A triode production test equipment

Abstract

The invention provides a transistor production test device, which relates to the field of transistor testing and comprises: a test box; a limit position component is fixedly arranged on the top of the test box, and a connection structure is fixedly arranged on the outer side of the top of the test box; a conductive component is fixedly arranged on one side of the test box, and a power connection structure is rotatably arranged inside the conductive component, and an auxiliary component is fixedly arranged on the outer side of the power connection structure; a driving device is fixedly arranged on the top of the test box, and a temperature control module is fixedly arranged on the outer side of the driving device, and by arranging the limit position component and the conductive component as well as the power connection structure and the temperature control module; during the transistor test process, three pins can be quickly switched, and disconnection between the pins and the meter needles can be avoided; and the environment for the transistor test can be changed, thereby solving the problem that the meter pen may accidentally touch other pins and it is inconvenient to change the environment for the transistor test.

Description

Technical Field

[0001] The invention relates to the technical field of triode testing, and in particular to a triode production testing device. Background Art

[0002] The triode, whose full name should be semiconductor triode, is a semiconductor device that controls electric current; its function is to amplify weak signals into electrical signals with larger amplitude values, and it is also used as a contactless switch; the performance of the triode needs to be tested after production is completed; the triode is made of two PN junctions very close to each other on a semiconductor substrate. The two PN junctions divide the entire semiconductor into three parts, the middle part is the base region, and the two side parts are the emitter region and the collector region. There are two arrangements: PNP and NPN.

[0003] Existing transistors are usually tested using a multimeter. When using a multimeter to test the pins of the transistor, a tester usually holds a red and a black test lead to contact and measure the three pins respectively. During the measurement, the test leads are easily separated from the pins. In addition, the transistor pins are small in size, so when the red and black test leads are switched to measure the three pins, the operation is cumbersome, which may cause the test leads to accidentally touch other pins. This reduces the test efficiency. Moreover, testing the transistor only through a multimeter is not convenient for changing the test environment of the transistor, and is not convenient for thermal stability testing of the transistor, which reduces the comprehensiveness of the test data. Summary of the invention

[0004] In view of this, the present invention provides a transistor production test equipment, which has a limit component and a conductive component as well as a power connection structure and a temperature control module; it can quickly switch between three pins during the transistor test process, and can avoid the disconnection between the pins and the meter needles, which is beneficial to enhancing the test efficiency; and it can change the environment of the transistor test.

[0005] The present invention provides a transistor production test device, which specifically comprises: a test box; a clamping plate is slidably arranged inside the test box, and the clamping plates are symmetrically arranged in four groups, and the top of the clamping plate is arranged in an inclined structure; a vertical plate is fixedly arranged on the outside of the clamping plate, and a cross bar is fixedly arranged between the vertical plate and the inside of the clamping plate; the cross bar is slidably arranged inside both sides of the test box, and a spring member is arranged between the top of the cross bar and the inside of the test box; a conductive strip A is fixedly arranged inside the clamping plate, and the number of the conductive strips A is set to two groups; two groups of partitions are fixedly arranged inside the test box, and the two groups of partitions are symmetrically arranged; a vertical shaft is rotatably arranged inside the inside of the test box, and a connecting gear is fixedly arranged at the bottom end of the vertical shaft;

[0006] A limiting component is fixedly arranged on the top of the test box, and a connecting structure is fixedly arranged on the outer side of the top of the test box; a conductive component is fixedly arranged on one side of the test box, and a power connection structure is rotatably arranged inside the conductive component, and an auxiliary component is fixedly arranged on the outer side of the power connection structure; a driving device is fixedly arranged on the top of the test box, and a temperature control module is fixedly arranged on the outer side of the driving device.

[0007] In at least some embodiments, a group of tooth plates A are fixedly provided at the bottom of two groups of vertical plates, and a group of tooth plates B are fixedly provided at the bottom of the other two groups of vertical plates; tooth plates A and tooth plates B are centrally symmetrically provided, and both tooth plates A and tooth plates B are meshed with connecting gears.

[0008] In at least some embodiments, the limiting assembly includes: a fixed seat, a guide rod, a circular plate, a clamping bar and a conductive strip B; the fixed seat is fixedly arranged on both sides of the top of the test box; the guide rod is slidably arranged inside the fixed seat, and a spring member is arranged between one end of the guide rod and the inner side of the fixed seat, and the guide rod and the fixed seat are symmetrically arranged in four groups; the circular plate is fixedly arranged at the other end of the guide rod, and the outer side of the circular plate is in contact with the outer side of the fixed seat; the clamping bar is fixedly arranged between the top ends of the two groups of guide rods, and the clamping bar is symmetrically arranged in two groups; the clamping bar and the clamping plate are vertically arranged in the space, and the top of the clamping bar is arranged as a bevel structure; the conductive strip B is fixedly arranged inside a group of clamping bars.

