Glass substrate detection method and system

Abstract

The invention relates to the field of panel display glass substrate detection, and discloses a glass substrate detection method and system.The glass substrate detection method comprises the steps that coordinate information of a detection point on a to-be-detected glass substrate is obtained, and the to-be-detected glass substrate is photographed according to the detection point to obtain a surface image of the to-be-detected glass substrate; the surface information of the to-be-detected glass substrate is finally determined and recorded, and the surface information of the to-be-detected glass substrate is accurately and automatically matched by acquiring the surface pattern of the to-be-detected glass substrate, so that the detection efficiency is improved. The glass substrate detection system disclosed by the invention comprises the clamping device, the image acquisition device, the lighting device, the positioning device and the controller, and the glass substrate detection system acquires the surface pattern of the to-be-detected glass substrate through the image acquisition device, so that the surface information of the to-be-detected glass substrate can be accurately and automatically matched; and the detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the field of flat panel display glass substrate detection, and in particular to a glass substrate detection method and system. Background Art

[0002] In the field of flat panel display, liquid crystal display (LCD) usually needs to make thin film transistor array (TFT) and color filter (CF) on glass substrate to realize active control and color display of liquid crystal box. In the production process, it needs to go through multiple processes such as physical vapor deposition (PVD) film formation and chemical vapor deposition (CVD) film formation, photolithography, etching and photoresist removal. If large-area process defects occur in each of the above processes, such as uneven film thickness or uneven line width, they can be directly reflected on the surface of the glass substrate. Therefore, in the above manufacturing process, by inspecting the macroscopic surface of the glass substrate, the defects in the manufacturing process can be discovered in time, so as to feedback to the relevant equipment to adjust the process parameters, thereby improving the process problems and improving the product yield.

[0003] The existing glass substrate surface detection device is mainly composed of a light source, a glass substrate carrier and a driving mechanism. It is often necessary to manually record the detection results, and it is impossible to achieve intelligent detection and recording. On the one hand, this traditional detection device has the problem of low efficiency. On the other hand, there may be errors between the manual records and the actual conditions of the glass substrate, and it cannot accurately reflect the actual situation.

[0004] Therefore, how to improve the accuracy of glass substrate surface detection devices and improve work efficiency has become an urgent problem to be solved in the industry. Summary of the invention

[0005] The present invention aims to solve at least one of the problems in the background technology.

[0006] To this end, a first object of the present invention is to provide a glass substrate detection method, by acquiring coordinate information of detection points on a glass substrate to be detected, positioning is performed according to the coordinate information, and photographing the glass substrate to be detected with the detection points as a reference to obtain a surface image of the glass substrate to be detected, and determining and recording the surface information of the glass substrate to be detected according to the detection point coordinate information and the surface image of the glass substrate to be detected. By acquiring the surface graphics, the surface information of the glass substrate to be detected is accurately matched, thereby improving the detection efficiency.

[0007] A second objective of the present invention is to provide a glass substrate inspection system.

[0008] To achieve the above-mentioned purpose, a glass substrate detection method is proposed according to a first aspect of an embodiment of the present invention, which comprises obtaining coordinate information of any detection point on a glass substrate to be detected; photographing the glass substrate to be detected according to the coordinate information of the detection point to obtain a surface image of the glass substrate to be detected; and determining and recording the surface information of the glass substrate to be detected according to the coordinate information of the detection point and the surface image of the glass substrate to be detected.

[0009] According to another embodiment of the present invention, obtaining the coordinate information of any detection point on the glass substrate to be detected specifically includes: emitting a beam of laser light onto the glass substrate to be detected; defining the contact point between the laser light and the glass substrate to be detected as the detection point; and calculating the coordinate value of the detection point.

[0010] According to another embodiment of the present invention, photographing the glass substrate to be inspected according to the coordinate information of the detection point to acquire the surface image of the glass substrate to be inspected specifically includes: determining the specific position of the detection point on the glass substrate to be inspected according to the coordinates of the detection point; and photographing the surface of the glass substrate to be inspected with the detection point as the center to acquire the surface image of the glass substrate to be inspected.

[0011] According to another embodiment of the present invention, determining and recording the surface information of the glass substrate to be inspected based on the detection point coordinate information and the surface image of the glass substrate to be inspected specifically includes: sending the detection point coordinate information and the surface image of the glass substrate to be inspected to a server; identifying a label of the glass substrate to be inspected in the server; and reading corresponding glass substrate information and process flow information from the server according to the label of the glass substrate to be inspected.

