A signal line conduction sensitivity testing method, system, device and medium thereof

Abstract

The present invention provides a signal line conduction sensitivity test method, comprising the following steps: Step 1: Preliminary analysis of the sensitivity characteristics of the signal line under test, including the sensitivity range and sensitive points; Step 2: Determine the test configuration of the signal source and the test cable according to the characteristics of the signal line under test and the test requirements; Step 3: The test system sets the initial amplitude value of the signal source through a preset program and performs the test according to the preset frequency point. The present invention can clarify its approximate sensitivity range and possible sensitive points by performing a preliminary analysis of the sensitivity characteristics of the signal line under test, and then determine the test configuration according to the characteristics of the signal line under test and the test requirements, thereby avoiding excessive testing of non-sensitive areas, thereby significantly reducing the test time and cost, and by understanding the sensitive points, it helps to more accurately locate during the test process, improves the pertinence and efficiency of the test, and has the advantages of strong pertinence and high test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of measuring electrical variables, and in particular to a signal line conduction sensitivity testing method, system, equipment and medium thereof. Background Art

[0002] The conducted sensitivity of a signal line is a measure of the interference signal current or voltage on a power line, control line, or signal line. When these interference signals cause an undesired response or performance degradation in a device, the conducted sensitivity of the signal line needs to be tested and evaluated. Conducted sensitivity testing is part of electromagnetic compatibility testing to ensure that the device can work properly in an electromagnetic environment without being affected by external interference.

[0003] Conducted susceptibility testing simulates electromagnetic interference signals that may exist in the actual environment and applies them to the signal lines of the device. By observing and measuring the response and performance changes of the device when it is subjected to these interference signals, the sensitivity of the signal line to conducted interference can be evaluated.

[0004] In the prior art, during the automatic sensitivity test, the setting and adjustment method of the initial amplitude value cannot be adjusted arbitrarily based on the experience of the tester as in the manual test. The setting of the initial value in the automatic test must be carried out according to a set program plan, and the setting of the initial amplitude value of the signal source has a great influence on the test efficiency. Therefore, when testing the sensitivity of signal line conduction, the following technical problems will exist:

[0005] (1) Low test efficiency: If the initial value is set too high, the protection mechanism of the signal line will be directly triggered or the signal line will fail, so the test needs to be restarted, which will increase the test time. On the contrary, if the initial value is set too low, the test system needs to gradually increase the amplitude until the required sensitivity level is reached, which will cause the test process to become longer and the test efficiency to be lower.

[0006] (2) Insufficient precision: During automatic testing, the signal amplitude is usually increased step by step according to a fixed step size. This makes it impossible to accurately find the sensitivity threshold, thus affecting the accuracy of the signal line conduction sensitivity test results.

[0007] To this end, a signal line conduction sensitivity testing method, system, equipment and medium thereof are proposed. Summary of the invention

[0008] In view of this, the present invention provides a signal line conduction sensitivity testing method, system, device and medium thereof to solve or alleviate the technical problems existing in the prior art and at least provide a beneficial option.

[0009] The technical solution of the embodiment of the present invention is implemented as follows: A signal line conduction sensitivity testing method comprises the following steps:

[0010] Step 1: Preliminary analysis of the sensitivity characteristics of the signal line under test, including sensitivity range and sensitive points;

[0011] Step 2: Determine the test configuration of the signal source and test cable according to the characteristics of the signal line under test and the test requirements;

[0012] Step 3: The test system sets the initial amplitude value of the signal source through a preset program and performs the test at the preset frequency point;

[0013] Step 4: The test system automatically adjusts the amplitude of the signal source according to the program scheme until the preset sensitivity threshold is reached;

[0014] Step 5: Record the signal source amplitude, device response and abnormal phenomena at each frequency point;

[0015] Step 6: Collect test data and analyze it to generate a detailed test report;

[0016] Step 7: Analyze the conduction sensitivity characteristics of the signal line at different frequencies based on the test results. The test is completed.