[0009] In at least some embodiments, the connection structure includes: a fixed column, a sliding plate, a connecting plate and a connecting seat; the fixed column is fixedly arranged on the outer side of the top of the test box, and the fixed column is arranged in a hexagon; the sliding plate is slidably arranged on the outer side of the fixed column; the connecting plate is rotatably arranged on both sides of the sliding plate, and the connecting plate is symmetrically arranged; the connecting seat is rotatably arranged on the inner side of the connecting plate, and the connecting seat is fixedly arranged on the outer side of the clamping bar.

[0010] In at least some embodiments, the conductive component includes: a fixed box, a limit slot A, a limit slot B, a limit slot C, a conductive column, a fixed plate and a baffle; the fixed box is fixedly arranged on the outside of the test box; the limit slot A, the limit slot B and the limit slot C are opened inside one side of the fixed box, and the limit slot A, the limit slot B and the limit slot C are each provided with two groups, and the limit slot A, the limit slot B and the limit slot C are spaced 90° apart; the conductive column is slidably arranged inside one side of the fixed box, and three groups of guide columns are provided; the three groups of conductive columns are respectively electrically connected to the two groups of conductive strips A and the one group of conductive strips B, and a chamfer is provided at one end of the conductive column; the fixed plate is fixedly arranged on the outside of the conductive column, and a spring member is arranged between the fixed plate and the inner side of the fixed box, and the spring member is located on the outside of the conductive column; the baffle is fixedly arranged at the other end of the conductive column, and the outside of the baffle is in contact with the outside of the fixed box.

[0011] In at least some embodiments, the power connection structure includes: an insulating cylinder, a power connection post, a power connection plate, a fixed cylinder, a limit post and a positioning plate; the insulating cylinder is rotatably arranged inside one side of the fixed box; the power connection post is fixedly arranged inside the insulating cylinder; the power connection plate is fixedly arranged at one end of the power connection post, and the outer side of the power connection plate is in contact with the top of the conductive post, and the power connection plate, the power connection post and the insulating cylinder are each provided with two groups; the fixed cylinder is fixedly arranged on one side of the insulating cylinder; the limit post is slidably arranged inside the fixed cylinder, and the top of the limit post is arranged as a spherical structure, and the spherical structure at the top of the limit post is movably arranged inside the limit groove A, the limit groove B and the limit groove C; the positioning plate is fixedly arranged on the outer side of the limit post, and the outer side of the positioning plate is in contact with the inner side of the fixed cylinder, and a spring member is arranged between the positioning plate and the inside of the fixed cylinder.

[0012] In at least some embodiments, the auxiliary component includes: an auxiliary frame, a conductive plate, a pressure block and a bolt rod; the auxiliary frame is fixedly arranged on the outside of the insulating tube; the conductive plate is fixedly arranged on the bottom of the inner side of the auxiliary frame, and the conductive plate and the power pole are arranged to be fixedly connected; the pressure block is slidably arranged on the inner side of the auxiliary frame; the bolt rod is arranged on the top of the inner side of the auxiliary frame through a threaded connection, and the bolt rod and the pressure block are arranged to be rotatably connected.

[0013] In at least some embodiments, the driving device includes: a driving frame, a driving screw, a synchronous wheel, a driving seat, an adjusting screw, an adjusting seat, a pressure sensor and a driving motor; the driving frame is fixedly arranged on both sides of the top of the test box; the driving screw is rotatably arranged inside the driving frame; the synchronous wheel is fixedly arranged at the top of the driving screw, and a synchronous belt device is installed on the outer side of the synchronous wheel; the driving seat is slidably arranged on the inner side of the driving frame, and the driving seat is arranged on the outer side of the driving screw through a threaded connection, and the number of driving seats is set to two groups; the adjusting screw is rotatably arranged on the outer side of the driving frame; the adjusting seat is slidably arranged on the outer side of the driving frame through a dovetail groove, and the adjusting seat is arranged on the outer side of the adjusting screw through a threaded connection, and the number of adjusting seats is set to two groups; the number of pressure sensors is set to two groups, and one group of pressure sensors is fixedly arranged on the top of one group of adjusting seats, and another group of pressure sensors is fixedly arranged on the bottom of another group of adjusting seats; the driving motor is fixedly arranged on the top of the driving frame, and a fixed connection is set between the driving motor shaft and the driving screw.

