Semi-finished product detection circuit and method for integrated control panel
By detecting the overcurrent protection function of IPM and PFC modules at the semi-finished node of the integrated control board, the problem of missing overcurrent protection function of the integrated control board in the finished product stage in the existing technology is solved, and the judgment protection is achieved when the module is not assembled The effectiveness of the function avoids module burning, saves costs and improves efficiency.
Patent Information
- Application Number
- CN202411061278.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-05
- Publication Date
- 2025-01-17
- Estimated Expiration
- 2044-08-05
AI Technical Summary
The existing integrated control board is only functionally tested in the finished product stage, which may cause the IPM and PFC modules to burn the module when the overcurrent protection function is missing, causing economic and time losses.
At the semi-finished node of the integrated control board, sharp pulse signals are generated through the IPM overcurrent signal generation circuit and the PFC overcurrent signal generation circuit, and the detection and analog circuit determine the overcurrent protection function to ensure that the module can be effectively protected in the finished product stage.
The overcurrent protection function is detected in advance, which avoids module burning caused by functional failure in the finished product stage, saves costs and improves efficiency.
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Figure CN118884193B_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of electronic circuits, and in particular to a semi-finished product detection circuit and method for an integrated control panel. Background Art
[0002] A heat pump is a device that converts low-temperature heat energy in the air, water or soil into high-temperature heat energy for heating, cooling or hot water supply. Its basic principle is to use refrigerant to achieve heat conversion through evaporation, compression, condensation and other processes, converting low-temperature heat energy into high-temperature heat energy, thereby achieving heating or cooling of indoor air.
[0003] Domestic and commercial heat pumps require a variable frequency compressor driver to invert the fixed frequency power input into a variable frequency power supply, thereby changing the speed of the compressor and adjusting the system capacity.
[0004] The key components of conventional variable frequency compressor drivers include intelligent power modules (IPM) and power factor regulation (PFC) modules. The existing intelligent power modules (IPM) and power factor regulation (PFC) modules generally use integrated control boards. During the manufacturing process of integrated control boards, functional tests are usually performed at the finished product stage; if the overcurrent protection function of the IPM and PFC modules before the finished product stage is missing, the modules may burn out, resulting in significant economic and time losses.
[0005] Therefore, at the semi-finished node of integrated control board manufacturing (i.e. when the power devices in the IPM and PFC modules have not yet been assembled), it is necessary to test the relevant overcurrent protection circuit functions to ensure that they can play an effective protection role in the subsequent finished product testing stage. Summary of the invention
[0006] In order to solve the above technical problems, a circuit and method for testing the overcurrent protection circuit function of a semi-finished node of an integrated control board are proposed.
[0007] To achieve the above object, the technical solution adopted by the present invention is as follows: a semi-finished product detection circuit of an integrated control board includes an integrated control board, an IPM overcurrent signal generating circuit, an IPM overcurrent detection analog circuit and a PFC overcurrent signal generating circuit, wherein the integrated control board has a built-in PFC overcurrent detection circuit;
[0008] The IPM overcurrent signal generating circuit, the IPM overcurrent detection analog circuit and the PFC overcurrent signal generating circuit are respectively connected to the integrated control board (hereinafter referred to as the test board);
[0009] The IPM overcurrent signal generating circuit is used to generate a positive spike pulse signal and send it to the board to be tested. After receiving the positive spike pulse signal, the board to be tested generates an IPM overcurrent protection signal through the IPM overcurrent detection analog circuit and sends it to the compressor control chip on the board to be tested. The compressor control chip executes a protection action and displays an alarm message.
[0010] The PFC overcurrent signal generating circuit is used to generate a negative spike pulse signal and send it to the board to be tested. The PFC overcurrent detection circuit built into the board to be tested detects the negative spike pulse signal and generates a PFC overcurrent protection signal, and then sends the PFC overcurrent protection signal to the compressor control chip on the board to be tested. The compressor control chip executes a protection action and displays an alarm message.
[0011] Preferably, the model of the board to be tested is MWH366 or other control boards with similar functions.
