A chip temperature shock stress screening test system

Abstract

The present invention belongs to the technical field of chip performance detection, and specifically is a chip temperature shock stress screening test system; it comprises a test bench, a bottom cover is fixedly connected to the top of the inner cavity of the test bench, a sealing plate is fixedly connected to the top of the bottom cover, a sealing cover 1 is attached to the top of the sealing plate, a lifting bin is provided on one side of the top of the test bench, a lifting unit is provided in the lifting bin, the lifting unit is transmission-connected with the sealing cover 1, and a detection box is fixedly connected to one side of the top of the sealing plate; the present invention cooperates with an air inlet pipe and an air outlet pipe through a temperature control unit to allow air flow to circulate, and drives the workstation seat to rotate through the control unit, so that the detection unit can perform performance detection on the passing chips in turn and screen out unqualified chips, which not only avoids the situation where the chip test results are poor due to the need to move the traditional lifting cage, but also realizes direct performance detection of the chip after hot and cold shock.

Description

Technical Field

[0001] The invention belongs to the technical field of chip performance detection, in particular to a chip temperature shock stress screening test system. Background Art

[0002] As a basic element of the modern economy, chips play a core role in various fields such as smartphones, automobiles, and home appliances, making electronic products more portable, efficient, and intelligent. Since chips are used in different fields, they often need to face various extreme usage environments, so the performance testing of chips after manufacturing has become a top priority. At present, the performance testing of chips in extreme temperature environments is generally carried out by placing the chips in a hot and cold shock test chamber, simulating the temperature changes under extreme environmental conditions, observing the working status and performance of the chips at different temperatures, and thus evaluating their tolerance and long-term stability under temperature changes.

[0003] In the prior art, when the chip is subjected to a hot and cold shock test, the cage carrying the chip is often required to slide back and forth between the hot and cold compartments. This can easily lead to poor test results due to the reciprocating up and down movement of the chip. In addition, most of the existing hot and cold shock test equipment does not have the function of directly performing performance testing after the temperature shock. This means that the chip needs to be taken out of the test equipment after the hot and cold alternating shock test and then undergo a performance test, which greatly affects the accuracy of the chip performance test results after the temperature shock.

[0004] To this end, the present invention provides a chip temperature shock stress screening test system. Summary of the invention

[0005] In order to make up for the deficiencies of the prior art and solve the problem that in the prior art, when the chip is subjected to a cold and hot shock test, the cage loaded with the chip is often required to slide back and forth between the cold and hot chambers, which easily leads to a poor test effect of the chip due to the reciprocating up and down movement. In addition, most of the existing cold and hot shock test equipment do not have the function of directly performing performance testing after the temperature shock, which requires the chip to be taken out of the test equipment for performance testing after the cold and hot alternating shock test, which greatly affects the accuracy of the chip performance test results after the temperature shock. The present invention proposes a chip temperature shock stress screening test system.

[0006] The present invention solves the technical problem in the following technical scheme: a chip temperature shock stress screening test system according to the present invention comprises a test bench, a bottom cover is fixedly connected to the top of the inner cavity of the test bench, a sealing plate is fixedly connected to the top of the bottom cover, a sealing cover 1 is attached to the top of the sealing plate, a lifting warehouse is provided on one side of the top of the test bench, a lifting unit is provided in the lifting warehouse, the lifting unit is transmission-connected with the sealing cover 1, a detection box is fixedly connected to one side of the top of the sealing plate, a detection unit is provided on the detection box, the detection box is adapted to the sealing cover 1, a station seat is rotatably connected to the sealing plate, a control unit is provided below the bottom cover, the control unit is transmission-connected with the station seat, a temperature control warehouse is provided on one side of the inner cavity of the test bench, a temperature control unit is provided in the temperature control warehouse, the temperature control warehouse is connected to the inner cavity of the bottom cover through an air outlet pipe, an air vent is provided at the center of the sealing plate, an air inlet pipe is fixedly connected to the bottom of the air vent of the sealing plate, an end of the air inlet pipe away from the sealing plate is connected to the temperature control unit, and air outlet holes are uniformly provided near the edge of the sealing plate.

[0007] Preferably, the temperature control unit includes a refrigerator, an electric heating tube and a centrifugal fan, and the refrigerator, the electric heating tube and the centrifugal fan are installed in the temperature control chamber in sequence from bottom to top, and the end of the air inlet pipe away from the sealing plate is connected to the outer shell of the centrifugal fan, and a return air duct is provided on the side of the temperature control chamber close to the air outlet pipe, one end of the return air duct is connected to the air outlet pipe, and the other end of the return air duct extends to the bottom of the inner cavity of the temperature control chamber, and the horizontal height of the port of the return air duct located in the temperature control chamber is lower than the horizontal height of the refrigerator.

[0008] Preferably, the lifting unit includes a motor 1, a gear transmission seat, a screw and a lifting seat. The motor 1 is fixedly installed in the lifting warehouse, and the screw is rotatably connected in the lifting warehouse. The motor 1 and the screw are transmission connected via the gear transmission seat. The screw is threadedly connected to the lifting seat, and the lifting seat is slidingly connected to the lifting warehouse. The lifting seat is fixedly connected to the top side wall of the sealing cover 1, and the sealing cover 2 is fixedly connected to the sealing cover 1, and the bottom end of the sealing cover 2 is in contact with the top of the sealing plate.