[0014] In at least some embodiments, the temperature control module includes: a temperature control frame, a heating lamp, a fixed tube, a nozzle, a pressure rod and a control module; the temperature control frame is fixedly arranged between two groups of drive seats; the heating lamp is fixedly arranged inside one side of the temperature control frame; the fixed tube is fixedly arranged inside the other side of the temperature control frame; the nozzle is fixedly arranged in a straight line inside one side of the fixed tube; the number of pressure rods is set to two groups, and one group of pressure rods is slidably arranged inside the top side of the temperature control frame, and the other group of pressure rods is slidably arranged inside the bottom side of the temperature control frame; a spring member is arranged between the pressure rod and the inside of the temperature control frame, and the two groups of pressure rods and the two groups of pressure sensors are respectively arranged on the same axis; the control module is fixedly arranged on the outside of the temperature control frame, and the control module is electrically connected to the drive motor and the pressure sensor.

[0015] Beneficial Effects

[0016] 1. The present invention, by providing a symmetrical connecting plate, a sliding plate and a fixing column, can make two groups of clamping bars move in opposite directions at the same time. At the same time, by using the clamping bar and its top bevel structure in combination with the spring member and the guide rod, when the transistor is inserted downward, the two groups of clamping bars can automatically clamp and fix the middle pin of the transistor; by using the connecting gear in combination with the tooth plate A and the tooth plate B, the two groups of vertical plates can move in opposite directions at the same time; by using the top inclined structure of the clamping plate, the cross bar and the spring member, when the transistor is inserted downward, the four groups of clamping plates can automatically clamp and fix the pins on both sides of the transistor; thus, the transistor can be quickly clamped and fixed according to its specific size specifications; and by using the two groups of conductive strips A and the conductive strips B, when the clamping bar and the clamping plate clamp the three pins, the three pins can be electrically connected to the three groups of conductive columns respectively; the convenience of the test equipment is enhanced, which is conducive to preventing the test lead from being separated from the pin.

[0017] 2. The present invention, by providing a bolt rod and a pressure block, can fix the end of the test lead to the top of the conductive sheet; at the same time, by using the limit column and the limit slot A as well as the limit slot B and the limit slot C, the insulating tube can drive the power connection post and the power connection plate to rotate 90°; thereby, the two groups of power connection posts and the three groups of conductive posts can be switched and connected; the red and black test leads can be quickly switched and connected with the three pins of the transistor; it is beneficial for the red and black test leads to switch and measure the three pins, and can prevent the test leads from accidentally touching other pins.

[0018] 3. The present invention is provided with a pressure sensor and a pressure rod. When the pressure rod applies pressure to the pressure sensor, the control module controls the driving motor to reverse, so that the driving screw drives the temperature control frame to move in the opposite direction through the driving seat, and then the temperature control frame can move back and forth, so that the heating tube, the fixed tube and the nozzle can move back and forth up and down, which is beneficial to uniform heating or cooling of the transistor.

[0019] 4. The present invention, by providing an adjusting screw and an adjusting seat, can adjust the horizontal spacing between the two groups of pressure sensors; and further can adjust the path length of the reciprocating movement of the temperature control rack according to the specific size of the transistor; it is beneficial to heat or cool the transistor according to the specific size of the transistor; it is beneficial to avoid waste of heating medium or cooling medium; and it is possible to change the test environment of the transistor, which is beneficial to thermal stability testing of the transistor and enhances the comprehensiveness of the test data. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solution of the embodiment of the present invention, the drawings of the embodiment are briefly introduced below.

[0021] The drawings described below are only related to some embodiments of the present invention, but are not intended to limit the present invention.

[0022] In the attached picture:

[0023] Figure 1 The overall structural diagram of the present invention is shown.

[0024] Figure 2 The cross-sectional structure diagram of the test box of the present invention is shown.

[0025] Figure 3 A schematic structural diagram of the lower surface of the vertical plate of the present invention is shown.

[0026] Figure 4 The internal structure schematic diagram of the test box of the present invention is shown.

[0027] Figure 5 A schematic diagram of the connection structure between the limit assembly and the connection structure of the present invention is shown.

[0028] Figure 6 A schematic diagram of the connection structure between the driving device and the temperature control module of the present invention is shown.

[0029] Figure 7 The schematic diagram of the structure of the temperature control module of the present invention is shown.

[0030] Figure 8 The schematic diagram of the structure of the driving device of the present invention is shown.

[0031] Fig. 9 A schematic diagram of the connection structure between the conductive component and the power connection structure of the present invention is shown.

[0032] Fig.10 The internal structure schematic diagram of the fixing box of the present invention is shown.

[0033] Fig.11 A schematic structural diagram of the auxiliary components of the present invention is shown.

[0034] Fig.12 A schematic cross-sectional structure diagram of the fixing cylinder of the present invention is shown.

