltage terminal V- generates a voltage drop through the sixth resistor R6, and the voltage drop data acquisition unit 130 amplifies the second voltage sampling result V_IQ-, and the amplification gain is G2; then the second static current parameter to be measured can be inferred, and the second static current parameter to be measured IQ-=V_IQ- / (G2*R6).

[0063] Because the first switch S1 is closed and the second switch S2 is closed, the second resistor R3 and the third resistor R4 are short-circuited, and the operational amplifier U1 to be tested amplifies the operational amplifier offset voltage parameter to be tested Vos, and the amplification factor is -(R1+R2) / R1, and then it is amplified again by the data acquisition unit 130 to obtain the third voltage acquisition result VOUT0, and the amplification gain is G1, thereby it can be inferred that the operational amplifier offset voltage parameter to be tested is obtained, and the operational amplifier offset voltage parameter to be tested Vos=-VOUT0*R1 / (R1+R2) / G1.

[0064] Afterwards, the first switch S1 is controlled to be closed and the second switch S2 is opened, the second resistor R3 is short-circuited, and the first output current parameter to be measured Ib+ flows through the third resistor R4, generating an additional offset voltage Vos1, which is amplified together with the operational amplifier offset voltage parameter to be measured Vos, and the data acquisition unit 130 outputs the fourth voltage sampling result VOUT1, and then the first output current parameter to be measured can be calculated, the first output current parameter to be measured Ib+=VOUT0-VOUT1)*R1 / (R1+R2) / G1 / R4.

[0065] Finally, the first switch S1 is controlled to be opened and the second switch S2 is controlled to be closed, the third resistor R4 is short-circuited, and the second output current parameter to be measured Ib+ flows through the second resistor R3, generating an additional offset voltage Vos1, which is amplified together with the operational amplifier offset voltage parameter to be measured Vos, and the data acquisition unit 130 outputs the fifth voltage sampling result VOUT1, and then the second output current parameter to be measured can be calculated, the second output current parameter to be measured Ib-=VOUT0-VOUT1)*R1 / (R1+R2) / G1 / R3.

[0066] In some embodiments, controlling the first switch to be closed and the second switch to be closed, obtaining the first voltage sampling result at both ends of the fifth resistor, the second voltage sampling result at both ends of the sixth resistor, and the third voltage sampling result at the output end of the operational amplifier to be tested through the data acquisition unit 130, includes:

[0067] Controlling the first switch to be closed, the second switch to be closed, the third switch to be closed, and the fourth switch to be closed;

[0068] Collecting a first voltage sampling result through a first detection operational amplifier;

[0069] Collecting a second voltage sampling result through a second detection operational amplifier;

[0070] The third voltage sampling result is collected by the third detection operational amplifier.

[0071] refer to Figure 1 In order to better explain the content of this embodiment, the data acquisition unit 130 is further described here. The data acquisition unit 130 includes a first detection amplifier U4, a second detection amplifier U6 and a third detection amplifier U2. The positive input terminal and the negative input terminal of the first detection amplifier U4 are connected to the two ends of the fifth resistor R5 through the third switch S3, the second detection amplifier U6 is connected to the two ends of the sixth resistor R6 through the fourth switch S4, and the third detection amplifier U2 is connected to the output terminal of the operational amplifier U1 to be tested through the switching unit 120.

[0072] In this embodiment, the controller can collect signals from different loops of a transport amplifier U1 to be tested through different operational amplifiers. Among them, the third detection operational amplifier U2 connected to the output end of the operational amplifier U1 to be tested can be a programmable amplifier, and the gain G1 of the programmable amplifier can be set through the amplification gain adjustment ports GPIO1 and GPIO2 of the programmable amplifier, which can solve the problem that when there is a difference in the order of magnitude between some parameters, all cannot be accurately detected.

[0073] By controlling the first switch S1 to be closed, the second switch S2 to be closed, the third switch S3 to be closed, and the fourth switch S4 to be closed, the loop between the fifth resistor R5 and the first detection amplifier U4 can be connected, the sixth resistor R6 and the second detection amplifier U6 can be connected, and the second resistor R3 and the third resistor R4 can be bypassed, thereby realizing the detection of the first voltage sampling result, the second sampling result, and the third sampling result.