[0012] The board to be tested here is the integrated control board containing an intelligent power module (IPM) and a power factor regulation (PFC) module mentioned in the background technology.
[0013] Preferably, the IPM overcurrent signal generating circuit comprises a resistor R1, a resistor R2, a resistor R3, a capacitor C1 and a key switch SW1, wherein the resistor R2, the capacitor C1 and the key switch SW1 are connected in series in sequence, the other end of the R2 is connected to the pin P5 of the board to be tested, and the other end of the key switch SW1 is connected to the pin P8 of the board to be tested;
[0014] The resistor R1 is connected in parallel between the pin P5 of the board to be tested and the pin P6 of the board to be tested, and the pin P6 of the board to be tested is grounded;
[0015] One end of the resistor R3 is connected between the capacitor C1 and the key switch SW1 , and the other end is grounded.
[0016] Preferably, the IPM overcurrent detection analog circuit includes a resistor R8, a resistor R9 and an NPN transistor Q1.
[0017] The resistor R8 is connected to the pin P4 of the board to be tested, and the resistor R9 is connected to the pin P3 of the board to be tested;
[0018] The C pole of the NPN transistor Q1 is connected to the resistor R9, the B pole is connected to the resistor R8, and the E pole is grounded.
[0019] Preferably, the PFC overcurrent signal generating circuit comprises a resistor R4, a resistor R6, a resistor R7, a capacitor C2 and a key switch SW2, wherein the resistor R6, the capacitor C2 and the resistor R7 are connected in series in sequence, the other end of the resistor R6 is connected to the pin P7 of the board to be tested, and the other end of the resistor R7 is connected to the pin P8 of the board to be tested;
[0020] The resistor R4 is connected in parallel between the pin P6 of the board to be tested and the pin P7 of the board to be tested;
[0021] One end of the key switch SW2 is connected between the capacitor C2 and the resistor R7, and the other end is grounded.
[0022] Preferably, the amplitude of the positive sharp pulse signal generated by the IPM overcurrent signal generating circuit is 0.877V, and the time constant τ is 57uS.
[0023] Preferably, the negative spike pulse signal generated by the PFC overcurrent signal generating circuit has an amplitude of 0.455V and a time constant τ of 11uS.
[0024] The semi-finished product detection method of the integrated control board uses the semi-finished product detection circuit of the integrated control board as described above, and the method comprises the following steps:
[0025] Step S1-1: the board to be tested is powered on, and the IPM overcurrent signal generating circuit is discharged;
[0026] Step S1-2: briefly turn on the key switch SW1, and the IPM overcurrent signal generating circuit generates a positive spike pulse, and transmits it to the board under test via the pin P5 of the board under test;
[0027] Step S1-3: The positive spike pulse is then transmitted to the IPM overcurrent detection analog circuit via the pin P4 of the board to be tested, so that it generates an IPM overcurrent protection signal;
[0028] Step S1-4: the IPM overcurrent protection signal is transmitted to the compressor control chip on the board to be tested via pin P3, and the compressor control chip on the board to be tested performs a protection operation;
[0029] Step S1-5: After the recovery period T1, turn on the key switch SW1 again and repeat the above steps S1-1 to S1-4.
[0030] Preferably, the method further comprises the following steps:
[0031] Step S2-1: the board under test is powered on, and the PFC overcurrent signal generating circuit is charged;
[0032] Step S2-2: briefly turn on the key switch SW2, and the PFC overcurrent signal generating circuit generates a negative sharp pulse, and transmits it to the board under test via the pin P7 of the board under test;
[0033] Step S2-3: The negative spike pulse is detected by the PFC over-current detection circuit built into the board to be tested, so that it generates a PFC over-current protection signal;
[0034] Step S2-4: the PFC overcurrent protection signal is transmitted to the compressor control chip on the board to be tested, and the compressor control chip on the board to be tested performs a protection operation;
[0035] Step S2-5: After the recovery period T2, the key switch SW2 is turned on again and the above steps S2-1 to S2-4 are repeated.