[0035] Reference numerals list

[0036] 1. Test box; 101. Clamping plate; 102. Vertical plate; 103. Crossbar; 104. Conductive strip A; 105. Vertical shaft; 106. Connecting gear; 107. Tooth plate A; 108. Tooth plate B; 109. Partition plate;

[0037] 2. Limiting assembly; 201. Fixing seat; 202. Guide rod; 203. Round plate; 204. Clamping bar; 205. Conductive bar B;

[0038] 3. Connecting structure; 301. Fixed column; 302. Sliding plate; 303. Connecting plate; 304. Connecting seat;

[0039] 4. Conductive assembly; 401. Fixed box; 402. Limiting slot A; 403. Limiting slot B; 404. Limiting slot C; 405. Conductive column; 406. Fixed plate; 407. Baffle;

[0040] 5. Power connection structure; 501. Insulating cylinder; 502. Power connection column; 503. Power connection board; 504. Fixing cylinder; 505. Limiting column; 506. Positioning plate;

[0041] 6. Auxiliary components; 601. Auxiliary frame; 602. Conductive plate; 603. Press block; 604. Bolt rod;

[0042] 7. Driving device; 701. Driving frame; 702. Driving screw; 703. Synchronous wheel; 704. Driving seat; 705. Adjusting screw; 706. Adjusting seat; 707. Pressure sensor; 708. Driving motor;

[0043] 8. Temperature control module; 801. Temperature control rack; 802. Heating lamp; 803. Fixing tube; 804. Nozzle; 805. Pressure rod; 806. Control module. DETAILED DESCRIPTION

[0044] In order to make the purpose, scheme and advantages of the technical solution of the present invention clearer, the technical solution of the embodiment of the present invention will be clearly and completely described in conjunction with the drawings of the specific embodiments of the present invention. Unless otherwise specified, the terms used herein have the usual meanings in the art. The same reference numerals in the drawings represent the same components.

[0045] Example 1: Please refer to Figures 1 to 12 As shown:

[0046] The present invention provides a transistor production test device, comprising a test box 1; a clamping plate 101 is slidably arranged inside the test box 1, and the clamping plates 101 are symmetrically arranged in four groups, and the top of the clamping plates 101 is arranged in an inclined structure; a vertical plate 102 is fixedly arranged outside the clamping plates 101, and a cross bar 103 is fixedly arranged between the vertical plate 102 and the inner side of the clamping plates 101; the cross bar 103 is slidably arranged inside both sides of the test box 1, and a spring member is arranged between the top of the cross bar 103 and the inner side of the test box 1; a conductive strip A104 is fixedly arranged inside the clamping plate 101, and the number of the conductive strips A104 is set in two groups; two groups of partitions 109 are fixedly arranged inside the test box 1, and the two groups of partitions 109 are symmetrically arranged; a vertical shaft 105 is rotatably arranged inside the test box 1, and a connecting gear 106 is fixedly arranged at the bottom end of the vertical shaft 105;

[0047] In the embodiment of the present disclosure, a limit assembly 2 is fixedly provided on the top of the test box 1, and a connection structure 3 is fixedly provided on the outer side of the top of the test box 1; a conductive assembly 4 is fixedly provided on one side of the test box 1, and a power connection structure 5 is rotatably provided inside the conductive assembly 4, and an auxiliary assembly 6 is fixedly provided on the outer side of the power connection structure 5; a driving device 7 is fixedly provided on the top of the test box 1, and a temperature control module 8 is fixedly provided on the outer side of the driving device 7; a group of tooth plates A107 are fixedly provided on the bottom of the two groups of vertical plates 102, and a group of tooth plates B108 are fixedly provided on the bottom of the other two groups of vertical plates 102; the tooth plates A107 and the ... The plate B108 is centrally symmetrically arranged, and the tooth plate A107 and the tooth plate B108 are both meshed with the connecting gear 106; the limit assembly 2 includes: a fixed seat 201, a guide rod 202, a circular plate 203, a clamping strip 204 and a conductive strip B205; the fixed seat 201 is fixedly arranged on both sides of the top of the test box 1; the guide rod 202 is slidably arranged inside the fixed seat 201, and a spring member is arranged between one end of the guide rod 202 and the inner side of the fixed seat 201, and the guide rod 202 and the fixed seat 201 are symmetrically arranged in four groups; the circular plate 203 is fixedly arranged at the other end of the guide rod 202, and the circular plate 203 is fixedly arranged at the other end of the guide rod 202. The outer side of the plate 203 is in contact with the outer side of the fixing seat 201; the clamping bar 204 is fixedly arranged between the top ends of the two groups of guide rods 202, and the clamping bar 204 is symmetrically arranged in two groups; the clamping bar 204 and the clamping plate 101 are vertically arranged in the space, and the top of the clamping bar 204 is arranged as a bevel structure; the conductive strip B205 is fixedly arranged inside a group of clamping bars 204; the connecting structure 3 includes: a fixed column 301, a sliding plate 302, a connecting plate 303 and a connecting seat 304; the fixed column 301 is fixedly arranged on the outer side of the top of the test box 1, and the fixed column 301 is arranged in a hexagonal shape; the sliding plate 30 2 is slidably arranged on the outside of the fixed column 301; the connecting plate 303 is rotatably arranged on both sides of the sliding plate 302, and the connecting plate 303 is symmetrically arranged; the connecting seat 304 is rotatably arranged on the inside of the connecting plate 303, and the connecting seat 304 is fixedly arranged on the outside of the clamping bar 204; its specific functions are: it can enable the clamping bar 204 and the clamping plate 101 to quickly clamp and fix the triode according to the specific size specifications; and by using two groups of conductive strips A104 and conductive strips B205, when the clamping bar 204 and the clamping plate 101 clamp the three pins, the three pins can be electrically connected to the three groups of conductive columns respectively.