[0074] In some embodiments, controlling the first switch to be closed and the second switch to be opened, and obtaining the fourth voltage sampling result of the output terminal of the operational amplifier to be tested through the data acquisition unit 130, includes:

[0075] Control the first switch to be closed, the second switch to be opened, the third switch to be opened, and the fourth switch to be opened;

[0076] The fourth voltage sampling result is collected by the third detection operational amplifier.

[0077] refer to Figure 1 , control the first switch S1 to close, the second switch S2 to open, the third switch S3 to open, and the fourth switch S4 to open, so that the loop between the fifth resistor R5 and the first detection amplifier U4 can be disconnected, the loop between the sixth resistor R6 and the second detection amplifier U6 can be disconnected, the second resistor R3 can be bypassed, and the third resistor R4 can be connected to the loop to realize the detection of the fourth voltage sampling result.

[0078] In some embodiments, controlling the first switch to be opened and the second switch to be closed, and obtaining the fifth voltage sampling result of the output terminal of the operational amplifier to be tested through the data acquisition unit 130, includes:

[0079] Control the first switch to be opened, the second switch to be closed, the third switch to be opened, and the fourth switch to be opened;

[0080] The fifth voltage sampling result is collected by the third detection operational amplifier.

[0081] refer to Figure 1 , control the first switch S1 to be opened, the second switch S2 to be closed, the third switch S3 to be opened, and the fourth switch S4 to be opened, so that the loop between the fifth resistor R5 and the first detection amplifier U4 can be disconnected, the sixth resistor R6 and the second detection amplifier U2 can be disconnected, the second resistor R3 can be connected to the loop, and the third resistor R4 can be bypassed, so as to realize the detection of the fifth voltage sampling result.

[0082] In some embodiments, the detection result of each operational amplifier to be tested is obtained by the following steps:

[0083] Determine a plurality of parameters to be measured corresponding one-to-one to a plurality of threshold parameters according to the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result;

[0084] Multiple parameters to be tested and multiple threshold parameters are compared one by one to obtain a detection result.

[0085] The multiple parameters to be measured include a current mean value parameter to be measured, a current difference value parameter to be measured, a first quiescent current parameter to be measured, a second quiescent current parameter to be measured, an operational amplifier offset voltage parameter to be measured, a first output current parameter to be measured, and a second output current parameter to be measured. The specific number and amount of the multiple parameters to be measured can be adaptively increased according to actual needs, and are not specifically limited in this embodiment. The parameters such as the current mean value parameter to be measured, the current difference parameter to be measured, the first quiescent current parameter to be measured, the second quiescent current parameter to be measured, the operational amplifier offset voltage parameter to be measured, the first output current parameter to be measured, and the second output current parameter to be measured have been described in detail above, and will not be repeated here.

[0086] After obtaining multiple parameters to be measured, it is only necessary to compare the multiple parameters to be measured with multiple threshold parameters one by one to obtain the detection result. The multiple threshold parameters include a current mean value parameter to be measured, a current difference parameter to be measured, a first quiescent current parameter to be measured, a second quiescent current parameter to be measured, an operational amplifier offset voltage parameter to be measured, a first output current parameter to be measured, and a second output current parameter to be measured corresponding to the multiple parameters to be measured.

[0087] After the test results are obtained, the results can be indicated through a screen display or through a light indication, so that the operator can understand the test results.

[0088] In some embodiments, according to the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result, a plurality of parameters to be measured corresponding to the plurality of threshold parameters are determined one by one, including:

[0089] Determine a first static current parameter to be measured using the first voltage sampling result and the fifth resistor;

[0090] Determine a second static current parameter to be measured using the second voltage sampling result and the sixth resistor;

[0091] Determine the operational amplifier offset voltage parameter to be measured using the third voltage sampling result and the first resistor and the fourth resistor;

[0092] Determine the first output current parameter to be measured by using the fourth voltage sampling result, the third voltage sampling result, the first resistor, the fourth resistor and the third resistor;

[0093] Determine a second output current parameter to be measured by using the fifth voltage sampling result, the third voltage sampling result, the first resistor, the fourth resistor, and the second resistor;

[0094] The current mean measured parameter and the current difference measured parameter are determined according to the first output current measured parameter and the second output current measured parameter. The current mean measured parameter, the current difference measured parameter, the first quiescent current measured parameter, the second quiescent current measured parameter, the operational amplifier offset voltage measured parameter, the first output current measured parameter and the second output current measured parameter are recorded as multiple measured parameters.