[0009] Preferably, the detection unit comprises motor three, detection plate one and detection plate two, motor three is fixedly mounted on the outer wall of the detection box, a worm is fixedly connected to the output end of motor three, one end of the worm away from motor three extends to the inner cavity of the detection box and is meshedly connected with a worm wheel, a bidirectional threaded rod is fixedly connected to the worm wheel, symmetrical screw sleeves are threadedly connected to the bidirectional threaded rod, an L-shaped mounting plate one and an L-shaped mounting plate two are slidably connected to the side of the detection box close to the work station seat, detection plate one is evenly fixedly connected to the L-shaped mounting plate one, detection plate two is evenly fixedly connected to the L-shaped mounting plate two, detection plate one and detection plate two are staggered, L-shaped mounting plate one and L-shaped mounting plate two are respectively fixedly connected to two screw sleeves, a limit rod is fixedly connected to the inner cavity of the detection box, and both of the screw sleeves are slidably connected to the limit rod.

[0010] Preferably, the control unit comprises motor 2, spur gear 1, an adjusting wheel and an adjusting ring, motor 2 is fixedly installed on the bottom of the bottom cover, a rotating shaft 1 is fixedly connected to the output end of the motor 2, the top end of the rotating shaft 1 passes through the intake pipe and extends to the top of the sealing plate, the rotating shaft 1 is sealingly and rotatably connected to the intake pipe, the work seat is fixedly connected to the rotating shaft 1, a fixing piece is fixedly connected to the center of the sealing plate, the top of the fixing piece is rotatably connected to the rotating shaft 2, spur gear 2 is fixedly connected to the rotating shaft 2, one side of the spur gear 2 is meshingly connected with the spur gear 1, the spur gear 1 is fixedly connected to the rotating shaft 1, the top end of the rotating shaft 2 extends to the top of the sealing plate and is fixedly connected to the adjusting wheel, teeth are provided on the outer side of the adjusting wheel, an adjusting ring is fixedly connected to the bottom of the work seat, teeth are equidistantly provided on the inner ring of the adjusting ring, and the adjusting wheel is meshingly connected to the adjusting ring.

[0011] Preferably, an annular partition is fixedly connected to the top of the sealing plate, and the annular partition is located between the work station seat and the air outlet. A gas collecting cylinder is fixedly connected to the work station seat, and a stirring assembly is provided on the outer side of the gas collecting cylinder.

[0012] Preferably, the stirring assembly includes a gear ring, a spur gear three, a rotating rod and fan blades, a plurality of groups of gear rings are evenly fixed on the outer wall of the gas collecting cylinder, the top end of the rotating shaft one extends to the top of the gas collecting cylinder and is sealed and rotatably connected to the gas collecting cylinder, two groups of fixed plates are symmetrically provided on the outer side of the gas collecting cylinder, the plurality of fixed plates in the same group are fixedly connected by a connecting rod one, the rotating shaft one and the fixed plate located at the top are fixedly connected by a connecting rod two, the fixed plate is rotatably connected with a rotating rod, the rotating rod is fixed with a spur gear three at one end close to the gas collecting cylinder, the spur gear three is meshingly connected with the gear ring, a mounting ring is provided on the rotating rod, and fan blades are evenly fixed to the outer wall of the mounting ring.

[0013] Preferably, an annular guide plate is fixedly connected to one side of the fixing plate close to the gas collecting cylinder, a reciprocating thread groove is provided on the outer wall of the annular guide plate, a slider is movably connected to the inner wall of the mounting ring, the slider is slidably connected to the reciprocating thread groove, guide grooves are symmetrically provided on the rotating rod, guide blocks are symmetrically fixed to the inner wall of the mounting ring, and the guide blocks are slidably connected to the guide grooves.

[0014] Preferably, through holes are evenly formed on the outer wall of the gas collecting cylinder.

[0015] Preferably, a plurality of positioning columns are fixedly connected to the top of the work station seat, and positioning holes are provided on the positioning columns. A plurality of insertion rods are fixedly connected to the bottom of the work station seat, and the insertion rods on the upper side are matched with the positioning holes on the positioning columns on the lower side thereof.

[0016] The beneficial effects of the present invention are as follows:

[0017] 1. The chip temperature shock stress screening test system described in the present invention, through the temperature control unit provided in the temperature control chamber, cooperates with the air inlet pipe and the air outlet pipe, so that the air flow can circulate between the temperature control chamber, the sealing plate and the sealing cover, and the bottom cover. At the same time, the staff controls the temperature of the circulating airflow, and can realize the alternating hot and cold shock test of the chip on the work station seat. The control unit can drive the work station seat to rotate, so that the detection unit on the detection box can perform performance detection on the passing chips in turn, and screen out unqualified chips. This not only avoids the situation where the chip test results are poor due to the need to move the traditional lifting cage, but also realizes the direct performance detection of the chip after the hot and cold shock.