[0017] Further preferably, in step 1, the method for analyzing the sensitivity characteristics of the signal line comprises the following steps:

[0018] S1: Analyze the interface type and signal transmission mode of the signal line under test, and determine the connection position and path of the signal line in the device;

[0019] S2: Analyze the circuit part to which the signal line is connected, clarify the amplification and filtering process of the circuit part, and the existing interference sources;

[0020] S3: Analyze the transmission signal type, frequency range, amplitude range and modulation method of the signal line;

[0021] S4: Evaluate the interference sources present in the test environment, including electromagnetic radiation, power supply noise, and mechanical vibration;

[0022] S5: Improve the results of the preliminary analysis and formulate subsequent test plans and methods based on the structure.

[0023] Further preferably, in S4, an oscilloscope or a spectrum analyzer is used to perform a preliminary test on the signal line to obtain a preliminary test result.

[0024] Further preferably, in step three, the initial amplitude value of the signal source is obtained according to the test frequency range, step size and sensitivity index of the signal line.

[0025] Further preferably, in step 4, the method for automatically adjusting the amplitude of the signal source comprises the following steps:

[0026] D1: Collect sensitivity test data of the signal line under different conditions, including signal inputs of different frequencies, amplitudes and durations, and record the response of the signal line;

[0027] D2: Extract features related to the sensitivity of the signal line from the data, including the amplitude, frequency, phase and response time of the signal;

[0028] D3: Use the extracted features and corresponding sensitivity data to train the ANN intelligent algorithm model;

[0029] D4: Predict the sensitivity of the signal line through the ANN intelligent algorithm model and find the precise threshold of the signal line sensitivity.

[0030] Further preferably, in step six, the test report includes the test results, sensitivity curves and existing problems at each frequency point.

[0031] Further preferably, in step seven, the ANN intelligent algorithm model is optimized according to the results of the automatic test.

[0032] A signal line conduction sensitivity test system includes a signal source module, a test connector, a signal line, a data analysis module, a monitoring module, a recording module, an acquisition module and a test control module;

[0033] The signal sending end of the signal source module is connected with the signal receiving end of the test connector, the signal sending end of the test connector is connected with the signal receiving end of the data analysis module, the signal sending end of the data analysis module is connected with the signal receiving end of the monitoring module, the signal sending end of the monitoring module is connected with the signal receiving end of the recording module, the signal sending end of the recording module is connected with the signal receiving end of the acquisition module, the signal sending end of the acquisition module is connected with the signal receiving end of the test control module, the signal sending end of the test control module is connected with the signal receiving end of the signal source module, and the signal line is connected with the test connector;

[0034] The signal source module is used to generate a signal with a specific frequency and amplitude, and to perform a conduction sensitivity test on the signal line. The signal source module is also used to accurately control the frequency and amplitude of the signal;

[0035] The test control module is used to control the entire test process and coordinate the work of each module according to the preset test configuration and program scheme, including starting the test and setting the signal source parameters;

[0036] The monitoring module and the recording module are used to monitor the response of the signal line during the test in real time and record the test data;

[0037] The data analysis module is used to process and analyze the test data of the signal line and generate a detailed test report. The data analysis module is also used to automatically interpret and evaluate the test results according to preset analysis algorithms and indicators, and provide comprehensive information about the conduction sensitivity of the equipment.

[0038] A signal line conduction sensitivity testing device, the device comprising:

[0039] at least one processor; and,

[0040] a memory communicatively connected to the at least one processor; wherein,

[0041] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the signal line conduction sensitivity testing method described above.

[0042] A computer storage medium, the computer readable storage medium stores computer instructions, the computer instructions are used to enable a computer to execute the above-mentioned signal line conduction sensitivity testing method.

[0043] The embodiment of the present invention has the following advantages due to the adoption of the above technical solution:

[0044] 1. The present invention can make a preliminary analysis of the sensitivity characteristics of the signal line under test to clarify its approximate sensitivity range and possible sensitive points, and then determine the test configuration according to the characteristics of the signal line under test and the test requirements, thereby avoiding excessive testing of non-sensitive areas, thereby significantly reducing the test time and cost. Moreover, by understanding the sensitive points, it is helpful to locate more accurately during the test process, thereby improving the pertinence and efficiency of the test, and has the advantages of strong pertinence and high test efficiency.