[0095] The specific origins of the above-mentioned multiple parameters to be measured have been introduced in the previous section and will not be repeated here.

[0096] In some embodiments, changing the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connected state, and acquiring the initial ADC sampling result through the data acquisition unit 130 includes:

[0097] Control the first switch to be closed and the second switch to be closed, and obtain the first voltage initial sampling result across the fifth resistor, the second voltage initial sampling result across the sixth resistor, and the third voltage initial sampling result at the output end of the initial operational amplifier through the data acquisition unit 130;

[0098] Control the first switch to be closed and the second switch to be opened, and obtain the initial sampling result of the fourth voltage at the output end of the initial operational amplifier through the data acquisition unit 130;

[0099] The first switch is controlled to be opened and the second switch is controlled to be closed, and the fifth voltage initial sampling result of the output terminal of the initial operational amplifier is obtained through the data acquisition unit 130; the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result are recorded as the ADC sampling results to be tested.

[0100] The circuit used to obtain the initial ADC sampling result is the same as the circuit used to obtain the ADC sampling result to be tested, and will not be described in detail here.

[0101] refer to Figure 1 The first voltage initial sampling result, the second voltage initial sampling result, the third voltage initial sampling result, the fourth voltage initial sampling result, and the fifth voltage initial sampling result are obtained in the same way as the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result, and the fifth voltage sampling result. Therefore, they can be obtained in the same way.

[0102] In some embodiments, a plurality of threshold parameters corresponding to the operational amplifier to be tested are obtained by the following steps:

[0103] A plurality of threshold parameters corresponding one-to-one to the plurality of parameters to be measured are determined according to the first voltage initial sampling result, the second voltage initial sampling result, the third voltage initial sampling result, the fourth voltage initial sampling result and the fifth voltage initial sampling result.

[0104] Specifically, according to the first voltage initial sampling result, the second voltage initial sampling result, the third voltage initial sampling result, the fourth voltage initial sampling result and the fifth voltage initial sampling result, a plurality of threshold parameters corresponding to the plurality of parameters to be measured are determined one by one, including:

[0105] Determine a first static current threshold parameter using the first voltage initial sampling result and the fifth resistor;

[0106] Determine a second static current threshold parameter using the second voltage initial sampling result and the sixth resistor;

[0107] Determine an operational amplifier offset voltage threshold parameter using the initial sampling result of the third voltage and the first resistor and the fourth resistor;

[0108] Determine a first output current threshold parameter using a fourth voltage initial sampling result, a third voltage initial sampling result, a first resistor, a fourth resistor, and a third resistor;

[0109] Determine a second output current threshold parameter using the fifth voltage initial sampling result, the third voltage initial sampling result, the first resistor, the fourth resistor, and the second resistor;

[0110] A current mean threshold parameter and a current difference threshold parameter are determined according to the first output current threshold parameter and the second output current threshold parameter. The current mean threshold parameter, the current difference threshold parameter, the first quiescent current threshold parameter, the second quiescent current threshold parameter, the operational amplifier offset voltage threshold parameter, the first output current threshold parameter and the second output current threshold parameter are recorded as multiple threshold parameters.

[0111] refer to Figure 1 , multiple threshold parameters correspond one-to-one to multiple parameters to be measured, multiple voltage initial sampling results correspond to multiple voltage sampling results, and the method for obtaining multiple threshold parameters can be the same as the method for obtaining multiple parameters to be measured, which will not be repeated here.

[0112] It should be noted that the threshold parameters calculated for a single operational amplifier may have certain errors due to problems with the operational amplifier itself. Therefore, in order to avoid abnormal threshold parameters, the threshold parameters of each initial operational amplifier in the operational amplifier detection circuit will be calculated. After the calculation, it is determined whether there are abnormal threshold parameters, and the corresponding initial operational amplifier is replaced, and the threshold parameters are recalculated until all normal threshold parameters are obtained. Then, each threshold parameter is linearly fitted to obtain the final threshold parameter. For example, for a model of operational amplifier, N initial operational amplifiers are connected to the operational amplifier detection circuit, then there can be N preliminarily determined first static current threshold parameters, and then the N preliminarily determined first static current threshold parameters are linearly fitted to obtain the final first static current threshold parameter.

