Automatic test report automatic data acquisition and generation system and method

Abstract

The invention relates to an automatic data acquisition and generation system and method for an automatic test report, and the method comprises the steps: connecting a test material with a test fixing jig through a test interface, enabling a test template management module to match a corresponding test template according to the test material, and if the matching fails, manually adding the template, the test template is sent to the control module and the test data acquisition report module, the control module sends corresponding control signals to the corresponding test equipment according to test items and test parameters in the test template, and the test equipment adjusts the test parameters according to the control signals and tests the test material. And the test result is sent to the control module, the control module sends the test data to the test data acquisition report module, and the test data acquisition report module generates a test report according to the test template and the test data. Compared with the prior art, the method has the advantages that automatic testing is achieved, testing efficiency is improved, labor cost is reduced, and errors are reduced.

Description

Technical Field

[0001] The invention belongs to the field of testing technology, and in particular relates to an automatic test report automatic data collection and generation system and method. Background Art

[0002] In the field of electronic product production, almost all electrical materials need to undergo different forms of testing requirements. This testing process usually involves various test systems or test equipment for detection or testing. Only after inspection can the next process be entered. This testing process usually requires the coordination of production, output and storage of various test data for subsequent inquiries. Due to the wide variety of components involved and the differences in the required test items and parameters, a lot of tedious work is required, and ultimately the required various test reports are generated. The current conventional practices are nothing more than the following:

[0003] The first type: In the scenario where there is no automated testing tool or software, design inspection record templates corresponding to various products, and manually record the test data, which has a high error rate and is time-consuming and labor-intensive.

[0004] The second type: There are automated test tools and supporting special software. This type of software is usually provided by equipment suppliers. Almost one piece of software is paired with one piece of equipment. At the same time, due to different test items, when using multiple devices, different software is needed for control and collection to output a complete test report, or multiple independent sub-item reports are combined into a complete report. This method is difficult to operate, the archived data is messy, the templates are different, it is easy to confuse or miss, it is inconvenient to manage, and it consumes a lot of human resource costs. Summary of the invention

[0005] The purpose of the present invention is to overcome the defects of the above-mentioned prior art and to provide an automatic test report automatic data collection and generation system and method.

[0006] The purpose of the present invention can be achieved by the following technical solutions:

[0007] The present invention provides an automatic test report automatic data collection and generation system, comprising: a control module, a test template management module, a test data collection report module, a test device, a switch, a test fixture and a material to be tested, wherein the control module is connected to the test device via the switch, the test template management module, the test data collection report module and the control module are interconnected, and the material to be tested, the test device and the test fixture are connected.

[0008] Furthermore, the test device and the control module communicate with each other through the Ethernet TCP / IP protocol by setting the IP addresses of the Ethernet ports in the same network segment.

[0009] Furthermore, the testing equipment includes a resistance tester, a voltage tester and an oscilloscope.

[0010] Furthermore, the test system does not limit the test equipment that can be connected.

[0011] Furthermore, the functions of the test template management module include: selecting a corresponding test template according to the material to be tested, sending the test template to the control module and the test data collection report module, and modifying the test template.

[0012] Furthermore, the test template includes test items, test data filling position numbers, and test parameters.

[0013] Furthermore, the control module is used to receive the test template sent by the test template management module, send corresponding control signals to the corresponding test equipment according to the test items and test parameters in the test template, receive the test data sent by the test equipment, and send the test data to the test data collection report module.

[0014] Further, the control module supports the underlying driver implementations of different test devices, including: NI-VISA driver, GPIB driver, USBTMC, and supports SCPI instruction set. According to the test items and test parameters in the test template, the corresponding control signal is sent to the corresponding test device, and the test data sent by the test device is received, which specifically includes:

[0015] The control module sends a system status query instruction to the test device, and the test device returns a status flag sequence in the status condition register;

[0016] The control module decodes the status flag sequence and maps the bit fields in the status flag sequence to the device status conditions, wherein the device status flags include: an error status flag, a warning status flag and an operation completion flag;

[0017] The state of the test equipment is judged by combining all the state flag sequences. If the error state flag is set, the subsequent test is rejected and the error information is reported. If the warning state flag is set but the error state flag is not set, the warning information is recorded and the test is continued. If the operation completion flag is set and the error state flag and the warning state flag are not set, it is confirmed that the equipment meets the expected requirements.