[0036] Preferably, the range of the period T1 is 0.5S-3S, and the range of the period T1 is 8S-12S.
[0037] Beneficial technical effects of the present invention: the circuit of the present invention is provided with an IPM overcurrent signal generating circuit, an IPM overcurrent detection simulation circuit, and a PFC overcurrent signal generating circuit, and generates an IPM overcurrent protection signal and a PFC overcurrent protection signal through the interaction between the circuits, thereby judging whether the IPM overcurrent protection function and the PFC overcurrent protection function are effective when the IPM and PFC modules are not assembled, and the problem of module burning caused by function failure in the finished product stage is avoided by testing in advance, thereby greatly saving costs and improving efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0038] Figure 1 The electronic circuit schematic diagram of the semi-finished detection circuit of the integrated control board of the present invention. DETAILED DESCRIPTION
[0039] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with embodiments, but the scope of protection claimed in the present invention is not limited to the following specific embodiments.
[0040] like Figure 1 It is said that the semi-finished product detection circuit of the integrated control board (hereinafter referred to as the board to be tested) includes a control chip, an IPM overcurrent signal generating circuit, an IPM overcurrent detection analog circuit and a PFC overcurrent signal generating circuit;
[0041] Specifically, the connection relationship between the various circuits is as follows: the IPM overcurrent signal generating circuit, the IPM overcurrent detection analog circuit and the PFC overcurrent signal generating circuit are respectively connected to the board to be tested, and the board to be tested has a built-in PFC overcurrent detection circuit;
[0042] The IPM overcurrent signal generating circuit is used to generate a positive spike pulse signal and send it to the board to be tested. After receiving the positive spike pulse signal, the board to be tested transmits it to the IPM overcurrent detection analog circuit to generate an IPM overcurrent protection signal and sends it to the compressor control chip on the board to be tested.
[0043] The PFC overcurrent signal generating circuit is used to generate a negative spike pulse signal and send it to the board to be tested, so that the PFC overcurrent detection circuit built into the board to be tested generates a PFC overcurrent protection signal and sends it to the compressor control chip on the board to be tested.
[0044] Preferably, the model of the board to be tested is MWH366 or other control boards with similar functions, that is, the integrated control board containing an intelligent power module (IPM) and a power factor regulation (PFC) module mentioned in the background technology, and its onboard compressor control chip can perform relevant over-current protection operations.
[0045] Specifically, the specific circuit principles of each circuit are as follows:
[0046] The IPM overcurrent signal generating circuit includes a resistor R1, a resistor R2, a resistor R3, a capacitor C1 and a key switch SW1, wherein the resistor R2, the capacitor C1 and the key switch SW1 are connected in series in sequence, the other end of the R2 is connected to the pin P5 of the board to be tested, and the other end of the key switch SW1 is connected to the pin P8 of the board to be tested; the resistor R1 is connected in parallel between the pin P5 of the board to be tested and the pin P6 of the board to be tested, and the pin P6 of the board to be tested is grounded; one end of the resistor R3 is connected between the capacitor C1 and the key switch SW1, and the other end is grounded.
[0047] Specifically, the resistors R1, R2 and the capacitor C1 form a differential / step-down circuit. In this embodiment, the amplitude of the positive spike pulse signal generated by the IPM overcurrent signal generating circuit is 0.877V, and the time constant τ is 57uS. The specific calculation is as follows:
[0048] Time constant τ = (R1 + R2) * C1 = (100 + 470) × 10 -7 =57×10 -6 (S) = 57 (uS);
[0049] Output amplitude Vo = Vi * R1 / (R1 + R2) = 5 × 100 / (100 + 470) = 0.877 (V);
[0050] Output internal resistance Ro = R1*R2 / (R1+R2) = 100×470 / (100+470) = 82(Ω);
[0051] The calculation and parameter selection of the above forward spike pulse signal amplitude and time constant τ can simulate the actual IPM overcurrent signal and action as close as possible, and can simulate the IPM overcurrent signal and action more accurately.
