Vehicle fault test method, device, equipment and medium

Abstract

The embodiment of the invention relates to the technical field of vehicle testing, in particular to a vehicle fault testing method and device, equipment and a medium. According to the embodiment of the invention, automation from acquisition of the fault test task to generation of the control instruction, execution of the fault operation and reading of the operation result in the whole test process is realized, manual intervention is reduced, and the test efficiency and accuracy are improved. Through determining the target DTC test item and the fault operation type, the test can be carried out in a more targeted manner, and the potential problem point can be rapidly positioned. And meanwhile, a plurality of target DTC test items can be tested, so that the coverage range of the test is expanded, and more potential faults can be found. The result of executing the fault operation by the test piece can be read in real time, and the test state can be known in time, so that a response can be quickly made when a problem occurs.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of vehicle testing technology, and in particular to a vehicle fault testing method, device, equipment and medium. Background Art

[0002] Today, the existing body domain controller faces many complex situations. It integrates a large number of electronic and electrical components, covering components with many different functions, from various sensors to actuators. At the same time, it has extremely frequent signal interactions with other controllers of the vehicle, and needs to continuously transmit data and coordinate with the engine controller, chassis controller, etc. This has led to the continuous expansion of the scale of test content, which not only requires testing the various functions of the body domain controller itself, but also ensuring the accuracy and stability of interaction with other controllers.

[0003] Moreover, during the test process, due to the large number of complex contents involved, the operations become extremely frequent, and the testers need to constantly set parameters, switch scenes, and monitor data. However, the manual testing method currently used is very inefficient, not only consuming a lot of time and manpower, but also prone to errors caused by human factors, making it difficult to ensure the consistency and reliability of the test results. Summary of the invention

[0004] In view of the above problems, the embodiments of the present invention provide a vehicle fault testing method, device, equipment and medium, which are used to solve the problem that the manual testing method existing in the prior art is very inefficient, not only consumes a lot of time and manpower, but is also easily affected by human factors and may cause errors.

[0005] According to one aspect of an embodiment of the present invention, a vehicle fault testing method is provided, the method comprising:

[0006] Acquire a fault test task currently triggered on the test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type;

[0007] Acquire a fault operation strategy corresponding to the fault operation type, and generate a control instruction based on the fault operation strategy;

[0008] Acquire a test piece corresponding to the target DTC test item, and send the control instruction to the test piece, so that the test piece performs a corresponding fault operation according to the control instruction;

[0009] The operation result of the test piece executing the fault operation is read.

[0010] Further, the obtaining of the fault test task currently triggered on the test bench includes:

[0011] Acquire at least one first toggle switch currently selected on the test bench, wherein the test bench includes a plurality of first-type toggle switches, and each of the first-type toggle switches corresponds to a DTC test item;

[0012] Obtaining a target DTC test item corresponding to the first toggle switch, and determining a target fault operation type according to an identification position of the first toggle switch;

[0013] The fault test task is generated based on the target DTC test item and the target fault operation type.

[0014] Further, determining the fault operation type according to the current identification position of the first toggle switch includes:

[0015] Detecting a first toggle operation currently acting on the first toggle switch;

[0016] In response to the first toggle operation, determining the identification position of the first toggle switch;

[0017] Based on a mapping relationship between a preset identification bit and a fault operation type, a target fault operation type corresponding to the identification bit is determined.

[0018] Further, the obtaining of the fault operation strategy corresponding to the fault operation type includes:

[0019] Acquire the fault operation content corresponding to the fault operation type, and detect whether a second toggle operation of a second type of toggle switch of the test bench is currently being acted on;

[0020] If there is a second toggle operation acting on the second type of toggle switch, in response to the second toggle operation, the toggle second type of toggle switch is used as the second toggle switch;

[0021] Acquire a target IO routine corresponding to the second toggle switch, and determine a routine interaction parameter of the target IO routine according to a second switch state corresponding to the second toggle switch;

[0022] The fault operation strategy is constructed using the fault operation content and the routine interaction parameters of the target IO routine.

[0023] Furthermore, before sending the control instruction to the test piece, the method further includes:

[0024] Query whether the test bench is connected to the test piece corresponding to the target DTC test item;

[0025] If the test bench is connected to the test piece, then obtaining corresponding monitoring indicators according to the type of the test piece;

[0026] Monitoring the test piece to obtain indicator data corresponding to the monitoring indicator;

[0027] determining, based on the indicator data, whether the test piece corresponding to the target DTC test item satisfies an execution condition of a fault operation strategy;

[0028] If the execution condition of the fault operation strategy is met, the control instruction is sent to the test piece.

[0029] Furthermore, after reading the operation result of the test piece performing the fault operation, the method further includes:

[0030] Obtaining a fault analysis strategy corresponding to the target DTC test item;

[0031] Analyzing the operation result using the fault analysis strategy to determine whether the operation result is abnormal;

[0032] If the operation result is abnormal, obtaining an operation log file of the test piece executing the fault operation;

[0033] The operation log file is analyzed to obtain factors causing the abnormality of the operation result.

[0034] Furthermore, after analyzing the operation log file to obtain the factors causing the abnormality of the operation result, the method further includes:

[0035] Analyzing the factors to determine whether the test piece has a hardware failure or performance problem;

[0036] If the test piece has a hardware fault, a fault prompt message is sent, wherein the fault prompt message is used to prompt the replacement of hardware; or, if the test piece has a performance problem, an upgrade software package is obtained and the upgrade software package is used to upgrade the test piece.

[0037] According to another aspect of an embodiment of the present invention, a vehicle fault testing device is provided, the device comprising:

[0038] An acquisition module, used for acquiring a fault test task currently triggered on a test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type;

[0039] A query module, used to obtain a fault operation strategy corresponding to the fault operation type, and generate a control instruction based on the fault operation strategy;

[0040] a sending module, configured to obtain a test piece corresponding to the target DTC test item, and send the control instruction to the test piece, so that the test piece performs a corresponding fault operation according to the control instruction;

[0041] The reading module is used to read the operation result of the test piece executing the fault operation.

[0042] According to another aspect of an embodiment of the present invention, there is provided an electronic device, comprising: a memory and a processor, the memory and the processor being communicatively connected to each other, the memory storing computer instructions, and the processor executing the method of the above-mentioned first aspect or any corresponding embodiment thereof by executing the computer instructions.

[0043] According to another aspect of an embodiment of the present invention, a computer-readable storage medium is provided, on which computer instructions are stored, and the computer instructions are used to enable a computer to execute the method of the first aspect or any corresponding embodiment thereof.