[0018] The control module sends a voltage setting instruction and a current setting instruction, the control module sends a query instruction to the test device, and the test device returns a response;

[0019] The control module analyzes the response to obtain the actual voltage and current values, compares the actual voltage and current values ​​with the preset voltage and current values, and sends a correction instruction to adjust the voltage and current if they are different; if they are the same, sends a test channel setting instruction to the test equipment;

[0020] The test device sets the test channel, the control module sends a channel activation test instruction, the test device performs an activation test on the test channel, the control module sends a channel status query instruction to the test device, the test device returns the channel status information, the control module compares the channel status information with the preset status, if they are different, resends the configuration instruction until the channel status information meets the preset status;

[0021] If they are the same, the control module sends a test mode setting instruction to the test device, and the test device sets the test mode according to the instruction. The control module sends a RUN instruction to the test device to control the test device to start the test. After the test, the control module sends a test data acquisition instruction to the test device to obtain the measurement data.

[0022] Furthermore, the test data collection report module is used to receive the test template sent by the test template management module, receive the test data sent by the control module, fill in the bit numbers according to the test items and test data in the test template, fill in the test data into the corresponding bit numbers, and generate a test report.

[0023] The present invention also provides an automatic test report automatic data collection and generation method, which is characterized in that it includes the following steps: connecting the test material and the test fixture through a test interface, the test template management module matches the corresponding test template according to the test material, if the matching fails, manually add the template, send the test template to the control module and the test data collection report module, the control module sends the corresponding control signal to the corresponding test equipment according to the test items and test parameters in the test template, the test equipment adjusts the test parameters according to the control signal, tests the test material, and sends the test results to the control module, the control module sends the test data to the test data collection report module, and the test data collection report module generates a test report according to the test template and the test data.

[0024] Compared with the prior art, the present invention has the following advantages:

[0025] (1) The test report system provided by the present invention realizes automated testing equipment, improves efficiency while also reducing labor costs and improving work efficiency; in addition, it avoids problems such as large errors caused by manual data entry.

[0026] (2) The present invention also realizes the control of different test devices and improves the test efficiency by making the control module compatible with the underlying driver implementation methods and instruction sets of different test devices.

[0027] (3) The present invention reduces the error rate caused by human factors by automating the test, while also ensuring the stability and reliability of product quality.

[0028] (4) The present invention separates the report template and the test module, and different templates can be selected according to the needs of the test material, which is more flexible.

[0029] (5) The present invention avoids test data filling errors caused by numerous test items by dynamically binding test data with test report cells. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 is a system structure diagram of the present invention;

[0031] Figure 2 This is the test template diagram. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0033] Embodiment 1:

[0034] like Figure 1 As shown, an automated test report automatic data collection and generation system includes: a control module, a test template management module, a test data collection report module, a test device, a switch, a test fixture and a material to be tested. The test device and the control module are connected via an Ethernet port, and the test template management module, the test data collection report module and the control module are interconnected. The test device and the control module are connected via an Ethernet port. The test device includes a resistance tester, a voltage tester and an oscilloscope. The functions of the test template management module include: selecting the corresponding test template according to the material to be tested, sending the test template to the control module and the test data collection report module, and modifying the test template. Figure 2As shown, the test template includes test items, test data filling bit numbers, and test parameters. The control module is used to receive the test template sent by the test template management module, send corresponding control signals to the corresponding test equipment according to the test items and test parameters in the test template, receive the test data sent by the test equipment, and send the test data to the test data acquisition report module. The control module supports the underlying drivers of different test equipment, including: NI-VISATDR, GPIO, USB TMC, and supports the SCPI instruction set, which includes test equipment control instructions, parameter setting instructions, and data reading instructions. The test data acquisition report module is used to receive the test template sent by the test template management module, receive the test data sent by the control module, fill in the bit numbers according to the test items and test data in the test template, fill in the test data into the corresponding bit numbers, and generate a test report. Further, the test system does not limit the test equipment connected. The system is used to have no requirements for the type of controller connected, as long as it can meet its needs and can run stably. Further, there is no upper limit on the number of test equipment, and the capacity of the test work can be increased by adding test equipment as the production line increases. An automatic test report automatic data collection and generation method includes the following steps: connecting the test material and the test fixture through a test interface, the test template management module matches the corresponding test template according to the test material, if the match fails, manually add the template, and then send the test template to the control module and the test data collection report module, the control module sends the corresponding control signal to the corresponding test equipment according to the test items and test parameters in the test template, the test equipment adjusts the test parameters according to the control signal, tests the test material, and sends the test result to the control module, the control module sends the test data to the test data collection report module, and the test data collection report module generates a test report according to the test template and the test data. Furthermore, after receiving the test template sent by the test template management module, the control module analyzes the configuration information of the test template, including the location and quantity of the test items, the test type of each test item, the position number of the filled data, and other information. After analyzing the configuration information of the test template, the control module starts to issue test commands to each test device. The specific test process is as follows: First, the control module obtains the test items to be executed from the test template, and then determines whether there is a test device of the corresponding type. If so, it issues an opening instruction to this test device. If not, it continues to search for the next test item. When all tests are completed, turn off all devices and then conduct another check to ensure that there are no problems in all tests executed this time. The entire working process is implemented by computer software, and a large number of test records can be stored in the system for later query, statistics, and reuse. The final results will be output in the form of an Excel spreadsheet, or directly exported to a PDF format file for storage.

[0035] Embodiment 2:

[0036] The parts not mentioned in this embodiment are the same as those in Embodiment 1.

[0037] An automatic data collection and generation system for automated test reports

[0038] like Figure 1 Including: test materials, test fixtures, test equipment, switches, and test systems.

[0039] The test system includes a control module, a test template management module, and a test data collection report module.

[0040] Connect multiple devices such as resistance testers and voltage testers to the switch via Ethernet, and connect the test system to the switch. Set the IP addresses of the Ethernet ports of the test equipment and the test system in the same network segment, and complete the communication with the test equipment through the Ethernet TCP / IP protocol. According to the test content of the test items, the test system controls the opening, closing, writing control commands and reading test data of all connected devices. Select the corresponding test fixture according to the test material, and insert and fix it. According to the material test items, select the corresponding test equipment, and connect the test end to the test fixture. For example, for voltage test, connect the voltage tester to the test fixture to achieve the connection between the test system and the test material.

[0041] The test equipment includes many test instruments. Different instruments support different underlying driver implementation methods and instruction sets. For example, this system supports the following methods: NI-VISA driver, GPIB driver, USBTMC; supports the following instruction sets: general SCPI instructions and special instructions for different instruments. These instruction sets mainly include instrument control instructions, such as: opening, closing, reading and writing instruments, etc.; parameter setting instructions, such as: setting the oscilloscope's AC mode, setting the current ripple peak-to-peak sampling mode, setting the maximum and minimum sampling modes, setting the number of sampling times, setting the output voltage and output current of the power supply, etc.; data reading instructions, sending a command to read the current test voltage to the voltage tester, sending a command to read the current test resistance value to the resistance tester, etc.

[0042] The test system mainly runs the test software, which mainly includes test project management, test auxiliary operation, instrument management and drive, test report loading and output management. The test system is responsible for the realization of the following functions: realizing the drive of all connected instruments and the realization of remote data acquisition functions; responsible for the automation of the test process of many test items; responsible for the automatic management of test project reports; responsible for automatically collecting test data according to different test items and automatically filling in test reports.

[0043] The present invention also includes the following steps and contents:

[0044] Run the test system. The system includes many test projects. Each test project contains many test items. When selecting the test project, the system automatically loads an empty template. The tester decides whether to import and load the report template of the test project according to the needs. The template is a pre-designed text based on Excel format, including a lot of information, including test data that needs to be reported. If the test data needs to be reported in the report, the import and loading of the report template needs to be executed before starting the test. Since the report template is based on Excel format, the filling position of the data can be specified according to the rows and columns. This system supports the filling position and test item Item point-to-point matching management function. Once the point-to-point matching configuration is completed, the test results of different test items Item will be automatically filled in the corresponding position during the test process, completing the automatic collection function of the test report.

