A solid state hard disk test platform

Abstract

The present invention discloses a solid state hard disk test platform, which belongs to the field of solid state hard disk detection technology, including a card opening box and a detection platform, wherein a plurality of hard disk components to be detected are arranged in the card opening box, and the left and right inner side walls of the card opening box are respectively connected with a hot storage slot plate and a cold storage slot plate for performing high and low temperature tests on the hard disk components, and the inner side wall of the card opening box is connected with a card opening roller through a conversion shaft. The present invention can detect the circuit board warpage of the hard disk component by using the value change transmitted by the pressure sensor corresponding to the leveling telescopic column through the setting of the leveling cavity plate and the leveling telescopic column, so as to facilitate the rapid screening of the hard disk components with unqualified warpage for rework operation, and at the same time, the setting of the limit card connection airbag seat and the final opening card seat can perform alternating aging tests on the hard disk component, so as to avoid the stagnation of other test steps when performing the aging test, so as to facilitate the improvement of the efficiency of the overall card opening test process before the hard disk component is packaged.

Description

Technical Field

[0001] The present invention relates to the technical field of solid state hard disk detection, and in particular to a solid state hard disk test platform. Background Art

[0002] Solid-state hard disk, also known as solid-state drive, is a hard disk made of solid-state electronic storage chip array. There are two types of storage media for solid-state hard disks, one is using flash memory (FLASH chip) as the storage medium, and the other is using DRAM as the storage medium.

[0003] During the production process of solid-state drives, before the shell is packaged, the solid-state drive is generally subjected to a card opening test. The first stage of card opening is mainly used to infer and identify the number, capacity and type of flash memory particles. The final card opening is mainly to use the set information to generate customized firmware and write it into the main control chip. However, during the card opening process, the solid-state drive that is not packaged in the shell is usually required to undergo high and low temperature tests and aging tests, which makes the entire card opening test process time-consuming, resulting in low overall production quality inspection efficiency. In addition, during the production process of solid-state drives, the chip is soldered on an entire circuit board in different areas, and then the entire circuit board is divided into a single primary solid-state drive. In the process of dividing the entire circuit board into multiple plates, the stress of the plates after division will change, which may easily cause some plates to have a large warping degree, so that when the primary solid-state drive is packaged with the shell, some plate areas are pressed against the shell, causing some chips or components on the primary solid-state drive to be damaged. Therefore, a solid-state drive test platform is proposed for solid-state drives that are not packaged in the shell. Summary of the invention

[0004] The purpose of the present invention is to solve the problem in the prior art that in the process of card opening, high and low temperature tests and aging tests are usually required for solid-state hard disks that are not packaged in a shell, which makes the entire card opening test process time-consuming and leads to low overall production quality inspection efficiency. In the production process of solid-state hard disks, the chip will be soldered on an entire circuit board in different areas, and then the entire circuit board will be divided into panels into a single primary solid-state hard disk. In the process of dividing the entire circuit board into multiple panels, the stress of the panels after division will change, which may easily cause some panels to have a large warping degree, so that when the primary solid-state hard disk is packaged with the shell, some panel areas are pressed against the shell, causing some chips or components on the primary solid-state hard disk to be damaged. A solid-state hard disk testing platform is proposed.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] A solid state hard disk test platform comprises a card opening box and a detection platform, wherein a plurality of hard disk components to be detected are arranged in the card opening box, and the left and right inner side walls of the card opening box are respectively connected with a hot storage slot plate and a cold storage slot plate for performing high and low temperature tests on the hard disk components, and the inner side wall of the card opening box is connected with a card opening roller through a conversion shaft, and the outer side wall of the card opening roller is connected with a plurality of flatness detection components for detecting the warpage of the circuit board after segmentation on the hard disk component through a plurality of initial card opening seats;

[0007] A plurality of electrically-controlled retractable plates are arranged below the card opening roller, and the side wall of the output end of the electrically-controlled retractable plate is connected to two limit clamping airbag seats for removing the hard disk component from above through a flip motor, a micro air pump is arranged between the two limit clamping airbag seats, and a final opening seat is arranged below the limit clamping airbag seat.