[0012] According to another embodiment of the present invention, after reading the corresponding glass substrate information and process flow information from the server according to the tag of the glass substrate to be inspected, the method further includes: uploading the glass substrate information and the process flow information to a database.

[0013] To achieve the above-mentioned purpose, a second aspect of the present invention proposes a glass substrate inspection system, comprising a clamping device, an image acquisition device, an illumination device, a positioning device and a controller, wherein the clamping device is used to clamp a glass substrate to be inspected, the image acquisition device is used to take a picture of the glass substrate to be inspected to obtain a surface image thereof, and the clamping device, the image acquisition device, the illumination device and the positioning device are electrically connected to the controller.

[0014] According to another embodiment of the present invention, the clamping device includes a base, an adjustment mechanism and a carrier, the bottom of the adjustment mechanism is arranged on the base, and the top of the adjustment mechanism is connected to the carrier.

[0015] According to another embodiment of the present invention, the positioning device includes a laser locator.

[0016] According to another embodiment of the present invention, a server is further included, wherein the server is used to identify the label of the glass substrate to be inspected and store the glass substrate information and process flow information.

[0017] According to another embodiment of the present invention, a database is further included, and the database is used to record the glass substrate information and the process flow information.

[0018] Compared with the prior art, the present invention has the following beneficial effects:

[0019] The glass substrate detection method and system of the embodiments of the present invention obtain coordinate information of detection points on the glass substrate to be detected, take a picture of the glass substrate to be detected according to the detection points to obtain a surface image of the glass substrate to be detected, and finally determine and record the surface information of the glass substrate to be detected. By obtaining the surface image, the surface information of the glass substrate to be detected is accurately matched, thereby improving the detection efficiency.

[0020] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The accompanying drawings are only used to illustrate the embodiments and are not to be considered as limiting the present invention. In addition, the same reference symbols are used to represent the same components throughout the accompanying drawings. In the accompanying drawings:

[0022] Figure 1 A flow chart of an embodiment of a glass substrate detection method provided in the present application;

[0023] Figure 2 A flow chart of another embodiment of the glass substrate detection method provided by the present application;

[0024] Figure 3 A flowchart of another embodiment of the glass substrate detection method provided in the present application;

[0025] Figure 4 A flow chart of another embodiment of the glass substrate detection method provided in the present application;

[0026] Figure 5 A flow chart of another embodiment of the glass substrate detection method provided in the present application;

[0027] Figure 6 A schematic diagram of an embodiment of a glass substrate detection system provided in the present application;

[0028] Figure 7 A schematic diagram of an embodiment of a clamping device for a glass substrate detection system provided in the present application;

[0029] Figure 8 A schematic diagram of another embodiment of a clamping device for a glass substrate detection system provided by the present application;

[0030] Fig. 9 A schematic diagram of another embodiment of a clamping device of a glass substrate detection system provided in the present application;

[0031] The meanings of the marks in the figure are:

[0032] 100. Glass substrate inspection system;

[0033] 110. Clamping device; 111. Base; 112. Adjusting mechanism; 113. Carrying platform;

[0034] 120. Image acquisition device;

[0035] 130. Lighting devices;

[0036] 140. Positioning device; 141. Laser positioner;

[0037] 200. A glass substrate to be inspected. DETAILED DESCRIPTION

[0038] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0039] In the description of the present invention, it is to be understood that a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "plurality" means two or more.

[0040] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0041] To illustrate the glass substrate detection method and system provided in the present application, the following is a detailed description in conjunction with the accompanying drawings and the textual description of the embodiments.

[0042] Reference below Figure 1-Figure 6 A method for inspecting a glass substrate according to an embodiment of the first aspect of the present invention is described.

[0043] Figure 1 FIG. 4 is a flow chart of a glass substrate detection method according to an embodiment of the present invention.

[0044] like Figure 1 As shown, the glass substrate detection method according to the embodiment of the present invention includes the following steps.

[0045] Step S100, obtaining coordinate information of any detection point on the glass substrate to be detected.

[0046] Specifically, any point on the surface of the glass substrate to be detected can be a detection point. In each detection, it is necessary to obtain one of the points on the surface of the glass substrate to be detected as the detection point of this detection, and obtain the coordinate information of the point on the corresponding coordinate axis to determine the specific position of the detection point on the surface of the glass substrate to be detected.