[0045] Before officially starting the test, you need to select the test item to be executed in the test input interface, enter the test parameters of the test item Item, enter the filling position of the collected data and click the matching configuration of the test item Item. For example, test item Item1 matches to column C, row 3: C3, and Item2 matches to column B, row 2: B2.

[0046] Take the ripple test of the power module as an example. After selecting the current ripple test project, click the open button. The test software will automatically load the drivers of all the instruments and meters required for the ripple test according to the program, remotely open the instruments and meters through the driver, and complete the initialization. The test system decomposes the test project into different test steps, such as: peak-to-peak value, load voltage. Each test step will determine when to read / write the relevant parameters of the instrument or what kind of action, instruction or task to perform according to the test content. For example, during the peak-to-peak test, first set the program-controlled power supply to the required voltage and current output, then open the corresponding test channel of the voltage test instrument, and then set the oscilloscope to the AC test mode. The test parameter is the peak-to-peak value, and the number of tests is, for example, 500 times. In this way, after clicking the start test button, the program-controlled power supply starts to output first, and then after a delay of a few seconds to stabilize, the oscilloscope starts to test and automatically reads the peak-to-peak value and displays it intuitively. When the test count ends, the host computer software reads the peak-to-peak value test result of the oscilloscope, and then reads the load voltage during the voltage tester test. After clicking the start test button, the test system software will automatically realize the automation control of remote instruments and meters according to the selected test items, and automatically execute the test content until the test is completed. The collected data received by the PC is automatically filled into the test report of the current test item after processing, and then the test report of the current test item can be automatically generated as needed.

[0047] The control module sends a system status query instruction to the test device, and the test device returns a status flag sequence in the status condition register;

[0048] The control module decodes the status flag sequence and maps the bit fields in the status flag sequence to the device status conditions, wherein the device status flags include: an error status flag, a warning status flag and an operation completion flag;

[0049] The state of the test equipment is judged by combining all the state flag sequences. If the error state flag is set, the subsequent test is rejected and the error information is reported. If the warning state flag is set but the error state flag is not set, the warning information is recorded and the test is continued. If the operation completion flag is set and the error state flag and the warning state flag are not set, it is confirmed that the equipment meets the expected requirements.

[0050] The control module sends a voltage setting instruction and a current setting instruction, the control module sends a query instruction to the test device, and the test device returns a response;

[0051] The control module analyzes the response to obtain the actual voltage and current values, compares the actual voltage and current values ​​with the preset voltage and current values, and sends a correction instruction to adjust the voltage and current if they are different; if they are the same, sends a test channel setting instruction to the test equipment;

[0052] The test device sets the test channel, the control module sends a channel activation test instruction, the test device performs an activation test on the test channel, the control module sends a channel status query instruction to the test device, the test device returns the channel status information, the control module compares the channel status information with the preset status, if they are different, resends the configuration instruction until the channel status information meets the preset status;

[0053] If they are the same, the control module sends a test mode setting instruction to the test device, and the test device sets the test mode according to the instruction. The control module sends a RUN instruction to the test device to control the test device to start the test. After the test, the control module sends a test data acquisition instruction to the test device to obtain the measurement data.

[0054] The test system does not limit the test equipment that can be connected. When there are new requirements, you only need to develop the corresponding connection ports to achieve intercommunication between the system and the equipment, and complete the testing and collection work.

[0055] The report templates and test modules in the system are separated, and the needs of various templates are met by importing templates;

[0056] The data recording cells in the test report are dynamically bound to the test data, and the data entry position can be flexibly selected; the test system supports automatic binding and manual binding. When selecting a test item, the system will load the test item configuration file to automatically load the relevant parameters. If there is no corresponding test item configuration, after loading the report, you can manually select the match between the test report data recording unit and the test item.

[0057] The test data is automatically generated through instrument testing, and the test PC software automatically reads the data of the instrument remotely through the driver according to the test items.

[0058] The system implemented by this technical solution can well solve the problem of automatic generation of traditional or commonly used test-related reports. At the same time, it can also avoid repeated modification and upgrading of software due to frequent changes in reports.