[0008] Preferably, a heat exhaust pump is fixedly connected to the top of the card opening box, a flow guide hole is opened in the card opening box, a dustproof heat dissipation cover is fixedly connected to the inner side wall of the bottom end of the flow guide hole, the dustproof heat dissipation cover is located on one side of the final card opening seat, and the bottom end of the card opening box is fixedly connected to the top of the detection platform through a plurality of pillars.

[0009] Preferably, the left and right inner walls of the card opening box are fixedly connected to the side walls of the hot storage slot plate and the cold storage slot plate respectively, the card opening roller is located between the hot storage slot plate and the cold storage slot plate, and the hot storage slot plate and the cold storage slot plate are provided with storage slots compatible with the hard disk components on the middle side walls.

[0010] Preferably, the inner side wall of the card opening box is rotatably connected to the card opening roller via a conversion shaft, and the outer side wall of the card opening roller is fixedly connected to the side walls of a plurality of initial card opening seats, and the number of the initial card opening seats is four.

[0011] Preferably, the leveling detection assembly consists of a leveling cavity plate and a plurality of leveling telescopic columns, and the initially opened card seat is located on one side wall of the two sockets and is respectively fixedly connected to two fixed axis support plates, and a transfer cross plate is fixedly connected between the two fixed axis support plates via a vertical plate, and a bidirectional electric push rod is fixedly connected to the end of the transfer cross plate.

[0012] Preferably, both ends of the bidirectional electric push rod are fixedly connected with an adjustment rack, one side of the adjustment rack is meshed with a rotary measuring gear, the inner side wall of the rotary measuring gear is fixedly connected with a pin shaft, the inner side wall of the end of the fixed axis support plate is rotatably connected to the leveling cavity plate through the pin shaft, and the leveling telescopic column is provided with a pressure sensor at the telescopic column head located in the leveling cavity plate.

[0013] Preferably, the inner wall of the card opening box is fixedly connected to the side wall of the flip motor through an electric control telescopic plate, the output end of the flip motor is fixedly connected to the outer wall of the two-way telescopic tube through a flip cross bar, and the two ends of the two-way telescopic tube are respectively fixedly connected to two limit-clamping airbag seats.

[0014] Preferably, the micro air pump is fixedly connected to the two limit-clamping airbag seats through two pneumatic telescopic rods, and the micro air pump is interconnected with the two two-way telescopic tubes through two guide air pipes. The inner side wall of the bottom end of the card opening box is fixedly connected to the side wall of the final opening card seat, and there is a ventilation gap between the final opening card seat and the inner side wall of the bottom end of the card opening box.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] 1. This solution can detect the warpage of the circuit board of the hard disk component by setting up the leveling cavity plate and the leveling telescopic column, using the value changes transmitted by the pressure sensor corresponding to the leveling telescopic column, so as to quickly screen out the hard disk components with unqualified warpage for rework.

[0017] 2. This solution can perform alternating aging tests on hard disk components by setting up a limit card connection airbag seat and a final opening card seat, avoiding the stagnation of other test steps during the aging test, and facilitating improving the efficiency of the overall opening card test process before the hard disk component is packaged.

[0018] 3. This solution can perform high and low temperature tests on the hard disk components on the initial card holder by setting up hot storage slot plates and cold storage slot plates, so that various tests can be carried out synchronously in stages, and during the inspection process after flipping, the hard disk components to be tested can be inserted during the gap time. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A three-dimensional structural schematic diagram of a solid state hard disk test platform proposed by the present invention;

[0020] Figure 2 A cross-sectional view of a solid state hard disk test platform proposed by the present invention;

[0021] Figure 3 An assembly diagram of a solid state hard disk test platform proposed by the present invention;

[0022] Figure 4 for Figure 3 The enlarged view of point A in the middle;

[0023] Figure 5 This is a structural schematic diagram of the positions of a hot storage slot plate and a cold storage slot plate in a solid state hard disk test platform proposed by the present invention;

[0024] Figure 6 A schematic diagram of the structure of the connection between a card opening roller and a plurality of initial card opening seats in a solid state hard disk test platform proposed by the present invention;

[0025] Figure 7 This is a structural schematic diagram of a flatness detection component in a solid state hard disk test platform proposed by the present invention;

[0026] Figure 8 This is a structural schematic diagram of multiple limit-locking airbag seat positions in a solid-state hard disk test platform proposed by the present invention.

