Resistance testing method, device, storage medium and program product

Abstract

The present application discloses a resistance testing method, device, storage medium and program product, and relates to the field of resistance needle testing technology, including: obtaining a resistance image of a resistor to be tested and a pinhole image of a test needle holder; a pinhole is provided on the test needle holder, and the pinhole is used to place a test probe for resistance testing; based on the resistance image, the resistance position information of the resistor to be tested is determined; based on the pinhole image, the pinhole position information is determined; based on the resistance position information and the pinhole position information, the position of the test needle holder is adjusted so that the test probe is aligned with the resistor to be tested for resistance needle testing. The present application can accurately locate the needle test position, and solve the technical problem of low resistance test accuracy caused by poor positioning accuracy in the related art.

Description

Technical Field

[0001] The present application relates to the technical field of resistance needle testing, and in particular to a resistance testing method, device, storage medium and program product. Background Art

[0002] In the related art, when measuring the temperature coefficient of a resistor, the position of the needle is usually determined by human eyes, and then the test probe is controlled to perform a needle test on the resistor to be tested. However, the manual positioning method is difficult to ensure the accuracy of the needle position, which will affect the accuracy of the temperature coefficient measurement result of the resistor to be tested. Summary of the invention

[0003] The main purpose of this application is to provide a resistance testing method, device, storage medium and program product, aiming to solve the technical problem of low resistance testing accuracy in related technologies.

[0004] To achieve the above objectives, the present application proposes a resistance testing method, comprising:

[0005] Obtaining a resistance image of the resistor to be tested and a pinhole image of the test needle holder; the test needle holder is provided with a pinhole, and the pinhole is used to place a test probe for resistance testing;

[0006] Based on the resistance image, determining the resistance position information of the resistor to be tested;

[0007] Based on the pinhole image, pinhole position information is determined;

[0008] Based on the resistor position information and the pinhole position information, the position of the test needle holder is adjusted so that the test probe is aligned with the resistor to be tested to perform the resistance needle test.

[0009] In one embodiment, the step of determining the resistance position information of the resistor to be tested based on the resistance image includes:

[0010] Performing grayscale matching on the resistor image based on the resistor standard image to determine the resistor region image in the resistor image to be tested;

[0011] Extract edge contours of resistor region images;

[0012] Based on the edge contour, the resistor position information is determined; the resistor position information includes the placement angle information of the resistor to be tested.

[0013] In one embodiment, after the step of determining the resistor position information based on the edge profile, the step further includes:

[0014] Binarizing the resistor region image to obtain a resistor region binary image;

[0015] Extracting the electrode area contour from the resistor area binary image;

[0016] Perform matrix fitting on the electrode area contour to obtain the electrode fitting model;

[0017] Based on the electrode fitting model, determining the electrode geometric parameters of the resistor to be tested; the electrode geometric parameters include electrode length and electrode width;

[0018] Based on the electrode geometry parameters, the resistor position information is corrected.

[0019] In one embodiment, the resistor to be tested is placed on a carrier plate; the test needle holder includes a first test needle holder disposed on one side of the carrier plate and a second test needle holder disposed on the other side of the carrier plate; the pinhole image includes a first pinhole image of the first test needle holder and a second pinhole image of the second test needle holder;

[0020] Based on the pinhole image, the steps of determining the pinhole position information include:

[0021] Performing grayscale matching on the first pinhole image based on the first pinhole standard image to determine position information of the first pinhole;

[0022] Grayscale matching is performed on the second pinhole image based on the second pinhole standard image to determine position information of the second pinhole.

[0023] In one embodiment, the step of adjusting the position of the test pin holder based on the resistance position information and the pinhole position information includes:

[0024] Determining pinhole difference information between the first pinhole and the second pinhole based on the position information of the first pinhole and the position information of the second pinhole;

[0025] Based on the pinhole difference information and the resistor position information, the position of the test pin holder is adjusted.