[0044] The entire test process of the embodiment of the present application is automated from obtaining fault test tasks to generating control instructions, executing fault operations, and reading operation results, which reduces manual intervention and improves test efficiency and accuracy. By clarifying the target DTC test items and fault operation types, more targeted testing can be performed to quickly locate potential problem points. At the same time, multiple target DTC test items can also be tested, which expands the coverage of the test and helps to discover more potential faults. The results of the test piece executing the fault operation can be read in real time, and the test status can be understood in a timely manner so that a quick response can be made when a problem occurs.

[0045] The above description is only an overview of the technical solution of the embodiment of the present invention. In order to more clearly understand the technical means of the embodiment of the present invention, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the embodiment of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are listed below.

[0046] The entire test process of the embodiment of the present application is automated from obtaining fault test tasks to generating control instructions, executing fault operations, and reading operation results, which reduces manual intervention and improves test efficiency and accuracy. By clarifying the target DTC test items and fault operation types, more targeted testing can be performed to quickly locate potential problem points. At the same time, multiple target DTC test items can also be tested, which expands the coverage of the test and helps to discover more potential faults. The results of the test piece executing the fault operation can be read in real time, and the test status can be understood in a timely manner so that a quick response can be made when a problem occurs. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] The accompanying drawings are only used to illustrate the embodiments and are not to be considered as limiting the present invention. In addition, the same reference symbols are used to represent the same components throughout the accompanying drawings. In the accompanying drawings:

[0048] Figure 1 A schematic flow chart showing an embodiment of a vehicle fault testing method provided by the present invention;

[0049] Figure 2 A schematic diagram of a test bench provided by the present invention is shown;

[0050] Figure 3 The following is a flowchart of the implementation of the IO routine control test item provided by the present invention;

[0051] Figure 4 A flow chart of a simulated single fault test provided by the present invention is shown;

[0052] Figure 5 A flowchart of simulating a concurrent test of multiple faults provided by the present invention is shown;

[0053] Figure 6 A schematic flow chart showing an embodiment of a vehicle fault testing method provided by the present invention;

[0054] Figure 7 A schematic structural diagram of an embodiment of a vehicle fault testing device provided by the present invention is shown;

[0055] Figure 8 A schematic structural diagram of an embodiment of an electronic device provided by the present invention is shown. DETAILED DESCRIPTION

[0056] Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are only for exemplary purposes and are not intended to limit the scope of protection of the present disclosure.

[0057] In the description of the embodiments of the present disclosure, the term "including" and similar terms should be understood as open inclusion, that is, "including but not limited to". The term "based on" should be understood as "based at least in part on". The term "one embodiment" or "the embodiment" should be understood as "at least one embodiment". The term "some embodiments" should be understood as "at least some embodiments". Other explicit and implicit definitions are also included below.

[0058] Herein, unless explicitly stated, executing a step “in response to A” does not mean executing the step immediately after “A” but may include one or more intermediate steps.

[0059] It is understandable that the data involved in this technical solution (including but not limited to the data itself, the acquisition, use, storage or deletion of the data) shall comply with the requirements of relevant laws, regulations and relevant provisions.

[0060] It is understandable that before using the technical solutions disclosed in the various embodiments of the present disclosure, the types, scopes of use, usage scenarios, etc. of the information involved in the present disclosure should be informed to relevant users and their authorization should be obtained in an appropriate manner in accordance with relevant laws and regulations. The relevant users may include any type of right holders, such as individuals, enterprises, and groups.

[0061] For example, in response to receiving an active request from a user, a prompt message is sent to the relevant user to clearly prompt the relevant user that the operation requested to be performed will require obtaining and using the information of the relevant user, so that the relevant user can independently choose whether to provide information to software or hardware such as an electronic device, application, server or storage medium that executes the operation of the technical solution of the present disclosure based on the prompt message.

[0062] As an optional but non-limiting implementation, in response to receiving an active request from a relevant user, a prompt message is sent to the relevant user, for example, in the form of a pop-up window, in which the prompt message may be presented in text form. In addition, the pop-up window may also carry a selection control for the user to select "agree" or "disagree" to provide information to the electronic device.

[0063] It is understandable that the above notification and the process of obtaining user authorization are merely illustrative and do not constitute a limitation on the implementation of the present disclosure. Other methods that meet relevant laws and regulations may also be applied to the implementation of the present disclosure.

[0064] According to an embodiment of the present invention, a vehicle fault testing method, device, equipment and medium are provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0065] Figure 1 A flow chart showing an embodiment of a vehicle fault testing method of the present invention is shown as follows: Figure 1 As shown, the method comprises the following steps:

[0066] Step S101 , obtaining a fault test task currently triggered on a test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type.

[0067] In the embodiments of the present application, Figure 2 As shown, when the test bench simulates the triggering of the DTC test item, its analog trigger signal connection type covers CAN / CANFD (transmission rate is 500K / 2M) signals, LIN signals and Ethernet signals. Taking CHCAN as an example, the operation panel can be connected to test equipment such as ZLGCAN and CANOE by means of CHCAN_L and CHCAN_H banana female connectors. These test equipment can send CAN / CANFD signals, LIN signals and Ethernet signals, communicate with BDC and realize signal transmission and reception. At the same time, the pins of each CAN harness need to be marked on the operation panel. In addition, test equipment such as Zhou Ligong equipment and CANoe equipment are connected to BDC2.0 and the test bench on the one hand, and to the host computer on the other hand, so as to establish a complete test environment.

[0068] The open USB port of the test bench provides an interface for communication and control with external devices (such as a PC host computer). Through this port, the PC host computer can send instructions and receive data to achieve remote control of the internal devices of the test bench. The NM relay integrated inside the test bench plays a key role in controlling the on-off of the circuit. The relay can switch its internal switch state according to the control signal received, thereby achieving on-off control of the circuit connected to the relay.

[0069] The PC host computer is installed with the corresponding control software, which can communicate with the test bench through a USB connection. When it is necessary to control the on and off of the relay to achieve output state switching, the host computer software sends a specific control command to the test bench through a USB connection. After receiving the command, the test bench parses the command and passes it to the NM relay. The relay switches the switch state according to the command, thereby controlling the current on and off of the corresponding wiring harness.

[0070] Different fault simulations require different connection harnesses to connect the test bench and the test sample. These connection harnesses are independent of each other and are responsible for transmitting the signals and currents required for specific fault simulations, avoiding interference between different fault simulations.