[0045] 2. By collecting test data and establishing an ANN intelligent algorithm model, the present invention can enable the system to predict the sensitivity of the signal line, and then find the precise threshold of the signal line sensitivity, avoiding errors caused by manual adjustment, and ensuring that the test signal is always close to the sensitive point. Compared with the prior art method of gradually increasing the signal amplitude according to a fixed step size, the sensitive point of the signal line can be located more accurately, thereby ensuring the accuracy of the signal line conduction sensitivity test results.

[0046] The above summary is for illustrative purposes only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments and features described above, further aspects, embodiments and features of the present invention will be readily apparent by reference to the accompanying drawings and the following detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0048] Figure 1 A flow chart of the steps of a signal line conduction sensitivity testing method of the present invention;

[0049] Figure 2 A flowchart of the steps of the method for analyzing the sensitivity characteristics of a signal line according to the present invention;

[0050] Figure 3 A flow chart of the steps of the method for automatically adjusting the amplitude of a signal source according to the present invention;

[0051] Figure 4 It is a structural diagram of a signal line conduction sensitivity testing system of the present invention;

[0052] Figure 5 The present invention is a structural diagram of a signal line conduction sensitivity testing device. DETAILED DESCRIPTION

[0053] In the following, only some exemplary embodiments are briefly described. As those skilled in the art will appreciate, the described embodiments may be modified in various ways without departing from the spirit or scope of the present invention. Therefore, the drawings and descriptions are considered to be exemplary and non-restrictive in nature.

[0054] The embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0055] Example 1

[0056] In the prior art, if the initial value of the signal source amplitude is set too high, it will directly trigger the protection mechanism of the signal line or the signal line will fail, so that the test needs to be restarted, which will increase the test time. Conversely, if the initial value is set too low, the test system needs to gradually increase the amplitude until the required sensitivity level is reached, which will cause the test process to become longer and the test efficiency to be lower.

[0057] To do this, see Figure 1-2 The embodiment of the present invention provides a signal line conduction sensitivity testing method, comprising the following steps:

[0058] Step 1: Preliminary analysis of the sensitivity characteristics of the signal line under test, including sensitivity range and sensitive points;

[0059] Step 2: Determine the test configuration of the signal source and test cable according to the characteristics of the signal line under test and the test requirements;

[0060] Step 3: The test system sets the initial amplitude value of the signal source through a preset program and performs the test at the preset frequency point;

[0061] Step 4: The test system automatically adjusts the amplitude of the signal source according to the program scheme until the preset sensitivity threshold is reached;

[0062] Step 5: Record the signal source amplitude, device response and abnormal phenomena at each frequency point;

[0063] Step 6: Collect and analyze test data to generate a detailed test report, which includes the test results, sensitivity curves, and existing problems at each frequency point;

[0064] Step 7: Analyze the conduction sensitivity characteristics of the signal line at different frequencies based on the test results. After the test is completed, optimize the ANN intelligent algorithm model based on the results of the automatic test.

[0065] In embodiment 1, in step 1, the method for analyzing the sensitivity characteristics of the signal line includes the following steps:

[0066] S1: Analyze the interface type and signal transmission mode of the signal line under test, and determine the connection position and path of the signal line in the device;

[0067] S2: Analyze the circuit part to which the signal line is connected, clarify the amplification and filtering process of the circuit part, and the existing interference sources;

[0068] When analyzing the circuit part connected by the signal line, start with the name of the equipment and the overall layout of the circuit diagram, clarify the function of the circuit part, understand the main technical indicators of the circuit part according to the specification or technical manual, find the starting point and end point of the signal line in the circuit diagram, and determine the process and direction of signal processing;

[0069] By finding the amplifier or amplifying circuit directly connected to the signal line in the circuit diagram and analyzing the type, amplification factor and frequency response of the amplifier, the amplification process of this circuit part can be clarified.