[0048] Example 2: Please refer to Figures 9 to 12As shown: Based on the first embodiment, the conductive component 4 includes: a fixed box 401, a limiting groove A402, a limiting groove B403, a limiting groove C404, a conductive column 405, a fixed plate 406 and a baffle 407; the fixed box 401 is fixedly arranged on the outside of the test box 1; the limiting grooves A402, the limiting grooves B403 and the limiting grooves C404 are opened inside one side of the fixed box 401, and the limiting grooves A402, the limiting grooves B403 and the limiting grooves C404 are each provided with two groups, and the limiting grooves A402, the limiting grooves B403 and the limiting grooves C404 are spaced 90° apart; the conductive column 405 is slidably arranged inside one side of the fixed box 401, and the guide column 405 is provided with three groups; the three groups of conductive columns 405 are respectively connected to the two groups of conductive strips A104 It is set to be electrically connected with a group of conductive strips B205, and one end of the conductive column 405 is chamfered; the fixing plate 406 is fixedly set on the outside of the conductive column 405, and a spring member is set between the fixing plate 406 and the inner side of the fixing box 401, and the spring member is located on the outside of the conductive column 405; the baffle 407 is fixedly set at the other end of the conductive column 405, and the outer side of the baffle 407 is in contact with the outer side of the fixing box 401; the power connection structure 5 includes: an insulating cylinder 501, a power connection column 502, a power connection plate 503, a fixing cylinder 504, a limit column 505 and a positioning plate 506; the insulating cylinder 501 is rotatably set inside one side of the fixing box 401; the power connection column 502 is fixedly set inside the insulating cylinder 501; the power connection plate 503 is fixedly set on the power connection column 502 One end, and the outer side of the power board 503 is in contact with the top of the conductive column 405, and the power board 503, the power column 502 and the insulating tube 501 are each provided with two groups; the fixed tube 504 is fixedly provided on one side of the insulating tube 501; the limiting column 505 is slidably provided inside the fixed tube 504, and the top of the limiting column 505 is provided with a spherical structure, and the spherical structure at the top of the limiting column 505 is movably provided inside the limiting groove A402, the limiting groove B403 and the limiting groove C404; the positioning plate 506 is fixedly provided on the outer side of the limiting column 505, and the outer side of the positioning plate 506 is in contact with the inner side of the fixed tube 504, and a spring member is provided between the positioning plate 506 and the inside of the fixed tube 504; the auxiliary component 6 includes: an auxiliary frame 601, a conductive plate 602 , a pressure block 603 and a bolt rod 604; the auxiliary frame 601 is fixedly arranged on the outside of the insulating cylinder 501; the conductive plate 602 is fixedly arranged on the inner bottom of the auxiliary frame 601, and the conductive plate 602 and the power post 502 are arranged to be fixedly connected; the pressure block 603 is slidably arranged on the inner side of the auxiliary frame 601; the bolt rod 604 is arranged on the inner top of the auxiliary frame 601 through a threaded connection, and the bolt rod 604 and the pressure block 603 are arranged to be rotatably connected; its specific function is: by using the limiting column 505 and the limiting groove A402 and the limiting groove B403 and the limiting groove C404, the insulating cylinder 501 can drive the power post 502 and the power board 503 to rotate 90°; thereby, the two groups of power posts 502 can be switched and connected with the three groups of conductive posts 405;It is convenient for the red and black test leads to switch and measure the three pins. ;

