A method and device for calibrating a phantom for detecting an optical transmission path in a near-infrared brain functional imaging device

Abstract

This application relates to the field of detection technology for near-infrared brain function imaging devices, and provides a method and apparatus for calibrating a phantom used to detect optical transmission pathways in near-infrared brain function imaging devices. The method includes utilizing a transmitting probe and a receiving probe from the same probe assembly to obtain standard attenuation intensity data for incident light emitted from a standard phantom after entering a standard detection environment of the standard phantom, and test attenuation intensity data for incident light emitted from a test phantom after entering a test detection environment of a test phantom; the standard phantom has a preset attenuation intensity for the incident light; and determining a light attenuation calibration result for the test phantom based on the standard attenuation intensity data and the test attenuation intensity data. This method improves the accuracy of detecting optical transmission pathways in near-infrared brain function imaging devices using the calibrated test phantom.

Description

Technical Field

[0001] The present application relates to the technical field of detection of near-infrared brain function imaging equipment, and in particular to a method and apparatus for calibrating a phantom used for detecting an optical transmission path in a near-infrared brain function imaging equipment. Background Art

[0002] Near-infrared brain imaging technology uses near-infrared light to detect hemodynamic responses in brain tissue, indirectly reflecting neuronal activity and its changing patterns within local brain tissue. Near-infrared brain imaging equipment includes light transmission components such as a light source, a transmitting probe (which can be housed within the transmitting probe), a receiving probe, and a light receiving unit. These components form the optical transmission pathway for transmitting near-infrared light to the brain and / or receiving near-infrared light from the brain. The performance of this optical transmission pathway directly affects the device's detection results.

[0003] To ensure the performance of near-infrared brain imaging equipment after a period of use, engineers need to regularly test it using testing equipment to evaluate its performance. Furthermore, if a near-infrared brain imaging device malfunctions, testing equipment is also required to identify the cause.

[0004] However, due to differences in the models, manufacturers, production batches, and manufacturing processes of the detection equipment, there will be certain deviations in the detection results of the optical transmission pathway in the near-infrared brain function imaging device by each detection equipment. Even if the detection equipment has the same structure, there will be certain deviations when manufactured using the same manufacturing process, which will lead to certain deviations in the detection results of the optical transmission pathway in the near-infrared brain function imaging device. The near-infrared light emitted by the near-infrared brain function imaging device to the brain and the near-infrared light received from the brain are both relatively weak. In particular, the near-infrared light will be absorbed and scattered after entering the brain tissue. The near-infrared light emitted from the brain through the brain tissue is even weaker (i.e., the near-infrared light received from the brain), and its optical power can reach the picowatt (watt) level. Therefore, the performance requirements for the optical transmission pathway in the near-infrared brain function imaging device are very high. The detection equipment needs to detect the optical transmission pathway in the near-infrared brain function imaging device more accurately so that the detection results can more accurately evaluate the performance of the optical transmission pathway. Summary of the Invention

[0005] The present application addresses the aforementioned technical issues in the prior art and aims to provide a method and apparatus for calibrating a phantom used to detect an optical transmission path in a near-infrared brain function imaging device, which can correct the intensity of light emitted from the test phantom so that the performance of the optical transmission path in the near-infrared brain function imaging device can be accurately detected based on the calibrated test phantom.

[0006] According to a first embodiment of the present application, there is provided a method for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device, the near-infrared brain function imaging device comprising at least one probe group, wherein each probe group comprises a transmitting probe for emitting near-infrared light toward an object and a receiving probe for acquiring near-infrared light from the object. The method comprises: utilizing the transmitting probe and receiving probe in the same probe group to obtain standard attenuation light intensity data of outgoing light emitted from the standard phantom after the emitted incident light enters a standard detection environment of the standard phantom, and obtaining test attenuation light intensity data of outgoing light emitted from the test phantom after the emitted incident light enters a test detection environment of the test phantom; wherein both the standard phantom and the test phantom are used to simulate the attenuation of the incident light emitted by the transmitting probe in the test environment, and the standard phantom has a preset attenuation intensity for the incident light; and determining a light attenuation calibration result of the test phantom based on the standard attenuation light intensity data and the test attenuation light intensity data.