[0027] In the figure: 1. card opening box; 2. detection platform; 3. hard disk component; 4. heat exhaust air pump; 5. conversion shaft; 6. card opening roller; 7. initial card opening seat; 8. hot storage slot plate; 9. cold storage slot plate; 10. fixed axis support plate; 11. vertical plate; 12. two-way electric push rod; 13. adjustment rack; 14. rotating measuring gear; 15. pin shaft; 16. leveling cavity plate; 17. leveling telescopic column; 18. dustproof heat dissipation cover; 19. electric control telescopic plate; 20. flip motor; 21. flip cross bar; 22. two-way telescopic tube; 23. limit card airbag seat; 24. micro air pump; 25. guide air pipe; 26. final card opening seat. DETAILED DESCRIPTION

[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0029] Embodiment 1, refer to Figure 1-Figure 8 A solid state hard disk test platform comprises a card opening box 1 and a detection platform 2, wherein a plurality of hard disk components 3 to be detected are arranged in the card opening box 1, and the left and right inner side walls of the card opening box 1 are respectively connected with a hot storage slot plate 8 and a cold storage slot plate 9 for performing high and low temperature tests on the hard disk components 3, and the inner side wall of the card opening box 1 is connected with a card opening roller 6 through a conversion shaft 5, and the outer side wall of the card opening roller 6 is connected with a plurality of flatness detection components for detecting the warpage of the circuit board after segmentation on the hard disk component 3 through a plurality of initial card opening seats 7;

[0030] Furthermore, a heat exhaust pump 4 is fixedly connected to the top of the card opening box 1, a flow guide hole is opened in the card opening box 1, and a dust-proof heat dissipation cover 18 is fixedly connected to the inner side wall of the bottom end of the flow guide hole, and the dust-proof heat dissipation cover 18 is located on one side of the final card opening seat 26. The bottom end of the card opening box 1 is fixedly connected to the top of the detection platform 2 through a plurality of pillars, and the left and right inner side walls of the card opening box 1 are respectively fixedly connected to the side walls of the hot storage slot plate 8 and the cold storage slot plate 9, and the card opening roller 6 is located between the hot storage slot plate 8 and the cold storage slot plate 9. The hot storage slot plate 8 and the cold storage slot plate 9 are provided with storage slots compatible with the hard disk component 3 on the middle side walls. The inner side wall of the card opening box 1 is rotatably connected to the card opening roller 6 through the conversion shaft 5, and the outer side wall of the card opening roller 6 is fixedly connected to the side walls of multiple initial card opening seats 7. There are four initial card seats 7, and the leveling detection component is composed of a leveling cavity plate 16 and a plurality of leveling telescopic columns 17. The initial card seat 7 is located at one side wall of the two sockets and is fixedly connected to two fixed axis support plates 10, and a transfer cross plate is fixedly connected between the two fixed axis support plates 10 through a vertical plate 11, and a bidirectional electric push rod 12 is fixedly connected to the end of the transfer cross plate, and both ends of the bidirectional electric push rod 12 are fixedly connected to an adjustment rack 13, and a rotary measuring gear 14 is meshed on one side of the adjustment rack 13, and a pin shaft 15 is fixedly connected to the inner side wall of the rotary measuring gear 14, and the inner side wall of the end of the fixed axis support plate 10 is rotatably connected to the leveling cavity plate 16 through the pin shaft 15, and the leveling telescopic column 17 is located at the telescopic column head in the leveling cavity plate 16 and a pressure sensor is provided;

[0031] It should be noted that: the hard disk component 3 to be tested is inserted into the socket of the initial opening card seat 7 on the top of the card opening box 1 in sequence, and the back of the hard disk component 3 is placed on the same side as the leveling cavity plate 16. After the hard disk component 3 is inserted, the control conversion shaft 5 is first rotated 90° to the left, and the hard disk component 3 on the uppermost initial opening card seat 7 will rotate into the storage slot of the hot storage slot plate 8 to perform a high-temperature test of the solid-state hard disk. Subsequently, the initial opening card seat 7 is rotated 180° to the right, and the hard disk component 3 is rotated into the storage slot of the cold storage slot plate 9 to perform a low-temperature test of the solid-state hard disk. During the high and low temperature tests, the hard disk component 3 on the initial opening card seat 7 will perform inference and identification of information such as the number, capacity and type of the flash memory particles when the card is first opened.