[0052] When the key switch SW1 is pressed, the differential / step-down circuit generates a positive narrow pulse, which triggers the IPM overcurrent detection analog circuit to generate an IPM overcurrent signal through the pin P5 of the board to be tested, and transmits it to the compressor control chip on the board to be tested, so that it generates a protection action and displays an alarm message; when the key switch SW1 is released, the charge stored in the capacitor C1 will be released through the resistor device R3 for the next test.
[0053] Specifically, the IPM overcurrent detection analog circuit includes a resistor R8, a resistor R9 and an NPN transistor Q1. The resistor R8 is connected to the pin P4 of the board to be tested, and the resistor R9 is connected to the pin P3 of the board to be tested; the C pole of the NPN transistor Q1 is connected to the resistor R9, the B pole is connected to the resistor R8, and the E pole is grounded.
[0054] The resistor R8, resistor R9 and transistor Q1 are used to replace and simulate the current detection function in the IPM (not yet assembled at this time). When the voltage at the pin P4 of the board to be tested reaches +0.5V, the transistor Q1 starts to conduct, and the IPM overcurrent detection simulation circuit simulates the IPM module to detect the overcurrent and generate an IPM overcurrent protection signal, which is transmitted to the compressor control chip on the board to be tested through the pin P3 of the board to be tested.
[0055] Specifically, the PFC overcurrent signal generating circuit includes a resistor R4, a resistor R6, a resistor R7, a capacitor C2 and a key switch SW2. The resistor R6, the capacitor C2 and the resistor R7 are connected in series in sequence, the other end of the resistor R6 is connected to the pin P7 of the board to be tested, and the other end of the resistor R7 is connected to the pin P8 of the board to be tested; the resistor R4 is connected in parallel between the pin P6 of the board to be tested and the pin P7 of the board to be tested; one end of the key switch SW2 is connected between the capacitor C2 and the resistor R7, and the other end is grounded.
[0056] There is no such simulation test link in the prior art, so there is no relevant specific circuit. The specific circuit structure and component connection relationship of the IPM overcurrent signal generating circuit, the IPM overcurrent detection simulation circuit and the PFC overcurrent signal generating circuit of the present invention are original circuits obtained through creative labor according to the problem to be solved by the present invention. They have a simple structure and are easy to operate. Through the interaction between the relevant circuits and the board to be tested, it can be judged whether the IPM overcurrent protection function and the PFC overcurrent protection function are effective when the IPM and PFC modules are not assembled, which brings unexpected effects.
[0057] In this embodiment, the resistors R4, R6 and the capacitor C2 form a differential / step-down circuit, and the negative spike pulse signal amplitude generated by the PFC overcurrent signal generating circuit is 0.455V and the time constant τ is 11uS. The specific calculation process is as follows:
[0058] Time constant τ = (R4 + R6) * C2 = (100 + 1000) × 10 -8 =11×10 -6 (S) = 11 (uS);
[0059] Output amplitude Vo = Vi * R4 / (R4 + R6) = (-5) × 100 / (100 + 1000) = -0.455 (V);
[0060] Output internal resistance Ro = R4*R6 / (R4+R6) = 100×1000 / (100+1000) = 91 (Ω).
[0061] The calculation and parameter selection of the above negative spike pulse signal amplitude and time constant τ can simulate the actual PFC over-current signal and action as close as possible, and can simulate the PFC over-current signal and action more accurately.
[0062] When the key switch SW2 is pressed, the differential / step-down circuit generates a negative narrow pulse, which triggers the PFC overcurrent detection circuit on the board to be tested through the pin P7 of the board to be tested and generates a PFC overcurrent protection signal, which is transmitted to the compressor control chip on the board to be tested, so that it generates a protection action and displays an alarm message; when the key switch SW2 is released, the capacitor device C2 will be pre-charged through the resistor device R7 for the next test.