[0007] According to a second embodiment of the present application, there is provided an apparatus for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device, the apparatus comprising a processing unit, the near-infrared brain function imaging device comprising at least one probe group, wherein each probe group comprises a transmitting probe for emitting near-infrared light toward an object and a receiving probe for acquiring near-infrared light from the object, the processing unit being configured to: utilize the transmitting probe and receiving probe in the same probe group to obtain standard attenuation light intensity data of outgoing light emitted from the standard phantom after the emitted incident light enters a standard detection environment of the standard phantom, and to obtain test attenuation light intensity data of outgoing light emitted from the test phantom after the emitted incident light enters a test detection environment of the test phantom; wherein both the standard phantom and the test phantom are used to simulate the attenuation of the incident light emitted by the transmitting probe in the test environment, and the standard phantom has a preset attenuation intensity for the incident light; and determine a light attenuation calibration result of the test phantom based on the standard attenuation light intensity data and the test attenuation light intensity data.

[0008] According to a third embodiment of the present application, a computer-readable storage medium is provided, which stores a computer program. When executed by a processing unit, the computer program performs the following steps: utilizing a transmitting probe for transmitting near-infrared light to an object and a receiving probe for acquiring near-infrared light from an object in the same probe group in a near-infrared brain functional imaging device, obtaining standard attenuation light intensity data of outgoing light emitted from the standard phantom after the incident light emitted enters a standard detection environment of the standard phantom, and obtaining test attenuation light intensity data of outgoing light emitted from the test phantom after the incident light emitted enters a test detection environment of the test phantom; wherein the standard phantom and the test phantom are both used to simulate the attenuation of the incident light emitted by the transmitting probe in the test environment, and the standard phantom has a preset attenuation intensity for the incident light; and determining a light attenuation calibration result of the test phantom based on the standard attenuation light intensity data and the test attenuation light intensity data.

[0009] Compared with the prior art, the embodiments of the present application have the following advantages:

[0010] The present invention provides a method for calibrating a phantom used to detect an optical transmission path in a near-infrared brain function imaging device. The method utilizes a transmitting probe and a receiving probe from the same probe set to obtain standard attenuation light intensity data and test attenuation light intensity data based on a standard phantom and a test phantom, respectively. The method then obtains a light attenuation calibration result for the test phantom based on the standard attenuation light intensity data and the test attenuation light intensity data. The standard phantom has a preset attenuation intensity for incident light. By establishing a correlation between the standard attenuation light intensity data and the test attenuation light intensity data, the light attenuation calibration result for the test phantom can be determined. This light attenuation calibration result can then be used to eliminate the adverse effects of individual differences in the test phantoms when detecting the performance of the optical transmission path in the near-infrared brain function imaging device. That is to say, when detecting the performance of the optical transmission path in the near-infrared brain function imaging device, the light attenuation calibration result can be used to correct the light intensity of the output light emitted from the test phantom, which can avoid the problem of insufficient accuracy of the detection results of the optical transmission path in the near-infrared brain function imaging device due to individual differences of the test phantom such as different physical detection environments, different equipment models, different factory batches, and manufacturing processes.

[0011] Based on the light attenuation calibration results, the actual light attenuation of the test phantom relative to the standard detection environment provided by the standard phantom can be determined. This allows the light attenuation intensity of the test phantom to be corrected, ensuring that the light attenuation intensity of the incident light entering the test phantom's detection environment is equivalent to the standard value. This allows the light intensity of the light emitted from the test phantom to be corrected, which helps improve the accuracy and reliability of the test results of the optical transmission path in near-infrared brain functional imaging equipment using the calibrated test phantom.

[0012] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above description and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In the drawings, which are not necessarily drawn to scale, the same reference numerals may describe similar components in different views. Similar reference numerals with letter suffixes or different letter suffixes may represent different examples of similar components. The accompanying drawings generally illustrate various embodiments by way of example and not by way of limitation, and together with the description and claims, serve to illustrate the disclosed embodiments. Such embodiments are illustrative and exemplary and are not intended to be exhaustive or exclusive embodiments of the present method, apparatus, or non-transitory computer-readable medium having instructions for implementing the method.

[0014] Figure 1 A schematic diagram showing the optical transmission path in the near-infrared brain functional imaging device according to an embodiment of the present application.

[0015] Figure 2 A flow chart of a method for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device according to an embodiment of the present application is shown.

[0016] Figure 3 A schematic structural diagram of a standard phantom according to an embodiment of the present application is shown.

[0017] Figure 4 A schematic structural diagram of a test phantom according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0018] In order to enable those skilled in the art to better understand the technical solution of the present application, the present application is described in detail below in conjunction with the accompanying drawings and specific embodiments. The embodiments of the present application are further described in detail below in conjunction with the accompanying drawings and specific embodiments, but are not intended to limit the present application.