[0032] After the hard disk component 3 is inserted into the socket of the initial card holder 7, the two-way electric push rod 12 is started to drive the adjustment racks 13 at both ends to move. The movement of the adjustment rack 13 will drive the rotation of the measuring gear 14. The rotation of the measuring gear 14 will drive the leveling cavity plate 16 to rotate on the fixed axis support plate 10 through the pin shaft 15. The rotation of the leveling cavity plate 16 will drive multiple leveling telescopic columns 17 to rotate and slide on the back side wall of the hard disk component 3. If the circuit board of the hard disk component 3 has a low warpage and is overall flat, the leveling telescopic columns 17 will not produce a large retraction in the leveling cavity plate 16 when rotating and sliding on the back side wall of the hard disk component 3, and there will be no large difference between the pressure sensors corresponding to the multiple leveling telescopic columns 17. Otherwise, it means that the circuit board of the hard disk component 3 has a large warpage and is easily compressed by the shell during subsequent installation, and the indicator lights at the corresponding positions are controlled by transmitting signals.

[0033] A further advantage of adopting the above method is that the warping of the circuit board of the hard disk component 3 can be detected by measuring the change in the value transmitted by the pressure sensor corresponding to the leveling telescopic column 17, so that the hard disk component 3 with unqualified warping can be quickly screened out for rework.

[0034] Example 2, reference Figure 1 - Figure 8 A plurality of electrically controlled telescopic plates 19 are arranged below the card opening roller 6, and the side wall of the output end of the electrically controlled telescopic plate 19 is connected to two limit clamping airbag seats 23 for removing the hard disk component 3 from the top through a flip motor 20, a micro air pump 24 is arranged between the two limit clamping airbag seats 23, and a final opening card seat 26 is arranged below the limit clamping airbag seat 23;

[0035] Further, the inner wall of the card opening box 1 is fixedly connected to the side wall of the flip motor 20 through the electric control telescopic plate 19, the output end of the flip motor 20 is fixedly connected to the outer side wall of the two-way telescopic tube 22 through the flip cross bar 21, the two ends of the two-way telescopic tube 22 are respectively fixedly connected to the two limit clamping airbag seats 23, the micro air pump 24 is respectively fixedly connected to the two limit clamping airbag seats 23 through two air pressure telescopic rods, the micro air pump 24 is respectively connected to the two two-way telescopic tubes 22 through two guide air pipes 25, the inner wall of the bottom end of the card opening box 1 is fixedly connected to the side wall of the final opening card seat 26, and there is a ventilation gap between the final opening card seat 26 and the inner wall of the bottom end of the card opening box 1;

[0036] It should be noted that: after completing the high and low temperature tests of the hard disk component 3 and the first stage of the card opening test, the initial card seat 7 is rotated to the lowest position of the card opening roller 6. At this time, the hard disk component 3 faces downward, and the micro air pump 24 is started to use the pneumatic telescopic rod to push the two limit card-connecting airbag seats 23 upward and downward respectively. When the upper limit card-connecting airbag seat 23 is adapted to be connected with the hard disk component 3 on the initial card seat 7, and the lower limit card-connecting airbag seat 23 is adapted to be connected with the hard disk component 3 on the final card seat 26, the micro air pump 24 will continuously supply filling gas to the limit card-connecting airbag seat 23 through the guide air pipe 25 and the two-way telescopic tube 22. The upper and lower limit card-connecting airbag seats 23 are flipped and exchanged by the flip motor 20, and a new hard disk component 3 is inserted into the final opening card seat 26 for the final opening test and aging test. The airflow introduced by the heat exhaust pump 4 can dissipate the heat of the densely packed hard disk components 3 on the final opening card seat 26 undergoing the aging test, simulating the normal long-term use state of a single hard disk component 3.

[0037] A further advantage of adopting the above method is that the hard disk component 3 can be subjected to alternate aging tests, thereby avoiding stagnation of other test steps during the aging test, thereby improving the efficiency of the overall card opening test process before the hard disk component 3 is packaged.