[0047] Step S200 , taking a photo of the glass substrate to be inspected according to the coordinate information of the inspection points to obtain a surface image of the glass substrate to be inspected.

[0048] Specifically, after determining the coordinate information of the detection point, the position of the detection point is located, and according to the specific position of the detection point on the surface of the glass substrate to be detected, the surface of the glass substrate to be detected is photographed with the detection point as a reference point to obtain an image of the surface of the glass substrate to be detected.

[0049] It should be noted that, in the present embodiment, after the coordinate information of the detection point is determined and its specific position on the surface of the glass substrate to be detected is determined, the surface of the glass substrate to be detected can be photographed with the detection point as the center, that is, the point is located at the center of the image of the surface of the glass substrate to be detected. Alternatively, after the coordinate information of the detection point is determined and its specific position on the surface of the glass substrate to be detected is determined, the surface of the glass substrate to be detected can be photographed with the detection point as the boundary point, that is, the point is located at the edge of the image of the surface of the glass substrate to be detected. Alternatively, after the coordinate information of the detection point is determined and its specific position on the surface of the glass substrate to be detected is determined, the surface of the glass substrate to be detected can be directly photographed, as long as the image of the surface of the glass substrate to be detected contains the detection point, and there is no need to limit the specific position of the detection point on the surface of the glass substrate to be detected.

[0050] Step S300 , determining and recording the surface information of the glass substrate to be inspected according to the coordinate information of the inspection points and the surface image of the glass substrate to be inspected.

[0051] Specifically, after obtaining the detection point coordinate information and the surface image of the glass substrate to be detected, the server can identify and confirm the information of the glass substrate to be detected, and store the confirmed information in the database to facilitate subsequent data retrieval and information tracing after processing.

[0052] It should be noted that after the surface inspection of the glass substrate to be inspected, the glass substrate to be inspected can be further analyzed, that is, the defects on the surface of the glass substrate to be inspected can be analyzed and confirmed or processed, such as the mura phenomenon or the bad pixel phenomenon can be analyzed or processed. After the surface defect processing is completed, the next specific process step can be carried out.

[0053] It can be seen that the glass substrate detection method of the embodiment of the present invention obtains the coordinate information of the detection point on the glass substrate to be detected, performs positioning according to the coordinate information, and photographs the glass substrate to be detected with the detection point as a reference to obtain the surface image of the glass substrate to be detected, and determines and records the surface information of the glass substrate to be detected according to the coordinate information of the detection point and the surface image of the glass substrate to be detected. By acquiring the surface graphic, the surface information of the glass substrate to be detected is accurately matched, thereby avoiding errors that may occur in manual detection and recording, and at the same time improving the detection efficiency.

[0054] Figure 2 FIG. 4 is a flow chart of a glass substrate detection method according to an embodiment of the present invention.

[0055] like Figure 2As shown, according to the glass substrate detection method of the embodiment of the present invention, step S100: obtaining coordinate information of any detection point on the glass substrate to be detected, specifically includes the following steps:

[0056] Step S110: emitting a beam of laser light onto the glass substrate to be inspected.

[0057] Specifically, by emitting laser light from outside the glass substrate to be detected to the surface of the glass substrate to be detected, the laser emission point can be any point outside the surface of the glass substrate to be detected. For example, a laser locator is set on the edge of the glass substrate to be detected, and the position where the laser potentiometer emits light is the laser emission point. It can be understood that as long as the laser light finally reaches the surface of the glass substrate to be detected, it will be fine.

[0058] Step S120: defining the contact point between the laser light and the glass substrate to be inspected as the inspection point.

[0059] Specifically, by emitting laser light from outside the glass substrate to be inspected toward the surface of the glass substrate to be inspected, the laser light will have an intersection with the surface of the glass substrate to be inspected, and this point is defined as the inspection point of this inspection.

[0060] Step S130: Calculate the coordinate values ​​of the detection points.

[0061] Specifically, the coordinate value of the detection point can be calculated by a specific formula. For example, the coordinate value of the detection point A(x, y), the x and y coordinates can be calculated by the following formula:

[0062]

[0063]

[0064] Wherein, a is the length of the glass substrate to be detected, b is the width of the glass substrate to be detected, h is the vertical distance between the point where the laser light is emitted and the glass substrate to be detected, and θ is the angle between the laser light and the glass substrate to be detected. It is the angle between the projection line of the laser light on the glass substrate to be inspected and one side of the glass substrate to be inspected.