[0113] Among them, the abnormal threshold parameters mentioned above are abnormal, which may be that the difference between the threshold parameter calculated and determined by a certain operational amplifier and the threshold parameter corresponding to each operational amplifier is greater than the preset error tolerance threshold, the difference may be the largest between the difference and the threshold parameters corresponding to the remaining operational amplifiers and each operational amplifier, and is greater than the preset error tolerance multiple, or the threshold parameter offsets the fitting straight line after linear fitting too far and exceeds the preset error tolerance distance.

[0114] In some embodiments, the switching unit 120 may directly use a multi-way gate switch, or a multi-way gate chip may be used according to the requirements.

[0115] In some embodiments, the operational amplifier to be tested may be a dual-channel operational amplifier, in which case only adaptive adjustments need to be made to the circuit. The adjustment results can be referred to Figure 2 , Figure 2 In the example, U1A and U1B are dual-channel operational amplifiers, and U1A corresponds to Figure 1To improve the detection result of the single-channel op amp in, it is only necessary to add a programmable amplifier and a multi-way selection switch corresponding to U1B. Among them, the programmable operational amplifier corresponding to the output ends of U1A and U1B can also directly use a dual-channel op amp.

[0116] The embodiment of the present application further provides an operational amplifier detection device, the operational amplifier detection device comprising:

[0117] A threshold acquisition unit is used to acquire multiple threshold parameters corresponding to multiple operational amplifiers to be tested, wherein the multiple threshold parameters are obtained by the operational amplifier detection circuit executing a threshold acquisition strategy on multiple initial operational amplifiers; the multiple threshold parameters are used to indicate normal results of normal operational amplifiers to be tested;

[0118] A data acquisition unit, used to control the switching unit 120 to poll and switch the connection state between the plurality of operational amplifiers to be tested and the data acquisition unit 130, and after each switching of the connection state, change the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the operational amplifier to be tested in the connection state, and obtain the sampling result of the ADC to be tested through the data acquisition unit 130;

[0119] A result output unit, used to obtain detection results of multiple operational amplifiers to be tested according to multiple threshold parameters and multiple ADC sampling results to be tested corresponding to the multiple operational amplifiers to be tested;

[0120] The threshold acquisition strategy includes:

[0121] The control switching unit 120 polls and switches the connection state between the multiple initial operational amplifiers and the data acquisition unit 130. After each connection state is switched, the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connection state is changed, and the initial ADC sampling result is obtained through the data acquisition unit 130.

[0122] A plurality of threshold parameters are obtained according to a plurality of initial ADC sampling results.

[0123] In order to better describe the operational amplifier detection device of the embodiment of the present application, a brief description of the operational amplifier detection circuit to be applied is given here. Figure 1As shown, the operational amplifier detection circuit includes a control unit and multiple detection sub-circuits 110, a switching unit 120, and a data acquisition unit 130 that are all electrically connected to the control unit; the multiple detection sub-circuits 110 are used to connect to multiple operational amplifiers to be tested or multiple initial operational amplifiers, and each detection sub-circuit 110 is used to change the resistance connection state of the positive input terminal and the negative input terminal of the connected operational amplifier to be tested or the initial operational amplifier; the switching unit 120 is used to switch the connection state between the output terminals of the multiple operational amplifiers to be tested or the multiple initial operational amplifiers and the data acquisition unit 130, and the data acquisition unit 130 is used to perform ADC sampling; the operational amplifiers to be tested and the initial operational amplifiers are of the same model.

[0124] The operational amplifier detection device of the embodiment of the present application is described below based on the above-mentioned operational amplifier detection circuit.

[0125] Before testing the operational amplifier to be tested, the controller first needs to obtain multiple threshold parameters required for threshold comparison. The threshold parameters can be obtained based on the above operational amplifier detection circuit, and the specific process is as follows.

[0126] First, multiple initial operational amplifiers are connected to the operational amplifier detection circuit. The multiple initial operational amplifiers need to be of the same model.