[0071] When two or more fault conditions need to be simulated simultaneously, the corresponding connection harnesses are connected to the test bench and the test sample respectively. Each connection harness corresponds to a specific fault simulation, and each performs signal transmission and fault simulation independently. Since there is no interference between the connection harnesses, multiple faults can be simulated simultaneously. When multiple fault conditions are simulated simultaneously, the test bench can monitor the status of each fault simulation in real time through the connection with the test sample. The test bench transmits the monitored fault status information back to the PC host computer through the USB connection port. The control software of the PC host computer can read the fault status of two or more faults at the same time, and display, analyze and record them.

[0072] In an embodiment of the present application, obtaining a fault test task currently triggered on a test bench includes the following steps A1-A3:

[0073] Step A1, obtaining at least one first toggle switch currently selected on the test bench, wherein the test bench includes a plurality of first-type toggle switches, and each first-type toggle switch corresponds to a DTC test item.

[0074] Specifically, a plurality of first-type toggle switches are arranged on the operation panel of the test bench, and each toggle switch corresponds to a specific DTC test item. The state of the toggle switches on the operation panel is monitored in real time by a test device (such as Zhou Ligong equipment, CANoe equipment, etc.) or a host computer software connected to the test bench. When a toggle switch is toggled or selected, the test device or the host computer software can detect the change and determine at least one first toggle switch currently selected.

[0075] Step A2, obtaining the target DTC test item corresponding to the first toggle switch, and determining the target fault operation type according to the identification position of the first toggle switch.

[0076] Specifically, since each first type toggle switch corresponds to a DTC test item, after the first toggle switch is determined, the target DTC test item corresponding to the toggle switch can be quickly found through the pre-established correspondence table between toggle switches and DTC test items.

[0077] Specifically, the fault operation type is determined according to the current identification position of the first toggle switch, including: detecting the first toggle operation currently acting on the first toggle switch; responding to the first toggle operation, determining the current identification position of the first toggle switch; based on the mapping relationship between the preset identification position and the fault operation type, determining the target fault operation type corresponding to the identification position.

[0078] By monitoring the physical state change or electrical signal change of the toggle switch, it is detected whether the user has toggled the first toggle switch. When the toggle operation is detected, the current position of the toggle switch is immediately read. This position can be represented by a specific identification bit, such as a digital code, color identification, etc. The correspondence between different identification bits and fault operation types (such as fault triggering, fault recovery, etc.) is pre-set in the system. After the identification bit of the first toggle switch is determined, the target fault operation type corresponding to the identification bit can be determined based on this mapping relationship.

[0079] Step A3: Generate a fault test task based on the target DTC test item and the target fault operation type.

[0080] Specifically, when the target DTC test item and the target fault operation type are determined, the two pieces of information can be combined. A fault test task including the target DTC test item and the target fault operation type can be generated through the software interface of the test equipment or the host computer software. This task can be stored in the memory in the form of a data structure, or recorded in a test log file for subsequent test execution and management.

[0081] Step S102: acquiring a fault operation strategy corresponding to the fault operation type, and generating a control instruction based on the fault operation strategy.

[0082] In the embodiment of the present application, obtaining the fault operation strategy corresponding to the fault operation type includes the following steps B1-B4:

[0083] Step B1, obtaining the fault operation content corresponding to the fault operation type, and detecting whether a second toggle operation of a second type of toggle switch of the test bench is currently being acted on.

[0084] Specifically, determine the fault operation type (such as fault trigger or fault recovery), and search for the corresponding specific operation content from the preset fault operation content library. This library can be a data structure that stores the mapping relationship between different fault operation types and specific operation contents. Then, through the test equipment (such as Zhou Ligong equipment, CANoe equipment, etc.) or host computer software connected to the test bench, the state of the second type of toggle switch on the test bench operation panel is monitored in real time. For example: by detecting the physical state change (such as position change) or electrical signal change of the toggle switch, it is determined whether a second toggle operation occurs.

[0085] Step B2: If there is a second toggle operation acting on the second type toggle switch, in response to the second toggle operation, the toggle second type toggle switch is used as the second toggle switch.

[0086] Specifically, when a second toggle operation is detected, the test device or the host computer software immediately responds to the operation, determines the toggle second type toggle switch, and marks it as a second toggle switch for subsequent processing and analysis.

[0087] Step B3: acquiring the target IO routine corresponding to the second toggle switch, and determining the routine interaction parameters of the target IO routine according to the second switch state corresponding to the second toggle switch.

[0088] Specifically, since each second type of toggle switch corresponds to an IO routine control test item, the target IO routine corresponding to the second toggle switch can be quickly found through the pre-established correspondence table between the toggle switch and the IO routine. According to the current switch state of the second toggle switch (state = 0, that is, output is turned off, state = 1, that is, output is turned on, and state = 2, that is, output is matched with the counterpart), the routine interaction parameters of the target IO routine are determined. For example, if the switch state is 1, the corresponding routine interaction parameter can be "output state turned on".

[0089] Step B4: construct a fault operation strategy using the fault operation content and the routine interaction parameters of the target IO routine.

[0090] Specifically, the fault operation content and the routine interaction parameters of the target IO routine are combined. A specific algorithm or rule can be used to build a fault operation strategy according to specific test requirements and system design. For example, the fault operation content can be used as the main framework, and then the routine interaction parameters can be inserted into the fault operation strategy as specific operation instructions. The constructed fault operation strategy can be used to control related equipment or systems on the test bench to achieve specific fault test scenarios.

[0091] like Figure 3As shown, the following is the implementation process of the IO routine control test item: ① Check the test piece status: Confirm that all parts of the test piece are working normally without obvious faults or abnormal phenomena. If the test piece status is abnormal, the fault should be eliminated before continuing the test. ② Set the IO control pin output status to 0x00: Use the corresponding programming interface or tool to set the output of the IO control pin to the hexadecimal value 0x00. Confirm that the setting is successful, which can be verified by reading the relevant registers or using tools such as oscilloscopes. ③ Read the corresponding pin: Use an appropriate method to read the current value of the pin set to the 0x00 output state. Check whether the read value is consistent with the expected 0x00 output state. ④ Set the IO control pin output status to 0x01: Use the programming interface or tool again to set the output of the IO control pin to the hexadecimal value 0x01. Also confirm that the setting is successful. ⑤ Set the IO control pin output status to 0x02: Continue to set the output of the IO control pin to the hexadecimal value 0x02. ⑥ Read the corresponding pin voltage value: Use a voltmeter or other tool that can measure voltage to read the voltage value of the pin. Record the voltage value read for subsequent analysis and judgment of whether the test results meet expectations. ⑦ End the test: organize the test data and results, and summarize and evaluate the test process.