[0019] The words "first", "second" and similar terms used in this application do not indicate any order, quantity or importance, but are only used to distinguish. The words "include" or "comprises" and similar terms used in this application mean that the elements before the word include the elements listed after the word, and do not exclude the possibility of covering other elements. In this application, the arrows shown in the figures of each step are only examples of the execution order, not limitations. The technical solution of this application is not limited to the execution order described in the embodiments. The steps in the execution order can be combined, decomposed, or swapped, as long as the logical relationship of the execution content is not affected.

[0020] All terms used in this application (including technical or scientific terms) have the same meaning as understood by a person of ordinary skill in the art to which this application belongs, unless otherwise specifically defined. It should also be understood that terms defined in common dictionaries, for example, should be interpreted as having a meaning consistent with their meaning in the context of the relevant art and should not be interpreted in an idealized or highly formal sense, unless explicitly defined as such herein. Techniques and devices known to a person of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, such techniques and devices should be considered part of the specification.

[0021] First, the optical transmission pathway within the near-infrared brain imaging device described in this application is introduced. The optical transmission pathway within the near-infrared brain imaging device described in this application represents the transmission path of near-infrared light used by the device when in operation. Specifically, it refers to the components of the device related to optical transmission when in its complete state. It is understood that the complete state of the near-infrared brain imaging device refers to the state in which all optical transmission-related components have been assembled or connected, allowing the device to enter operation directly. For example, by placing a head cap on a subject's head and turning it on, the device can enter operation and collect near-infrared signals from the subject's head. It is understood that the components related to optical transmission may include at least one of a light source, a transmitting probe, a receiving probe, a transmission cable (e.g., an optical fiber) between the transmitting probe and the light source, a transmission cable between the receiving probe and the optical processing module, and a light receiving unit. In some embodiments, the components related to optical transmission may also include a head-mounted device for mounting the transmitting probe and / or the receiving probe. For example, the head-mounted device may be a head cap worn on the subject's head for mounting the transmitting probe and / or the receiving probe. The optical processing module may include a photoelectric sensor (e.g., a photoelectric conversion unit). The above-mentioned light transmission-related components can be arbitrarily combined and coordinated to form an optical transmission path for emitting near-infrared light to the brain and / or an optical transmission path for receiving near-infrared light from the brain. For example, some light source parts are directly installed in the transmitting probe, and the near-infrared light emitted by them can directly enter the subject's head without being transmitted through optical fiber. In near-infrared brain function imaging equipment used in scenarios such as nuclear magnetic resonance and transcranial magnetic resonance, the light source part is arranged inside the main unit, and the near-infrared light emitted by the light source part can be transmitted to the transmitting probe through an optical fiber cable and then enter the subject's head. For example, in some near-infrared brain function imaging devices, the near-infrared light from the subject can be transmitted to the optical processing module through optical fiber. In other near-infrared brain function imaging devices, the optical processing module can be integrated on a head cap, and the near-infrared light from the subject can be directly acquired by the optical processing module integrated on the head cap.

[0022] In summary, there is an optical transmission path in the near-infrared brain functional imaging device that transmits near-infrared light to the object and / or transmits near-infrared light from the object, but this application does not make specific restrictions on the setting position of the optical transmission path, the design of the specific components that constitute the optical transmission path, the combination of each component, the coordination method, etc.

[0023] For example, the schematic diagram of the light transmission path in the near-infrared brain function imaging device can be as follows: Figure 1 As shown, Figure 1As shown, the near-infrared brain function imaging device includes a host, a transmission cable, a transmitting probe S and a receiving probe D respectively connected to each transmission cable, and the transmitting probe S and the receiving probe D are assembled on a head cap, wherein the host includes a light source part and a light processing module. When the near-infrared brain function imaging device is used in the complete state, the near-infrared light emitted by the light source part enters the transmitting probe S on the head cap via the transmission cable, and is emitted from the transmitting probe S to enter the subject's head. The near-infrared light from the subject's head is acquired by the receiving probe D on the head cap and reaches the light processing module via the transmission cable. The light processing module processes and analyzes the near-infrared light signal and transmits it to the processor or display. At this time, the light transmission path in the near-infrared brain function imaging device in the complete state includes the host, the optical fiber cable, the transmitting probe S, the receiving probe D, and the head cap for installing the probe. This is only used as an example and does not constitute a limitation of the present application scheme.