[0018] 2. The chip temperature shock stress screening test system described in the present invention can prevent the airflow in the air inlet pipe from entering the space formed by the sealing plate and the sealing cover and then directly flowing out from the air outlet quickly, causing the temperature to be unable to rise or fall quickly, through the annular baffle and the stirring assembly, and can also stir the airflow entering the space formed by the sealing plate and the sealing cover to achieve uniform distribution, thereby avoiding the situation where the temperature changes in a gradient from the lowest point to the highest point of the annular baffle. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The present invention will be further described below in conjunction with the accompanying drawings.

[0020] Figure 1 is a stereogram of the present invention;

[0021] Figure 2 is a cross-sectional view of a sealing cover of the present invention;

[0022] Figure 3 yes Figure 2 A partial enlarged view of the middle part;

[0023] Figure 4 is a cross-sectional view of the temperature control chamber of the present invention;

[0024] Figure 5 It is a schematic diagram of the sealing plate of the present invention;

[0025] Figure 6 It is a schematic diagram of the workstation seat of the present invention;

[0026] Figure 7 is an exploded view of the sealing plate of the present invention;

[0027] Figure 8 yes Figure 7 A partial enlarged view of point B in the middle;

[0028] Fig. 9 It is a schematic diagram of the interior of the detection box of the present invention;

[0029] Fig.10 is a cross-sectional view of the gas collecting cylinder of the present invention;

[0030] Fig.11 yes Fig.10 A partial enlarged view of point C in the middle;

[0031] Fig.12 is an exploded view of the mounting ring of the present invention;

[0032] In the figure: 1. Test bench; 2. Sealing cover 1; 3. Sealing cover 2; 4. Lifting chamber; 5. Motor 1; 6. Gear transmission seat; 7. Lead screw; 8. Lifting seat; 9. Bottom cover; 10. Sealing plate; 11. Temperature control chamber; 12. Refrigerator; 13. Electric heating tube; 14. Centrifugal fan; 15. Inlet pipe; 16. Outlet pipe; 17. Return air duct; 18. Annular partition; 19. Outlet hole; 20. Motor 2; 21. Rotating shaft 1; 22. Fixing piece; 23. Spur gear 1; 24. Rotating shaft 2; 25. Spur gear 2; 26. Adjusting wheel; 27. Adjusting Ring; 28. Work station seat; 29. ​​Air collecting cylinder; 30. Through hole; 31. Gear ring; 32. Rotating rod; 33. Spur gear three; 34. Fixed plate; 35. Guide groove; 36. Guide block; 37. Mounting ring; 38. Slider; 39. Fan blade; 40. Annular guide plate; 41. Inspection box; 42. Motor three; 43. Worm; 44. Worm wheel; 45. Bidirectional threaded rod; 46. Screw sleeve; 47. Limit rod; 48. L-shaped mounting plate one; 49. L-shaped mounting plate two; 50. Inspection plate one; 51. Inspection plate two; 52. Positioning column; 53. Insert rod. DETAILED DESCRIPTION

[0033] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further explained below in conjunction with specific implementation methods.

[0034] like Figure 1-Figure 12As shown, a chip temperature shock stress screening test system described in an embodiment of the present invention includes a test bench 1, a bottom cover 9 is fixedly connected to the top of the inner cavity of the test bench 1, a sealing plate 10 is fixedly connected to the top of the bottom cover 9, a sealing cover 2 is attached to the top of the sealing plate 10, a lifting warehouse 4 is provided on the top side of the test bench 1, a lifting unit is provided in the lifting warehouse 4, the lifting unit is connected to the sealing cover 2 by transmission, a detection box 41 is fixedly connected to the top side of the sealing plate 10, a detection unit is provided on the detection box 41, the detection box 41 is adapted to the sealing cover 2, a station seat 28 is rotatably connected to the sealing plate 10, and a lifting unit is provided below the bottom cover 9. The control unit is connected to the workstation 28 by transmission. A temperature control chamber 11 is provided on one side of the inner cavity of the test bench 1. A temperature control unit is provided in the temperature control chamber 11. The temperature control chamber 11 is connected to the inner cavity of the bottom cover 9 through an air outlet pipe 16. An air vent is provided at the center of the sealing plate 10. An air inlet pipe 15 is fixedly connected to the bottom of the air vent of the sealing plate 10. The end of the air inlet pipe 15 away from the sealing plate 10 is connected to the temperature control unit. The sealing plate 10 is evenly provided with air outlet holes 19 near the edge. When working, before conducting the hot and cold shock experiment, the staff first places the chip on the workstation 28, and drives the sealing cover to move up and down through the lifting unit. 2 slides down and fits the sealing plate 10 completely, so that a closed space is formed between the sealing cover 2 and the sealing plate 10. The temperature control unit provided in the temperature control chamber 11 cooperates with the air inlet pipe 15 and the air outlet pipe 16, so that the air flow can circulate between the closed space formed by the temperature control chamber 11, the sealing plate 10 and the sealing cover 2 and the bottom cover 9. At the same time, the staff controls the temperature of the circulating air flow, and can implement the hot and cold alternating impact test on the chip on the work station seat 28. The control unit can drive the work station seat 28 to rotate, so that the detection units on the detection box 41 can perform performance inspection on the passing chips in turn. The test bench 1 can screen out unqualified chips by cooperating with each other in the test. The problem in the prior art that the chips need to slide back and forth between the hot and cold chambers when undergoing hot and cold shock tests is solved, and the chips may easily suffer from poor test results due to the reciprocating up and down movement. In addition, most of the existing hot and cold shock test equipment do not have the function of directly performing performance testing after temperature shock. This requires the chips to be taken out of the test equipment for performance testing after the hot and cold alternating shock test, which greatly affects the accuracy of the chip performance test results after the temperature shock.