[0092] Step S103, obtaining the test piece corresponding to the target DTC test item, and sending a control instruction to the test piece, so that the test piece performs a corresponding fault operation according to the control instruction.

[0093] In an embodiment of the present application, before sending a control instruction to the test piece, the method also includes: querying whether the test bench is connected to the test piece corresponding to the target DTC test item; if the test bench and the test piece are connected, obtaining corresponding monitoring indicators according to the type of the test piece; monitoring the test piece to obtain indicator data corresponding to the monitoring indicators; determining whether the test piece corresponding to the target DTC test item meets the execution conditions of the fault operation strategy based on the indicator data; if the execution conditions of the fault operation strategy are met, sending a control instruction to the test piece.

[0094] Specifically, first, you need to determine whether the test bench and the test piece are connected. This can be determined in the following ways: Check the physical connection between the test bench and the test piece, such as whether the cables and interfaces are correctly connected and secure. You can use indicator lights or connection status detection software to confirm the connection status. Alternatively, try to communicate with the test piece through a test device (such as Zhou Ligong equipment, CANoe equipment, etc.). If communication can be successfully established, it means that the test bench and the test piece are connected.

[0095] It should be noted that different types of test pieces require different monitoring indicators. For electronic component test pieces, the monitoring indicators include: voltage monitoring indicators, current detection indicators, temperature detection indicators, etc. Among them, the voltage monitoring indicator can determine whether the voltage at both ends of the test piece is within the normal range. The current monitoring indicator is the magnitude of the current passing through the test piece to determine whether its working state is normal. Some electronic components generate heat when working, and their temperature is monitored by temperature sensors to prevent overheating damage. For mechanical component test pieces, the monitoring indicators include: displacement monitoring indicators, pressure monitoring indicators, and vibration monitoring indicators, etc. It should be noted that if the test piece is a movable mechanical component, such as a valve, slider, etc., its position change can be monitored by a displacement sensor. For mechanical test pieces involving pressure, such as components in a hydraulic system, their pressure values ​​can be monitored. Detect the vibration of mechanical components during operation to determine whether they have abnormal vibrations.

[0096] Secondly, according to the determined monitoring indicators, select the corresponding sensors and monitoring equipment. For example, use a voltage sensor to monitor voltage indicators, and use a current transformer to monitor current indicators. Specifically, through the test equipment or host computer software connected to the test bench, the test piece is monitored in real time to obtain the indicator data corresponding to the monitoring indicators. A certain sampling frequency can be set to ensure the timeliness and accuracy of the data.

[0097] Then, the obtained indicator data is compared with the preset standard value or range. For example, if the standard value of the voltage monitoring indicator is 5V±0.1V, and the actual measured voltage is 4.8V, the execution condition is not met. Consider the situation of multiple monitoring indicators and make a comprehensive judgment. If only one indicator deviates slightly from the standard value, but the other indicators are within the normal range, the execution condition is still met. However, if multiple indicators deviate significantly from the standard value, the execution condition is not met.

[0098] Finally, according to the specific requirements of the fault operation strategy, determine whether the test piece meets the execution conditions. For example, if the fault operation strategy requires the test piece to perform fault operations within a specific voltage and current range, then the execution conditions are considered to be met only when the monitored voltage and current indicator data meet this range.

[0099] If it is determined that the test piece meets the execution conditions of the fault operation strategy, a control instruction is sent to the test piece. The specific steps are as follows: Generate the corresponding control instruction according to the fault operation strategy. The control instruction can be a digital signal, an analog signal, or a specific communication protocol data packet. Through the connection between the test bench and the test piece, the control instruction is sent to the test piece using the test equipment or the host computer software. The instruction can be sent by wired communication (such as USB, RS232, etc.) or wireless communication (such as Bluetooth, Wi-Fi, etc.). After sending the control instruction, wait for the response of the test piece and confirm whether the control instruction is executed correctly. The execution can be confirmed by monitoring the state change of the test piece or receiving the feedback signal of the test piece.

[0100] As an example, for different DTC test items, the test pieces related thereto are determined.

[0101] For power supply undervoltage and power supply overvoltage faults: the test piece is mainly the programmable power supply and the DC power supply output part connected to the system under test.

[0102] For Bus-off failure: the test pieces include the toggle switch, Ethernet interface and related CAN interface equipment on the test bench.

[0103] For faults such as node loss: CAN tools, test benches, and depending on whether configuration words are involved, custom message sending equipment or DBC file processing equipment are also involved.

[0104] For switch stuck and switch sticking faults: the test pieces include the test bench switches and power supplies used to control the switch output status on the test bench.

[0105] For relay faults: test the toggle switches, loads, and related power and communication equipment on the test bench.

[0106] For a door handle retract timeout fault: Test the device on the test bench that sets the door handle status signal.

[0107] For motor output short circuit fault: test the control equipment, multimeter and related motor and circuit parts on the test bench.

[0108] For faults such as switch sticking: Test the equipment on the bench used to schedule the ID signal specified in the matrix table.

[0109] For the left rear door handle touch unlock switch stuck fault: test the pin connection device related to the left rear door handle on the test bench.

[0110] Determine the required control instruction content according to the fault triggering or recovery method of the target DTC test item. For example, for a power undervoltage fault, if the fault is to be triggered, the control instruction is to let the program-controlled power supply output a low voltage (<7V); if the fault is to be recovered, the control instruction is to let the program-controlled power supply output a voltage of 9-16V. For a Bus-off fault, if there is a spontaneous message, the control instruction is to let the test bench control toggle switch directly short-circuit and read the current status through the Ethernet port; if there is no spontaneous message, a specific diagnostic message is sent through the message routing method to trigger or recover the fault.

[0111] Use the communication interface and protocol to send control instructions to the test piece. Ensure accurate transmission and reception of instructions. You can improve the reliability of communication by setting checksums, confirmation mechanisms, or error handlers. Wait for the test piece's response. Some test pieces will return confirmation information or status reports after receiving control instructions to confirm whether the instructions are executed correctly. Observe the state changes of the test system to confirm whether the fault operation is executed as expected.

[0112] For example, for a power undervoltage fault, a voltmeter can be used to monitor whether the DC power supply output voltage reaches the expected low voltage value; for a Bus-off fault, the current bus status can be read through the Ethernet port to confirm whether a Bus-off condition occurs. If the fault operation is not performed as expected, the control instruction sending process, the connection status of the test piece, and the working status of the test piece itself can be checked to determine the problem and make corresponding adjustments and repairs.