[0024] Figure 2 A flowchart of a method for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device according to an embodiment of the present application is shown. In this flowchart, the arrows shown in the figure from step S201 to step S203 are merely examples of the execution order and are not limitations. The technical solution of the present application is not limited to the execution order described in the embodiments. The steps in the execution order can be combined, decomposed, or swapped, as long as the logical relationship of the execution content is not affected.

[0025] In this embodiment, the near-infrared brain imaging device includes at least one probe group, wherein each probe group includes a transmitting probe for emitting near-infrared light toward a subject and a receiving probe for receiving near-infrared light from the subject. Specifically, in a usage scenario, the near-infrared brain imaging device uses the transmitting probe to emit near-infrared light toward the subject's head and uses the receiving probe to receive near-infrared light scattered from the subject's head. The paired transmitting and receiving probes in each probe group form a detection channel.

[0026] In other embodiments of the present application, the near-infrared brain imaging device includes an optical transmission path for transmitting near-infrared light to and / or from a subject. For example, the near-infrared brain imaging device transmits near-infrared light to a subject's head, a phantom, or other device via a transmission cable. Furthermore, near-infrared light scattered from the subject's head or emitted by a phantom or other device may also be transmitted via the transmission cable.

[0027] In step S201, the transmitting probe and the receiving probe in the same probe group are used to obtain the standard attenuation intensity data of the outgoing light emitted from the standard phantom after the incident light enters the standard detection environment of the standard phantom. Specifically, Figure 3As shown, the same probe group includes a transmitting probe M and a receiving probe N arranged in pairs, which form a detection channel. The standard phantom 300 is used to simulate the attenuation of the incident light emitted by the transmitting probe M in the test environment, and the standard phantom 300 has a preset attenuation intensity for the incident light. It is understandable that the actual standard phantom 300 is relatively large and has only one mounting hole for installing the transmitting probe M and one mounting hole for installing the receiving probe N. It is difficult for engineers to carry the standard phantom 300 to the use site of the near-infrared brain function imaging equipment to perform maintenance work. Therefore, it is necessary to design a portable detection device to detect the optical transmission path in the near-infrared brain function imaging equipment. Since the technical requirements of the field are very high for the performance of the optical transmission path in the near-infrared brain function imaging equipment, it is necessary to ensure that the detection results of the detection device can accurately evaluate the performance of the optical transmission path.

[0028] Among them, the present application does not specifically limit the value or range of the preset attenuation intensity of the standard phantom 300 for incident light, and can be set according to national standards or industry specifications. For example, the preset attenuation intensity can be set to 60dB, that is, the attenuation intensity of the standard phantom 300 for light entering the standard detection environment it provides is the standard light attenuation intensity of 60dB.

[0029] Specifically, if Figure 3 The near-infrared brain function imaging device can emit near-infrared light to the standard phantom 300 through the transmitting probe M of the probe group. The incident light undergoes standard light attenuation after entering the standard detection environment of the standard phantom 300. The near-infrared light after standard light attenuation is emitted from the standard phantom 300. The receiving probe N in the near-infrared brain function imaging device receives the near-infrared light emitted from the standard phantom 300, and transmits the received near-infrared light to the data processing device through the optical transmission path to analyze and process the near-infrared light emitted from the standard phantom 300.

[0030] In step S202, the same probe group as used for standard phantom testing is used to obtain test attenuation intensity data of the outgoing light emitted from the test phantom after the incident light emitted by the transmitting probe enters the test environment of the test phantom.

[0031] That is to say, in order to ensure the accuracy of the calibration results, the probe group for standard phantom detection and test phantom detection can be the same probe group, so that the incident light entering the standard phantom and the test phantom is the same, based on the fact that the receiving probes for receiving the outgoing light of the standard phantom and the test phantom are the same, and when the near-infrared brain functional imaging equipment used is the same, the test phantom can be calibrated by controlling the variables (the variable is the phantom, and other test conditions are the same); in actual applications, different groups of probe groups with the same specifications / parameters can also be used for calibration, such as using two groups of probes with the same emission power for calibration, which can provide the same test environment for the standard phantom and the test phantom (such as the same optical power of the incident light), and the embodiments of the present disclosure are not limited to this.

[0032] The test phantom is also used to simulate the attenuation of incident light emitted by the transmitting probe within the test environment. In principle, the light attenuation intensity of the test phantom for light entering its test detection environment is consistent with the preset attenuation intensity of the standard phantom for incident light. That is, the test attenuation intensity data of the output light emitted from the test phantom is consistent with the standard attenuation intensity data of the output light emitted from the standard phantom. However, due to differences in the manufacturer of the test phantom, different factory batches, and manufacturing processes, there are differences between the test phantom and the standard phantom, resulting in deviations between the attenuation of the test detection environment provided by the test phantom and the attenuation of the standard detection environment provided by the standard phantom.