[0070] By finding the filter or filter circuit directly connected to the signal line in the circuit diagram, and analyzing its selectivity to the signal frequency according to the type of filter, the filtering process of this circuit part can be clarified;

[0071] By analyzing the possible interference sources in the circuit diagram, such as power supply noise, electromagnetic radiation, transmission line interference, etc., and checking the circuit layout and wiring method, the interference sources in this circuit part can be clearly identified;

[0072] S3: Analyze the transmission signal type, frequency range, amplitude range and modulation method of the signal line;

[0073] Depending on the devices and systems connected to the signal line, the type of signal transmitted can be determined. The signal can be an analog signal (such as an audio signal, a video signal) or a digital signal (such as a data communication signal);

[0074] When determining the frequency range of a signal, for analog signals, the frequency range is determined according to the purpose and characteristics of the signal. For example, the frequency range of an audio signal is usually between 20Hz and 20kHz; the frequency range of a video signal varies according to the resolution and transmission standard. For example, the frequency of a standard-definition television signal is in the medium frequency range, while the frequency of a high-definition television signal is in the high frequency range.

[0075] When determining the frequency range of a signal, for a digital signal, its frequency range is usually related to the data transmission rate. The frequency range of a digital signal can be determined based on the specifications of the signal line and the data transmission rate of the connected device.

[0076] Determine the amplitude range of the signal: The amplitude range of the signal represents the maximum and minimum voltage or power values ​​of the signal. For analog signals, the amplitude range is determined by the characteristics of the signal source and the receiving device. For example, the amplitude range of an audio signal can be adjusted according to the size of the sound and the volume control.

[0077] For digital signals, the amplitude range is determined by the signal encoding method and logic level. Common digital signal amplitude ranges include TTL (transistor-transistor logic) level, CMOS (complementary metal oxide semiconductor) level, etc. These level standards define the voltage range corresponding to logic "0" and logic "1";

[0078] Determine the modulation method of the signal: Modulation method refers to the process of converting the original signal into a signal suitable for transmission. Modulation methods include amplitude modulation (AM), frequency modulation (FM), phase modulation (PM) and orthogonal frequency division multiplexing (OFDM). The modulation method of the signal is determined according to the communication protocol and standard of the equipment and system connected to the signal line. For example, in radio communication, commonly used modulation methods include AM and FM; and in digital communication, OFDM is a commonly used modulation method used to efficiently transmit multiple data streams within a limited bandwidth;

[0079] S4: Evaluate the interference sources present in the test environment, including electromagnetic radiation, power supply noise, and mechanical vibration;

[0080] Use a spectrum analyzer to monitor and identify electromagnetic radiation sources in the environment. Use a spectrum analyzer to continuously monitor potential interference frequency bands, record signal frequency, amplitude, bandwidth and other parameters, and record interference conditions in different time periods, including the duration and frequency changes of interference. Based on spectrum analysis data, identify electromagnetic radiation interference signals that overlap with the test equipment frequency band, determine their possible sources, and then analyze the strength of the interference signals to assess their potential impact on the normal operation of the test equipment.

[0081] Use an oscilloscope to monitor the stability and noise level of the power supply network, observe the differences in noise generated by different power supply systems, and evaluate the impact of power supply noise on signal quality;

[0082] Identify equipment or mechanical structures that may generate mechanical vibrations, use vibration sensors to monitor vibrations near the test equipment, and then analyze the impact of vibrations on signal transmission and test equipment performance;

[0083] S5: Improve the results of the preliminary analysis and formulate subsequent test plans and methods based on the structure;

[0084] In S4, an oscilloscope and a spectrum analyzer are used to perform preliminary tests on the signal lines to obtain preliminary test results.

[0085] In embodiment 1, in step 3, the initial amplitude value of the signal source is obtained according to the test frequency range, step size and sensitivity index of the signal line;

[0086] First, it is necessary to clarify the test frequency range of the signal line, which is determined according to the specifications and purpose of the signal line. Then set the test step length. The test step length refers to the interval of frequency change during the test. According to the test requirements, select an appropriate test step length, and then analyze the sensitivity index of the signal line. The sensitivity index is a parameter that describes the sensitivity of the signal line to signal changes. According to the sensitivity index of the signal line, you can understand the performance of the signal line at different frequencies and amplitudes. Finally, calculate the initial value of the signal source amplitude;

[0087] When calculating the initial value of the signal source amplitude, first, divide the test frequency into several sub-frequency bands according to the test frequency range and step size. Then, in each sub-frequency band, determine a suitable initial value of the signal source amplitude according to the sensitivity index of the signal line. This initial value should enable the signal line to generate sufficient response within the frequency band to facilitate subsequent performance testing and analysis.