[0113] Step S104, reading the operation result of the test piece executing the fault operation.

[0114] In an embodiment of the present application, when reading the operating results of the test bench performing a fault operation on the test piece, data can be read through the connected test equipment, and the state of the dial switch and the color of the LED light on the operation panel can be observed to preliminarily determine the fault state. At the same time, the detailed data obtained by the test equipment, such as fault codes, status flags and other information, can be analyzed, and these result data can be recorded and stored for subsequent analysis and processing.

[0115] like Figure 4As shown in the figure, the process of simulating a single fault test is as follows: ① Start the test. At this time, the system is in the initial state and the DTC fault status is 0x08, indicating that the test piece is in normal state and there is no specific fault. ② Simulate DTC faults by injecting specific fault signals into the system or modifying related parameters. For example, sensor faults, circuit short circuits or open circuits can be simulated. Wait for a while to allow the system enough time to detect the fault. ③ Read the DTC fault status. At this time, it should be detected that the fault has been triggered. The read status is 0x09, indicating that the specific fault has been identified by the system. ④ Remove the simulated DTC fault, which can be achieved by revoking the previously injected fault signal or restoring the modified parameters. ⑤ Read the DTC fault status again. At this time, it should be detected that the fault has been cleared. The read status is 0x08, indicating that the system has returned to a fault-free state.

[0116] like Figure 5 As shown in the figure, the process of simulating multiple fault concurrent testing is as follows: First, start the test. At this time, the system is in the initial state, and the DTC fault status is 0x08, indicating that there is no specific fault. Simulate two different DTC faults at the same time, marked as simulated DTC fault 1 and simulated DTC fault 2. This can be achieved by injecting specific fault signals into the system or modifying related parameters. Read the DTC fault status. At this time, it should be detected that both faults have been triggered. The read DTC fault 1 status is 0x09, and the DTC fault 2 status is also 0x09, indicating that two different faults have been identified by the system. Then remove the simulated DTC fault 1 and DTC fault 2 respectively. This can be achieved by revoking the previously injected fault signal or restoring the modified parameters. Read the DTC fault status again. At this time, it should be detected that the fault has been cleared, and the read DTC fault status is 0x08, indicating that the system has returned to a fault-free state.

[0117] Through this multi-fault concurrent simulation example, the system's detection and recovery capabilities when facing multiple faults occurring simultaneously can be effectively tested. In actual applications, more complex multi-fault simulations can be performed according to specific system requirements and fault conditions to ensure the stability and reliability of the system.

[0118] The entire test process of the embodiment of the present application is automated from obtaining fault test tasks to generating control instructions, executing fault operations, and reading operation results, which reduces manual intervention and improves test efficiency and accuracy. By clarifying the target DTC test items and fault operation types, more targeted testing can be performed to quickly locate potential problem points. At the same time, multiple target DTC test items can also be tested, which expands the coverage of the test and helps to discover more potential faults. The results of the test piece executing the fault operation can be read in real time, and the test status can be understood in a timely manner so that a quick response can be made when a problem occurs.

[0119] In the embodiment of the present application, after reading the operation result of the test piece performing the fault operation, such as Figure 6 As shown, the method also includes:

[0120] Step S201, obtaining a fault analysis strategy corresponding to a target DTC test item.

[0121] In an embodiment of the present application, first, a database or data structure containing fault analysis strategies corresponding to various DTC test items is created. According to the test task currently being performed, the target DTC test item is determined. In the fault analysis strategy library, a search is performed according to the target DTC test item to find the corresponding fault analysis strategy. For example, keyword matching, index search and other methods can be used to quickly locate the required strategy.

[0122] Step S202: Analyze the operation result using the fault analysis strategy to determine whether there is any abnormality in the operation result.

[0123] In an embodiment of the present application, different fault analysis strategies may use different indicators, algorithms or rules to determine whether the operation result is abnormal. Extract key features and data from the operation result obtained after the test piece performs the fault operation. These features may include numerical values, change trends, status codes, etc. According to the requirements of the fault analysis strategy, analyze the extracted operation result features. For example, if the fault analysis strategy is based on threshold judgment, the operation result is compared with the preset threshold; if it is based on pattern matching, the operation result is matched with the known abnormal pattern. According to the analysis results of the fault analysis strategy, determine whether the operation result is abnormal. If the operation result exceeds the normal range, does not conform to the expected pattern, or triggers a specific abnormal condition, it is considered to be abnormal.

[0124] Step S203: if the operation result is abnormal, obtain the operation log file of the test piece executing the fault operation.

[0125] In an embodiment of the present application, when it is determined that an operation result is abnormal, a process for obtaining an operation log file is triggered. This can be achieved by setting an abnormality detection mechanism or event triggering. The storage location of the operation log file in the test system is understood. This can be locally on the test device, on a server, or in a specific storage device. According to the determined location information, the operation log file of the test piece performing the fault operation is retrieved and obtained. The log file can be obtained using a file system interface, a database query, or a specific log management tool.

[0126] Step S204: Analyze the operation log file to obtain factors that cause abnormal operation results.

[0127] In an embodiment of the present application, the content of the operation log file is read. The log file can be read line by line to extract key information such as timestamps, operation steps, error codes, etc. In the log file content, events related to abnormal operation results are identified. This can be achieved by finding specific error messages, abnormal status codes, or abnormal time points. According to the identified abnormal events, the factors that cause the abnormal operation results are analyzed. This needs to be inferred in combination with the architecture, working principle, and fault analysis experience of the test system. For example, if a hardware component fails in the log, it is a hardware problem that causes the abnormal operation result; if a communication error is shown in the log, it is a network problem or a software configuration problem.

[0128] The abnormal factors obtained from the analysis are summarized and summarized for subsequent problem solving and system optimization. The abnormal factors can be recorded in the report or fed back to the developers and maintainers for further processing.

[0129] In an embodiment of the present application, after analyzing the operation log file to obtain the factors that cause the abnormal operation results, the method also includes: analyzing the factors to determine whether the test piece has a hardware failure or performance problem; if the test piece has a hardware failure, sending a fault prompt message, wherein the fault prompt message is used to prompt the replacement of hardware; or, if the test piece has a performance problem, obtaining an upgrade software package, and using the upgrade software package to upgrade the test piece.

[0130] Specifically, first, collect various factors used to determine the status of the test piece. These factors may include, but are not limited to, the following aspects: The performance of the test piece during operation, such as response time, data accuracy, stability, etc. Abnormal events, error codes, and other information recorded in the operation log file. Monitoring indicator data, such as physical parameters such as voltage, current, and temperature. Comparison results with similar test pieces to determine whether there are performance differences.