[0035] The temperature control unit includes a refrigerator 12, an electric heating tube 13 and a centrifugal fan 14. The refrigerator 12, the electric heating tube 13 and the centrifugal fan 14 are installed in the temperature control chamber 11 from bottom to top. The end of the air inlet pipe 15 away from the sealing plate 10 is connected to the shell of the centrifugal fan 14. A return air duct 17 is provided on the side of the temperature control chamber 11 close to the air outlet pipe 16. One end of the return air duct 17 is connected to the air outlet pipe 16, and the other end of the return air duct 17 extends to the bottom of the inner cavity of the temperature control chamber 11. The horizontal height of the port of the return air duct 17 in the temperature control chamber 11 is lower than the horizontal height of the refrigerator 12. When working, the centrifugal fan 14 is started, so that the airflow in the space above the sealing plate 10 enters the bottom cover 9 through the air outlet hole 19 provided at the edge of the sealing plate 10, and then enters the temperature control chamber 11 along the air outlet pipe 16 and the return air duct 17. When hot air is needed, the refrigerator 12 is in a closed state, and the electric heating tube 13 is in an open state, so that the airflow entering the temperature control chamber 11 is heated and then enters the air inlet pipe 15 under the action of the centrifugal fan 14, and re-enters the space above the sealing plate 10 along the air inlet pipe 15, thereby realizing a high-temperature impact simulation on the chip. When cold air is needed, the refrigerator 12 is turned on, and the electric heating tube 13 is turned off, so that the airflow entering the temperature control chamber 11 is cooled and then re-enters the space above the sealing plate 10 by the centrifugal fan 14 and the air inlet pipe 15, thereby realizing a low-temperature impact simulation on the chip. Through the circulating flow structure of the hot and cold air flows, the extreme environment that the chip needs to face in daily use is fully simulated. At the same time, it avoids the situation where the chip test results are poor because the traditional lifting cage needs to be moved.

[0036] The lifting unit includes a motor 5, a gear transmission seat 6, a screw 7 and a lifting seat 8. The motor 5 is fixedly installed in the lifting warehouse 4, and the screw 7 is rotatably connected in the lifting warehouse 4. The motor 5 and the screw 7 are connected through the gear transmission seat 6. The screw 7 is threadedly connected with the lifting seat 8. The lifting seat 8 is slidably connected with the lifting warehouse 4. The lifting seat 8 is fixedly connected to the top side wall of the sealing cover 2, and the sealing cover 2 3 is fixedly connected in the sealing cover 2. The bottom end of the sealing cover 2 3 is in contact with the top of the sealing plate 10. When working, the gear transmission seat 6 is mainly composed of two meshing spur gears, and the two spur gears are respectively fixedly connected to the output end of the motor 5 and the screw 7. The motor 5 cooperates with the gear transmission seat 6 to drive the screw 7 to rotate forward and reverse, so that the staff can lift or lower the sealing cover 2. By arranging another sealing cover 2 3 in the sealing cover 2 and cooperating with the sealing plate 10, a two-layer sealed space is formed, which greatly avoids the dispersion of airflow during hot and cold shocks.

[0037] The detection unit includes a motor three 42, a detection plate one 50 and a detection plate two 51. The motor three 42 is fixedly installed on the outer wall of the detection box 41. The output end of the motor three 42 is fixedly connected to a worm 43. The end of the worm 43 away from the motor three 42 extends to the inner cavity of the detection box 41 and is meshed with a worm wheel 44. A bidirectional threaded rod 45 is fixedly connected to the worm wheel 44. A symmetrical screw sleeve 46 is threadedly connected to the bidirectional threaded rod 45. An L-shaped mounting plate one 48 and an L-shaped mounting plate two 49 are slidably connected to the side of the detection box 41 close to the workstation seat 28. The detection plate one 50 is evenly fixed to the L-shaped mounting plate one 48, and the detection plate two 51 is evenly fixed to the L-shaped mounting plate two 49. The detection plate one 50 and the detection plate two 51 are staggered. The L-shaped mounting plate 1 48 and the L-shaped mounting plate 2 49 are respectively fixedly connected to the two screw sleeves 46, and the inner cavity of the detection box 41 is fixedly connected to the limit rod 47, and the two screw sleeves 46 are slidably connected to the limit rod 47; during operation, when it is necessary to perform performance testing on the chip after impact, the motor 3 42 cooperates with the worm 43 to drive the worm wheel 44, so that the bidirectional threaded rod 45 can rotate forward and reverse, and then the two screw sleeves 46 can slide relative to or oppositely, so that the multiple detection plates 1 50 on the L-shaped mounting plate 1 48 cooperate with the multiple detection plates 2 51 on the L-shaped mounting plate 2 49 to perform performance testing on the passing chips, thereby realizing direct performance testing of the chips after cold and hot shocks, and simulating and testing the performance of the chips in extreme environments.