[0026] In one embodiment, the pinhole difference information includes angle information between the first pinhole and the second pinhole;

[0027] Based on the pinhole difference information and the resistance position information, the steps of adjusting the position of the test needle seat include:

[0028] Based on the difference between the angle information and the placement angle information of the resistor to be tested, the position of the test needle holder or the position of the carrier plate is adjusted so that the resistor to be tested, the first pinhole and the second pinhole are located on the same vertical plane.

[0029] In one embodiment, the pinhole difference information includes distance information between the first pinhole and the second pinhole; the resistor position information includes electrode distance information;

[0030] Based on the pinhole difference information and the resistance position information, the step of adjusting the position of the test needle holder also includes:

[0031] Based on the distance information and the electrode distance information, the position of the test needle holder is adjusted.

[0032] In addition, to achieve the above objectives, the present application also proposes a resistance testing device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the resistance testing method as described above.

[0033] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium. A computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the resistance testing method as described above are implemented.

[0034] In addition, to achieve the above-mentioned purpose, the present application also proposes a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps of the resistance testing method as described above are implemented.

[0035] One or more technical solutions proposed in this application have at least the following technical effects:

[0036] In the resistance testing method provided in the present application, a resistance image of the resistor to be tested and a pinhole image of the test needle holder can be obtained; wherein, a pinhole is provided on the test needle holder, and the pinhole is used to place a test probe for resistance testing; based on the resistance image, the resistance position information of the resistor to be tested can be determined; based on the pinhole image, the pinhole position information can be determined; thus, based on the resistance position information and the pinhole position information, the position of the test needle holder can be adjusted so that the test probe is aligned with the resistor to be tested to perform a resistance pinning test.

[0037] The present application can determine relatively accurate resistance position information and pinhole position information through the resistance image and pinhole image during the test, thereby automatically adjusting the position of the test needle holder according to the above information to ensure that the test probe can correctly contact the resistance test point, reducing the alignment error that may be caused by manual positioning, and can effectively improve the accuracy of the resistance test. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related technologies, the drawings required for use in the embodiments or the related technical descriptions are briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0040] Figure 1A schematic diagram of a flow chart provided for the first embodiment of the resistance testing method of the present application;

[0041] Figure 2 This is a schematic diagram of a resistance test environment structure;

[0042] Figure 3 This is a schematic diagram of the resistor to be tested and the position of the needle holder before adjustment;

[0043] Figure 4 A schematic diagram of the resistor to be tested and the needle holder position after adjustment is shown in FIG.

[0044] Figure 5 Schematic diagram of the device structure of the hardware operating environment involved in the resistance testing method in the embodiment of the present application.

[0045] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0046] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0047] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0048] The main solution of the embodiment of the present application is: obtaining a resistance image of the resistor to be tested and a pinhole image of the test needle holder; a pinhole is provided on the test needle holder, and the pinhole is used to place a test probe for resistance testing; based on the resistance image, the resistance position information of the resistor to be tested is determined; based on the pinhole image, the pinhole position information is determined; based on the resistance position information and the pinhole position information, the position of the test needle holder is adjusted to align the test probe with the resistor to be tested for resistance pinning test.

[0049] In the related art, when measuring the temperature coefficient of a resistor, the position of the needle is usually determined by human eyes, and then the test probe is controlled to perform a needle test on the resistor to be tested. However, the manual positioning method is difficult to ensure the accuracy of the needle position, which will affect the accuracy of the temperature coefficient measurement result of the resistor to be tested.

[0050] The present application provides a solution, which can determine relatively accurate resistance position information and pinhole position information through the resistance image and pinhole image during the test, thereby automatically adjusting the position of the test needle holder according to the above information to ensure that the test probe can correctly contact the resistance test point, reducing the alignment error that may be caused by manual positioning, and can effectively improve the accuracy of the resistance test.