[0033] The present application found that directly using an uncalibrated test phantom to detect the optical transmission path in the near-infrared brain function imaging device, due to the individual differences of the test phantom, there are large deviations in the detection results of the optical transmission path in the near-infrared brain function imaging device in the whole machine state, thereby accurately evaluating the performance of the optical transmission path in the near-infrared brain function imaging device.

[0034] In step S203, the light attenuation calibration result of the test phantom is determined based on the standard attenuation light intensity data and the test attenuation light intensity data. By correcting the test attenuation light intensity data of the outgoing light emitted from the test phantom, the problem of inaccurate detection results of the optical transmission path due to individual differences in the test phantom can be avoided.

[0035] In some other embodiments of the present application, the test phantom includes at least one pair of holes to be calibrated, and each hole to be calibrated includes a transmitting hole for installing a transmitting probe and a receiving hole for installing a receiving probe. Preferably, the test phantom includes multiple holes to be calibrated so that multiple light transmission paths in the near-infrared brain function imaging device can be detected simultaneously to improve detection efficiency. Figure 4The test phantom shows 12 hole positions to be calibrated, wherein the first hole position to be calibrated includes a transmitting hole position A11 for installing a transmitting probe and a receiving hole position B11 for installing a receiving probe, the second hole position to be calibrated includes a transmitting hole position A12 for installing a transmitting probe and a receiving hole position B12 for installing a receiving probe, the third hole position to be calibrated includes a transmitting hole position A21 for installing a transmitting probe and a receiving hole position B21 for installing a receiving probe, and the fourth hole position to be calibrated includes a transmitting hole position A22 for installing a transmitting probe and a receiving hole position B22 for installing a receiving probe. These four hole positions to be calibrated are only used as examples, which does not mean that the test phantom has only these four hole positions to be calibrated. Other hole positions to be calibrated will not be illustrated one by one.

[0036] In some other embodiments of the present application, for each hole position to be calibrated, the test attenuation light intensity data of the outgoing light obtained from the receiving hole position after the incident light enters the transmitting hole position is obtained; based on the standard attenuation light intensity data and the test attenuation light intensity data corresponding to each hole position to be calibrated, the light attenuation calibration result corresponding to each hole position to be calibrated is determined. Specifically, Figure 4 The first hole position to be calibrated and the second hole position to be calibrated are shown as examples for description.

[0037] For the first hole position to be calibrated, its transmitting hole position A11 and receiving hole position B11 are respectively used to install a transmitting probe and a receiving probe from a preset probe group, so as to obtain first test attenuation light intensity data of the outgoing light emitted by the transmitting probe after the incident light enters the test detection environment through transmitting hole position A11 of the test phantom. In addition, standard attenuation light intensity data of the outgoing light emitted from the standard phantom after the incident light emitted by the transmitting probe from the preset probe group enters the standard detection environment of the standard phantom is obtained. Based on the first test attenuation light intensity data and the standard attenuation light intensity data, a light attenuation calibration result corresponding to the first hole position to be calibrated is obtained.

[0038] Of course, for the second hole position to be calibrated, its transmitting hole position A12 and receiving hole position B12 are respectively used to install the transmitting probe and receiving probe from the preset probe group. This is to obtain second test attenuation light intensity data of the outgoing light emitted by the transmitting probe after the incident light passes through transmitting hole position A12 of the test phantom and enters the test detection environment. Based on this second test attenuation light intensity data and the standard attenuation light intensity data, the light attenuation calibration result corresponding to the second hole position to be calibrated is obtained. In other words, the light attenuation calibration result of the test phantom includes the light attenuation calibration result corresponding to each hole position to be calibrated.

[0039] The light attenuation calibration result corresponding to each hole position to be calibrated includes: the attenuation intensity deviation between the light attenuation intensity of the hole position to be calibrated and the preset attenuation intensity, and / or the light attenuation intensity corresponding to the hole position to be calibrated. In other embodiments, the attenuation intensity deviation corresponding to each hole position to be calibrated can be determined based on the ratio of the test attenuation light intensity data corresponding to each hole position to be calibrated to the standard attenuation light intensity data. The relationship between the test attenuation light intensity data and the standard attenuation light intensity data can be established through the ratio of the test attenuation light intensity data corresponding to each hole position to be calibrated to the standard attenuation light intensity data.