[0065] It should be noted that the coordinates A(x, y) of the detection point are located on the surface of the glass substrate to be detected, that is, the horizontal coordinate x and the vertical coordinate y are both located on the surface of the glass substrate to be detected, that is, the planes where the x-axis and the y-axis are located coincide with the plane where the surface of the glass substrate to be detected is located.

[0066] It can be seen that the glass substrate detection method of the embodiment of the present invention emits a beam of laser light onto the glass substrate to be detected, defines the contact point between the laser light and the glass substrate to be detected as the detection point, and calculates the coordinate value of the detection point through a formula, thereby quickly and accurately calculating the specific position of the detection point on the glass substrate to be detected.

[0067] Figure 3 FIG. 4 is a flow chart of a glass substrate detection method according to an embodiment of the present invention.

[0068] like Figure 3 As shown, according to the glass substrate detection method of the embodiment of the present invention, step S200: taking a photo of the glass substrate to be detected according to the coordinate information of the detection point to obtain the surface image of the glass substrate to be detected, specifically includes the following steps:

[0069] Step S210: determining the specific position of the detection point on the glass substrate to be detected according to the coordinates of the detection point.

[0070] Specifically, by determining the coordinate value of the detection point and making the coordinate value correspond to the position of the surface of the glass substrate to be detected, the specific position of the detection point on the glass substrate to be detected is determined.

[0071] Step S220: taking a picture of the surface of the glass substrate to be inspected with the inspection point as the center to obtain a surface image of the glass substrate to be inspected.

[0072] Specifically, after determining that the detection point is located at a specific position on the glass substrate to be detected, the shooting angle of the image acquisition device is adjusted, and finally a photo is taken with the detection point as the center of the image to obtain the surface image of the glass substrate to be detected.

[0073] It should be noted that, since the detection point is taken as the center of the image, the detection point should not be located at the edge of the surface of the glass substrate to be detected, so as to ensure that the surface image of the glass substrate to be detected is more complete.

[0074] It can be seen that the glass substrate detection method of the embodiment of the present invention can better find the reference point for shooting, so as to better achieve the acquisition of the surface image of the glass substrate to be detected, by determining the specific position of the detection point on the glass substrate to be detected, and taking a picture of the surface of the glass substrate to be detected with the detection point as the center to obtain the surface image of the glass substrate to be detected.

[0075] Figure 4 FIG. 4 is a flow chart of a glass substrate detection method according to an embodiment of the present invention.

[0076] like Figure 4As shown, according to the glass substrate detection method of the embodiment of the present invention, step S300: determining and recording the surface information of the glass substrate to be detected according to the detection point coordinate information and the surface image of the glass substrate to be detected, specifically includes the following steps:

[0077] Step S310: sending the detection point coordinate information and the surface image of the glass substrate to be detected to the server.

[0078] Step S320: Identify the label of the glass substrate to be inspected in the server.

[0079] Specifically, by sending the detection point coordinate information and the surface image of the glass substrate to be detected to the server, the server recognizes the surface image of the glass substrate to be detected and matches the label information corresponding to the glass substrate to be detected according to the recognized information.

[0080] Step S330: reading the corresponding glass substrate information and process flow information from the server according to the label of the glass substrate to be inspected.

[0081] Specifically, by identifying and matching the label information corresponding to the glass substrate to be inspected, the glass substrate information corresponding to the glass substrate to be inspected and the current process flow information are determined. That is to say, the glass model and category of the glass substrate to be inspected, as well as the process flow step of the glass substrate to be inspected during inspection can be determined through the label information.

[0082] It can be seen that the glass substrate detection method of the embodiment of the present invention sends the detection point coordinate information and the surface image of the glass substrate to be detected to the server, and identifies the label of the glass substrate to be detected in the server, and reads the corresponding glass substrate information and process flow information from the server according to the label of the glass substrate to be detected, so as to quickly match the original properties of the glass substrate to be detected and the process flow information it is in.

[0083] Figure 5 FIG. 4 is a flow chart of a glass substrate detection method according to an embodiment of the present invention.

[0084] like Figure 5 As shown, according to the glass substrate detection method of the embodiment of the present invention, after step S330: reading the corresponding glass substrate information and process flow information from the server according to the label of the glass substrate to be detected, the method further includes the following steps:

[0085] Step S340: Upload the glass substrate information and process flow information to the database.

[0086] It can be seen that the glass substrate detection method of the embodiment of the present invention can store the matched information inside the database by uploading the original attribute information of the glass substrate to be detected and the process flow information it is in to the database, so as to facilitate the subsequent data retrieval and information tracing after processing.