[0051] It should be noted that the execution subject of this embodiment can be a computing service device with data processing, network communication and program running functions, such as a tablet computer, a personal computer, etc., or an electronic device capable of realizing the above functions, etc. The following takes a resistance testing device as an example to illustrate this embodiment and the following embodiments.

[0052] Based on this, the present application embodiment provides a resistance testing method, referring to Figure 1 , Figure 1 This is a flow chart of the first embodiment of the resistance testing method of the present application.

[0053] In this embodiment, the resistance testing method includes steps S100 to S400:

[0054] Step S100, obtaining a resistance image of the resistor to be tested and a pinhole image of the test needle holder.

[0055] Wherein, a pinhole is arranged on the test needle holder, and the pinhole is used for placing a test probe for resistance testing.

[0056] Step S200: determining the resistance position information of the resistor to be tested based on the resistance image.

[0057] Step S300: determining the pinhole position information based on the pinhole image.

[0058] Step S400, based on the resistor position information and the pinhole position information, the position of the test needle holder is adjusted so that the test probe is aligned with the resistor to be tested to perform a resistance pin test.

[0059] Specifically, when performing a resistance test, the resistor to be tested is generally placed on a carrier plate, and at least one test needle holder is arranged around the carrier plate. The test needle holder is provided with a pinhole, and the pinhole is used to place the test probe for the resistance test. In practical applications, an image acquisition device (such as a high-resolution camera, an industrial camera, etc.) can be used to capture the resistance image of the resistor to be tested and the pinhole image of the test needle holder. For ease of understanding, Figure 2 A schematic diagram of the structure of an example resistance test environment is shown; Figure 2 As shown, the resistor to be tested can be placed on a loading tray 1, and a first test needle holder 2a is provided on one side of the loading tray 1, and a second test needle holder 2b is provided on the other side of the loading tray; the image acquisition device 3 can be provided directly above the loading tray 1, and before performing the resistance test, the resistance image of the resistor to be tested placed on the loading tray 1 and the pinhole images of the first test needle holder 2a and the second test needle holder 2b can be acquired by the image acquisition device 3.

[0060] After obtaining the resistor image, an image processing algorithm may be used to analyze and process the resistor image to determine the resistor position information of the resistor to be tested. In a feasible implementation, step S200 may specifically include steps S210 to S230:

[0061] Step S210 , grayscale matching is performed on the resistor image based on the resistor standard image to determine the resistor region image in the resistor image to be tested.

[0062] Step S220, extracting the edge contour of the resistor region image.

[0063] Step S230: determining resistor position information based on the edge contour.

[0064] The resistor position information includes the placement angle information of the resistor to be tested.

[0065] Specifically, the collected resistance image of the resistor to be tested may include redundant elements other than the resistor (such as shooting background, etc.). In order to avoid the redundant elements from affecting the accuracy of the resistor position determined subsequently, the image of the standard resistor corresponding to the resistor to be tested (i.e., the resistor standard image) can be prepared in advance as a resistor matching template; then the collected resistance image of the resistor to be tested is compared with the resistor matching template (i.e., the resistor standard image) using a grayscale matching algorithm, and the area with the highest matching degree is determined in the resistor image, which is the resistor area image; after obtaining the resistor area image, an edge detection algorithm (such as Canny edge detection, Sobel filtering, etc.) can be used to extract the edge contour of the resistor area image, and after the edge contour of the resistor is extracted, the resistor position information can be determined based on the edge contour; wherein the resistor position information may include the placement angle information and boundary position information of the resistor to be tested; for example, based on the extracted edge contour, it can be roughly determined that the resistor to be tested is a rectangle, and then by analyzing the vertices of the rectangle, the major axis and minor axis of the rectangle can be calculated; and based on the angle between the major axis and the horizontal line, the placement angle of the resistor to be tested can be determined.

[0066] It is worth mentioning that since the electrodes of resistors are usually made of thinner metal materials, they may be deformed by mechanical pressure during resistor processing or test feeding. Therefore, in actual testing, the electrode shape of each resistor to be tested may be irregular. In order to ensure that more accurate position information of the resistor to be tested is determined, steps S240 to S280 may be specifically included after step S230 to adjust and correct the resistor position information:

[0067] Step S240, binarizing the resistor region image to obtain a resistor region binary image.