[0038] When the present invention is in use, the hard disk component 3 to be tested is inserted into the socket of the initial opening card seat 7 on the top of the card opening box 1 in sequence, and the back of the hard disk component 3 is placed on the same side as the leveling cavity plate 16. After the hard disk component 3 is inserted, the control conversion shaft 5 is first rotated 90° to the left, so that the hard disk component 3 on the uppermost initial opening card seat 7 will rotate into the storage slot of the hot storage slot plate 8 to perform a high temperature test of the solid state hard disk. Subsequently, the initial opening card seat 7 is rotated 180° to the right, so that the hard disk component 3 is rotated into the storage slot of the cold storage slot plate 9 to perform a low temperature test of the solid state hard disk. During the high and low temperature test, the hard disk component 3 on the initial opening card seat 7 will perform an inference and identification of the number, capacity and type of the flash memory particles when the card is first opened. In this way, the hard disk component 3 on the initial opening card seat 7 can be subjected to high and low temperature tests, so that various tests can be performed synchronously in stages, and during the detection process after flipping, the gap time is used to insert the hard disk component 3 to be tested.

[0039] After the hard disk component 3 is inserted into the socket of the initial card holder 7, the two-way electric push rod 12 is started to drive the adjustment racks 13 at both ends to move. The movement of the adjustment rack 13 will drive the rotation of the measuring gear 14. The rotation of the measuring gear 14 will drive the leveling cavity plate 16 to rotate on the fixed axis support plate 10 through the pin shaft 15. The rotation of the leveling cavity plate 16 will drive multiple leveling telescopic columns 17 to rotate and slide on the back side wall of the hard disk component 3. If the circuit board of the hard disk component 3 has a low warpage and is flat as a whole, the leveling telescopic columns 17 will rotate and slide on the back side wall of the hard disk component 3. When the leveling cavity plate 16 is shifted, no large retraction will occur in the leveling cavity plate 16, and there will be no large difference between the pressure sensors corresponding to the multiple leveling telescopic columns 17. Otherwise, it means that the circuit board of the hard disk component 3 has a large warpage, which is easy to be compressed by the shell during subsequent installation. The indicator light at the corresponding position is controlled to turn on and off by transmitting a signal. In this way, the warpage of the circuit board of the hard disk component 3 can be detected through the change of the value transmitted by the pressure sensor corresponding to the leveling telescopic column 17, so that the hard disk component 3 with unqualified warpage can be quickly screened out for rework.

[0040] After completing the high and low temperature tests of the hard disk component 3 and the first stage of the card opening test, let the initial card seat 7 rotate to the lowest position of the card opening roller 6. At this time, the hard disk component 3 faces downward, and the micro air pump 24 is started to use the pneumatic telescopic rod to push the two limit card connection airbag seats 23 upward and downward respectively, until the upper limit card connection airbag seat 23 is adapted to the hard disk component 3 on the initial card seat 7, and the lower limit card connection airbag seat 23 is adapted to the hard disk component 3 on the final card seat 26. The micro air pump 24 will continuously introduce filling gas to the limit card connection airbag seat 23 through the guide air pipe 25 and the two-way telescopic tube 22, so that the limit card connection airbag seat 23 presses the hard disk component 3 to limit the position, and when the limit card connection airbag seat 23 returns to its position. The hard disk components 3 on the initial card seat 7 and the final card seat 26 are pulled out respectively. During the pulling out process, the chip welding strength on the hard disk component 3 is also convenient to detect. Then, the upper and lower limit card airbag seats 23 are flipped and swapped through the flip motor 20, and the new hard disk component 3 is inserted into the final card seat 26 for the final card opening test and aging test. The airflow introduced by the heat exhaust air pump 4 can dissipate the heat of the dense hard disk components 3 undergoing the aging test on the final card seat 26, simulating the state of normal long-term use of a single hard disk component 3. In this way, the hard disk component 3 can be subjected to alternating aging tests, avoiding the stagnation of other test steps during the aging test, thereby facilitating improving the efficiency of the overall card opening test process before the hard disk component 3 is packaged.