[0040] Specifically, the attenuation intensity deviation can be calculated according to formula (1): ΔdB=10log 10 (I 测 / I 标 ), where ΔdB represents the attenuation intensity deviation, I 测 Indicates the test attenuation light intensity data, I 标 Indicates standard attenuation light intensity data.

[0041] Based on the attenuation intensity deviation and the preset attenuation intensity, the light attenuation intensity of each hole to be calibrated can be obtained. For example, if the preset attenuation intensity is 60 dB and the attenuation intensity deviation calculated according to formula (1) is 3 dB, then the light attenuation intensity corresponding to the test phantom is 57 dB.

[0042] In some embodiments of the present application, the light attenuation calibration results can be stored in a storage space corresponding to the test phantom. This storage space can be a storage device located within the test phantom. The storage device can be a USB flash drive physically restricted to read-only status, or other types of storage devices, without limitation. This storage device can also store other device information about the test phantom. After the near-infrared brain functional imaging device is connected to the test phantom, the near-infrared brain functional imaging device can directly read the relevant device information stored in the storage device and directly obtain the light attenuation calibration results for the test phantom.

[0043] In the above embodiments, the standard attenuated light intensity data and the test attenuated light intensity data can both be light intensity voltage values that characterize light intensity, or related parameters for converting between light intensity voltage values and light intensity, or other conversion parameters obtained based on the emitted light, without limitation.

[0044] In other embodiments of the present application, the transmitting probe emits near-infrared light of at least two preset wavelengths, and the light attenuation calibration result includes the light attenuation calibration result at each preset wavelength. For example, the preset wavelengths of the near-infrared light may include 730 nm, 808 nm, 850 nm, etc., without limitation. For example, when the preset wavelength is 730 nm, standard attenuation light intensity data and test attenuation light intensity data at a wavelength of 730 nm are obtained based on a standard phantom and a test phantom, respectively. Based on the standard attenuation light intensity data and the test attenuation light intensity data, the light attenuation calibration result of the test phantom at a wavelength of 730 nm is determined. This is merely an example and does not constitute a limitation on the specific solution.

[0045] In some other embodiments of the present application, the standard phantom includes a light attenuation component, such as Figure 3 The optical attenuation assembly may include a first optical attenuator 3011, a second optical attenuator 3012, and an aperture adjustment block 303. Incident light emitted by the transmitting probe M enters the first optical attenuator 3011, passes through the variable aperture 302, and then enters the second optical attenuator 3012. After exiting the second optical attenuator 3012, the light is received by the receiving probe N. The size of the variable aperture 302 can be adjusted by adjusting the position of the aperture adjustment block 303.

[0046] Specifically, before using the standard phantom, the standard phantom can be tested, specifically by obtaining a first optical power value of incident light emitted by a transmitting probe and a second optical power value of outgoing light emitted from the standard phantom after the incident light enters the standard testing environment of the standard phantom. Based on the first and second optical power values, an adjustment method corresponding to the optical attenuation component in the standard phantom is determined, and the standard phantom is adjusted based on the adjustment method. In this way, the standard phantom can be guaranteed to have a preset attenuation intensity for incident light.

[0047] For example, an optical power meter can be used to test the optical power value. Specifically, the transmitting probe in the preset probe group of the near-infrared brain functional imaging device can be fixed to the photosensitive probe of the optical power meter through a tool, and near-infrared light is emitted from the transmitting probe. The photosensitive probe is illuminated and a first optical power value is read on the optical power meter. Then, the transmitting probe and receiving probe in the preset probe group can be installed in the transmitting and receiving holes of the test phantom respectively, and the second optical power value can be read using the receiving probe. Alternatively, the photosensitive probe of the optical power meter can be fixed to the receiving hole of the test phantom, and the second optical power value can be read using the photosensitive probe. The corresponding adjustment method of the optical attenuation component can then be determined by comparing the first and second optical power values.

[0048] like Figure 3Assuming the preset attenuation intensity is 60 dB, if the attenuation intensity of the standard phantom obtained using the second optical power value and the first optical power value is not 60 dB, the diameter of the variable aperture 302 can be expanded or reduced by adjusting the aperture adjustment block 303 until the attenuation intensity of the standard phantom equals 60 dB, thereby determining the standard phantom at that time. This is merely an example, and the adjustment method for the standard phantom can be adjusted according to its specific structure.