[0087] In order to implement the above embodiment, the present invention further provides a glass substrate inspection system 100 .

[0088] Reference below Figure 6-Figure 9 A glass substrate inspection system 100 according to an embodiment of a second aspect of the present invention is described.

[0089] Figure 6 FIG. 1 is a schematic structural diagram of a glass substrate inspection system 100 according to an embodiment of the present invention.

[0090] According to another embodiment of the present invention, Figure 6 As shown, the glass substrate inspection system 100 includes a clamping device 110, an image acquisition device 120, an illumination device 130, a positioning device 140 and a controller (not shown in the figure). Specifically, the clamping device 110 is used to clamp the glass substrate 200 to be inspected, the image acquisition device 120 is used to take a picture of the glass substrate 200 to be inspected to obtain a corresponding surface image, the illumination device 130 is used to provide a supplementary light source when the external light is insufficient to ensure the clarity of the acquired surface image of the glass substrate 200 to be inspected, and the positioning device 140 is used to determine the specific position of the inspection point on the surface of the glass substrate 200 to be inspected. Further, the clamping device 110, the image acquisition device 120, the illumination device 130 and the positioning device 140 are electrically connected to the controller, that is, the controller can control the clamping device 110, the image acquisition device 120, the illumination device 130 and the positioning device 140 to perform corresponding operations.

[0091] It should be noted that the positioning device 140 can only perform positioning at one same position on the surface of the glass substrate 200 to be inspected, or the positioning device 140 can perform positioning at any of a plurality of different positions on the surface of the glass substrate 200 to be inspected.

[0092] It should be noted that the image acquisition device 120 may include a photographing module (not shown in the figure) and a transmission module (not shown in the figure). Specifically, the photographing module takes a photo of the glass substrate 200 to be inspected to obtain a surface image of the glass substrate 200 to be inspected. After receiving the surface image of the glass substrate 200 to be inspected obtained by the photographing module, the transmission module transmits it to a processing center such as a server for further processing. Specifically, the photographing module can rotate within a certain angle, so as to adjust the photographing angle to adapt to the positions of different reference detection points, and adjust to the corresponding angle to take a photo of the glass substrate 200 to be inspected to obtain the surface image of the glass substrate 200 to be inspected.

[0093] It should be noted that the glass substrate detection system 100 also includes a driving mechanism (not shown in the figure), and the driving mechanism is electrically connected to the controller, that is, the controller can control the driving mechanism to drive the clamping device 110, the image acquisition device 120, the lighting device 130 or the positioning device 140 to perform corresponding operations.

[0094] Figure 7-Figure 9 FIG. 1 is a schematic structural diagram of a glass substrate inspection system 100 according to an embodiment of the present invention.

[0095] According to another embodiment of the present invention, Figure 7 As shown, the clamping device 110 includes a base 111, an adjustment mechanism 112 and a carrier 113. The carrier 113 is used to clamp and carry the glass substrate 200 to be tested. Specifically, the bottom of the adjustment mechanism 112 is arranged on the base 111, and the top of the adjustment mechanism 112 is connected to the carrier 113. By arranging the adjustment mechanism 112 at the bottom of the carrier 113, the height of the carrier 113 can be adjusted, thereby expanding the application range of the carrier 113.

[0096] It should be noted that, in some other embodiments, such as Figure 8 As shown, the clamping device 110 may only include a base 111 and a carrier 113 . In this case, the base 111 and the carrier 113 are fixedly connected, and the carrier 113 is disposed on the base 111 .

[0097] It should be noted that, in some other embodiments, such as Fig. 9 As shown, the clamping device 110 may include a base 111, an adjusting mechanism 112 and a carrier 113. At this time, the adjusting mechanism 112 and the carrier 113 are fixedly connected, and the bottoms of the adjusting mechanism 112 and the carrier 113 are arranged on the base 111. By integrating the adjusting mechanism 112 and the carrier 113, the stability of the overall structure can be enhanced.

[0098] According to another embodiment of the present invention, the positioning device 140 includes a laser locator 150 and an analysis module (not shown in the figure). Specifically, the laser locator 150 is arranged at the edge of the carrier 113. It can be understood that the laser locator 150 needs to avoid contacting the glass substrate 200 to be detected. Therefore, it needs to be arranged at the edge of the carrier 113 to avoid contacting the glass substrate 200 to be detected. Specifically, the analysis module defines the intersection of the laser light emitted by the laser locator 150 and the surface of the glass substrate 200 to be detected as the detection point of this detection, calculates the coordinate value of the detection point through the corresponding formula, and sends the coordinate value of the detection point to the server.