[0131] Based on the collected analysis factors, determine whether the test piece has hardware failure or performance problems. Hardware failures are manifested by signs such as complete inability to work, frequent occurrence of specific errors, and physical damage. For example, the test piece cannot be powered on, a chip is burned, or the interface is damaged. Performance problems are manifested by slower response speed, reduced data processing capabilities, occasional errors that do not clearly point to hardware damage, etc. For example, the test piece freezes when processing large amounts of data, and the execution time of certain functions is significantly extended.

[0132] If it is determined that the test piece has a hardware failure, the system will send a fault prompt message. The fault prompt message can be presented in many forms, such as displaying a warning message on the display screen of the test system, sending a notification to relevant personnel via email or text message, etc. The fault prompt message should clearly indicate that the test piece has a hardware failure and recommend replacing the hardware. For example, "Test piece X has a hardware failure, please replace it in time."

[0133] After receiving the fault prompt information, the relevant personnel should take appropriate measures according to the prompt. First, determine the hardware components that need to be replaced and prepare the new hardware. Then, follow the correct operating procedures to remove the faulty hardware from the test system and install the new hardware. After replacing the hardware, the test system needs to be retested to ensure that the problem is solved.

[0134] If it is determined that the testware has a performance problem, the system will try to solve it through software upgrades. First, the system will automatically search or obtain the upgrade software package applicable to the testware from a specific server. The upgrade software package contains optimization algorithms for performance issues, fixed vulnerabilities, updated drivers, etc. After obtaining the upgrade software package, the system will automatically upgrade the testware or with the user's confirmation. The upgrade process requires shutting down certain functions of the testware or suspending the operation of the test system to ensure a smooth upgrade. After the upgrade is complete, the testware needs to be retested to verify whether the performance problem has been resolved. If the problem persists, further analysis and other measures are required.

[0135] The method provided in the embodiment of the present application firstly provides a targeted analysis method for a specific test situation by obtaining the fault analysis strategy corresponding to the target DTC test item, thereby improving the accuracy and efficiency of the analysis. Then, by using this strategy to analyze the operation results, it is possible to quickly determine whether the operation results are abnormal, discover potential problems in a timely manner, and provide a clear direction for subsequent problem solving. When an abnormal operation result is found, the operation log file of the test piece is obtained, which provides a detailed record for an in-depth understanding of the problem and helps to trace the specific process of the problem. By analyzing the operation log file, the factors that cause abnormal operation results can be accurately found, so that the problem can be solved in a targeted manner, greatly shortening the time for problem solving.

[0136] In this embodiment, a vehicle fault testing device is also provided, which is used to implement the above-mentioned embodiments and preferred implementation modes, and the descriptions that have been made will not be repeated. As used below, the term "module" can be a combination of software and / or hardware that implements a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also and is conceived.

[0137] This embodiment provides a vehicle fault testing device, such as Figure 7 As shown, including:

[0138] An acquisition module 401 is used to acquire a fault test task currently triggered on a test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type;

[0139] A query module 402 is used to obtain a fault operation strategy corresponding to the fault operation type and generate a control instruction based on the fault operation strategy;

[0140] The sending module 403 is used to obtain the test piece corresponding to the target DTC test item and send a control instruction to the test piece so that the test piece performs a corresponding fault operation according to the control instruction;

[0141] The reading module 404 is used to read the operation result of the test piece performing the fault operation.

[0142] In an embodiment of the present application, an acquisition module 401 is used to acquire at least one first toggle switch currently selected on a test bench, wherein the test bench includes multiple toggle switches of the first type, and each toggle switch of the first type corresponds to a DTC test item; acquire a target DTC test item corresponding to the first toggle switch, and determine a target fault operation type according to an identification position of the first toggle switch; and generate a fault test task based on the target DTC test item and the target fault operation type.

[0143] In an embodiment of the present application, the acquisition module 401 is used to detect the first toggle operation currently acting on the first toggle switch; in response to the first toggle operation, determine the identification position currently located by the first toggle switch; based on the mapping relationship between the preset identification position and the fault operation type, determine the target fault operation type corresponding to the identification position.

[0144] In an embodiment of the present application, the query module 402 is used to obtain the fault operation content corresponding to the fault operation type, and detect whether a second toggle operation of the second type of toggle switch is currently acting on the test bench; if there is a second toggle operation acting on the second type of toggle switch, then in response to the second toggle operation, the toggle switch of the second type is used as the second toggle switch; the target IO routine corresponding to the second toggle switch is obtained, and the routine interaction parameters of the target IO routine are determined according to the second switch state corresponding to the second toggle switch; and a fault operation strategy is constructed using the fault operation content and the routine interaction parameters of the target IO routine.

[0145] In an embodiment of the present application, the device also includes: a query module, used to query whether the test bench is connected to the test piece corresponding to the target DTC test item; if the test bench is connected to the test piece, obtaining corresponding monitoring indicators according to the type of the test piece; monitoring the test piece to obtain indicator data corresponding to the monitoring indicators; determining whether the test piece corresponding to the target DTC test item meets the execution conditions of the fault operation strategy based on the indicator data; if the execution conditions of the fault operation strategy are met, sending a control instruction to the test piece.

[0146] In an embodiment of the present application, the device also includes: a first analysis module, used to obtain a fault analysis strategy corresponding to a target DTC test item; using the fault analysis strategy to analyze the operation result to determine whether the operation result is abnormal; if the operation result is abnormal, obtaining an operation log file of the test piece performing the fault operation; analyzing the operation log file to obtain factors that cause the operation result to be abnormal.

[0147] In an embodiment of the present application, the device also includes: a second analysis module, which is used to analyze factors to determine whether the test piece has a hardware failure or performance problem; if the test piece has a hardware failure, a fault prompt message is sent, wherein the fault prompt message is used to prompt the replacement of hardware; or, if the test piece has a performance problem, an upgrade software package is obtained, and the upgrade software package is used to upgrade the test piece.

[0148] Figure 8 The schematic diagram of the structure of an embodiment of the electronic device of the present invention is shown, and the specific embodiment of the present invention does not limit the specific implementation of the electronic device.

[0149] like Figure 8 As shown, the electronic device may include: a processor (processor) 402 , a communication interface (Communications Interface) 404 , a memory (memory) 406 , and a communication bus 408 .