[0049] In some embodiments of the present application, a device for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device is provided, the device comprising a processing unit, the near-infrared brain function imaging device comprising at least one probe group, wherein each probe group comprises a transmitting probe for emitting near-infrared light to an object and a receiving probe for acquiring near-infrared light from the object, the processing unit being configured to: utilize the transmitting probe and receiving probe in the same probe group to obtain standard attenuation light intensity data of outgoing light emitted from the standard phantom after the emitted incident light enters a standard detection environment of the standard phantom, and to obtain test attenuation light intensity data of outgoing light emitted from the test phantom after the emitted incident light enters a test detection environment of the test phantom; wherein both the standard phantom and the test phantom are used to simulate the attenuation of the incident light emitted by the transmitting probe in the test environment, and the standard phantom has a preset attenuation intensity for the incident light; and determine the light attenuation calibration result of the test phantom based on the standard attenuation light intensity data and the test attenuation light intensity data.

[0050] In this way, the device can correct the light attenuation intensity of the test phantom, so that the light attenuation intensity of the incident light entering the test detection environment of the test phantom is equivalent to the standard value, and can correct the attenuation of the incident light in the test detection environment of the test phantom to the attenuation in the standard detection environment of the standard phantom, thereby achieving the purpose of correcting the light intensity of the outgoing light emitted from the test phantom, which is conducive to improving the accuracy and reliability of the detection results of the optical transmission path in the near-infrared brain functional imaging equipment based on the calibrated test phantom.

[0051] This application describes various operations or functions that can be implemented as software code or instructions or defined as software code or instructions. Such content can be source code or differential code ("incremental" or "patch" code) that can be directly executed ("object" or "executable" form). Software code or instructions can be stored in a computer-readable storage medium and, when executed, can cause a machine to perform the described functions or operations, and include any mechanism for storing information in a form accessible to a machine (e.g., a computing device, an electronic system, etc.), such as recordable or non-recordable media (e.g., read-only memory (ROM), random access memory (RAM), magnetic disk storage media, optical storage media, flash memory devices, etc.).

[0052] The exemplary methods described herein can be at least partially implemented by a machine or computer. In some embodiments, a computer-readable storage medium stores computer program instructions, which, when executed by a processing unit, performs the following steps: utilizing a transmitting probe for transmitting near-infrared light to a subject and a receiving probe for acquiring near-infrared light from the subject in the same probe group of a near-infrared brain functional imaging device to acquire standard attenuation intensity data of light emitted from the standard phantom after the incident light emitted enters a standard detection environment of the standard phantom, and acquiring test attenuation intensity data of light emitted from the test phantom after the incident light emitted enters a test detection environment of the test phantom; wherein both the standard phantom and the test phantom are used to simulate the attenuation of the incident light emitted by the transmitting probe in the test environment, and the standard phantom has a preset attenuation intensity for the incident light; and determining a light attenuation calibration result for the test phantom based on the standard attenuation intensity data and the test attenuation intensity data.

[0053] In addition, the methods for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device provided in the embodiments of the present application can be combined here and will not be described in detail here.

[0054] Implementations of such methods may include software code, such as microcode, assembly language code, high-level language code, and the like. Various software programming techniques may be used to create various programs or program modules. For example, program portions or program modules may be designed using or with the aid of Java, Python, C, C++, assembly language, or any other known programming language. One or more of such software portions or modules may be integrated into a computer system and / or computer-readable media. Such software code may include computer-readable instructions for performing the various methods. The software code may form part of a computer program product or computer program module. Furthermore, in an example, the software code may be tangibly stored on one or more volatile, non-transitory, or non-volatile tangible computer-readable media, such as during execution or at other times. Examples of such tangible computer-readable media may include, but are not limited to, hard disks, removable disks, removable optical disks (e.g., optical disks and digital video disks), magnetic cassettes, memory cards or sticks, random access memory (RAM), read-only memory (ROM), and the like.

[0055] Furthermore, although exemplary embodiments have been described herein, the scope includes any and all embodiments based on the present application with equivalent elements, modifications, omissions, combinations (e.g., solutions that intersect various embodiments), adaptations, or changes. The elements of the claims are to be interpreted broadly based on the language employed in the claims and are not limited to the examples described in this specification or during the prosecution of the application, which examples are to be construed as non-exclusive. Therefore, it is intended that this specification and examples be considered merely as examples, with the true scope and spirit being indicated by the following claims and their full scope of equivalents.