[0088] In order to solve the above technical problems, an embodiment of the present invention provides a signal line conduction sensitivity testing method and solves the problem through the above technical solution:

[0089] By conducting a preliminary analysis of the sensitivity characteristics of the signal line under test, its approximate sensitivity range and possible sensitive points can be determined. Then, based on the characteristics of the signal line under test and the test requirements, the test configuration can be determined, thereby avoiding excessive testing of non-sensitive areas, thereby significantly reducing test time and costs. In addition, understanding the sensitive points helps to locate more accurately during the test process, improving the targetedness and efficiency of the test. It has the advantages of strong targetedness and high test efficiency.

[0090] Example 2

[0091] In the prior art, during automatic testing, the signal amplitude is usually increased step by step according to a fixed step size, which makes it impossible to accurately find the precise threshold of sensitivity, thereby affecting the accuracy of the signal line conduction sensitivity test results.

[0092] To do this, see Figure 3 , an embodiment of the present invention provides a method for automatically adjusting the amplitude of a signal source, comprising the following steps:

[0093] D1: Collect sensitivity test data of the signal line under different conditions, including signal inputs of different frequencies, amplitudes and durations, and record the response of the signal line;

[0094] D2: Extract features related to the sensitivity of the signal line from the data, including the amplitude, frequency, phase and response time of the signal;

[0095] D3: Use the extracted features and corresponding sensitivity data to train the ANN intelligent algorithm model;

[0096] D4: Predict the sensitivity of the signal line through the ANN intelligent algorithm model and find the precise threshold of the signal line sensitivity.

[0097] In order to solve the above technical problems, the present invention provides a method for automatically adjusting the amplitude of a signal source and solves the problem through the above technical solution:

[0098] By collecting test data and establishing an ANN intelligent algorithm model, the system can predict the sensitivity of the signal line and then find the precise threshold of the signal line sensitivity, avoiding errors that may be caused by manual adjustment and ensuring that the test signal is always close to the sensitive point. Compared with the prior art method of gradually increasing the signal amplitude according to a fixed step size, the sensitive point of the signal line can be located more accurately, thereby ensuring the accuracy of the signal line conduction sensitivity test results.

[0099] Example 3

[0100] See also Figure 4, an embodiment of the present invention provides a signal line conduction sensitivity test system, including a signal source module, a test connector, a signal line, a data analysis module, a monitoring module, a recording module, a collection module and a test control module;

[0101] The signal sending end of the signal source module is connected to the signal receiving end of the test connector, the signal sending end of the test connector is connected to the signal receiving end of the data analysis module, the signal sending end of the data analysis module is connected to the signal receiving end of the monitoring module, the signal sending end of the monitoring module is connected to the signal receiving end of the recording module, the signal sending end of the recording module is connected to the signal receiving end of the acquisition module, the signal sending end of the acquisition module is connected to the signal receiving end of the test control module, the signal sending end of the test control module is connected to the signal receiving end of the signal source module, and the signal line is connected to the test connector;

[0102] The signal source module is used to generate a signal of a specific frequency and amplitude to perform a conduction sensitivity test on the signal line. The signal source module is also used to accurately control the frequency and amplitude of the signal;

[0103] The test control module is used to control the entire test process and coordinate the work of each module according to the preset test configuration and program scheme, including starting the test and setting the signal source parameters;

[0104] The monitoring module and recording module are used to monitor the response of the signal line during the test in real time and record the test data;

[0105] The data analysis module is used to process and analyze the test data of the signal line and generate a detailed test report. The data analysis module is also used to automatically interpret and evaluate the test results according to preset analysis algorithms and indicators, and provide comprehensive information about the conduction sensitivity of the equipment.

[0106] Example 4

[0107] The signal line conduction sensitivity test device according to the embodiment of the present disclosure includes a memory and a processor. The memory is used to store non-temporary computer-readable instructions. Specifically, the memory may include one or more computer program products, and the computer program product may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may include, for example, a random access memory (RAM) and / or a cache memory (cache), etc. The non-volatile memory may include, for example, a read-only memory (ROM), a hard disk, a flash memory, etc.