[0068] Step S250, extracting the electrode region contour in the resistor region binary image.

[0069] Step S260, performing matrix fitting on the electrode area contour to obtain an electrode fitting model.

[0070] Step S270, determining the electrode geometric parameters of the resistor to be tested based on the electrode fitting model.

[0071] Among them, the electrode geometric parameters include electrode length and electrode width.

[0072] Step S280, correcting the resistor position information based on the electrode geometric parameters.

[0073] Specifically, the resistor region image determined above can be binarized to obtain the corresponding resistor region binary image; the binarization process can convert the resistor region image into black and white, which can provide a clearer image basis for subsequent contour extraction, feature analysis, and geometric parameter calculation. Similarly, the electrode region contour can be extracted from the resistor region binary image using edge detection or contour extraction algorithms (such as Canny edge detection, Sobel operator, or contour tracking algorithm, etc.), which can identify the edge of the electrode and generate electrode contour data. The electrode region contour extracted is subjected to matrix fitting, and the electrode fitting model can be obtained; for example, the coordinate matrix composed of the electrode contour data can be fitted into a standard geometric model (i.e., electrode fitting model) that can describe the electrode shape by using the least squares method; according to the specific electrode fitting model, the electrode geometric parameters such as electrode length and electrode width can be determined, and the electrode geometric parameters can help provide a more accurate reference for the resistance position, so the electrode geometric parameters can be used to further correct the position information of the resistance to be tested, so that the corrected resistance position information is closer to the actual situation.

[0074] Similarly, after obtaining the pinhole image of the test needle holder, the pinhole position information can also be determined based on the pinhole image; in a feasible embodiment, the resistor to be tested is placed on a carrier plate; the test needle holder includes a first test needle holder arranged on one side of the carrier plate and a second test needle holder arranged on the other side of the carrier plate; the pinhole image includes a first pinhole image of the first test needle holder and a second pinhole image of the second test needle holder; step S300 can specifically include: performing grayscale matching on the first pinhole image based on the first pinhole standard image to determine the position information of the first pinhole; performing grayscale matching on the second pinhole image based on the second pinhole standard image to determine the position information of the second pinhole.

[0075] Specifically, similar to the processing of the aforementioned resistance image, before testing, a standard image of the pinhole of the first test needle holder (i.e., the first pinhole standard image) can be prepared as a pinhole matching template, and then the collected first pinhole image can be compared with the pinhole matching template using a grayscale matching algorithm to determine the position information of the first pinhole; the position information of the second pinhole is obtained by the same processing method, so it will not be repeated here.

[0076] After the resistor position information and the pinhole position information are determined, the position of the test needle holder can be adjusted based on the resistor position information and the pinhole position information so that the test probe can be aligned with the resistor to be tested to perform a resistance needle test. In a feasible implementation, step S400 can specifically include steps S410 to S420:

[0077] Step S410: determining pinhole difference information between the first pinhole and the second pinhole based on the position information of the first pinhole and the position information of the second pinhole.

[0078] Step S420, adjusting the position of the test needle holder based on the pinhole difference information and the resistance position information.

[0079] Specifically, the pinhole difference information between the two can be determined based on the acquired position information of the first pinhole and the position information of the second pinhole; based on the pinhole difference information and the resistance position information obtained in the above steps, the specific distance and direction that the test needle holder needs to move can be calculated to ensure that the pinholes of the first test needle holder and the second test needle holder can be accurately aligned with the contact points of the resistor to be tested.