[0056] The above description is intended to be illustrative and not restrictive. For example, the above examples (or one or more of their embodiments) may be used in combination with each other. For example, a person of ordinary skill in the art may use other embodiments when reading the above description. In addition, in the above detailed description, various features may be grouped together to simplify the application. This should not be interpreted as an intention that a disclosed feature that is not claimed for protection is essential to any claim. On the contrary, the subject matter of the present application may have less than all the features of a particular disclosed embodiment. Thus, the claims are incorporated herein into the detailed description as examples or embodiments, with each claim independently serving as a separate embodiment, and it is contemplated that these embodiments may be combined with each other in various combinations or arrangements. The scope of the present application should be determined with reference to the appended claims and the full scope of equivalents to which such claims are entitled.

[0057] The above embodiments are merely exemplary embodiments of the present application and are not intended to limit the scope of the present application. The scope of protection of the present application is defined by the claims. Those skilled in the art may make various modifications or equivalent substitutions to the present application within the essence and scope of protection of the present application, and such modifications or equivalent substitutions shall also be deemed to fall within the scope of protection of the present application.

Claims

1. A method for calibrating a phantom used to detect an optical transmission path in a near-infrared brain function imaging device, characterized in that: The near-infrared brain function imaging device includes at least one probe group, wherein each probe group includes a transmitting probe for transmitting near-infrared light to the subject and a receiving probe for acquiring near-infrared light from the subject. The method includes: Using a transmitting probe and a receiving probe in the same probe group, obtain standard attenuation intensity data of the output light emitted from the standard phantom after the emitted incident light enters the standard detection environment of the standard phantom, and obtain test attenuation intensity data of the output light emitted from the test phantom after the emitted incident light enters the test detection environment of the test phantom; The standard phantom and the test phantom are both used to simulate the attenuation of the incident light emitted by the transmitting probe in the test environment, and the standard phantom has a preset attenuation intensity for the incident light; Determining a light attenuation calibration result of the test phantom based on the standard attenuation light intensity data and the test attenuation light intensity data, so as to correct the light attenuation intensity of the test phantom based on the light attenuation calibration result, wherein the light attenuation calibration result of the test phantom includes a light attenuation calibration result corresponding to each well position to be calibrated; the method further comprises: The light attenuation calibration result is stored in the storage space corresponding to the test phantom, so that the near-infrared brain functional imaging device can directly obtain the light attenuation calibration result of the test phantom.

2. The method according to claim 1, characterized in that The test phantom comprises at least one pair of holes to be calibrated, and each hole to be calibrated comprises a transmitting hole for installing a transmitting probe and a receiving hole for installing a receiving probe.

3. The method according to claim 1 or 2, characterized in that The transmitting probe emits near-infrared light of at least two preset wavelengths, and the light attenuation calibration result includes the light attenuation calibration result at each preset wavelength.

4. The method according to claim 2, characterized in that The method comprises determining the light attenuation calibration results corresponding to each hole position to be calibrated in the test phantom according to the following steps: For each hole position to be calibrated, obtain the test attenuation intensity data of the outgoing light obtained from the receiving hole position after the incident light enters the transmitting hole position; Based on the standard attenuated light intensity data and the test attenuated light intensity data corresponding to each hole position to be calibrated, the light attenuation calibration result corresponding to each hole position to be calibrated is determined.

5. The method according to claim 2 or 4, characterized in that The light attenuation calibration result corresponding to each hole position to be calibrated includes: the attenuation intensity deviation between the light attenuation intensity of the hole position to be calibrated and the preset attenuation intensity, and / or the light attenuation intensity corresponding to the hole position to be calibrated.

6. The method according to claim 5, characterized in that The method comprises determining the attenuation intensity deviation corresponding to each hole position to be calibrated according to the following steps: The attenuation intensity deviation corresponding to each hole position to be calibrated is determined based on the ratio of the test attenuation light intensity data corresponding to each hole position to be calibrated to the standard attenuation light intensity data.

7. The method according to claim 1, characterized in that The standard phantom includes a light attenuation component; before using the standard phantom, the method further includes: Acquiring a first optical power value of incident light emitted by the transmitting probe, and a second optical power value of outgoing light emitted from the standard phantom after the incident light enters the standard detection environment of the standard phantom; Based on the first optical power value and the second optical power value, an adjustment method corresponding to the optical attenuation component in the standard phantom is determined, so as to adjust the standard phantom based on the adjustment method.

8. A device for calibrating a phantom used for detecting an optical transmission path in a near-infrared brain function imaging device, using a method for calibrating a phantom used for detecting an optical transmission path in a near-infrared brain function imaging device as claimed in any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, which, when executed by the processing unit, performs a method for calibrating a phantom for detecting an optical transmission path in a near-infrared brain function imaging device according to any one of claims 1 to 7.

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