[0049] Example 3: Please refer to Figures 6 to 8 As shown in the figure, on the basis of the first and second embodiments, the driving device 7 comprises: a driving frame 701, a driving screw 702, a synchronous wheel 703, a driving seat 704, an adjusting screw 705, an adjusting seat 706, a pressure sensor 707 and a driving motor 708; the driving frame 701 is fixedly arranged on both sides of the top of the test box 1; the driving screw 702 is rotatably arranged inside the driving frame 701; the synchronous wheel 703 is fixedly arranged on the top of the driving screw 702, and a synchronous belt device is installed on the outer side of the synchronous wheel 703; the driving seat 704 is slidably arranged on the inner side of the driving frame 701, and the driving seat 704 is arranged on the outer side of the driving screw 702 through a threaded connection, and the driving The number of movable seats 704 is set to two groups; the adjusting screw 705 is rotatably set on the outside of the driving frame 701; the adjusting seat 706 is slidably set on the outside of the driving frame 701 through a dovetail groove, and the adjusting seat 706 is set on the outside of the adjusting screw 705 through a threaded connection, and the number of adjusting seats 706 is set to two groups; the number of pressure sensors 707 is set to two groups, and one group of pressure sensors 707 is fixedly set on the top of one group of adjusting seats 706, and the other group of pressure sensors 707 is fixedly set on the bottom of the other group of adjusting seats 706; the driving motor 708 is fixedly set on the top of the driving frame 701, and a shaft of the driving motor 708 and the driving screw 702 are set The temperature control module 8 comprises: a temperature control frame 801, a heating lamp 802, a fixed tube 803, a nozzle 804, a pressure rod 805 and a control module 806; the temperature control frame 801 is fixedly arranged between the two groups of driving seats 704; the heating lamp 802 is fixedly arranged inside one side of the temperature control frame 801; the fixed tube 803 is fixedly arranged inside the other side of the temperature control frame 801; the nozzle 804 is fixedly arranged inside one side of the fixed tube 803 in a straight line; the number of pressure rods 805 is set to two groups, and one group of pressure rods 805 is slidably arranged inside the top side of the temperature control frame 801, and the other group of pressure rods 805 is slidably arranged inside the bottom side of the temperature control frame 801; the pressure rods A spring member is arranged between 805 and the inside of the temperature control rack 801, and the two groups of pressure rods 805 and the two groups of pressure sensors 707 are respectively arranged on the same axis; the control module 806 is fixedly arranged on the outside of the temperature control rack 801, and the control module 806 is electrically connected to the drive motor 708 and the pressure sensor 707; its specific function is: by arranging the adjusting screw 705 and the adjusting seat 706, the horizontal spacing between the two groups of pressure sensors 707 can be adjusted; and then the path length of the reciprocating movement of the temperature control rack 801 can be adjusted according to the specific size of the transistor; it is beneficial to heat or cool the transistor according to its specific size.

[0050] Specific usage and function of this embodiment: In the present invention, when in use, the black and red test leads of the multimeter are placed above the two groups of conductive plates 602 respectively; then the bolt rod 604 is rotated, and the bolt rod 604 drives the pressing block 603 to move downward, so that the pressing block 603 fixes the black and red test leads above the conductive plate 602; so that the black and red test leads of the multimeter are electrically connected to the two groups of connecting posts 502 respectively; the pin in the middle of the transistor is placed above the two groups of clamping bars 204, and then the transistor is pressed down, and the pin in the middle of the transistor drives the clamping bar 204 to move outward through the top bevel of the clamping bar 204; the two groups of clamping bars 204 are connected to the connecting plate 303 through the connecting plate 303. The sliding plate 302 moves in the opposite direction at the same time; and the two groups of clamping strips 204 apply clamping force to the pin in the middle of the transistor through the spring member and the guide rod 202, so that the conductive strip B205 is electrically connected to the pin in the middle of the transistor; the transistor is pressed down continuously, so that the pins on both sides of the transistor apply pressure to the clamping plate 101; the clamping plate 101 moves outward through the top tilting structure; the two groups of clamping plates 101 move in the opposite direction at the same time through the vertical plate 102 and the connecting gear 106 and the tooth plate A107 and the tooth plate B108; and the two groups of clamping plates 101 apply clamping force to the pins on both sides of the transistor through the spring member and the cross bar 103, so that the conductive strip A1 04 is electrically connected to the pins on both sides of the transistor; thereby fixing the transistor, and at the same time, the three pins of the transistor are electrically connected to the two groups of conductive strips A104 and the conductive strips B205 respectively; then the insulating cylinder 501 is rotated, and the insulating cylinder 501 drives the fixing cylinder 504 and the limiting column 505 to rotate. When the two groups of limiting columns 505 are movably set in the two groups of limiting grooves A402, it indicates that the red and black test leads of the multimeter are electrically connected to the pins on one side and the middle pin of the transistor respectively; when the two groups of limiting columns 505 are movably set in the two groups of limiting grooves B403, it indicates that the red and black test leads of the multimeter are electrically connected to the middle pin and the other side pin of the transistor respectively. Electrical connection; when the two groups of limit posts 505 are respectively movably set in one group of limit slots A402 and one group of limit slots B403, the red and black test leads of the surface multimeter are respectively electrically connected to the pins on both sides of the transistor; thus, the red and black test leads can be easily and conveniently switched and connected with the three pins of the transistor quickly; it is beneficial for the red and black test leads to switch and measure the three pins, and it can avoid the test leads from accidentally touching other pins; by observing the values ​​on the multimeter, it can be determined whether the transistor is turned on or damaged; when both groups of limit posts 505 are movably set in the two groups of limit slots C404, it indicates that the red and black test leads of the multimeter are disconnected from the three pins of the transistor;