[0127] After the connection between multiple initial operational amplifiers and the operational amplifier detection circuit is completed, the control switching unit 120 is connected to a connection channel so that an initial operational amplifier is connected to the data acquisition unit 130. After that, the initial operational amplifier is powered and the detection voltage is input so that the data acquisition unit 130 can collect the initial ADC sampling results related to the initial operational amplifier. After the collection of the initial operational amplifier is completed, the control switching unit 120 completes the channel switching, connects the next initial operational amplifier, completes the initial ADC sampling results of the next initial operational amplifier, and then continues to switch channels and continue to detect until the acquisition of the initial ADC sampling results of each initial operational amplifier is completed.

[0128] After obtaining the initial ADC sampling results of each initial operational amplifier, the threshold parameters can be determined according to the multiple initial ADC sampling results. It should be noted that, because multiple initial ADC sampling results are used, when there are individual or a small number of sampling results that are abnormal, they can be discovered in time, so that the situation where there are problems with some threshold parameters calculated and determined due to the failure of the initial operational amplifier can be avoided. When an abnormal initial operational amplifier is found, the initial operational amplifier can be directly removed from the operational amplifier detection circuit, and then a new initial operational amplifier can be replaced. After replacement, a round of detection is performed again, and the initial ADC sampling results of multiple initial operational amplifiers are obtained again. If there are still abnormal initial ADC sampling results, continue to replace, and continue to re-polling detection until the initial ADC sampling results of multiple initial operational amplifiers obtained are not abnormal.

[0129] In addition, the threshold parameters of various models of operational amplifiers can be pre-acquired and then stored in a local storage unit. When a certain model of operational amplifier needs to be tested, only the corresponding model information needs to be input into the controller, and the controller can obtain the corresponding multiple threshold parameters.

[0130] When it is necessary to test the operational amplifier to be tested, firstly, multiple operational amplifiers to be tested are connected to the operational amplifier detection circuit, and then the model information of the operational amplifier to be tested is used to obtain multiple corresponding threshold parameters, and then the detection process can be started.

[0131] During the detection process, the controller controls the switching unit 120 to connect a connection channel, so that an operational amplifier to be tested is connected to the data acquisition unit 130, and power is supplied to the operational amplifier to be tested. Then, a detection voltage is input to the operational amplifier to be tested through the detection subcircuit 110, so that the data acquisition unit 130 can collect the ADC sampling results to be tested related to the operational amplifier to be tested; after the acquisition of the operational amplifier to be tested is completed, the switching unit 120 is controlled to complete the channel switching, connect the next operational amplifier to be tested, complete the acquisition of the ADC sampling results to be tested of the next operational amplifier to be tested, and then continue to switch channels and continue testing until the acquisition of the ADC sampling results to be tested of each operational amplifier to be tested is completed.

[0132] After obtaining the ADC sampling results of all operational amplifiers to be tested, multiple parameters to be tested corresponding to each operational amplifier to be tested can be determined according to the ADC sampling results to be tested of each operational amplifier to be tested, and then multiple parameters to be tested can be compared with multiple threshold parameters to determine whether each operational amplifier to be tested has an abnormality. Information indication can be given to the operational amplifier with the abnormality.

[0133] In addition, in the process of comparing the multiple parameters to be measured with the multiple threshold parameters, a preset proportional coefficient can be added, and each threshold parameter is first multiplied by the preset proportional coefficient, and then the multiple parameters to be measured are compared with the multiple threshold parameters after the multiplication.

[0134] In addition, for each model of operational amplifier, one threshold parameter can be selected from a plurality of pre-acquired threshold parameters and written into the controller, and subsequently, only this threshold parameter needs to be compared to complete the detection of the operational amplifier to be tested.

[0135] The operational amplifier detection device of the embodiment of the present application can simultaneously connect multiple operational amplifiers to be tested through the operational amplifier detection circuit, and can realize the patrol switching of multiple operational amplifiers to be tested through the switching unit 120, and then obtain the ADC sampling result to be tested through the data acquisition unit 130, and finally, the quality of the operational amplifier to be tested can be detected based on the threshold parameter of the ADC sampling result to be tested. Compared with the traditional method, the embodiment of the present application can greatly improve the detection efficiency, and because it is no longer a manual detection, it can also reduce the occurrence of errors caused by human subjective reasons.

[0136] In addition, an embodiment of the present application also provides a computer-readable storage medium, which stores computer-executable instructions, and the computer-executable instructions are executed by a processor or a control module, so that the above-mentioned processor can execute the operational amplifier detection method in the above-mentioned embodiment, for example, execute the method described above.