[0080] It should be noted that the temperature coefficient measurement of resistors generally needs to be carried out under three-temperature environments, that is, the resistor to be tested needs to be tested under high temperature, normal temperature and low temperature environments respectively. The resistor to be tested is generally placed in the material hole set on the loading tray, but in actual applications, the loading tray holding the resistor may be deformed due to the hot and cold temperature shocks of the test environment. In order to cope with the deformation problem, the material hole on the loading tray usually needs to be enlarged to a certain gap before the resistor can be normally taken and placed. However, the enlarged gap may cause the angle and position deviation of the resistor when it is placed on the loading tray compared to the ideal state. In this way, the position accuracy of the resistor to be tested during the needle test is difficult to guarantee, which will affect the accuracy of the resistance test results; in addition, the test pinhole and the test pin holder may also be deformed at high and low temperatures, resulting in partial deviation of the position of the test probe on the pinhole from the ideal state. Therefore, in a feasible embodiment, the pinhole difference information may include the angle information between the first pinhole and the second pinhole; in this embodiment, step S420 may include: based on the difference between the angle information and the placement angle information of the resistor to be tested, adjusting the position of the test pin holder or the position of the carrier plate so that the resistor to be tested, the first pinhole and the second pinhole are in the same vertical plane.

[0081] It is not difficult to understand that the position information of the pinhole may include position coordinates, etc. According to the position coordinates of the first pinhole and the second pinhole, the angle value (angle information) between the line connecting the first pinhole and the second pinhole relative to the horizontal reference line can be determined; it should be noted that the horizontal reference line for determining the angle information between the first pinhole and the second pinhole here is consistent with the horizontal reference line for determining the placement angle information of the resistor to be tested. Then compare the angle information between the first pinhole and the second pinhole with the placement angle information of the resistor to be tested to determine the angle difference between the two, so that the carrier plate can be adjusted according to the angle difference; for example, the carrier plate can be rotated and adjusted according to the angle difference, so that the placement angle of the adjusted resistor is consistent with the angle information between the first pinhole and the second pinhole, so as to ensure that the test probe can accurately fall to the test position of the resistor to be tested. Alternatively, the position of the first test needle holder and the second test needle holder can also be adjusted according to the angle difference, so that the adjusted first pinhole, the second pinhole and the resistor to be tested can be in the same vertical plane, so that the test probes on the first pinhole and the second pinhole can accurately fall vertically on the resistor to be tested. For ease of understanding, refer to Figure 3~4 , Figure 3 A schematic diagram of a resistor to be tested and a needle holder position before an example adjustment is shown; Figure 4 The diagram shows the adjusted resistor to be tested and the position of the needle holder. Figure 3It can be seen that there is an angle deviation α between the position of the resistor A to be tested and the two needle seats (the first test needle seat 2a and the second test needle seat 2b). At this time, the angle deviation value α corresponding to the rotation of the carrier plate can be controlled to obtain the following: Figure 4 As shown in the schematic diagram after adjustment, the two test needle holders (pinholes) and the resistor A to be tested are located in the same vertical plane, so that the test probes can stably contact the resistor to be tested when the needles are lowered.

[0082] In a feasible implementation, the pinhole difference information also includes the distance information between the first pinhole and the second pinhole; the resistor position information includes the electrode distance information; in this implementation, step S420 may include adjusting the position of the test needle holder based on the distance information and the electrode distance information. The above-mentioned electrode distance information is the distance between the two end points of the resistor. The position of the needle holder can be adjusted according to the electrode distance information, so that the distance information between the pinholes on the two needle holders can be consistent with the electrode distance information, ensuring that the test probe can accurately contact the electrodes at both ends of the resistor when the needle is dropped, and complete the resistance test. It should be noted here that the distance values ​​in the aforementioned pinhole position information and the electrode distance information are generally pixel distance values; this implementation involves adjusting the test needle holder according to the distance value, so it is necessary to convert the pixel distance value into the corresponding actual physical distance value before making the adjustment. Before acquiring the resistance image of the resistor to be tested and the pinhole image of the test needle holder, camera calibration can be performed to determine the conversion relationship between the pixel distance of the image acquired by the image acquisition device and the physical distance; thereby, the electrode distance value or the pinhole distance value at the pixel level can be converted into the physical distance value in actual operation according to the conversion relationship, and the distance between the test needle holders can be adjusted accordingly to ensure the accuracy of the needle test.