[0038] The control unit includes a motor 20, a spur gear 23, an adjusting wheel 26 and an adjusting ring 27. The motor 20 is fixedly installed on the bottom of the bottom cover 9. The output end of the motor 20 is fixedly connected to a rotating shaft 21. The top of the rotating shaft 21 penetrates the air intake pipe 15 and extends to the top of the sealing plate 10. The rotating shaft 21 is sealed and rotatably connected to the air intake pipe 15. The station seat 28 is fixedly connected to the rotating shaft 21. A fixing member 22 is fixedly connected to the center of the sealing plate 10. The top of the fixing member 22 is rotatably connected to the rotating shaft 24. A spur gear 25 is fixedly connected to the rotating shaft 24. One side of the spur gear 25 is meshingly connected to the spur gear 23. The spur gear 23 is fixedly connected to the rotating shaft 21. The top of the rotating shaft 24 extends to the top of the sealing plate 10 and is fixedly connected to the adjusting wheel 26. The outer side of the adjusting wheel 26 is provided with teeth. The bottom of the station seat 28 is fixedly connected to the adjusting ring 27. The inner ring of the adjusting ring 27, etc. The distance is provided with teeth, and the adjusting wheel 26 is meshed with the adjusting ring 27; when working, the motor 20 drives the spur gear 23 on the rotating shaft 21 to rotate, so that the spur gear 25 rotates accordingly, and then the rotating shaft 24 drives the adjusting wheel 26 to rotate. When the teeth on the adjusting wheel 26 mesh with the teeth on the adjusting ring 27, the adjusting wheel 26 drives the adjusting ring 27 to rotate an angle, so that after the work station 28 rotates an angle, the chip that has completed the performance test is transferred out from the detection box 41, and at the same time, another chip to be tested is transferred to the detection box 41. When the adjusting wheel 26 is separated from the adjusting ring 27, the work station 28 stops rotating, and the detection unit on the detection box 41 starts to perform performance detection until the adjusting wheel 26 meshes with the adjusting ring 27 again. This reciprocating process realizes the intermittent rotation of the work station 28, which is convenient for the chips on the work station 28 to be detected in turn.

[0039] An annular baffle 18 is fixedly connected to the top of the sealing plate 10, and the annular baffle 18 is located between the work station seat 28 and the air outlet 19. An air collecting cylinder 29 is fixedly connected to the work station seat 28, and a stirring component is provided on the outer side of the air collecting cylinder 29. During operation, the annular baffle 18 is provided between the work station seat 28 and the air outlet 19 of the sealing plate 10, so that the airflow in the air inlet pipe 15 will not flow out directly from the air outlet 19 quickly after entering the space formed by the sealing plate 10 and the sealing cover 23, causing the temperature to be unable to rise or fall quickly, thereby ensuring the rapid alternation of high temperature and low temperature environments, and by providing the air collecting cylinder 29 on the work station seat 28 and cooperating with the stirring component, the airflow entering the space formed by the sealing plate 10 and the sealing cover 23 is stirred, thereby achieving uniform distribution, and the temperature in the annular baffle 18 is the same everywhere, thereby avoiding the situation where the temperature changes in a gradient from the lowest point to the highest point of the annular baffle 18.

[0040] The stirring assembly includes a gear ring 31, a spur gear three 33, a rotating rod 32 and a fan blade 39. A plurality of gear rings 31 are evenly fixed on the outer wall of the gas collecting cylinder 29. The top of the rotating shaft 21 extends to the top of the gas collecting cylinder 29 and is sealed and rotatably connected to the gas collecting cylinder 29. Two groups of fixed plates 34 are symmetrically arranged on the outer side of the gas collecting cylinder 29. The multiple fixed plates 34 in the same group are fixedly connected by a connecting rod 1. The rotating shaft 21 and the fixed plate 34 located at the top are fixedly connected by a connecting rod 2. The rotating rod 32 is rotatably connected to the fixed plate 34. The end of the rotating rod 32 close to the gas collecting cylinder 29 is fixedly connected to a spur gear. Three 33, the spur gear three 33 is meshed and connected with the gear ring 31, and a mounting ring 37 is provided on the rotating rod 32, and the fan blades 39 are evenly fixed on the outer wall of the mounting ring 37; when working, the two sets of fixed plates 34 are driven by the rotating shaft 21 to rotate along the outer side of the air collecting cylinder 29, so that the spur gear three 33 on the rotating rod 32 is continuously meshed with the gear ring 31, and then the rotating rod 32 rotates accordingly, so that the fan blades 39 on the mounting ring 37 rotate with the rotating rod 32 while also revolving around the rotating shaft 21, so as to stir and evenly distribute the airflow in the annular partition 18.