[0150] The processor 402, the communication interface 404, and the memory 406 communicate with each other via the communication bus 408. The communication interface 404 is used to communicate with other devices such as a client or other server network elements. The processor 402 is used to execute the program 410, which can specifically execute the relevant steps in the above method embodiment.

[0151] Specifically, the program 410 may include program code including computer executable instructions.

[0152] The processor 402 may be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present invention. The one or more processors included in the electronic device may be processors of the same type, such as one or more CPUs; or processors of different types, such as one or more CPUs and one or more ASICs.

[0153] The memory 406 is used to store the program 410. The memory 406 may include a high-speed RAM memory, and may also include a non-volatile memory (non-volatile memory), such as at least one disk memory.

[0154] Program 410 can be specifically called by processor 402 to enable the electronic device to perform the following operations:

[0155] Obtain a fault test task currently triggered on a test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type; obtain a fault operation strategy corresponding to the fault operation type, and generate a control instruction based on the fault operation strategy; obtain a test piece corresponding to the target DTC test item, and send the control instruction to the test piece so that the test piece performs a corresponding fault operation according to the control instruction; and read an operation result of the test piece performing the fault operation.

[0156] Furthermore, the obtaining of the fault test task currently triggered on the test bench includes: obtaining at least one first toggle switch currently selected on the test bench, wherein the test bench includes multiple toggle switches of the first type, and each toggle switch of the first type corresponds to a DTC test item; obtaining a target DTC test item corresponding to the first toggle switch, and determining a target fault operation type according to an identification position of the first toggle switch; and generating the fault test task based on the target DTC test item and the target fault operation type.

[0157] Furthermore, determining the fault operation type based on the current identification position of the first toggle switch includes: detecting a first toggle operation currently acting on the first toggle switch; determining the current identification position of the first toggle switch in response to the first toggle operation; and determining the target fault operation type corresponding to the identification position based on a mapping relationship between a preset identification position and the fault operation type.

[0158] Furthermore, the obtaining of the fault operation strategy corresponding to the fault operation type includes: obtaining the fault operation content corresponding to the fault operation type, and detecting whether a second toggle operation of a second type of toggle switch is currently acting on the test bench; if there is a second toggle operation acting on the second type of toggle switch, then in response to the second toggle operation, the toggle-operated second type of toggle switch is used as the second toggle switch; obtaining the target IO routine corresponding to the second toggle switch, and determining the routine interaction parameters of the target IO routine according to the second switch state corresponding to the second toggle switch; and constructing the fault operation strategy using the fault operation content and the routine interaction parameters of the target IO routine.

[0159] Furthermore, before sending the control instruction to the test piece, the method also includes: querying whether the test bench is connected to the test piece corresponding to the target DTC test item; if the test bench is connected to the test piece, obtaining corresponding monitoring indicators according to the type of the test piece; monitoring the test piece to obtain indicator data corresponding to the monitoring indicators; determining whether the test piece corresponding to the target DTC test item meets the execution conditions of the fault operation strategy based on the indicator data; if the execution conditions of the fault operation strategy are met, sending the control instruction to the test piece.

[0160] Furthermore, after reading the operation result of the test piece performing the fault operation, the method also includes: obtaining a fault analysis strategy corresponding to the target DTC test item; analyzing the operation result using the fault analysis strategy to determine whether the operation result is abnormal; if the operation result is abnormal, obtaining an operation log file of the test piece performing the fault operation; and analyzing the operation log file to obtain factors that cause the operation result to be abnormal.

[0161] Furthermore, after analyzing the operation log file to obtain the factors that cause the abnormal operation results, the method also includes: analyzing the factors to determine whether the test piece has a hardware failure or performance problem; if the test piece has a hardware failure, sending a fault prompt message, wherein the fault prompt message is used to prompt the replacement of hardware; or, if the test piece has a performance problem, obtaining an upgrade software package, and using the upgrade software package to upgrade the test piece.

[0162] An embodiment of the present invention provides a computer-readable storage medium, in which at least one executable instruction is stored. When the executable instruction is executed on a vehicle failure test device, the vehicle failure test device performs the following method operations.

[0163] The executable instructions may be specifically used to enable the vehicle failure test device to perform the following operations:

[0164] Obtain a fault test task currently triggered on a test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type; obtain a fault operation strategy corresponding to the fault operation type, and generate a control instruction based on the fault operation strategy; obtain a test piece corresponding to the target DTC test item, and send the control instruction to the test piece so that the test piece performs a corresponding fault operation according to the control instruction; and read an operation result of the test piece performing the fault operation.

[0165] Furthermore, the obtaining of the fault test task currently triggered on the test bench includes: obtaining at least one first toggle switch currently selected on the test bench, wherein the test bench includes multiple toggle switches of the first type, and each toggle switch of the first type corresponds to a DTC test item; obtaining a target DTC test item corresponding to the first toggle switch, and determining a target fault operation type according to an identification position of the first toggle switch; and generating the fault test task based on the target DTC test item and the target fault operation type.

[0166] Furthermore, determining the fault operation type based on the current identification position of the first toggle switch includes: detecting a first toggle operation currently acting on the first toggle switch; determining the current identification position of the first toggle switch in response to the first toggle operation; and determining the target fault operation type corresponding to the identification position based on a mapping relationship between a preset identification position and the fault operation type.

[0167] Furthermore, the obtaining of the fault operation strategy corresponding to the fault operation type includes: obtaining the fault operation content corresponding to the fault operation type, and detecting whether a second toggle operation of a second type of toggle switch is currently acting on the test bench; if there is a second toggle operation acting on the second type of toggle switch, then in response to the second toggle operation, the toggle-operated second type of toggle switch is used as the second toggle switch; obtaining the target IO routine corresponding to the second toggle switch, and determining the routine interaction parameters of the target IO routine according to the second switch state corresponding to the second toggle switch; and constructing the fault operation strategy using the fault operation content and the routine interaction parameters of the target IO routine.

[0168] Furthermore, before sending the control instruction to the test piece, the method also includes: querying whether the test bench is connected to the test piece corresponding to the target DTC test item; if the test bench is connected to the test piece, obtaining corresponding monitoring indicators according to the type of the test piece; monitoring the test piece to obtain indicator data corresponding to the monitoring indicators; determining whether the test piece corresponding to the target DTC test item meets the execution conditions of the fault operation strategy based on the indicator data; if the execution conditions of the fault operation strategy are met, sending the control instruction to the test piece.