[0051] When the transistor needs to be tested for thermal stability, the adjusting screw 705 is rotated so that the adjusting screw 705 drives the pressure sensor 707 to move up and down through the adjusting seat belt 706, so that the horizontal spacing between the two groups of pressure sensors 707 is adjusted according to the specific size of the transistor; the driving motor 708 is started, and the driving motor 708 drives a group of driving screws 702 to rotate. The two groups of driving screws 702 rotate simultaneously through the synchronous wheel 703 and the synchronous belt device, so that the two groups of driving seats 704 drive the temperature control frame 801 to move. When the pressure rod 805 touches the pressure sensor 707 and applies pressure to the pressure sensor 707, the pressure sensor 707 transmits the pressure signal to the control The control module 806 controls the driving motor 708 to reverse, so that the temperature control frame 801 moves in the opposite direction, so that the temperature control frame 801 can move back and forth according to the specific size of the transistor; when the transistor needs to be tested in a high-temperature environment, the heating lamp 802 is started, so that the heating lamp 802 heats the transistor by moving it back and forth up and down; when the transistor needs to be tested in a low-temperature environment, dry cold air is introduced into the fixed tube 803, so that the dry cold air is sprayed to the transistor through the nozzle 804; so that the transistor can be evenly heated or cooled; so that the transistor can be tested in high and low temperature environments, and then the thermal stability of the transistor can be tested.

Claims

1. A transistor production test equipment, characterized in that: include: A test box; a clamping plate is slidably arranged inside the test box, and the clamping plates are symmetrically arranged in four groups, and the top of the clamping plate is set as an inclined structure; a vertical plate is fixedly arranged on the outside of the clamping plate, and a cross bar is fixedly arranged between the vertical plate and the inside of the clamping plate; the cross bar is slidably arranged inside both sides of the test box, and a spring member is arranged between the top of the cross bar and the inside of the test box; a conductive strip A is fixedly arranged inside the clamping plate, and the number of conductive strips A is set in two groups; two groups of partitions are fixedly arranged inside the test box, and the two groups of partitions are symmetrically arranged; a vertical shaft is rotatably arranged inside the inside of the test box, and a connecting gear is fixedly arranged at the bottom end of the vertical shaft; A limit assembly is fixedly provided on the top of the test box, and a connection structure is fixedly provided on the outer side of the top of the test box; a conductive assembly is fixedly provided on one side of the test box, and a power connection structure is rotatably provided inside the conductive assembly, and an auxiliary assembly is fixedly provided on the outer side of the power connection structure; a driving device is fixedly provided on the top of the test box, and a temperature control module is fixedly provided on the outer side of the driving device; The limiting assembly includes: a fixed seat, a guide rod, a circular plate, a clamping strip and a conductive strip B; the fixed seat is fixedly arranged on both sides of the top of the test box; the guide rod is slidably arranged inside the fixed seat, and a spring member is arranged between one end of the guide rod and the inner side of the fixed seat, and the guide rod and the fixed seat are symmetrically arranged in four groups; the circular plate is fixedly arranged at the other end of the guide rod, and the outer side of the circular plate is in contact with the outer side of the fixed seat; the clamping strip is fixedly arranged between the top ends of the two groups of guide rods, and the clamping strip is symmetrically arranged in two groups; the clamping strip and the clamping plate are vertically arranged in the space, and the top of the clamping strip is arranged as a bevel structure; the conductive strip B is fixedly arranged inside a group of clamping strips; the conductive assembly includes: a fixed box, a limiting slot A, a limiting slot B, a limiting slot C, a guide An electric post, a fixed plate and a baffle; the fixed box is fixedly arranged on the outside of the test box; the limit slots A, B and C are arranged inside one side of the fixed box, and two groups of limit slots A, B and C are arranged, and the intervals between the limit slots A, B and C are 90°; the conductive post is slidably arranged inside one side of the fixed box, and three groups of guide posts are arranged; the three groups of conductive posts are respectively electrically connected with the two groups of conductive strips A and the one group of conductive strips B, and one end of the conductive post is chamfered; the fixed plate is fixedly arranged on the outside of the conductive post, and a spring member is arranged between the fixed plate and the inner side of the fixed box, and the spring member is located on the outside of the conductive post; the baffle is fixedly arranged on the other end of the conductive post, and the outer side of the baffle fits with the outer side of the fixed box.