[0041] An annular guide plate 40 is fixedly connected to one side of the fixed plate 34 close to the air collecting cylinder 29. The outer wall of the annular guide plate 40 is provided with a reciprocating threaded groove. A slider 38 is movably connected to the inner wall of the mounting ring 37. The slider 38 is slidably connected to the reciprocating threaded groove. Guide grooves 35 are symmetrically provided on the rotating rod 32. Guide blocks 36 are symmetrically fixed to the inner wall of the mounting ring 37. The guide blocks 36 are slidably connected to the guide grooves 35. During operation, the mounting ring 37 rotates with the rotating rod 32 through the sliding cooperation between the guide blocks 36 and the guide grooves 35. When the mounting ring 37 rotates, the slider 38 slides along the reciprocating threaded groove on the annular guide plate 40, so that the annular guide plate 40 drives the fan blades 39 to slide axially back and forth along the rotating rod 32, thereby further enhancing the stirring effect on the airflow.

[0042] Through holes 30 are evenly opened on the outer wall of the air collecting cylinder 29; during operation, by evenly opening the through holes 30 on the air collecting cylinder 29, a part of the air flow flowing out of the air inlet pipe 15 enters the air collecting cylinder 29 and is ejected from the through holes 30 and evenly sprayed into the space in the annular partition 18.

[0043] A plurality of positioning posts 52 are fixedly connected to the top of the work seat 28, and positioning holes are provided on the positioning posts 52. A plurality of insertion rods 53 are fixedly connected to the bottom of the work seat 28, and the insertion rods 53 on the upper side are matched with the positioning holes on the positioning posts 52 on the lower side thereof. During operation, the lowest work seat 28 is directly rotatably connected to the sealing plate 10 through the positioning posts 52 and the insertion rods 53 provided on the work seat 28, and then a second work seat 28 can be placed on the lowest work seat 28, and so on. When conducting a hot and cold shock experiment, a plurality of work seats 28 can be placed to realize the hot and cold shock test on a large number of chips at the same time, thereby improving efficiency.

[0044] Working principle: before conducting the hot and cold shock test, the staff first places the chip on the workstation seat 28, and drives the sealing cover 2 to slide down and fit the sealing plate 10 completely through the lifting unit, so that a closed space is formed between the sealing cover 2 and the sealing plate 10. The temperature control unit provided in the temperature control chamber 11 cooperates with the air inlet pipe 15 and the air outlet pipe 16, so that the air flow can circulate between the closed space formed by the temperature control chamber 11, the sealing plate 10 and the sealing cover 2 and the bottom cover 9. At the same time, the staff controls the temperature of the circulating air flow, and can realize the hot and cold alternating shock test on the chip on the workstation seat 28. The control unit can drive the workstation seat 28 to rotate, so that the detection unit on the detection box 41 can perform performance detection on the passing chips in turn. Unqualified chips are screened out. During the test, the centrifugal fan 14 is started, so that the airflow in the space above the sealing plate 10 enters the bottom cover 9 through the air outlet 19 provided at the edge of the sealing plate 10, and then enters the temperature control chamber 11 along the air outlet pipe 16 and the return air duct 17. When hot air is needed, the refrigerator 12 is turned off, and the electric heating tube 13 is turned on, so that the airflow entering the temperature control chamber 11 enters the air inlet pipe 15 after being heated under the action of the centrifugal fan 14, and re-enters the space above the sealing plate 10 along the air inlet pipe 15, so as to realize the high-temperature impact simulation of the chip. When cold air is needed, the refrigerator 12 is turned on, and the electric heating tube 13 is turned off, so that the airflow entering the temperature control chamber 11 enters the sealing chamber 11 again after being cooled by the centrifugal fan 14 in cooperation with the air inlet pipe 15. In the space above the plate 10, low-temperature impact simulation of the chip is realized. The motor 15 cooperates with the gear transmission seat 6 to drive the screw 7 to rotate forward and reverse, which makes it convenient for the staff to raise or lower the sealing cover 2. By arranging another sealing cover 2 3 in the sealing cover 2 and cooperating with the sealing plate 10, a two-layer sealed space is formed, which greatly avoids the dispersion of airflow during hot and cold impact. When the chip after the impact needs to be tested for performance, the motor 3 42 cooperates with the worm 43 and worm wheel 44 to make the bidirectional threaded rod 45 rotate forward and reverse, so that the two screw sleeves 46 can slide relative to or oppositely, which is convenient for the multiple detection plates 1 50 on the L-shaped mounting plate 1 48 to cooperate with the multiple detection plates 2 51 on the L-shaped mounting plate 2 49 to detect the passing chips. Performance testing is carried out to directly test the performance of the chip after the cold and hot shock, simulating the performance of the chip in an extreme environment. The motor 20 drives the spur gear 1 23 on the rotating shaft 1 21 to rotate, so that the spur gear 2 25 rotates accordingly, and then the rotating shaft 24 drives the adjusting wheel 26 to rotate. When the teeth on the adjusting wheel 26 mesh with the teeth on the adjusting ring 27, the adjusting wheel 26 drives the adjusting ring 27 to rotate an angle, so that after the station seat 28 rotates an angle, the chip that has completed the performance test is transferred out from the detection box 41, and at the same time, another chip to be tested is transferred to the detection box 41. When the adjusting wheel 26 is separated from the adjusting ring 27, the station seat 28 stops rotating, and the detection unit on the detection box 41 starts to perform performance testing.Until the adjusting wheel 26 is meshed with the adjusting ring 27 again, the intermittent rotation of the station seat 28 is realized, which is convenient for the chips on the station seat 28 to be detected in turn. By setting the annular partition plate 18 between the station seat 28 and the air outlet 19 of the sealing plate 10, the air flow in the air inlet pipe 15 will not flow out directly from the air outlet 19 quickly after entering the space formed by the sealing plate 10 and the sealing cover 23, causing the temperature to be unable to rise or fall quickly, thereby ensuring the rapid alternation of high temperature and low temperature environments. By setting a gas collecting cylinder on the station seat 28 The two sets of fixed plates 34 are driven by the rotating shaft 21 to rotate along the outer side of the gas collecting cylinder 29, so that the spur gear 33 on the rotating rod 32 is continuously meshed with the gear ring 31, and the rotating rod 32 is rotated accordingly, so that the fan blades 39 on the mounting ring 37 are rotated along with the rotation. While the rod 32 rotates, it also revolves around the rotating shaft 21, so as to stir and evenly distribute the airflow in the annular partition 18. The sliding cooperation between the guide block 36 and the guide groove 35 allows the mounting ring 37 to rotate with the rotating rod 32. When the annular mounting plate rotates, the slider 38 slides along the reciprocating thread groove on the annular guide plate 40, so that the annular guide plate 40 drives the fan blades 39 to slide axially back and forth along the rotating rod 32, further enhancing the stirring effect of the airflow. By evenly opening through holes on the air collecting cylinder 29 30, so that part of the air flow from the air inlet pipe 15 enters the air collecting cylinder 29 and then sprays out from the through hole 30, and is evenly sprayed into the space in the annular partition 18. Through the positioning column 52 and the insertion rod 53 provided on the station seat 28, the lowest station seat 28 is directly connected to the sealing plate 10 for rotation, and then the second station seat 28 can be placed on the lowest station seat 28, and so on. When performing a thermal shock test, multiple station seats 28 can be placed to realize thermal shock tests on a large number of chips at the same time, thereby improving efficiency.