[0137] It will be appreciated by those skilled in the art that all or some of the steps and systems in the disclosed methods above may be implemented as software, firmware, hardware and appropriate combinations thereof. Some physical components or all physical components may be implemented as software executed by a processor, such as a central processing unit, a digital signal processor or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on a computer-readable medium, which may include a computer storage medium or a non-transitory medium and a communication medium or a temporary medium. As known to those skilled in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information such as computer-readable instructions, data structures, program modules or other data. Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disk DVD or other optical disk storage, magnetic cassettes, magnetic tapes, disk storage or other magnetic storage devices, or any other medium that may be used to store desired information and may be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media typically embodies computer readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media.

[0138] The embodiments of the present application are described in detail above in conjunction with the accompanying drawings, but the present application is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the relevant technical field without departing from the purpose of the present application.

Claims

1. An operational amplifier detection method, characterized in that: Applied to an operational amplifier detection circuit, the operational amplifier detection circuit includes a control unit and a plurality of detection subcircuits, a switching unit, and a data acquisition unit, all of which are electrically connected to the control unit; the plurality of detection subcircuits are used to be connected to a plurality of operational amplifiers to be tested or a plurality of initial operational amplifiers, and each of the detection subcircuits is used to change the resistance connection state of the positive input terminal and the negative input terminal of the connected operational amplifier to be tested or the initial operational amplifier; the switching unit is used to switch the connection state between the output terminals of the plurality of operational amplifiers to be tested or the plurality of initial operational amplifiers and the data acquisition unit, and the data acquisition unit is used to perform ADC sampling; The operational amplifier to be tested and the initial operational amplifier are of the same model; The operational amplifier detection method comprises: Acquire a plurality of threshold parameters corresponding to the plurality of operational amplifiers to be tested, wherein the plurality of threshold parameters are obtained by the operational amplifier detection circuit executing a threshold acquisition strategy on the plurality of initial operational amplifiers; the plurality of threshold parameters are used to indicate normal results of the normal operational amplifiers to be tested; Control the switching unit to poll and switch the connection status between the plurality of operational amplifiers to be tested and the data acquisition unit, and after each switching of the connection status, change the connection status of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the operational amplifier to be tested in the connection status, and obtain the sampling result of the ADC to be tested through the data acquisition unit; Obtaining detection results of the plurality of operational amplifiers to be tested according to the plurality of threshold parameters and the plurality of ADC sampling results to be tested corresponding to the plurality of operational amplifiers to be tested; The threshold acquisition strategy includes: Control the switching unit to poll and switch the connection states between the multiple initial operational amplifiers and the data acquisition unit, and after each switching of the connection states, change the connection states of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connection state, and obtain the initial ADC sampling result through the data acquisition unit; A plurality of threshold parameters are obtained according to the plurality of initial ADC sampling results.

2. The operational amplifier detection method according to claim 1, characterized in that: The detection subcircuit includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a first switch, and a second switch; one end of the first resistor is used as a test input end, the second resistor is connected in series between the other end of the first resistor and the negative input end of the operational amplifier to be tested, the third resistor is connected in series between the test input end and the positive input end of the operational amplifier to be tested, the fourth resistor is connected in series between the one end of the first resistor and the output end of the operational amplifier to be tested, the fifth resistor is used to connect the positive power supply voltage to the positive power supply voltage end of the operational amplifier to be tested, and the sixth resistor is used to connect the negative power supply voltage to the negative power supply voltage end of the operational amplifier to be tested; the first switch is used to bypass the second resistor, and the second switch is used to bypass the third resistor; The step of changing the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the operational amplifier to be tested which is in a connected state, and acquiring the sampling result of the ADC to be tested through the data acquisition unit, comprises: Control the first switch to be closed and the second switch to be closed, and obtain, through the data acquisition unit, a first voltage sampling result at both ends of the fifth resistor, a second voltage sampling result at both ends of the sixth resistor, and a third voltage sampling result at the output end of the operational amplifier to be tested; Controlling the first switch to be closed and the second switch to be opened, and obtaining a fourth voltage sampling result of the output terminal of the operational amplifier to be tested through the data acquisition unit; The first switch is controlled to be opened and the second switch is controlled to be closed, and a fifth voltage sampling result of the output end of the operational amplifier to be tested is obtained through the data acquisition unit; the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result are recorded as the ADC sampling results to be tested.