[0041] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A solid state hard disk test platform, comprising a card opening box (1) and a test platform (2), wherein a plurality of hard disk components (3) to be tested are arranged in the card opening box (1), characterized in that: The left and right inner walls of the card opening box (1) are respectively connected to a hot storage slot plate (8) and a cold storage slot plate (9) for performing high and low temperature tests on the hard disk component (3); the inner wall of the card opening box (1) is connected to a card opening roller (6) via a conversion shaft (5); the outer wall of the card opening roller (6) is connected to a plurality of flatness detection components for detecting the warpage of the circuit board after segmentation on the hard disk component (3) via a plurality of initial card opening seats (7); A plurality of electrically controlled telescopic plates (19) are arranged below the card opening roller (6); the side wall of the output end of the electrically controlled telescopic plate (19) is connected to two limit clamping airbag seats (23) for removing the hard disk component (3) from above via a flip motor (20); a micro air pump (24) is arranged between the two limit clamping airbag seats (23); and a final opening card seat (26) is arranged below the limit clamping airbag seat (23).

2. A solid state drive test platform according to claim 1, characterized in that: The top of the card opening box (1) is fixedly connected to a heat exhaust pump (4), a flow guide hole is provided in the card opening box (1), a dustproof heat dissipation cover (18) is fixedly connected to the inner side wall of the bottom end of the flow guide hole, the dustproof heat dissipation cover (18) is located on one side of the final card opening seat (26), and the bottom end of the card opening box (1) is fixedly connected to the top of the detection platform (2) via a plurality of pillars.

3. A solid state drive testing platform according to claim 1, characterized in that: The left and right inner side walls of the card opening box (1) are respectively fixedly connected to the side walls of the hot storage slot plate (8) and the cold storage slot plate (9); the card opening roller (6) is located between the hot storage slot plate (8) and the cold storage slot plate (9); and the hot storage slot plate (8) and the cold storage slot plate (9) are provided with storage slots adapted to the hard disk component (3) on the middle side walls.

4. The solid state drive testing platform according to claim 1, characterized in that: The inner side wall of the card opening box (1) is rotatably connected to the card opening roller (6) via a conversion shaft (5), and the outer side wall of the card opening roller (6) is fixedly connected to the side walls of a plurality of initial card opening seats (7), wherein the number of the initial card opening seats (7) is four.

5. The solid state drive testing platform according to claim 1, characterized in that: The leveling detection assembly is composed of a leveling cavity plate (16) and a plurality of leveling telescopic columns (17); one side wall of the initial opening holder (7) located at two sockets is respectively fixedly connected to two fixed axis support plates (10); a transfer cross plate is fixedly connected between the two fixed axis support plates (10) via a vertical plate (11); and a bidirectional electric push rod (12) is fixedly connected to the end of the transfer cross plate.

6. A solid state drive test platform according to claim 5, characterized in that: Both ends of the bidirectional electric push rod (12) are fixedly connected to an adjustment rack (13), one side of the adjustment rack (13) is meshed with a rotary measuring gear (14), an inner side wall of the rotary measuring gear (14) is fixedly connected to a pin shaft (15), the inner side wall of the end of the fixed axis support plate (10) is rotatably connected to the leveling cavity plate (16) through the pin shaft (15), and a pressure sensor is provided at the telescopic column head of the leveling cavity plate (16) of the telescopic column (17).

7. The solid state drive testing platform according to claim 1, characterized in that: The inner wall of the card opening box (1) is fixedly connected to the side wall of the flip motor (20) via an electric control telescopic plate (19); the output end of the flip motor (20) is fixedly connected to the outer wall of the bidirectional telescopic tube (22) via a flip cross bar (21); and the two ends of the bidirectional telescopic tube (22) are respectively fixedly connected to two limit clamping airbag seats (23).

8. The solid state drive testing platform according to claim 1, characterized in that: The micro air pump (24) is fixedly connected to the two limit-clamping airbag seats (23) through two air pressure telescopic rods, and the micro air pump (24) is communicated with the two two-way telescopic tubes (22) through two flow guide air pipes (25). The inner side wall of the bottom end of the card opening box (1) is fixedly connected to the side wall of the final opening seat (26), and a ventilation gap exists between the final opening seat (26) and the inner side wall of the bottom end of the card opening box (1).

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