[0045] The above-mentioned front, back, left, right, top and bottom are all based on the figures in the specification. Figure 1 As a benchmark, according to the person's observation perspective, the side of the device facing the observer is defined as the front, the left side of the observer is defined as the left, and so on.

[0046] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the scope of protection of the present invention.

[0047] The above shows and describes the basic principles, main features and advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited to the above embodiments. The above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. A chip temperature shock stress screening test system, characterized in that: The test bench (1) comprises a test bench (1), wherein a bottom cover (9) is fixedly connected to the top of the inner cavity of the test bench (1), a sealing plate (10) is fixedly connected to the top of the bottom cover (9), a sealing cover (2) is attached to the top of the sealing plate (10), a lifting bin (4) is provided on one side of the top of the test bench (1), a lifting unit is provided in the lifting bin (4), the lifting unit is transmission-connected to the sealing cover (2), a detection box (41) is fixedly connected to one side of the top of the sealing plate (10), a detection unit is provided on the detection box (41), the detection box (41) is adapted to the sealing cover (2), and a work station seat is rotatably connected to the sealing plate (10). (28), a control unit is provided below the bottom cover (9), the control unit is connected to the workstation seat (28) by transmission, a temperature control chamber (11) is provided on one side of the inner cavity of the test bench (1), a temperature control unit is provided in the temperature control chamber (11), the temperature control chamber (11) and the inner cavity of the bottom cover (9) are connected via an air outlet pipe (16), an air vent is provided at the center of the sealing plate (10), an air inlet pipe (15) is fixedly connected to the bottom of the air vent of the sealing plate (10), one end of the air inlet pipe (15) away from the sealing plate (10) is connected to the temperature control unit, and air outlet holes (19) are evenly provided near the edge of the sealing plate (10); The control unit comprises a second motor (20), a first spur gear (23), an adjusting wheel (26) and an adjusting ring (27); the second motor (20) is fixedly mounted on the bottom of the bottom cover (9); the output end of the second motor (20) is fixedly connected to a first rotating shaft (21); the top end of the first rotating shaft (21) penetrates the air intake pipe (15) and extends to the top of the sealing plate (10); the first rotating shaft (21) is sealingly rotatably connected to the air intake pipe (15); the work station seat (28) is fixedly connected to the first rotating shaft (21); a fixing member (22) is fixedly connected to the center of the sealing plate (10); the top of the fixing member (22) is fixedly connected to the center of the sealing plate (10); The second rotating shaft (24) is rotatably connected to the second rotating shaft (24), a spur gear (25) is fixedly connected to the second rotating shaft (24), one side of the spur gear (25) is meshingly connected to the spur gear (23), the spur gear (23) is fixedly connected to the first rotating shaft (21), the top end of the second rotating shaft (24) extends to the top of the sealing plate (10) and is fixedly connected to an adjusting wheel (26), the outer side of the adjusting wheel (26) is provided with teeth, the bottom of the station seat (28) is fixedly connected to an adjusting ring (27), the inner ring of the adjusting ring (27) is provided with teeth at equal intervals, and the adjusting wheel (26) is meshingly connected to the adjusting ring (27); An annular baffle (18) is fixedly connected to the top of the sealing plate (10), the annular baffle (18) is located between the work station seat (28) and the air outlet (19), a gas collecting cylinder (29) is fixedly connected to the work station seat (28), and a stirring assembly is provided on the outer side of the gas collecting cylinder (29); The stirring assembly comprises a gear ring (31), a spur gear three (33), a rotating rod (32) and a fan blade (39); a plurality of groups of gear rings (31) are evenly fixedly connected to the outer wall of the gas collecting cylinder (29); the top end of the rotating shaft one (21) extends to the top of the gas collecting cylinder (29) and is sealed and rotatably connected to the gas collecting cylinder (29); two groups of fixed plates (34) are symmetrically arranged on the outer side of the gas collecting cylinder (29); the plurality of fixed plates (34) in the same group are fixedly connected by a connecting rod one. The rotating shaft 1 (21) is fixedly connected to the uppermost fixed plate (34) via a connecting rod 2; a rotating rod (32) is rotatably connected to the fixed plate (34); a spur gear 3 (33) is fixedly connected to one end of the rotating rod (32) close to the gas collecting cylinder (29); the spur gear 3 (33) is meshingly connected to the gear ring (31); a mounting ring (37) is provided on the rotating rod (32); and fan blades (39) are evenly fixedly connected to the outer wall of the mounting ring (37); An annular guide plate (40) is fixedly connected to one side of the fixed plate (34) close to the gas collecting cylinder (29); a reciprocating thread groove is provided on the outer wall of the annular guide plate (40); a slider (38) is movably connected to the inner wall of the mounting ring (37); the slider (38) is slidably connected to the reciprocating thread groove; guide grooves (35) are symmetrically provided on the rotating rod (32); guide blocks (36) are symmetrically fixedly connected to the inner wall of the mounting ring (37); the guide blocks (36) are slidably connected to the guide grooves (35).