[0063] Specifically, the semi-finished product detection method of the integrated control board uses the semi-finished product detection circuit of the integrated control board as described above, and the method includes the following steps:
[0064] Step S1-1: the board to be tested is powered on, and the IPM overcurrent signal generating circuit is discharged;
[0065] Step S1-2: briefly turn on the key switch SW1, and the IPM overcurrent signal generating circuit generates a positive spike pulse, which is transmitted to the board under test via the pin P5 of the board under test;
[0066] Step S1-3: The positive spike pulse is then transmitted to the IPM overcurrent detection analog circuit via the pin P4 of the board to be tested, so that it generates an IPM overcurrent protection signal;
[0067] Step S1-4: the IPM overcurrent protection signal is transmitted to the compressor control chip on the board to be tested via pin P3, and the compressor control chip on the board to be tested performs a protection operation;
[0068] Step S1-5: After the recovery period T1, turn on the key switch SW1 again and repeat the above steps S1-1 to S1-4.
[0069] Preferably, the method further comprises the following steps:
[0070] Step S2-1: the board under test is powered on, and the PFC overcurrent signal generating circuit is charged;
[0071] Step S2-2: briefly turn on the key switch SW2, and the PFC overcurrent signal generating circuit generates a negative spike pulse, and transmits it to the board under test via the pin P7 of the board under test;
[0072] Step S2-3: the negative spike pulse is detected by the PFC over-current detection circuit on the board to be tested, so that it generates a PFC over-current protection signal;
[0073] Step S2-4: the PFC overcurrent protection signal is transmitted to the compressor control chip on the board to be tested, and the compressor control chip on the board to be tested performs a protection operation;
[0074] Step S2-5: After the recovery period T2, the key switch SW2 is turned on again and the above steps S2-1 to S2-4 are repeated.
[0075] Preferably, the range of the period T1 is 0.5S-3S, the range of the period T1 is 8S-12S, in this embodiment, the range of T1 is 1S, and the range of T1 is 10S.
[0076] The circuit of the present invention is provided with an IPM overcurrent signal generating circuit, an IPM overcurrent detection simulation circuit and a PFC overcurrent signal generating circuit, and generates an IPM overcurrent protection signal and a PFC overcurrent protection signal respectively under the action of the board to be tested, so as to judge whether the IPM overcurrent protection function and the PFC overcurrent protection function are effective when the IPM and PFC modules are not assembled, and the problem of module burning caused by function failure in the finished product stage is avoided by testing in advance, thereby greatly saving costs and improving efficiency.
[0077] According to the disclosure and teaching of the above description, those skilled in the art to which the present invention belongs may also make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and changes to the invention should also fall within the scope of protection of the claims of the present invention. In addition, although some specific terms are used in this specification, these terms are only for the convenience of description and do not constitute any limitation to the invention.
Claims
1. A semi-finished product detection circuit of an integrated control board, characterized in that: It includes a board to be tested, an IPM overcurrent signal generating circuit, an IPM overcurrent detection simulation circuit and a PFC overcurrent signal generating circuit, wherein the board to be tested has a built-in PFC overcurrent detection circuit; The IPM overcurrent signal generating circuit, the IPM overcurrent detection analog circuit and the PFC overcurrent signal generating circuit are respectively connected to the board to be tested; The IPM overcurrent signal generating circuit is used to generate a positive spike pulse signal and send it to the IPM overcurrent detection analog circuit via the board to be tested, so that the IPM overcurrent detection analog circuit generates an IPM overcurrent protection signal and sends it to the board to be tested; The PFC overcurrent signal generating circuit is used to generate a negative spike pulse signal and send it to the PFC overcurrent detection circuit of the board to be tested so that it generates a PFC overcurrent protection signal; The board to be tested is an integrated control board; The IPM is an intelligent power module, and the PFC is a power factor regulation.
2. The semi-finished product detection circuit of the integrated control board according to claim 1, characterized in that: The model of the integrated control panel is MWH366.