[0083] It is not difficult to understand that the resistance testing method provided in this embodiment can determine relatively accurate resistance position information and pinhole position information through the resistance image and pinhole image during the test, thereby automatically adjusting the position of the test needle holder according to the above information to ensure that the test probe can correctly contact the resistance test point, reducing the alignment error that may be caused by manual positioning, and can effectively improve the accuracy of the resistance test.

[0084] The present application provides a resistance testing device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the resistance testing method in the above-mentioned embodiment 1.

[0085] Reference below Figure 5, which shows a schematic diagram of the structure of a resistance test device suitable for implementing the embodiment of the present application. The resistance test device in the embodiment of the present application may include but is not limited to mobile terminals such as laptop computers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), etc., and fixed terminals such as desktop computers, etc. Figure 5 The resistance testing device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0086] like Figure 5 As shown, the resistance test device may include a processing device 1001 (such as a central processing unit, a graphics processor, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage device 1003 to a random access memory (RAM: Random Access Memory) 1004. In RAM1004, various programs and data required for the operation of the resistance test device are also stored. The processing device 1001, ROM1002 and RAM1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems can be connected to the I / O interface 1006: an input device 1007 including, for example, a touch screen, a touch pad, a keyboard, a mouse, an image sensor, a microphone, etc.; an output device 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage device 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 1009. The communication device 1009 can allow the resistance test device to communicate with other devices wirelessly or by wire to exchange data. Although the figure shows a resistance test device with various systems, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or have alternatively.

[0087] In particular, according to the embodiments disclosed in the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, the embodiments disclosed in the present application include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication device, or installed from a storage device 1003, or installed from a ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0088] The resistance testing device provided by the present application adopts the resistance testing method in the above embodiment, which can solve the technical problem of low resistance testing accuracy in the related art. Compared with the related art, the beneficial effects of the resistance testing device provided by the present application are the same as the beneficial effects of the resistance testing method provided by the above embodiment, and other technical features in the resistance testing device are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0089] It should be understood that the various parts disclosed in this application can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0090] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

[0091] The present application provides a computer-readable storage medium having computer-readable program instructions (ie, computer programs) stored thereon, and the computer-readable program instructions are used to execute the resistance testing method in the above-mentioned embodiment.

[0092] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems or devices, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM: Random Access Memory), a read-only memory (ROM: Read Only Memory), an erasable programmable read-only memory (EPROM: Erasable Programmable Read Only Memory or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM: CD-Read Only Memory), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency: Radio Frequency), etc., or any suitable combination of the above.

[0093] The computer-readable storage medium may be included in the resistance testing device; or may exist independently without being assembled into the resistance testing device.

[0094] The computer-readable storage medium carries one or more programs. When the one or more programs are executed by a resistance testing device, the resistance testing device: obtains a resistance image of the resistor to be tested and a pinhole image of a test needle holder; a pinhole is provided on the test needle holder, and the pinhole is used to place a test probe for resistance testing; based on the resistance image, the resistance position information of the resistor to be tested is determined; based on the pinhole image, the pinhole position information is determined; based on the resistance position information and the pinhole position information, the position of the test needle holder is adjusted so that the test probe is aligned with the resistor to be tested to perform a resistance pinning test.

[0095] Computer program code for performing the operations of the present application may be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0096] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present application. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0097] The modules involved in the embodiments described in this application may be implemented by software or hardware, wherein the name of the module does not constitute a limitation on the unit itself in some cases.

[0098] The readable storage medium provided in the present application is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned resistance testing method, and can solve the technical problem of low resistance testing accuracy in the related art. Compared with the related art, the beneficial effects of the computer-readable storage medium provided in the present application are the same as the beneficial effects of the resistance testing method provided in the above-mentioned embodiment, and will not be described in detail here.