[0059] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. An automated test report automatic data collection and generation system, It is characterized in that include: A control module, a test template management module, a test data collection report module, a test device, a switch, a test fixture and a material to be tested. The control module is connected to the test device via a switch, the test template management module, the test data collection report module and the control module are interconnected, and the material to be tested, the test device and the test fixture are connected.

2. The automatic test report automatic data collection and generation system according to claim 1, It is characterized in that The test device and the control module communicate with each other through the Ethernet TCP / IP protocol by setting the IP address of the Ethernet port in the same network segment.

3. An automated test report automatic data collection and generation system according to claim 1 or 2, It is characterized in that The testing equipment includes a resistance tester, a voltage tester and an oscilloscope.

4. The automatic test report automatic data collection and generation system according to claim 1, It is characterized in that The test system does not limit the test equipment that can be connected.

5. The automatic test report automatic data collection and generation system according to claim 1, It is characterized in that The functions of the test template management module include: selecting the corresponding test template according to the material to be tested, sending the test template to the control module and the test data collection report module, and modifying the test template.

6. The automatic test report automatic data collection and generation system according to claim 5, It is characterized in that The test template includes test items, test data filling position numbers, and test parameters.

7. The automatic test report automatic data collection and generation system according to claim 1, It is characterized in that The control module is used to receive the test template sent by the test template management module, send corresponding control signals to the corresponding test equipment according to the test items and test parameters in the test template, receive the test data sent by the test equipment, and send the test data to the test data collection report module.

8. The automatic test report automatic data collection and generation system according to claim 7, It is characterized in that The control module supports different underlying driver implementations of test equipment, including: NI-VISA driver, GPIB driver, USBTMC, and supports SCPI instruction set. According to the test items and test parameters in the test template, the corresponding control signal is sent to the corresponding test equipment, and the test data sent by the test equipment is received, which specifically includes: The control module sends a system status query instruction to the test device, and the test device returns a status flag sequence in the status condition register; The control module decodes the status flag sequence and maps the bit fields in the status flag sequence to the device status conditions, wherein the device status flags include: an error status flag, a warning status flag and an operation completion flag; The state of the test equipment is judged by combining all the state flag sequences. If the error state flag is set, the subsequent test is rejected and the error information is reported. If the warning state flag is set but the error state flag is not set, the warning information is recorded and the test is continued. If the operation completion flag is set and the error state flag and the warning state flag are not set, it is confirmed that the equipment meets the expected requirements. The control module sends a voltage setting instruction and a current setting instruction, the control module sends a query instruction to the test device, and the test device returns a response; The control module analyzes the response to obtain the actual voltage and current values, compares the actual voltage and current values ​​with the preset voltage and current values, and sends a correction instruction to adjust the voltage and current if they are different; if they are the same, sends a test channel setting instruction to the test equipment; The test device sets the test channel, the control module sends a channel activation test instruction, the test device performs an activation test on the test channel, the control module sends a channel status query instruction to the test device, the test device returns the channel status information, the control module compares the channel status information with the preset status, if they are different, resends the configuration instruction until the channel status information meets the preset status; If they are the same, the control module sends a test mode setting instruction to the test device, and the test device sets the test mode according to the instruction. The control module sends a RUN instruction to the test device to control the test device to start the test. After the test, the control module sends a test data acquisition instruction to the test device to obtain the measurement data.

9. The automatic test report automatic data collection and generation system according to claim 1, It is characterized in that The test data collection report module is used to receive the test template sent by the test template management module, receive the test data sent by the control module, fill in the bit numbers according to the test items and test data in the test template, fill in the test data into the corresponding bit numbers, and generate a test report.

10. A method for automatic data collection and generation of automated test reports, It is characterized in that The following steps are involved: The test material and the test fixture are connected through the test interface. The test template management module matches the corresponding test template according to the test material. If the match fails, the template is added manually and the test template is sent to the control module and the test data acquisition report module. The control module sends the corresponding control signal to the corresponding test equipment according to the test items and test parameters in the test template. The test equipment adjusts the test parameters according to the control signal, tests the test material, and sends the test results to the control module. The control module sends the test data to the test data acquisition report module. The test data acquisition report module generates a test report based on the test template and the test data.

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