3. The operational amplifier detection method according to claim 2, characterized in that: The data acquisition unit includes a first detection operational amplifier, a second detection operational amplifier and a third detection operational amplifier, the positive input terminal and the negative input terminal of the first detection operational amplifier are connected to the two ends of the fifth resistor through a third switch, the second detection operational amplifier is connected to the two ends of the sixth resistor through a fourth switch, and the third detection operational amplifier is connected to the output terminal of the operational amplifier to be tested through a switching unit; The controlling the first switch to be closed and the second switch to be closed, and acquiring, through the data acquisition unit, a first voltage sampling result at both ends of the fifth resistor, a second voltage sampling result at both ends of the sixth resistor, and a third voltage sampling result at the output end of the operational amplifier to be tested, comprises: Controlling the first switch to be closed, the second switch to be closed, the third switch to be closed, and the fourth switch to be closed; Collecting the first voltage sampling result by the first detection operational amplifier; Collecting the second voltage sampling result by the second detection operational amplifier; The third voltage sampling result is collected by the third detection operational amplifier.

4. The operational amplifier detection method according to claim 2, characterized in that: The detection result of each operational amplifier to be tested is obtained by the following steps: Determine a plurality of parameters to be measured corresponding one-to-one to the plurality of threshold parameters according to the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result; The plurality of parameters to be measured and the plurality of threshold parameters are compared one by one to obtain the detection result.

5. The operational amplifier detection method according to claim 4, characterized in that: The determining, according to the first voltage sampling result, the second voltage sampling result, the third voltage sampling result, the fourth voltage sampling result and the fifth voltage sampling result, a plurality of parameters to be measured corresponding one-to-one to the plurality of threshold parameters comprises: Determine a first static current parameter to be measured using the first voltage sampling result and the fifth resistor; Determine a second quiescent current parameter to be measured using the second voltage sampling result and the sixth resistor; Determine the operational amplifier offset voltage parameter to be measured by using the third voltage sampling result and the first resistor and the fourth resistor; Determine a first output current parameter to be measured by using the fourth voltage sampling result, the third voltage sampling result, the first resistor, the fourth resistor and the third resistor; Determine a second output current parameter to be measured by using the fifth voltage sampling result, the third voltage sampling result, the first resistor, the fourth resistor and the second resistor; A current mean value parameter to be measured and a current difference value parameter to be measured are determined according to the first output current parameter to be measured and the second output current parameter to be measured. The current mean value parameter to be measured, the current difference value parameter to be measured, the first quiescent current parameter to be measured, the second quiescent current parameter to be measured, the operational amplifier offset voltage parameter to be measured, the first output current parameter to be measured and the second output current parameter to be measured are recorded as the multiple parameters to be measured.

6. The operational amplifier detection method according to claim 4, characterized in that: The detection subcircuit includes a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a first switch, and a second switch; one end of the first resistor is used as a test input end, the second resistor is connected in series between the other end of the first resistor and the negative input end of the initial operational amplifier, the third resistor is connected in series between the test input end and the positive input end of the initial operational amplifier, the fourth resistor is connected in series between the one end of the first resistor and the output end of the initial operational amplifier, the fifth resistor is used to connect a positive power supply voltage to the positive power supply voltage end of the initial operational amplifier, and the sixth resistor is used to connect a negative power supply voltage to the negative power supply voltage end of the initial operational amplifier; the first switch is used to bypass the second resistor, and the second switch is used to bypass the third resistor; The step of changing the connection state of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connected state, and acquiring the initial ADC sampling result through the data acquisition unit, comprises: Control the first switch to be closed and the second switch to be closed, and obtain, through the data acquisition unit, a first voltage initial sampling result at both ends of the fifth resistor, a second voltage initial sampling result at both ends of the sixth resistor, and a third voltage initial sampling result at the output end of the initial operational amplifier; Controlling the first switch to be closed and the second switch to be opened, and obtaining an initial sampling result of a fourth voltage at the output end of the initial operational amplifier through the data acquisition unit; The first switch is controlled to be opened and the second switch is controlled to be closed, and an initial sampling result of a fifth voltage at the output end of the initial operational amplifier is obtained through the data acquisition unit; the first voltage initial sampling result, the second voltage initial sampling result, the third voltage initial sampling result, the fourth voltage initial sampling result and the fifth voltage initial sampling result are recorded as the initial ADC sampling result.