2. A chip temperature shock stress screening test system according to claim 1, characterized in that: The temperature control unit comprises a refrigerator (12), an electric heating tube (13) and a centrifugal fan (14); the refrigerator (12), the electric heating tube (13) and the centrifugal fan (14) are installed in the temperature control chamber (11) in sequence from bottom to top; the end of the air inlet pipe (15) away from the sealing plate (10) is connected to the outer shell of the centrifugal fan (14); a return air duct (17) is provided on the side of the temperature control chamber (11) close to the air outlet pipe (16); one end of the return air duct (17) is connected to the air outlet pipe (16); the other end of the return air duct (17) extends to the bottom of the inner cavity of the temperature control chamber (11); the horizontal height of the port of the return air duct (17) located in the temperature control chamber (11) is lower than the horizontal height of the refrigerator (12).

3. A chip temperature shock stress screening test system according to claim 2, characterized in that: The lifting unit comprises a motor 1 (5), a gear transmission seat (6), a lead screw (7) and a lifting seat (8); the motor 1 (5) is fixedly installed in the lifting bin (4); the lead screw (7) is rotatably connected in the lifting bin (4); the motor 1 (5) and the lead screw (7) are transmission-connected via the gear transmission seat (6); the lead screw (7) is threadedly connected to the lifting seat (8); the lifting seat (8) is slidably connected to the lifting bin (4); the lifting seat (8) is fixedly connected to the top side wall of the sealing cover 1 (2); the sealing cover 2 (3) is fixedly connected in the sealing cover 1 (2); the bottom end of the sealing cover 2 (3) is in contact with the top of the sealing plate (10).

4. A chip temperature shock stress screening test system according to claim 3, characterized in that: The detection unit comprises a motor three (42), a detection plate one (50) and a detection plate two (51); the motor three (42) is fixedly mounted on the outer wall of the detection box (41); the output end of the motor three (42) is fixedly connected to a worm (43); one end of the worm (43) away from the motor three (42) extends to the inner cavity of the detection box (41) and is meshedly connected to a worm wheel (44); a bidirectional threaded rod (45) is fixedly connected to the worm wheel (44); a symmetrical screw sleeve (46) is threadedly connected to the bidirectional threaded rod (45); the detection box (41) is close to the work station seat (2 An L-shaped mounting plate 1 (48) and an L-shaped mounting plate 2 (49) are slidably connected on one side of the detection box (8); a detection plate 1 (50) is evenly fixedly connected to the L-shaped mounting plate 1 (48); a detection plate 2 (51) is evenly fixedly connected to the L-shaped mounting plate 2 (49); the detection plates 1 (50) and 2 (51) are staggeredly distributed; the L-shaped mounting plate 1 (48) and the L-shaped mounting plate 2 (49) are respectively fixedly connected to two screw sleeves (46); a limit rod (47) is fixedly connected to the inner cavity of the detection box (41); and the two screw sleeves (46) are both slidably connected to the limit rod (47).

5. A chip temperature shock stress screening test system according to claim 1, characterized in that: Through holes (30) are evenly formed on the outer wall of the gas collecting cylinder (29).

6. A chip temperature shock stress screening test system according to claim 4, characterized in that: A plurality of positioning columns (52) are fixedly connected to the top of the work station seat (28), and positioning holes are provided on the positioning columns (52). A plurality of insertion rods (53) are fixedly connected to the bottom of the work station seat (28), and the insertion rods (53) on the upper side are matched with the positioning holes on the positioning columns (52) on the lower side.

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