3. The semi-finished product detection circuit of the integrated control board according to claim 2, characterized in that: The IPM overcurrent signal generating circuit includes a resistor R1, a resistor R2, a resistor R3, a capacitor C1 and a key switch SW1, wherein the resistor R2, the capacitor C1 and the key switch SW1 are connected in series in sequence, the other end of the R2 is connected to the pin P5 of the board to be tested, and the other end of the key switch SW1 is connected to the pin P8 of the board to be tested; The resistor R1 is connected in parallel between the pin P5 of the board to be tested and the pin P6 of the board to be tested, and the pin P6 of the board to be tested is grounded; One end of the resistor R3 is connected between the capacitor C1 and the key switch SW1 , and the other end is grounded.
4. The semi-finished product detection circuit of the integrated control board according to claim 2, characterized in that: The IPM over-current detection analog circuit includes a resistor R8, a resistor R9 and an NPN transistor Q1; The resistor R8 is connected to the pin P4 of the board to be tested, and the resistor R9 is connected to the pin P3 of the board to be tested; The C pole of the NPN transistor Q1 is connected to the resistor R9, the B pole is connected to the resistor R8, and the E pole is grounded.
5. The semi-finished product detection circuit of the integrated control board according to claim 2, characterized in that: The PFC overcurrent signal generating circuit comprises a resistor R4, a resistor R6, a resistor R7, a capacitor C2 and a key switch SW2, wherein the resistor R6, the capacitor C2 and the resistor R7 are connected in series in sequence, the other end of the resistor R6 is connected to the pin P7 of the board to be tested, and the other end of the resistor R7 is connected to the pin P8 of the board to be tested; The resistor R4 is connected in parallel between the pin P6 of the board to be tested and the pin P7 of the board to be tested; One end of the key switch SW2 is connected between the capacitor C2 and the resistor R7, and the other end is grounded.
6. The semi-finished product detection circuit of the integrated control board according to claim 1, characterized in that: The amplitude of the positive sharp pulse signal generated by the IPM overcurrent signal generating circuit is 0.877V, and the time constant τ is 57uS.
7. The semi-finished product detection circuit of the integrated control board according to claim 1, characterized in that: The negative spike pulse signal amplitude generated by the PFC overcurrent signal generating circuit is 0.455V and the time constant τ is 11uS.
8. A method for detecting a semi-finished product of an integrated control board, using a semi-finished product detection circuit of an integrated control board as claimed in any one of claims 1 to 7, characterized in that: The method includes the following steps for testing the IPM overcurrent protection function: Step S1-1: the board to be tested is powered on, and the IPM overcurrent signal generating circuit is discharged; Step S1-2: briefly turn on the key switch SW1, and the IPM overcurrent signal generating circuit generates a positive spike pulse, and transmits it to the board under test via the pin P5 of the board under test; Step S1-3: The positive spike pulse is then transmitted to the IPM overcurrent detection analog circuit via the pin P4 of the board to be tested, so that it generates an IPM overcurrent protection signal; Step S1-4: the IPM overcurrent protection signal is transmitted to the compressor control chip on the board to be tested via the pin P3 of the board to be tested, and the compressor control chip on the board to be tested performs a protection operation; Step S1-5: After the recovery period T1, turn on the key switch SW1 again and repeat the above steps S1-1 to S1-4.
9. The semi-finished product detection method of the integrated control panel according to claim 8, characterized in that: It also includes the PFC overcurrent protection function test steps: Step S2-1: the board under test is powered on, and the PFC overcurrent signal generating circuit is charged; Step S2-2: briefly turn on the key switch SW2, and the PFC overcurrent signal generating circuit generates a negative sharp pulse, and transmits it to the board under test via the pin P7 of the board under test; Step S2-3: the negative spike pulse is detected by the PFC over-current detection circuit on the board to be tested, so that it generates a PFC over-current protection signal; Step S2-4: the PFC overcurrent protection signal is transmitted to the compressor control chip on the board to be tested, and the compressor control chip on the board to be tested performs a protection operation; Step S2-5: After the recovery period T2, the key switch SW2 is turned on again and the above steps S2-1 to S2-4 are repeated.
10. The semi-finished product detection method of the integrated control panel according to claim 8, characterized in that: The range of the period T1 is 0.5S-3S, and the range of the period T1 is 8S-12S.
Citation Information
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