7. The operational amplifier detection method according to claim 6, characterized in that: The plurality of threshold parameters corresponding to the operational amplifier to be tested are obtained by the following steps: According to the first voltage initial sampling result, the second voltage initial sampling result, the third voltage initial sampling result, the fourth voltage initial sampling result and the fifth voltage initial sampling result, a plurality of threshold parameters corresponding one-to-one to the plurality of parameters to be measured are determined.

8. The operational amplifier detection method according to claim 7, characterized in that: The determining, according to the first voltage initial sampling result, the second voltage initial sampling result, the third voltage initial sampling result, the fourth voltage initial sampling result, and the fifth voltage initial sampling result, a plurality of threshold parameters corresponding one-to-one to the plurality of parameters to be measured comprises: Determine a first static current threshold parameter using the first voltage initial sampling result and the fifth resistor; Determine a second static current threshold parameter using the second voltage initial sampling result and the sixth resistor; Determine an operational amplifier offset voltage threshold parameter using the initial sampling result of the third voltage and the first resistor and the fourth resistor; Determine a first output current threshold parameter using the fourth voltage initial sampling result, the third voltage initial sampling result, the first resistor, the fourth resistor and the third resistor; Determine a second output current threshold parameter using the fifth voltage initial sampling result, the third voltage initial sampling result, the first resistor, the fourth resistor, and the second resistor; A current mean threshold parameter and a current difference threshold parameter are determined according to the first output current threshold parameter and the second output current threshold parameter. The current mean threshold parameter, the current difference threshold parameter, the first quiescent current threshold parameter, the second quiescent current threshold parameter, the op amp offset voltage threshold parameter, the first output current threshold parameter and the second output current threshold parameter are recorded as the multiple threshold parameters.

9. An operational amplifier detection device, characterized in that: Applied to an operational amplifier detection circuit, the operational amplifier detection circuit includes a control unit and a plurality of detection subcircuits, a switching unit, and a data acquisition unit, all of which are electrically connected to the control unit; the plurality of detection subcircuits are used to be connected to a plurality of operational amplifiers to be tested or a plurality of initial operational amplifiers, and each of the detection subcircuits is used to change the resistance connection state of the positive input terminal and the negative input terminal of the connected operational amplifier to be tested or the initial operational amplifier; the switching unit is used to switch the connection state between the output terminals of the plurality of operational amplifiers to be tested or the plurality of initial operational amplifiers and the data acquisition unit, and the data acquisition unit is used to perform ADC sampling; The operational amplifier to be tested and the initial operational amplifier are of the same model; The operational amplifier detection device comprises: A threshold acquisition unit, used to acquire a plurality of threshold parameters corresponding to the plurality of operational amplifiers to be tested, wherein the plurality of threshold parameters are obtained by the operational amplifier detection circuit executing a threshold acquisition strategy on the plurality of initial operational amplifiers; the plurality of threshold parameters are used to indicate normal results of the normal operational amplifiers to be tested; A data acquisition unit, used to control the switching unit to poll and switch the connection state between the plurality of operational amplifiers to be tested and the data acquisition unit, and after each switching of the connection state, change the connection state of the resistor connected in series with the positive input end and the resistor connected in series with the negative input end of the operational amplifier to be tested in the connection state, and obtain the sampling result of the ADC to be tested through the data acquisition unit; A result output unit, configured to obtain detection results of the plurality of operational amplifiers to be tested according to the plurality of threshold parameters and the plurality of ADC sampling results to be tested corresponding to the plurality of operational amplifiers to be tested; The threshold acquisition strategy includes: Control the switching unit to poll and switch the connection states between the multiple initial operational amplifiers and the data acquisition unit, and after each switching of the connection states, change the connection states of the resistor connected in series with the positive input terminal and the resistor connected in series with the negative input terminal of the initial operational amplifier in the connection state, and obtain the initial ADC sampling result through the data acquisition unit; A plurality of threshold parameters are obtained according to the plurality of initial ADC sampling results.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to enable a computer to execute the operational amplifier detection method according to any one of claims 1 to 8.

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