[0108] The processor may be a central processing unit (CPU) or other forms of processing units with data processing capability and / or instruction execution capability, and may control other components in the signal line conduction sensitivity test device to perform desired functions. In one embodiment of the present disclosure, the processor is used to run the computer-readable instructions stored in the memory, so that the signal line conduction sensitivity test device performs all or part of the steps of a signal line conduction sensitivity test method of each embodiment of the present disclosure.

[0109] Those skilled in the art should be able to understand that in order to solve the technical problem of how to obtain a good user experience, the present embodiment may also include well-known structures such as a communication bus and an interface, and these well-known structures should also be included in the protection scope of the present disclosure.

[0110] like Figure 5 A schematic diagram of the structure of a signal line conduction sensitivity test device provided in an embodiment of the present disclosure is shown, which is suitable for implementing the signal line conduction sensitivity test device in an embodiment of the present disclosure. Figure 5 The signal line conduction sensitivity testing device shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present disclosure.

[0111] like Figure 5 As shown, the signal line conduction sensitivity test equipment may include a processor (such as a central processing unit, a graphics processing unit, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) or a program loaded from a storage device into a random access memory (RAM). In the RAM, various programs and data required for the operation of the signal line conduction sensitivity test equipment are also stored. The processor, ROM, and RAM are connected to each other through a bus. The input / output (I / O) interface is also connected to the bus.

[0112] Typically, the following devices can be connected to the I / O interface: input devices such as sensors or visual information acquisition devices; output devices such as display screens; storage devices such as magnetic tapes, hard disks, etc.; and communication devices. The communication device can allow the signal line conduction sensitivity test equipment to communicate with other devices (such as edge computing devices) wirelessly or by wire to exchange data. Figure 5 The signal line conduction sensitivity test equipment having various devices is shown, but it should be understood that it is not required to implement or possess all the devices shown. More or fewer devices may be implemented or possessed instead.

[0113] In particular, according to an embodiment of the present disclosure, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present disclosure includes a computer program product, which includes a computer program carried on a non-transitory computer-readable medium, and the computer program contains program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication device, or installed from a storage device, or installed from a ROM. When the computer program is executed by a processor, all or part of the steps of a signal line conduction sensitivity test method of an embodiment of the present disclosure are executed.

[0114] For detailed description of this embodiment, reference may be made to the corresponding descriptions in the aforementioned embodiments, which will not be repeated here.

[0115] Example 5

[0116] According to the computer-readable storage medium of the embodiment of the present disclosure, non-transitory computer-readable instructions are stored thereon. When the non-transitory computer-readable instructions are executed by a processor, all or part of the steps of a signal line conduction sensitivity testing method of each embodiment of the present disclosure are executed.

[0117] The above-mentioned computer-readable storage media include, but are not limited to: optical storage media (e.g., CD-ROM and DVD), magneto-optical storage media (e.g., MO), magnetic storage media (e.g., magnetic tape or mobile hard disk), media with built-in rewritable non-volatile memory (e.g., memory card) and media with built-in ROM (e.g., ROM box).

[0118] For detailed description of this embodiment, reference may be made to the corresponding descriptions in the aforementioned embodiments, which will not be repeated here.

[0119] The basic principles of the present disclosure are described above in conjunction with specific embodiments. However, it should be noted that the advantages, strengths, effects, etc. mentioned in the present disclosure are only examples and not limitations, and it cannot be considered that these advantages, strengths, effects, etc. are required by each embodiment of the present disclosure. In addition, the specific details disclosed above are only for the purpose of illustration and ease of understanding, and are not limitations. The above details do not limit the present disclosure to the necessity of adopting the above specific details to be implemented.

[0120] In the present disclosure, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. The block diagrams of the devices, devices, equipment, and systems involved in the present disclosure are only illustrative examples and are not intended to require or imply that they must be connected, arranged, and configured in the manner shown in the block diagram. As will be appreciated by those skilled in the art, these devices, devices, equipment, and systems can be connected, arranged, and configured in any manner. Words such as "including", "comprising", "having", etc. are open words, referring to "including but not limited to", and can be used interchangeably with them. The words "or" and "and" used here refer to the words "and / or" and can be used interchangeably with them, unless the context clearly indicates otherwise. The words "such as" used here refer to the phrase "such as but not limited to", and can be used interchangeably with them.