[0169] Furthermore, after reading the operation result of the test piece performing the fault operation, the method also includes: obtaining a fault analysis strategy corresponding to the target DTC test item; analyzing the operation result using the fault analysis strategy to determine whether the operation result is abnormal; if the operation result is abnormal, obtaining an operation log file of the test piece performing the fault operation; and analyzing the operation log file to obtain factors that cause the operation result to be abnormal.

[0170] Furthermore, after analyzing the operation log file to obtain the factors that cause the abnormal operation results, the method also includes: analyzing the factors to determine whether the test piece has a hardware failure or performance problem; if the test piece has a hardware failure, sending a fault prompt message, wherein the fault prompt message is used to prompt the replacement of hardware; or, if the test piece has a performance problem, obtaining an upgrade software package, and using the upgrade software package to upgrade the test piece.

[0171] The algorithms or displays provided herein are not inherently related to any particular computer, virtual system or other device. In addition, the embodiments of the present invention are not directed to any particular programming language.

[0172] In the description provided herein, a large number of specific details are described. However, it is understood that embodiments of the present invention can be practiced without these specific details. Similarly, in order to simplify the present invention and help understand one or more of the various inventive aspects, in the above description of exemplary embodiments of the present invention, the various features of the embodiments of the present invention are sometimes grouped together into a single embodiment, figure, or description thereof. Wherein, the claims that follow the specific embodiment are hereby expressly incorporated into the specific embodiment, wherein each claim itself is a separate embodiment of the present invention.

[0173] Those skilled in the art will appreciate that the modules in the devices in the embodiments may be adaptively changed and arranged in one or more devices different from the embodiments. The modules or units or components in the embodiments may be combined into one module or unit or component, and further may be divided into a plurality of submodules or subunits or subcomponents. Except that at least some of such features and / or processes or units are mutually exclusive.

[0174] It should be noted that the above embodiments illustrate the present invention rather than limit it, and that those skilled in the art may devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference symbol between brackets shall not be construed as a limitation on the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "one" or "an" preceding an element does not exclude the presence of a plurality of such elements. The present invention may be implemented by means of hardware comprising a number of different elements and by means of a suitably programmed computer. In a unit claim enumerating a number of devices, several of these devices may be embodied by the same hardware item. The use of the words first, second, and third, etc. does not indicate any order. These words may be interpreted as names. The steps in the above embodiments, unless otherwise specified, should not be understood as limitations on the order of execution.

Claims

1. A vehicle fault testing method, characterized in that: The method comprises: Acquire a fault test task currently triggered on the test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type; Acquire a fault operation strategy corresponding to the fault operation type, and generate a control instruction based on the fault operation strategy; Acquire a test piece corresponding to the target DTC test item, and send the control instruction to the test piece, so that the test piece performs a corresponding fault operation according to the control instruction; The operation result of the test piece executing the fault operation is read.

2. The method according to claim 1, characterized in that The obtaining of the fault test task currently triggered on the test bench includes: Acquire at least one first toggle switch currently selected on the test bench, wherein the test bench includes a plurality of first-type toggle switches, and each of the first-type toggle switches corresponds to a DTC test item; Obtaining a target DTC test item corresponding to the first toggle switch, and determining a target fault operation type according to an identification position of the first toggle switch; The fault test task is generated based on the target DTC test item and the target fault operation type.

3. The method according to claim 2, characterized in that The determining the fault operation type according to the current identification position of the first toggle switch includes: Detecting a first toggle operation currently acting on the first toggle switch; In response to the first toggle operation, determining the identification position of the first toggle switch; Based on a mapping relationship between a preset identification bit and a fault operation type, a target fault operation type corresponding to the identification bit is determined.

4. The method according to claim 1, characterized in that: The acquiring the fault operation strategy corresponding to the fault operation type includes: Acquire the fault operation content corresponding to the fault operation type, and detect whether a second toggle operation of a second type of toggle switch of the test bench is currently being acted on; If there is a second toggle operation acting on the second type of toggle switch, in response to the second toggle operation, the toggle second type of toggle switch is used as the second toggle switch; Acquire a target IO routine corresponding to the second toggle switch, and determine a routine interaction parameter of the target IO routine according to a second switch state corresponding to the second toggle switch; The fault operation strategy is constructed using the fault operation content and the routine interaction parameters of the target IO routine.

5. The method according to claim 1, characterized in that Before sending the control instruction to the test piece, the method further includes: Query whether the test bench is connected to the test piece corresponding to the target DTC test item; If the test bench is connected to the test piece, then obtaining corresponding monitoring indicators according to the type of the test piece; Monitoring the test piece to obtain indicator data corresponding to the monitoring indicator; determining, based on the indicator data, whether the test piece corresponding to the target DTC test item satisfies an execution condition of a fault operation strategy; If the execution condition of the fault operation strategy is met, the control instruction is sent to the test piece.

6. The method according to claim 1, characterized in that After reading the operation result of the test piece performing the fault operation, the method further includes: Obtaining a fault analysis strategy corresponding to the target DTC test item; Analyzing the operation result using the fault analysis strategy to determine whether the operation result is abnormal; If the operation result is abnormal, obtaining an operation log file of the test piece executing the fault operation; The operation log file is analyzed to obtain factors causing the abnormality of the operation result.

7. The method according to claim 6, characterized in that After analyzing the operation log file to obtain the factors causing the abnormality of the operation result, the method further includes: Analyzing the factors to determine whether the test piece has a hardware failure or performance problem; If the test piece has a hardware fault, a fault prompt message is sent, wherein the fault prompt message is used to prompt the replacement of hardware; or, if the test piece has a performance problem, an upgrade software package is obtained and the upgrade software package is used to upgrade the test piece.

8. A vehicle fault testing device, characterized in that: The device comprises: An acquisition module, used for acquiring a fault test task currently triggered on a test bench, wherein the fault test task includes at least one target DTC test item and a fault operation type; A query module, used to obtain a fault operation strategy corresponding to the fault operation type, and generate a control instruction based on the fault operation strategy; a sending module, configured to obtain a test piece corresponding to the target DTC test item, and send the control instruction to the test piece, so that the test piece performs a corresponding fault operation according to the control instruction; The reading module is used to read the operation result of the test piece executing the fault operation.

9. An electronic device, characterized in that: include: A processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface communicate with each other via the communication bus; The memory is used to store at least one executable instruction, and the executable instruction enables the processor to perform the operation of the method according to any one of claims 1-7.

10. A computer-readable storage medium, characterized in that: The storage medium stores at least one executable instruction. When the executable instruction is executed on the vehicle failure test device, the vehicle failure test device performs the operation of the method described in any one of claims 1 to 7.

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