[0099] According to another embodiment of the present invention, the glass substrate inspection system 100 further includes a server (not shown in the figure), and the server is used to identify the label of the glass substrate 200 to be inspected, and store the glass substrate information and the process flow information. It can be understood that by sending the inspection point coordinate information and the surface image of the glass substrate 200 to be inspected to the server, and identifying the label of the glass substrate 200 to be inspected in the server, the corresponding glass substrate information and the process flow information are read from the server according to the label of the glass substrate 200 to be inspected, so as to quickly and accurately match the original properties of the glass substrate 200 to be inspected and the current process flow information.

[0100] According to another embodiment of the present invention, the glass substrate inspection system 100 further includes a database (not shown in the figure), and the database is used to record glass substrate information and process flow information. It can be understood that by uploading the original attribute information of the matched glass substrate 200 to be inspected and the current process flow information to the database, the matched information can be stored inside the database to facilitate later data retrieval and information tracing after processing.

[0101] The above are preferred embodiments of the glass substrate detection method and system provided in the present application, and should not be construed as limiting the scope of protection of the present application. Those skilled in the art should be aware that various improvements or substitutions may be made without departing from the concept of the present application, and all improvements or substitutions should be within the scope of protection of the present application, that is, the scope of protection of the present application should be based on the claims.

[0102] In the absence of conflict, the above embodiments and features in the embodiments may be combined with each other.

Claims

1. A method for detecting a glass substrate, characterized in that: The following steps are involved: Obtaining coordinate information of any detection point on the glass substrate to be detected; According to the coordinate information of the detection point, photograph the glass substrate to be detected to obtain a surface image of the glass substrate to be detected; The surface information of the glass substrate to be inspected is determined and recorded according to the inspection point coordinate information and the surface image of the glass substrate to be inspected.

2. The method for detecting a glass substrate according to claim 1, wherein: The step of obtaining coordinate information of any detection point on the glass substrate to be detected specifically includes: Sending a beam of laser light to the glass substrate to be inspected; The contact point between the laser light and the glass substrate to be inspected is defined as an inspection point; The coordinate values ​​of the detection points are calculated.

3. The method for detecting a glass substrate according to claim 1, wherein: The photographing of the glass substrate to be inspected to acquire the surface image of the glass substrate to be inspected according to the coordinate information of the inspection point specifically includes: Determining the specific position of the detection point on the glass substrate to be detected according to the coordinates of the detection point; The surface of the glass substrate to be inspected is photographed with the inspection point as the center to obtain a surface image of the glass substrate to be inspected.

4. The method for detecting a glass substrate according to claim 1, wherein: The determining and recording the surface information of the glass substrate to be inspected according to the inspection point coordinate information and the surface image of the glass substrate to be inspected specifically includes: Sending the detection point coordinate information and the surface image of the glass substrate to be detected to a server; identifying, in the server, a label of the glass substrate to be inspected; The corresponding glass substrate information and process flow information are read from the server according to the label of the glass substrate to be detected.

5. The method for detecting a glass substrate according to claim 4, wherein: After reading the corresponding glass substrate information and process flow information from the server according to the label of the glass substrate to be inspected, the method further includes: The glass substrate information and the process flow information are uploaded to a database.

6. A glass substrate detection system, characterized in that: The invention comprises a clamping device, an image acquisition device, an illumination device, a positioning device and a controller. The clamping device is used to clamp a glass substrate to be inspected. The image acquisition device is used to take a picture of the glass substrate to be inspected to obtain a surface image thereof. The clamping device, the image acquisition device, the illumination device and the positioning device are electrically connected to the controller.

7. The glass substrate detection system according to claim 6, wherein: The clamping device comprises a base, an adjusting mechanism and a carrier, the bottom of the adjusting mechanism is arranged on the base, and the top of the adjusting mechanism is connected with the carrier.

8. The glass substrate detection system according to claim 6, wherein: The positioning device includes a laser locator.

9. The glass substrate detection system according to claim 6, wherein: The system also includes a server, which is used to identify the label of the glass substrate to be inspected and store the glass substrate information and process flow information.

10. The glass substrate detection system according to claim 9, wherein: Also included is a database, which is used to record the glass substrate information and the process flow information.

Images