2. The transistor production test equipment according to claim 1, characterized in that: A set of tooth plates A are fixedly arranged at the bottom of the two sets of vertical plates, and a set of tooth plates B are fixedly arranged at the bottom of the other two sets of vertical plates; the tooth plates A and B are centrally symmetrically arranged, and both the tooth plates A and B are meshed with the connecting gears.

3. The transistor production and testing equipment according to claim 1, characterized in that: The connection structure includes: a fixed column, a sliding plate, a connecting plate and a connecting seat; the fixed column is fixedly arranged on the outer side of the top of the test box, and the fixed column is arranged in a hexagon; the sliding plate is slidably arranged on the outer side of the fixed column; the connecting plate is rotatably arranged on both sides of the sliding plate, and the connecting plate is symmetrically arranged; the connecting seat is rotatably arranged on the inner side of the connecting plate, and the connecting seat is fixedly arranged on the outer side of the clamping strip.

4. The transistor production and testing equipment according to claim 1, characterized in that: The power connection structure includes: an insulating cylinder, a power connection post, a power connection plate, a fixed cylinder, a limit post and a positioning plate; the insulating cylinder is rotatably arranged inside one side of the fixed box; the power connection post is fixedly arranged inside the insulating cylinder; the power connection plate is fixedly arranged at one end of the power connection post, and the outer side of the power connection plate is in contact with the top of the conductive post, and the power connection plate, the power connection post and the insulating cylinder are all provided with two groups; the fixed cylinder is fixedly arranged on one side of the insulating cylinder; the limit post is slidably arranged inside the fixed cylinder, and the top of the limit post is arranged as a spherical structure, and the spherical structure at the top of the limit post is movably arranged inside the limit slots A, B and C; the positioning plate is fixedly arranged on the outer side of the limit post, and the outer side of the positioning plate is in contact with the inner side of the fixed cylinder, and a spring member is arranged between the positioning plate and the inside of the fixed cylinder.

5. The transistor production and testing equipment according to claim 4, characterized in that: The auxiliary component includes: an auxiliary frame, a conductive plate, a pressure block and a bolt rod; the auxiliary frame is fixedly arranged on the outside of the insulating tube; the conductive plate is fixedly arranged on the bottom of the inner side of the auxiliary frame, and the conductive plate and the power connection post are arranged to be fixedly connected; the pressure block is slidably arranged on the inner side of the auxiliary frame; the bolt rod is arranged on the top of the inner side of the auxiliary frame through a threaded connection, and the bolt rod and the pressure block are arranged to be rotatably connected.

6. The transistor production and testing equipment according to claim 1, characterized in that: The driving device includes: a driving frame, a driving screw, a synchronous wheel, a driving seat, an adjusting screw, an adjusting seat, a pressure sensor and a driving motor; the driving frame is fixedly arranged on both sides of the top of the test box; the driving screw is rotatably arranged inside the driving frame; the synchronous wheel is fixedly arranged at the top of the driving screw, and a synchronous belt device is installed on the outer side of the synchronous wheel; the driving seat is slidably arranged on the inner side of the driving frame, and the driving seat is arranged on the outer side of the driving screw through a threaded connection, and the number of driving seats is set to two groups; the adjusting screw is rotatably arranged on the outer side of the driving frame; the adjusting seat is slidably arranged on the outer side of the driving frame through a dovetail groove, and the adjusting seat is arranged on the outer side of the adjusting screw through a threaded connection, and the number of adjusting seats is set to two groups; the number of pressure sensors is set to two groups, and one group of pressure sensors is fixedly arranged on the top of one group of adjusting seats, and another group of pressure sensors is fixedly arranged on the bottom of another group of adjusting seats; the driving motor is fixedly arranged on the top of the driving frame, and a fixed connection is set between the driving motor shaft and the driving screw.

7. The transistor production and testing equipment according to claim 6, characterized in that: The temperature control module includes: a temperature control frame, a heating lamp, a fixed tube, a nozzle, a pressure rod and a control module; the temperature control frame is fixedly arranged between two groups of drive seats; the heating lamp is fixedly arranged inside one side of the temperature control frame; the fixed tube is fixedly arranged inside the other side of the temperature control frame; the nozzle is fixedly arranged inside one side of the fixed tube in a linear arrangement; the number of pressure rods is set to two groups, and one group of pressure rods is slidably arranged inside the top side of the temperature control frame, and the other group of pressure rods is slidably arranged inside the bottom side of the temperature control frame; a spring member is arranged between the pressure rod and the inside of the temperature control frame, and the two groups of pressure rods and the two groups of pressure sensors are respectively arranged on the same axis; the control module is fixedly arranged on the outside of the temperature control frame, and the control module is electrically connected to the drive motor and the pressure sensor.

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