[0099] The present application also provides a computer program product, including a computer program, wherein when the computer program is executed by a processor, the steps of the resistance testing method as described above are implemented.

[0100] The computer program product provided by the present application can solve the technical problem of low resistance test accuracy in the related art. Compared with the related art, the beneficial effects of the computer program product provided by the present application are the same as the beneficial effects of the resistance test method provided by the above embodiment, which will not be repeated here.

[0101] The above descriptions are only some embodiments of the present application, and are not intended to limit the patent scope of the present application. All equivalent structural changes made using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect applications in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A resistance testing method, characterized in that: The resistance testing method comprises: Acquire a resistance image of the resistor to be tested and a pinhole image of a test needle holder; the test needle holder is provided with a pinhole, and the pinhole is used to place a test probe for resistance testing; Based on the resistance image, determining the resistance position information of the resistor to be tested; Based on the pinhole image, determining pinhole position information; Based on the resistor position information and the pinhole position information, adjusting the position of the test needle holder so that the test probe is aligned with the resistor to be tested to perform a resistance pin test; The resistor to be tested is placed on a carrier plate; the test needle holder includes a first test needle holder arranged on one side of the carrier plate and a second test needle holder arranged on the other side of the carrier plate; the pinhole image includes a first pinhole image of the first test needle holder and a second pinhole image of the second test needle holder; The step of determining the pinhole position information based on the pinhole image comprises: Performing grayscale matching on the first pinhole image based on the first pinhole standard image to determine position information of the first pinhole; Performing grayscale matching on the second pinhole image based on the second pinhole standard image to determine position information of the second pinhole; The step of adjusting the position of the test needle holder based on the resistance position information and the pinhole position information comprises: Determine pinhole difference information between the first pinhole and the second pinhole based on the position information of the first pinhole and the position information of the second pinhole; Based on the pinhole difference information and the resistance position information, the position of the test needle holder is adjusted.

2. The resistance testing method according to claim 1, characterized in that: The step of determining the resistance position information of the resistor to be tested based on the resistance image comprises: Performing grayscale matching on the resistor image based on the resistor standard image to determine the resistor region image in the resistor image to be tested; Extracting the edge contour of the resistor region image; Based on the edge contour, the resistor position information is determined; the resistor position information includes placement angle information of the resistor to be tested.

3. The resistance testing method according to claim 2, characterized in that: After the step of determining the resistor position information based on the edge contour, the step further includes: Performing binarization processing on the resistor region image to obtain a resistor region binary image; Extracting the electrode area contour in the resistor area binary image; Performing matrix fitting on the electrode region contour to obtain an electrode fitting model; Based on the electrode fitting model, determining the electrode geometric parameters of the resistor to be tested; the electrode geometric parameters include electrode length and electrode width; Based on the electrode geometric parameters, the resistor position information is corrected.

4. The resistance testing method according to claim 3, characterized in that: The pinhole difference information includes angle information between the first pinhole and the second pinhole; The step of adjusting the position of the test needle holder based on the pinhole difference information and the resistance position information comprises: Based on the difference between the angle information and the placement angle information of the resistor to be tested, the position of the test needle holder or the position of the carrier is adjusted so that the resistor to be tested, the first pinhole and the second pinhole are on the same vertical plane.

5. The resistance testing method according to claim 4, characterized in that: The pinhole difference information includes the distance information between the first pinhole and the second pinhole; the resistor position information includes the electrode distance information; The step of adjusting the position of the test needle holder based on the pinhole difference information and the resistance position information further includes: Based on the distance information and the electrode distance information, the position of the test needle holder is adjusted.

6. A resistance testing device, characterized in that: The device comprises: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the resistance testing method according to any one of claims 1 to 5.

7. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the resistance testing method according to any one of claims 1 to 5 are implemented.

8. A computer program product, characterized in that The computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the resistance testing method according to any one of claims 1 to 5 are implemented.

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