[0121] Additionally, as used herein, "or" used in a list of items beginning with "at least one" indicates a separate list, so that, for example, a list of "at least one of A, B, or C" means A or B or C, or AB or AC or BC, or ABC (i.e., A and B and C). Furthermore, the word "exemplary" does not mean that the example described is preferred or better than other examples.

[0122] It should also be noted that in the system and method of the present disclosure, each component or each step can be decomposed and / or recombined. Such decomposition and / or recombination should be regarded as equivalent solutions of the present disclosure.

[0123] Various changes, substitutions, and modifications of the techniques described herein may be made without departing from the teachings defined by the appended claims. Furthermore, the scope of the claims of the present disclosure is not limited to the specific aspects of the processes, machines, manufactures, compositions of events, means, methods, and actions described above. Currently existing or later to be developed processes, machines, manufactures, compositions of events, means, methods, or actions that perform substantially the same functions or achieve substantially the same results as the corresponding aspects described herein may be utilized. Thus, the appended claims include such processes, machines, manufactures, compositions of events, means, methods, or actions within their scope.

[0124] The above description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present disclosure. Various modifications to these aspects will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other aspects without departing from the scope of the present disclosure. Therefore, the present disclosure is not intended to be limited to the aspects shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

[0125] The above description has been given for the purpose of illustration and description. In addition, this description is not intended to limit the embodiments of the present disclosure to the forms disclosed herein. Although multiple example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations thereof.

[0126] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of various changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A signal line conduction sensitivity testing method, characterized in that: The following steps are involved: Step 1: Preliminary analysis of the sensitivity characteristics of the signal line under test, including sensitivity range and sensitive points; Step 2: Determine the test configuration of the signal source and test cable according to the characteristics of the signal line under test and the test requirements; Step 3: The test system sets the initial amplitude value of the signal source through a preset program and performs the test at the preset frequency point; Step 4: The test system automatically adjusts the amplitude of the signal source according to the program scheme until the preset sensitivity threshold is reached; Step 5: Record the signal source amplitude, device response and abnormal phenomena at each frequency point; Step 6: Collect test data and analyze it to generate a detailed test report; Step 7: Analyze the conduction sensitivity characteristics of the signal line at different frequencies based on the test results, and the test is completed; In step 1, the method for analyzing the sensitivity characteristics of the signal line includes the following steps: S1: Analyze the interface type and signal transmission mode of the signal line under test, and determine the connection position and path of the signal line in the device; S2: Analyze the circuit part to which the signal line is connected, clarify the amplification and filtering process of the circuit part, and the existing interference sources; S3: Analyze the transmission signal type, frequency range, amplitude range and modulation method of the signal line; S4: Evaluate the interference sources present in the test environment, including electromagnetic radiation, power supply noise, and mechanical vibration; S5: Improve the results of the preliminary analysis and formulate subsequent test plans and methods based on the structure; In S4, an oscilloscope and a spectrum analyzer are used to perform preliminary tests on the signal lines to obtain preliminary test results.

2. A signal line conduction sensitivity testing method according to claim 1, characterized in that: In step three, the initial amplitude value of the signal source is obtained according to the test frequency range, step size and sensitivity index of the signal line.

3. A signal line conduction sensitivity testing method according to claim 1, characterized in that: In step 4, the method for automatically adjusting the amplitude of the signal source includes the following steps: D1: Collect sensitivity test data of the signal line under different conditions, including signal inputs of different frequencies, amplitudes and durations, and record the response of the signal line; D2: Extract features related to the sensitivity of the signal line from the data, including the amplitude, frequency, phase and response time of the signal; D3: Use the extracted features and corresponding sensitivity data to train the ANN intelligent algorithm model; D4: Predict the sensitivity of the signal line through the ANN intelligent algorithm model and find the precise threshold of the signal line sensitivity.

4. A signal line conduction sensitivity testing method according to claim 1, characterized in that: In step six, the test report includes the test results, sensitivity curves and existing problems at each frequency point.

5. A signal line conduction sensitivity testing method according to claim 1, characterized in that: In step seven, the ANN intelligent algorithm model is optimized according to the results of the automatic test.

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